CN201170789Y - Probe device - Google Patents

Probe device Download PDF

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Publication number
CN201170789Y
CN201170789Y CNU2008200058727U CN200820005872U CN201170789Y CN 201170789 Y CN201170789 Y CN 201170789Y CN U2008200058727 U CNU2008200058727 U CN U2008200058727U CN 200820005872 U CN200820005872 U CN 200820005872U CN 201170789 Y CN201170789 Y CN 201170789Y
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CN
China
Prior art keywords
probe
base
unit
pedestal
slot
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNU2008200058727U
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Chinese (zh)
Inventor
邱增喜
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to CNU2008200058727U priority Critical patent/CN201170789Y/en
Application granted granted Critical
Publication of CN201170789Y publication Critical patent/CN201170789Y/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model provides a probe device. A plurality of probes are fixed in the probe slots of a probe holder arranged in a pedestal one by one so that the probes are arranged in parallel at a fixed tiny distance. In this way, the probe device fixes each probe, and keeps the probes at the predetermined positions during test, which prevents the probes from deflecting, moving back, moving or eliminates the unevenness of probe pressure and so on.

Description

Probe unit
Technical field
The utility model is relevant with the detecting instrument of display, more detailed it, the probe unit that whether damages about detecting LCD (hereinafter to be referred as LCD) panel pixel unit.
Background technology
Whether damage about detecting LCD panel pixel unit in the known techniques, be haply with detector probe, flexible circuit board (FLEXIBLE PCB, FPCB), computer and microscope form a cover computer vision automatic detection system and reach.This detector probe, as Fig. 1, probe 11 by predetermined number is fixed in a pedestal 12 with predetermined little spacing arrangement, and the link 111 of each probe 11 needs to insert the connector 14 of above-mentioned flexible circuit board 13, and 112 glass plates with LCD measured panel 19 of end of probe contact detects each pixel according to this.The design of the number of probe 11 and spacing and flexible circuit board, the LCD panel of the indivedual corresponding different sizes of need.
Probe 11 is arranged side by side with little spacing, and it is fixing with pedestal 12, but, between probe 11 and the probe 11 and non-structure fix its little spacing, detect in the operation, when the operation strength that probe contacts with measured panel was excessive, probe just occurred deflection easily, shrinks back or pin is pressed unequal problem, will have a strong impact on and detect operation and testing result.
Summary of the invention
Fundamental purpose of the present utility model is, a kind of probe unit is provided, and it is fixing that this probe unit obtains each probe, remains on both allocations when detecting, and avoids deflection, shrinks back, moves or pin is pressed unequal problem.
Another purpose of the present utility model is, proposes a kind of probe unit, and this probe unit has the structure of easy assembling probe, so that the correct assembling probe of operator.
A purpose more of the present utility model is, proposes a kind of probe unit, and it can change the probe of damage individually.
The technological means that the utility model is reached above-mentioned purpose is, a kind of probe unit in the number probes probe slot that is fixed on the probe base under the base interior one by one, makes several probes be arranged in parallel with little spacing that can not change.
Wherein, several probe slots of this probe base predetermined little spacing of being separated by parallel to each other, each probe slot connects the front end and the rear end of this probe base; The end of probe of number probe is extended the front end of this probe base, and its link extends the rear end of this probe base.
Wherein, this probe base is established a clamping slot that traverses portion about it, and each probe has a fastening part and is embedded in this clamping slot.
Wherein, the clamping slot of this probe base is arranged on the position near this probe base front end.
Wherein, comprise that more one combines and locate the location lid of described probe in described probe slot with this probe base.
Wherein, each side space of portion about this probe base is in order to receive the joint portion that this location lid left and right sides protrudes downwards.
Wherein, the bottom land of the assembling grove that is locked to this pedestal was respectively worn by portion about this location was covered by a vertical retaining element.
Wherein, this probe base is fixed in this assembling grove, and the end of probe of this probe is extended the front end of this pedestal; This pedestal is established a circuit board, has several contacts on it, is connected with the link of this probe.
Wherein, this location lid is made for insulation materials such as plastic cement or potteries.
The utility model beneficial effect: it is fixing that the utility model probe unit obtains each probe, remains on both allocations when detecting, and avoids deflection, shrinks back, moves or pin is pressed unequal problem.Moreover also have the structure of easy assembling probe, can change the probe of damage individually.
For ease of explanation the utility model represented central idea in above-mentioned novel content one hurdle, express with specific embodiment now.Various different objects and deflection thereof or displacement system but not is drawn in the ratio of actual components in the ratio that is suitable for exemplifying explanation among the embodiment, close chat earlier bright.
Description of drawings
Fig. 1 is the outside drawing of known probe unit.
Fig. 2 is the outside drawing of facing of the utility model probe unit.
Fig. 3 looks outside drawing for the end of the utility model probe unit.
Fig. 4 looks three-dimensional exploded view for the end of the utility model probe unit.
Fig. 5 is the probe slot of the utility model probe unit and the three-dimensional exploded view of probe.
Fig. 6 is the cut-open view in 6-6 cross section among Fig. 2.
Fig. 7 is the cut-open view in 7-7 cross section among Fig. 2.
Embodiment
As Fig. 2, the utility model probe unit is mainly counted probe 31 in a pedestal 20 inside with little spacing arrangement.Protruding out this pedestal 20 front end persons is the end of probe 311 of this probe 31, in order to contact a measured panel.
As Fig. 3, Fig. 4, Fig. 5, show the structure of this this probe 31 of pedestal 20 internal fixation with three-dimensional exploded view.Comprise a probe base 40, number probe 31, and a location covers 60.
This probe base 40 is established several probe slots 41, the number probe slot 41 predetermined little spacings of being separated by parallel to each other, and each probe slot 41 connects the front end 42 and the rear end 43 of this probe base 40.This pedestal 20 is horizontally set with a clamping slot 44 near the position of its front end 42.Each probe 31 has a link 312 and an end of probe 311, and its probe bodies near this end of probe 311 is established a fastening part 313.Each probe 31 is embedded in this probe slot 41, and its end of probe 311 is extended the front end 42 of this probe base 40, and its link 312 extends the rear end 43 of this probe base 40, and the fastening part 313 of this probe 31 is embedded in this clamping slot 44.This location lid 60 combine with this probe base 40 and described probe 31 compactings is not had the anxiety of disengaging, and the joint portion 61 of the downward protrusion of 60 left and right sides is covered in order to receive this location in each side space 45 of about this probe base 40.This location lid 60 is made for insulation materials such as plastic cement or potteries.
As Fig. 3, Fig. 6, above-mentioned probe base 40 is located in the default assembling grove 21 of this pedestal 20, and the location cover about 60 one and respectively worn the bottom land that is locked to this assembling grove 21 by a vertical retaining element 62, and then this probe base 40 is fixed in this assembling grove 21.
As Fig. 3, Fig. 7, this probe 31 is embedded at this probe slot 41, and its end of probe 311 is extended the front end of this probe base 40, and its link 312 extends the rear end of this probe base 40.This pedestal 20 is provided with a circuit board 22, and this circuit board 22 is provided with several contacts 221 and is connected with the link 312 of this probe 31.
Above-mentioned each probe 31 gets by this probe slot 41 and permanently is arranged in parallel with changeless little spacing, each probe 31 is embedded in the clamping slot 44 of this probe base 40 with its fastening part 313 again, and each probe 31 is moved before and after not understanding, cooperate this location to cover 60 and each probe 31 can not moved up and down.Therefore, each probe 31 obtains omnibearing fixing, remains on both allocations when detecting, and can avoid deflection, shrink back, moves or the uneven problem of pin pressure.Moreover, these probe slot 41 convenient assembling and position probe 31 one by one, whether contact 221 convenient affirmation probe 31 assemblings on this circuit board 22 are correct, that is, when probe 31 embeds the clamping slot 44 of this probe base 40 with fastening part 313, the link 312 of this probe 31 promptly should with the 221 relative contacts of a contact, if when the not corresponding situation of probe 31 and contact 221 takes place, it is incorrect promptly to represent probe 31 to assemble.The utility model said structure also helps changing any impaired probe.
Though the utility model is to do explanation with a most preferred embodiment, is skillful in this skill person and can makes various multi-form changes not breaking away under the utility model spirit and the category.Above illustrated embodiment is only in order to explanation the utility model, and is non-in order to limit scope of the present utility model.Such as do not disobey various modifications or the variation that the utility model spirit is engaged in, all belong to the utility model claim.

Claims (9)

1. a probe unit is characterized in that, comprising:
Number probe (31) is made several probes (31) be arranged in parallel with little spacing that can not change by in the probe slot (41) that is fixed on the inner probe base (40) of a pedestal (20) one by one.
2. probe unit as claimed in claim 1 is characterized in that, several probe slots (41) of this probe base (40) predetermined little spacing of being separated by parallel to each other, and each probe slot (41) connects front end (42) and rear end (43) of this probe base (40); The end of probe (311) of number probe (31) is extended the front end (42) of this probe base (40), and its link (312) extends the rear end (43) of this probe base (40).
3. probe unit as claimed in claim 2 is characterized in that, this probe base (40) is established a clamping slot (44) that traverses portion about it, and each probe (40) has a fastening part (313) and is embedded in this clamping slot (44).
4. probe unit as claimed in claim 3 is characterized in that, the clamping slot (44) of this probe base (40) is arranged on the position near this probe base (40) front end (42).
5. probe unit as claimed in claim 1 is characterized in that, comprises that more one combines and locate the location lid (60) of described probe (31) in described probe slot (41) with this probe base (40).
6. probe unit as claimed in claim 5 is characterized in that, each side space (45) of portion about this probe base (40) is in order to receive the joint portion (61) that this location lid (60) left and right sides protrudes downwards.
7. probe unit as claimed in claim 6 is characterized in that, the bottom land of the assembling grove (21) that is locked to this pedestal (20) is respectively worn by portion about this location lid (60) by a vertical retaining element (62).
8. probe unit as claimed in claim 7 is characterized in that, this probe base (40) is fixed in this assembling grove (21), and the end of probe (311) of this probe (31) is extended the front end of this pedestal (20); This pedestal (20) is established a circuit board (22), has several contacts (221) on it, is connected with the link (312) of this probe (31).
9. probe unit as claimed in claim 5 is characterized in that, this location lid (60) is made for insulation materials such as plastic cement or potteries.
CNU2008200058727U 2008-02-28 2008-02-28 Probe device Expired - Fee Related CN201170789Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNU2008200058727U CN201170789Y (en) 2008-02-28 2008-02-28 Probe device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNU2008200058727U CN201170789Y (en) 2008-02-28 2008-02-28 Probe device

Publications (1)

Publication Number Publication Date
CN201170789Y true CN201170789Y (en) 2008-12-24

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ID=40209842

Family Applications (1)

Application Number Title Priority Date Filing Date
CNU2008200058727U Expired - Fee Related CN201170789Y (en) 2008-02-28 2008-02-28 Probe device

Country Status (1)

Country Link
CN (1) CN201170789Y (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102735884A (en) * 2012-06-21 2012-10-17 深圳市大族激光科技股份有限公司 Bracket for measuring head of flying-probe tester and design method of bracket
CN113552393A (en) * 2020-04-23 2021-10-26 跃澐科技股份有限公司 Test probe seat structure

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102735884A (en) * 2012-06-21 2012-10-17 深圳市大族激光科技股份有限公司 Bracket for measuring head of flying-probe tester and design method of bracket
CN102735884B (en) * 2012-06-21 2014-09-10 深圳市大族激光科技股份有限公司 Bracket for measuring head of flying-probe tester and design method of bracket
CN113552393A (en) * 2020-04-23 2021-10-26 跃澐科技股份有限公司 Test probe seat structure

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Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20081224

Termination date: 20110228