SE8603749D0 - Forfarande for testning av berare forsedda med ett flertal digitala integrerade kretsar, berare forsedd med sadana kretsar, integrerad krets lempad for montering pa en sadan berare och testanordning for testning av sada - Google Patents
Forfarande for testning av berare forsedda med ett flertal digitala integrerade kretsar, berare forsedd med sadana kretsar, integrerad krets lempad for montering pa en sadan berare och testanordning for testning av sadaInfo
- Publication number
- SE8603749D0 SE8603749D0 SE8603749A SE8603749A SE8603749D0 SE 8603749 D0 SE8603749 D0 SE 8603749D0 SE 8603749 A SE8603749 A SE 8603749A SE 8603749 A SE8603749 A SE 8603749A SE 8603749 D0 SE8603749 D0 SE 8603749D0
- Authority
- SE
- Sweden
- Prior art keywords
- testing
- integrated circuit
- bearing provided
- integrated circuits
- circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
- G01R31/31855—Interconnection testing, e.g. crosstalk, shortcircuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8502476A NL8502476A (nl) | 1985-09-11 | 1985-09-11 | Werkwijze voor het testen van dragers met meerdere digitaal-werkende geintegreerde schakelingen, drager voorzien van zulke schakelingen, geintegreerde schakeling geschikt voor het aanbrengen op zo'n drager, en testinrichting voor het testen van zulke dragers. |
Publications (3)
Publication Number | Publication Date |
---|---|
SE8603749D0 true SE8603749D0 (sv) | 1986-09-08 |
SE8603749L SE8603749L (sv) | 1987-03-12 |
SE469995B SE469995B (sv) | 1993-10-18 |
Family
ID=19846534
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE8603749A SE469995B (sv) | 1985-09-11 | 1986-09-08 | Förfarande för testning av integrerade kretsar som är monterade på en bärare |
Country Status (8)
Country | Link |
---|---|
US (2) | US4791358A (sv) |
JP (1) | JP2873297B2 (sv) |
CA (1) | CA1257012A (sv) |
DE (1) | DE3627638C2 (sv) |
FR (1) | FR2587124B1 (sv) |
GB (1) | GB2180355B (sv) |
NL (1) | NL8502476A (sv) |
SE (1) | SE469995B (sv) |
Families Citing this family (64)
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NL192801C (nl) * | 1986-09-10 | 1998-02-03 | Philips Electronics Nv | Werkwijze voor het testen van een drager met meerdere digitaal-werkende geïntegreerde schakelingen, geïntegreerde schakeling geschikt voor het aanbrengen op een aldus te testen drager, en drager voorzien van meerdere van zulke geïntegreerde schakelingen. |
NL8801362A (nl) * | 1988-05-27 | 1989-12-18 | Philips Nv | Elektronische module bevattende een eerste substraatelement met een funktioneel deel, alsmede een tweede substraatelement voor het testen van een interkonnektiefunktie, voet bevattende zo een tweede substraatelement, substraatelement te gebruiken als zo een tweede substraatelement en elektronisch apparaat bevattende een plaat met gedrukte bedrading en ten minste twee zulke elektronische modules. |
NL8801835A (nl) * | 1988-07-20 | 1990-02-16 | Philips Nv | Werkwijze en inrichting voor het testen van meervoudige voedingsverbindingen van een geintegreerde schakeling op een printpaneel. |
US6304987B1 (en) | 1995-06-07 | 2001-10-16 | Texas Instruments Incorporated | Integrated test circuit |
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JP3005250B2 (ja) | 1989-06-30 | 2000-01-31 | テキサス インスツルメンツ インコーポレイテツド | バスモニター集積回路 |
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US6675333B1 (en) * | 1990-03-30 | 2004-01-06 | Texas Instruments Incorporated | Integrated circuit with serial I/O controller |
KR0169736B1 (ko) * | 1990-03-30 | 1999-01-15 | 엔. 라이스 머레트 | 데이타 통신 인터페이스 및 이의 통신 방법 |
SE466875B (sv) * | 1990-08-15 | 1992-04-13 | Ellemtel Utvecklings Ab | Anordning foer att oevervaka matningsspaenningen lokalt paa integrerad krets |
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DE4132072A1 (de) * | 1991-09-26 | 1993-04-08 | Grundig Emv | Pruefeinrichtung fuer integrierte schaltkreise |
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US5343478A (en) * | 1991-11-27 | 1994-08-30 | Ncr Corporation | Computer system configuration via test bus |
US5325368A (en) * | 1991-11-27 | 1994-06-28 | Ncr Corporation | JTAG component description via nonvolatile memory |
US5410551A (en) * | 1992-01-02 | 1995-04-25 | Andahl Corporation | Net verification method and apparatus |
US5448166A (en) * | 1992-01-03 | 1995-09-05 | Hewlett-Packard Company | Powered testing of mixed conventional/boundary-scan logic |
US5260649A (en) * | 1992-01-03 | 1993-11-09 | Hewlett-Packard Company | Powered testing of mixed conventional/boundary-scan logic |
US5390191A (en) * | 1992-01-31 | 1995-02-14 | Sony Corporation | Apparatus and method for testing the interconnection between integrated circuits |
TW253097B (sv) * | 1992-03-02 | 1995-08-01 | At & T Corp | |
US5341380A (en) * | 1992-03-19 | 1994-08-23 | Nec Corporation | Large-scale integrated circuit device |
US5270642A (en) * | 1992-05-15 | 1993-12-14 | Hewlett-Packard Company | Partitioned boundary-scan testing for the reduction of testing-induced damage |
GB9217728D0 (en) * | 1992-08-20 | 1992-09-30 | Texas Instruments Ltd | Method of testing interconnections between integrated circuits in a circuit |
DE4322249A1 (de) * | 1992-10-23 | 1994-04-28 | Marquardt Gmbh | Bus-Schalter |
EP0642083A1 (en) * | 1993-09-04 | 1995-03-08 | International Business Machines Corporation | Test circuit and method for interconnect testing of chips |
US5581176A (en) * | 1993-05-24 | 1996-12-03 | North American Philips Corporation | Analog autonomous test bus framework for testing integrated circuits on a printed circuit board |
GB2278689B (en) * | 1993-06-02 | 1997-03-19 | Ford Motor Co | Method and apparatus for testing integrated circuits |
US5864565A (en) | 1993-06-15 | 1999-01-26 | Micron Technology, Inc. | Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit |
US5951703A (en) * | 1993-06-28 | 1999-09-14 | Tandem Computers Incorporated | System and method for performing improved pseudo-random testing of systems having multi driver buses |
WO1995016924A1 (en) * | 1993-12-16 | 1995-06-22 | Philips Electronics N.V. | Device for testing the connection between an output of a means which outputs a fixed logic value and the input of a circuit |
EP0685075B1 (en) * | 1993-12-21 | 2002-04-03 | Koninklijke Philips Electronics N.V. | Device for testing connections provided with pulling resistors |
KR970011651B1 (ko) * | 1994-02-02 | 1997-07-12 | 삼성전자 주식회사 | 반도체 소자의 버스라인 블록화에 의한 단선 검사장치 및 검사방법 |
JPH07306883A (ja) * | 1994-05-12 | 1995-11-21 | Fujitsu Ltd | パターン評価支援装置 |
US5544107A (en) * | 1994-08-22 | 1996-08-06 | Adaptec, Inc. | Diagnostic data port for a LSI or VLSI integrated circuit |
JP2581018B2 (ja) * | 1994-09-12 | 1997-02-12 | 日本電気株式会社 | データ処理装置 |
US5969538A (en) | 1996-10-31 | 1999-10-19 | Texas Instruments Incorporated | Semiconductor wafer with interconnect between dies for testing and a process of testing |
US5745493A (en) * | 1995-11-20 | 1998-04-28 | International Business Machines Corporation | Method and system for addressing multiple components on a communication bus |
US6011387A (en) * | 1996-08-12 | 2000-01-04 | Philips Electronics North America Corporation | Analog autonomous test bus framework for testing integrated circuits on a printed circuit board |
US5857085A (en) * | 1996-11-13 | 1999-01-05 | Cypress Semiconductor Corporation | Interface device for XT/AT system devices on high speed local bus |
EP0969289B1 (en) * | 1997-03-21 | 2006-12-13 | Matsushita Electric Industrial Co., Ltd. | Testing the functional blocks in a semiconductor integrated circuit |
US6242269B1 (en) * | 1997-11-03 | 2001-06-05 | Texas Instruments Incorporated | Parallel scan distributors and collectors and process of testing integrated circuits |
US6405335B1 (en) | 1998-02-25 | 2002-06-11 | Texas Instruments Incorporated | Position independent testing of circuits |
US6323694B1 (en) | 1998-04-01 | 2001-11-27 | Ltx Corporation | Differential comparator with a programmable voltage offset for use in an automatic tester |
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US6654913B1 (en) * | 1999-02-17 | 2003-11-25 | International Business Machines Corporation | Alternate port apparatus for manufacturing test of integrated serial bus and method therefor |
FR2793328B1 (fr) * | 1999-05-07 | 2001-06-29 | Thomson Multimedia Sa | Procede d'aide a la detection de defauts de fonctionnement dans un appareil numerique et appareil numerique associe |
DE19940902C1 (de) * | 1999-08-27 | 2001-06-21 | Wolfgang Runge | Prüfeinrichtung |
US6728915B2 (en) | 2000-01-10 | 2004-04-27 | Texas Instruments Incorporated | IC with shared scan cells selectively connected in scan path |
US6769080B2 (en) | 2000-03-09 | 2004-07-27 | Texas Instruments Incorporated | Scan circuit low power adapter with counter |
US7487419B2 (en) | 2005-06-15 | 2009-02-03 | Nilanjan Mukherjee | Reduced-pin-count-testing architectures for applying test patterns |
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JP5365381B2 (ja) * | 2009-07-09 | 2013-12-11 | 大日本印刷株式会社 | 回路板の検査方法、回路板の検査装置 |
JP5855616B2 (ja) * | 2013-09-12 | 2016-02-09 | 大日本印刷株式会社 | 回路板の検査方法、回路板の検査装置 |
CN107861019B (zh) * | 2017-11-23 | 2023-09-05 | 深圳市巴丁微电子有限公司 | 一种h桥的检测***及检测方法 |
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-
1985
- 1985-09-11 NL NL8502476A patent/NL8502476A/nl not_active Application Discontinuation
-
1986
- 1986-08-14 DE DE3627638A patent/DE3627638C2/de not_active Expired - Lifetime
- 1986-09-02 US US06/902,910 patent/US4791358A/en not_active Expired - Lifetime
- 1986-09-08 JP JP61209756A patent/JP2873297B2/ja not_active Expired - Lifetime
- 1986-09-08 SE SE8603749A patent/SE469995B/sv not_active IP Right Cessation
- 1986-09-08 GB GB8621538A patent/GB2180355B/en not_active Expired - Lifetime
- 1986-09-08 CA CA000517650A patent/CA1257012A/en not_active Expired
- 1986-09-09 FR FR8612607A patent/FR2587124B1/fr not_active Expired
-
1988
- 1988-09-02 US US07/239,714 patent/US4879717A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
FR2587124A1 (fr) | 1987-03-13 |
GB8621538D0 (en) | 1986-10-15 |
GB2180355B (en) | 1990-01-24 |
NL8502476A (nl) | 1987-04-01 |
US4879717A (en) | 1989-11-07 |
SE469995B (sv) | 1993-10-18 |
DE3627638A1 (de) | 1987-03-19 |
US4791358A (en) | 1988-12-13 |
CA1257012A (en) | 1989-07-04 |
DE3627638C2 (de) | 2000-04-06 |
SE8603749L (sv) | 1987-03-12 |
JPS6262275A (ja) | 1987-03-18 |
GB2180355A (en) | 1987-03-25 |
FR2587124B1 (fr) | 1987-12-18 |
JP2873297B2 (ja) | 1999-03-24 |
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