WO2010104303A3 - Probe unit for testing panel - Google Patents

Probe unit for testing panel Download PDF

Info

Publication number
WO2010104303A3
WO2010104303A3 PCT/KR2010/001438 KR2010001438W WO2010104303A3 WO 2010104303 A3 WO2010104303 A3 WO 2010104303A3 KR 2010001438 W KR2010001438 W KR 2010001438W WO 2010104303 A3 WO2010104303 A3 WO 2010104303A3
Authority
WO
WIPO (PCT)
Prior art keywords
panel
tab
probe unit
fpcb
testing panel
Prior art date
Application number
PCT/KR2010/001438
Other languages
French (fr)
Other versions
WO2010104303A2 (en
Inventor
Yi Bin Ihm
Nam Jung Her
Jun Soo Cho
Original Assignee
Pro-2000 Co. Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=42645952&utm_source=***_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=WO2010104303(A3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Pro-2000 Co. Ltd. filed Critical Pro-2000 Co. Ltd.
Priority to JP2011553943A priority Critical patent/JP5746060B2/en
Priority to CN201080011466.1A priority patent/CN102348991B/en
Publication of WO2010104303A2 publication Critical patent/WO2010104303A2/en
Publication of WO2010104303A3 publication Critical patent/WO2010104303A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Environmental & Geological Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Liquid Crystal (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

There is provided a probe unit for testing a panel. The probe unit includes a body block and a flexible printed circuit board (FPCB). The body block with a bottom on which a taped-automated-bonded (TAB) integrated circuit (IC) used in the panel is mounted, the TAB IC in contact with leads of the panel. On a side opposite to a contact portion between the TAB IC and the panel, there is formed a buffer block maintaining flatness of the contact portion and providing elasticity there to. The FPCB is electrically connected to a rear of the TAB IC and transmits a test signal to the panel via the TAB IC.
PCT/KR2010/001438 2009-03-10 2010-03-08 Probe unit for testing panel WO2010104303A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2011553943A JP5746060B2 (en) 2009-03-10 2010-03-08 Probe unit for panel testing
CN201080011466.1A CN102348991B (en) 2009-03-10 2010-03-08 Probe unit for testing panel

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR10-2009-0020494 2009-03-10
KR20090020494 2009-03-10
KR10-2009-0097521 2009-10-14
KR1020090097521A KR100972049B1 (en) 2009-03-10 2009-10-14 Probe unit for testing panel

Publications (2)

Publication Number Publication Date
WO2010104303A2 WO2010104303A2 (en) 2010-09-16
WO2010104303A3 true WO2010104303A3 (en) 2011-01-06

Family

ID=42645952

Family Applications (2)

Application Number Title Priority Date Filing Date
PCT/KR2010/001399 WO2010104289A2 (en) 2009-03-10 2010-03-05 Probe unit for testing panel
PCT/KR2010/001438 WO2010104303A2 (en) 2009-03-10 2010-03-08 Probe unit for testing panel

Family Applications Before (1)

Application Number Title Priority Date Filing Date
PCT/KR2010/001399 WO2010104289A2 (en) 2009-03-10 2010-03-05 Probe unit for testing panel

Country Status (5)

Country Link
JP (2) JP2012519867A (en)
KR (1) KR100972049B1 (en)
CN (2) CN102348990A (en)
TW (2) TW201100810A (en)
WO (2) WO2010104289A2 (en)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100972049B1 (en) * 2009-03-10 2010-07-22 주식회사 프로이천 Probe unit for testing panel
KR101039338B1 (en) 2010-01-25 2011-06-08 주식회사 코디에스 Probe unit testing micro pitch array
KR101020624B1 (en) 2010-07-20 2011-03-09 주식회사 코디에스 Menufacturing method of probe unit having pressure member
KR101043818B1 (en) * 2010-08-18 2011-06-22 주식회사 프로이천 Probe unit for testing lcd panel
KR101020625B1 (en) 2010-10-07 2011-03-09 주식회사 코디에스 Film type probe unit and manufacturing method of the same
KR101039336B1 (en) 2010-10-08 2011-06-08 주식회사 코디에스 Film type probe unit
KR101158762B1 (en) 2010-10-19 2012-06-22 주식회사 코디에스 Film type probe unit and manufacturing method of the same
KR101063184B1 (en) 2010-11-26 2011-09-07 주식회사 코디에스 Probe unit for testing chip on glass panel
KR101057594B1 (en) 2010-11-26 2011-08-18 주식회사 코디에스 Probe unit for testing flat panel display
KR101177514B1 (en) 2010-11-26 2012-08-27 주식회사 코디에스 Probe unit for testing chip on glass panel
KR101242372B1 (en) 2012-08-28 2013-03-25 (주)메리테크 Bump-type probe, glass block panels for testing
KR101970782B1 (en) * 2018-07-13 2019-04-19 주식회사 케이피에스 Probing apparatus for testing of organic light-emitting display panel
CN109283368A (en) * 2018-10-29 2019-01-29 大族激光科技产业集团股份有限公司 Flexible display panels test device
KR102098653B1 (en) * 2019-09-19 2020-04-10 주식회사 프로이천 Probe block
JP7217293B2 (en) 2019-12-18 2023-02-02 株式会社アドバンテスト Automatic test equipment for testing one or more devices under test, and method for operating the automatic test equipment
TWI797552B (en) * 2020-02-06 2023-04-01 日商愛德萬測試股份有限公司 Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09127542A (en) * 1995-10-27 1997-05-16 Nec Corp Liquid crystal display device and its inspecting method
JPH10221371A (en) * 1997-02-07 1998-08-21 Mitsubishi Materials Corp Contact probe and its manufacture and probe apparatus having the contact probe
JPH1164382A (en) * 1997-08-12 1999-03-05 Mitsubishi Materials Corp Probe head
KR100212276B1 (en) * 1996-06-13 1999-08-02 윤종용 Electrostatic protected lcd panel, probing apparatus and monitoring method
KR100314874B1 (en) * 1999-01-26 2001-11-23 가부시키가이샤 니혼 마이크로닉스 Probing apparatus
KR100720378B1 (en) * 2005-04-13 2007-05-22 주식회사 코디에스 Probe unit for inspecting liquid crytal display panel

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2707119B2 (en) * 1988-10-18 1998-01-28 株式会社日本マイクロニクス Probe for board
JP3076600B2 (en) * 1990-11-20 2000-08-14 株式会社日本マイクロニクス Display panel prober
JP3187855B2 (en) * 1991-03-27 2001-07-16 株式会社日本マイクロニクス Display panel prober
JP2617080B2 (en) * 1993-06-04 1997-06-04 株式会社東京カソード研究所 Multi-pin contact and manufacturing method thereof
JP2668653B2 (en) * 1994-05-17 1997-10-27 日東精工株式会社 Conductive contact terminal
JP3602630B2 (en) * 1995-12-14 2004-12-15 株式会社日本マイクロニクス Probe unit
JPH10221137A (en) * 1997-02-10 1998-08-21 Tokimec Inc Jig for fitting probe of cryogenic ultrasonic flowmeter
JP3035275B2 (en) * 1997-10-13 2000-04-24 松下電器産業株式会社 Probe device for integrated circuit devices
JP2006284362A (en) * 2005-03-31 2006-10-19 Nhk Spring Co Ltd Contact probe
JP2007003207A (en) * 2005-06-21 2007-01-11 Yamaha Corp Probe unit and its manufacturing method
JP2007139712A (en) * 2005-11-22 2007-06-07 Nhk Spring Co Ltd Probe holder and probe unit
JP4789686B2 (en) * 2006-04-05 2011-10-12 株式会社ユニオンアロー・テクノロジー Microprobe unit using microprobe guide and staggered microprobe unit
KR100972049B1 (en) * 2009-03-10 2010-07-22 주식회사 프로이천 Probe unit for testing panel

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09127542A (en) * 1995-10-27 1997-05-16 Nec Corp Liquid crystal display device and its inspecting method
KR100212276B1 (en) * 1996-06-13 1999-08-02 윤종용 Electrostatic protected lcd panel, probing apparatus and monitoring method
JPH10221371A (en) * 1997-02-07 1998-08-21 Mitsubishi Materials Corp Contact probe and its manufacture and probe apparatus having the contact probe
JPH1164382A (en) * 1997-08-12 1999-03-05 Mitsubishi Materials Corp Probe head
KR100314874B1 (en) * 1999-01-26 2001-11-23 가부시키가이샤 니혼 마이크로닉스 Probing apparatus
KR100720378B1 (en) * 2005-04-13 2007-05-22 주식회사 코디에스 Probe unit for inspecting liquid crytal display panel

Also Published As

Publication number Publication date
KR100972049B1 (en) 2010-07-22
TWI482972B (en) 2015-05-01
JP2012519867A (en) 2012-08-30
WO2010104303A2 (en) 2010-09-16
JP2012519868A (en) 2012-08-30
CN102348990A (en) 2012-02-08
TW201100810A (en) 2011-01-01
TW201037321A (en) 2010-10-16
CN102348991A (en) 2012-02-08
CN102348991B (en) 2014-05-07
WO2010104289A2 (en) 2010-09-16
JP5746060B2 (en) 2015-07-08
WO2010104289A3 (en) 2011-01-06

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