CN204116399U - Flying probe device and test probe thereof - Google Patents
Flying probe device and test probe thereof Download PDFInfo
- Publication number
- CN204116399U CN204116399U CN201420535273.1U CN201420535273U CN204116399U CN 204116399 U CN204116399 U CN 204116399U CN 201420535273 U CN201420535273 U CN 201420535273U CN 204116399 U CN204116399 U CN 204116399U
- Authority
- CN
- China
- Prior art keywords
- arm
- force
- probe
- fixed part
- rod
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The utility model relates to a kind of test probe, comprises elastic support and is arranged on the probe on elastic support, wherein: elastic support comprises fixed part, first arm of force, second arm of force and probe installation portion; First arm of force and second arm of force are all arranged on fixed part, probe installation portion is arranged at first arm of force and second arm of force one end away from fixed part, probe installation portion offers probe mounting groove, and the bearing of trend of probe mounting groove is vertical with the bearing of trend of first arm of force; The junction of first arm of force, second arm of force and fixed part and installation portion of popping one's head in all offers the groove that can reduce elastic support rigidity; Probe comprises linking arm and is arranged at the contact needle on linking arm one end, and linking arm is arranged in probe mounting groove.Above-mentioned test probe has can the advantage of the tested printed circuit board (PCB) of available protecting.A kind of flying probe device using above-mentioned test probe is also provided simultaneously.
Description
Technical field
The utility model relates to printed circuit board test technology, particularly relates to a kind of flying probe device and test probe thereof.
Background technology
Flying probe device is for each test probe on it being moved to fixing unit to be tested, the pad of test probe contact measured PCB and via hole, thus the situation of test PCB circuit on-off short circuit.During test, test probe usually with pin under the speed of 10 ~ 50 times per second with lift pin to contact different test point.For reaching reliable test, probe needs firmly to prick on test board.Therefore, need to ensure that the contact force of probe and PCB to be measured is suitable, avoid PCB surperficial by embroider, this just requires its plastics spring support to need to vibrate in suitable rigidity and test process little.
But, in traditional flying probe device, due to pin under test probe and lift the speed of pin quickly, meanwhile, because the rigidity of support is comparatively large, after test probe contacts with printed circuit board (PCB), contact force is excessive, cause printed circuit board (PCB) to have scratch or indenture, result in scrapping of printed circuit board (PCB).
Utility model content
Based on this, be necessary to provide a kind of can the test probe of the tested printed circuit board (PCB) of available protecting.
A kind of test probe, comprises elastic support and is arranged on the probe on elastic support, wherein:
Described elastic support comprises:
Fixed part;
First arm of force, one end is arranged on described fixed part;
Second arm of force, one end is arranged on described fixed part, and with described first arm of force separately; And
Probe installation portion, be arranged at described first arm of force and described second arm of force away from one end of described fixed part, described probe installation portion offers probe mounting groove, and the bearing of trend of described probe mounting groove is vertical with the bearing of trend of described first arm of force; The junction of described first arm of force, described second arm of force and described fixed part and described probe installation portion all offers the groove that can reduce described elastic support rigidity;
Described probe comprises linking arm and is arranged at the contact needle on described linking arm one end, and described linking arm is arranged in described probe mounting groove.
Wherein in an embodiment, the each described junction of described first arm of force, described second arm of force and described fixed part and described probe installation portion all offers two relative grooves, described groove is U-lag, and to make described first arm of force, each described junction of described second arm of force and described fixed part and described probe installation portion is " work " character form structure.
Wherein in an embodiment, relatively described second arm of force of described first arm of force is closer to described contact needle, and the length of described first arm of force is greater than the length of described second arm of force.
Wherein in an embodiment, described fixed part is step-like structure, the second step portion comprising first step portion and be connected with described first step portion, described first arm of force is connected with described first step portion, and described second arm of force is connected with described second step portion.
Wherein in an embodiment, the direction extended with described first arm of force and described second arm of force is for short transverse, and the direction extended with described probe mounting groove, for Width, is thickness direction with described short transverse and all vertical direction of described Width;
Described first arm of force comprises first body of rod and second body of rod that are connected, and described first body of rod is connected with described fixed part, and described second body of rod is connected with described probe installation portion, and the thickness of described first body of rod is greater than the thickness of described second body of rod.
Wherein in an embodiment, described second arm of force comprises the 3rd body of rod and the 4th body of rod that are connected, described 3rd body of rod is connected with described fixed part, and described 4th body of rod is connected with described probe installation portion, and the thickness of described 3rd body of rod is greater than the thickness of described 4th body of rod.
Wherein in an embodiment, the needle point of described contact needle is positioned at described elastic support on the center line of thickness direction.
Wherein in an embodiment, described contact needle is blade-shaped structure or needle-like structures.
Wherein in an embodiment, described first arm of force and described second arm of force are rectangular cylindrical structures.
In addition, there is a need to provide a kind of flying probe device using above-mentioned test probe.
A kind of flying probe device, comprises above-mentioned test probe.
Above-mentioned flying probe device and test probe thereof; all groove is offered in the junction of first arm of force, second arm of force and fixed part and installation portion of popping one's head in; thus reduce the rigidity of elastic support entirety; utilize the pliability of elastic support self; avoid test probe and printed circuit board (PCB) hard contact in test process, available protecting printed circuit board (PCB).
Accompanying drawing explanation
Fig. 1 is the structural drawing of the test probe in an embodiment;
Fig. 2 is the structural drawing of the test probe of another embodiment.
Embodiment
For the ease of understanding the utility model, below with reference to relevant drawings, the utility model is described more fully.Better embodiment of the present utility model is given in accompanying drawing.But the utility model can realize in many different forms, is not limited to embodiment described herein.On the contrary, provide the object of these embodiments be make to disclosure of the present utility model understand more thorough comprehensively.
It should be noted that, when element is called as " being fixed on " another element, directly can there is element placed in the middle in it on another element or also.When an element is considered to " connection " another element, it can be directly connected to another element or may there is centering elements simultaneously.Term as used herein " vertical ", " level ", "left", "right" and similar statement just for illustrative purposes, do not represent it is unique embodiment.
Unless otherwise defined, all technology used herein and scientific terminology are identical with belonging to the implication that those skilled in the art of the present utility model understand usually.The object of the term used in instructions of the present utility model herein just in order to describe concrete embodiment, is not intended to be restriction the utility model.Term as used herein " and/or " comprise arbitrary and all combinations of one or more relevant Listed Items.
Refer to Fig. 1, the flying probe device (not shown) in an embodiment, comprises test probe 10.Test probe 10 comprises elastic support 100 and probe 200.
Elastic support 100 comprises fixed part 110, first arm of force 120, second arm of force 130 and probe installation portion 140.
First arm of force 120 and second arm of force 130 are strip structure.One end of first arm of force 120 and second arm of force 130 is all arranged on fixed part 110.First arm of force 120 and second arm of force 130 are separately.
Probe installation portion 140 is arranged at first arm of force 120 and second arm of force 130 one end away from fixed part 110.Probe installation portion 140 offers probe mounting groove 142, the bearing of trend of probe mounting groove 142 is vertical with the bearing of trend of first arm of force 120.First arm of force 120, second arm of force 130 all offers groove 152 with the junction 150 of fixed part 110 and installation portion 140 of popping one's head in.
Probe 200 comprises linking arm 210 and is arranged at the contact needle 220 on linking arm 210 one end, and linking arm 210 is arranged in probe mounting groove 142.Concrete linking arm 210 is trapezium structure in the present embodiment, and probe mounting groove 142 is also the trapezium structure corresponding with linking arm 210.Fastened by the linking arm of trapezium structure 210 and trapezium structure mounting groove 142 of popping one's head in, probe 200 is better connected on elastic support 100.
In above-mentioned test probe 10; first arm of force 120, second arm of force 130 all offers groove 152 with the junction 150 of fixed part 110 and installation portion 140 of popping one's head in; these grooves 152 reduce the rigidity of elastic support 100 entirety; utilize the pliability of elastic support 100 self; to avoid in test process test probe 10 and printed circuit board (PCB) hard contact, available protecting printed circuit board (PCB).
The direction extended with first arm of force 120 and second arm of force 130 is for short transverse.The direction extended with mounting groove 142 of popping one's head in is for Width.Be thickness direction with short transverse and all vertical direction of Width.
Concrete in the present embodiment, each junction 150 of first arm of force 120, second arm of force 130 and fixed part 110 and installation portion 140 of popping one's head in all offers two relative grooves 152.Groove 152 is U-lag, is " work " character form structure to make first arm of force 120, second arm of force 130 with each junction 150 of fixed part 110 and installation portion 140 of popping one's head in.
During due to test, test probe 10 movement velocity is very fast, and the vibration that result in test probe 10 is inevitable, and violent vibration can cause test probe 10 unstable with the contact of printed circuit board (PCB).Test probe 10 can not ensure that in stressed fallback procedures it can move in parallel.After being subject to reaction thrust effect, test probe 10 height in retrogressing moving process can decrease, and side-play amount is comparatively large, thus may occur pricking inclined situation in test process, has a strong impact on the measuring accuracy of test probe 10 device.
Each junction 150 all offers two relative grooves 152, to make junction 150 form " work " character form structure, reduce further the rigidity of elastic support 100.First arm of force 120 and second arm of force 130 effectively can distribute the size of the power suffered by elastic support 100.First arm of force 120 and second arm of force 130 are by distributing the size of the power obtained, each junction 150 offering groove 152 is made to produce corresponding distortion, to make up the deficiency of test probe 10 height, ensure that test probe 10 moves in parallel in fallback procedures, excessive angle of inclination can not be produced, and then ensure that retreating testing needle in moving process can keep geo-stationary with surface of contact, can not there is excessive beat in test probe 10, ensure that the precision of test.
In addition, junction 150 is " work " character form structure, relative to traditional form offering separately arc groove, the stress distribution of its groove 152 inside is more even, stress is not concentrated on a certain bar line, but distribution on the whole, advantageously in the raising in the serviceable life of elastic support 100.
First arm of force 120 and second arm of force 130 arrange in the width direction.Relative second arm of force 130 of first arm of force 120 is closer to contact needle 220, and the length of first arm of force 120 is greater than the length of second arm of force 130.Fixed part 110 is in step-like structure.The second step portion 114 that fixed part 110 comprises first step portion 112 and is connected with first step portion 112.The height in second step portion 114 is higher than first step portion 112.First arm of force 120 is connected with first step portion 112, and second arm of force 130 is connected with second step portion 114.
The length of first arm of force 120 and second arm of force 130 is all drawn by FEM (finite element) calculation.Elastic support 100 adopts the length of first arm of force 120 to be longer than the form of second arm of force 130, both can ensure that the junction 150 offering groove 152 easily produced distortion, to ensure that contact force between test probe 10 and printed circuit board (PCB) is suitable and operate steadily, can ensure that again elastic support 100 effectively can resist the vibration of Width.
First arm of force 120 and second arm of force 130 are rectangular cylindrical structures.First arm of force 120 comprises first body of rod 122 that is connected and second body of rod 124, first body of rod 122 is connected with fixed part 110, and second body of rod 124 is connected with probe installation portion 140, and the thickness of first body of rod 122 is greater than the thickness of second body of rod 124.
Second arm of force 130 comprises the 3rd body of rod 132 that is connected and the 4th body of rod the 134, three body of rod 132 is connected with fixed part 110, and the 4th body of rod 134 is connected with probe installation portion 140, and the thickness of the 3rd body of rod 132 is greater than the thickness of the 4th body of rod 134.
The form that first arm of force 120 and second arm of force 130 all adopt side thicker than opposite side, effectively can alleviate the quality of elastic support 100 head, and the vibration advantageously in the vibration resistance of test probe 10, particularly Width.
Be appreciated that first arm of force 120 and second arm of force 130 are not limited to rectangular cylindrical structures, also can be the structures such as cylindric.
Specifically in the present embodiment, contact needle 220 is blade-shaped structure.The contact needle 220 of blade-shaped structure, the size of its needle point 222 is about more than 60 microns, and manufacturing cost is lower, is generally used for common printed circuit board (PCB).
The needle point 222 of contact needle 220 is positioned at elastic support 100 on the center line of thickness direction, can avoid the generation of moment in test process, improves the vibration resistance of test probe 10 further.
Be appreciated that in other embodiments, such as, shown in accompanying drawing 2, contact needle 220 also can be needle-like structures.The contact needle 220 of needle-like structures, the size of its needle point 222 is about 20 microns, and manufacturing cost is higher, is applicable to high-density printed circuit board.
Above-mentioned flying probe device and test probe 10 thereof; groove 152 is all offered with the junction 150 of fixed part 110 and installation portion 140 of popping one's head at first arm of force 120, second arm of force 130; thus reduce the rigidity of elastic support 100 entirety; utilize the pliability of elastic support 100 self; to avoid in test process test probe 10 and printed circuit board (PCB) hard contact, available protecting printed circuit board (PCB).
The above embodiment only have expressed several embodiment of the present utility model, and it describes comparatively concrete and detailed, but therefore can not be interpreted as the restriction to the utility model the scope of the claims.It should be pointed out that for the person of ordinary skill of the art, without departing from the concept of the premise utility, can also make some distortion and improvement, these all belong to protection domain of the present utility model.Therefore, the protection domain of the utility model patent should be as the criterion with claims.
Claims (10)
1. a test probe, is characterized in that, comprises elastic support and is arranged on the probe on elastic support, wherein:
Described elastic support comprises:
Fixed part;
First arm of force, one end is arranged on described fixed part;
Second arm of force, one end is arranged on described fixed part, and with described first arm of force separately; And
Probe installation portion, be arranged at described first arm of force and described second arm of force away from one end of described fixed part, described probe installation portion offers probe mounting groove, and the bearing of trend of described probe mounting groove is vertical with the bearing of trend of described first arm of force; The junction of described first arm of force, described second arm of force and described fixed part and described probe installation portion all offers the groove that can reduce described elastic support rigidity;
Described probe comprises linking arm and is arranged at the contact needle on described linking arm one end, and described linking arm is arranged in described probe mounting groove.
2. test probe according to claim 1, it is characterized in that, the each described junction of described first arm of force, described second arm of force and described fixed part and described probe installation portion all offers two relative grooves, described groove is U-lag, and to make described first arm of force, each described junction of described second arm of force and described fixed part and described probe installation portion is " work " character form structure.
3. test probe according to claim 1, is characterized in that, relatively described second arm of force of described first arm of force is closer to described contact needle, and the length of described first arm of force is greater than the length of described second arm of force.
4. test probe according to claim 3, it is characterized in that, described fixed part is step-like structure, the second step portion comprising first step portion and be connected with described first step portion, described first arm of force is connected with described first step portion, and described second arm of force is connected with described second step portion.
5. test probe according to claim 1, it is characterized in that, the direction extended with described first arm of force and described second arm of force is for short transverse, and the direction extended with described probe mounting groove, for Width, is thickness direction with described short transverse and all vertical direction of described Width;
Described first arm of force comprises first body of rod and second body of rod that are connected, and described first body of rod is connected with described fixed part, and described second body of rod is connected with described probe installation portion, and the thickness of described first body of rod is greater than the thickness of described second body of rod.
6. test probe according to claim 5, it is characterized in that, described second arm of force comprises the 3rd body of rod and the 4th body of rod that are connected, described 3rd body of rod is connected with described fixed part, described 4th body of rod is connected with described probe installation portion, and the thickness of described 3rd body of rod is greater than the thickness of described 4th body of rod.
7. test probe according to claim 5, is characterized in that, the needle point of described contact needle is positioned at described elastic support on the center line of thickness direction.
8. test probe according to claim 1, is characterized in that, described contact needle is blade-shaped structure or needle-like structures.
9. test probe according to claim 1, is characterized in that, described first arm of force and described second arm of force are rectangular cylindrical structures.
10. a flying probe device, is characterized in that, comprises the test probe as described in claim 1 to claim 9 any one.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420535273.1U CN204116399U (en) | 2014-09-17 | 2014-09-17 | Flying probe device and test probe thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420535273.1U CN204116399U (en) | 2014-09-17 | 2014-09-17 | Flying probe device and test probe thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204116399U true CN204116399U (en) | 2015-01-21 |
Family
ID=52333696
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420535273.1U Active CN204116399U (en) | 2014-09-17 | 2014-09-17 | Flying probe device and test probe thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204116399U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106033109A (en) * | 2015-03-11 | 2016-10-19 | 深南电路股份有限公司 | Testing method of stepped circuit board |
| CN110836985A (en) * | 2018-08-15 | 2020-02-25 | 万润科技股份有限公司 | Probe, probe module, probe device, and method and apparatus for inspecting electronic component using the probe device |
| CN115856370A (en) * | 2023-02-01 | 2023-03-28 | 苏州中熙精密电机有限公司 | Flying probe module and flying probe tester |
-
2014
- 2014-09-17 CN CN201420535273.1U patent/CN204116399U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106033109A (en) * | 2015-03-11 | 2016-10-19 | 深南电路股份有限公司 | Testing method of stepped circuit board |
| CN106033109B (en) * | 2015-03-11 | 2018-10-23 | 深南电路股份有限公司 | A kind of test method of step circuit boards |
| CN110836985A (en) * | 2018-08-15 | 2020-02-25 | 万润科技股份有限公司 | Probe, probe module, probe device, and method and apparatus for inspecting electronic component using the probe device |
| TWI690709B (en) * | 2018-08-15 | 2020-04-11 | 萬潤科技股份有限公司 | Probe module, probe device, and electronic component detection method and equipment using the probe device |
| CN115856370A (en) * | 2023-02-01 | 2023-03-28 | 苏州中熙精密电机有限公司 | Flying probe module and flying probe tester |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN204116399U (en) | Flying probe device and test probe thereof | |
| SG168518A1 (en) | Probe card assembly | |
| US20060250149A1 (en) | Complex printed circuit board testing tool | |
| WO2009013809A1 (en) | Contactor, probe card and method of mounting contactor | |
| TW201606322A (en) | Socket for testing semiconductor device | |
| CN103399176B (en) | Test system for acceleration sensor | |
| CN104007380A (en) | PCB test fixture | |
| JP5947139B2 (en) | Probe and electrical connection device | |
| CN104251923B (en) | Measure with two cable probe unit and its application process | |
| WO2010087668A3 (en) | Probe structure and a probe card having the same | |
| CN204389642U (en) | A kind of pcb board testing electrical property tool | |
| CN103412173A (en) | Mobile phone PCB voltage testing jig | |
| CN102680752A (en) | Electric testing jig for flexible circuit board | |
| CN101424702B (en) | Probe, test socket and tester thereof | |
| CN202649248U (en) | Flexible circuit board electrical measurement fixture | |
| KR200457028Y1 (en) | Probe apparatus | |
| CN204882620U (en) | A PCB board protection device for flying needle online test appearance | |
| CN108896791A (en) | A kind of flying needle mould group for high speed flying probe tester | |
| CN203672924U (en) | Short-circuit-preventing signal test probe | |
| CN202693624U (en) | Measuring head bracket of flying probe tester | |
| CN206146968U (en) | Test fixture and single tail returns shape probe thereof | |
| ATE519123T1 (en) | CONTACT PIN FOR A TEST HEAD WITH VERTICAL TEST NEEDLES WITH IMPROVED SCRUBBING MOTION | |
| CN213423233U (en) | Long arm type swinging seat and flying probe testing mechanism | |
| CN104237579A (en) | Four-line test probe device and application method thereof | |
| JP2008045969A (en) | Probe for four-terminal measurement |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20200624 Address after: 518101 workshop 5 / F, 1 / 2 / F, 14 / F, 17 / F, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. Address before: 518055, the Han Dynasty laser building, No. 9 West West Road, Nanshan District hi tech park, Guangdong, Shenzhen Co-patentee before: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. Patentee before: HAN'S LASER TECHNOLOGY INDUSTRY GROUP Co.,Ltd. |
|
| CP01 | Change in the name or title of a patent holder | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 518101 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Han's CNC Technology Co.,Ltd. Address before: 518101 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. |