TWI647303B - 樹脂遮罩層用洗淨劑組合物及電路基板之製造方法 - Google Patents

樹脂遮罩層用洗淨劑組合物及電路基板之製造方法 Download PDF

Info

Publication number
TWI647303B
TWI647303B TW103131435A TW103131435A TWI647303B TW I647303 B TWI647303 B TW I647303B TW 103131435 A TW103131435 A TW 103131435A TW 103131435 A TW103131435 A TW 103131435A TW I647303 B TWI647303 B TW I647303B
Authority
TW
Taiwan
Prior art keywords
mass
parts
component
carbon atoms
detergent composition
Prior art date
Application number
TW103131435A
Other languages
English (en)
Chinese (zh)
Other versions
TW201516143A (zh
Inventor
岡村真美
高田真吾
長沼純
Original Assignee
日商花王股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商花王股份有限公司 filed Critical 日商花王股份有限公司
Publication of TW201516143A publication Critical patent/TW201516143A/zh
Application granted granted Critical
Publication of TWI647303B publication Critical patent/TWI647303B/zh

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/10Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/108Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by semi-additive methods; masks therefor
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D1/00Detergent compositions based essentially on surface-active compounds; Use of these compounds as a detergent
    • C11D1/38Cationic compounds
    • C11D1/645Mixtures of compounds all of which are cationic
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10Objects to be cleaned
    • C11D2111/14Hard surfaces
    • C11D2111/22Electronic devices, e.g. PCBs or semiconductors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01Dielectrics
    • H05K2201/0137Materials
    • H05K2201/0175Inorganic, non-metallic layer, e.g. resist or dielectric for printed capacitor

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Wood Science & Technology (AREA)
  • Organic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Detergent Compositions (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Cleaning By Liquid Or Steam (AREA)
TW103131435A 2013-09-11 2014-09-11 樹脂遮罩層用洗淨劑組合物及電路基板之製造方法 TWI647303B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013-188618 2013-09-11
JP2013188618 2013-09-11

Publications (2)

Publication Number Publication Date
TW201516143A TW201516143A (zh) 2015-05-01
TWI647303B true TWI647303B (zh) 2019-01-11

Family

ID=52975386

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103131435A TWI647303B (zh) 2013-09-11 2014-09-11 樹脂遮罩層用洗淨劑組合物及電路基板之製造方法

Country Status (4)

Country Link
JP (1) JP6412377B2 (ja)
KR (1) KR102257405B1 (ja)
CN (2) CN104427781B (ja)
TW (1) TWI647303B (ja)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6808714B2 (ja) * 2015-08-03 2021-01-06 フジフイルム エレクトロニック マテリアルズ ユー.エス.エー., インコーポレイテッド 洗浄組成物
JP6670100B2 (ja) * 2015-12-25 2020-03-18 花王株式会社 樹脂マスク剥離用洗浄剤組成物
JP6824719B2 (ja) * 2015-12-28 2021-02-03 花王株式会社 ネガ型樹脂マスク剥離用洗浄剤組成物
JP2017119782A (ja) * 2015-12-28 2017-07-06 花王株式会社 水溶性フラックス用洗浄剤組成物
TWI685718B (zh) * 2016-06-20 2020-02-21 日商三菱製紙股份有限公司 阻焊劑圖型之形成方法
JP6860276B2 (ja) 2016-09-09 2021-04-14 花王株式会社 樹脂マスク剥離用洗浄剤組成物
JP6924690B2 (ja) * 2017-12-21 2021-08-25 花王株式会社 樹脂マスク剥離洗浄方法
US10948826B2 (en) * 2018-03-07 2021-03-16 Versum Materials Us, Llc Photoresist stripper
JP7036212B2 (ja) * 2018-04-26 2022-03-15 栗田工業株式会社 第四級トリアルキルアルカノールアミン水酸化物を含む組成物の安定化
KR102029127B1 (ko) * 2019-02-08 2019-10-07 영창케미칼 주식회사 반도체 제조 공정에 있어서 실리콘 또는 실리콘 화합물 패턴을 형성하기 위한 신규 방법
CN114008539A (zh) * 2019-06-27 2022-02-01 花王株式会社 清洗方法
CN112764330B (zh) * 2021-01-08 2022-08-02 绵阳艾萨斯电子材料有限公司 Pfa光刻胶再生剥离液及其制备方法与应用
CN113437204A (zh) * 2021-05-18 2021-09-24 深圳市隆利科技股份有限公司 一种灯板制备方法
CN115475797B (zh) * 2022-09-30 2024-04-05 肇庆绿宝石电子科技股份有限公司 一种叠层电容器及其制造方法、载条清洗液及制备方法
WO2024128210A1 (ja) * 2022-12-12 2024-06-20 三菱瓦斯化学株式会社 フォトレジスト除去用組成物およびフォトレジストの除去方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW545099B (en) * 2002-06-17 2003-08-01 Via Tech Inc Bump forming technology with high resolution
TW200928619A (en) * 2007-09-28 2009-07-01 Samsung Electronics Co Ltd Composition for striipping and stripping method
TW201137117A (en) * 2010-03-25 2011-11-01 Fujifilm Corp Cleaning composition, cleaning process, and process for producing semiconductor device

Family Cites Families (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3705896A1 (de) * 1986-02-24 1987-08-27 Tokyo Ohka Kogyo Co Ltd Verfahren zur herstellung eines fotoresistmusters auf einer substratflaeche und ein dafuer geeignetes schaumentfernungsmittel
JP3424687B2 (ja) * 1993-05-21 2003-07-07 三菱瓦斯化学株式会社 水酸化第四級アンモニウム水溶液の製造方法
JP4283952B2 (ja) * 1999-10-12 2009-06-24 多摩化学工業株式会社 非鉄金属洗浄用洗浄液組成物
JP3371098B2 (ja) * 1999-11-04 2003-01-27 花王株式会社 洗浄剤組成物
JP2001343759A (ja) * 2000-05-31 2001-12-14 Nichigo Morton Co Ltd 光重合性組成物の硬化膜用剥離液
JP2002062668A (ja) * 2000-08-14 2002-02-28 Mitsubishi Gas Chem Co Inc フォトレジストの剥離方法
JP3738996B2 (ja) * 2002-10-10 2006-01-25 東京応化工業株式会社 ホトリソグラフィー用洗浄液および基板の処理方法
US20030138737A1 (en) * 2001-12-27 2003-07-24 Kazumasa Wakiya Photoresist stripping solution and a method of stripping photoresists using the same
JP3516446B2 (ja) * 2002-04-26 2004-04-05 東京応化工業株式会社 ホトレジスト剥離方法
CN100529014C (zh) * 2002-10-22 2009-08-19 Ekc技术公司 清洗半导体装置的磷酸组合物水溶液
JP4270544B2 (ja) * 2003-03-06 2009-06-03 花王株式会社 剥離剤組成物
CN1918698B (zh) * 2004-02-09 2010-04-07 三菱化学株式会社 半导体装置用基板的洗涤液及洗涤方法
JP4855667B2 (ja) * 2004-10-15 2012-01-18 ハリマ化成株式会社 樹脂マスク層の除去方法およびはんだバンプ付き基板の製造方法
WO2006127885A1 (en) * 2005-05-26 2006-11-30 Advanced Technology Materials, Inc. Copper passivating post-chemical mechanical polishing cleaning composition and method of use
JP4633619B2 (ja) * 2005-12-22 2011-02-16 花王株式会社 液体洗浄剤組成物
JP5152816B2 (ja) 2006-02-24 2013-02-27 化研テック株式会社 被洗浄物の洗浄方法
CN101071778A (zh) * 2006-05-08 2007-11-14 中芯国际集成电路制造(上海)有限公司 焊料凸点制作方法
CN100561697C (zh) * 2006-12-22 2009-11-18 中芯国际集成电路制造(上海)有限公司 一种焊料凸点的制作方法
JP5062562B2 (ja) * 2007-09-04 2012-10-31 Nltテクノロジー株式会社 薬液及びそれを用いた基板処理方法
JP2009075285A (ja) * 2007-09-20 2009-04-09 Fujifilm Corp 半導体デバイスの剥離液、及び、剥離方法
KR20100076999A (ko) * 2007-10-31 2010-07-06 이케이씨 테크놀로지, 인코포레이티드 포토레지스트 박리를 위한 화합물
US20090120457A1 (en) * 2007-11-09 2009-05-14 Surface Chemistry Discoveries, Inc. Compositions and method for removing coatings and preparation of surfaces for use in metal finishing, and manufacturing of electronic and microelectronic devices
JP5466836B2 (ja) * 2008-06-13 2014-04-09 花王株式会社 フラックス用洗浄剤組成物
KR20110063632A (ko) * 2008-08-05 2011-06-13 미츠비시 가스 가가쿠 가부시키가이샤 잔사 박리액 조성물 및 그것을 이용한 반도체 소자의 세정 방법
JP5548390B2 (ja) * 2009-05-29 2014-07-16 花王株式会社 液体洗浄剤組成物
US8765653B2 (en) * 2009-07-07 2014-07-01 Air Products And Chemicals, Inc. Formulations and method for post-CMP cleaning
US8110535B2 (en) * 2009-08-05 2012-02-07 Air Products And Chemicals, Inc. Semi-aqueous stripping and cleaning formulation for metal substrate and methods for using same
JP5646882B2 (ja) * 2009-09-30 2014-12-24 富士フイルム株式会社 洗浄組成物、洗浄方法、及び半導体装置の製造方法
JP5404459B2 (ja) * 2010-02-08 2014-01-29 東京応化工業株式会社 リソグラフィー用洗浄液及び配線形成方法
CN102141743A (zh) * 2010-08-25 2011-08-03 上海飞凯光电材料股份有限公司 具有金属保护的光刻胶剥离液组合物
SG10201605697UA (en) * 2011-08-09 2016-09-29 Basf Se Aqueous alkaline compositions and method for treating the surface of silicon substrates
CN102981379A (zh) * 2012-12-19 2013-03-20 青岛华电高压电气有限公司 一种光刻胶清洗剂组合物
KR101420571B1 (ko) * 2013-07-05 2014-07-16 주식회사 동진쎄미켐 드라이필름 레지스트 박리제 조성물 및 이를 이용한 드라이필름 레지스트의 제거방법

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW545099B (en) * 2002-06-17 2003-08-01 Via Tech Inc Bump forming technology with high resolution
TW200928619A (en) * 2007-09-28 2009-07-01 Samsung Electronics Co Ltd Composition for striipping and stripping method
TW201137117A (en) * 2010-03-25 2011-11-01 Fujifilm Corp Cleaning composition, cleaning process, and process for producing semiconductor device

Also Published As

Publication number Publication date
JP6412377B2 (ja) 2018-10-24
TW201516143A (zh) 2015-05-01
CN104427781A (zh) 2015-03-18
CN110225667A (zh) 2019-09-10
CN110225667B (zh) 2023-01-10
KR20150030175A (ko) 2015-03-19
CN104427781B (zh) 2019-05-17
JP2015079244A (ja) 2015-04-23
KR102257405B1 (ko) 2021-05-27

Similar Documents

Publication Publication Date Title
TWI647303B (zh) 樹脂遮罩層用洗淨劑組合物及電路基板之製造方法
JP5428859B2 (ja) 鉛フリーハンダフラックス除去用洗浄剤組成物、および鉛フリーハンダフラックスの除去方法
JP5857740B2 (ja) 鉛フリーハンダ水溶性フラックス除去用洗浄剤、除去方法及び洗浄方法
CN109563453B (zh) 丝网印版用清洗剂组合物
TWI647304B (zh) 固化焊劑之電路基板之製造方法、搭載電子零件之電路基板之製造方法、及助焊劑用洗淨劑組合物
JP6030637B2 (ja) ワイヤーボンディング法を改良するためのリードフレームのクリーニング
JP6670100B2 (ja) 樹脂マスク剥離用洗浄剤組成物
JP2017119782A (ja) 水溶性フラックス用洗浄剤組成物
JP7385597B2 (ja) フラックス残渣除去用洗浄剤組成物
CN109313399A (zh) 用于从基板去除物质的水溶液和方法
JP6316713B2 (ja) 回路基板の製造方法
TW201934738A (zh) 樹脂遮罩剝離洗淨方法
CN115280244A (zh) 基板的清洗方法
JP6824719B2 (ja) ネガ型樹脂マスク剥離用洗浄剤組成物
WO2022114110A1 (ja) 樹脂マスク剥離用洗浄剤組成物
JP2021042327A (ja) フラックス残渣除去用洗浄剤組成物
JP7132214B2 (ja) 樹脂マスク剥離用洗浄剤組成物
TW202108820A (zh) 組成物及蝕刻方法
WO2020262448A1 (ja) 洗浄方法
JP2023172703A (ja) 洗浄方法
WO2022050382A1 (ja) フラックス用洗浄剤組成物
KR20130071985A (ko) 땜납 플럭스 제거용 세정제 조성물