CN102735884B - Bracket for measuring head of flying-probe tester and design method of bracket - Google Patents
Bracket for measuring head of flying-probe tester and design method of bracket Download PDFInfo
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- CN102735884B CN102735884B CN201210206989.2A CN201210206989A CN102735884B CN 102735884 B CN102735884 B CN 102735884B CN 201210206989 A CN201210206989 A CN 201210206989A CN 102735884 B CN102735884 B CN 102735884B
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Abstract
The invention relates to a design method of a bracket for a measuring head of a flying-probe tester. The design method comprises the following steps of: acquiring structural parameters and material parameters of the bracket; constructing a bracket model according to the structural parameters and the material parameters of the bracket; performing finite element simulation on the bracket model; and when a simulation result is in accordance with preset conditions, outputting the structural parameters and the material parameters of the bracket. The bracket which is designed according to the method meets material and structural requirements; and after a test probe is subjected to reverse thrust of a contact surface of a printed circuit board (PCB), the test probe and the contact surface can keep still relative to each other in the backward movement process, and a test probe head cannot be heavily deflected, so testing accuracy is ensured, and scratches can be avoided. Meanwhile, the bracket is moderate in rigidness, and the problems of recessing of the PCB caused by over-high rigidness, high deformation caused by over-low rigidness and over-short service life can be solved. Moreover, the invention also provides the bracket which is designed according to the method.
Description
Technical field
The present invention relates to flying probe tester, particularly relate to a kind of flying probe tester gauge head support and method for designing.
Background technology
Flying probe tester is a system of testing PCB (Printed Circuit Board, printed circuit board (PCB)) in manufacturing environment, and flying probe is one of method (open-short circuit) that checks PCB electrical functionality.Flying probe tester moves to each testing needle on fixing unit to be tested, thus the discrete component that the pad of testing needle engaged test PCB and via hole are tested unit to be tested.The pad of PCB and the size of through hole are very little, if guarantee measuring accuracy, testing needle is subject to the reaction thrust of surface of contact after contact measured examination PCB pad and through hole so, tests syringe needle excessive skew can not occur in retreating moving process.Meanwhile, test syringe needle is little and sharp, in order to guarantee that PCB is not scratched, also requires testing needle can not have excessive side-play amount and too large contact force after contact PCB.
Because testing needle is installed on flying probe tester gauge head support, guarantee the surface quality of measuring accuracy and PCB, the design of flying probe tester gauge head support seems particularly important.Traditional flying probe tester gauge head stent development cycle is grown and can not ensure the quality of products.
Summary of the invention
Based on this, provide a kind of construction cycle is shorter and can ensure the quality of products flying probe tester gauge head support (hereinafter to be referred as support) and method for designing.
A method for designing for flying probe tester gauge head support, described method for designing comprises the steps: to obtain structural parameters and the material parameter of support, according to the structural parameters of described support and material parameter, build support model, described support model is carried out to finite element simulation, when simulation result meets pre-conditionedly, export structural parameters and the material parameter of described support, and, the support of described structure is plastic material and comprises pedestal, first arm of force extending towards a side from described pedestal respectively, second arm of force, the 3rd arm of force and the 4th arm of force, and be arranged at described first arm of force, second arm of force, the installation portion of the 3rd arm of force and the 4th arm of force end, described first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with the first groove with the intersection of described pedestal respectively, described first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with the second groove with the intersection of described installation portion respectively, described first arm of force and described second arm of force are symmetrical arranged, described the 3rd arm of force and the 4th arm of force are symmetrical arranged.
Therein in an embodiment, described structural parameters comprise at least one in size, chaining pin mounting hole bit position and the support fixed orifice bit position of installing space.
In an embodiment, described material parameter comprises elasticity coefficient and the material properties of material therein.
Therein in an embodiment, described pre-conditioned comprising: default measuring accuracy scope; Be less than the allowed maximum stress bearing in default tested PCB surface; The maximum access times of test bracket are more than or equal to the maximum access times of gauge head support of prediction.
In an embodiment, described default precision comprises that default support is subject to contacting the allowed maximum deformation quantity of counter-force therein.
In an embodiment, after the allowed default contact force of maximum stress employing of bearing in described default tested PCB surface and support force, the relation of deflection represents therein.
Therein in an embodiment, after the step of the described structural parameters that obtain support, also comprise step: described structural parameters are carried out to displacement ratio and amplify and process.
A kind of flying probe tester gauge head support, it is for plastic material and comprise pedestal, first arm of force extending towards a side from described pedestal respectively, second arm of force, the 3rd arm of force and the 4th arm of force, and be arranged at described first arm of force, second arm of force, the installation portion of the 3rd arm of force and the 4th arm of force end, described first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with the first groove with the intersection of described pedestal respectively, described first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with the second groove with the intersection of described installation portion respectively, described first arm of force and described second arm of force are symmetrical arranged, described the 3rd arm of force and the 4th arm of force are symmetrical arranged.
Therein in an embodiment, the length of described first arm of force is greater than the length of described the 3rd arm of force, described installation portion comprises and connects the first installation portion of described first arm of force and the 3rd arm of force end and be connected described second arm of force and the second installation portion of the 4th arm of force, offers the fixedly fixed orifice of gauge head support on described pedestal.
The method for designing of above-mentioned flying probe tester gauge head support being by building support model and adopting finite element simulation, makes the construction cycle shorter and can ensure the quality of products.The support of designing according to this method meets material and topology requirement, can make testing needle after being subject to the reaction thrust of PCB surface of contact, in retreating moving process, can keep testing needle relative with surface of contact static, there is not excessive beat in test syringe needle, and then assurance measuring accuracy, also guaranteed to test the scratch that does not leave testing needle on PCB.Meanwhile, the rigidity of this support is moderate, can not cause because rigidity is too high contact force excessive and make PCB leave indenture, also can not cause because rigidity is too low being out of shape excessive and support too short problem in serviceable life.
Accompanying drawing explanation
Fig. 1 is the design flow diagram of present embodiment flying probe tester gauge head support;
Fig. 2 is the contact force test curve of present embodiment flying probe tester gauge head support and PCB;
Fig. 3 is the structural drawing of present embodiment flying probe tester gauge head support.
Embodiment
Please refer to the drawing 1, present embodiment discloses a kind of method for designing of flying probe tester gauge head support, and it comprises the steps:
Step S110, obtains structural parameters and the material parameter of support.
Step S120, builds support model according to the structural parameters of described support and material parameter.
Step S130, carries out finite element simulation to described support model.
Step S140, judges whether simulation result meets pre-conditioned, if so, performs step S150, if not, returns to step S110.
Step S150, exports structural parameters and the material parameter of described support.
This kind of structure support model also adopts method construction cycle of finite element simulation shorter and can ensure the quality of products.The support of designing according to this method meets material and topology requirement, can make testing needle after being subject to the reaction thrust of PCB surface of contact, in retreating moving process, can keep testing needle relative with surface of contact static, there is not excessive beat in test syringe needle, and then assurance measuring accuracy, also guaranteed to test the scratch that does not leave testing needle on PCB.Meanwhile, the rigidity of this support is moderate, can not cause because rigidity is too high contact force excessive and make PCB leave indenture, also can not cause because rigidity is too low being out of shape excessive and support too short problem in serviceable life.
Please refer to the drawing 3, the support 200 building is for plastic material and comprise pedestal 210, first arm of force 221, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224 that from pedestal 210, towards a side, extend respectively, and is arranged at the installation portion 230 of first arm of force 221, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224 ends.First arm of force 221, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224 are provided with the first groove 225 with the intersection of pedestal 210 respectively.First arm of force 221, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224 are provided with the second groove 226 with the intersection of installation portion 230 respectively.First arm of force 221 and second arm of force 222 are symmetrical arranged, and the 3rd arm of force 223 and the 4th arm of force 224 are symmetrical arranged.
Structural parameters comprise at least one in size, chaining pin mounting hole bit position and the support fixed orifice bit position of installing space.
After the step of structural parameters of obtaining support, also comprise step: described structural parameters are carried out to displacement ratio and amplify processing.Structural strain is little, stress is low, but displacement can suitably amplify, and can improve thus the serviceable life of support.
Material parameter comprises elasticity coefficient and the material properties of material.Material need possess the function that is similar to spring and determine.Preferably, support adopts plastics, and is designed to built-in coil component spring or spring leaf or offers the version that groove is similar to parallelogram.
Pre-conditioned comprising: default measuring accuracy scope; Be less than the allowed maximum stress size of bearing in default tested PCB surface; The maximum access times of test bracket are more than or equal to the maximum access times of gauge head support of prediction.
Default precision comprises that default support is subject to contacting the allowed maximum deformation quantity of counter-force.Preferably, according to measuring accuracy requirement, support is being subject to testing needle and test the contacting after counter-force effect of PCB, and the deflection that retreats left and right, up and down direction in moving process at fore-and-aft direction can not be excessive.In a specific embodiment, the allowed deflection of both direction is 10um.
After the allowed default contact force of maximum stress size employing of bearing in default tested PCB surface and support force, the relation of deflection represents.The stress bearing makes PCB to be measured surface not leave indenture and scratch.Preferably, make the firmly size of test platform test contact force, with displacement transducer, determine the relation of displacement.In a specific embodiment, when contact force is 1.5N to the maximum, displacement is 1.5mm to the maximum, please refer to Fig. 2.
Please refer to the drawing 3, present embodiment also provides a kind of flying probe tester gauge head support 200, it is for plastic material and comprise pedestal 210, first arm of force 221, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224 that from pedestal 210, towards a side, extend respectively, and is arranged at the installation portion 230 of first arm of force 221, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224 ends.First arm of force 221, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224 are provided with the first groove 225 with the intersection of pedestal 210 respectively.First arm of force 221, second arm of force 222, the 3rd arm of force 223 and the 4th arm of force 224 are provided with the second groove 226 with the intersection of installation portion 230 respectively.First arm of force 221 and second arm of force 222 are symmetrical arranged, and the 3rd arm of force 223 and the 4th arm of force 224 are symmetrical arranged.
The length of first arm of force 221 is greater than the length of the 3rd arm of force 223, installation portion 230 comprises and connects the first installation portion 231 of first arm of force 221 and the 3rd arm of force 223 ends and be connected second arm of force 222 and the second installation portion 232 of the 4th arm of force 224, offers the fixedly fixed orifice 211 of gauge head support on pedestal 210.
During test, support 200 is subject to repulsion power, first to fourth arm of force can effectively distribute the size of power, and make first groove 225 at first to fourth arm of force two ends and the second groove 226 produce corresponding distortion, the testing needle (not shown) that assurance is installed on installation portion 230 almost moves abreast in test, and side-play amount is less; At least two arm of forces are symmetrical arranged and make each arm of force distortion more even, and left and right, up and down direction rolling momentum is fewer; And support 200 adopts elastoplast, makes its rigidity moderate, can not cause because rigidity is too high contact force to cross ambassador PCB (not shown) and leave indenture, thereby guarantee measuring accuracy.
The above embodiment has only expressed several embodiment of the present invention, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.
Claims (9)
1. a method for designing for flying probe tester gauge head support, is characterized in that, described method for designing comprises the steps:
Obtain structural parameters and the material parameter of support;
According to the structural parameters of described support and material parameter, build support model;
Described support model is carried out to finite element simulation, when simulation result meets pre-conditionedly, export structural parameters and the material parameter of described support; And,
The support of described structure is plastic material and comprises pedestal, first arm of force extending towards a side from described pedestal respectively, second arm of force, the 3rd arm of force and the 4th arm of force, and be arranged at described first arm of force, second arm of force, the installation portion of the 3rd arm of force and the 4th arm of force end, described first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with the first groove with the intersection of described pedestal respectively, described first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with the second groove with the intersection of described installation portion respectively, described first arm of force and described second arm of force are symmetrical arranged, described the 3rd arm of force and the 4th arm of force are symmetrical arranged.
2. the method for designing of flying probe tester gauge head support according to claim 1, is characterized in that, described structural parameters comprise at least one in size, chaining pin mounting hole bit position and the support fixed orifice bit position of installing space.
3. the method for designing of flying probe tester gauge head support according to claim 1, is characterized in that, described material parameter comprises elasticity coefficient and the material properties of material.
4. according to the method for designing of the flying probe tester gauge head support described in any one in claims 1 to 3 item, it is characterized in that described pre-conditioned comprising:
Default measuring accuracy scope;
Be less than the allowed maximum stress bearing in default tested PCB surface;
The maximum access times of test bracket are more than or equal to the maximum access times of gauge head support of prediction.
5. the method for designing of flying probe tester gauge head support according to claim 4, is characterized in that, described default precision comprises that default support is subject to contacting the allowed maximum deformation quantity of counter-force.
6. the method for designing of flying probe tester gauge head support according to claim 4, is characterized in that, after the allowed default contact force of maximum stress employing of bearing in described default tested PCB surface and support force, the relation of deflection represents.
7. the method for designing of flying probe tester gauge head support according to claim 6, is characterized in that, also comprises step after the step of the described structural parameters that obtain support: described structural parameters are carried out to displacement ratio and amplify and process.
8. a flying probe tester gauge head support, it is characterized in that, it is for plastic material and comprise pedestal, first arm of force extending towards a side from described pedestal respectively, second arm of force, the 3rd arm of force and the 4th arm of force, and be arranged at described first arm of force, second arm of force, the installation portion of the 3rd arm of force and the 4th arm of force end, described first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with the first groove with the intersection of described pedestal respectively, described first arm of force, second arm of force, the 3rd arm of force and the 4th arm of force are provided with the second groove with the intersection of described installation portion respectively, described first arm of force and described second arm of force are symmetrical arranged, described the 3rd arm of force and the 4th arm of force are symmetrical arranged.
9. flying probe tester gauge head support according to claim 8, it is characterized in that, the length of described first arm of force is greater than the length of described the 3rd arm of force, described installation portion comprises and connects the first installation portion of described first arm of force and the 3rd arm of force end and be connected described second arm of force and the second installation portion of the 4th arm of force, offers the fixedly fixed orifice of gauge head support on described pedestal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210206989.2A CN102735884B (en) | 2012-06-21 | 2012-06-21 | Bracket for measuring head of flying-probe tester and design method of bracket |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210206989.2A CN102735884B (en) | 2012-06-21 | 2012-06-21 | Bracket for measuring head of flying-probe tester and design method of bracket |
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| CN102735884A CN102735884A (en) | 2012-10-17 |
| CN102735884B true CN102735884B (en) | 2014-09-10 |
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| CN201210206989.2A Active CN102735884B (en) | 2012-06-21 | 2012-06-21 | Bracket for measuring head of flying-probe tester and design method of bracket |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103049607A (en) * | 2012-12-17 | 2013-04-17 | 深圳市大族激光科技股份有限公司 | Improved method for gantry type support connection mode and gantry type support |
| CN104251923B (en) * | 2014-09-17 | 2017-06-30 | 大族激光科技产业集团股份有限公司 | Measure with two cable probe unit and its application process |
| CN105652178B (en) * | 2014-11-13 | 2018-11-27 | 大族激光科技产业集团股份有限公司 | A kind of design method of flying probe tester movement girder construction |
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Address after: 518000 No. 9 West West Road, Nanshan District hi tech park, Shenzhen, Guangdong Co-patentee after: HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. Patentee after: HAN'S LASER TECHNOLOGY INDUSTRY GROUP Co.,Ltd. Address before: 518000 No. 9 West West Road, Nanshan District hi tech park, Shenzhen, Guangdong Co-patentee before: HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. Patentee before: Han's Laser Technology Co.,Ltd. |
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Effective date of registration: 20200612 Address after: 518101 workshop 5 / F, 1 / 2 / F, 14 / F, 17 / F, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. Address before: 518000 No. 9 West West Road, Nanshan District hi tech park, Shenzhen, Guangdong Co-patentee before: HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. Patentee before: HAN'S LASER TECHNOLOGY INDUSTRY GROUP Co.,Ltd. |
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Address after: 518101 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Han's CNC Technology Co.,Ltd. Address before: 518101 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee before: HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. |
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