FR2749939B1 - Detecteur de gamme de tension d'alimentation dans un circuit integre - Google Patents

Detecteur de gamme de tension d'alimentation dans un circuit integre

Info

Publication number
FR2749939B1
FR2749939B1 FR9607368A FR9607368A FR2749939B1 FR 2749939 B1 FR2749939 B1 FR 2749939B1 FR 9607368 A FR9607368 A FR 9607368A FR 9607368 A FR9607368 A FR 9607368A FR 2749939 B1 FR2749939 B1 FR 2749939B1
Authority
FR
France
Prior art keywords
integrated circuit
supply voltage
voltage range
range detector
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9607368A
Other languages
English (en)
Other versions
FR2749939A1 (fr
Inventor
Mathieu Lisart
Hubert Degoirat
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Priority to FR9607368A priority Critical patent/FR2749939B1/fr
Priority to US08/876,282 priority patent/US6147521A/en
Publication of FR2749939A1 publication Critical patent/FR2749939A1/fr
Application granted granted Critical
Publication of FR2749939B1 publication Critical patent/FR2749939B1/fr
Priority to US10/034,969 priority patent/US20020079933A1/en
Priority to US10/858,231 priority patent/US6943592B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/1659Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16504Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed
    • G01R19/16519Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed using FET's

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
FR9607368A 1996-06-13 1996-06-13 Detecteur de gamme de tension d'alimentation dans un circuit integre Expired - Fee Related FR2749939B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR9607368A FR2749939B1 (fr) 1996-06-13 1996-06-13 Detecteur de gamme de tension d'alimentation dans un circuit integre
US08/876,282 US6147521A (en) 1996-06-13 1997-06-12 Detector of range of supply voltage in an integrated circuit
US10/034,969 US20020079933A1 (en) 1996-06-13 2001-12-21 Detector of range of supply voltage in an integrated circuit
US10/858,231 US6943592B2 (en) 1996-06-13 2004-06-01 Detector of range of supply voltage in an integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9607368A FR2749939B1 (fr) 1996-06-13 1996-06-13 Detecteur de gamme de tension d'alimentation dans un circuit integre

Publications (2)

Publication Number Publication Date
FR2749939A1 FR2749939A1 (fr) 1997-12-19
FR2749939B1 true FR2749939B1 (fr) 1998-07-31

Family

ID=9493028

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9607368A Expired - Fee Related FR2749939B1 (fr) 1996-06-13 1996-06-13 Detecteur de gamme de tension d'alimentation dans un circuit integre

Country Status (2)

Country Link
US (3) US6147521A (fr)
FR (1) FR2749939B1 (fr)

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FR2749939B1 (fr) * 1996-06-13 1998-07-31 Sgs Thomson Microelectronics Detecteur de gamme de tension d'alimentation dans un circuit integre
JP2000331490A (ja) * 1999-05-18 2000-11-30 Hitachi Ltd 半導体集積回路装置
JP3578043B2 (ja) * 2000-04-14 2004-10-20 松下電器産業株式会社 電源電圧検出回路
US6304108B1 (en) * 2000-07-14 2001-10-16 Micrel, Incorporated Reference-corrected ratiometric MOS current sensing circuit
JP2002185301A (ja) * 2000-12-15 2002-06-28 Fujitsu Ltd 半導体装置及び制御方法
JP3606814B2 (ja) * 2001-02-01 2005-01-05 松下電器産業株式会社 電源検出回路
KR100434176B1 (ko) * 2001-11-30 2004-06-04 주식회사 하이닉스반도체 전원전압 레벨 검출기
US6545510B1 (en) 2001-12-10 2003-04-08 Micron Technology, Inc. Input buffer and method for voltage level detection
WO2003075461A2 (fr) * 2002-03-05 2003-09-12 Koninklijke Philips Electronics N.V. Comparateur de tension
JP3947044B2 (ja) * 2002-05-31 2007-07-18 富士通株式会社 入出力バッファ
DE10234181B3 (de) * 2002-07-26 2004-04-08 Infineon Technologies Ag Adaptive Spannungsüberwachung
JP2004191333A (ja) * 2002-12-13 2004-07-08 Matsushita Electric Ind Co Ltd 2値電源電圧検出回路
US7030668B1 (en) * 2003-06-24 2006-04-18 Xilinx, Inc. Voltage detector
JP2005039635A (ja) * 2003-07-16 2005-02-10 Matsushita Electric Ind Co Ltd パワーオンリセット回路
DE10354534A1 (de) * 2003-11-12 2005-07-14 Atmel Germany Gmbh Schaltungsanordnung zur Spannungserfassung
US7349190B1 (en) 2003-12-22 2008-03-25 Cypress Semiconductor Corp. Resistor-less accurate low voltage detect circuit and method for detecting a low voltage condition
JP4033472B2 (ja) * 2004-02-23 2008-01-16 ローム株式会社 電圧検出回路及びそれを用いたバッテリ装置
US7230456B2 (en) * 2004-02-24 2007-06-12 Intel Corporation Low current consumption detector circuit and applications
KR100607180B1 (ko) * 2004-06-18 2006-08-01 삼성전자주식회사 반도체 메모리 장치의 파워 업 리셋 회로
TWI255345B (en) * 2005-01-07 2006-05-21 Winbond Electronics Corp Low voltage detection circuit
US7106107B2 (en) * 2005-01-31 2006-09-12 Agere Systems Inc. Reliability comparator with hysteresis
US7271624B2 (en) * 2005-06-29 2007-09-18 Broadcom Corporation Low-power supply voltage level detection circuit and method
US7728621B2 (en) * 2005-08-16 2010-06-01 Novelics, Llc Block-by-block leakage control and interface
JP4717692B2 (ja) * 2006-04-14 2011-07-06 ルネサスエレクトロニクス株式会社 リミッタ回路
US20080048746A1 (en) * 2006-08-25 2008-02-28 Microchip Technology Incorporated Hysteresis Comparator with Programmable Hysteresis Width
US7869775B2 (en) * 2006-10-30 2011-01-11 Skyworks Solutions, Inc. Circuit and method for biasing a gallium arsenide (GaAs) power amplifier
US7466171B2 (en) * 2007-01-15 2008-12-16 International Business Machines Corporation Voltage detection circuit and circuit for generating a trigger flag signal
US7589568B2 (en) * 2007-05-04 2009-09-15 Microchip Technology Incorporated Variable power and response time brown-out-reset circuit
US7873921B2 (en) * 2007-11-30 2011-01-18 International Business Machines Corporation Structure for a voltage detection circuit in an integrated circuit and method of generating a trigger flag signal
TWI355801B (en) * 2008-04-01 2012-01-01 Richtek Technology Corp Dual power switch and voltage regulator using same
US7944248B2 (en) * 2008-04-17 2011-05-17 Altera Corporation Techniques for measuring voltages in a circuit
CN101604282B (zh) * 2008-06-13 2012-08-29 鸿富锦精密工业(深圳)有限公司 电压侦测报警装置
US8436659B1 (en) * 2008-06-24 2013-05-07 Marvell International Ltd. Circuits and methods for reducing electrical stress on a transistor
EP2327157A1 (fr) * 2008-09-11 2011-06-01 Nxp B.V. Dispositif de rétablissement du niveau zéro
KR20110028712A (ko) * 2009-09-14 2011-03-22 삼성전자주식회사 전압 범위 판단 회로
KR20120100496A (ko) * 2011-03-04 2012-09-12 삼성전자주식회사 전압 레귤레이터 및 이를 포함하는 집적 회로
KR20120119398A (ko) * 2011-04-21 2012-10-31 삼성전기주식회사 패드 제어 장치
EP2775371B1 (fr) * 2013-03-04 2021-01-27 Dialog Semiconductor GmbH Commande de courant pour étage de polarisation de dispositif de sortie
US9400514B2 (en) * 2013-03-04 2016-07-26 Dialog Semiconductor Gmbh Current control for output device biasing stage
US9811135B2 (en) * 2015-06-19 2017-11-07 Cypress Semiconductor Corporation Low-power type-C receiver with high idle noise and DC-level rejection
JP6903398B2 (ja) * 2016-01-27 2021-07-14 三菱電機株式会社 駆動装置および液晶表示装置
JP2017143448A (ja) * 2016-02-11 2017-08-17 アルパイン株式会社 リセット信号発生回路
JP6716373B2 (ja) * 2016-07-12 2020-07-01 日置電機株式会社 測定装置
US10928434B2 (en) * 2018-02-21 2021-02-23 Analog Devices International Unlimited Company Averaged reference with fault monitoring
TWI676886B (zh) * 2018-11-05 2019-11-11 廣達電腦股份有限公司 系統負載偵測裝置和方法

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JPS50104332A (fr) * 1974-01-28 1975-08-18
US4044304A (en) * 1974-01-28 1977-08-23 Nippon Kogaku K.K. Device for checking a d c source voltage relative to a predetermined value
GB2020437B (en) * 1978-04-14 1982-08-04 Seiko Instr & Electronics Voltage detecting circuit
US4367423A (en) * 1981-01-06 1983-01-04 General Electric Company Reset signal generator
JP2536210B2 (ja) * 1989-02-03 1996-09-18 日本電気株式会社 電源電圧監視回路
JPH043513A (ja) 1990-04-20 1992-01-08 Nec Corp パワーオンリセット回路
JPH0451711A (ja) 1990-06-20 1992-02-20 Nec Corp パワーオンクリア回路
JPH04265012A (ja) 1991-02-20 1992-09-21 Mitsubishi Electric Corp パワー・オン・リセット回路
JP3042012B2 (ja) * 1991-04-19 2000-05-15 日本電気株式会社 パワーオンリセット装置
JP2761687B2 (ja) * 1991-12-19 1998-06-04 三菱電機株式会社 電圧レベル検出回路
US5440254A (en) * 1992-10-20 1995-08-08 Exar Corporation Accurate low voltage detect circuit
DE69424764T2 (de) * 1994-01-28 2000-11-16 St Microelectronics Srl Ladungspumpenschaltung
US5781648A (en) * 1995-04-07 1998-07-14 California Institute Of Technology Pulse domain neuromorphic integrated circuit for computing motion
FR2744263B3 (fr) * 1996-01-31 1998-03-27 Sgs Thomson Microelectronics Dispositif de reference de courant en circuit integre
FR2749939B1 (fr) 1996-06-13 1998-07-31 Sgs Thomson Microelectronics Detecteur de gamme de tension d'alimentation dans un circuit integre
US5859803A (en) * 1997-09-08 1999-01-12 Information Storage Devices, Inc. Non-volatile circuit that disables failed devices

Also Published As

Publication number Publication date
US20020079933A1 (en) 2002-06-27
US6147521A (en) 2000-11-14
US20040222827A1 (en) 2004-11-11
FR2749939A1 (fr) 1997-12-19
US6943592B2 (en) 2005-09-13

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20090228