IT8621514A0 - Circuito diagnostico utilizzante confronti bidirezionali di dati di prove. - Google Patents

Circuito diagnostico utilizzante confronti bidirezionali di dati di prove.

Info

Publication number: IT8621514A0
Authority: IT; Italy
Prior art keywords: comparisons; bidirectional; test data; diagnostic circuit; diagnostic
Prior art date: 1985-10-21

Application number

IT8621514A

Other languages

English (en)

Other versions

IT8621514A1 (it

IT1197111B (it

Inventor

Albert M Rubin

Original Assignee

Singer Co

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1985-10-21

Filing date

1986-08-22

Publication date

1986-08-22

1986-08-22 Application filed by Singer Co filed Critical Singer Co

1986-08-22 Publication of IT8621514A0 publication Critical patent/IT8621514A0/it

1988-02-22 Publication of IT8621514A1 publication Critical patent/IT8621514A1/it

1988-11-25 Application granted granted Critical

1988-11-25 Publication of IT1197111B publication Critical patent/IT1197111B/it

Links

230000002457 bidirectional effect Effects 0.000 title 1

Classifications

- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318566—Comparators; Diagnosing the device under test

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Theoretical Computer Science (AREA)
Computer Hardware Design (AREA)
Quality & Reliability (AREA)
Test And Diagnosis Of Digital Computers (AREA)

IT21514/86A 1985-10-21 1986-08-22 Circuito diagnostico utilizzante confronti bidirezionali di dati di prove IT1197111B (it)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US06/789,528 US4683569A (en)	1985-10-21	1985-10-21	Diagnostic circuit utilizing bidirectional test data comparisons

Publications (3)

Publication Number	Publication Date
IT8621514A0 true IT8621514A0 (it)	1986-08-22
IT8621514A1 IT8621514A1 (it)	1988-02-22
IT1197111B IT1197111B (it)	1988-11-25

Family

ID=25147902

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
IT21514/86A IT1197111B (it)	1985-10-21	1986-08-22	Circuito diagnostico utilizzante confronti bidirezionali di dati di prove

Country Status (11)

Country	Link
US (1)	US4683569A (it)
JP (1)	JPS6299835A (it)
AU (1)	AU584212B2 (it)
CA (1)	CA1251569A (it)
DE (1)	DE3635736A1 (it)
FR (1)	FR2588966A1 (it)
GB (1)	GB2181850B (it)
IL (1)	IL78898A0 (it)
IT (1)	IT1197111B (it)
NO (1)	NO862510L (it)
SE (1)	SE8604333L (it)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE3538484A1 (de) *	1985-10-25	1987-05-07	Siemens Ag	Verfahren zur ueberpruefung von schutzbefehl-uebertragungssystemen im on-line-betrieb
JPH0690260B2 (ja) *	1986-05-30	1994-11-14	三菱電機株式会社	論理回路試験装置
US4750181A (en) *	1986-11-05	1988-06-07	Rockwell International Corporation	Dynamic circuit checking apparatus using data input and output comparisons for testing the data integrity of a circuit
JPS63165930A (ja) *	1986-12-27	1988-07-09	Toshiba Corp	エラ−検査装置
US6304987B1 (en) *	1995-06-07	2001-10-16	Texas Instruments Incorporated	Integrated test circuit
JP3005250B2 (ja)	1989-06-30	2000-01-31	テキサスインスツルメンツインコーポレイテツド	バスモニター集積回路
JP2000504830A (ja) *	1996-02-06	2000-04-18	テレフオンアクチーボラゲツトエルエムエリクソン（パブル）	集積回路デバイスを試験する組立体および方法
DE19730716A1 (de) *	1996-10-21	1998-04-23	Fraunhofer Ges Forschung	Triggerung eines Meßverfahrens zur Qualitätsbeurteilung von Audio- und/oder Sprachsignalen
US6408413B1 (en)	1998-02-18	2002-06-18	Texas Instruments Incorporated	Hierarchical access of test access ports in embedded core integrated circuits
US6405335B1 (en)	1998-02-25	2002-06-11	Texas Instruments Incorporated	Position independent testing of circuits
GB2344184A (en)	1998-11-26	2000-05-31	Ericsson Telefon Ab L M	Testing integrated circuits
US7058862B2 (en)	2000-05-26	2006-06-06	Texas Instruments Incorporated	Selecting different 1149.1 TAP domains from update-IR state
JP2001166009A (ja)	1999-12-14	2001-06-22	Matsushita Electric Ind Co Ltd	診断機能を有する半導体集積回路
US6728915B2 (en)	2000-01-10	2004-04-27	Texas Instruments Incorporated	IC with shared scan cells selectively connected in scan path
US6769080B2 (en)	2000-03-09	2004-07-27	Texas Instruments Incorporated	Scan circuit low power adapter with counter
CN100442069C (zh) *	2005-12-08	2008-12-10	上海华虹Nec电子有限公司	同步通讯芯片进行多芯片并行测试的方法
US10118307B2 (en)	2014-04-29	2018-11-06	Chervon (Hk) Limited	Chain saw

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3582633A (en) *	1968-02-20	1971-06-01	Lockheed Aircraft Corp	Method and apparatus for fault detection in a logic circuit
US3863215A (en) *	1973-07-03	1975-01-28	Rca Corp	Detector for repetitive digital codes
US4216374A (en) *	1978-08-11	1980-08-05	John Fluke Mfg. Co., Inc.	Hybrid signature test method and apparatus
US4257031A (en) *	1979-07-18	1981-03-17	The Bendix Corporation	Digital remote control system
JPS5618766A (en) *	1979-07-26	1981-02-21	Fujitsu Ltd	Testing apparatus for logic circuit
US4357703A (en) *	1980-10-09	1982-11-02	Control Data Corporation	Test system for LSI circuits resident on LSI chips
US4404677A (en) *	1981-04-08	1983-09-13	Rockwell International Corporation	Detecting redundant digital codewords using a variable criterion
US4476560A (en) *	1982-09-21	1984-10-09	Advanced Micro Devices, Inc.	Diagnostic circuit for digital systems

1985
- 1985-10-21 US US06/789,528 patent/US4683569A/en not_active Expired - Fee Related
1986
- 1986-05-23 IL IL78898A patent/IL78898A0/xx unknown
- 1986-05-28 CA CA000510205A patent/CA1251569A/en not_active Expired
- 1986-06-04 GB GB8613569A patent/GB2181850B/en not_active Expired
- 1986-06-13 AU AU58875/86A patent/AU584212B2/en not_active Ceased
- 1986-06-16 FR FR8608658A patent/FR2588966A1/fr active Pending
- 1986-06-23 NO NO862510A patent/NO862510L/no unknown
- 1986-07-03 JP JP61157160A patent/JPS6299835A/ja active Pending
- 1986-08-22 IT IT21514/86A patent/IT1197111B/it active
- 1986-10-13 SE SE8604333A patent/SE8604333L/xx not_active Application Discontinuation
- 1986-10-21 DE DE19863635736 patent/DE3635736A1/de not_active Withdrawn

Also Published As

Publication number	Publication date
GB2181850A (en)	1987-04-29
GB8613569D0 (en)	1986-07-09
IL78898A0 (en)	1986-09-30
SE8604333D0 (sv)	1986-10-13
GB2181850B (en)	1989-12-20
FR2588966A1 (fr)	1987-04-24
CA1251569A (en)	1989-03-21
NO862510L (no)	1987-04-22
DE3635736A1 (de)	1987-04-23
IT8621514A1 (it)	1988-02-22
IT1197111B (it)	1988-11-25
SE8604333L (sv)	1987-04-22
US4683569A (en)	1987-07-28
AU5887586A (en)	1987-04-30
JPS6299835A (ja)	1987-05-09
NO862510D0 (no)	1986-06-23
AU584212B2 (en)	1989-05-18

Publication	Publication Date	Title
DE3630351B4 (de)	2005-04-28	Optisches Untersuchungsgerät
IT8621514A0 (it)	1986-08-22	Circuito diagnostico utilizzante confronti bidirezionali di dati di prove.
FI872328A (fi)	1987-05-26	Intraokulaert kirurgiskt instrument.
DK169182A (da)	1982-10-16	Medicinsk instrument
FI862586A0 (fi)	1986-06-17	Hydrogelbildande polymerkompositioner foer anvaendning i absorberande produkter.
KR880701926A (ko)	1988-11-07	휴대용 데이타 주사기
DE3650722D1 (de)	1999-08-12	Bilderzeugungsgerät
KR870003755A (ko)	1987-05-04	내시경 장치
DE3686665D1 (de)	1992-10-15	Bildaufnahmegeraet.
DE3678557D1 (de)	1991-05-08	Chirurgisches geraet.
DE3684114D1 (de)	1992-04-09	Bildaufnahmegeraet.
DE3688294D1 (de)	1993-05-19	Bildaufzeichnungsvorrichtung.
DE3682336D1 (de)	1991-12-12	Diagnostisches testgeraet.
NO862471D0 (no)	1986-06-20	Flerlags ioneundersoekelsesinnretning.
IT8620618A0 (it)	1986-05-30	Circuito di collegamento.
DE3689765D1 (de)	1994-05-11	Gelehriges Untersuchungsgerät.
FI872458A (fi)	1987-06-02	Oeverdragning av produkter.
KR860012355U (ko)	1986-10-10	광학식 판독장치
FI861293A0 (fi)	1986-03-26	Kompaktfoerpackning foer spridbara produkter.
FI871904A0 (fi)	1987-04-29	Foerpackning foer sterila produkter.
DE3672655D1 (de)	1990-08-23	Bildaufnahmevorrichtung.
ES553337A0 (es)	1987-08-01	Aparato registrador de datos
BR8706008A (pt)	1988-06-28	Circuito multiplexador
IT1186194B (it)	1987-11-18	Circuito sfasatore-equalizzatore
NO863715L (no)	1986-09-17	Kirurgisk anordning.