NO862510L - Diagnostisk krets som gjoer bruk av toveis testdata sammenligninger. - Google Patents

Diagnostisk krets som gjoer bruk av toveis testdata sammenligninger.

Info

Publication number: NO862510L
Authority: NO; Norway
Prior art keywords: storage means; signals; bit; read; test
Prior art date: 1985-10-21

Application number

NO862510A

Other languages

English (en)

Norwegian (no)

Other versions

NO862510D0 (no

Inventor

Albert M Rubin

Original Assignee

Singer Co Kearfott Division

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1985-10-21

Filing date

1986-06-23

Publication date

1987-04-22

1986-06-23 Application filed by Singer Co Kearfott Division filed Critical Singer Co Kearfott Division

1986-06-23 Publication of NO862510D0 publication Critical patent/NO862510D0/no

1987-04-22 Publication of NO862510L publication Critical patent/NO862510L/no

Links

238000012360 testing method Methods 0.000 title claims description 36
238000000034 method Methods 0.000 claims description 3
230000008878 coupling Effects 0.000 claims 1
238000010168 coupling process Methods 0.000 claims 1
238000005859 coupling reaction Methods 0.000 claims 1
238000002405 diagnostic procedure Methods 0.000 description 4
238000010586 diagram Methods 0.000 description 2
230000002457 bidirectional effect Effects 0.000 description 1
230000005540 biological transmission Effects 0.000 description 1
238000007689 inspection Methods 0.000 description 1
238000012986 modification Methods 0.000 description 1
230000004048 modification Effects 0.000 description 1
238000012544 monitoring process Methods 0.000 description 1
238000012545 processing Methods 0.000 description 1

Classifications

- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318566—Comparators; Diagnosing the device under test

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Theoretical Computer Science (AREA)
Computer Hardware Design (AREA)
Quality & Reliability (AREA)
Test And Diagnosis Of Digital Computers (AREA)

NO862510A 1985-10-21 1986-06-23 Diagnostisk krets som gjoer bruk av toveis testdata sammenligninger. NO862510L (no)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US06/789,528 US4683569A (en)	1985-10-21	1985-10-21	Diagnostic circuit utilizing bidirectional test data comparisons

Publications (2)

Publication Number	Publication Date
NO862510D0 NO862510D0 (no)	1986-06-23
NO862510L true NO862510L (no)	1987-04-22

Family

ID=25147902

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
NO862510A NO862510L (no)	1985-10-21	1986-06-23	Diagnostisk krets som gjoer bruk av toveis testdata sammenligninger.

Country Status (11)

Country	Link
US (1)	US4683569A (sv)
JP (1)	JPS6299835A (sv)
AU (1)	AU584212B2 (sv)
CA (1)	CA1251569A (sv)
DE (1)	DE3635736A1 (sv)
FR (1)	FR2588966A1 (sv)
GB (1)	GB2181850B (sv)
IL (1)	IL78898A0 (sv)
IT (1)	IT1197111B (sv)
NO (1)	NO862510L (sv)
SE (1)	SE8604333L (sv)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE3538484A1 (de) *	1985-10-25	1987-05-07	Siemens Ag	Verfahren zur ueberpruefung von schutzbefehl-uebertragungssystemen im on-line-betrieb
JPH0690260B2 (ja) *	1986-05-30	1994-11-14	三菱電機株式会社	論理回路試験装置
US4750181A (en) *	1986-11-05	1988-06-07	Rockwell International Corporation	Dynamic circuit checking apparatus using data input and output comparisons for testing the data integrity of a circuit
JPS63165930A (ja) *	1986-12-27	1988-07-09	Toshiba Corp	エラ−検査装置
US6304987B1 (en) *	1995-06-07	2001-10-16	Texas Instruments Incorporated	Integrated test circuit
JP3005250B2 (ja)	1989-06-30	2000-01-31	テキサスインスツルメンツインコーポレイテツド	バスモニター集積回路
JP2000504830A (ja) *	1996-02-06	2000-04-18	テレフオンアクチーボラゲツトエルエムエリクソン（パブル）	集積回路デバイスを試験する組立体および方法
DE19730716A1 (de) *	1996-10-21	1998-04-23	Fraunhofer Ges Forschung	Triggerung eines Meßverfahrens zur Qualitätsbeurteilung von Audio- und/oder Sprachsignalen
US6408413B1 (en)	1998-02-18	2002-06-18	Texas Instruments Incorporated	Hierarchical access of test access ports in embedded core integrated circuits
US6405335B1 (en)	1998-02-25	2002-06-11	Texas Instruments Incorporated	Position independent testing of circuits
GB2344184A (en)	1998-11-26	2000-05-31	Ericsson Telefon Ab L M	Testing integrated circuits
US7058862B2 (en)	2000-05-26	2006-06-06	Texas Instruments Incorporated	Selecting different 1149.1 TAP domains from update-IR state
JP2001166009A (ja)	1999-12-14	2001-06-22	Matsushita Electric Ind Co Ltd	診断機能を有する半導体集積回路
US6728915B2 (en)	2000-01-10	2004-04-27	Texas Instruments Incorporated	IC with shared scan cells selectively connected in scan path
US6769080B2 (en)	2000-03-09	2004-07-27	Texas Instruments Incorporated	Scan circuit low power adapter with counter
CN100442069C (zh) *	2005-12-08	2008-12-10	上海华虹Nec电子有限公司	同步通讯芯片进行多芯片并行测试的方法
US10118307B2 (en)	2014-04-29	2018-11-06	Chervon (Hk) Limited	Chain saw

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3582633A (en) *	1968-02-20	1971-06-01	Lockheed Aircraft Corp	Method and apparatus for fault detection in a logic circuit
US3863215A (en) *	1973-07-03	1975-01-28	Rca Corp	Detector for repetitive digital codes
US4216374A (en) *	1978-08-11	1980-08-05	John Fluke Mfg. Co., Inc.	Hybrid signature test method and apparatus
US4257031A (en) *	1979-07-18	1981-03-17	The Bendix Corporation	Digital remote control system
JPS5618766A (en) *	1979-07-26	1981-02-21	Fujitsu Ltd	Testing apparatus for logic circuit
US4357703A (en) *	1980-10-09	1982-11-02	Control Data Corporation	Test system for LSI circuits resident on LSI chips
US4404677A (en) *	1981-04-08	1983-09-13	Rockwell International Corporation	Detecting redundant digital codewords using a variable criterion
US4476560A (en) *	1982-09-21	1984-10-09	Advanced Micro Devices, Inc.	Diagnostic circuit for digital systems

1985
- 1985-10-21 US US06/789,528 patent/US4683569A/en not_active Expired - Fee Related
1986
- 1986-05-23 IL IL78898A patent/IL78898A0/xx unknown
- 1986-05-28 CA CA000510205A patent/CA1251569A/en not_active Expired
- 1986-06-04 GB GB8613569A patent/GB2181850B/en not_active Expired
- 1986-06-13 AU AU58875/86A patent/AU584212B2/en not_active Ceased
- 1986-06-16 FR FR8608658A patent/FR2588966A1/fr active Pending
- 1986-06-23 NO NO862510A patent/NO862510L/no unknown
- 1986-07-03 JP JP61157160A patent/JPS6299835A/ja active Pending
- 1986-08-22 IT IT21514/86A patent/IT1197111B/it active
- 1986-10-13 SE SE8604333A patent/SE8604333L/sv not_active Application Discontinuation
- 1986-10-21 DE DE19863635736 patent/DE3635736A1/de not_active Withdrawn

Also Published As

Publication number	Publication date
GB2181850A (en)	1987-04-29
GB8613569D0 (en)	1986-07-09
IL78898A0 (en)	1986-09-30
SE8604333D0 (sv)	1986-10-13
GB2181850B (en)	1989-12-20
FR2588966A1 (fr)	1987-04-24
CA1251569A (en)	1989-03-21
DE3635736A1 (de)	1987-04-23
IT8621514A1 (it)	1988-02-22
IT1197111B (it)	1988-11-25
SE8604333L (sv)	1987-04-22
US4683569A (en)	1987-07-28
AU5887586A (en)	1987-04-30
JPS6299835A (ja)	1987-05-09
NO862510D0 (no)	1986-06-23
AU584212B2 (en)	1989-05-18
IT8621514A0 (it)	1986-08-22

Publication	Publication Date	Title
NO862510L (no)	1987-04-22	Diagnostisk krets som gjoer bruk av toveis testdata sammenligninger.
KR920009093B1 (ko)	1992-10-13	멀티프로세서 시스템
EP0273043A1 (en)	1988-07-06	MULTIPLE-REDUNDANT ERROR DETECTION SYSTEM AND CORRESPONDING APPLICATION METHOD.
JPS63148802A (ja)	1988-06-21	自動列車制御装置用受信器
JP2554282B2 (ja)	1996-11-13	シーケンスコントローラの故障診断装置
JPH04245309A (ja)	1992-09-01	制御用ディジタルコントローラ
DK163753B (da)	1992-03-30	Kredsloeb til kontrol af den korrekte start af et tokanalet fail-safe-mikrodatamatkoblevaerk, navnlig til jernbanesikringsanlaeg
JP2607620B2 (ja)	1997-05-07	シーケンスプログラム制御系モニタのグループ分け方法
JP2518652B2 (ja)	1996-07-24	多重系バス同期システムの割込み診断装置
JPS5938618B2 (ja)	1984-09-18	接点入力回路の異常点検装置
JPH02301836A (ja)	1990-12-13	データ処理システム
JP2871966B2 (ja)	1999-03-17	障害検出回路検査システム
JPS6051136B2 (ja)	1985-11-12	デ−タ誤り検出方式
KR890000354B1 (ko)	1989-03-14	제어장치의 고장정보 기록장치
JPH0322037A (ja)	1991-01-30	故障診断方式
JPS62221742A (ja)	1987-09-29	診断制御装置
JPH09179835A (ja)	1997-07-11	並列プロセッサシステム
JPS6346458B2 (sv)	1988-09-14
JPS6319046A (ja)	1988-01-26	レジスタ試験方式
JPH05313935A (ja)	1993-11-26	情報処理装置の診断回路
JPS62172221A (ja)	1987-07-29	センサ異常情報蓄積装置
JPS63280342A (ja)	1988-11-17	シフトパス故障診断装置
JPS60112155A (ja)	1985-06-18	障害識別方式
JPH04102929A (ja)	1992-04-03	情報処理装置
JPS6137653B2 (sv)	1986-08-25