TWI315406B - Testing apparatus and method for electronic device - Google Patents

Testing apparatus and method for electronic device

Info

Publication number
TWI315406B
TWI315406B TW093108468A TW93108468A TWI315406B TW I315406 B TWI315406 B TW I315406B TW 093108468 A TW093108468 A TW 093108468A TW 93108468 A TW93108468 A TW 93108468A TW I315406 B TWI315406 B TW I315406B
Authority
TW
Taiwan
Prior art keywords
electronic device
testing apparatus
testing
electronic
Prior art date
Application number
TW093108468A
Other languages
English (en)
Other versions
TW200506397A (en
Inventor
Seiji Ichiyoshi
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200506397A publication Critical patent/TW200506397A/zh
Application granted granted Critical
Publication of TWI315406B publication Critical patent/TWI315406B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Debugging And Monitoring (AREA)
TW093108468A 2003-03-31 2004-03-29 Testing apparatus and method for electronic device TWI315406B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/403,817 US7290192B2 (en) 2003-03-31 2003-03-31 Test apparatus and test method for testing plurality of devices in parallel

Publications (2)

Publication Number Publication Date
TW200506397A TW200506397A (en) 2005-02-16
TWI315406B true TWI315406B (en) 2009-10-01

Family

ID=32990043

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093108468A TWI315406B (en) 2003-03-31 2004-03-29 Testing apparatus and method for electronic device

Country Status (9)

Country Link
US (2) US7290192B2 (zh)
EP (2) EP1610135B8 (zh)
JP (2) JP3748269B2 (zh)
KR (1) KR20050113271A (zh)
CN (3) CN100432689C (zh)
DE (2) DE602004016973D1 (zh)
MY (1) MY131932A (zh)
TW (1) TWI315406B (zh)
WO (1) WO2004088339A1 (zh)

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* Cited by examiner, † Cited by third party
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Also Published As

Publication number Publication date
CN100489554C (zh) 2009-05-20
EP1884789B1 (en) 2009-07-29
US20040255216A1 (en) 2004-12-16
DE602004016973D1 (de) 2008-11-20
JP4704178B2 (ja) 2011-06-15
CN100432689C (zh) 2008-11-12
US7272765B2 (en) 2007-09-18
EP1884789A3 (en) 2008-02-13
CN101231325B (zh) 2011-08-31
EP1610135B8 (en) 2009-03-04
CN1756960A (zh) 2006-04-05
EP1610135A1 (en) 2005-12-28
MY131932A (en) 2007-09-28
WO2004088339A1 (ja) 2004-10-14
US20040193990A1 (en) 2004-09-30
EP1610135A4 (en) 2006-12-20
US7290192B2 (en) 2007-10-30
KR20050113271A (ko) 2005-12-01
CN1768275A (zh) 2006-05-03
JP3748269B2 (ja) 2006-02-22
CN101231325A (zh) 2008-07-30
JP2006053160A (ja) 2006-02-23
JPWO2004088339A1 (ja) 2006-07-06
TW200506397A (en) 2005-02-16
EP1610135B1 (en) 2008-10-08
EP1884789A2 (en) 2008-02-06
DE602004022347D1 (de) 2009-09-10

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