KR102430853B1 - 기준 전압 회로 및 반도체 장치 - Google Patents
기준 전압 회로 및 반도체 장치 Download PDFInfo
- Publication number
- KR102430853B1 KR102430853B1 KR1020180061873A KR20180061873A KR102430853B1 KR 102430853 B1 KR102430853 B1 KR 102430853B1 KR 1020180061873 A KR1020180061873 A KR 1020180061873A KR 20180061873 A KR20180061873 A KR 20180061873A KR 102430853 B1 KR102430853 B1 KR 102430853B1
- Authority
- KR
- South Korea
- Prior art keywords
- transistor
- reference voltage
- voltage circuit
- transistors
- depletion
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims description 21
- 230000005484 gravity Effects 0.000 claims abstract description 17
- 238000010586 diagram Methods 0.000 description 11
- 230000000694 effects Effects 0.000 description 5
- 238000005538 encapsulation Methods 0.000 description 5
- 239000011347 resin Substances 0.000 description 5
- 229920005989 resin Polymers 0.000 description 5
- 238000004806 packaging method and process Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/205—Substrate bias-voltage generators
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/26—Current mirrors
- G05F3/262—Current mirrors using field-effect transistors only
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/26—Current mirrors
- G05F3/265—Current mirrors using bipolar transistors only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
- H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
- H01L27/0883—Combination of depletion and enhancement field effect transistors
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- Electromagnetism (AREA)
- Radar, Positioning & Navigation (AREA)
- Nonlinear Science (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Control Of Electrical Variables (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017109043 | 2017-06-01 | ||
JPJP-P-2017-109043 | 2017-06-01 | ||
JPJP-P-2018-060317 | 2018-03-27 | ||
JP2018060317A JP7075172B2 (ja) | 2017-06-01 | 2018-03-27 | 基準電圧回路及び半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20180131980A KR20180131980A (ko) | 2018-12-11 |
KR102430853B1 true KR102430853B1 (ko) | 2022-08-09 |
Family
ID=64458282
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020180061873A KR102430853B1 (ko) | 2017-06-01 | 2018-05-30 | 기준 전압 회로 및 반도체 장치 |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR102430853B1 (zh) |
CN (1) | CN108983857A (zh) |
TW (1) | TWI751335B (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102130322B1 (ko) * | 2019-01-03 | 2020-07-06 | 청주대학교 산학협력단 | 박막 트랜지스터 논리회로 및 그 제조방법 |
JP2020177393A (ja) * | 2019-04-17 | 2020-10-29 | エイブリック株式会社 | 定電流回路及び半導体装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020036488A1 (en) * | 2000-06-23 | 2002-03-28 | Yoshinori Ueda | Voltage reference generation circuit and power source incorporating such circuit |
JP2009021360A (ja) * | 2007-07-11 | 2009-01-29 | Mitsumi Electric Co Ltd | Mosトランジスタ及びこれを用いたmosトランジスタ回路 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2034937B (en) * | 1978-11-14 | 1983-01-06 | Philips Electronic Associated | Regulated power supply |
US6005378A (en) * | 1998-03-05 | 1999-12-21 | Impala Linear Corporation | Compact low dropout voltage regulator using enhancement and depletion mode MOS transistors |
JP3523521B2 (ja) * | 1998-04-09 | 2004-04-26 | 松下電器産業株式会社 | Mosトランジスタ対装置 |
US6265857B1 (en) * | 1998-12-22 | 2001-07-24 | International Business Machines Corporation | Constant current source circuit with variable temperature compensation |
CN100543999C (zh) * | 2000-09-01 | 2009-09-23 | 精工电子有限公司 | Cmos半导体器件及其制造方法 |
JP4397211B2 (ja) * | 2003-10-06 | 2010-01-13 | 株式会社リコー | 基準電圧発生回路及びそれを用いた電源装置 |
JP2008004796A (ja) * | 2006-06-23 | 2008-01-10 | Matsushita Electric Ind Co Ltd | 半導体装置および回路素子レイアウト方法 |
CN100492245C (zh) * | 2007-07-11 | 2009-05-27 | 中国电子科技集团公司第二十四研究所 | 一种高电源抑制比的nmos基准电压源 |
KR101465598B1 (ko) * | 2008-06-05 | 2014-12-15 | 삼성전자주식회사 | 기준 전압 발생 장치 및 방법 |
JP5511166B2 (ja) * | 2008-09-10 | 2014-06-04 | セイコーインスツル株式会社 | 半導体装置 |
US7772920B1 (en) * | 2009-05-29 | 2010-08-10 | Linear Technology Corporation | Low thermal hysteresis bandgap voltage reference |
TWI453567B (zh) | 2009-06-26 | 2014-09-21 | Univ Michigan | 微微功率參考電壓產生器 |
JP2014187082A (ja) * | 2013-03-22 | 2014-10-02 | Hitachi Ltd | 半導体装置 |
CN104181971B (zh) * | 2013-05-24 | 2015-11-25 | 比亚迪股份有限公司 | 一种基准电压源 |
JP6193771B2 (ja) * | 2014-01-28 | 2017-09-06 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US9537338B2 (en) * | 2014-09-16 | 2017-01-03 | Navitas Semiconductor Inc. | Level shift and inverter circuits for GaN devices |
-
2018
- 2018-05-15 TW TW107116355A patent/TWI751335B/zh active
- 2018-05-30 KR KR1020180061873A patent/KR102430853B1/ko active IP Right Grant
- 2018-05-30 CN CN201810535941.3A patent/CN108983857A/zh active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020036488A1 (en) * | 2000-06-23 | 2002-03-28 | Yoshinori Ueda | Voltage reference generation circuit and power source incorporating such circuit |
JP2009021360A (ja) * | 2007-07-11 | 2009-01-29 | Mitsumi Electric Co Ltd | Mosトランジスタ及びこれを用いたmosトランジスタ回路 |
Also Published As
Publication number | Publication date |
---|---|
CN108983857A (zh) | 2018-12-11 |
TWI751335B (zh) | 2022-01-01 |
TW201911533A (zh) | 2019-03-16 |
KR20180131980A (ko) | 2018-12-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR102430853B1 (ko) | 기준 전압 회로 및 반도체 장치 | |
US20160252919A1 (en) | Power supply circuit | |
KR102407546B1 (ko) | 스큐 검출 회로 및 이를 이용한 입력 회로 | |
JP7075172B2 (ja) | 基準電圧回路及び半導体装置 | |
JP6253418B2 (ja) | ボルテージレギュレータおよび半導体装置 | |
KR20160124672A (ko) | 전류 검출 회로 | |
JP2012244117A (ja) | トリミング回路及び半導体装置 | |
KR102208799B1 (ko) | 기준 전압 회로 | |
US9557764B2 (en) | Clock tree circuit and memory controller | |
KR102483031B1 (ko) | 전류 생성 회로 | |
US9798346B2 (en) | Voltage reference circuit with reduced current consumption | |
JP5806972B2 (ja) | 出力ドライバ回路 | |
JP2017009340A (ja) | 静電気保護回路付き電流検出回路 | |
US10007289B2 (en) | High precision voltage reference circuit | |
US9197213B1 (en) | Level shifter | |
US20170237415A1 (en) | Buffer circuit | |
JP7240075B2 (ja) | 定電圧回路 | |
JP2017129929A (ja) | ボルテージレギュレータ | |
JP2006115255A (ja) | 演算増幅器 | |
US20140132242A1 (en) | Current mirror circuits | |
JP7244180B2 (ja) | 電圧クランプ回路及び集積回路。 | |
KR20180111645A (ko) | 저항 분압 회로를 갖는 반도체 장치 | |
US8816723B1 (en) | Buffer circuit | |
KR20090075107A (ko) | 전압 분배 회로 | |
JP2022114045A (ja) | 半導体装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
AMND | Amendment | ||
E601 | Decision to refuse application | ||
AMND | Amendment | ||
X701 | Decision to grant (after re-examination) | ||
GRNT | Written decision to grant |