JPS5710939A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS5710939A
JPS5710939A JP8567380A JP8567380A JPS5710939A JP S5710939 A JPS5710939 A JP S5710939A JP 8567380 A JP8567380 A JP 8567380A JP 8567380 A JP8567380 A JP 8567380A JP S5710939 A JPS5710939 A JP S5710939A
Authority
JP
Japan
Prior art keywords
layer
ion injection
film
dielectric film
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8567380A
Other languages
Japanese (ja)
Inventor
Kazuo Nishiyama
Shozo Watabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP8567380A priority Critical patent/JPS5710939A/en
Publication of JPS5710939A publication Critical patent/JPS5710939A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/324Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Recrystallisation Techniques (AREA)

Abstract

PURPOSE:To anneal an ion injection layer on the surface of a semiconductor substrate uniformly by a method wherein layer rays are absorbed efficiently in a dielectric film formed on the surface of the substrate, and the dielectric film is heated. CONSTITUTION:An ion injection mask layer 5 is formed on the single crystal silicon semiconductor substrate 4, a window 5a is bored where ions are injected selectively, the impurity ions of boron, etc. are injected through the window, and the ion injection layer 6 is made up on the surface of the substrate 4. The mask layer 5 is removed by means of etching, the dielectric film 7 with uniform thickness consisting of a film such as a SiO2 film is built up on the substrate 4, a laser such as a CO2 laser having a wavelength at an absorption peak is irradiated to the dielectric film, the ion injection layer 6 is annealed by the heat and the layer 6 is activated. Accordingly, the optimum condition for annealing is determined by the power of the laser and the thickness of the film 7, and annealing can be uniformalized.
JP8567380A 1980-06-24 1980-06-24 Manufacture of semiconductor device Pending JPS5710939A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8567380A JPS5710939A (en) 1980-06-24 1980-06-24 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8567380A JPS5710939A (en) 1980-06-24 1980-06-24 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5710939A true JPS5710939A (en) 1982-01-20

Family

ID=13865337

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8567380A Pending JPS5710939A (en) 1980-06-24 1980-06-24 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5710939A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5911622A (en) * 1982-07-13 1984-01-21 Ushio Inc Heating method
EP0432612A3 (en) * 1989-12-09 1994-07-20 eupec Europäische Gesellschaft für Leistungshalbleiter mbH & Co. KG Process for profiling the charge carriers life-time in a semiconductor

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5510974A (en) * 1978-07-12 1980-01-25 Tomy Kogyo Co Electric circuit switchgear of motor for luminous body movement support frame in game played by projecting shade of luminous body to screen and its baseball game

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5510974A (en) * 1978-07-12 1980-01-25 Tomy Kogyo Co Electric circuit switchgear of motor for luminous body movement support frame in game played by projecting shade of luminous body to screen and its baseball game

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5911622A (en) * 1982-07-13 1984-01-21 Ushio Inc Heating method
EP0432612A3 (en) * 1989-12-09 1994-07-20 eupec Europäische Gesellschaft für Leistungshalbleiter mbH & Co. KG Process for profiling the charge carriers life-time in a semiconductor

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