KR870005459A - 반도체장치 - Google Patents
반도체장치 Download PDFInfo
- Publication number
- KR870005459A KR870005459A KR860009284A KR860009284A KR870005459A KR 870005459 A KR870005459 A KR 870005459A KR 860009284 A KR860009284 A KR 860009284A KR 860009284 A KR860009284 A KR 860009284A KR 870005459 A KR870005459 A KR 870005459A
- Authority
- KR
- South Korea
- Prior art keywords
- well region
- semiconductor device
- semiconductor substrate
- semiconductor
- mosfet
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims description 6
- 239000000758 substrate Substances 0.000 claims description 3
- 239000012535 impurity Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0611—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region
- H01L27/0617—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type
- H01L27/0623—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type in combination with bipolar transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8232—Field-effect technology
- H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
- H01L21/8238—Complementary field-effect transistors, e.g. CMOS
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8248—Combination of bipolar and field-effect technology
- H01L21/8249—Bipolar and MOS technology
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
- Y10S257/921—Radiation hardened semiconductor device
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 일실시예시도.
제2도는 제1도의 MOSFET의 제조프로세스 표시도.
제3도는 본 발명의 다른 실시예시도.
*도면의 주요 부분에 대한 부호의 설명
1 : 반도체기판 2 : P형 웰영역
3 : 고농도층 120 : N형 웰영역
Claims (1)
- 반도체기판의 소정영역에 웰영역이 형성되며 이 웰영역에 MOSFET를 형성한 반도체장치에 있어서 웰영역의 불순물 농도분포는 표면보다 깊은 부분에서 골 형상을 가지며 그 곡소점은 그 농도가 5×1015cm-3이하고 반도체기판 표면에서 1.6㎛이내의 깊은 곳에 위치하고 있는 것을 특징으로 하는 반도체 기억장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60-267170 | 1985-11-29 | ||
JP60267170A JPH0770606B2 (ja) | 1985-11-29 | 1985-11-29 | 半導体装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940016676A Division KR960016692A (ko) | 1985-11-29 | 1994-07-11 | 반도체장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR870005459A true KR870005459A (ko) | 1987-06-09 |
KR970000462B1 KR970000462B1 (ko) | 1997-01-11 |
Family
ID=17441073
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019860009284A KR970000462B1 (ko) | 1985-11-29 | 1986-11-04 | 반도체 장치 |
KR1019940016676A KR960016692A (ko) | 1985-11-29 | 1994-07-11 | 반도체장치 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940016676A KR960016692A (ko) | 1985-11-29 | 1994-07-11 | 반도체장치 |
Country Status (3)
Country | Link |
---|---|
US (2) | US4963973A (ko) |
JP (1) | JPH0770606B2 (ko) |
KR (2) | KR970000462B1 (ko) |
Families Citing this family (66)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH0770606B2 (ja) * | 1985-11-29 | 1995-07-31 | 株式会社日立製作所 | 半導体装置 |
US5093707A (en) * | 1988-04-27 | 1992-03-03 | Kabushiki Kaisha Toshiba | Semiconductor device with bipolar and cmos transistors |
JP2569171B2 (ja) * | 1989-04-12 | 1997-01-08 | 株式会社日立製作所 | 半導体装置 |
JP4255142B2 (ja) * | 1998-02-05 | 2009-04-15 | 株式会社ルネサステクノロジ | 半導体装置 |
US6268250B1 (en) | 1999-05-14 | 2001-07-31 | Micron Technology, Inc. | Efficient fabrication process for dual well type structures |
US6310366B1 (en) * | 1999-06-16 | 2001-10-30 | Micron Technology, Inc. | Retrograde well structure for a CMOS imager |
US6445014B1 (en) | 1999-06-16 | 2002-09-03 | Micron Technology Inc. | Retrograde well structure for a CMOS imager |
US6372582B1 (en) | 1999-08-18 | 2002-04-16 | Advanced Micro Devices, Inc. | Indium retrograde channel doping for improved gate oxide reliability |
US6426279B1 (en) | 1999-08-18 | 2002-07-30 | Advanced Micro Devices, Inc. | Epitaxial delta doping for retrograde channel profile |
KR20010056719A (ko) * | 1999-12-16 | 2001-07-04 | 권문구 | 반사형 편광판의 시야각에 따른 색차 및 휘도 보상 방법 |
US6528850B1 (en) * | 2000-05-03 | 2003-03-04 | Linear Technology Corporation | High voltage MOS transistor with up-retro well |
US8329564B2 (en) * | 2007-10-26 | 2012-12-11 | International Business Machines Corporation | Method for fabricating super-steep retrograde well MOSFET on SOI or bulk silicon substrate, and device fabricated in accordance with the method |
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US8796048B1 (en) | 2011-05-11 | 2014-08-05 | Suvolta, Inc. | Monitoring and measurement of thin film layers |
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US9268885B1 (en) | 2013-02-28 | 2016-02-23 | Mie Fujitsu Semiconductor Limited | Integrated circuit device methods and models with predicted device metric variations |
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US9449967B1 (en) | 2013-03-15 | 2016-09-20 | Fujitsu Semiconductor Limited | Transistor array structure |
US9112495B1 (en) | 2013-03-15 | 2015-08-18 | Mie Fujitsu Semiconductor Limited | Integrated circuit device body bias circuits and methods |
US9478571B1 (en) | 2013-05-24 | 2016-10-25 | Mie Fujitsu Semiconductor Limited | Buried channel deeply depleted channel transistor |
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Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4032372A (en) * | 1971-04-28 | 1977-06-28 | International Business Machines Corporation | Epitaxial outdiffusion technique for integrated bipolar and field effect transistors |
US4247862B1 (en) * | 1977-08-26 | 1995-12-26 | Intel Corp | Ionzation resistant mos structure |
US4258379A (en) * | 1978-09-25 | 1981-03-24 | Hitachi, Ltd. | IIL With in and outdiffused emitter pocket |
US4435895A (en) * | 1982-04-05 | 1984-03-13 | Bell Telephone Laboratories, Incorporated | Process for forming complementary integrated circuit devices |
JPS5994861A (ja) * | 1982-11-24 | 1984-05-31 | Hitachi Ltd | 半導体集積回路装置及びその製造方法 |
JPS60113457A (ja) * | 1983-11-24 | 1985-06-19 | Nec Corp | 相補型半導体装置の製造方法 |
US4762802A (en) * | 1984-11-09 | 1988-08-09 | American Telephone And Telegraph Company At&T, Bell Laboratories | Method for preventing latchup in CMOS devices |
US4604790A (en) * | 1985-04-01 | 1986-08-12 | Advanced Micro Devices, Inc. | Method of fabricating integrated circuit structure having CMOS and bipolar devices |
JPH0715971B2 (ja) * | 1985-05-23 | 1995-02-22 | カシオ計算機株式会社 | 相補型mos集積回路の製造方法 |
JPH0770606B2 (ja) * | 1985-11-29 | 1995-07-31 | 株式会社日立製作所 | 半導体装置 |
-
1985
- 1985-11-29 JP JP60267170A patent/JPH0770606B2/ja not_active Expired - Fee Related
-
1986
- 1986-11-04 KR KR1019860009284A patent/KR970000462B1/ko not_active IP Right Cessation
-
1989
- 1989-03-13 US US07/323,212 patent/US4963973A/en not_active Expired - Lifetime
-
1994
- 1994-05-16 US US08/243,325 patent/US5726488A/en not_active Expired - Fee Related
- 1994-07-11 KR KR1019940016676A patent/KR960016692A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
KR970000462B1 (ko) | 1997-01-11 |
JPH0770606B2 (ja) | 1995-07-31 |
JPS62128170A (ja) | 1987-06-10 |
KR960016692A (ko) | 1996-05-22 |
US5726488A (en) | 1998-03-10 |
US4963973A (en) | 1990-10-16 |
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