CN102735884A - Bracket for measuring head of flying-probe tester and design method of bracket - Google Patents
Bracket for measuring head of flying-probe tester and design method of bracket Download PDFInfo
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- CN102735884A CN102735884A CN2012102069892A CN201210206989A CN102735884A CN 102735884 A CN102735884 A CN 102735884A CN 2012102069892 A CN2012102069892 A CN 2012102069892A CN 201210206989 A CN201210206989 A CN 201210206989A CN 102735884 A CN102735884 A CN 102735884A
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Abstract
The invention relates to a design method of a bracket for a measuring head of a flying-probe tester. The design method comprises the following steps of: acquiring structural parameters and material parameters of the bracket; constructing a bracket model according to the structural parameters and the material parameters of the bracket; performing finite element simulation on the bracket model; and when a simulation result is in accordance with preset conditions, outputting the structural parameters and the material parameters of the bracket. The bracket which is designed according to the method meets material and structural requirements; and after a test probe is subjected to reverse thrust of a contact surface of a printed circuit board (PCB), the test probe and the contact surface can keep still relative to each other in the backward movement process, and a test probe head cannot be heavily deflected, so testing accuracy is ensured, and scratches can be avoided. Meanwhile, the bracket is moderate in rigidness, and the problems of recessing of the PCB caused by over-high rigidness, high deformation caused by over-low rigidness and over-short service life can be solved. Moreover, the invention also provides the bracket which is designed according to the method.
Description
Technical field
The present invention relates to flying probe tester, particularly relate to a kind of flying probe tester gauge head support and method for designing.
Background technology
Flying probe tester is a system that in manufacturing environment, tests PCB (Printed Circuit Board, printed circuit board (PCB)), and flying probe is one of method (open-short circuit) of an inspection PCB electrical functionality.Flying probe tester moves to each testing needle on the fixing unit to be tested, thus the discrete component that the pad of testing needle engaged test PCB and via hole are tested unit to be tested.The pad of PCB and the size of through hole are very little, if guarantee measuring accuracy, testing needle receives the reaction thrust of surface of contact behind contact measured examination PCB pad and through hole so, and excessive skew can not take place the test syringe needle in retreating moving process.Simultaneously, the test syringe needle is little and sharp, is not scratched in order to guarantee PCB, also requires testing needle behind contact PCB, excessive side-play amount and too big contact force can not be arranged.
Because of testing needle is installed on the flying probe tester gauge head support, guarantee the surface quality of measuring accuracy and PCB, the design of flying probe tester gauge head support seems particularly important.Traditional flying probe tester gauge head stent development cycle is grown and can not ensure the quality of products.
Summary of the invention
Based on this, a kind of construction cycle is short and can ensure the quality of products flying probe tester gauge head support (hereinafter to be referred as support) and method for designing are provided.
A kind of method for designing of flying probe tester gauge head support, said method for designing comprise the steps: to obtain the structural parameters and the material parameter of support; Structural parameters and material parameter according to said support make up the support model; Said support model is carried out finite element simulation,, then export the structural parameters and the material parameter of said support when simulation result satisfies pre-conditionedly.
Therein among embodiment; The support of said structure is plastic material and comprises pedestal, first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force that extend towards a side from said pedestal respectively; And be arranged at said first arm of force, second arm of force, the 3rd arm of force and the terminal installation portion of the 4th arm of force; Said first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with first groove with the intersection of said pedestal respectively; Said first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with second groove with the intersection of said installation portion respectively; Said first arm of force and said second arm of force are symmetrical set, and said the 3rd arm of force and the 4th arm of force are symmetrical set.
Therein among embodiment, said structural parameters comprise in size, chaining pin mounting hole bit position and the support fixed orifice bit position of installing space at least a.
Among embodiment, said material parameter comprises the elasticity coefficient and the material properties of material therein.
Therein among embodiment, said pre-conditioned comprising: preset measuring accuracy scope; Less than the allowed maximum stress size of bearing in PCB preset to be tested surface; The maximum access times of test bracket are more than or equal to the maximum access times of the gauge head support of prediction.
Among embodiment, said preset precision comprises that preset support receives the allowed maximum deformation quantity of contact counter-force therein.
Therein among embodiment, the allowed maximum stress size of bearing in said preset PCB to be tested surface adopts behind preset contact force and the support force relation of deflection to represent.
Therein among embodiment, after the step of the said structural parameters that obtain support, also comprise step: said structural parameters are carried out displacement ratio processing and amplifying.
A kind of flying probe tester gauge head support; It is for plastic material and comprise pedestal, first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force that extend towards a side from said pedestal respectively; And be arranged at said first arm of force, second arm of force, the 3rd arm of force and the terminal installation portion of the 4th arm of force; Said first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with first groove with the intersection of said pedestal respectively; Said first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with second groove with the intersection of said installation portion respectively, and said first arm of force and said second arm of force are symmetrical set, and said the 3rd arm of force and the 4th arm of force are symmetrical set.
Therein among embodiment; The length of said first arm of force is greater than the length of said the 3rd arm of force; Said installation portion comprises first installation portion that connects said first arm of force and the 3rd arm of force end and second installation portion that is connected said second arm of force and the 4th arm of force, offers the fixedly fixed orifice of gauge head support on the said pedestal.
The method for designing of above-mentioned flying probe tester gauge head support makes the construction cycle than lacking and can ensuring the quality of products through making up the support model and adopting finite element simulation.The support of designing according to this method satisfies material and topology requirement; Can make testing needle behind the reaction thrust that receives the PCB surface of contact; In retreating moving process, can keep testing needle and surface of contact static relatively; Excessive beat does not take place in the test syringe needle, and then guarantees measuring accuracy, has guaranteed not stay on the test PCB scratch of testing needle yet.Simultaneously, the rigidity of this support is moderate, can not cause contact force excessive and make PCB stay indenture because rigidity is too high, also can not cause being out of shape excessive and support too short problem in serviceable life because rigidity crosses low.
Description of drawings
Fig. 1 is the design flow diagram of this embodiment flying probe tester gauge head support;
Fig. 2 is the contact force test curve of this embodiment flying probe tester gauge head support and PCB;
Fig. 3 is the structural drawing of this embodiment flying probe tester gauge head support.
Embodiment
Please join Fig. 1, this embodiment discloses a kind of method for designing of flying probe tester gauge head support, and it comprises the steps:
Step S110 obtains the structural parameters and the material parameter of support.
Step S120 is according to the structural parameters and the material parameter structure support model of said support.
Step S130 carries out finite element simulation to said support model.
Step S140, it is pre-conditioned to judge whether simulation result satisfies, if execution in step S150 if not, returns step S110.
Step S150 exports the structural parameters and the material parameter of said support.
This kind structure support model also adopts method construction cycle of finite element simulation short and can ensure the quality of products.The support of designing according to this method satisfies material and topology requirement; Can make testing needle behind the reaction thrust that receives the PCB surface of contact; In retreating moving process, can keep testing needle and surface of contact static relatively; Excessive beat does not take place in the test syringe needle, and then guarantees measuring accuracy, has guaranteed not stay on the test PCB scratch of testing needle yet.Simultaneously, the rigidity of this support is moderate, can not cause contact force excessive and make PCB stay indenture because rigidity is too high, also can not cause being out of shape excessive and support too short problem in serviceable life because rigidity crosses low.
Please join Fig. 3; The support 100 that makes up is for plastic material and comprise pedestal 210, first arm of force 221 that extends towards a side from pedestal 210 respectively, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224, and is arranged at first arm of force 221, second arm of force 222, the 3rd arm of force 223 and the terminal installation portion 230 of the 4th arm of force 224.First arm of force 221, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224 are provided with first groove 225 with the intersection of pedestal 210 respectively.First arm of force 221, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224 are provided with second groove 226 with the intersection of installation portion 230 respectively.First arm of force 221 and second arm of force 222 are symmetrical set, and the 3rd arm of force 223 and the 4th arm of force 224 are symmetrical set.
Structural parameters comprise in size, chaining pin mounting hole bit position and the support fixed orifice bit position of installing space at least a.
After the step of the structural parameters that obtain support, also comprise step: said structural parameters are carried out displacement ratio processing and amplifying.Structural strain is little, stress is low, but displacement can suitably amplify, and can improve the serviceable life of support thus.
Material parameter comprises the elasticity coefficient and the material properties of material.Material need possess the function that is similar to spring and confirm.Preferably, support adopts plastics, and is designed to built-in coil component spring or spring leaf or offers the version that groove is similar to parallelogram.
Pre-conditioned comprising: preset measuring accuracy scope; Less than the allowed maximum stress size of bearing in PCB preset to be tested surface; The maximum access times of test bracket are more than or equal to the maximum access times of the gauge head support of prediction.
Preset precision comprises that preset support receives the allowed maximum deformation quantity of contact counter-force.Preferably, according to the measuring accuracy requirement, support receive testing needle with the test PCB contact the counter-force effect after, the deflection of retreating left and right, up and down direction in the moving process at fore-and-aft direction can not be excessive.Among the concrete embodiment, the allowed deflection of both direction is 10um.
The relation of deflection is represented behind allowed preset contact force of maximum stress size employing of bearing in PCB preset to be tested surface and the support force.The stress that is born makes PCB to be measured surface not stay indenture and scratch.Preferably, make the firmly size of test platform test contact force, confirm the relation of displacement with displacement transducer.Among the concrete embodiment, displacement was 1.5mm to the maximum when contact force was 1.5N to the maximum, please refer to Fig. 2.
Please join Fig. 3; This embodiment also provides a kind of flying probe tester gauge head support 200; It is for plastic material and comprise pedestal 210, first arm of force 221 that extends towards a side from pedestal 210 respectively, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224, and is arranged at first arm of force 221, second arm of force 222, the 3rd arm of force 223 and the terminal installation portion 230 of the 4th arm of force 224.First arm of force 221, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224 are provided with first groove 225 with the intersection of pedestal 210 respectively.First arm of force 221, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224 are provided with second groove 226 with the intersection of installation portion 230 respectively.First arm of force 221 and second arm of force 222 are symmetrical set, and the 3rd arm of force 223 and the 4th arm of force 224 are symmetrical set.
The length of first arm of force 221 is greater than the length of the 3rd arm of force 223; Installation portion 230 comprises first installation portion 231 that connects first arm of force 221 and the 3rd arm of force 223 ends and is connected second arm of force 222 and second installation portion 232 of the 4th arm of force 224, offers the fixedly fixed orifice 211 of gauge head support on the pedestal 210.
During test; Support 200 receives repulsion power; First to fourth arm of force can effectively distribute the size of power; And make first groove 225 at first to fourth arm of force two ends and second groove 226 produce corresponding distortion, and guaranteeing that the testing needle (not shown) that is installed on installation portion 230 almost moves abreast in test, side-play amount is less; At least two arm of forces are symmetrical set and make each arm of force distortion more even, and left and right, up and down direction rolling momentum is fewer; And support 200 adopts elastoplast, makes its rigidity moderate, can not cause contact force to cross ambassador PCB (not shown) because rigidity is too high and stay indenture, thereby guarantee measuring accuracy.
The above embodiment has only expressed several kinds of embodiments of the present invention, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to claim of the present invention.Should be pointed out that for the person of ordinary skill of the art under the prerequisite that does not break away from the present invention's design, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with accompanying claims.
Claims (10)
1. the method for designing of a flying probe tester gauge head support is characterized in that, said method for designing comprises the steps:
Obtain the structural parameters and the material parameter of support;
Structural parameters and material parameter according to said support make up the support model;
Said support model is carried out finite element simulation,, then export the structural parameters and the material parameter of said support when simulation result satisfies pre-conditionedly.
2. the method for designing of flying probe tester gauge head support according to claim 1; It is characterized in that; The support of said structure is plastic material and comprises pedestal, first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force that extend towards a side from said pedestal respectively; And be arranged at said first arm of force, second arm of force, the 3rd arm of force and the terminal installation portion of the 4th arm of force; Said first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with first groove with the intersection of said pedestal respectively; Said first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with second groove with the intersection of said installation portion respectively, and said first arm of force and said second arm of force are symmetrical set, and said the 3rd arm of force and the 4th arm of force are symmetrical set.
3. the method for designing of flying probe tester gauge head support according to claim 1 is characterized in that, said structural parameters comprise in size, chaining pin mounting hole bit position and the support fixed orifice bit position of installing space at least a.
4. the method for designing of flying probe tester gauge head support according to claim 1 is characterized in that, said material parameter comprises the elasticity coefficient and the material properties of material.
5. according to the method for designing of each described flying probe tester gauge head support in the claim 1 to 4, it is characterized in that said pre-conditioned comprising:
Preset measuring accuracy scope;
Less than the allowed maximum stress size of bearing in PCB preset to be tested surface;
The maximum access times of test bracket are more than or equal to the maximum access times of the gauge head support of prediction.
6. the method for designing of flying probe tester gauge head support according to claim 5 is characterized in that, said preset precision comprises that preset support receives the allowed maximum deformation quantity of contact counter-force.
7. the method for designing of flying probe tester gauge head support according to claim 5 is characterized in that, the relation of deflection is represented behind allowed preset contact force of maximum stress size employing of bearing in said preset PCB to be tested surface and the support force.
8. the method for designing of flying probe tester gauge head support according to claim 7 is characterized in that, after the step of the said structural parameters that obtain support, also comprises step: said structural parameters are carried out displacement ratio processing and amplifying.
9. flying probe tester gauge head support; It is characterized in that; It is for plastic material and comprise pedestal, first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force that extend towards a side from said pedestal respectively; And be arranged at said first arm of force, second arm of force, the 3rd arm of force and the terminal installation portion of the 4th arm of force; Said first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with first groove with the intersection of said pedestal respectively; Said first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with second groove with the intersection of said installation portion respectively, and said first arm of force and said second arm of force are symmetrical set, and said the 3rd arm of force and the 4th arm of force are symmetrical set.
10. flying probe tester gauge head support according to claim 9; It is characterized in that; The length of said first arm of force is greater than the length of said the 3rd arm of force; Said installation portion comprises first installation portion that connects said first arm of force and the 3rd arm of force end and second installation portion that is connected said second arm of force and the 4th arm of force, offers the fixedly fixed orifice of gauge head support on the said pedestal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210206989.2A CN102735884B (en) | 2012-06-21 | 2012-06-21 | Bracket for measuring head of flying-probe tester and design method of bracket |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210206989.2A CN102735884B (en) | 2012-06-21 | 2012-06-21 | Bracket for measuring head of flying-probe tester and design method of bracket |
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| Publication Number | Publication Date |
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| CN102735884A true CN102735884A (en) | 2012-10-17 |
| CN102735884B CN102735884B (en) | 2014-09-10 |
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| CN201210206989.2A Active CN102735884B (en) | 2012-06-21 | 2012-06-21 | Bracket for measuring head of flying-probe tester and design method of bracket |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103049607A (en) * | 2012-12-17 | 2013-04-17 | 深圳市大族激光科技股份有限公司 | Improved method for gantry type support connection mode and gantry type support |
| CN104251923A (en) * | 2014-09-17 | 2014-12-31 | 深圳市大族激光科技股份有限公司 | Two-wire testing probe device and application method thereof |
| CN105652178A (en) * | 2014-11-13 | 2016-06-08 | 大族激光科技产业集团股份有限公司 | Design method of flying probe tester motion beam structure |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103049607A (en) * | 2012-12-17 | 2013-04-17 | 深圳市大族激光科技股份有限公司 | Improved method for gantry type support connection mode and gantry type support |
| CN104251923A (en) * | 2014-09-17 | 2014-12-31 | 深圳市大族激光科技股份有限公司 | Two-wire testing probe device and application method thereof |
| CN104251923B (en) * | 2014-09-17 | 2017-06-30 | 大族激光科技产业集团股份有限公司 | Measure with two cable probe unit and its application process |
| CN105652178A (en) * | 2014-11-13 | 2016-06-08 | 大族激光科技产业集团股份有限公司 | Design method of flying probe tester motion beam structure |
| CN105652178B (en) * | 2014-11-13 | 2018-11-27 | 大族激光科技产业集团股份有限公司 | A kind of design method of flying probe tester movement girder construction |
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| Publication number | Publication date |
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| CN102735884B (en) | 2014-09-10 |
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Address after: 518101 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Han's CNC Technology Co.,Ltd. Address before: 518101 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee before: HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. |