DE69118451D1 - Prüfungsanordnung für elektrische Schaltungen auf Printplatten - Google Patents

Prüfungsanordnung für elektrische Schaltungen auf Printplatten

Info

Publication number
DE69118451D1
DE69118451D1 DE69118451T DE69118451T DE69118451D1 DE 69118451 D1 DE69118451 D1 DE 69118451D1 DE 69118451 T DE69118451 T DE 69118451T DE 69118451 T DE69118451 T DE 69118451T DE 69118451 D1 DE69118451 D1 DE 69118451D1
Authority
DE
Germany
Prior art keywords
printed circuit
circuit boards
electrical circuits
test arrangement
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69118451T
Other languages
English (en)
Other versions
DE69118451T2 (de
Inventor
Klooster Robert Karel Athe Van
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronics NV filed Critical Philips Electronics NV
Publication of DE69118451D1 publication Critical patent/DE69118451D1/de
Application granted granted Critical
Publication of DE69118451T2 publication Critical patent/DE69118451T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE69118451T 1990-06-28 1991-06-18 Prüfungsanordnung für elektrische Schaltungen auf Printplatten Expired - Fee Related DE69118451T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL9001478A NL9001478A (nl) 1990-06-28 1990-06-28 Testinrichting voor electrische schakelingen op panelen.

Publications (2)

Publication Number Publication Date
DE69118451D1 true DE69118451D1 (de) 1996-05-09
DE69118451T2 DE69118451T2 (de) 1996-10-02

Family

ID=19857328

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69118451T Expired - Fee Related DE69118451T2 (de) 1990-06-28 1991-06-18 Prüfungsanordnung für elektrische Schaltungen auf Printplatten

Country Status (6)

Country Link
US (1) US5166601A (de)
EP (1) EP0463684B1 (de)
JP (1) JPH04233248A (de)
CN (1) CN1026357C (de)
DE (1) DE69118451T2 (de)
NL (1) NL9001478A (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4313962C1 (de) * 1993-04-28 1994-09-29 Siemens Ag Vorrichtung für den automatischen Test von hochintegrierten Baugruppen
US5793218A (en) * 1995-12-15 1998-08-11 Lear Astronics Corporation Generic interface test adapter
DE19814312C2 (de) * 1998-03-31 2000-06-08 Deutsche Telekom Ag Vorrichtung zum automatischen Testen von Baugruppen oder Bauateilen
US6335627B1 (en) * 1998-04-13 2002-01-01 Intel Corporation Apparatus and method for testing an electronics package substrate
US6468098B1 (en) * 1999-08-17 2002-10-22 Formfactor, Inc. Electrical contactor especially wafer level contactor using fluid pressure
US7396236B2 (en) 2001-03-16 2008-07-08 Formfactor, Inc. Wafer level interposer
US7122760B2 (en) 2002-11-25 2006-10-17 Formfactor, Inc. Using electric discharge machining to manufacture probes
US6945827B2 (en) 2002-12-23 2005-09-20 Formfactor, Inc. Microelectronic contact structure
US20050131513A1 (en) * 2003-12-16 2005-06-16 Cook Incorporated Stent catheter with a permanently affixed conductor
CN100419433C (zh) * 2004-09-24 2008-09-17 京元电子股份有限公司 具有讯号转接装置的集成电路插座及电子元件测试方法
JP5334355B2 (ja) * 2005-05-27 2013-11-06 ヤマハファインテック株式会社 プリント基板の電気検査装置および電気検査方法
CN101424702B (zh) * 2007-10-29 2010-07-28 京元电子股份有限公司 一种探针、测试插座及其测试机
DE102009012021B4 (de) * 2009-03-10 2011-02-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Messvorrichtung zur elektrischen Vermessung einer einseitig an einer Messseite elektrisch kontaktierbaren Messstruktur
CN102466760A (zh) * 2010-11-08 2012-05-23 亚旭电脑股份有限公司 频率测量装置
CN102944829B (zh) * 2012-10-30 2015-04-15 江苏斯菲尔电气股份有限公司 一种多功能的线路板测试机台及其使用方法
CN105093044B (zh) * 2015-09-14 2018-06-05 博众精工科技股份有限公司 一种针载板模组测试机构

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4115735A (en) * 1976-10-14 1978-09-19 Faultfinders, Inc. Test fixture employing plural platens for advancing some or all of the probes of the test fixture
US4321533A (en) * 1979-04-19 1982-03-23 Fairchild Camera & Instrument Corp. Printed circuit board test fixture having interchangeable card personalizers
US4344033A (en) * 1980-09-12 1982-08-10 Virginia Panel Corporation Vacuum-actuated test fixture for printed circuit boards
US4625164A (en) * 1984-03-05 1986-11-25 Pylon Company Vacuum actuated bi-level test fixture
US4626776A (en) * 1984-06-07 1986-12-02 O. B. Test Group, Inc. Programmable test fixture
US4626779A (en) * 1985-03-19 1986-12-02 Pylon Company, Inc. Spring-stops for a bi-level test fixture
GB2178860B (en) * 1985-08-09 1988-12-14 Databasix Limited Improvements in or relating to testing equipment for printed circuit boards
US4667155A (en) * 1986-01-07 1987-05-19 Virginia Panel Corporation Modular molded vacuum test fixture
US4636723A (en) * 1986-03-21 1987-01-13 Coffin Harry S Testing device for printed circuit boards
US4746861A (en) * 1986-08-21 1988-05-24 Tti Testron, Inc. Test fixture for printed circuit board assembly
US4841231A (en) * 1987-10-30 1989-06-20 Unisys Corporation Test probe accessibility method and tool
GB2223631B (en) * 1988-10-06 1993-01-13 British Aerospace Universal test fixture

Also Published As

Publication number Publication date
CN1026357C (zh) 1994-10-26
EP0463684B1 (de) 1996-04-03
US5166601A (en) 1992-11-24
CN1057719A (zh) 1992-01-08
JPH04233248A (ja) 1992-08-21
NL9001478A (nl) 1992-01-16
DE69118451T2 (de) 1996-10-02
EP0463684A1 (de) 1992-01-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V., EINDHOVEN, N

8339 Ceased/non-payment of the annual fee