DE3887599D1 - Prüfen von integrierten Schaltungen auf einer bestückten Leiterplatte. - Google Patents
Prüfen von integrierten Schaltungen auf einer bestückten Leiterplatte.Info
- Publication number
- DE3887599D1 DE3887599D1 DE88114058T DE3887599T DE3887599D1 DE 3887599 D1 DE3887599 D1 DE 3887599D1 DE 88114058 T DE88114058 T DE 88114058T DE 3887599 T DE3887599 T DE 3887599T DE 3887599 D1 DE3887599 D1 DE 3887599D1
- Authority
- DE
- Germany
- Prior art keywords
- circuit board
- printed circuit
- integrated circuits
- testing integrated
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US9153687A | 1987-08-31 | 1987-08-31 | |
US14299088A | 1988-01-12 | 1988-01-12 | |
US21436588A | 1988-07-01 | 1988-07-01 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3887599D1 true DE3887599D1 (de) | 1994-03-17 |
DE3887599T2 DE3887599T2 (de) | 1994-05-11 |
Family
ID=27376925
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19883887599 Expired - Fee Related DE3887599T2 (de) | 1987-08-31 | 1988-08-29 | Prüfen von integrierten Schaltungen auf einer bestückten Leiterplatte. |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0305951B1 (de) |
JP (1) | JP2598482B2 (de) |
DE (1) | DE3887599T2 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5166609A (en) * | 1990-05-24 | 1992-11-24 | Tektronix, Inc. | Adapter and test fixture for an integrated circuit device package |
US5205741A (en) * | 1991-08-14 | 1993-04-27 | Hewlett-Packard Company | Connector assembly for testing integrated circuit packages |
US5389885A (en) * | 1992-01-27 | 1995-02-14 | Everett Charles Technologies, Inc. | Expandable diaphragm test modules and connectors |
WO1994015220A1 (en) * | 1992-12-17 | 1994-07-07 | Vlsi Technology, Inc. | Integrated circuit test jig |
US5391082A (en) * | 1993-10-26 | 1995-02-21 | Airhart; Durwood | Conductive wedges for interdigitating with adjacent legs of an IC or the like |
US5463324A (en) * | 1993-10-26 | 1995-10-31 | Hewlett-Packard Company | Probe with contacts that interdigitate with and wedge between adjacent legs of an IC or the like |
CN1296568A (zh) * | 1998-01-12 | 2001-05-23 | 英特尔公司 | 测试供电***的改进的电源触点 |
AU9196198A (en) * | 1998-09-09 | 2000-03-27 | Spire Technologies Pte Ltd | Interface device between testing equipment and integrated circuit |
JP4271435B2 (ja) * | 2002-12-09 | 2009-06-03 | シャープ株式会社 | 半導体装置 |
TWI445109B (zh) * | 2006-07-07 | 2014-07-11 | Advanced Inquiry Systems Inc | 平面延伸電導體超越基材邊緣的方法和設備 |
US7723980B2 (en) * | 2007-03-22 | 2010-05-25 | Advanced Inquiry Systems, Inc. | Fully tested wafers having bond pads undamaged by probing and applications thereof |
CN102445569A (zh) * | 2010-10-11 | 2012-05-09 | 苏州路之遥科技股份有限公司 | 一种pcb板测试治具底盘 |
CN104698225A (zh) * | 2013-12-06 | 2015-06-10 | 国网上海市电力公司 | 一种晶闸管快速试验操作杆 |
DE102016111884A1 (de) * | 2016-06-29 | 2018-01-04 | Infineon Technologies Ag | Vorrichtung, System und Verfahren zum automatischen Testen integrierter Antennen |
CN110109004B (zh) * | 2019-06-10 | 2024-06-18 | 成都鸿芯光电通信有限公司 | 一种多触点定位测试装置 |
PH12020050134A1 (en) * | 2019-06-12 | 2021-09-01 | Jf Microtechnology Sdn Bhd | Wedged contact fingers for integrated circuit testing apparatus |
KR102075484B1 (ko) * | 2019-12-30 | 2020-02-10 | 윤찬 | 반도체 테스트용 소켓 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3573617A (en) * | 1967-10-27 | 1971-04-06 | Aai Corp | Method and apparatus for testing packaged integrated circuits |
US3701077A (en) * | 1969-12-29 | 1972-10-24 | Tech Inc K | Electronic components |
US4138186A (en) * | 1977-07-22 | 1979-02-06 | Everett/Charles, Inc. | Test apparatus |
GB2061630A (en) * | 1979-10-17 | 1981-05-13 | Standard Telephones Cables Ltd | Apparatus for testing printed circuit boards |
JPS6216481U (de) * | 1985-07-15 | 1987-01-31 |
-
1988
- 1988-08-29 DE DE19883887599 patent/DE3887599T2/de not_active Expired - Fee Related
- 1988-08-29 EP EP88114058A patent/EP0305951B1/de not_active Expired - Lifetime
- 1988-08-31 JP JP63218221A patent/JP2598482B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0305951A1 (de) | 1989-03-08 |
JP2598482B2 (ja) | 1997-04-09 |
JPH026764A (ja) | 1990-01-10 |
EP0305951B1 (de) | 1994-02-02 |
DE3887599T2 (de) | 1994-05-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |