SE8603749L - Forfarande for testning av berare forsedda med ett flertal digitala integrerade kretsar, berare forsedd med sadana kretsar, integrerad krets lempad for montering pa en sadan berare och testanordning for testning av sada - Google Patents

Forfarande for testning av berare forsedda med ett flertal digitala integrerade kretsar, berare forsedd med sadana kretsar, integrerad krets lempad for montering pa en sadan berare och testanordning for testning av sada

Info

Publication number
SE8603749L
SE8603749L SE8603749A SE8603749A SE8603749L SE 8603749 L SE8603749 L SE 8603749L SE 8603749 A SE8603749 A SE 8603749A SE 8603749 A SE8603749 A SE 8603749A SE 8603749 L SE8603749 L SE 8603749L
Authority
SE
Sweden
Prior art keywords
testing
integrated circuit
bearing provided
integrated circuits
circuit
Prior art date
Application number
SE8603749A
Other languages
Unknown language ( )
English (en)
Other versions
SE469995B (sv
SE8603749D0 (sv
Inventor
W A Sauerwald
Wilde J De
Eerdewijk K J E Van
F P M Deenker
M T M Segers
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Publication of SE8603749D0 publication Critical patent/SE8603749D0/sv
Publication of SE8603749L publication Critical patent/SE8603749L/sv
Publication of SE469995B publication Critical patent/SE469995B/sv

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3185Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544Scanning methods, algorithms and patterns
    • G01R31/31855Interconnection testing, e.g. crosstalk, shortcircuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SE8603749A 1985-09-11 1986-09-08 Förfarande för testning av integrerade kretsar som är monterade på en bärare SE469995B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8502476A NL8502476A (nl) 1985-09-11 1985-09-11 Werkwijze voor het testen van dragers met meerdere digitaal-werkende geintegreerde schakelingen, drager voorzien van zulke schakelingen, geintegreerde schakeling geschikt voor het aanbrengen op zo'n drager, en testinrichting voor het testen van zulke dragers.

Publications (3)

Publication Number Publication Date
SE8603749D0 SE8603749D0 (sv) 1986-09-08
SE8603749L true SE8603749L (sv) 1987-03-12
SE469995B SE469995B (sv) 1993-10-18

Family

ID=19846534

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8603749A SE469995B (sv) 1985-09-11 1986-09-08 Förfarande för testning av integrerade kretsar som är monterade på en bärare

Country Status (8)

Country Link
US (2) US4791358A (sv)
JP (1) JP2873297B2 (sv)
CA (1) CA1257012A (sv)
DE (1) DE3627638C2 (sv)
FR (1) FR2587124B1 (sv)
GB (1) GB2180355B (sv)
NL (1) NL8502476A (sv)
SE (1) SE469995B (sv)

Families Citing this family (64)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL192801C (nl) * 1986-09-10 1998-02-03 Philips Electronics Nv Werkwijze voor het testen van een drager met meerdere digitaal-werkende geïntegreerde schakelingen, geïntegreerde schakeling geschikt voor het aanbrengen op een aldus te testen drager, en drager voorzien van meerdere van zulke geïntegreerde schakelingen.
NL8801362A (nl) * 1988-05-27 1989-12-18 Philips Nv Elektronische module bevattende een eerste substraatelement met een funktioneel deel, alsmede een tweede substraatelement voor het testen van een interkonnektiefunktie, voet bevattende zo een tweede substraatelement, substraatelement te gebruiken als zo een tweede substraatelement en elektronisch apparaat bevattende een plaat met gedrukte bedrading en ten minste twee zulke elektronische modules.
NL8801835A (nl) * 1988-07-20 1990-02-16 Philips Nv Werkwijze en inrichting voor het testen van meervoudige voedingsverbindingen van een geintegreerde schakeling op een printpaneel.
US6304987B1 (en) 1995-06-07 2001-10-16 Texas Instruments Incorporated Integrated test circuit
US4862072A (en) * 1988-09-08 1989-08-29 General Electric Company Distributed access serial port test arrangement for integrated circuits
US4996691A (en) * 1988-09-21 1991-02-26 Northern Telecom Limited Integrated circuit testing method and apparatus and integrated circuit devices for use therewith
US5077738A (en) * 1988-12-30 1991-12-31 Intel Corporation Test mode enable scheme for memory
US4875003A (en) * 1989-02-21 1989-10-17 Silicon Connections Corporation Non-contact I/O signal pad scan testing of VLSI circuits
JPH02260200A (ja) * 1989-03-30 1990-10-22 Sharp Corp 複数ビット並列テスト機能を有する半導体記憶装置における複数ビット並列機能テスト方法
JP3005250B2 (ja) 1989-06-30 2000-01-31 テキサス インスツルメンツ インコーポレイテツド バスモニター集積回路
US5115435A (en) * 1989-10-19 1992-05-19 Ncr Corporation Method and apparatus for bus executed boundary scanning
US5168501A (en) * 1990-02-06 1992-12-01 Unisys Corporation Method for checking hardware errors
KR0169736B1 (ko) * 1990-03-30 1999-01-15 엔. 라이스 머레트 데이타 통신 인터페이스 및 이의 통신 방법
US6675333B1 (en) * 1990-03-30 2004-01-06 Texas Instruments Incorporated Integrated circuit with serial I/O controller
SE466875B (sv) * 1990-08-15 1992-04-13 Ellemtel Utvecklings Ab Anordning foer att oevervaka matningsspaenningen lokalt paa integrerad krets
US5498972A (en) * 1990-08-15 1996-03-12 Telefonaktiebolaget Lm Ericsson Device for monitoring the supply voltage on integrated circuits
US5293123A (en) * 1990-10-19 1994-03-08 Tandem Computers Incorporated Pseudo-Random scan test apparatus
US5122753A (en) * 1990-12-20 1992-06-16 Microelectronics And Computer Technology Corporation Method of testing electrical components for defects
US5369645A (en) * 1991-07-02 1994-11-29 Hewlett-Packard Company Testing integrated circuit pad input and output structures
DE4132072A1 (de) * 1991-09-26 1993-04-08 Grundig Emv Pruefeinrichtung fuer integrierte schaltkreise
US5343478A (en) * 1991-11-27 1994-08-30 Ncr Corporation Computer system configuration via test bus
US5423050A (en) * 1991-11-27 1995-06-06 Ncr Corporation Intermodule test across system bus utilizing serial test bus
US5377198A (en) * 1991-11-27 1994-12-27 Ncr Corporation (Nka At&T Global Information Solutions Company JTAG instruction error detection
US5325368A (en) * 1991-11-27 1994-06-28 Ncr Corporation JTAG component description via nonvolatile memory
US5410551A (en) * 1992-01-02 1995-04-25 Andahl Corporation Net verification method and apparatus
US5448166A (en) * 1992-01-03 1995-09-05 Hewlett-Packard Company Powered testing of mixed conventional/boundary-scan logic
US5260649A (en) * 1992-01-03 1993-11-09 Hewlett-Packard Company Powered testing of mixed conventional/boundary-scan logic
US5390191A (en) * 1992-01-31 1995-02-14 Sony Corporation Apparatus and method for testing the interconnection between integrated circuits
TW253097B (sv) * 1992-03-02 1995-08-01 At & T Corp
US5341380A (en) * 1992-03-19 1994-08-23 Nec Corporation Large-scale integrated circuit device
US5270642A (en) * 1992-05-15 1993-12-14 Hewlett-Packard Company Partitioned boundary-scan testing for the reduction of testing-induced damage
GB9217728D0 (en) * 1992-08-20 1992-09-30 Texas Instruments Ltd Method of testing interconnections between integrated circuits in a circuit
DE4322249A1 (de) * 1992-10-23 1994-04-28 Marquardt Gmbh Bus-Schalter
EP0642083A1 (en) * 1993-09-04 1995-03-08 International Business Machines Corporation Test circuit and method for interconnect testing of chips
US5581176A (en) * 1993-05-24 1996-12-03 North American Philips Corporation Analog autonomous test bus framework for testing integrated circuits on a printed circuit board
GB2278689B (en) * 1993-06-02 1997-03-19 Ford Motor Co Method and apparatus for testing integrated circuits
US5864565A (en) 1993-06-15 1999-01-26 Micron Technology, Inc. Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit
US5951703A (en) * 1993-06-28 1999-09-14 Tandem Computers Incorporated System and method for performing improved pseudo-random testing of systems having multi driver buses
EP0685074B1 (en) * 1993-12-16 2004-03-17 Koninklijke Philips Electronics N.V. Device for testing the connection between an output of a means which outputs a fixed logic value and the input of a circuit
WO1995017682A1 (en) * 1993-12-21 1995-06-29 Philips Electronics N.V. Device for testing connections provided with pulling resistors
KR970011651B1 (ko) * 1994-02-02 1997-07-12 삼성전자 주식회사 반도체 소자의 버스라인 블록화에 의한 단선 검사장치 및 검사방법
JPH07306883A (ja) * 1994-05-12 1995-11-21 Fujitsu Ltd パターン評価支援装置
US5544107A (en) * 1994-08-22 1996-08-06 Adaptec, Inc. Diagnostic data port for a LSI or VLSI integrated circuit
JP2581018B2 (ja) * 1994-09-12 1997-02-12 日本電気株式会社 データ処理装置
US5969538A (en) 1996-10-31 1999-10-19 Texas Instruments Incorporated Semiconductor wafer with interconnect between dies for testing and a process of testing
US5745493A (en) * 1995-11-20 1998-04-28 International Business Machines Corporation Method and system for addressing multiple components on a communication bus
US6011387A (en) * 1996-08-12 2000-01-04 Philips Electronics North America Corporation Analog autonomous test bus framework for testing integrated circuits on a printed circuit board
US5857085A (en) * 1996-11-13 1999-01-05 Cypress Semiconductor Corporation Interface device for XT/AT system devices on high speed local bus
DE69836625D1 (de) * 1997-03-21 2007-01-25 Matsushita Electric Ind Co Ltd Prüfen der funktionellen blöcke in einer integrierten halbleiterschaltung
US6242269B1 (en) * 1997-11-03 2001-06-05 Texas Instruments Incorporated Parallel scan distributors and collectors and process of testing integrated circuits
US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
US6323694B1 (en) 1998-04-01 2001-11-27 Ltx Corporation Differential comparator with a programmable voltage offset for use in an automatic tester
US6052810A (en) * 1998-07-07 2000-04-18 Ltx Corporation Differential driver circuit for use in automatic test equipment
GB2344184A (en) * 1998-11-26 2000-05-31 Ericsson Telefon Ab L M Testing integrated circuits
US6654913B1 (en) * 1999-02-17 2003-11-25 International Business Machines Corporation Alternate port apparatus for manufacturing test of integrated serial bus and method therefor
FR2793328B1 (fr) * 1999-05-07 2001-06-29 Thomson Multimedia Sa Procede d'aide a la detection de defauts de fonctionnement dans un appareil numerique et appareil numerique associe
DE19940902C1 (de) * 1999-08-27 2001-06-21 Wolfgang Runge Prüfeinrichtung
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter
US7487419B2 (en) * 2005-06-15 2009-02-03 Nilanjan Mukherjee Reduced-pin-count-testing architectures for applying test patterns
US7386086B1 (en) * 2005-10-03 2008-06-10 Westinghouse Electric Co. Llc Printed circuit card
JP5365381B2 (ja) * 2009-07-09 2013-12-11 大日本印刷株式会社 回路板の検査方法、回路板の検査装置
JP5855616B2 (ja) * 2013-09-12 2016-02-09 大日本印刷株式会社 回路板の検査方法、回路板の検査装置
CN107861019B (zh) * 2017-11-23 2023-09-05 深圳市巴丁微电子有限公司 一种h桥的检测***及检测方法

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3761695A (en) * 1972-10-16 1973-09-25 Ibm Method of level sensitive testing a functional logic system
US4241307A (en) * 1978-08-18 1980-12-23 International Business Machines Corporation Module interconnection testing scheme
US4225957A (en) * 1978-10-16 1980-09-30 International Business Machines Corporation Testing macros embedded in LSI chips
US4244048A (en) * 1978-12-29 1981-01-06 International Business Machines Corporation Chip and wafer configuration and testing method for large-scale-integrated circuits
JPS5672367A (en) * 1979-11-17 1981-06-16 Fujitsu Ltd Circuit for test
NL8004176A (nl) * 1980-07-21 1982-02-16 Philips Nv Inrichting voor het testen van een schakeling met digitaal werkende en kombinatorisch werkende onderdelen.
US4357703A (en) * 1980-10-09 1982-11-02 Control Data Corporation Test system for LSI circuits resident on LSI chips
NL8005976A (nl) * 1980-10-31 1982-05-17 Philips Nv Tweedraads-bussysteem met een kloklijndraad en een datalijndraad voor het onderling verbinden van een aantal stations.
US4479088A (en) * 1981-01-16 1984-10-23 Burroughs Corporation Wafer including test lead connected to ground for testing networks thereon
US4494066A (en) * 1981-07-02 1985-01-15 International Business Machines Corporation Method of electrically testing a packaging structure having n interconnected integrated circuit chips
JPS5811875A (ja) * 1981-07-14 1983-01-22 Matsushita Electronics Corp 集積回路素子の自動測定装置
JPS58137060A (ja) * 1982-02-10 1983-08-15 Hitachi Ltd Lsi搭載パツケ−ジの診断方式
US4503386A (en) * 1982-04-20 1985-03-05 International Business Machines Corporation Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks
US4509008A (en) * 1982-04-20 1985-04-02 International Business Machines Corporation Method of concurrently testing each of a plurality of interconnected integrated circuit chips
DE3274910D1 (en) * 1982-09-28 1987-02-05 Ibm Device for loading and reading different chains of bistable circuits in a data processing system
EP0109770B1 (en) * 1982-11-20 1986-12-30 International Computers Limited Testing digital electronic circuits
US4580137A (en) * 1983-08-29 1986-04-01 International Business Machines Corporation LSSD-testable D-type edge-trigger-operable latch with overriding set/reset asynchronous control
JPS6082871A (ja) * 1983-10-13 1985-05-11 Nec Corp 論理集積回路
US4534028A (en) * 1983-12-01 1985-08-06 Siemens Corporate Research & Support, Inc. Random testing using scan path technique
JPH0772744B2 (ja) * 1984-09-04 1995-08-02 株式会社日立製作所 半導体集積回路装置
JPS61204744A (ja) * 1985-02-05 1986-09-10 Hitachi Ltd 診断機能を有するram内蔵lsiおよびその診断方法
US4728883A (en) * 1985-03-15 1988-03-01 Tektronix, Inc. Method of testing electronic circuits
US4710931A (en) * 1985-10-23 1987-12-01 Texas Instruments Incorporated Partitioned scan-testing system
US4710933A (en) * 1985-10-23 1987-12-01 Texas Instruments Incorporated Parallel/serial scan system for testing logic circuits

Also Published As

Publication number Publication date
GB2180355A (en) 1987-03-25
DE3627638C2 (de) 2000-04-06
JP2873297B2 (ja) 1999-03-24
GB2180355B (en) 1990-01-24
SE469995B (sv) 1993-10-18
US4879717A (en) 1989-11-07
DE3627638A1 (de) 1987-03-19
JPS6262275A (ja) 1987-03-18
GB8621538D0 (en) 1986-10-15
FR2587124A1 (fr) 1987-03-13
FR2587124B1 (fr) 1987-12-18
SE8603749D0 (sv) 1986-09-08
NL8502476A (nl) 1987-04-01
CA1257012A (en) 1989-07-04
US4791358A (en) 1988-12-13

Similar Documents

Publication Publication Date Title
SE8603749L (sv) Forfarande for testning av berare forsedda med ett flertal digitala integrerade kretsar, berare forsedd med sadana kretsar, integrerad krets lempad for montering pa en sadan berare och testanordning for testning av sada
IT1230685B (it) Collaudo di circuiti integrati presenti su un supporto
DE69429741T2 (de) Analoge, selbstständige Prüfbusstruktur zum Testen integrierter Schaltungen auf einer gedruckten Leiterplatte
KR890017546A (ko) 전자 모듈 소켓장치
SE8405090D0 (sv) Vlsi-krets som er uppdelad i isokrona regioner, sett for maskinell konstruktion av en sadan krets och sett for maskinell testning av en sadan krets
IT1162778B (it) Apparecchiatura per provare circuiti semiconduttori integrati
DE3382311D1 (en) Online-monitor.
YU44989A (sh) Višeslojno memorijsko štampano kolo za površinsku montažu
SE8005980L (sv) Metod och anordning for montering av elektriska komponenter pa tryckta kretskort
FR2461361B1 (fr) Blocs de puces de circuits integres pour circuits logiques
KR870007460A (ko) 캐리선견가산기와 캐리전송방법
KR880014475A (ko) 반도체 집적회로장치
TW352466B (en) Apparatus and method for testing integrated circuit
FR2648916B1 (fr) Agencement de test de cartes a circuit imprime et son application au test de cartes a circuit imprime formant un equipement de multiplexage-demultiplexage de signaux numeriques
DE69314683T2 (de) Verfahren und Gerät zum Prüfen von Ein-/Ausgabeverbindungen des Randsteckverbinders einer Schaltkreiskarte mit Boundary Scan
DE69321207T2 (de) Abtastprüfung für integrierte Schaltkreise
ATE108294T1 (de) Modul für eine aus mehreren auf einem träger nebeneinander angeordneten modulen bestehenden steuerung.
DE3887599D1 (de) Prüfen von integrierten Schaltungen auf einer bestückten Leiterplatte.
DE69118451D1 (de) Prüfungsanordnung für elektrische Schaltungen auf Printplatten
ATE139355T1 (de) Zusammengesetzte elektrische bauteile
DE69821231D1 (de) Verbindungsvorrichtung mit signalbus
DE60026093D1 (de) Halbleitervorrichtung mit Makros und Prüfverfahren dafür
MX166192B (es) Destrabado automatico de reloj en un tablero de circuito
SE9604704D0 (sv) Metoder och anordning vid kretskortskonstruktion
DE19981507D2 (de) Integrierte Schaltung mit eingebautem Baugruppentest

Legal Events

Date Code Title Description
NAL Patent in force

Ref document number: 8603749-6

Format of ref document f/p: F

NUG Patent has lapsed