CN104251923B - Measure with two cable probe unit and its application process - Google Patents
Measure with two cable probe unit and its application process Download PDFInfo
- Publication number
- CN104251923B CN104251923B CN201410476692.7A CN201410476692A CN104251923B CN 104251923 B CN104251923 B CN 104251923B CN 201410476692 A CN201410476692 A CN 201410476692A CN 104251923 B CN104251923 B CN 104251923B
- Authority
- CN
- China
- Prior art keywords
- measure
- probe unit
- main body
- elastic support
- cable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000000523 sample Substances 0.000 title claims abstract description 143
- 238000000034 method Methods 0.000 title claims abstract description 23
- 238000012360 testing method Methods 0.000 claims abstract description 89
- 230000000149 penetrating effect Effects 0.000 claims abstract description 19
- 230000033001 locomotion Effects 0.000 claims description 9
- 238000006073 displacement reaction Methods 0.000 claims description 8
- 229920003023 plastic Polymers 0.000 claims description 3
- 239000004033 plastic Substances 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims description 2
- 238000009434 installation Methods 0.000 description 8
- 241000826860 Trapezium Species 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000005611 electricity Effects 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000005622 photoelectricity Effects 0.000 description 2
- 230000001154 acute effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001141 propulsive effect Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
Include haulage gear, main body fixed seat, test probe, photoelectric sensor the present invention relates to a kind of measure with two cable probe unit；Main body fixed seat can be moved under the drive of haulage gear；Test probe includes elastic support and the probe being arranged on elastic support, and elastic support is provided with the light shielding block of protrusion；Photoelectric sensor offers recess near the side of test probe, and photoelectric sensor is with the opposite side launched from the side of recess to recess to penetrating light；Wherein, light shielding block can extend into recess and block to penetrating light, elastic support is deformed in test, so that the generation change of the light quantity to penetrating light that light shielding block is blocked, and produce the output voltage for changing, haulage gear to apply pressure on a printed circuit according to the value of output voltage control test probe by photoelectric sensor.Above-mentioned measure with two cable probe unit has the advantages that the contact forces that can effectively control to test probe and printed circuit board (PCB).Additionally provide measure with two cable probe unit application process simultaneously.
Description
Technical field
The present invention relates to printed circuit board (PCB) test device, more particularly to a kind of measure with two cable probe unit and its
Application process.
Background technology
Probe tester is generally used for detecting printed circuit board (PCB) (PCB), during detection, it is necessary to test probe with
Circuit board contacts.Difference according to method of testing has the two kinds of test probe apparatus in two wires and four lines.Measure with two cable probe unit is used
In the test less demanding occasion of resistance accuracy, and four line test probe apparatus are then used to test resistance requirement low-resistance test high
Occasion.
, in test, probe is generally with pin under the speed of 10~50 times per second and lift pin for traditional measure with two cable probe unit
To contact different test points.To reach the requirement of reliable test, probe need to be pricked firmly on test board.Also to ensure to visit simultaneously
Pin is suitable with the contact force of test print circuit board, it is to avoid printed circuit board surface is embroidered, and this requires that its spring support is needed
Have in suitable rigidity and test process vibrate it is small.But, because movement velocity is fast, test probe apparatus are applied to printing electricity
Pressure on the plate of road is difficult control, and contact force is excessive after test probe is contacted with printed circuit board (PCB), causes printed circuit board (PCB) to be scraped
Trace or indenture, cause printed circuit board (PCB) to be scrapped.
The content of the invention
Based on this, it is necessary to provide a kind of two wires that can effectively control to test probe and the contact forces of printed circuit board (PCB)
Test probe apparatus and its application process.
A kind of measure with two cable probe unit, for testing printed circuit board (PCB), including：
Haulage gear；
Main body fixed seat, is fixed on the haulage gear, and the main body fixed seat can be under the drive of haulage gear
Motion；
Test probe, including the elastic support being fixed in the main body fixed seat and the spy being arranged on elastic support
Head, the elastic support is provided with the light shielding block of protrusion；
Photoelectric sensor, is arranged in the main body fixed seat, and is communicated to connect with the haulage gear, the photoelectric transfer
Sensor offers recess near the side of the test probe, the photoelectric sensor have from the side of the recess launch to
The opposite side of the recess to penetrating light, the photoelectric sensor is used for the described pair of received light for penetrating light of measurement in real time
Amount, and produce the output voltage changed with the described pair of light quantity for penetrating light；
Wherein, the light shielding block can extend into the recess and block described pair and penetrates light, and the elastic support is in test
It is deformed, so that the generation change of the described pair of light quantity for penetrating light that the light shielding block is blocked, and produced by photoelectric sensor
The output voltage of changing, the haulage gear is applied to the print according to the value of the output voltage control test probe
Pressure on printed circuit board.
Wherein in one embodiment, also including rack fixing seat, the rack fixing seat is located at the main body fixed seat
One end, the elastic support is fixed on the rack fixing seat.
Wherein in one embodiment, the rack fixing seat also includes limited block, the limited block and the elasticity branch
Frame is in contact away from the end of the main body fixed seat.
Wherein in one embodiment, seat also is adjusted including sensor, the sensor adjustment seat is slidably disposed in
In the main body fixed seat, the photoelectric sensor is fixed on the sensor adjustment seat.
Wherein in one embodiment, draw-in groove is offered in the main body fixed seat；Opened up on the sensor adjustment seat
There is the first screw；The measure with two cable probe unit also includes adjusting screw, and the nut of the adjusting screw is fastened in the card
In groove, and the adjusting screw is screwed with first screw, so that the adjusting screw is total to sensor adjustment seat
With screw thread pair structure is formed, the adjusting screw is rotated, can adjust the sensor adjustment relatively described main body fixed seat of seat
Position.
Wherein in one embodiment, bar hole is offered on the sensor adjustment seat, opened in the main body fixed seat
The second screw is provided with, the measure with two cable probe unit also includes fixing screws, and the fixing screws are arranged in the bar hole
It is interior, and coordinate with second screw, and the fixing screws can be moved in the bar hole, so that sensor adjustment seat
It is slidably disposed in the main body fixed seat.
Wherein in one embodiment, the elastic support is made of plastics.
Wherein in one embodiment, the contact pin for including linking arm and being arranged on described linking arm one end of popping one's head in
Head, the linking arm is on the elastic support.
Wherein in one embodiment, the contact syringe needle is blade-shaped structure or needle-like structures.
A kind of application process of measure with two cable probe unit, comprises the following steps：
Two above-mentioned measure with two cable probe units are provided；
The test probe of two measure with two cable probe units is pricked the two of any one UNICOM's circuit of correcting plate respectively
On the pad at end；
One of them described measure with two cable probe unit is remained stationary as, another measure with two cable probe unit movement with
Adjust the contact force that its test probe is put on correcting plate；
The displacement of the measure with two cable probe unit and the output voltage of the photoelectric sensor are obtained in real time, by institute
Contact force is stated to be associated with the output voltage；
Measure with two cable probe unit is adjusted according to the relation pair between the contact force and the output voltage.
In test, test probe brings pressure to bear on printed circuit board (PCB) above-mentioned measure with two cable probe unit, elastic support
Can be deformed, so that the generation change of the light quantity to penetrating light that light shielding block is blocked, and change is produced by photoelectric sensor
Output voltage, haulage gear applies pressure on a printed circuit, realizes according to the value of output voltage control test probe
Control to test probe and the contact forces of printed circuit board (PCB), it is to avoid printed circuit board surface is embroidered, effectively protect
Printed circuit board (PCB).Also, this control process realizes Automated condtrol, saves manpower.
Brief description of the drawings
Fig. 1 is the structural representation of measure with two cable probe unit in an embodiment；
Fig. 2 is the three-dimensional exploded view of measure with two cable probe unit shown in Fig. 1；
Fig. 3 is the concrete structure diagram of test probe in measure with two cable probe unit shown in Fig. 1；
Fig. 4 is the concrete structure diagram of the test probe of another embodiment；
Fig. 5 is the flow chart of the application process of measure with two cable probe unit in an embodiment；
Fig. 6 is the schematic diagram of the application process of measure with two cable probe unit shown in Fig. 5.
Specific embodiment
For the ease of understanding the present invention, the present invention is described more fully below with reference to relevant drawings.In accompanying drawing
Give better embodiment of the invention.But, the present invention can be realized in many different forms, however it is not limited to herein
Described implementation method.On the contrary, the purpose for providing these implementation methods is to make to understand more the disclosure
Plus it is thorough comprehensive.
It should be noted that when element is referred to as " being fixed on " another element, it can directly on another element
Or can also there is element placed in the middle.When an element is considered as " connection " another element, it can be directly connected to
To another element or may be simultaneously present centering elements.Term as used herein " vertical ", " level ", " left side ",
For illustrative purposes only, it is unique implementation method to be not offered as " right side " and similar statement.
Unless otherwise defined, all of technologies and scientific terms used here by the article with belong to technical field of the invention
The implication that technical staff is generally understood that is identical.The term for being used in the description of the invention herein is intended merely to description tool
The purpose of the implementation method of body, it is not intended that in the limitation present invention.Term as used herein " and/or " include one or more
The arbitrary and all of combination of related Listed Items.
Fig. 1 is referred to, the measure with two cable probe unit 10 in an embodiment, for being carried out to printed circuit board (PCB) (not shown)
Test.Measure with two cable probe unit 10 includes haulage gear (not shown), main body fixed seat 100, test probe 200 and photoelectric transfer
Sensor 300.
Main body fixed seat 100 is fixed on haulage gear, and main body fixed seat 100 can be transported under the drive of haulage gear
It is dynamic.
Also referring to Fig. 2, test probe 200 includes the elastic support 210 being fixed in main body fixed seat 100 and sets
Probe 230 on elastic support 210.Elastic support 210 is made of plastics, and possesses certain elasticity.On elastic support 210
It is provided with the light shielding block 211 of protrusion.
Photoelectric sensor 300 is arranged in main body fixed seat 100, and is communicated to connect with haulage gear.Photoelectric sensor 300
Recess 310 is offered near the side of test probe 200, photoelectric sensor 300 has to be launched to recess from the side of recess 310
310 opposite side to penetrating light.The real-time reception of photoelectric sensor 300 to penetrating the light quantity of light, when received by photoelectric sensor 300
Light quantity produce change when, the output voltage of photoelectric sensor 300 can also produce change accordingly.Specifically, photoelectric sensor
300 output signal is analog voltage signal, and it is with received to penetrating the linear variation relation of the light quantity of light.
Light shielding block 211 can extend into recess 310 and block to penetrating light.When testing printed circuit board (PCB), test is visited
Pin 200 is brought pressure to bear on printed circuit board (PCB), and elastic support 210 can be deformed so that light shielding block 211 blocked to penetrating light
Light quantity generation change, and by photoelectric sensor 300 produce change output voltage.Haulage gear is according to output voltage
Value control test probe 200 applies pressure on a printed circuit.
Specifically, because test probe 200 applies pressure to printed circuit board (PCB), the deformation of elastic support 210 can be brought, and
The deformation of elastic support 210 can bring displacement of the light shielding block 211 in recess 310, then to test probe 200 and printed circuit board (PCB)
The control of contact forces be convertible into control to the displacement of light shielding block 211.Also, because the displacement of light shielding block 211 can band
Carry out the change of the light quantity that photoelectric sensor 300 is received, and then change the output voltage of photoelectric sensor 300.External software pair
The output voltage of photoelectric sensor 300 is analyzed, and when the change of output voltage exceedes threshold value, i.e. probe 200 is tested in explanation
The pressure put on printed circuit board (PCB) is sufficiently large, haulage gear stop motion at once, to control test probe 200 with printing electricity
The contact forces of road plate.Because photoelectric sensor 300 to the light quantity for penetrating light in real time to being monitored, and then can be to test probe
200 carry out real-time control with the contact forces of printed circuit board (PCB), it is ensured that the accuracy of contact force size.
Measure with two cable probe unit 10 may also include rack fixing seat 400.Rack fixing seat 400 is located at main body fixed seat
100 one end, elastic support 210 is fixed on rack fixing seat 400.
Rack fixing seat 400 also includes limited block 410, and limited block 410 is with elastic support 210 away from main body fixed seat 100
End be in contact.Limited block 410 is in contact with the end of elastic support 210, elastic support 210 is generated certain pre- change
Shape, when elastic support 210 is vibrated due to high-speed motion, due to the presence of limited block 410, elastic support 210 is produced
Vibration will soon be suppressed, the vibration that occurs of probe 200 is tested during test to reduce, improve the accuracy of test.
It is appreciated that in other embodiments, elastic support 210 is directly fixed in main body fixed seat 100, and now, branch
Frame fixed seat 400 can be omitted.
Due to being possible to error occur during assembling or use in measure with two cable probe unit 10, so that photoelectric transfer
Sensor 300 may deviate from voltage origin.In order to reduce error, make test more accurate, measure with two cable probe unit 10 may be used also
Seat 500 is adjusted including sensor.Sensor adjustment seat 500 is slidably disposed in main body fixed seat 100.Photoelectric sensor
300 are fixed on sensor adjustment seat 500.Position of the seat 500 in main body fixed seat 100 is adjusted by adjusting sensor, can
The distance between regulation photoelectric sensor 300 and elastic support 210, and then can be to the voltage origin of photoelectric sensor 300
Regulation.
Draw-in groove 120 is offered in main body fixed seat 100.The first screw (not shown) is offered on sensor adjustment seat 500.
Measure with two cable probe unit 10 also includes adjusting screw 600, and the nut of adjusting screw 600 is fastened in draw-in groove 120, and regulation spiral shell
Nail 600 is screwed with the first screw, so that adjusting screw 600 is collectively forming screw thread auxiliary structure with sensor adjustment seat 500.Rotate
Adjusting screw 600, position of the adjustable sensor adjustment seat 500 with respect to main body fixed seat 100.
Bar hole 510 is offered on sensor adjustment seat 500, the second screw 140, two are offered in main body fixed seat 100
Line test probe apparatus 10 also include fixing screws 700, and fixing screws 700 are arranged in bar hole 510, and with the second screw
140 coordinate, and fixing screws 700 can be moved in bar hole 510, so that sensor adjustment seat 500 is slidably disposed in
In main body fixed seat 100.
Also referring to Fig. 3, elastic support 210 specifically include fixed part 212, first arm of force 214, second arm of force 216 and
Probe installation portion 218.
First arm of force 214 and second arm of force 216 are strip structure.One end of first arm of force 214 and second arm of force 216
May be contained within fixed part 212.First arm of force 214 and second arm of force 216 are separately.
Probe installation portion 218 is arranged at the one end of first arm of force 214 and second arm of force 216 away from fixed part 212.Probe peace
Probe mounting groove 218a, the bearing of trend of probe mounting groove 218a and the bearing of trend of first arm of force 214 are offered in dress portion 218
Vertically.First arm of force 214, second arm of force 216 open up fluted with the junction 213 of fixed part 212 and probe installation portion 218
213a。
Probe 230 includes linking arm 232 and the contact syringe needle 234 being arranged on the one end of linking arm 232, and linking arm 232 blocks
In probe mounting groove 218a.Specific linking arm 232 is trapezium structure in the present embodiment, and probe mounting groove 218a is also
The trapezium structure corresponding with linking arm 232.By the linking arm 232 and trapezium structure probe mounting groove 218a phases of trapezium structure
Engaging so that probe 230 is preferably connected on elastic support 210.
In above-mentioned test probe 200, first arm of force 214, second arm of force 216 and fixed part 212 and probe installation portion 218
Junction 213 opens up fluted 213a, and these grooves 213a reduces the rigidity of the entirety of elastic support 210, is propped up using elasticity
Frame 210 pliability of itself, it is to avoid test probe 200 and printed circuit board (PCB) hard contact, effectively protection in test process
Printed circuit board (PCB).
It is short transverse with the direction that first arm of force 214 and second arm of force 216 extend.With mounting groove 218a extensions of popping one's head in
Direction is width.The direction vertical with short transverse and width is thickness direction.
Specifically in the present embodiment, first arm of force 214, second arm of force 216 and fixed part 212 and installation portion 218 of popping one's head in
Two relative groove 213a are offered on each junction 213.Groove 213a is U-lag, so that first arm of force 214, the
Two arm of forces 216 are I-shaped structure with each junction 213 of fixed part 212 and probe installation portion 218.
During due to test, test probe 200 movement velocity is very fast, and the vibration that result in test probe 200 is inevitable, acute
Strong vibration can cause test contact of the probe 200 with printed circuit board (PCB) unstable.Test probe 200 is in stress fallback procedures
It cannot be guaranteed that it can be moved in parallel.After being acted on by propulsive thrust, test probe 200 highly has in moving process is retreated
Reduced, side-play amount is larger, so that it is possible that the inclined situation of bundle, has a strong impact on test probe 200 and fill in test process
The measuring accuracy put.
Two relative groove 213a are offered on each junction 213, so that junction 213 forms I-shaped knot
Structure, reduce further the rigidity of elastic support 210.First arm of force 214 and second arm of force 216 can effectively distribute elastic support
The size of the power suffered by 210.The size of the power that first arm of force 214 and second arm of force 216 are obtained by distribution, offers each
The junction 213 of groove 213a produces corresponding deformation, to make up the deficiency of the test height of probe 200, it is ensured that test probe 200
Moved in parallel in fallback procedures, excessive angle of inclination will not be produced, and then ensure that testing needle energy in retrogressing moving process
Enough and contact surface keeps geo-stationary, and testing probe 200 will not occur excessive beat, it is ensured that the precision of test.
Additionally, junction 213 is I-shaped structure, relative to traditional form for individually opening up arc groove, its is recessed
Stress distribution inside groove 213a is more uniform, and stress is not concentrated on a certain bar line, and is distributed across on face, advantageously
In the raising of the service life of elastic support 210.
First arm of force 214 and second arm of force 216 are arranged in the width direction.Relative second arm of force 216 of first arm of force 214 is more leaned on
Adosculation syringe needle 234, and first arm of force 214 length more than second arm of force 216 length.Fixed part 212 is in step-like structure.
Fixed part 212 includes the first step portion 212a and second step portion 212b being connected with first step portion 212a.Second step
The height of portion 212b is higher than first step portion 212a.First arm of force 214 is connected with first step portion 212a, second arm of force 216
It is connected with second step portion 212b.
The length of first arm of force 214 and second arm of force 216 is drawn by FEM calculation.Elastic support 210 uses
The length of one arm of force 214 is longer than the form of second arm of force 216, can both ensure that the junction 213 for opening up fluted 213a is easily produced
Change shape, to ensure that the contact force tested between probe 200 and printed circuit board (PCB) is suitable and operates steadily, ensures that elastic branch
Frame 210 can be effective against the vibration of width.
First arm of force 214 and second arm of force 216 are rectangular cylindrical structures.First arm of force 214 includes be connected first
The body of rod 124 of the body of rod 122 and second, first body of rod 122 is connected with fixed part 212, second body of rod 124 and probe installation portion 218
It is connected, the thickness of the thickness more than second body of rod 124 of first body of rod 122.
Second arm of force 216 includes the 3rd body of rod 132 and the 4th body of rod 134 that are connected, the 3rd body of rod 132 and fixed part
212 are connected, and the 4th body of rod 134 is connected with probe installation portion 218, and the thickness of the 3rd body of rod 132 is more than the 4th body of rod 134
Thickness.
First arm of force 214 and second arm of force 216 using the form that side is thicker than opposite side, can effectively mitigate elastic branch
The quality of the head of frame 210, and advantageously in the vibration resistance of test probe 200, the particularly vibration on width.
It is appreciated that first arm of force 214 and second arm of force 216 are not limited to rectangular cylindrical structures, also knot can be waited for cylindric
Structure.
Specifically in the present embodiment, contact syringe needle 234 is blade-shaped structure.The contact syringe needle 234 of blade-shaped structure, its pin
The size of sharp 234a is about more than 60 microns, and manufacturing cost is relatively low, is generally used for common printed circuit board (PCB).
The needle point 234a for contacting syringe needle 234 is located at elastic support 210 on the center line of thickness direction, can avoid testing
The generation of torque in journey, further improves the vibration resistance of test probe 200.
It is appreciated that in other embodiments, such as shown in accompanying drawing 4, contact syringe needle 234 can also be needle-like structures.Aciculiform
The contact syringe needle 234 of structure, the size of its needle point 234a is about 20 microns, and manufacturing cost is higher, it is adaptable to high density printing electricity
Road plate.
In test, test probe 200 brings pressure to bear on printed circuit board (PCB) above-mentioned measure with two cable probe unit 10, elasticity
Support 210 can be deformed, so that the generation change of the light quantity to penetrating light that light shielding block 211 is blocked, and by photoelectric sensing
Device 300 produces the output voltage of change, haulage gear to be applied to printed circuit according to the value of output voltage control test probe 200
Pressure on plate, realizes the control of the contact forces to test probe 200 and printed circuit board (PCB), it is to avoid printed circuit board surface
Embroidered, effectively protected printed circuit board (PCB).Also, this control process realizes Automated condtrol, saves manpower.
Additionally, also referring to Fig. 5, additionally providing a kind of application process of measure with two cable probe unit, including following step
Suddenly：
Step S110, there is provided two above-mentioned measure with two cable probe units.
Step S120, respectively pricks in any one UNICOM's circuit of correcting plate two test probes of measure with two cable probe unit
Two ends pad on.
Also referring to Fig. 6, the test probe 200 of two measure with two cable probe units 10 is pricked in correcting plate 60 respectively
Anticipate UNICOM's circuit two ends pad on.Correcting plate 60 is an intact printed circuit board (PCB).
Step S130, one of measure with two cable probe unit is remained stationary as, the movement of another measure with two cable probe unit
Contact force on correcting plate is put on to adjust its test probe.
One of measure with two cable probe unit 10 is remained stationary as, and another measure with two cable probe unit 10 moves to adjust
Its test probe 200 puts on the contact force on correcting plate 60.When two test signal UNICOMs of measure with two cable probe unit 10
That time, displacement was designated as zero.
Step S140, obtains the displacement of measure with two cable probe unit and the output voltage of photoelectric sensor in real time, will
Contact force is associated with output voltage.
When one of measure with two cable probe unit 10 travels forward a segment distance, displacement and photoelectricity are obtained in real time
The voltage that sensor 300 is exported.After above-mentioned test can obtain test probe 200 and test print circuit board contacts
The relation of the output voltage of deflection and photoelectric sensor, with reference to the result that contact force and deflection are tested, by contact force and light
The output voltage of electric transducer is associated.
Step S150, is adjusted according to the relation pair measure with two cable probe unit between contact force and output voltage.
The output voltage of contact force and photoelectric sensor 300 is associated, it is necessary to when being controlled to contact force, can be by
Controlling and being converted into the control to voltage signal to contact force.During specific works, a voltage threshold can be set, work as photoelectricity
The output voltage change of sensor, when reaching voltage threshold, stops the movement of measure with two cable probe unit 10, and then control survey
Sound out the contact force between pin 200 and printed circuit board (PCB).
Embodiment described above only expresses several embodiments of the invention, and its description is more specific and detailed, but simultaneously
Therefore the limitation to the scope of the claims of the present invention can not be interpreted as.It should be pointed out that for one of ordinary skill in the art
For, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to guarantor of the invention
Shield scope.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (8)
1. a kind of measure with two cable probe unit, for testing printed circuit board (PCB), it is characterised in that including：
Haulage gear；
Main body fixed seat, is fixed on the haulage gear, and the main body fixed seat can be moved under the drive of haulage gear；
Test probe, including the elastic support being fixed in the main body fixed seat and the probe being arranged on elastic support, institute
State the light shielding block that elastic support is provided with protrusion；And
Photoelectric sensor, is arranged in the main body fixed seat, and is communicated to connect with the haulage gear, the photoelectric sensor
Recess is offered near the side of the test probe, the photoelectric sensor has to be launched to described from the side of the recess
The opposite side of recess to penetrating light, the photoelectric sensor is used for the described pair of received light quantity for penetrating light of measurement in real time, and
Produce the output voltage changed with the described pair of light quantity for penetrating light；
Wherein, the light shielding block can extend into the recess and block described pair and penetrates light, and the elastic support is produced in test
Deformation, so that the described pair of light quantity for penetrating light that the light shielding block is blocked produces change, and produces change by photoelectric sensor
Output voltage, the haulage gear according to the value of the output voltage control it is described test probe be applied to the printed circuit
Pressure on plate；
The measure with two cable probe unit also includes that sensor adjusts seat, and the sensor adjustment seat is slidably disposed in described
In main body fixed seat, the photoelectric sensor is fixed on the sensor adjustment seat；
Draw-in groove is offered in the main body fixed seat；The first screw is offered on the sensor adjustment seat；The measure with two cable
Probe unit also includes adjusting screw, and the nut of the adjusting screw is fastened in the draw-in groove, and the adjusting screw and institute
State the first screw to be screwed, so that the adjusting screw is collectively forming screw thread auxiliary structure with sensor adjustment seat, rotate institute
Adjusting screw is stated, the position that the sensor adjusts the relatively described main body fixed seat of seat is can adjust.
2. measure with two cable probe unit according to claim 1, it is characterised in that also including rack fixing seat, the branch
Frame fixed seat is fixed on the rack fixing seat located at one end of the main body fixed seat, the elastic support.
3. measure with two cable probe unit according to claim 2, it is characterised in that the rack fixing seat also includes spacing
Block, end of the limited block with the elastic support away from the main body fixed seat is in contact.
4. measure with two cable probe unit according to claim 1, it is characterised in that offered on the sensor adjustment seat
Bar hole, offers the second screw in the main body fixed seat, the measure with two cable probe unit also includes fixing screws, described
Fixing screws are arranged in the bar hole, and are coordinated with second screw, and the fixing screws are in the bar hole
Can move, so that sensor adjustment seat is slidably disposed in the main body fixed seat.
5. measure with two cable probe unit according to claim 1, it is characterised in that the elastic support is made of plastics.
6. measure with two cable probe unit according to claim 1, it is characterised in that the probe includes linking arm and setting
Contact syringe needle on described linking arm one end, the linking arm is on the elastic support.
7. measure with two cable probe unit according to claim 6, it is characterised in that the contact syringe needle is blade-shaped structure
Or needle-like structures.
8. a kind of application process of measure with two cable probe unit, it is characterised in that comprise the following steps：
Measure with two cable probe unit of two claims 1 described in claim 7 any one is provided；
The test probe of two measure with two cable probe units is pricked the two ends of any one UNICOM's circuit on correcting plate respectively
Pad on；
One of them described measure with two cable probe unit is remained stationary as, and another measure with two cable probe unit movement is adjusting
Its test probe puts on the contact force on correcting plate；
The displacement of the measure with two cable probe unit and the output voltage of the photoelectric sensor are obtained in real time, are connect described
Touch is associated with the output voltage；
Measure with two cable probe unit is adjusted according to the relation pair between the contact force and the output voltage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410476692.7A CN104251923B (en) | 2014-09-17 | 2014-09-17 | Measure with two cable probe unit and its application process |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410476692.7A CN104251923B (en) | 2014-09-17 | 2014-09-17 | Measure with two cable probe unit and its application process |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104251923A CN104251923A (en) | 2014-12-31 |
| CN104251923B true CN104251923B (en) | 2017-06-30 |
Family
ID=52187007
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410476692.7A Active CN104251923B (en) | 2014-09-17 | 2014-09-17 | Measure with two cable probe unit and its application process |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104251923B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104792879A (en) * | 2015-05-05 | 2015-07-22 | 上海和伍新材料科技有限公司 | Anti-collision device in longitudinal direction of ultrasonic probe |
| CN106908682B (en) * | 2015-12-22 | 2023-08-04 | 昆山万盛电子有限公司 | Sliding type probe testing device and method |
| CN112998680B (en) * | 2021-02-23 | 2023-03-21 | 潍坊歌尔微电子有限公司 | Testing mechanism |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1585901A (en) * | 2001-12-07 | 2005-02-23 | 德商·Atg测试***股份有限公司 | Test probe for a finger tester and corresponding finger tester |
| CN201247263Y (en) * | 2008-07-31 | 2009-05-27 | 旺矽科技股份有限公司 | Adjustable probe base |
| CN201298064Y (en) * | 2008-07-22 | 2009-08-26 | 南京金五环***科技有限公司 | Mobile probe tester with pressure-adjusting function |
| CN102735884A (en) * | 2012-06-21 | 2012-10-17 | 深圳市大族激光科技股份有限公司 | Bracket for measuring head of flying-probe tester and design method of bracket |
| TWM454543U (en) * | 2012-12-27 | 2013-06-01 | Test Research Inc | Position detection device and testing equipment using the same |
| CN103207293A (en) * | 2012-01-12 | 2013-07-17 | 旺矽科技股份有限公司 | Probe needle pressure correction method and correction equipment thereof |
| CN203178434U (en) * | 2013-03-06 | 2013-09-04 | 深圳市大族激光科技股份有限公司 | Probe testing device |
| CN103513069A (en) * | 2012-06-21 | 2014-01-15 | 深圳麦逊电子有限公司 | Test probe device |
| CN203759201U (en) * | 2014-03-10 | 2014-08-06 | 深圳市大族激光科技股份有限公司 | Flying probe testing machine and flying probe testing shaft thereof |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020004320A1 (en) * | 1995-05-26 | 2002-01-10 | David V. Pedersen | Attaratus for socketably receiving interconnection elements of an electronic component |
-
2014
- 2014-09-17 CN CN201410476692.7A patent/CN104251923B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1585901A (en) * | 2001-12-07 | 2005-02-23 | 德商·Atg测试***股份有限公司 | Test probe for a finger tester and corresponding finger tester |
| CN201298064Y (en) * | 2008-07-22 | 2009-08-26 | 南京金五环***科技有限公司 | Mobile probe tester with pressure-adjusting function |
| CN201247263Y (en) * | 2008-07-31 | 2009-05-27 | 旺矽科技股份有限公司 | Adjustable probe base |
| CN103207293A (en) * | 2012-01-12 | 2013-07-17 | 旺矽科技股份有限公司 | Probe needle pressure correction method and correction equipment thereof |
| CN102735884A (en) * | 2012-06-21 | 2012-10-17 | 深圳市大族激光科技股份有限公司 | Bracket for measuring head of flying-probe tester and design method of bracket |
| CN103513069A (en) * | 2012-06-21 | 2014-01-15 | 深圳麦逊电子有限公司 | Test probe device |
| TWM454543U (en) * | 2012-12-27 | 2013-06-01 | Test Research Inc | Position detection device and testing equipment using the same |
| CN203178434U (en) * | 2013-03-06 | 2013-09-04 | 深圳市大族激光科技股份有限公司 | Probe testing device |
| CN203759201U (en) * | 2014-03-10 | 2014-08-06 | 深圳市大族激光科技股份有限公司 | Flying probe testing machine and flying probe testing shaft thereof |
Non-Patent Citations (1)
| Title |
|---|
| 飞针测试机同步带传动特性;陈楚技等;《计算机辅助工程》;20130531;第22卷;第286-289页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104251923A (en) | 2014-12-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP6255914B2 (en) | Inspection jig | |
| CN101784862B (en) | Method for measuring surface profile of sample and apparatus for measuring surface profile of sample | |
| CN105372499B (en) | A kind of microresistivity survey equipment and measuring method | |
| CN104251923B (en) | Measure with two cable probe unit and its application process | |
| CN203705554U (en) | Resistance measuring device | |
| CN204314136U (en) | The normal direction loading equipemtn of fretting fatigue testing system | |
| CN104568619A (en) | Normal loading device of fretting fatigue test system | |
| KR100968131B1 (en) | Probe device and method of regulating contact pressure between object to be inspected and probe | |
| CN204255782U (en) | A kind of simple wire dynamic fatigue test device | |
| CN104007380A (en) | PCB test fixture | |
| CN101694436B (en) | Strain control method of cantilever bending and loading low-circle fatigue test | |
| CN104515876A (en) | Quick testing tool for circuit board | |
| CN104034921A (en) | PCB (Printed Circuit Board) test fixture having orientating function | |
| CN207798993U (en) | USB plugs measurement jig | |
| CN205333753U (en) | Device for connecting detect pencil length specification | |
| CN104914374A (en) | Device for detecting electrical performance of chips | |
| CN203385347U (en) | Shaft step size gauge | |
| CN205301431U (en) | Little resistance measurement equipment | |
| CN103674377A (en) | Method for detecting contact pressure between conductive slip ring and conductive brush wire | |
| CN104237579B (en) | Four-line test probe device and application method thereof | |
| CN108381415B (en) | Product positioning device and method | |
| CN203909083U (en) | PCB board test jig with directional function | |
| CN203643264U (en) | Maximum force elongation measuring device for steel strands | |
| CN102735884B (en) | Bracket for measuring head of flying-probe tester and design method of bracket | |
| CN101936955A (en) | Device and method for measuring propagation velocity of dynamic crack |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C53 | Correction of patent for invention or patent application | ||
| CB02 | Change of applicant information |
Address after: Dazu laser Building No. 9 Nanshan District high tech Park North new road Shenzhen city Guangdong province 518055 Applicant after: HANS LASER TECHNOLOGY INDUSTRY GROUP CO., LTD. Applicant after: Shenzhen Dazu Digital Control Science & Technology Co., Ltd. Address before: 518000 Shenzhen Province, Nanshan District high tech park, North West New Road, No. 9 Applicant before: Dazu Laser Sci. & Tech. Co., Ltd., Shenzhen Applicant before: Shenzhen Dazu Digital Control Science & Technology Co., Ltd. |
|
| COR | Change of bibliographic data |
Free format text: CORRECT: APPLICANT; FROM: DAZU LASER SCI. + TECH. CO., LTD., SHENZHEN TO: HAN'S LASER TECHNOLOGY INDUSTRY GROUP CO., LTD. |
|
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20200611 Address after: 518101 workshop 5 / F, 1 / 2 / F, 14 / F, 17 / F, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. Address before: 518055, the Han Dynasty laser building, No. 9 West West Road, Nanshan District hi tech park, Guangdong, Shenzhen Co-patentee before: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. Patentee before: HAN'S LASER TECHNOLOGY INDUSTRY GROUP Co.,Ltd. |
|
| CP01 | Change in the name or title of a patent holder | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 518101 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Han's CNC Technology Co.,Ltd. Address before: 518101 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. |