DE69836625D1 - Prüfen der funktionellen blöcke in einer integrierten halbleiterschaltung - Google Patents

Prüfen der funktionellen blöcke in einer integrierten halbleiterschaltung

Info

Publication number
DE69836625D1
DE69836625D1 DE69836625T DE69836625T DE69836625D1 DE 69836625 D1 DE69836625 D1 DE 69836625D1 DE 69836625 T DE69836625 T DE 69836625T DE 69836625 T DE69836625 T DE 69836625T DE 69836625 D1 DE69836625 D1 DE 69836625D1
Authority
DE
Germany
Prior art keywords
inspect
functional blocks
semiconductor circuit
integrated semiconductor
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69836625T
Other languages
English (en)
Inventor
Mitsuyasu Ohta
Sadami Takeoka
Toshihiro Hiraoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Application granted granted Critical
Publication of DE69836625D1 publication Critical patent/DE69836625D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0207—Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
DE69836625T 1997-03-21 1998-03-20 Prüfen der funktionellen blöcke in einer integrierten halbleiterschaltung Expired - Lifetime DE69836625D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP6766797 1997-03-21
PCT/JP1998/001249 WO1998043101A1 (fr) 1997-03-21 1998-03-20 Bloc fonctionnel pour circuit integre, circuit integre a semiconducteur, procede d'inspection de circuits integres a semiconducteur, et procede de conception associe

Publications (1)

Publication Number Publication Date
DE69836625D1 true DE69836625D1 (de) 2007-01-25

Family

ID=13351592

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69836625T Expired - Lifetime DE69836625D1 (de) 1997-03-21 1998-03-20 Prüfen der funktionellen blöcke in einer integrierten halbleiterschaltung

Country Status (6)

Country Link
US (2) US6708301B1 (de)
EP (1) EP0969289B1 (de)
KR (1) KR100522217B1 (de)
DE (1) DE69836625D1 (de)
TW (1) TW366450B (de)
WO (1) WO1998043101A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3654104B2 (ja) * 2000-01-12 2005-06-02 富士通株式会社 試験方法、動作条件設定方法及び動作条件設定可能な装置
KR100657255B1 (ko) * 2000-06-16 2006-12-14 삼성전자주식회사 비디오 신호 처리 시스템
JP4846128B2 (ja) * 2001-07-12 2011-12-28 ルネサスエレクトロニクス株式会社 半導体装置およびそのテスト方法
US7027947B2 (en) * 2003-04-03 2006-04-11 Fujitsu Limited Integrated circuit testing method, program, storing medium, and apparatus
JP4063207B2 (ja) * 2003-12-04 2008-03-19 株式会社リコー 画像処理装置検査システムと方法およびプログラム
KR100657830B1 (ko) * 2005-01-24 2006-12-14 삼성전자주식회사 반도체 메모리 장치의 테스트 장치 및 방법
US7587645B2 (en) * 2005-01-24 2009-09-08 Samsung Electronics Co., Ltd. Input circuit of semiconductor memory device and test system having the same
CN101111776A (zh) * 2005-01-27 2008-01-23 松下电器产业株式会社 半导体集成电路和***lsi
US7447958B2 (en) * 2005-05-05 2008-11-04 Cypress Semiconductor Corporation Parallel input/output self-test circuit and method
JP5601860B2 (ja) * 2010-03-26 2014-10-08 ピーエスフォー ルクスコ エスエイアールエル 半導体装置
TWI435208B (zh) * 2010-12-02 2014-04-21 Realtek Semiconductor Corp 積體電路與其控制方法
DE102012009256B4 (de) * 2012-05-02 2015-08-06 Norma Germany Gmbh Profilschelle
JP6295113B2 (ja) * 2014-03-17 2018-03-14 ルネサスエレクトロニクス株式会社 自己診断装置及び自己診断方法
US9835680B2 (en) 2015-03-16 2017-12-05 Taiwan Semiconductor Manufacturing Company, Ltd. Method, device and computer program product for circuit testing
CN112768444B (zh) * 2020-12-31 2023-06-13 成都海光集成电路设计有限公司 集成电路芯片、数据分析***及电子设备

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8502476A (nl) * 1985-09-11 1987-04-01 Philips Nv Werkwijze voor het testen van dragers met meerdere digitaal-werkende geintegreerde schakelingen, drager voorzien van zulke schakelingen, geintegreerde schakeling geschikt voor het aanbrengen op zo'n drager, en testinrichting voor het testen van zulke dragers.
JPH01237472A (ja) * 1988-03-18 1989-09-21 Fujitsu Ltd 実装配線試験システム
US5173906A (en) * 1990-08-31 1992-12-22 Dreibelbis Jeffrey H Built-in self test for integrated circuits
JPH0599993A (ja) * 1991-04-15 1993-04-23 Internatl Business Mach Corp <Ibm> 試験可能な走査ストリングを有する論理回路
JPH0552910A (ja) * 1991-08-22 1993-03-02 Fujitsu Ltd 高速論理ユニツトにおける信号伝播特性試験方式
US5258985A (en) * 1991-11-12 1993-11-02 Motorola, Inc. Combinational data generator and analyzer for built-in self test
JPH05158724A (ja) * 1991-12-05 1993-06-25 Nec Ibaraki Ltd Ｌｓｉ間接続診断方式
JP3247937B2 (ja) * 1992-09-24 2002-01-21 株式会社日立製作所 論理集積回路
JPH06186302A (ja) * 1992-12-18 1994-07-08 Nippon Steel Corp 半導体装置
US6055661A (en) * 1994-06-13 2000-04-25 Luk; Fong System configuration and methods for on-the-fly testing of integrated circuits
JPH08248096A (ja) * 1995-03-13 1996-09-27 Advantest Corp 回路試験装置
US5991907A (en) * 1996-02-02 1999-11-23 Lucent Technologies Inc. Method for testing field programmable gate arrays
US5805608A (en) * 1996-10-18 1998-09-08 Samsung Electronics Co., Ltd. Clock generation for testing of integrated circuits
US5812562A (en) * 1996-11-15 1998-09-22 Samsung Electronics Company, Ltd. Low cost emulation scheme implemented via clock control using JTAG controller in a scan environment
US5790561A (en) * 1997-01-17 1998-08-04 Rockwell International Corporation Internal testability system for microprocessor-based integrated circuit
JP3501200B2 (ja) * 1997-02-21 2004-03-02 株式会社アドバンテスト Ｉｃ試験装置

Also Published As

Publication number Publication date
WO1998043101A1 (fr) 1998-10-01
EP0969289A4 (de) 2004-09-08
EP0969289A1 (de) 2000-01-05
TW366450B (en) 1999-08-11
EP0969289B1 (de) 2006-12-13
KR20000076281A (ko) 2000-12-26
KR100522217B1 (ko) 2005-10-14
US20040139376A1 (en) 2004-07-15
US6708301B1 (en) 2004-03-16

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Legal Events

Date Code Title Description
8332 No legal effect for de