FR2755318B1 - Circuit regulateur et dispositif a circuit integre a semi-conducteur le comprenant - Google Patents

Circuit regulateur et dispositif a circuit integre a semi-conducteur le comprenant

Info

Publication number
FR2755318B1
FR2755318B1 FR9708405A FR9708405A FR2755318B1 FR 2755318 B1 FR2755318 B1 FR 2755318B1 FR 9708405 A FR9708405 A FR 9708405A FR 9708405 A FR9708405 A FR 9708405A FR 2755318 B1 FR2755318 B1 FR 2755318B1
Authority
FR
France
Prior art keywords
same
semiconductor integrated
integrated circuit
circuit device
regulator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9708405A
Other languages
English (en)
Other versions
FR2755318A1 (fr
Inventor
Atsushi Matsuda
Hirokazu Tanaka
Kunihiko Gotoh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Publication of FR2755318A1 publication Critical patent/FR2755318A1/fr
Application granted granted Critical
Publication of FR2755318B1 publication Critical patent/FR2755318B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02MAPPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00Conversion of dc power input into dc power output
    • H02M3/02Conversion of dc power input into dc power output without intermediate conversion into ac
    • H02M3/04Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
    • H02M3/10Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
    • H02M3/145Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal
    • H02M3/155Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only
    • H02M3/156Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators
    • H02M3/1563Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators without using an external clock
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current
    • G05F1/46Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/462Regulating voltage or current wherein the variable actually regulated by the final control device is dc as a function of the requirements of the load, e.g. delay, temperature, specific voltage/current characteristic
    • G05F1/465Internal voltage generators for integrated circuits, e.g. step down generators

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Continuous-Control Power Sources That Use Transistors (AREA)
  • Dram (AREA)
FR9708405A 1996-10-28 1997-07-03 Circuit regulateur et dispositif a circuit integre a semi-conducteur le comprenant Expired - Fee Related FR2755318B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8285647A JPH10133754A (ja) 1996-10-28 1996-10-28 レギュレータ回路及び半導体集積回路装置

Publications (2)

Publication Number Publication Date
FR2755318A1 FR2755318A1 (fr) 1998-04-30
FR2755318B1 true FR2755318B1 (fr) 2004-09-24

Family

ID=17694249

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9708405A Expired - Fee Related FR2755318B1 (fr) 1996-10-28 1997-07-03 Circuit regulateur et dispositif a circuit integre a semi-conducteur le comprenant

Country Status (4)

Country Link
US (1) US5861771A (fr)
JP (1) JPH10133754A (fr)
KR (1) KR100264718B1 (fr)
FR (1) FR2755318B1 (fr)

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JP3732914B2 (ja) * 1997-02-28 2006-01-11 株式会社ルネサステクノロジ 半導体装置
US6768165B1 (en) * 1997-08-01 2004-07-27 Saifun Semiconductors Ltd. Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping
KR100512160B1 (ko) * 1997-11-27 2006-03-14 삼성전자주식회사 내부전원전압발생회로
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US6057721A (en) * 1998-04-23 2000-05-02 Microchip Technology Incorporated Reference circuit using current feedback for fast biasing upon power-up
US6060873A (en) * 1999-03-12 2000-05-09 Vanguard International Semiconductor Corporation On-chip-generated supply voltage regulator with power-up mode
JP3592130B2 (ja) * 1999-04-19 2004-11-24 富士通株式会社 電子回路
US6208124B1 (en) 1999-06-04 2001-03-27 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit
US6411158B1 (en) * 1999-09-03 2002-06-25 Conexant Systems, Inc. Bandgap reference voltage with low noise sensitivity
JP3423957B2 (ja) * 1999-11-25 2003-07-07 Necエレクトロニクス株式会社 降圧回路
US6281666B1 (en) * 2000-03-14 2001-08-28 Advanced Micro Devices, Inc. Efficiency of a multiphase switching power supply during low power mode
US6297685B1 (en) * 2000-06-14 2001-10-02 International Business Machines Corporation High-speed fully-compensated low-voltage differential driver/translator circuit arrangement
JP3831894B2 (ja) * 2000-08-01 2006-10-11 株式会社ルネサステクノロジ 半導体集積回路
FR2817360B1 (fr) * 2000-11-30 2004-03-12 St Microelectronics Sa Circuit integre avec dispositif de regulation de la tension d'alimentation
US6414539B1 (en) * 2001-03-29 2002-07-02 Intel Corporation AC timings at the input buffer of source synchronous and common clock designs by making the supply for differential amplifier track the reference voltage
US6584017B2 (en) 2001-04-05 2003-06-24 Saifun Semiconductors Ltd. Method for programming a reference cell
US7098107B2 (en) * 2001-11-19 2006-08-29 Saifun Semiconductor Ltd. Protective layer in memory device and method therefor
US6700818B2 (en) * 2002-01-31 2004-03-02 Saifun Semiconductors Ltd. Method for operating a memory device
US6917544B2 (en) * 2002-07-10 2005-07-12 Saifun Semiconductors Ltd. Multiple use memory chip
US7136304B2 (en) 2002-10-29 2006-11-14 Saifun Semiconductor Ltd Method, system and circuit for programming a non-volatile memory array
US7178004B2 (en) * 2003-01-31 2007-02-13 Yan Polansky Memory array programming circuit and a method for using the circuit
JP4458457B2 (ja) * 2003-07-04 2010-04-28 株式会社リコー 半導体装置
US7123532B2 (en) * 2003-09-16 2006-10-17 Saifun Semiconductors Ltd. Operating array cells with matched reference cells
US6922099B2 (en) * 2003-10-21 2005-07-26 Saifun Semiconductors Ltd. Class AB voltage regulator
JP4467963B2 (ja) * 2003-12-03 2010-05-26 株式会社東芝 レギュレータ装置およびそれに用いる逆流防止ダイオード回路
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WO2005094178A2 (fr) * 2004-04-01 2005-10-13 Saifun Semiconductors Ltd. Procede, circuit et systemes pour effacer une ou plusieurs cellules de memoire non volatile
US7095655B2 (en) * 2004-08-12 2006-08-22 Saifun Semiconductors Ltd. Dynamic matching of signal path and reference path for sensing
US20060068551A1 (en) * 2004-09-27 2006-03-30 Saifun Semiconductors, Ltd. Method for embedding NROM
US7638850B2 (en) * 2004-10-14 2009-12-29 Saifun Semiconductors Ltd. Non-volatile memory structure and method of fabrication
US20060146624A1 (en) * 2004-12-02 2006-07-06 Saifun Semiconductors, Ltd. Current folding sense amplifier
CN1838328A (zh) * 2005-01-19 2006-09-27 赛芬半导体有限公司 擦除存储器阵列上存储单元的方法
JP4603378B2 (ja) * 2005-02-08 2010-12-22 株式会社豊田中央研究所 基準電圧回路
EP1852766B1 (fr) * 2005-02-24 2010-11-24 Fujitsu Ltd. Circuit générateur de tension de réfèrence
JP2006244228A (ja) * 2005-03-04 2006-09-14 Elpida Memory Inc 電源回路
US8053812B2 (en) 2005-03-17 2011-11-08 Spansion Israel Ltd Contact in planar NROM technology
US20070141788A1 (en) * 2005-05-25 2007-06-21 Ilan Bloom Method for embedding non-volatile memory with logic circuitry
US8400841B2 (en) * 2005-06-15 2013-03-19 Spansion Israel Ltd. Device to program adjacent storage cells of different NROM cells
US7184313B2 (en) * 2005-06-17 2007-02-27 Saifun Semiconductors Ltd. Method circuit and system for compensating for temperature induced margin loss in non-volatile memory cells
BRPI0613349A2 (pt) * 2005-06-20 2011-01-04 Halliburton Energy Serv Inc método de diagrafia de resistividade e aparelho de diagrafia de resistividade
KR20080036168A (ko) * 2005-06-24 2008-04-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체장치 및 무선 통신 시스템
JP4741886B2 (ja) * 2005-06-24 2011-08-10 Hoya株式会社 レギュレータ回路
US7804126B2 (en) * 2005-07-18 2010-09-28 Saifun Semiconductors Ltd. Dense non-volatile memory array and method of fabrication
US20070036007A1 (en) * 2005-08-09 2007-02-15 Saifun Semiconductors, Ltd. Sticky bit buffer
US7668017B2 (en) 2005-08-17 2010-02-23 Saifun Semiconductors Ltd. Method of erasing non-volatile memory cells
US20070096199A1 (en) * 2005-09-08 2007-05-03 Eli Lusky Method of manufacturing symmetric arrays
US7490428B2 (en) * 2005-10-19 2009-02-17 Halliburton Energy Services, Inc. High performance communication system
US7696756B2 (en) * 2005-11-04 2010-04-13 Halliburton Energy Services, Inc. Oil based mud imaging tool with common mode voltage compensation
JP2007133533A (ja) * 2005-11-09 2007-05-31 Nec Electronics Corp 基準電圧生成回路
WO2007059429A2 (fr) * 2005-11-10 2007-05-24 Halliburton Energy Services, Inc. Amplificateur d’electrode deplacee
US7352627B2 (en) * 2006-01-03 2008-04-01 Saifon Semiconductors Ltd. Method, system, and circuit for operating a non-volatile memory array
US7808818B2 (en) * 2006-01-12 2010-10-05 Saifun Semiconductors Ltd. Secondary injection for NROM
US7830200B2 (en) * 2006-01-17 2010-11-09 Cypress Semiconductor Corporation High voltage tolerant bias circuit with low voltage transistors
US7755419B2 (en) 2006-01-17 2010-07-13 Cypress Semiconductor Corporation Low power beta multiplier start-up circuit and method
US20070173017A1 (en) * 2006-01-20 2007-07-26 Saifun Semiconductors, Ltd. Advanced non-volatile memory array and method of fabrication thereof
US8253452B2 (en) * 2006-02-21 2012-08-28 Spansion Israel Ltd Circuit and method for powering up an integrated circuit and an integrated circuit utilizing same
US7692961B2 (en) * 2006-02-21 2010-04-06 Saifun Semiconductors Ltd. Method, circuit and device for disturb-control of programming nonvolatile memory cells by hot-hole injection (HHI) and by channel hot-electron (CHE) injection
US7760554B2 (en) * 2006-02-21 2010-07-20 Saifun Semiconductors Ltd. NROM non-volatile memory and mode of operation
US7701779B2 (en) * 2006-04-27 2010-04-20 Sajfun Semiconductors Ltd. Method for programming a reference cell
JP2008015875A (ja) * 2006-07-07 2008-01-24 Matsushita Electric Ind Co Ltd 電源回路
US7605579B2 (en) * 2006-09-18 2009-10-20 Saifun Semiconductors Ltd. Measuring and controlling current consumption and output current of charge pumps
JP2008140531A (ja) * 2006-11-07 2008-06-19 Nec Electronics Corp 半導体装置及びメモリ
WO2008120350A1 (fr) * 2007-03-29 2008-10-09 Fujitsu Limited Circuit de génération de tension de référence
US20080239599A1 (en) * 2007-04-01 2008-10-02 Yehuda Yizraeli Clamping Voltage Events Such As ESD
JP2007318154A (ja) * 2007-06-18 2007-12-06 Renesas Technology Corp 半導体装置及び直流電圧回路
KR101121090B1 (ko) * 2007-09-04 2012-03-16 가부시키가이샤 어드밴티스트 전원 안정화 회로, 전자 디바이스 및 시험 장치
JP2009164415A (ja) * 2008-01-08 2009-07-23 Mitsumi Electric Co Ltd 半導体装置
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KR101143446B1 (ko) * 2010-05-31 2012-05-22 에스케이하이닉스 주식회사 전압 발생 회로
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JP2012170020A (ja) * 2011-02-16 2012-09-06 Seiko Instruments Inc 内部電源電圧生成回路
JP2014026610A (ja) * 2012-07-30 2014-02-06 Seiko Instruments Inc レギュレータ
JP6135768B2 (ja) * 2013-09-26 2017-05-31 富士通株式会社 降圧電源回路、電源モジュール、及び降圧電源回路の制御方法
US9671801B2 (en) * 2013-11-06 2017-06-06 Dialog Semiconductor Gmbh Apparatus and method for a voltage regulator with improved power supply reduction ratio (PSRR) with reduced parasitic capacitance on bias signal lines
JP6903398B2 (ja) * 2016-01-27 2021-07-14 三菱電機株式会社 駆動装置および液晶表示装置
CN107402592B (zh) * 2016-12-01 2018-11-20 上海韦玏微电子有限公司 启动电路
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CN113253787A (zh) * 2021-06-17 2021-08-13 苏州裕太微电子有限公司 一种芯片内电阻校正电路
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Also Published As

Publication number Publication date
KR19980032204A (ko) 1998-07-25
US5861771A (en) 1999-01-19
KR100264718B1 (ko) 2000-09-01
FR2755318A1 (fr) 1998-04-30
JPH10133754A (ja) 1998-05-22

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Effective date: 20070330