CN202189063U - High-speed high-precision analog-digital converter test adapter - Google Patents
High-speed high-precision analog-digital converter test adapter Download PDFInfo
- Publication number
- CN202189063U CN202189063U CN2011203141728U CN201120314172U CN202189063U CN 202189063 U CN202189063 U CN 202189063U CN 2011203141728 U CN2011203141728 U CN 2011203141728U CN 201120314172 U CN201120314172 U CN 201120314172U CN 202189063 U CN202189063 U CN 202189063U
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- CN
- China
- Prior art keywords
- test
- board
- socket
- chip
- jack
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- Expired - Lifetime
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Abstract
The utility model provides a high-speed high-precision analog-digital converter test adapter, which comprises test system resources, a test board and a test socket. The test system resources are connected to the test board which is connected to the test socket. The test system resources comprise direct current voltage source, a direct current signal measuring instrument, a digital pin and an alternating current signal source. The direct current voltage source, the direct current signal measuring instrument and the digital pin are connected to the test board through contact pins, and the alternating current signal source is connected to the test board through a surface mounted assembly (SMA) socket. The test socket is connected to the test board by means of an ejector pin structure. An ejector pin and a self-locking spring are disposed on the test socket, and a test chip is fixed on the test socket through the self-locking spring ejector pin. The ejector pin structure between the test socket and the test board reduces high-frequency signal waveform damage caused by punching, and improves test precision and speed of an analog-digital converter. The test chip is fixed on the test socket by means of the self-locking spring ejector pin mode so that the test chip is effectively protected and test reliability is enhanced.
Description
[technical field]
The utility model relates to field tests, particularly about a kind of A/D converter with high speed and high precision test adapter.
[background technology]
Present stage; The test jack of A/D converter with high speed and high precision test adapter adopts fixing punching to wait the straight cutting way of contact, and this way of contact makes existing A/D converter with high speed and high precision test adapter have that signal transmission of graphical cracky, signal are prone to rebound, the high-frequency test precision is low, the shortcoming that the frequency range of high-frequency test is narrow; In the prior art; The fixedly present stage of test chip is taked the mechanical pressure mode, and the rigidity compressing of chip under test pin is big, damages chip under test easily.
[summary of the invention]
The purpose of the utility model is to provide a kind of A/D converter with high speed and high precision test adapter that addresses the above problem, and it is good that it has the signal transmission of graphical, and signal does not rebound, the advantage that measuring accuracy is high.
The A/D converter with high speed and high precision test adapter that the utility model provides; Comprise test macro resource, test board, test jack; The test macro resource links to each other with test board; Test board links to each other with test jack, and the test macro resource comprises direct voltage source, direct current signal measurement instrument, digital pin and ac signal which; Direct voltage source in the test macro resource, direct current signal measurement instrument and digital pin link to each other with test board through contact pin, and ac signal which links to each other with test board through the SMA socket in the test macro resource; The thimble-type structure is adopted in being connected of described test jack and test board.
Wherein, thimble and self-locking spring are set in the described test jack, test chip is fixed in the test jack through this thimble and self-locking spring.
The utlity model has following advantage:
Test jack is adopted the thimble-type structure with being connected of test board; Can reduce because the high-frequency signal waveform that punching causes is damaged problems such as signal bounce-back, the precision of high-frequency test greatly; Expand the frequency span of high-frequency test, improved the test speed of analog to digital converter; The self-locking spring thimble mode of taking of test chip is fixed in the test jack; Reduce the rigidity compressing of test jack, significantly reduce, effectively protected test chip because test connects the damage to the test chip pin to the test chip pin; Increased testing reliability; The introducing of self-locking spring thimble structure simultaneously in the contact area that guarantees effectively to have reduced under the good prerequisite that contacts test chip pin and test jack, has improved the pin densities level of test chip.
[description of drawings]
Fig. 1 is that the A/D converter with high speed and high precision test adapter of the utility model connects block diagram.
[embodiment]
Reach technological means and the effect that predetermined purpose is taked for further setting forth the present invention; Below in conjunction with accompanying drawing and preferred embodiment; To the A/D converter with high speed and high precision test adapter that proposes according to the utility model; Its embodiment, structure, characteristic and effect thereof, explain as after.
The A/D converter with high speed and high precision test adapter that the utility model provides, as shown in Figure 1, comprise test macro resource 1, test board 2, test jack 3.The test of A/D converter with high speed and high precision comprises accuracy test, signal to noise ratio (S/N ratio) test, power consumption test, digital pin test etc.Test macro resource 1 comprises direct voltage source, direct current signal measurement instrument, digital pin and ac signal which.Test macro resource 1 for the A/D converter with high speed and high precision test adapter provides as follows must resources supplIes: the variable DC voltage source that, satisfies the converter need of work; Two, direct current signal measurement instrument; Three, the ac signal which of Frequency Adjustable amplitude modulation, four, the digital pin of sufficient amount.Described test macro resource 1 links to each other with test board 2, and test board 2 links to each other with test jack 3, and test chip 4 is tested A/D converter with high speed and high precision, and this chip 4 links to each other with test jack 3.
Wherein, Direct voltage source in the test macro resource 1, direct current signal measurement instrument and digital pin link to each other with test board 2 through contact pin; Ac signal which links to each other with test board 2 through SMA socket (SMA is that English SMALL writes a Chinese character in simplified form, and the SMA socket is a kind of microwave high-frequency connector) in the test macro resource 1, in Fig. 1; A represents the contact pin connected mode of test macro resource 1 and test board 2, and b represents the SMA socket connected mode of test macro resource 1 and test board 2.
The thimble-type structure is adopted in being connected of described test jack 3 and test board 2; These thimble-type syndeton contrast present stage test jack 3 punchings are fixed on the connected mode of test board 2; Can reduce because the high-frequency signal waveform that punching causes is damaged; Problems such as signal bounce-back, the precision of high-frequency test is greatly expanded the frequency span of high-frequency test.
In the described test jack 3 thimble and self-locking spring are set; Test chip 4 is fixed in the test jack 3 through this thimble and self-locking spring; This kind fixed form contrast existing machinery compressing mode can reduce the rigidity compressing of 3 pairs of test chip 4 pins of test jack; Significantly reduce, effectively protected test chip 4, simultaneously the introducing of self-locking spring thimble mode because test connects the damage to test chip 4 pins; In 3 contacts area that guarantee effectively to have reduced under test chip 4 and the test jack 3 good prerequisites that contact test chip 4 pins and test jack, improved the pin densities level of test chip 4.
Test jack 3 is adopted the thimble-type structure with being connected of test board 2; Can reduce because the high-frequency signal waveform that punching causes is damaged problems such as signal bounce-back, the precision of high-frequency test greatly; Expand the frequency span of high-frequency test, improved the test speed of analog to digital converter; The self-locking spring thimble mode of taking of test chip 4 is fixed in the test jack 3; Reduce the rigidity compressing of 3 pairs of test chip 4 pins of test jack, significantly reduce, effectively protected test chip 4 because test connects the damage to test chip 4 pins; Increased testing reliability; The introducing of self-locking spring thimble structure simultaneously in the contact area that guarantees effectively to have reduced under the good prerequisite that contacts test chip 4 pins and test jack 3, has improved the pin densities level of test chip 4.
In this instructions, the present invention is described with reference to its certain embodiments, still, still can make various modifications and conversion obviously and does not deviate from the spirit and scope of the present invention.Therefore, instructions of the present invention and accompanying drawing are considered to illustrative and nonrestrictive.
Claims (2)
1. A/D converter with high speed and high precision test adapter; Comprise test macro resource, test board, test jack; The test macro resource links to each other with test board; Test board links to each other with test jack, it is characterized in that, the test macro resource comprises direct voltage source, direct current signal measurement instrument, digital pin and ac signal which; Direct voltage source in the test macro resource, direct current signal measurement instrument and digital pin link to each other with test board through contact pin, and ac signal which links to each other with test board through the SMA socket in the test macro resource; The thimble-type structure is adopted in being connected of described test jack and test board.
2. A/D converter with high speed and high precision test adapter as claimed in claim 1 is characterized in that, thimble and self-locking spring are set in the described test jack, and test chip is fixed in the test jack through this thimble and self-locking spring.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011203141728U CN202189063U (en) | 2011-08-26 | 2011-08-26 | High-speed high-precision analog-digital converter test adapter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011203141728U CN202189063U (en) | 2011-08-26 | 2011-08-26 | High-speed high-precision analog-digital converter test adapter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202189063U true CN202189063U (en) | 2012-04-11 |
Family
ID=45920505
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011203141728U Expired - Lifetime CN202189063U (en) | 2011-08-26 | 2011-08-26 | High-speed high-precision analog-digital converter test adapter |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202189063U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102759674A (en) * | 2012-07-20 | 2012-10-31 | 航天科工防御技术研究试验中心 | Universal adapter for testing optocouplers |
| CN110514870A (en) * | 2019-08-13 | 2019-11-29 | 中国航空工业集团公司西安飞行自动控制研究所 | A kind of silicon pendulum accelerometer signal conditioning device and system |
-
2011
- 2011-08-26 CN CN2011203141728U patent/CN202189063U/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102759674A (en) * | 2012-07-20 | 2012-10-31 | 航天科工防御技术研究试验中心 | Universal adapter for testing optocouplers |
| CN110514870A (en) * | 2019-08-13 | 2019-11-29 | 中国航空工业集团公司西安飞行自动控制研究所 | A kind of silicon pendulum accelerometer signal conditioning device and system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20120411 |
|
| CX01 | Expiry of patent term |