JP5637154B2 - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
- Publication number
- JP5637154B2 JP5637154B2 JP2012036416A JP2012036416A JP5637154B2 JP 5637154 B2 JP5637154 B2 JP 5637154B2 JP 2012036416 A JP2012036416 A JP 2012036416A JP 2012036416 A JP2012036416 A JP 2012036416A JP 5637154 B2 JP5637154 B2 JP 5637154B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- flr
- insulating film
- region
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000004065 semiconductor Substances 0.000 title claims description 101
- 239000000758 substrate Substances 0.000 claims description 86
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 26
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 26
- 238000000034 method Methods 0.000 claims description 12
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 11
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 11
- 238000004519 manufacturing process Methods 0.000 claims description 6
- 238000000151 deposition Methods 0.000 claims description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 12
- 229920005591 polysilicon Polymers 0.000 description 12
- 229910052751 metal Inorganic materials 0.000 description 10
- 239000002184 metal Substances 0.000 description 10
- 230000005684 electric field Effects 0.000 description 9
- 150000002500 ions Chemical class 0.000 description 9
- 239000000463 material Substances 0.000 description 9
- 230000015556 catabolic process Effects 0.000 description 8
- 229910052782 aluminium Inorganic materials 0.000 description 7
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- 239000012141 concentrate Substances 0.000 description 4
- 239000012535 impurity Substances 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 239000010931 gold Substances 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 239000010936 titanium Substances 0.000 description 3
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 229910052796 boron Inorganic materials 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0603—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions
- H01L29/0607—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration
- H01L29/0611—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse biased devices
- H01L29/0615—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse biased devices by the doping profile or the shape or the arrangement of the PN junction, or with supplementary regions, e.g. junction termination extension [JTE]
- H01L29/0619—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse biased devices by the doping profile or the shape or the arrangement of the PN junction, or with supplementary regions, e.g. junction termination extension [JTE] with a supplementary region doped oppositely to or in rectifying contact with the semiconductor containing or contacting region, e.g. guard rings with PN or Schottky junction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0657—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/402—Field plates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/402—Field plates
- H01L29/404—Multiple field plate structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/408—Electrodes ; Multistep manufacturing processes therefor with an insulating layer with a particular dielectric or electrostatic property, e.g. with static charges or for controlling trapped charges or moving ions, or with a plate acting on the insulator potential or the insulator charges, e.g. for controlling charges effect or potential distribution in the insulating layer, or with a semi-insulating layer contacting directly the semiconductor surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/739—Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
- H01L29/7393—Insulated gate bipolar mode transistors, i.e. IGBT; IGT; COMFET
- H01L29/7395—Vertical transistors, e.g. vertical IGBT
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
- H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
- H01L29/7811—Vertical DMOS transistors, i.e. VDMOS transistors with an edge termination structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0603—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions
- H01L29/0607—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration
- H01L29/0638—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration for preventing surface leakage due to surface inversion layer, e.g. with channel stopper
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0684—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape, relative sizes or dispositions of the semiconductor regions or junctions between the regions
- H01L29/0692—Surface layout
- H01L29/0696—Surface layout of cellular field-effect devices, e.g. multicellular DMOS transistors or IGBTs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/1095—Body region, i.e. base region, of DMOS transistors or IGBTs
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Electrodes Of Semiconductors (AREA)
Description
上記の実施例では、フィールドプレート部11は第2導電膜120a〜120dを備えていたが、これに限定されない。例えば、図3に示すように、第2導電膜を備えておらず、第1導電膜240aが、第1絶縁膜142および第2絶縁膜250aを半導体基板100の方向に貫通して、FLR層135aに接していてもよい。
11 フィールドプレート部
100 半導体基板
101 セル領域
102 非セル領域
103 ゲート配線
110 表面電極
112 裏面電極
114 電極
120a〜120d 第2導電膜
131 コレクタ層
132 基板層
133 ボディ層
135a〜135d FLR層
140a〜140d,240a 第1導電膜
141a,141b 導電膜
142 第1絶縁膜
142a〜142d 突出部
150a〜150d、250a 第2絶縁膜
170a〜170d 第1領域
180a〜180d 第2領域
284 角部
Claims (3)
- 半導体素子が形成されたセル領域と、セル領域の周囲に設けられた非セル領域とを有する半導体基板と、
非セル領域の表面に形成されたフィールドプレート部とを備えた半導体装置であって、
非セル領域は、
第1導電型の基板層と、
基板層の表面に形成されており、セル領域の周囲に沿った第1方向に伸びてセル領域を囲むとともに、第1方向に直交する第2方向に間隔を空けて配置されている複数の第2導電型のFLR層とを備えており、
フィールドプレート部は、
半導体基板の表面に形成されており、FLR層毎にそのFLR層上に形成されているとともにそのFLR層に接する複数の第1領域と、第1領域毎にその第1領域に対して第2方向に隣接する基板層上に形成されているとともに基板層に接する複数の第2領域とを備えている絶縁膜と、
絶縁膜の内部にFLR層毎に形成されており、半導体基板を平面視したときにFLR層に沿って第2方向に間隔を空けて配置されており、FLR層と電気的に接続している複数の第1導電膜とを備えており、
絶縁膜は、
FLR層上に形成されており、FLR層に接しており、基板層上に開口部を有するシリコン窒化膜と、
シリコン窒化膜上及び開口部内に形成されており、開口部内において基板層に接しているシリコン酸化膜、
を有しており、
開口部に、絶縁膜が開口部の外側よりも半導体基板側に突出している突出部が形成されており、
突出部を有する部分の絶縁膜の厚さが、第1領域の厚さよりも厚い、半導体装置。 - 突出部は、LOCOS法によって形成されたシリコン酸化膜を含んでいる、請求項1に記載の半導体装置。
- 請求項1または2に記載の半導体装置の製造方法であって、
基板層と複数のFLR層を有する半導体基板の表面に、基板層の表面の少なくとも一部に開口部を有し、FLR層の表面を少なくとも部分的に覆うシリコン窒化膜を形成する工程と、
開口部内に、シリコン窒化膜よりも半導体基板側に突出するLOCOS酸化膜を形成する工程と、
シリコン窒化膜及びLOCOS酸化膜上にシリコン酸化物を堆積させる工程、とを含む、半導体装置の製造方法。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012036416A JP5637154B2 (ja) | 2012-02-22 | 2012-02-22 | 半導体装置 |
US13/773,423 US9048085B2 (en) | 2012-02-22 | 2013-02-21 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012036416A JP5637154B2 (ja) | 2012-02-22 | 2012-02-22 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013172088A JP2013172088A (ja) | 2013-09-02 |
JP5637154B2 true JP5637154B2 (ja) | 2014-12-10 |
Family
ID=48981649
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012036416A Active JP5637154B2 (ja) | 2012-02-22 | 2012-02-22 | 半導体装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US9048085B2 (ja) |
JP (1) | JP5637154B2 (ja) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6168961B2 (ja) * | 2013-10-10 | 2017-07-26 | 三菱電機株式会社 | 半導体装置 |
JP2015177041A (ja) * | 2014-03-14 | 2015-10-05 | 株式会社東芝 | 半導体装置 |
CN104409478A (zh) * | 2014-11-05 | 2015-03-11 | 中国东方电气集团有限公司 | 一种电力电子半导体芯片的终端结构 |
CN104377233A (zh) * | 2014-11-05 | 2015-02-25 | 中国东方电气集团有限公司 | 一种采用多晶截止场板的半导体器件终端结构 |
CN104393028A (zh) * | 2014-11-05 | 2015-03-04 | 中国东方电气集团有限公司 | 采用多晶截止场板的半导体器件终端单元结构及制造方法 |
CN106489208B (zh) * | 2015-01-29 | 2019-11-01 | 富士电机株式会社 | 半导体装置 |
DE102016120301A1 (de) * | 2016-10-25 | 2018-04-26 | Infineon Technologies Ag | Leistungshalbleitervorrichtungs-Abschlussstruktur |
JP6637012B2 (ja) * | 2016-11-10 | 2020-01-29 | ローム株式会社 | 半導体装置 |
WO2018207712A1 (ja) * | 2017-05-08 | 2018-11-15 | ローム株式会社 | 半導体装置 |
CN108091701A (zh) * | 2017-11-02 | 2018-05-29 | 全球能源互联网研究院有限公司 | 半导体器件及其制造方法 |
CN108110040A (zh) * | 2017-11-02 | 2018-06-01 | 全球能源互联网研究院有限公司 | 功率半导体器件及其制造方法 |
JP7190256B2 (ja) * | 2018-02-09 | 2022-12-15 | ローム株式会社 | 半導体装置 |
JP6904279B2 (ja) * | 2018-02-27 | 2021-07-14 | 三菱電機株式会社 | 半導体装置およびその製造方法並びに電力変換装置 |
CN111326588A (zh) * | 2020-03-11 | 2020-06-23 | 四川美阔电子科技有限公司 | 平面型场效晶体管及其制作方法 |
WO2023154046A1 (en) * | 2022-02-10 | 2023-08-17 | Vishay Siliconix Llc | Adaptive edge termination by design for efficient and rugged high voltage silicon carbide power device |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USH665H (en) | 1987-10-19 | 1989-08-01 | Bell Telephone Laboratories, Incorporated | Resistive field shields for high voltage devices |
WO1996029744A1 (fr) * | 1995-03-17 | 1996-09-26 | Hitachi, Ltd. | Semi-conducteur plan, son procede de fabrication et convertisseur de puissance |
JPH08306911A (ja) * | 1995-04-28 | 1996-11-22 | Sanyo Electric Co Ltd | 半導体装置とその製造方法 |
JP4024990B2 (ja) * | 2000-04-28 | 2007-12-19 | 株式会社ルネサステクノロジ | 半導体装置 |
KR100393199B1 (ko) * | 2001-01-15 | 2003-07-31 | 페어차일드코리아반도체 주식회사 | 높은 브레이크다운 전압을 갖는 고전압 반도체 소자 및 그제조방법 |
JP2003347547A (ja) * | 2002-05-27 | 2003-12-05 | Mitsubishi Electric Corp | 電力用半導体装置及びその製造方法 |
JP4346322B2 (ja) * | 2003-02-07 | 2009-10-21 | 株式会社ルネサステクノロジ | 半導体装置 |
JP4469584B2 (ja) * | 2003-09-12 | 2010-05-26 | 株式会社東芝 | 半導体装置 |
JP2008181988A (ja) * | 2007-01-24 | 2008-08-07 | Hitachi Ltd | 半導体装置 |
CN101345254A (zh) * | 2007-07-12 | 2009-01-14 | 富士电机电子技术株式会社 | 半导体器件 |
JP2009099863A (ja) * | 2007-10-18 | 2009-05-07 | Toshiba Corp | 半導体装置、及び半導体装置の製造方法 |
JP4544313B2 (ja) * | 2008-02-19 | 2010-09-15 | トヨタ自動車株式会社 | Igbtとその製造方法 |
JP4803211B2 (ja) * | 2008-05-27 | 2011-10-26 | トヨタ自動車株式会社 | 半導体装置 |
CN102177587B (zh) * | 2008-12-10 | 2013-08-14 | 丰田自动车株式会社 | 半导体装置 |
JP5218474B2 (ja) * | 2010-05-27 | 2013-06-26 | 富士電機株式会社 | 半導体装置 |
-
2012
- 2012-02-22 JP JP2012036416A patent/JP5637154B2/ja active Active
-
2013
- 2013-02-21 US US13/773,423 patent/US9048085B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US9048085B2 (en) | 2015-06-02 |
JP2013172088A (ja) | 2013-09-02 |
US20130214394A1 (en) | 2013-08-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5637154B2 (ja) | 半導体装置 | |
US9178014B2 (en) | Semiconductor device | |
JP6112600B2 (ja) | 半導体装置および半導体装置の製造方法 | |
JP6061181B2 (ja) | 半導体装置 | |
JP5919033B2 (ja) | ショットキーバリアダイオード | |
JP5205856B2 (ja) | 電力用半導体素子 | |
JP5811977B2 (ja) | 炭化珪素半導体装置 | |
JP5939127B2 (ja) | 炭化珪素半導体装置 | |
JP5742668B2 (ja) | 炭化珪素半導体装置 | |
JP2009187994A (ja) | 半導体装置およびその製造方法 | |
JP2015046500A (ja) | 炭化珪素半導体装置 | |
JP2016009712A (ja) | 炭化珪素半導体装置 | |
JP2014038963A (ja) | 半導体装置 | |
JP2012186318A (ja) | 高耐圧半導体装置 | |
JP6179538B2 (ja) | 半導体装置 | |
JP2012174895A (ja) | 高耐圧半導体装置 | |
JP2007227620A (ja) | 半導体装置とその製造方法 | |
JP5827020B2 (ja) | 高耐圧半導体装置 | |
JP6295797B2 (ja) | 炭化珪素半導体装置およびその製造方法 | |
JP2017139293A (ja) | ダイオード | |
JP2012079945A (ja) | 半導体装置 | |
JP2017139289A (ja) | ダイオード | |
JP2014041920A (ja) | 半導体装置 | |
JP2013165167A (ja) | 半導体装置 | |
JP6673088B2 (ja) | 半導体装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20140205 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20140610 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20140612 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20140730 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20140924 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20141007 |
|
R151 | Written notification of patent or utility model registration |
Ref document number: 5637154 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R151 |
|
S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313113 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |