DE3887599D1 - Prüfen von integrierten Schaltungen auf einer bestückten Leiterplatte. - Google Patents

Prüfen von integrierten Schaltungen auf einer bestückten Leiterplatte.

Info

Publication number
DE3887599D1
DE3887599D1 DE88114058T DE3887599T DE3887599D1 DE 3887599 D1 DE3887599 D1 DE 3887599D1 DE 88114058 T DE88114058 T DE 88114058T DE 3887599 T DE3887599 T DE 3887599T DE 3887599 D1 DE3887599 D1 DE 3887599D1
Authority
DE
Germany
Prior art keywords
circuit board
printed circuit
integrated circuits
testing integrated
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE88114058T
Other languages
English (en)
Other versions
DE3887599T2 (de
Inventor
Loan David R Van
Mark Andrew Swart
Charles Joseph Johnston
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Everett Charles Technologies Inc
Original Assignee
Everett Charles Contact Products Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Everett Charles Contact Products Inc filed Critical Everett Charles Contact Products Inc
Publication of DE3887599D1 publication Critical patent/DE3887599D1/de
Application granted granted Critical
Publication of DE3887599T2 publication Critical patent/DE3887599T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425—Test clips, e.g. for IC's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE19883887599 1987-08-31 1988-08-29 Prüfen von integrierten Schaltungen auf einer bestückten Leiterplatte. Expired - Fee Related DE3887599T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US9153687A 1987-08-31 1987-08-31
US14299088A 1988-01-12 1988-01-12
US21436588A 1988-07-01 1988-07-01

Publications (2)

Publication Number Publication Date
DE3887599D1 true DE3887599D1 (de) 1994-03-17
DE3887599T2 DE3887599T2 (de) 1994-05-11

Family

ID=27376925

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19883887599 Expired - Fee Related DE3887599T2 (de) 1987-08-31 1988-08-29 Prüfen von integrierten Schaltungen auf einer bestückten Leiterplatte.

Country Status (3)

Country Link
EP (1) EP0305951B1 (de)
JP (1) JP2598482B2 (de)
DE (1) DE3887599T2 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5166609A (en) * 1990-05-24 1992-11-24 Tektronix, Inc. Adapter and test fixture for an integrated circuit device package
US5205741A (en) * 1991-08-14 1993-04-27 Hewlett-Packard Company Connector assembly for testing integrated circuit packages
US5389885A (en) * 1992-01-27 1995-02-14 Everett Charles Technologies, Inc. Expandable diaphragm test modules and connectors
WO1994015220A1 (en) * 1992-12-17 1994-07-07 Vlsi Technology, Inc. Integrated circuit test jig
US5391082A (en) * 1993-10-26 1995-02-21 Airhart; Durwood Conductive wedges for interdigitating with adjacent legs of an IC or the like
US5463324A (en) * 1993-10-26 1995-10-31 Hewlett-Packard Company Probe with contacts that interdigitate with and wedge between adjacent legs of an IC or the like
CN1296568A (zh) * 1998-01-12 2001-05-23 英特尔公司 测试供电***的改进的电源触点
AU9196198A (en) * 1998-09-09 2000-03-27 Spire Technologies Pte Ltd Interface device between testing equipment and integrated circuit
JP4271435B2 (ja) * 2002-12-09 2009-06-03 シャープ株式会社 半導体装置
TWI445109B (zh) * 2006-07-07 2014-07-11 Advanced Inquiry Systems Inc 平面延伸電導體超越基材邊緣的方法和設備
US7723980B2 (en) * 2007-03-22 2010-05-25 Advanced Inquiry Systems, Inc. Fully tested wafers having bond pads undamaged by probing and applications thereof
CN102445569A (zh) * 2010-10-11 2012-05-09 苏州路之遥科技股份有限公司 一种pcb板测试治具底盘
CN104698225A (zh) * 2013-12-06 2015-06-10 国网上海市电力公司 一种晶闸管快速试验操作杆
DE102016111884A1 (de) * 2016-06-29 2018-01-04 Infineon Technologies Ag Vorrichtung, System und Verfahren zum automatischen Testen integrierter Antennen
CN110109004B (zh) * 2019-06-10 2024-06-18 成都鸿芯光电通信有限公司 一种多触点定位测试装置
PH12020050134A1 (en) * 2019-06-12 2021-09-01 Jf Microtechnology Sdn Bhd Wedged contact fingers for integrated circuit testing apparatus
KR102075484B1 (ko) * 2019-12-30 2020-02-10 윤찬 반도체 테스트용 소켓

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3573617A (en) * 1967-10-27 1971-04-06 Aai Corp Method and apparatus for testing packaged integrated circuits
US3701077A (en) * 1969-12-29 1972-10-24 Tech Inc K Electronic components
US4138186A (en) * 1977-07-22 1979-02-06 Everett/Charles, Inc. Test apparatus
GB2061630A (en) * 1979-10-17 1981-05-13 Standard Telephones Cables Ltd Apparatus for testing printed circuit boards
JPS6216481U (de) * 1985-07-15 1987-01-31

Also Published As

Publication number Publication date
EP0305951A1 (de) 1989-03-08
JP2598482B2 (ja) 1997-04-09
JPH026764A (ja) 1990-01-10
EP0305951B1 (de) 1994-02-02
DE3887599T2 (de) 1994-05-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee