CN102348990A - 用于测试面板的探测装置 - Google Patents
用于测试面板的探测装置 Download PDFInfo
- Publication number
- CN102348990A CN102348990A CN2010800114318A CN201080011431A CN102348990A CN 102348990 A CN102348990 A CN 102348990A CN 2010800114318 A CN2010800114318 A CN 2010800114318A CN 201080011431 A CN201080011431 A CN 201080011431A CN 102348990 A CN102348990 A CN 102348990A
- Authority
- CN
- China
- Prior art keywords
- panel
- tab
- lead
- main body
- wire
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Environmental & Geological Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2009-0020494 | 2009-03-10 | ||
KR20090020494 | 2009-03-10 | ||
KR10-2009-0097521 | 2009-10-14 | ||
KR1020090097521A KR100972049B1 (ko) | 2009-03-10 | 2009-10-14 | 패널 테스트를 위한 프로브 유닛 |
PCT/KR2010/001399 WO2010104289A2 (en) | 2009-03-10 | 2010-03-05 | Probe unit for testing panel |
Publications (1)
Publication Number | Publication Date |
---|---|
CN102348990A true CN102348990A (zh) | 2012-02-08 |
Family
ID=42645952
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2010800114318A Pending CN102348990A (zh) | 2009-03-10 | 2010-03-05 | 用于测试面板的探测装置 |
CN201080011466.1A Active CN102348991B (zh) | 2009-03-10 | 2010-03-08 | 用于测试面板的探测装置 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201080011466.1A Active CN102348991B (zh) | 2009-03-10 | 2010-03-08 | 用于测试面板的探测装置 |
Country Status (5)
Country | Link |
---|---|
JP (2) | JP2012519867A (ja) |
KR (1) | KR100972049B1 (ja) |
CN (2) | CN102348990A (ja) |
TW (2) | TW201100810A (ja) |
WO (2) | WO2010104289A2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102348991A (zh) * | 2009-03-10 | 2012-02-08 | 普罗-2000有限公司 | 用于测试面板的探测装置 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101039338B1 (ko) | 2010-01-25 | 2011-06-08 | 주식회사 코디에스 | 극 미세피치 검사용 프로브유닛 |
KR101020624B1 (ko) | 2010-07-20 | 2011-03-09 | 주식회사 코디에스 | 가압부재를 구비한 프로브 유닛의 제조방법 |
KR101043818B1 (ko) * | 2010-08-18 | 2011-06-22 | 주식회사 프로이천 | 액정패널 테스트를 위한 프로브 유닛 |
KR101020625B1 (ko) | 2010-10-07 | 2011-03-09 | 주식회사 코디에스 | 필름타입 프로브유닛 및 그의 제조방법 |
KR101039336B1 (ko) | 2010-10-08 | 2011-06-08 | 주식회사 코디에스 | 필름타입 프로브유닛 |
KR101158762B1 (ko) | 2010-10-19 | 2012-06-22 | 주식회사 코디에스 | 필름타입 프로브유닛 및 그의 제조방법 |
KR101177514B1 (ko) | 2010-11-26 | 2012-08-27 | 주식회사 코디에스 | Cog패널 검사용 프로브유닛 |
KR101063184B1 (ko) | 2010-11-26 | 2011-09-07 | 주식회사 코디에스 | Cog패널 검사용 프로브유닛 |
KR101057594B1 (ko) | 2010-11-26 | 2011-08-18 | 주식회사 코디에스 | Fpd 검사용 프로브유닛 |
KR101242372B1 (ko) | 2012-08-28 | 2013-03-25 | (주)메리테크 | 패널 테스트용 글라스 범프 타입 프로브 블록 |
KR101970782B1 (ko) * | 2018-07-13 | 2019-04-19 | 주식회사 케이피에스 | 유기 발광 다이오드 패널 검사용 프로브 장치 |
CN109283368A (zh) * | 2018-10-29 | 2019-01-29 | 大族激光科技产业集团股份有限公司 | 柔性显示面板测试装置 |
KR102098653B1 (ko) * | 2019-09-19 | 2020-04-10 | 주식회사 프로이천 | 프로브 블록 |
JP7217293B2 (ja) | 2019-12-18 | 2023-02-02 | 株式会社アドバンテスト | 1または複数の被テストデバイスをテストするための自動テスト装置、および、自動テスト装置を操作するための方法 |
TWI797552B (zh) * | 2020-02-06 | 2023-04-01 | 日商愛德萬測試股份有限公司 | 用於測試一或多個受測裝置之自動測試設備及用於操作自動測試設備的方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10221371A (ja) * | 1997-02-07 | 1998-08-21 | Mitsubishi Materials Corp | コンタクトプローブおよびその製造方法と前記コンタクトプローブを備えたプローブ装置 |
JPH1164382A (ja) * | 1997-08-12 | 1999-03-05 | Mitsubishi Materials Corp | プローブヘッド |
KR100720378B1 (ko) * | 2005-04-13 | 2007-05-22 | 주식회사 코디에스 | 액정 디스플레이 패널 검사용 프로브 유니트 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2707119B2 (ja) * | 1988-10-18 | 1998-01-28 | 株式会社日本マイクロニクス | 基板用プローブ |
JP3076600B2 (ja) * | 1990-11-20 | 2000-08-14 | 株式会社日本マイクロニクス | 表示パネル用プローバ |
JP3187855B2 (ja) * | 1991-03-27 | 2001-07-16 | 株式会社日本マイクロニクス | 表示パネル用プローバ |
JP2617080B2 (ja) * | 1993-06-04 | 1997-06-04 | 株式会社東京カソード研究所 | 多ピン接触子およびその製造方法 |
JP2668653B2 (ja) * | 1994-05-17 | 1997-10-27 | 日東精工株式会社 | 導通接触端子 |
JPH09127542A (ja) * | 1995-10-27 | 1997-05-16 | Nec Corp | 液晶表示装置及びその検査方法 |
JP3602630B2 (ja) * | 1995-12-14 | 2004-12-15 | 株式会社日本マイクロニクス | プローブユニット |
KR100212276B1 (ko) * | 1996-06-13 | 1999-08-02 | 윤종용 | 정전기 방전 수단을 가지는 액정 패널, 액정 패널검사용 프루브장치 및 검사방법 |
JPH10221137A (ja) * | 1997-02-10 | 1998-08-21 | Tokimec Inc | 極低温用超音波流量計プローブ取付治具 |
JP3035275B2 (ja) * | 1997-10-13 | 2000-04-24 | 松下電器産業株式会社 | 集積回路素子のプローブ装置 |
JP2000214184A (ja) * | 1999-01-26 | 2000-08-04 | Micronics Japan Co Ltd | プロ―ブ装置 |
JP2006284362A (ja) * | 2005-03-31 | 2006-10-19 | Nhk Spring Co Ltd | コンタクトプローブ |
JP2007003207A (ja) * | 2005-06-21 | 2007-01-11 | Yamaha Corp | プローブユニット及びその製造方法 |
JP2007139712A (ja) * | 2005-11-22 | 2007-06-07 | Nhk Spring Co Ltd | プローブホルダおよびプローブユニット |
JP4789686B2 (ja) * | 2006-04-05 | 2011-10-12 | 株式会社ユニオンアロー・テクノロジー | マイクロプローブガイドを用いるマイクロプローブユニット及び千鳥配置型マイクロプローブユニット |
KR100972049B1 (ko) * | 2009-03-10 | 2010-07-22 | 주식회사 프로이천 | 패널 테스트를 위한 프로브 유닛 |
-
2009
- 2009-10-14 KR KR1020090097521A patent/KR100972049B1/ko active IP Right Review Request
-
2010
- 2010-03-05 WO PCT/KR2010/001399 patent/WO2010104289A2/en active Application Filing
- 2010-03-05 TW TW99106531A patent/TW201100810A/zh unknown
- 2010-03-05 CN CN2010800114318A patent/CN102348990A/zh active Pending
- 2010-03-05 JP JP2011553939A patent/JP2012519867A/ja active Pending
- 2010-03-05 TW TW099106532A patent/TWI482972B/zh not_active IP Right Cessation
- 2010-03-08 WO PCT/KR2010/001438 patent/WO2010104303A2/en active Application Filing
- 2010-03-08 CN CN201080011466.1A patent/CN102348991B/zh active Active
- 2010-03-08 JP JP2011553943A patent/JP5746060B2/ja not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10221371A (ja) * | 1997-02-07 | 1998-08-21 | Mitsubishi Materials Corp | コンタクトプローブおよびその製造方法と前記コンタクトプローブを備えたプローブ装置 |
JPH1164382A (ja) * | 1997-08-12 | 1999-03-05 | Mitsubishi Materials Corp | プローブヘッド |
KR100720378B1 (ko) * | 2005-04-13 | 2007-05-22 | 주식회사 코디에스 | 액정 디스플레이 패널 검사용 프로브 유니트 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102348991A (zh) * | 2009-03-10 | 2012-02-08 | 普罗-2000有限公司 | 用于测试面板的探测装置 |
CN102348991B (zh) * | 2009-03-10 | 2014-05-07 | 普罗-2000有限公司 | 用于测试面板的探测装置 |
Also Published As
Publication number | Publication date |
---|---|
WO2010104303A3 (en) | 2011-01-06 |
TW201100810A (en) | 2011-01-01 |
TW201037321A (en) | 2010-10-16 |
JP2012519868A (ja) | 2012-08-30 |
CN102348991A (zh) | 2012-02-08 |
WO2010104289A2 (en) | 2010-09-16 |
TWI482972B (zh) | 2015-05-01 |
CN102348991B (zh) | 2014-05-07 |
JP5746060B2 (ja) | 2015-07-08 |
WO2010104289A3 (en) | 2011-01-06 |
WO2010104303A2 (en) | 2010-09-16 |
JP2012519867A (ja) | 2012-08-30 |
KR100972049B1 (ko) | 2010-07-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20120208 |