CN1067325A - 半导体记忆装置 - Google Patents

半导体记忆装置 Download PDF

Info

Publication number
CN1067325A
CN1067325A CN92100194A CN92100194A CN1067325A CN 1067325 A CN1067325 A CN 1067325A CN 92100194 A CN92100194 A CN 92100194A CN 92100194 A CN92100194 A CN 92100194A CN 1067325 A CN1067325 A CN 1067325A
Authority
CN
China
Prior art keywords
aforementioned
bit line
electric crystal
writing
require
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN92100194A
Other languages
English (en)
Chinese (zh)
Inventor
金昌来
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of CN1067325A publication Critical patent/CN1067325A/zh
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/12Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
    • G11C11/419Read-write [R-W] circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Static Random-Access Memory (AREA)
  • Semiconductor Memories (AREA)
  • Dram (AREA)
CN92100194A 1991-05-28 1992-01-10 半导体记忆装置 Pending CN1067325A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1019910008735A KR920022301A (ko) 1991-05-28 1991-05-28 반도체 기억장치
KR91-8735 1991-05-28

Publications (1)

Publication Number Publication Date
CN1067325A true CN1067325A (zh) 1992-12-23

Family

ID=19315060

Family Applications (1)

Application Number Title Priority Date Filing Date
CN92100194A Pending CN1067325A (zh) 1991-05-28 1992-01-10 半导体记忆装置

Country Status (7)

Country Link
KR (1) KR920022301A (fr)
CN (1) CN1067325A (fr)
DE (1) DE4135686A1 (fr)
FR (1) FR2677162A1 (fr)
GB (1) GB2256297A (fr)
IT (1) IT1251623B (fr)
NL (1) NL9101772A (fr)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100347786C (zh) * 2002-04-04 2007-11-07 三菱电机株式会社 设有不需要刷新操作的存储器单元的半导体存储装置
CN100350507C (zh) * 2002-09-25 2007-11-21 松下电器产业株式会社 半导体存储器件
CN100397279C (zh) * 2002-10-31 2008-06-25 松下电器产业株式会社 漏电流补偿装置及漏电流补偿方法
CN100419914C (zh) * 2001-03-30 2008-09-17 英特尔公司 用于存储器贮存单元泄漏抵消方案的设备和方法
CN106558329A (zh) * 2015-09-30 2017-04-05 展讯通信(上海)有限公司 一种单端存储器的差分读取电路及方法
WO2018152952A1 (fr) * 2017-02-21 2018-08-30 中国科学院上海微***与信息技术研究所 Circuit de lecture et procédé de lecture pour mémoire tridimensionnelle

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5828610A (en) * 1997-03-31 1998-10-27 Seiko Epson Corporation Low power memory including selective precharge circuit
JP3544933B2 (ja) * 2000-10-05 2004-07-21 Necエレクトロニクス株式会社 半導体集積回路
KR100732390B1 (ko) * 2001-12-29 2007-06-27 매그나칩 반도체 유한회사 전류 미러형 누설 전류 보상 회로
DE10255102B3 (de) * 2002-11-26 2004-04-29 Infineon Technologies Ag SRAM-Speicherzelle mit Mitteln zur Erzielung eines vom Speicherzustand unabhängigen Leckstroms
US6967875B2 (en) * 2003-04-21 2005-11-22 United Microelectronics Corp. Static random access memory system with compensating-circuit for bitline leakage

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3277750D1 (de) * 1981-09-01 1988-01-07 Fujitsu Ltd Semi-conductor memory circuit
US4467451A (en) * 1981-12-07 1984-08-21 Hughes Aircraft Company Nonvolatile random access memory cell
US4494221A (en) * 1982-03-03 1985-01-15 Inmos Corporation Bit line precharging and equilibrating circuit
JPS61239493A (ja) * 1985-04-05 1986-10-24 Fujitsu Ltd 半導体記憶装置
JPS63131396A (ja) * 1986-11-20 1988-06-03 Ricoh Co Ltd 半導体メモリ装置のセンス回路
JPS63166090A (ja) * 1986-12-26 1988-07-09 Toshiba Corp スタティック型メモリ
JPH0760600B2 (ja) * 1987-08-19 1995-06-28 三菱電機株式会社 同期型記憶装置
JP2542022B2 (ja) * 1987-12-18 1996-10-09 沖電気工業株式会社 電界効果トランジスタ負荷回路
US4975879A (en) * 1989-07-17 1990-12-04 Advanced Micro Devices, Inc. Biasing scheme for FIFO memories

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100419914C (zh) * 2001-03-30 2008-09-17 英特尔公司 用于存储器贮存单元泄漏抵消方案的设备和方法
CN100347786C (zh) * 2002-04-04 2007-11-07 三菱电机株式会社 设有不需要刷新操作的存储器单元的半导体存储装置
CN100350507C (zh) * 2002-09-25 2007-11-21 松下电器产业株式会社 半导体存储器件
CN100397279C (zh) * 2002-10-31 2008-06-25 松下电器产业株式会社 漏电流补偿装置及漏电流补偿方法
CN106558329A (zh) * 2015-09-30 2017-04-05 展讯通信(上海)有限公司 一种单端存储器的差分读取电路及方法
WO2018152952A1 (fr) * 2017-02-21 2018-08-30 中国科学院上海微***与信息技术研究所 Circuit de lecture et procédé de lecture pour mémoire tridimensionnelle

Also Published As

Publication number Publication date
ITMI912808A0 (it) 1991-10-23
GB9121767D0 (en) 1991-11-27
KR920022301A (ko) 1992-12-19
DE4135686A1 (de) 1992-12-03
FR2677162A1 (fr) 1992-12-04
ITMI912808A1 (it) 1993-04-23
IT1251623B (it) 1995-05-17
GB2256297A (en) 1992-12-02
NL9101772A (nl) 1992-12-16

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SE01 Entry into force of request for substantive examination
C06 Publication
PB01 Publication
C01 Deemed withdrawal of patent application (patent law 1993)
WD01 Invention patent application deemed withdrawn after publication