NO862510D0 - Diagnostisk krets som gjoer bruk av toveis testdata sammenligninger. - Google Patents

Diagnostisk krets som gjoer bruk av toveis testdata sammenligninger.

Info

Publication number
NO862510D0
NO862510D0 NO862510A NO862510A NO862510D0 NO 862510 D0 NO862510 D0 NO 862510D0 NO 862510 A NO862510 A NO 862510A NO 862510 A NO862510 A NO 862510A NO 862510 D0 NO862510 D0 NO 862510D0
Authority
NO
Norway
Prior art keywords
test data
diagnostic circuit
data comparisons
comparisons
diagnostic
Prior art date
Application number
NO862510A
Other languages
English (en)
Other versions
NO862510L (no
Inventor
Albert M Rubin
Original Assignee
Singer Co Kearfott Division
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Singer Co Kearfott Division filed Critical Singer Co Kearfott Division
Publication of NO862510D0 publication Critical patent/NO862510D0/no
Publication of NO862510L publication Critical patent/NO862510L/no

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318566—Comparators; Diagnosing the device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
NO862510A 1985-10-21 1986-06-23 Diagnostisk krets som gjoer bruk av toveis testdata sammenligninger. NO862510L (no)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/789,528 US4683569A (en) 1985-10-21 1985-10-21 Diagnostic circuit utilizing bidirectional test data comparisons

Publications (2)

Publication Number Publication Date
NO862510D0 true NO862510D0 (no) 1986-06-23
NO862510L NO862510L (no) 1987-04-22

Family

ID=25147902

Family Applications (1)

Application Number Title Priority Date Filing Date
NO862510A NO862510L (no) 1985-10-21 1986-06-23 Diagnostisk krets som gjoer bruk av toveis testdata sammenligninger.

Country Status (11)

Country Link
US (1) US4683569A (no)
JP (1) JPS6299835A (no)
AU (1) AU584212B2 (no)
CA (1) CA1251569A (no)
DE (1) DE3635736A1 (no)
FR (1) FR2588966A1 (no)
GB (1) GB2181850B (no)
IL (1) IL78898A0 (no)
IT (1) IT1197111B (no)
NO (1) NO862510L (no)
SE (1) SE8604333L (no)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3538484A1 (de) * 1985-10-25 1987-05-07 Siemens Ag Verfahren zur ueberpruefung von schutzbefehl-uebertragungssystemen im on-line-betrieb
JPH0690260B2 (ja) * 1986-05-30 1994-11-14 三菱電機株式会社 論理回路試験装置
US4750181A (en) * 1986-11-05 1988-06-07 Rockwell International Corporation Dynamic circuit checking apparatus using data input and output comparisons for testing the data integrity of a circuit
JPS63165930A (ja) * 1986-12-27 1988-07-09 Toshiba Corp エラ−検査装置
US6304987B1 (en) * 1995-06-07 2001-10-16 Texas Instruments Incorporated Integrated test circuit
JP3005250B2 (ja) 1989-06-30 2000-01-31 テキサス インスツルメンツ インコーポレイテツド バスモニター集積回路
JP2000504830A (ja) * 1996-02-06 2000-04-18 テレフオンアクチーボラゲツト エル エム エリクソン（パブル） 集積回路デバイスを試験する組立体および方法
DE19730716A1 (de) * 1996-10-21 1998-04-23 Fraunhofer Ges Forschung Triggerung eines Meßverfahrens zur Qualitätsbeurteilung von Audio- und/oder Sprachsignalen
US6408413B1 (en) 1998-02-18 2002-06-18 Texas Instruments Incorporated Hierarchical access of test access ports in embedded core integrated circuits
US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
GB2344184A (en) 1998-11-26 2000-05-31 Ericsson Telefon Ab L M Testing integrated circuits
US7058862B2 (en) 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
JP2001166009A (ja) 1999-12-14 2001-06-22 Matsushita Electric Ind Co Ltd 診断機能を有する半導体集積回路
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter
CN100442069C (zh) * 2005-12-08 2008-12-10 上海华虹Nec电子有限公司 同步通讯芯片进行多芯片并行测试的方法
US10118307B2 (en) 2014-04-29 2018-11-06 Chervon (Hk) Limited Chain saw

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3582633A (en) * 1968-02-20 1971-06-01 Lockheed Aircraft Corp Method and apparatus for fault detection in a logic circuit
US3863215A (en) * 1973-07-03 1975-01-28 Rca Corp Detector for repetitive digital codes
US4216374A (en) * 1978-08-11 1980-08-05 John Fluke Mfg. Co., Inc. Hybrid signature test method and apparatus
US4257031A (en) * 1979-07-18 1981-03-17 The Bendix Corporation Digital remote control system
JPS5618766A (en) * 1979-07-26 1981-02-21 Fujitsu Ltd Testing apparatus for logic circuit
US4357703A (en) * 1980-10-09 1982-11-02 Control Data Corporation Test system for LSI circuits resident on LSI chips
US4404677A (en) * 1981-04-08 1983-09-13 Rockwell International Corporation Detecting redundant digital codewords using a variable criterion
US4476560A (en) * 1982-09-21 1984-10-09 Advanced Micro Devices, Inc. Diagnostic circuit for digital systems

Also Published As

Publication number Publication date
GB2181850A (en) 1987-04-29
GB8613569D0 (en) 1986-07-09
IL78898A0 (en) 1986-09-30
SE8604333D0 (sv) 1986-10-13
GB2181850B (en) 1989-12-20
FR2588966A1 (fr) 1987-04-24
CA1251569A (en) 1989-03-21
NO862510L (no) 1987-04-22
DE3635736A1 (de) 1987-04-23
IT8621514A1 (it) 1988-02-22
IT1197111B (it) 1988-11-25
SE8604333L (sv) 1987-04-22
US4683569A (en) 1987-07-28
AU5887586A (en) 1987-04-30
JPS6299835A (ja) 1987-05-09
AU584212B2 (en) 1989-05-18
IT8621514A0 (it) 1986-08-22

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