KR100639765B1 - 기판 처리 장치, 기판 처리 방법 및 반도체 장치의 제조방법 - Google Patents
기판 처리 장치, 기판 처리 방법 및 반도체 장치의 제조방법 Download PDFInfo
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- KR100639765B1 KR100639765B1 KR1020010020422A KR20010020422A KR100639765B1 KR 100639765 B1 KR100639765 B1 KR 100639765B1 KR 1020010020422 A KR1020010020422 A KR 1020010020422A KR 20010020422 A KR20010020422 A KR 20010020422A KR 100639765 B1 KR100639765 B1 KR 100639765B1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67772—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving removal of lid, door, cover
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67775—Docking arrangements
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/14—Wafer cassette transporting
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- Condensed Matter Physics & Semiconductors (AREA)
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- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
Claims (22)
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- 도어가 구비되어 있으며 기판을 수납하기 위한 포드를 그 위에 탑재시키기 위한 적어도 2개의 포드 지지 스테이지,상기 포드 지지 스테이지에 위치된 포드 내의 기판으로의 접근을 허용하기 위한 적어도 2개의 포드 도어 개구 기구를 포함하고,상기 포드 도어 개구 기구는 포드로부터 이에 대응하는 도어를 수평으로 제거하여, 그 내부에 배치된 기판을 언로딩시키는기판 처리 장치.
- 제 11 항에 있어서,상기 적어도 2개의 포드 지지 스테이지는 수직 방향으로 배치되는기판 처리 장치.
- 제 11 항에 있어서,상기 포드 지지 스테이지의 각각은 포드 내의 기판의 위치를 검출하기 위한 맵핑 장치를 갖는기판 처리 장치.
- 제 11 항에 있어서,상기 포드 지지 스테이지중 하나에 위치한 포드로 기판을 로딩하거나 또는 이 포드로부터 기판을 언로딩하기 위한 기판 핸들링 장치 및 상기 기판 핸들링 장치가 상기 포드 지지 스테이지중 하나에 위치한 포드로 기판을 로딩하거나 또는 이 포드로부터 기판을 언로딩하는 동안, 또 하나의 포드를 상기 포드 지지 스테이지중 다른 하나에 위치한 포드를 이동시키기 위한 포드 이송 장치를 더 포함하는기판 처리 장치.
- 제 14 항에 있어서,상기 맵핑 장치는 맵핑 프로세스가 실행되는 맵핑 위치와 포드의 입구로부터 이격된 대기 위치 사이에서 이동하여, 기판의 로딩 또는 언로딩 프로세스가 상기 포드의 입구를 통해 실행되도록 허용하는기판 처리 장치.
- 제 11 항에 있어서,각 포드 도어 개구 기구는 포드 도어가 닫히는 위치와 포드가 완전히 개구되는 후퇴 위치 사이에서 포드의 도어를 이동시키는기판 처리 장치.
- 도어를 갖는 포드 내에 배치된 기판으로의 접근을 허용하기 위한 적어도 하나의 포드 도어 개구 기구를 포함하고,상기 포드 도어 개구 기구는 상기 포드의 도어가 닫혀있는 위치로부터 포드가 완전히 개구되는 후퇴 위치로 상기 포드의 도어를 수평으로 이동시켜, 기판을 포드로부터 언로딩시키는기판 처리 장치.
- 개구를 가지며 기판을 수납하기 위한 포드를 그 위에 탑재시키기 위한 포드 지지 스테이지,상기 포드의 개구를 통해 상기 포드 지지 스테이지 상의 포드 내의 기판의 위치를 검출하기 위해 상기 포드 지지 스테이지에 배치된 맵핑 장치 및상기 포드의 개구를 통해 상기 포드 지지 스테이지 상의 포드로부터 기판을 언로딩시키기 위한 기판 핸들링 장치를 포함하고,상기 맵핑 장치는 맵핑 프로세스가 실행되는 맵핑 위치와 상기 포드의 개구로부터 이격된 대기 위치 사이에서 피봇 운동하여, 기판 언로딩 프로세스가 상기 개구를 통해 실행되도록 하는기판 처리 장치.
- 도어가 마련되어 있으며 기판을 수납하기 위한 포드를 탑재시키기 위한 적어도 2개의 포드 지지 스테이지를 갖는 기판 처리 장치용 기판 처리 방법에 있어서,(a) 제 1 포드를 하나의 포드 지지 스테이지 상에 위치시키는 단계,(b) 상기 제 1 포드의 도어를 대략 수평방향으로 개구시키는 단계,(c) 상기 제 1 포드로 기판을 로딩시키거나 또는 상기 제 1 포드로부터 기판을 언로딩시키는 단계 및(d) 상기 로딩 또는 언로딩 단계(c) 동안, 제 2 포드를 다른 하나의 포드 지지 스테이지 상에 위치시키는 단계를 포함하는기판 처리 방법.
- 제 11 항에 있어서,상기 포드 도어 개구 기구는 각각의 포드 지지 스테이지에 따로 설치되어 있는기판 처리 장치.
- 제 20 항에 있어서,상기 포드 도어 개구 기구는,상기 포드 지지 스테이지중의 하나에 있어서, 상기 포드 도어 개구 기구중의 하나에 의해 도어를 대략 수평방향으로 개구한 하나의 포드에 기판을 로딩하거나 또는 이 포드로부터 기판을 언로딩시키는 동안에, 상기 포드 지지 스테이지중의 다른 하나에 있어서, 다른 하나의 포드의 도어를 대략 수평방향으로 개구시키도록 구성되어 있는기판 처리 장치.
- 제 19 항에 있어서, 단계(d)는 단계(c)동안에, 제 2 포드를 다른 하나의 포드 지지 스테이지상에 위치시키고, 제 2 포드의 도어를 대략 수평방향으로 개구시키는 단계를 포함하는기판 처리 방법.
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JP2000-114818 | 2000-04-17 | ||
JP2000114818 | 2000-04-17 |
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KR20010098658A KR20010098658A (ko) | 2001-11-08 |
KR100639765B1 true KR100639765B1 (ko) | 2006-10-31 |
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US (2) | US6641350B2 (ko) |
JP (5) | JP4583461B2 (ko) |
KR (1) | KR100639765B1 (ko) |
TW (1) | TWI222108B (ko) |
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JP4583461B2 (ja) | 2010-11-17 |
JP4581031B2 (ja) | 2010-11-17 |
JP5237336B2 (ja) | 2013-07-17 |
TWI222108B (en) | 2004-10-11 |
JP2010161389A (ja) | 2010-07-22 |
JP5518132B2 (ja) | 2014-06-11 |
JP4581032B2 (ja) | 2010-11-17 |
KR20010098658A (ko) | 2001-11-08 |
USRE43023E1 (en) | 2011-12-13 |
JP2008182255A (ja) | 2008-08-07 |
JP2010147499A (ja) | 2010-07-01 |
US20010038783A1 (en) | 2001-11-08 |
JP2012199584A (ja) | 2012-10-18 |
JP2011040743A (ja) | 2011-02-24 |
US6641350B2 (en) | 2003-11-04 |
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