CN102289000B - X射线断层摄影检查*** - Google Patents

X射线断层摄影检查*** Download PDF

Info

Publication number
CN102289000B
CN102289000B CN201110114520.1A CN201110114520A CN102289000B CN 102289000 B CN102289000 B CN 102289000B CN 201110114520 A CN201110114520 A CN 201110114520A CN 102289000 B CN102289000 B CN 102289000B
Authority
CN
China
Prior art keywords
ray
scattering
data
image
detecting device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201110114520.1A
Other languages
English (en)
Other versions
CN102289000A (zh
Inventor
E·J·默通
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CXR Ltd
Original Assignee
CXR Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CXR Ltd filed Critical CXR Ltd
Publication of CN102289000A publication Critical patent/CN102289000A/zh
Application granted granted Critical
Publication of CN102289000B publication Critical patent/CN102289000B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/246Measuring radiation intensity with semiconductor detectors utilizing latent read-out, e.g. charge stored and read-out later
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/247Detector read-out circuitry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2985In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of nuclear radiation, e.g. of natural or induced radioactivity
    • G01V5/20
    • G01V5/22
    • G01V5/222
    • G01V5/226
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/12Edge-based segmentation
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/143Segmentation; Edge detection involving probabilistic approaches, e.g. Markov random field [MRF] modelling
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/187Segmentation; Edge detection involving region growing; involving region merging; involving connected component labelling
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/33Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3304Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts helicoidal scan
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/33Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3307Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts source and detector fixed; object moves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/33Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3308Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object translates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/401Imaging image processing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/419Imaging computed tomograph
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/421Imaging digitised image, analysed in real time (recognition algorithms)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/50Detectors
    • G01N2223/501Detectors array
    • G01N2223/5015Detectors array linear array
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/639Specific applications or type of materials material in a container
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/643Specific applications or type of materials object on conveyor

Abstract

本发明涉及X射线断层摄影检查***。一种用于检查物品的X射线成像检查***,包括X射线源(10),该X射线源在成像体积(16)周围延伸并限定可从中引导X射线穿过成像体积的多个源点(14)。X射线检测器阵列(12)也在成像体积(16)周围延伸,并被配置为检测穿过成像体积的来自源点的X射线,并产生依赖于检测到的X射线的输出信号。传输器(20)被配置为传输物品以使其穿过成像体积(16)。

Description

X射线断层摄影检查***
本申请是国际申请日为2006年12月15日,申请号为200680051488.4,发明名称为“X射线断层摄影检查***”的分案申请。
技术领域
本发明涉及X射线扫描。它在行李、包裹和其他可疑物体的安全排查中具有特别的应用,而且它同样可用于其他合适的应用。
背景技术
X射线计算断层摄影(CT)扫描仪用于机场中的安全排查中已有若干年。常规的***包括围绕某一轴旋转的X射线管,以及也以相同的速度围绕同一轴旋转的弓形X射线检测器。其上承载有行李的传输带被放在位于旋转中心轴附近的适当的洞内,并且随着射线管的旋转沿该轴移动。X放射线的扇形射束从放射源穿过待检查物体到达X射线检测器阵列。
X射线检测器阵列在沿其长度的几个位置上记录穿过待检查物体的X射线的强度。在许多源角度中的每一个上记录一组投影数据。由这些记录的X射线强度,通常可以利用滤波反投影(filtered backprojection)算法形成断层摄影(断面)图像。为了产生诸如袋子或包裹的物体的精确的断层摄影图像,可以表明要求X射线源穿透通过物体的每个平面。在上述的配置中,通过X射线源的旋转扫描以及其上承载有物体的传输器的纵向移动来实现这一点。
在这种类型的***中,可收集X射线断层摄影扫描的速率取决于保持X射线源和检测器阵列的台架(gantry)的旋转速度。在现代CT台架中,整个射线管-检测器组件和台架将每秒完成二到四转。这分别允许每秒收集多达四次或八次的断层摄影扫描。
随着现有技术的发展,单环的X射线检测器已被多环的检测器代替。这使得可以采用从单扫描机器调整而来的滤波反投影方法同时扫描和重构许多切片(slice)(一般为8个)。随着传输器穿过成像***的连续移动,放射源描绘了围绕物体的螺旋状扫描移动。这允许应用更复杂的锥束图像重构方法,其可在原理上提供更精确的体图像重构。
在另一进展中,已在医疗应用中展示了扫掠式电子束扫描仪(swept electron beam scanner),由此免除了X射线源和检测器的机械扫描运动,取而代之的是围绕被检查物体的X射线检测器的连续环,以及由于在弓形阳极周围扫掠电子束而产生的移动X射线源。这使得可以比常规扫描仪更快速地获得图像。但是,由于电子源位于旋转轴上,因此这种扫掠式电子束扫描仪与传输器***不兼容,传输器***本身与旋转轴接近并平行地移动。
发明内容
本发明提供一种用于检查物品的X射线扫描***,该***包含:X射线源,其在扫描体积周围延伸并限定可从中引导X射线穿过扫描体积的多个源点;X射线检测器阵列,其同样在扫描体积周围延伸并被配置为检测已穿过扫描体积的来自源点的X射线并产生依赖于检测到的X射线的输出信号;和传输器,被配置为传输物品以使其穿过扫描体积。
本发明还提供一种网络化检查***,该网络化检查***包括X射线扫描***、工作站、和被配置为将扫描***连接到工作站上的连接装置,该扫描***包含:X射线源,其在扫描体积周围延伸并限定可从中引导X射线穿过扫描体积的多个源点;X射线检测器阵列,其同样在扫描体积周围延伸并被配置为检测已穿过扫描体积的来自源点的X射线并产生依赖于检测到的X射线的输出信号;和传输器,被配置为传输物品以使其穿过扫描体积。
本发明还提供一种用于对物品进行分拣的分拣***,该***包括:被配置为扫描各个物品的多个扫描区域以由此产生扫描仪输出的断层摄影扫描仪;被配置为分析扫描仪输出并且至少部分地基于扫描仪输出将各个物品分配到多个类别中的一个的分析装置;和被配置为至少部分地基于物品已被分配到的类别对它们进行分拣的分拣装置。
本发明还提供一种X射线扫描***,该X射线扫描***包括:被配置为从扫描区域周围的多个X射线源位置产生X射线的X射线源;被配置为检测穿过扫描区域的X射线的第一组检测器;被配置为检测在扫描区域内散射的X射线的第二组检测器;和处理装置,其被配置为处理来自第一组检测器的输出以产生限定扫描区域的图像的图像数据、分析图像数据以识别图像内的物体、处理来自第二组检测器的输出以产生散射数据并将散射数据的多个部分与物体相关联。
本发明还提供一种用于从X射线扫描仪收集数据的数据收集***,该***包括:具有分别与图像的相应区相关的多个区的存储器;被配置为以预定的次序从多个X射线检测器接收输入数据的数据输入装置;处理装置,其被配置为从输入数据产生与图像的区中的每一个相关的X射线透射数据和X射线散射数据,并将该X射线透射数据和X射线散射数据存储在适当的存储区中。
本发明还提供一种X射线扫描***,该X射线扫描***包括:被配置为扫描物体以产生限定物体的断层摄影X射线图像的扫描数据的扫描仪;和处理装置,其被配置为分析扫描数据以提取图像数据的至少一个参数并基于所述至少一个参数将物体分配到多个类别中的一个。
本发明还提供一种具有中心纵轴的X射线扫描***,包括:被配置为从扫描区域周围的多个X射线源位置产生X射线、并沿与中心纵轴垂直的方向穿过扫描区域发送产生的X射线的X射线源;被配置为在围绕中心纵轴的圆形阵列中对发送的X射线进行检测的第一组检测器;被配置为在围绕中心纵轴的圆形阵列中对在扫描区域内散射的X射线进行检测的第二组检测器;被配置为防止散射的X射线到达第二组检测器中的每一个除非X射线来自接收方向的准直器,其中对于第二组检测器中的每一个,沿接收方向来自检测器的线穿过中心纵轴并不与中心纵轴垂直,和处理装置,该处理装置被配置为:处理来自第一组检测器的输出以产生限定扫描区域的图像的图像数据,分析图像数据以识别图像内的物体,将散射数据的多个部分与物体相关联,以及处理来自第二组检测器的输出以产生散射数据并基于散射的X射线到达第二组检测器中的哪个检测器确定发送的X射线被散射的位置。
附图说明
现在参照附图仅作为示例说明本发明的优选实施例,在这些附图中:
图1是根据本发明第一实施例的实时断层摄影安全扫描***的纵剖面;
图1a是图1的***的X射线源的透视图;
图2是图1的***的平面图;
图3是图1的***的示意性侧视图;
图4是形成图1的***的一部分的数据获取***的示意图;
图5是形成图1的***的一部分的威胁检测***的示意图;
图6是根据本发明实施例的行李分拣***的示意图,该行李分拣***包括图1的扫描***;
图7是根据本发明另一实施例的行李分拣***的示意图;
图8a、图8b和图8c是根据本发明其他实施例的行李分拣***的示意图;
图9是根据本发明另一实施例的网络化行李分拣***的示意图;
图10是根据本发明另一实施例的独立式扫描***的示意性平面图;
图11是图10的***的示意性侧视图;
图12是根据本发明另一实施例的模块化扫描***的示意性侧视图;
图13是X射线散射事件的示图;
图14是根据本发明另一实施例的安全扫描***的纵剖面;
图15是图14的***的另一纵剖面,示出了如何检测不同的散射事件;
图16是图14的***的横剖面;
图17是图14的扫描***的数据采集***的示意图;
图18是根据本发明另一实施例的双重能量扫描仪的局部视图;
图19是图18的扫描仪的另一局部视图;
图20是本发明另一实施例的双重能量X射线源的示意图;
图21是根据本发明另一实施例的扫描仪的检测器阵列的示意图;
图22是根据本发明另一实施例的扫描仪的检测器阵列的示意图;
图23是图21的实施例的数据采集电路的电路图;以及
图24是本发明另一实施例的数据采集电路的电路图。
具体实施方式
参照图1~3,中央大厅行李扫描***6包括扫描单元8,扫描单元8包含多焦距X射线源10和X射线检测器阵列12。射线源10包含处于射线源上的各个分开的位置上并且被配置在围绕***的轴X-X的全360°圆形阵列中的大量源点14。可以理解,也可以使用覆盖少于全360°角的阵列。
参照图1a,在与传输器的移动方向垂直的平面上,X射线源10由许多源单元11组成,这些源单元11以基本上圆形的配置在扫描区域16的周围间隔开。各个源单元11包含具有两侧的导电金属抑制器13和沿抑制器两侧之间延伸的发射器元件15。在抑制器13的上方支撑有与发射器元件15垂直的网格导线17形式的许多网格元件。在网格导线的与发射器元件相对的一侧的另一平面上支撑有聚焦导线19形式的许多聚焦元件。聚焦导线19与网格导线17平行并且以与网格导线相同的间隔相互分开,每个聚焦导线19与网格导线17中的相应的一条对准。
聚焦导线19在与发射器元件15平行地延伸的两条承轨21上被支撑,并且与抑制器13分开。承轨21是导电性的,使得所有聚焦导线19均电连接在一起。承轨21中的一条与连接器23连接以为聚焦导线19提供电连接。网格导线17中的每一条在抑制器13的一侧的下方延伸,并与为网格导线17中的每一条提供单独的电连接的相应电连接器25连接。
在网格导线17和聚焦导线19的上方支撑有阳极27。阳极27形成为一般为镀钨或银的铜的杆,并与发射器元件15平行地延伸。网格和聚焦导线17、19因此在发射器元件15和阳极27之间延伸。电连接器29提供与阳极27的电连接。
除了与正电位连接的两条网格导线17以外,网格导线17均与负电位连接。这些正网格导线从发射器元件15的区域提取电子束,并且,通过聚焦导线19的聚焦,将电子束引导到阳极27上的点上,该点形成该对网格导线的X射线源点。网格导线的电位因此可在任意时间被切换,以选择哪一对网格导线是活动的,并因此在任何时间选择阳极27上的哪个点是活动的X射线源点。
放射源10因此可被控制为单独地从源单元11中的每一个中的源点14中的每一个产生X射线,并且,重新参照图1,来自各个源点14的X射线被向内引导为穿过圆形源10内的扫描区域16。由控制单元18(其控制施加到网格导线17上的电位并由此控制从源点14中的每一个的X射线发射)控制放射源10。
在WO 2004/097889中说明了其他适当的X射线源设计。多焦距X射线源10允许使用电子控制电路18以在任何时刻选择多焦距X射线源中的许多单个X射线源点14中的哪一个是活动的。由此,通过电子地扫描多焦距X射线管,在没有机械部分物理移动的情况下产生了X射线源移动的错觉。在这种情况下,源旋转的角速度可增加到使用常规旋转X射线管组件时根本不能实现的水平。这种迅速的旋转扫描会转化为等效地加速的数据采集过程,并在随后转化为快速的图像重构。
检测器阵列12也是圆形的,并且围绕轴X-X被配置在沿轴方向稍偏离放射源10的位置上。放射源10被配置为引导其产生的X射线向着扫描区域的相反一侧的检测器阵列12穿过扫描区域16。X射线束的路径18因此沿基本上或几乎与扫描仪轴X-X垂直的方向穿过扫描区域16,从而在该轴附近相交。被扫描和成像的扫描区域的体积因此呈现与扫描仪轴垂直的薄片的形式。放射源被扫描,使得各个源点发射X射线相应的时段,该发射时段以预定的次序被排列。随着各个源点14发射X射线,会产生来自检测器12的信号,该信号依赖于入射到检测器上的X射线的强度,并且在存储器中记录信号提供的强度数据。当放射源完成其扫描时,可以处理检测器信号以形成被扫描体积的图像。
传输带20如图1所示的那样与扫描仪的轴X-X平行地从左到右穿过成像体积。X射线散射防护罩22位于主X射线***的上游和下游的传输带20的周围,以防止由于散射的X射线导致的操作员放射剂量。X射线散射防护罩22在它们的开放的端部包含含铅橡胶条形幕帘24,使得检查中的物品26在进入检查区域时被拖动穿过一个幕帘并在离开时被拖动穿过一个幕帘。在示出的集成***中,示出了安装在传输器20的下方的主电子控制***18、处理***30、电源32和冷却架34。传输器20被配置为一般以恒定的传输器速度按连续的扫描移动进行工作,并且一般在成像体积内具有碳纤维框架。
参照图4,处理***30包含电子数据采集***和实时图像重构***。X射线检测器阵列12包含被配置为简单的线性图案(例如,1x 16)的多排的单一X射线检测器50。多个环图案(例如,8x 16)也是可能的。每个检测器50都输出依赖于它检测的X射线的强度的信号。多路传输块52多路传输来自输入X射线检测器50中的每一个的输出数据信号,执行数据过滤、增益和偏差校正,并将该数据格式化成高速串行流。选择块53从所有多路传输块52取得输入,并只选择整个X射线数据中的图像重构所需要的一部分。选择块53还为适当的X射线源点确定未衰减的X射线束强度Io(其将随多焦距X射线管内的每一个X射线源点而改变),通过形成结果loge(Ix/Io)处理来自多路传输块52的X射线强度数据Ix,然后用适当的1-D滤波器对其进行卷积处理。得到的投影数据被记录为声纳图(sinogram),其中,利用沿一个轴(在这种情况下是水平的)的像素号和沿另一轴的源角度(在这种情况下是垂直的)在阵列中排列数据。然后将数据从选择块53并行地传递给一组背投求和处理器元件54。使用具有用于选择必需的卷积X射线数据的预先计算的系数和用于快速背投和求和的加权因子的查找表,处理器元件54被映射成硬件。格式化块55从多个处理器元件54取得代表单个重构的图像文件的数据,并将最终的输出图像数据格式化成适于在显示屏上产生合适的格式化的三维图像的形式。为了实时或离线查看,可以实时地对于要产生的图像足够快地产生该输出,由此,该***被称为实时断层摄影(RTT)***。
在本实施例中,将多路传输块52编码在软件中,将选择块53和格式化块55编码在固件中,并将处理器元件映射在硬件中。但是,根据特定***的需求,这些部件中的每一个都可以是硬件也可以是软件。
参照图5,然后由处理***30内的威胁检测处理器60来处理用于每个行李物品的每幅最终输出图像,该威胁检测处理器60被配置为确定被成像的行李物品是否代表威胁。在威胁检测处理器60中,输入的X射线断层摄影图像数据62被传递到一组低层级参数提取器63(层级1)中。参数提取器63识别诸如恒定的灰度级的面积、纹理和统计信息之类的图像特征。一些提取器作用于单一的2维图像或切片的数据,一些作用于3维图像,一些作用于声纳图数据。在可能的情况下,各个提取器并行地作用于同一组输入数据,并且各个提取器被配置为执行不同的处理操作并确定不同的参数。在处理结束时,由参数提取器63确定的参数被传递到一组决策树64(层级2)。以下给出提取的参数的细节。决策树64分别取得大量的(一般为所有的)低层级参数,并且用相关的统计信息构建各更高层级的信息,如关于邻接的体积的信息。在最高层级(层级3)上,数据库搜索器65将在层级2上产生的较高层级的参数映射成表示存在威胁的“红色”概率Pr(威胁)和表示被检查物品安全的“绿色”概率Pr(安全)。处理***30利用这些概率将所扫描的物品分配到适当的安全类别,并产生自动分拣控制输出。该自动分拣控制输出可以为表示物品被分配到开释(clear)类别的第一“绿色”输出、表示物品被分配到“不开释”类别的第二“红色”输出、或表示不能实施具有足够的可靠性的自动分拣以将物品分配到“开释”或“不开释”的类别的第三“琥珀色”输出。具体来说,如果Pr(安全)高于预定值(或者Pr(威胁)低于预定值),那么将产生具有第一信号形式的自动分拣输出,表示物品应被分配到绿色通道。如果Pr(威胁)高于预定值(或者Pr(安全)低于预定值),那么将产生具有第二信号形式的自动分拣输出,表示物品应被分配到红色通道。如果Pr(威胁)(或者Pr(安全))处于两个预定值之间,那么将产生具有第三信号形式的自动分拣输出,表示不能将物品分配到红色通道或绿色通道。也可将概率输出为其他输出信号。
将要由参数提取器63确定的参数一般与2维或3维图像的各单独的区域内的像素的统计分析有关。为了识别图像中的各个单独的区域,使用统计边缘检测方法。该方法在某一像素上开始,然后检查相邻的像素是否是同一区域的一部分,从而随着区域生长而向外移动。在各个步骤中,通过计算区域内的像素的平均强度来确定区域的平均强度,并且,将与该区域相邻的下一个像素的强度与该平均值相比较,以对于待加入该区域的像素确定其强度是否足够接近该平均值。在这种情况下,确定区域内的像素强度的标准偏差,并且,如果新像素的强度在该标准偏差内,那么将它添加到该区域中。否则,不将它添加到该区域中,并且,这将该区域的边缘限定为该区域中的像素与已被检查并且未被添加到该区域中的像素之间的边界。
一旦已将图像分成多个区域,那么可以测量区域的参数。一个这种参数是对区域内的像素强度的方差的测量。如果它较高,这可能表示可能例如在自制炸弹中发现的块料(lumpy material),而如果方差较低,这可能表示诸如液体的均匀材料。
被测量的另一参数是区域内的像素值的分布的偏斜情况(skewedness),通过测量像素值的直方图的偏斜情况来确定该偏斜情况。高斯分布(即无偏斜分布)表示区域内的材料是均匀的,而高度偏斜的分布表示区域中的不均匀性。
如上所述,这些低层级参数被向上传递到决策树64,在这些决策树64中,用所确定的更高层级的参数构建更高层级的信息。一个这种更高层级的参数是识别的区域的表面积与体积之比。另一个是类似度的测量,该类似度在本情况下是区域的形状和存储在***中的模板形状之间的互相关性。模板形状被配置为对应于诸如***或***的具有安全威胁的物品的形状。如上面说明的那样使用这些高层级参数来确定由被成像物体引起的威胁级别。
参照图6,联机(in-line)实时断层摄影行李分拣***包括图1的扫描***6,传输器20穿过该扫描***6。在扫描***6的下游,分拣装置40被配置为从传输器20接收各件行李,并将它们移动到开释或“绿色”通道传输器42或不开释或“红色”通道传输器44。通过经由控制线路46来自处理***30的自动分拣输出信号并且还通过来自工作站48(分拣装置40经由线路45连接到工作站48)的信号来控制分拣装置40,自动分拣输出信号表示处理***30关于物品是否为开释的决定。来自扫描***6的图像和来自处理***30的表示红色和绿色概率和处理***30的名义决定的信号也被馈送到工作站48。工作站被配置为在屏幕47上显示图像,使得操作人员可看到它们,并提供指示绿色和红色概率和名义自动分拣决定的显示。工作站处的用户可回顾图像和概率以及自动分拣输出,并且,如果扫描***的决定是要将物品分配到红色或绿色类别,那么决定是接受还是推翻该决定,或者,如果扫描***决定是要将物品分配到“琥珀色”类别,那么决定是否输入该决定。工作站48具有使得用户能够向分拣装置40发送信号的用户输入49,该信号可被分拣装置识别为推翻扫描***的决定。如果推翻信号被分拣装置接收,那么分拣装置确实推翻扫描***的决定。如果没有接收到推翻信号,或者事实上如果从工作站接收到确认扫描***的决定的确认信号,那么分拣装置基于扫描***的决定对物品进行分拣。如果分拣***从扫描***接收与物品有关的“琥珀色”信号,那么它最初将该物品分配到要被放入红色通道的“红色”类别。但是,如果在它对物品进行分拣之前它从工作站接收到指示物品应处于“绿色”类别的输入信号,那么它将物品分类到绿色通道。
在图6的***的修改例中,分拣可以是完全自动的,使得处理***给出仅两种分拣输出“开释”和“不开释”中的一个,从而将物品分配到绿色通道或红色通道。对于处理***来说,也可以用一个阈值确定仅仅一个概率Pr(威胁),并根据该概率是否高于或低于阈值而将物品分配到两个类别中的一个。在这种情况下,分配仍是临时性的,并且操作员仍具有推翻自动分拣的选择权。在另一修改例中,在根本没有用户输入的情况下,使用扫描***的自动类别分配作为最终的分配。这提供了一种全自动分拣***。
在图6的***中,扫描速度与传输器速度匹配,使得可以按恒定的速度从装载区(在装载区处,行李被装载到传输器20上)穿过扫描***6移动行李,并将其移动到分拣装置40上。传输器20在扫描***6的出口和分拣装置40之间延伸距离L。在行李物品在传输器20上行进距离L的期间,操作员可观察被检查物品的图像数据以及由扫描***确定的初始类别分配,并且确认或拒绝RTT***的自动决定。一般来说,行李接着会被接受到开释通道上并向前传送以准备运输,或者被拒绝到不开释通道上以进行进一步的调查。
在该RTT多焦距***中,RTT扫描单元8能够按最高行李带速度操作,由此对于最佳的***操作来说不需要行李排队或其他转向机构。在诸如该***的集成***中,常规旋转源***的有限的吞吐能力是明显的约束。这往往意味着并行地放置多个常规的CT机,并使用复杂的行李处理***以将待检查物品切换到下一个可用的机器。通过图6的配置,可以避免这种复杂性。
参照图7,本发明的第二实施例包括冗余***,在该冗余***中,两个RTT扫描***70、72在同一传输器74上被串联地放置,使得如果使一个***退出服务,那么另一个可继续扫描行李。在任一种情况下,传输带74可在标准的操作带速度下继续穿过两个扫描***70、72。
参照图8a,在第三实施例中设置有并行地操作两个RTT***82、84的更复杂的冗余***。第一主进入传输器86将所有要被分拣的物品带到第一分拣装置88,该第一分拣装置88可将物品传送到两个另外的传输器90、92中的任一个上。这两个传输器90、92中的每一个都穿过将扫描物品并使得能够针对是否开释物品做出决定的扫描***82、84中的相应的一个。在两个传输器90、92中的每一个上设置有另一分拣装置94、96,该分拣装置94、96被配置为将行李分拣到用于向前传输的共用的‘绿色通道’传输器98上,或者在该物品未被开释的情况下将其分拣到‘红色通道’传输器100上,在该‘红色通道’传输器100上它可经受进一步的调查。在该配置中,可以按比RTT传输器速度高、一般达到该速度的两倍的速度运行输入传输器86和‘绿色通道’传输器。例如,在这种情况下,主进入传输器86和共用的‘绿色通道’传输器以1m/s的速度移动,而扫描传输器82、84以该速度的一半即0.5m/s的速度行进。当然,可以用更多的并行的RTT***来扩展该***,使得主进入传输器的速度与扫描仪传输器的速度之比等于或基本上等于并行的扫描仪的数量,尽管在大于约1m/s主传输器速度下分拣装置可能会变得不可靠。
参照图8b,在另一实施例中,行李分拣***包括许多RTT扫描仪81b、82b、83b,一般在一个***中达到约60个,每一个都与相应的检入台相关联。分拣装置84b、85b、86b与各个RTT扫描仪相关,并且行李在传输器上从各个RTT扫描仪被传输到其相关的分拣装置。每个分拣装置84b、85b、86b都响应于来自其扫描仪的信号将行李分拣到共用的开释通道传输器88b或共用的拒绝通道传输器87b。在拒绝通道传输器87b上设置有另一后备RTT扫描仪89b,该后备RTT扫描仪89b具有可将行李留在拒绝通道传输器87b上或将其传送到开释通道传输器88b的相关的分拣装置90b。
在正常的操作下,一次扫描仪81b、82b、83b中的每一个都对行李进行分拣,并且后备或冗余扫描仪89b对分拣到拒绝通道中的物品提供进一步的检查。如果该扫描仪确定行李物品代表没有或者足够低的威胁,那么它将该行李物品传送到开释通道。如果一次扫描仪中的一个不起作用或出现故障,那么其相关的分拣装置被配置为将来自该扫描仪的所有行李分拣到拒绝通道。然后,后备扫描仪89b扫描所有的这些行李并在开释通道和拒绝通道之间控制其分拣。这使得在故障扫描仪被维修或更换的同时所有的检入台都能够继续起作用。
参照图8c,在另一实施例中,来自检入台中的每一个的行李经由多个单独的传输器被传送到中央回路或环形传送带81c上,在该传送带81c上行李连续地循环。许多分拣装置82c、83c、84c分别被配置为将来自回路81c的行李物品传送到引导到相应RTT扫描仪85c、86c、87c的相应传输器。分拣装置82c、83c、84c被扫描仪控制以控制将行李物品馈送到扫描仪中的每一个的速率。从扫描仪起,传输器将所有的行李物品传送到引导到另一分拣装置89c的共用的出口传输器88c。通过所有的扫描仪对它进行控制以在开释通道90c和拒绝通道91c之间对行李物品中的每一个进行分拣。
为了跟踪各行李物品的移动,对每个物品都赋予6数字ID和当该物品第一次进入***时记录的其在传输带上的位置。扫描仪因此可识别在任意一个时刻正在扫描哪一件行李物品,并将扫描结果与适当的物品相关联。分拣装置因此还可识别各行李物品并基于它们的扫描结果对它们进行分拣。
配置本***中的扫描仪的数量和传输器的速度,使得如果扫描仪中的一个不起作用,那么剩余的扫描仪可处理从检入台正在被馈送到回路81c上的所有行李。
在本实施例的修改例中,选择哪些物品被传送到各个扫描仪的分拣装置82c、83c、84c不是由扫描仪控制的,而是分别被配置为选择来自回路81c的物品以按预定的速率将它们馈送到相应的扫描仪。
参照图9,根据另一实施例的网络化***包括三个与图6的扫描***类似的扫描***108和四个操作员工作站148。来自三个RTT扫描***108的视频图像输出通过相应的高带宽点对点视频链路与向冗余视频交换机110提供用于原始图像数据的瞬时存储器的实时盘阵列109连接。盘阵列109又与工作站148中的每一个连接。视频交换机110因此能够将从扫描***108中的每一个输出的原始视频图像从其临时存储器传送到工作站148中的任一个,在该工作站148中可以利用该原始视频图像来产生可离线观看的3维视频图像。来自扫描***的用于红色/绿色概率信号和自动分拣分配信号的输出与冗余的常规以太网交换机112连接,该以太网交换机112也与工作站中的每一个连接。以太网交换机被配置为将概率信号和分拣分配信号中的每一个切换到同一工作站148,作为相关联的视频信号。这允许将来自多个机器的图像数据与自动分配和赋予该分配的概率一起接到操作员工作站148组(bank)上,在该组中,操作员可监视行李检查***的执行并确定被赋以琥珀威胁等级的行李的目的地。
作为替代方案,一种网络化***包括与服务器连接的单个扫描***108和工作站148。来自扫描***108的视频图像输出与为原始图像数据提供瞬时存储器的实时盘阵列109连接。盘阵列109又与工作站148连接。将概率信号和分配信号输出与要***作员监视的相关视频图像输出一起被发送到工作站148。网络化的单个扫描***可以是具有多个扫描***的网络化***的一部分。
参照图10和图11,在另一实施例中,联机(in-line)扫描仪具有刚好与主散射防护罩162一样长的传输带160。在这种独立式***配置中,用于检查的物品被放置到传输带160上,并且该物品被装载到***中。然后通过扫描仪机器164扫描物品并产生图像。在常规***中,在物体中的选择的平面的计算断层摄影放映之前,常常用简单传送X射线***对物品进行预放映,以识别可能的威胁区域。这种应用只用于实时多焦距***。这里,不使用预放映并且将获得整个物品的真实三维图像。
在一些实施例中,多焦距X射线源中的源点的轨迹将在仅180度加上扇形射束角度(一般在40~90度的范围内)的角度范围上的弧中延伸。有利的是,选择离散的源点的数量以满足Nyquist采样定理。在一些实施例中,如图1的实施例那样,使用完整的360度环的源点。在这种情况下,对于给定的扫描速率,每个源点的停留时间增加,超过180+扇形射束配置,并且这在改善重构图像信噪比的方面是有利的。
图1的扫描仪***是集成扫描仪***,这是因为,在具有扫描***8和遮蔽罩22的单元中容纳有控制、处理、电源和冷却单元18、30、32、34。参照图12,在另一实施例中设置有模块化***,在该模块化***中,控制、处理、电源和冷却架218、230、232、234中的一些或全部被定位为远离包含多焦距X射线源和传感器阵列的扫描单元208。有利的是使用模块化设计以便于安装,这在行李处理大厅环境中尤其有利,在该环境中,***可被悬挂于天花板上或处于访问受限的区域。作为替代方案,整个***可被配置为具有共同位于单个外壳内的多个子组件单元的集成单元。
在包括图1的实施例在内的一些实施例中,使用单个X射线检测器环。即使在较高的图像扫描速率下用简单扇形射束图像重构算法构建和提供足够的信噪性能也是较为便宜的。在其他的实施例中(特别是对于较大的图像重构圆直径),优选的是使用多环传感器阵列,该多环传感器阵列具有沿***的偏离源的轴隔开的、彼此相邻布置的多个圆形或部分圆形的传感器组。这使得能够在处理***中使用更复杂的锥束图像重构算法。使用多环传感器会增加每个源点的停留时间,得到更大的积分信号大小并因此导致重构图像的信噪比的改善。
使用基于多焦距X射线源的计算断层摄影***的上述实施例的设计的中心是放射源的旋转角速度和穿过扫描仪的传输器***的速度之间的关系。在传输器静止的极限情况下,重构的图像切片的厚度完全由X射线焦距的大小和X射线检测器阵列的各元件的面积来确定。随着传输器速度从零增加,被检查物体将在X射线射束的旋转过程中穿过成像切片,并且,将沿切片厚度的方向在重构的图像中引入附加的模糊。在理想情况下,与传输器速度相比X射线源旋转将较快,使得沿切片厚度方向的模糊将被最小化。
出于对被检查物品中的威胁材料和物体的高概率检测的目的,用于行李检查的基于多焦距X射线源的计算断层摄影***提供了良好的放射源旋转角速度与传输器线速度之比。作为示例,在图1的实施例中,如在机场***中常见的那样,传输器速度为0.5m/s。放射源可实现每秒围绕传输器240次源旋转,因此被检查物体在扫描过程中将穿过成像切片移动2.08mm的距离。在具有每秒4转的源旋转的常规***中,被检查物体在相同的带速度下将在扫描过程中穿过成像切片移动62.5mm的距离。
用于检测威胁材料的检查***的主要目的是精确地检测威胁材料的存在并且在没有嫌疑时放过所有其他材料。在扫描过程中由于传输器移动而导致的沿切片方向的模糊越大,则重构图像像素中的部分体积人为现象(artefact)越大并且重构的图像密度越不精确。重构的图像密度的精度越差,则***越有可能对非威胁材料给出警报而不对真正的威胁材料发出警报。因此,与常规的机械旋转的X射线***相比,基于多焦距X射线源技术的实时断层摄影(RTT)***可以在较高的传输器速度下提供显著增强的威胁检测能力。
由于在多焦距X射线源中使用扩展的弓形阳极,因此可以对电子源进行开关,使得它在阳极的全长度上跳跃,而不是依次进行扫描以仿效在常规计算断层摄影***中观察到的机械旋转。有利的是,为了使阳极上的瞬时热负载最小化,X射线焦距将被开关以使当前的阳极辐射位置到所有以前的辐射位置的距离最大化。在使由于传输器移动导致的部分体积效应最小化从而进一步改善重构的像素精度的过程中,X射线发射点的这种瞬时展开是有利的。
RTT***的较高的时间分辨率允许在自动威胁检测中实现较高的精度水平。通过这种较高的精度水平,可以在无人看管的模式中操作RTT***,从而产生简单的两状态输出指示,一种状态与绿色或开释分配对应,另一种与红色或不开释分配对应。绿袋被开释用于向前传输。红袋代表较高的威胁水平,并且应与乘客协调并禁止该乘客旅行。
现在将说明本发明的其他实施例,在这些实施例中,与X射线的散射有关的数据以及与被透射的X射线有关的数据被记录并用于分析所扫描的行李物品。
参照图13,当X射线的射束300穿过物体302时,X射线中的一些直接透过它并离开物体,该物体沿与这些X射线进入物体的方向相同的方向行进。X射线中的一些按散射角θ被散射,散射角θ是它们进入物体的方向与它们离开物体的方向之差。众所周知,会发生两种类型的散射:集中在5°、一般为4~6°的散射角周围的相干或布拉格散射,和X射线按更大的角度散射的非相干或康普顿散射。布拉格散射随着物体的原子序数线性增加并且服从下式:
nλ=2dsinθ
其中,
n是整数
λ是X射线的波长
d是物体中的原子间距离。
因此,布拉格散射的量给出了关于物体的原子结构的信息。但是,它不随着原子序数而平滑地变化。
康普顿散射的量依赖于物体的电子密度并随其平滑地变化,因此,较大的散射角度下的散射量给出了关于物体的电子密度的信息,并由此给出了关于其原子序数的信息。
参照图14,根据本发明的另一实施例的安全扫描***包括与图1中的相同的多焦距X射线源410,和同样与图1中的相同的圆形检测器阵列412和传输器420。但是,在本实施例中,***包括另一圆筒检测器阵列422,该圆筒检测器阵列422以与圆形检测器阵列412相同的半径在传输器周围延伸,但沿轴向处于放射源410的另一侧。虽然圆形检测器阵列被配置为检测透过物体426的X射线,但圆筒检测器阵列422被配置为检测在物体中散射的X射线。散射检测器阵列422由检测器的大量的圆形阵列或环422a、422b构成,并且各个环中的检测器在传输器周围均等地隔开,使得它们被配置成沿扫描仪的轴向延伸的许多直行。
散射检测器阵列422中的检测器是能量分辨检测器,使得与各个检测器的各X射线交互作用会产生指示X射线的能量的检测器输出。可以由诸如GaAs、HgI、CdZnTe或CdTe的宽带隙III-V或II-IV半导体材料、诸如Ge的窄带隙半导体或诸如具有光电倍增管读出器的NaI(Ti)的复合闪烁检测器制造这些检测器。
参照图15,在散射检测器422的前面设置有准直器428。准直器428提供了障碍,该障碍防止X射线到达各个检测器,除非X射线来自特定的接收方向。从图16可以看出,对于阵列422中的各个检测器,接收方向穿过扫描仪的中心纵轴X-X。但是,从图15可以看出,接收方向不与轴X-X垂直,而是沿向着放射源410的方向以约5°的角度向检测器环422a、422b的平面倾斜。
参照图15,可以理解,入射到阵列422的检测器中的任一个上的X射线一定是从位于X射线射束的路径和从检测器422起的接收方向的线上的较薄的成像体积内的相应的小子体积散射出来的。对于任何相干散射的X射线,检测到它的检测器的轴向位置将由到发生散射的活动X射线源点的距离来确定。沿轴向最接近放射源410的检测器将检测从活动的X射线源点起散射得最远的X射线。例如,从最接近活动的X射线源点410a的点x散射的X射线将被距放射源410比从点z(其距活动的X射线源点更远)起散射的X射线远的检测器检测。因此,在任何一个时刻,当活动的X射线源点可被识别时,检测到散射的X射线的检测器的轴向位置可用于确定沿X射线射束方向的散射位置。
从图15还可理解,为了使***工作,很重要的是,应沿扫描仪的轴向很窄地聚焦X射线射束。射束沿横向的展开(即沿横向使用扇形射束展开)仍将允许相干散射事件的这种定位。
参照图16,由于准直器428对准扫描仪的轴,因此,经受相干散射的来自活动的源点410a的X射线将仅被位于扫描仪轴的与活动的源点相对的一侧的检测器行422a检测到,并且,根据准直器在多窄的程度上被聚焦,可能被在任一侧接近它的行中的一个或更多个行检测到。如果X射线被限定为又直又窄的“笔形”射束,那么,由于按较大角度非相干地散射的任何X射线将被准直器428截止,因此根本检测不到任何这种X射线。图16中的箭头‘a’示出了这种X射线的示例。但是,如果从活动的源点410a产生沿与扫描仪轴垂直的方向透过成像体积切片展开的X射线的扇形射束,那么指向进一步远离扫描仪轴的X射线可经受非相干散射并到达与活动的源点相对的行422a的任一侧的检测器。箭头b和c示出了这些X射线的示例。应当注意,为了到达任意检测器422b,必须在穿过扫描仪轴和该检测器422b的平面上发生散射事件。这意味着,对于给定的活动源点和特定的检测器,被检测的X射线的散射事件的位置可被识别为位于穿过扫描仪轴和该检测器的平面上。如果要确定散射事件的确切位置,那么需要其他的信息。例如,如果关于成像体积内的物体的位置的信息是可从例如断层摄影成像数据得到的,那么,如下面更详细地说明的那样,散射可与最可能的物体相关。
由布拉格散射数据,对于各个检测的散射事件,X射线能量和散射角度的组合可用于确定其中发生了散射事件的材料的原子间距离d。实际上,可以假定散射角度为常数,并且使用能量来区分不同的材料。对于康普顿散射,来自散射体积的各个体积的散射的水平给出该体积中的材料的密度的指示。也可确定康普顿散射与相干散射之比并将其用作表征成像物体的材料的另一参数。
由于用于各个X射线源点的较短的停留时间,因此各个源点的检测到的散射X射线的数量总是非常少,一般少于五条。为了形成合理的相干散射信号,必须收集断层摄影扫描内的所有源点的散射数据,然后累积成像体积的各个子体积的结果。对于具有500个源点的扫描仪和每次扫描每个子体积一个相干衍射散射结果的平均值,那么,在累积一组数据之后,每个子体积将具有与其相关的与该子体积内的500个散射事件对应的500个结果。典型的子体积在成像平面内占有几平方厘米的面积,体积厚度为几毫米。
现在参照图17,被配置为累积来自图14~16的扫描仪的散射检测器阵列422的数据的数据采集***包括与检测器422中的每一个相关的多通道分析器(MCA)500。各MCA 500被配置为接收来自检测器的输出信号,并向大量的X射线能量范围或通道中的一个分配检测的各X射线,并输出指示检测的X射线落入的能量范围的信号。多路复用器502被配置为接收来自MCA 500中的每一个的输出。还提供其中具有多个条目的查找表504,这些条目对于给定的源点和检测器识别其中散射了X射线的成像体积内的子体积。该***还包括包含大量的存储区508的图像存储器506,这些存储区508中的每一个都与扫描仪成像平面内的各个子体积相关。
在查找表504的指导下由多路复用器502自动地将数据加载到各个存储区508中。查找表在扫描之前装载有将检测器422和MCA 500的各个组合映射到相应的图像位置508的系数,每个X射线源位置一个查找表条目。处于正向(即基本上处于光子在任何交互作用之前从放射源起行进的方向)的那些像素(即检测器422)被假定为以约4~6度的小射束角度记录相干散射光子。不处于正向的那些像素422被假定为记录由于康普顿散射效应导致的非相干散射光子。由此,图像存储器506实际上是“三维的”-两个维度代表图像中的位置,而第三维度保持用于相干散射(低8位)和非相干散射(高8位)的散射能谱。查找表504还将关于在每次投影时为各个MCA 500收集的数据类型指示多路复用器502,使得填充适当的存储器空间。
一旦已对于给定的扫描收集了散射数据,就将数据传送到以上参照图4说明的主RTT数据采集***512,并且由投影定序器510使该数据与主RTT数据采集***512同步。由此,重构的图像数据和散射数据被同时传递到威胁检测***,该威胁检测***可使用它来确定适当的分析用参数。
对于每次扫描,来自透射检测器412的断层摄影图像数据会产生与图像的各个像素的X射线衰减有关的数据,该数据又与断层摄影成像体积的相应子体积对应。如以上参照图4说明的那样获得该数据。来自散射检测器422的数据如上所述的那样提供了与各子体积内的相干散射的量有关的数据和与各子体积内的非相干散射的量有关的数据。因此可在与图5的威胁检测处理器类似的威胁检测处理器中分析该数据。在这种情况下,提取的数据的参数可与图像数据或散射数据或两种或更多种类型的数据的组合有关。从数据提取的参数的示例是相干散射与非相干散射之比、从相干散射数据确定的材料类型、从非相干散射数据确定的材料密度、CT图像像素值与散射数据的相关关系。并且,还可确定与以上对于透射数据说明的参数对应的散射数据参数。
参照图18,在本发明的另一实施例中,用于产生断层摄影图像数据的透射检测器512被配置为在不同的能量范围上测量X射线透射。通过具有分别形成围绕传输器的环的两组检测器512a、512b来实现这一点。这两个组沿传输器的行进方向位于不同的轴向位置,在本情况下,这两个组沿轴向彼此相邻。第一组512a在其前面没有滤波器,但第二组512b具有位于它和X射线源510之间的金属滤波器513。第一组检测器512a因此在较宽的能量范围上检测透过的X射线,而第二组512b仅在该范围的处于高能量端的较窄的一部分中检测X射线。
随着要被扫描的物品沿传输器移动,可使用第一组检测器512a将其各个薄体积或切片扫描一次,然后使用第二组512b再次扫描。在示出的实施例中,使用同一放射源510同时扫描两个相邻的体积,使得通过检测器组512a、512b中的相应的一个收集这两个体积中的每一个的数据。在物品的体积经过两组检测器并被扫描两次之后,可使用两个不同的X射线能量范围形成两组图像数据,每个图像包含图像的各个像素的透射数据(并由此包含衰减数据)。可通过从第一检测器组512b的图像数据减去第二检测器组512a的图像数据,将这两组图像数据组合起来,得到低能量X射线分量的相应的图像数据。
可对于图像的各个像素记录各单个能量范围的X射线透射数据和诸如高能量和低能量的两个不同范围的数据之间的差异。然后可利用该数据来提高CT图像的精度。还可将其用作威胁检测算法中的另一参数。
可以理解,可以使用其他的方法以获得不同范围的X射线能量的透射数据。在图18和图19的***的修改例中,可以在两个检测器组上使用衡消滤波器。选择滤波器,使得存在被它们双方穿过的窄的能量窗口。然后可组合两组检测器的图像数据以获得该窄的能量窗口的透射数据。这使得能够获得化学特定成像。例如,可以通过使用在钙K边缘能量周围衡消的滤波器产生骨特定图像。很显然,可以在威胁检测算法中有效地使用该化学特定数据。
在另一实施例中,不使用各个单独的滤波器,而使用对于不同能量X射线敏感的两组检测器。在这种情况下,使用层叠的检测器,这些检测器包括对低能量X射线敏感而允许较高能量X射线穿过的薄的前检测器,和对于穿过前检测器的高能量X射线敏感的厚的后检测器。同样,可以使用不同能量范围的衰减数据以提供能量特定图像数据。
在另一实施例中,用通过在X射线源中使用例如160kV和100kV的不同的管电压实现的两种不同的X射线射束能量对物体的各个切片进行两次扫描。不同的能量会得到彼此相对偏移的X射线能谱。由于能谱在一部分能量范围上是相对平坦的,因此能谱在该范围的许多部分上是类似的。但是,能谱的一部分将显著变化。因此,可以使用两种管电压的比较图像以识别在这两幅图像之间衰减显著变化的物体部分。这因此在在图像之间发生变化的窄能谱部分中识别具有高衰减的图像区。这因此是获得被扫描体积内的子体积中的每一个的能量特定衰减数据的替代性方式。
参照图20,在本发明的另一实施例中,通过在具有两种不同的材料的目标区602、604的X射线管中设置阳极600,产生两种不同的X射线能谱。在这种情况下,例如,阳极包含具有一个钨目标区602和一个铀目标区604的铜基606。电子源610具有可被单独地激活的大量的源点612。在电子束616的路径的相对侧设置有一对电极612、614,该电极612、614可被控制为打开和切断电场以控制电子束的路径,使得它撞击目标区602、604中的一个或另一个。在阳极上产生的X射线的能谱将根据电子束616撞击到目标区中的哪一个上而改变。
本实施例使用与图1a的X射线源类似的X射线源,不同的目标区形成为沿阳极27延伸的平行条带。对于各个活动的电子源点,根据使用哪种目标材料,可以产生两种不同的X射线谱。放射源可被配置为在其活动时在各电子源点的两个目标区之间切换。作为替代方案,可以执行沿阳极27的扫描两次,一次针对一种目标材料,一次针对另一种。在任一种情况下,可能需要另外的电子束聚焦导线以确保电子束一次只照射一个或另一个目标材料。
根据从阳极提取X射线射束的角度,来自两个目标区602、604的射束在一些情况下可被配置为穿过同一成像体积并被共用的检测器阵列检测。作为替代方案,它们可被配置为穿过成像体积的相邻的切片并被各个单独的检测器阵列检测。在这种情况下,可以按与图18的配置类似的方式在物品连同传输器一起经过时扫描成像物品的各个部分两次。
参照图21,在还一实施例中,在单个扫描仪中设置在轴向上彼此相邻的两个检测器阵列,一个检测器阵列710与图1的检测器阵列对应并被配置为形成RTT图像,另一个检测器阵列712具有更高的分辨率并被配置为产生被扫描物体的高分辨率投影图像。在本实施例中,高分辨率检测器阵列712包括两个平行的线性阵列714、716,这两个线性阵列714、716中的每一个被配置为检测不同的能量的X射线,使得可以产生双重能量投影图像。在图22的实施例中,高分辨率阵列812包括两个层叠的阵列,即,位于上方的被配置为检测较低能量X射线而对较高能量X射线透明的薄阵列,和位于下方的被配置为检测较高能量X射线的较厚阵列。在两种情况下,两个检测器阵列均被配置为沿轴向足够靠近,以能够检测来自源点的单个线性阵列的X射线。
为了提供投影图像,当只有一个源点活动时,需要从高分辨率阵列712、812中的所有检测器捕获数据。参照图23,为了实现这一点,高分辨率阵列中的各个检测器718、818与积分器750连接。积分器包括与电容器754并联的放大器752。在检测器718和放大器752之间设置输入开关756,在放大器的输入端子两端设置复位开关758,在电容器754两端连接另一复位开关759,并且在积分器和模数转换器ADC之间设置多路复用开关760。
在操作中,当不需要检测器718活动时,关闭除多路复用开关760以外的所有开关。这确保电容器754不被充电并保持原样。然后,在要求检测器收集数据的时段的开始时,关闭两个复位开关758、759,使得由检测器718检测的任何X射线将导致电容器754上的电荷的增加,这会得到来自检测器718的信号的积分。当用于数据采集的时段结束时,打开输入开关756,使得电容器将保持充电。然后,为了从积分器读取积分信号,关闭输出开关760以将积分器与ADC连接。这样向ADC提供了模拟信号,该模拟信号由电容器754上的电荷的电平来确定,并因此指示检测器718在与积分器连接的时段期间检测到的X射线的数量。ADC然后将该模拟信号转换成用于输入到数据采集***的数字信号。为了产生单幅投影图像,当X射线源点中的一个活动时,使用所有的高分辨率检测器以同时收集数据。
参照图24,在另一实施例中,各个检测器718与并联的两个积分器750a、750b连接,这两个积分器750a、750b中的每一个与图23的积分器相同。来自这两个积分器的输出经由它们的输出开关760a、760b与ADC连接。这使得各个积分器能够被配置为在X射线源的扫描中在不同的点上积分来自检测器718的信号,并因此收集单独的图像的数据,这两幅图像通过不同的X射线源点来自不同的角度。例如,可以使用它以从正交方向产生多幅投影图像,这些投影图像可用于构建高分辨率3维图像的,由该高分辨率3维图像,可在三个维度中确定被成像包裹中的特征的位置。
由于高分辨率图像可帮助识别诸如细丝的需要较高分辨率的物品,因此当它与RTT图像组合时可以是有用的。

Claims (6)

1.一种具有中心纵轴的X射线扫描***,包括:
被配置为从扫描区域周围的多个X射线源位置产生X射线、并沿与中心纵轴垂直的方向穿过扫描区域发送产生的X射线的X射线源;
被配置为在围绕中心纵轴的圆形阵列中对发送的X射线进行检测的第一组检测器;
被配置为在围绕中心纵轴的圆筒阵列中对在扫描区域内散射的X射线进行检测的第二组检测器;
被配置为防止散射的X射线到达第二组检测器中的每一个除非X射线来自接收方向的准直器,其中,接收方向穿过中心纵轴并不与中心纵轴垂直,和
处理装置,该处理装置被配置为:
处理来自第一组检测器的输出以产生限定扫描区域的图像的图像数据,
分析图像数据以识别图像内的物体,
处理来自第二组检测器的输出以产生散射数据,
从检测到散射的X射线的检测器的轴向位置和在扫描区域中引导X射线的方向确定散射的位置,以及
将散射数据的多个部分与物体相关联。
2.根据权利要求1所述的***,其中,处理装置被配置为从散射数据确定来自扫描区域内的不同位置的散射的水平的度量。
3.根据权利要求2所述的***,其中,散射是相干散射。
4.根据权利要求1或权利要求2所述的***,其中,散射是非相干散射。
5.根据权利要求1或权利要求2所述的***,其中,处理装置被配置为从图像数据确定对散射的X射线已发生散射的位置的指示。
6.根据权利要求1或权利要求2所述的***,其中,处理装置被配置为限定图像内的多个像素、将像素中的至少一个识别为与图像内的物体相关联,并将散射数据的多个部分与相应像素相关联。
CN201110114520.1A 2005-12-16 2006-12-15 X射线断层摄影检查*** Expired - Fee Related CN102289000B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0525593.0A GB0525593D0 (en) 2005-12-16 2005-12-16 X-ray tomography inspection systems
GB0525593.0 2005-12-16

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN2006800514884A Division CN101400992B (zh) 2005-12-16 2006-12-15 X射线断层摄影检查***

Publications (2)

Publication Number Publication Date
CN102289000A CN102289000A (zh) 2011-12-21
CN102289000B true CN102289000B (zh) 2014-07-09

Family

ID=35736226

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201110114520.1A Expired - Fee Related CN102289000B (zh) 2005-12-16 2006-12-15 X射线断层摄影检查***
CN2006800514884A Expired - Fee Related CN101400992B (zh) 2005-12-16 2006-12-15 X射线断层摄影检查***

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN2006800514884A Expired - Fee Related CN101400992B (zh) 2005-12-16 2006-12-15 X射线断层摄影检查***

Country Status (8)

Country Link
US (7) US7876879B2 (zh)
EP (3) EP2017605B1 (zh)
JP (3) JP5537031B2 (zh)
CN (2) CN102289000B (zh)
ES (2) ES2769530T3 (zh)
GB (4) GB0525593D0 (zh)
PL (2) PL2017605T3 (zh)
WO (1) WO2007068933A1 (zh)

Families Citing this family (133)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US8804899B2 (en) 2003-04-25 2014-08-12 Rapiscan Systems, Inc. Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners
US7949101B2 (en) 2005-12-16 2011-05-24 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US10483077B2 (en) 2003-04-25 2019-11-19 Rapiscan Systems, Inc. X-ray sources having reduced electron scattering
US8451974B2 (en) * 2003-04-25 2013-05-28 Rapiscan Systems, Inc. X-ray tomographic inspection system for the identification of specific target items
GB0525593D0 (en) 2005-12-16 2006-01-25 Cxr Ltd X-ray tomography inspection systems
GB0812864D0 (en) 2008-07-15 2008-08-20 Cxr Ltd Coolign anode
US8243876B2 (en) 2003-04-25 2012-08-14 Rapiscan Systems, Inc. X-ray scanners
US9113839B2 (en) 2003-04-25 2015-08-25 Rapiscon Systems, Inc. X-ray inspection system and method
GB0903198D0 (en) * 2009-02-25 2009-04-08 Cxr Ltd X-Ray scanners
US8223919B2 (en) 2003-04-25 2012-07-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
US8837669B2 (en) 2003-04-25 2014-09-16 Rapiscan Systems, Inc. X-ray scanning system
US9208988B2 (en) 2005-10-25 2015-12-08 Rapiscan Systems, Inc. Graphite backscattered electron shield for use in an X-ray tube
US6928141B2 (en) 2003-06-20 2005-08-09 Rapiscan, Inc. Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
US9046465B2 (en) 2011-02-24 2015-06-02 Rapiscan Systems, Inc. Optimization of the source firing pattern for X-ray scanning systems
US7526064B2 (en) 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
CA2666838C (en) 2006-09-18 2010-12-07 Optosecurity Inc. Method and apparatus for assessing characteristics of liquids
CA2690163C (en) * 2006-10-02 2011-08-02 Optosecurity Inc. Method, apparatus and system for use in assessing the threat status of an article at a security check point
NL1033178C2 (nl) * 2007-01-05 2008-07-11 Scarabee Id B V Bagage-afgiftesysteem.
US7693261B2 (en) * 2007-05-17 2010-04-06 Durham Scientific Crystals Limited Method and apparatus for inspection of materials
JP2009008441A (ja) * 2007-06-26 2009-01-15 Ihi Corp 半固定式物質同定装置および方法
WO2009043145A1 (en) * 2007-10-01 2009-04-09 Optosecurity Inc. Method and devices for assessing the threat status of an article at a security check point
CN101403711B (zh) 2007-10-05 2013-06-19 清华大学 液态物品检查方法和设备
CN101403710B (zh) * 2007-10-05 2013-06-19 清华大学 液态物品检查方法和设备
CN101424648B (zh) * 2007-10-30 2012-10-03 清华大学 检查***和检查方法
CN101470082B (zh) * 2007-12-27 2011-03-30 同方威视技术股份有限公司 物品检测装置及其检测方法
US8086347B2 (en) * 2008-01-22 2011-12-27 Walgreen Co. Targeted product distribution system and method
GB0803640D0 (en) 2008-02-28 2008-04-02 Rapiscan Security Products Inc Scanning systems
GB0803641D0 (en) 2008-02-28 2008-04-02 Rapiscan Security Products Inc Scanning systems
WO2009127353A1 (de) * 2008-04-18 2009-10-22 Smiths Heimann Verfahren und vorrichtung zur detektion eines bestimmten materials in einem objekt mittels elektromagnetischer strahlen
GB0809110D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Gantry scanner systems
GB0809107D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Scannign systems
GB0809109D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Scanner systems
US8963094B2 (en) 2008-06-11 2015-02-24 Rapiscan Systems, Inc. Composite gamma-neutron detection system
GB0810638D0 (en) 2008-06-11 2008-07-16 Rapiscan Security Products Inc Photomultiplier and detection systems
WO2010025539A1 (en) * 2008-09-05 2010-03-11 Optosecurity Inc. Method and system for performing x-ray inspection of a liquid product at a security checkpoint
US7835495B2 (en) 2008-10-31 2010-11-16 Morpho Detection, Inc. System and method for X-ray diffraction imaging
GB0901338D0 (en) 2009-01-28 2009-03-11 Cxr Ltd X-Ray tube electron sources
US9202961B2 (en) * 2009-02-02 2015-12-01 Redlen Technologies Imaging devices with solid-state radiation detector with improved sensitivity
WO2010091493A1 (en) * 2009-02-10 2010-08-19 Optosecurity Inc. Method and system for performing x-ray inspection of a product at a security checkpoint using simulation
US7756249B1 (en) 2009-02-19 2010-07-13 Morpho Detection, Inc. Compact multi-focus x-ray source, x-ray diffraction imaging system, and method for fabricating compact multi-focus x-ray source
US8180138B2 (en) * 2009-03-23 2012-05-15 Morpho Detection, Inc. Method and system for inspection of containers
US9310323B2 (en) 2009-05-16 2016-04-12 Rapiscan Systems, Inc. Systems and methods for high-Z threat alarm resolution
GB2501023B (en) * 2009-05-26 2014-02-12 Rapiscan Systems Inc X-ray tomographic inspection systems for the identification of specific target items
EP3686901A1 (en) * 2009-05-26 2020-07-29 Rapiscan Systems, Inc. X-ray tomographic inspection method
JP5843759B2 (ja) * 2009-05-26 2016-01-13 ラピスカン システムズ、インコーポレイテッド 高データ速度断層撮影x線スキャナ用のイメージング、データ獲得、データ伝送及びデータ配信のためのシステム
EP2443441B8 (en) 2009-06-15 2017-11-22 Optosecurity Inc. Method and apparatus for assessing the threat status of luggage
RU2544388C2 (ru) * 2009-06-18 2015-03-20 Конинклейке Филипс Электроникс Н.В. Создание оптимальных энергетических окон для рассеянных событий при формировании радионуклидных изображений
EP2459990A4 (en) 2009-07-31 2017-08-09 Optosecurity Inc. Method and system for identifying a liquid product in luggage or other receptacle
US9442213B2 (en) 2010-01-19 2016-09-13 Rapiscan Systems, Inc. Method of electron beam transport in an X-ray scanner
CN102804326B (zh) * 2010-01-19 2016-01-20 拉皮斯坎***股份有限公司 多视图货物扫描器
US20110188632A1 (en) * 2010-02-03 2011-08-04 Geoffrey Harding Multiple plane multi-inverse fan-beam detection systems and method for using the same
WO2011106332A2 (en) 2010-02-23 2011-09-01 Rapiscan Systems, Inc. Simultaneous image distribution and archiving
US8713131B2 (en) 2010-02-23 2014-04-29 RHPiscan Systems, Inc. Simultaneous image distribution and archiving
GB201010233D0 (en) 2010-06-18 2010-07-21 Univ Nottingham Trent Improvements in or relating to sample analysis
JP5765913B2 (ja) * 2010-10-14 2015-08-19 株式会社東芝 医用画像診断装置及び医用画像処理方法
US8660226B2 (en) 2011-01-19 2014-02-25 General Electric Company Systems and methods for multichannel noise reduction
PL3270185T3 (pl) 2011-02-08 2023-06-12 Rapiscan Systems, Inc. Niejawny nadzór z wykorzystaniem wielomodalnościowego wykrywania
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
KR101973221B1 (ko) 2011-09-07 2019-04-26 라피스캔 시스템스, 인코포레이티드 적하목록 데이터를 이미징/검출 프로세싱에 통합시키는 x-선 검사시스템
DE112012004856B4 (de) 2011-11-22 2022-01-05 The University Of North Carolina At Chapel Hill Kontrollsystem und Verfahren zur schnellen, platzsparenden Röntgentomografiekontrolle
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
DE102012005767A1 (de) * 2012-03-25 2013-09-26 DüRR DENTAL AG Phasenkontrast-Röntgen-Tomographiegerät
CN104486997B (zh) * 2012-06-05 2017-07-25 拉皮斯坎***股份有限公司 X射线扫描***的射线源激发模式的最佳化
CN103674979B (zh) * 2012-09-19 2016-12-21 同方威视技术股份有限公司 一种行李物品ct安检***及其探测器装置
US20140175289A1 (en) * 2012-12-21 2014-06-26 R. John Voorhees Conveyer Belt with Optically Visible and Machine-Detectable Indicators
CN103901488A (zh) * 2012-12-27 2014-07-02 同方威视技术股份有限公司 固定式ct装置
CN103901493B (zh) * 2012-12-27 2016-12-28 同方威视技术股份有限公司 一种无机架ct装置
US9183261B2 (en) 2012-12-28 2015-11-10 Shutterstock, Inc. Lexicon based systems and methods for intelligent media search
US9183215B2 (en) 2012-12-29 2015-11-10 Shutterstock, Inc. Mosaic display systems and methods for intelligent media search
CN103076350A (zh) * 2013-01-04 2013-05-01 公安部第一研究所 一种移动背散射x射线安全检查方法及装置
WO2014121097A1 (en) 2013-01-31 2014-08-07 Rapiscan Systems, Inc. Portable security inspection system
CA2919159A1 (en) 2013-07-23 2015-01-29 Rapiscan Systems, Inc. Methods for improving processing speed for object inspection
EP3025148A1 (en) * 2013-07-25 2016-06-01 Analogic Corporation Generation of diffraction signature of item within object
KR102207643B1 (ko) 2013-08-09 2021-01-25 고쿠리쓰다이가쿠호진 규슈다이가쿠 유기 금속 착물, 발광 재료, 지연 형광체 및 유기 발광 소자
CN103499593A (zh) * 2013-09-23 2014-01-08 深圳先进技术研究院 一种计算机断层扫描***
CN103611687A (zh) * 2013-11-27 2014-03-05 南通芯迎设计服务有限公司 一种具有安全检查功能的包裹自动分类通知装置
US9557427B2 (en) 2014-01-08 2017-01-31 Rapiscan Systems, Inc. Thin gap chamber neutron detectors
CN103808741A (zh) * 2014-03-07 2014-05-21 黄善花 一种行李安全检查机及其检查方法
CN105785462B (zh) * 2014-06-25 2019-02-22 同方威视技术股份有限公司 一种定位三维ct图像中的目标的方法和安检ct***
WO2016003547A1 (en) 2014-06-30 2016-01-07 American Science And Engineering, Inc. Rapidly relocatable modular cargo container scanner
FR3023001A1 (fr) 2014-06-30 2016-01-01 Commissariat Energie Atomique Procede d'analyse d'un objet en deux temps utilisant un rayonnement en transmission puis un spectre en diffusion.
CA2973721A1 (en) * 2015-01-16 2016-07-21 Rapiscan Systems, Inc. Non-intrusive inspection systems and methods for the detection of materials of interest
MX2017009342A (es) 2015-01-20 2017-11-17 American Science & Eng Inc Punto focal dinamicamente ajustable.
PL3271709T3 (pl) 2015-03-20 2023-02-20 Rapiscan Systems, Inc. Ręczny przenośny system kontroli rozpraszania wstecznego
WO2017011057A2 (en) * 2015-04-27 2017-01-19 GREEN, Christopher, K. Four plane x-ray inspection system
US10345479B2 (en) 2015-09-16 2019-07-09 Rapiscan Systems, Inc. Portable X-ray scanner
JP6654397B2 (ja) * 2015-10-09 2020-02-26 株式会社イシダ X線検査装置
WO2017114267A1 (zh) * 2015-12-29 2017-07-06 上海联影医疗科技有限公司 一种医疗设备的数据采集***及其配置方法
GB2564038B (en) 2016-02-22 2021-11-10 Rapiscan Systems Inc Systems and methods for detecting threats and contraband in cargo
CN110199209B (zh) 2016-07-28 2021-07-30 德国史密斯海曼简化股份公司 散射成像
GB2555564B (en) * 2016-07-28 2020-09-09 Smiths Heimann Sas Scatter imaging
US20180038807A1 (en) * 2016-08-08 2018-02-08 Adaptix Ltd. Method and system for reconstructing 3-dimensional images from spatially and temporally overlapping x-rays
WO2018144630A1 (en) 2017-01-31 2018-08-09 Rapiscan Systems, Inc. High-power x-ray sources and methods of operation
WO2018195016A1 (en) 2017-04-17 2018-10-25 Rapiscan Systems, Inc. X-ray tomography inspection systems and methods
US10987071B2 (en) * 2017-06-29 2021-04-27 University Of Delaware Pixelated K-edge coded aperture system for compressive spectral X-ray imaging
CN109420623A (zh) * 2017-08-31 2019-03-05 无锡日联科技股份有限公司 一种应用于贝壳的全自动x射线检测、分拣***
US10585206B2 (en) 2017-09-06 2020-03-10 Rapiscan Systems, Inc. Method and system for a multi-view scanner
EP3530360A1 (de) * 2018-02-21 2019-08-28 Siemens Aktiengesellschaft Erkennung von nicht förderfähigen sendungen
US20190346379A1 (en) * 2018-05-10 2019-11-14 Voti Inc. X-ray screening system and method
US10845491B2 (en) 2018-06-04 2020-11-24 Sigray, Inc. Energy-resolving x-ray detection system
WO2019245636A1 (en) 2018-06-20 2019-12-26 American Science And Engineering, Inc. Wavelength-shifting sheet-coupled scintillation detectors
CN112154322A (zh) * 2018-06-27 2020-12-29 东丽株式会社 放射线透过检查方法和装置、以及微多孔膜的制造方法
CN108614303A (zh) * 2018-07-12 2018-10-02 同方威视技术股份有限公司 安全检查设备的屏蔽结构及安全检查通道
GB2591630B (en) 2018-07-26 2023-05-24 Sigray Inc High brightness x-ray reflection source
JP6632674B1 (ja) * 2018-09-06 2020-01-22 株式会社東芝 検査装置及び検査プログラム
CN112823280A (zh) 2018-09-07 2021-05-18 斯格瑞公司 用于深度可选x射线分析的***和方法
CN110907481A (zh) * 2018-09-18 2020-03-24 同方威视技术股份有限公司 一种x射线的检测***和检测方法
WO2020073132A1 (en) * 2018-10-11 2020-04-16 Shawcor Ltd. Skewed x-ray detection apparatus and method for pipeline use
US11977037B2 (en) 2018-10-22 2024-05-07 Rapiscan Holdings, Inc. Insert for screening tray
DE102019111463A1 (de) * 2019-05-03 2020-11-05 Wipotec Gmbh Röntgenstrahlungsdetektorvorrichtung und Vorrichtung zur Röntgeninspektion von Produkten, insbesondere von Lebensmitteln
CN110155688B (zh) * 2019-06-02 2020-12-25 浙江鼎兴企业管理有限公司 一种分流式车站行李安检机
CN110361400A (zh) * 2019-07-01 2019-10-22 创新奇智(合肥)科技有限公司 一种铸铁工件的气泡检测方法及电子设备
CN110327070A (zh) * 2019-07-12 2019-10-15 山东大骋医疗科技有限公司 具有储能***的ct设备
US20220323030A1 (en) * 2019-09-16 2022-10-13 Voti Inc. Probabilistic image analysis
US11058369B2 (en) 2019-11-15 2021-07-13 GE Precision Healthcare LLC Systems and methods for coherent scatter imaging using a segmented photon-counting detector for computed tomography
US11594001B2 (en) 2020-01-20 2023-02-28 Rapiscan Systems, Inc. Methods and systems for generating three-dimensional images that enable improved visualization and interaction with objects in the three-dimensional images
US11397269B2 (en) 2020-01-23 2022-07-26 Rapiscan Systems, Inc. Systems and methods for compton scatter and/or pulse pileup detection
US11212902B2 (en) 2020-02-25 2021-12-28 Rapiscan Systems, Inc. Multiplexed drive systems and methods for a multi-emitter X-ray source
US11193898B1 (en) 2020-06-01 2021-12-07 American Science And Engineering, Inc. Systems and methods for controlling image contrast in an X-ray system
WO2021257049A1 (en) * 2020-06-15 2021-12-23 American Science And Engineering, Inc. Scatter x-ray imaging with adaptive scanning beam intensity
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
EP3933881A1 (en) 2020-06-30 2022-01-05 VEC Imaging GmbH & Co. KG X-ray source with multiple grids
KR102246196B1 (ko) * 2020-07-06 2021-04-29 주식회사 딥노이드 X-ray 보안 장치에 대한 데이터 분석 장치 및 방법
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
WO2022183191A1 (en) 2021-02-23 2022-09-01 Rapiscan Systems, Inc. Systems and methods for eliminating cross-talk in scanning systems having multiple x-ray sources
JP2022144586A (ja) * 2021-03-19 2022-10-03 株式会社イシダ X線検査装置
US11885752B2 (en) 2021-06-30 2024-01-30 Rapiscan Holdings, Inc. Calibration method and device therefor
CN113960086B (zh) * 2021-09-18 2024-01-02 中国航天科工集团第二研究院 一种补偿式背散射探测器栅格准直成像***及方法
GB2612326A (en) * 2021-10-27 2023-05-03 Smiths Detection France S A S Static or quasi-static multi-view or 3D inspection of cargo

Family Cites Families (963)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US768538A (en) 1903-01-03 1904-08-23 Cons Car Heating Co Air-brake.
US2010020A (en) 1929-11-04 1935-08-06 Holzwarth Gas Turbine Co Explosion turbine
US2006291A (en) 1932-01-28 1935-06-25 Donald S Barrows Registration control for pipe organs
US2005180A (en) 1933-02-20 1935-06-18 Standard Oil Co California Tank cleaning device
US2009060A (en) 1933-03-18 1935-07-23 Noble And Cooley Company Sound propagating diaphragm and hoop
US2010278A (en) 1933-12-18 1935-08-06 William A Snyder Folding table
US2007003A (en) 1934-05-24 1935-07-02 Milprint Products Corp Commodity wrapper
US2101143A (en) 1935-12-31 1937-12-07 Westinghouse Electric & Mfg Co Shockproof X-ray unit
US2333525A (en) 1941-09-04 1943-11-02 Westinghouse Electric & Mfg Co Vapor electric device
US2299251A (en) 1941-10-15 1942-10-20 Albert C Perbal Adjustable bracket
GB730803A (en) 1951-11-08 1955-06-01 Licentia Gmbh Improvements in and relating to x-ray tubes
US2831123A (en) 1956-07-11 1958-04-15 Webster J Daly X-ray fluoroscopic device
US2952790A (en) 1957-07-15 1960-09-13 Raytheon Co X-ray tubes
US2999935A (en) 1957-10-30 1961-09-12 Industrial Nucleonics Corp Convertible radiation source
US3143651A (en) 1961-02-23 1964-08-04 American Science & Eng Inc X-ray reflection collimator adapted to focus x-radiation directly on a detector
US3239706A (en) * 1961-04-17 1966-03-08 High Voltage Engineering Corp X-ray target
US3138729A (en) 1961-09-18 1964-06-23 Philips Electronic Pharma Ultra-soft X-ray source
FR1469185A (fr) 1965-12-30 1967-02-10 Csf Intégration d'éléments magnétiques câblés
GB1272498A (en) 1969-12-03 1972-04-26 Philips Electronic Associated X-ray tube having a metal envelope
US3610994A (en) 1970-08-31 1971-10-05 Sheldon Edward E Cathode-ray tubes of television type for x-rays protection
US3713156A (en) 1970-10-12 1973-01-23 R Pothier Surface and subsurface detection device
US3768645A (en) 1971-02-22 1973-10-30 Sunkist Growers Inc Method and means for automatically detecting and sorting produce according to internal damage
JPS5325851B1 (zh) 1971-03-29 1978-07-29
US3707672A (en) 1971-06-02 1972-12-26 Westinghouse Electric Corp Weapon detector utilizing the pulsed field technique to detect weapons on the basis of weapons thickness
US3780291A (en) 1971-07-07 1973-12-18 American Science & Eng Inc Radiant energy imaging with scanning pencil beam
USRE28544E (en) 1971-07-07 1975-09-02 Radiant energy imaging with scanning pencil beam
US3790785A (en) 1971-11-18 1974-02-05 American Science & Eng Inc Radiographic imaging
US3784837A (en) 1972-05-08 1974-01-08 Siemens Ag X-ray device with a stand
US3790799A (en) 1972-06-21 1974-02-05 American Science & Eng Inc Radiant energy imaging with rocking scanning
US3766387A (en) 1972-07-11 1973-10-16 Us Navy Nondestructive test device using radiation to detect flaws in materials
JPS5224397B2 (zh) 1973-06-05 1977-06-30
US3848130A (en) 1973-06-25 1974-11-12 A Macovski Selective material x-ray imaging system
JPS5413286B2 (zh) 1973-08-30 1979-05-30
US3867637A (en) 1973-09-04 1975-02-18 Raytheon Co Extended monochromatic x-ray source
JPS5081080A (zh) 1973-11-14 1975-07-01
US3854049A (en) 1973-12-10 1974-12-10 Wisconsin Alumni Res Found Compensation for patient thickness variations in differential x-ray transmission imaging
GB1497396A (en) 1974-03-23 1978-01-12 Emi Ltd Radiography
US3980889A (en) 1974-04-08 1976-09-14 North American Philips Corporation Article transfer and inspection apparatus
USRE32961E (en) 1974-09-06 1989-06-20 U.S. Philips Corporation Device for measuring local radiation absorption in a body
DE2442809A1 (de) 1974-09-06 1976-03-18 Philips Patentverwaltung Anordnung zur ermittlung der absorption in einem koerper
US3965358A (en) 1974-12-06 1976-06-22 Albert Macovski Cross-sectional imaging system using a polychromatic x-ray source
JPS5178696A (en) 1974-12-28 1976-07-08 Tokyo Shibaura Electric Co x senkan
US4031401A (en) 1975-03-14 1977-06-21 American Science & Engineering, Inc. Radiant energy imaging scanning
DE2532218C2 (de) 1975-07-18 1982-09-02 Heimann Gmbh, 6200 Wiesbaden Vorrichtung zum Prüfen von Gepäckstücken mittels Röntgenstrahlung
DE2532300C3 (de) 1975-07-18 1979-05-17 Heimann Gmbh, 6200 Wiesbaden Anlage zum Prüfen von Gepäckstücken mittels Röntgenstrahlung
GB1526041A (en) 1975-08-29 1978-09-27 Emi Ltd Sources of x-radiation
US4031545A (en) 1975-09-08 1977-06-21 American Science & Engineering, Inc. Radiant energy alarm system
US4045672A (en) 1975-09-11 1977-08-30 Nihon Denshi Kabushiki Kaisha Apparatus for tomography comprising a pin hole for forming a microbeam of x-rays
NL7611391A (nl) 1975-10-18 1977-04-20 Emi Ltd Roentgentoestel.
US4210811A (en) 1975-11-03 1980-07-01 Heimann Gmbh Drive for moveable shield in luggage screening apparatus
JPS5275996A (en) 1975-12-20 1977-06-25 Toshiba Corp X-ray tube for analysis
IT1083997B (it) 1976-01-30 1985-05-25 Pretini Gisberto Porta a tamburo definita da scomparti ruotanti combinabile con un rivelatore di armi per impianti di protezione antirapina ed antiostaggio
JPS52124890A (en) 1976-04-13 1977-10-20 Toshiba Corp X-ray tube
DE2647167A1 (de) 1976-10-19 1978-04-20 Siemens Ag Verfahren zur herstellung von schichtaufnahmen mit roentgen- oder aehnlich durchdringenden strahlen
US4171254A (en) 1976-12-30 1979-10-16 Exxon Research & Engineering Co. Shielded anodes
FR2379158A1 (fr) 1977-01-28 1978-08-25 Radiologie Cie Gle Tube radiogene pour fournir un faisceau de rayons x plat en eventail de grande ouverture et appareil de radiologie comportant un tel tube
DE2705640A1 (de) * 1977-02-10 1978-08-17 Siemens Ag Rechnersystem fuer den bildaufbau eines koerperschnittbildes und verfahren zum betrieb des rechnersystems
US4105922A (en) 1977-04-11 1978-08-08 General Electric Company CT number identifier in a computed tomography system
DE2729353A1 (de) 1977-06-29 1979-01-11 Siemens Ag Roentgenroehre mit wanderndem brennfleck
JPS5427793A (en) * 1977-08-04 1979-03-02 Toshiba Corp X-ray tomographic diagnosis apparatus
DE2735400C2 (de) 1977-08-05 1979-09-20 Heimann Gmbh, 6200 Wiesbaden Vorrichtung zum Prüfen von Gepäckstücken mitteis Röntgenstrahlung
US4200800A (en) 1977-11-03 1980-04-29 American Science & Engineering, Inc. Reduced dose CT scanning
JPS5480097A (en) 1977-12-09 1979-06-26 Nippon Telegr & Teleph Corp <Ntt> Soft x-ray tube anti-cathode and its manufacture
DE2756659A1 (de) 1977-12-19 1979-06-21 Philips Patentverwaltung Anordnung zur bestimmung der absorptionsverteilung
US4471343A (en) 1977-12-27 1984-09-11 Lemelson Jerome H Electronic detection systems and methods
US4297580A (en) 1977-12-27 1981-10-27 North American Philips Corporation X-ray optical system for article inspection, with components disposed on parallel axes
US4158770A (en) 1978-01-03 1979-06-19 Raytheon Company Radiographic imaging system
DE2807735B2 (de) 1978-02-23 1979-12-20 Philips Patentverwaltung Gmbh, 2000 Hamburg Röntgenröhre mit einem aus Metall bestehenden Röhrenkolben
US4242583A (en) 1978-04-26 1980-12-30 American Science And Engineering, Inc. X-ray imaging variable resolution
US4228353A (en) 1978-05-02 1980-10-14 Johnson Steven A Multiple-phase flowmeter and materials analysis apparatus and method
US4185205A (en) 1978-05-09 1980-01-22 American Science & Engineering, Inc. Remote load controller
US4165472A (en) 1978-05-12 1979-08-21 Rockwell International Corporation Rotating anode x-ray source and cooling technique therefor
US4260898A (en) 1978-09-28 1981-04-07 American Science And Engineering, Inc. X-ray imaging variable resolution
JPS5546408A (en) 1978-09-29 1980-04-01 Toshiba Corp X-ray device
JPS5568056A (en) 1978-11-17 1980-05-22 Hitachi Ltd X-ray tube
US4228357A (en) 1978-12-04 1980-10-14 American Science And Engineering, Inc. Detector on wheel system (flying spot)
US4245158A (en) 1979-03-26 1981-01-13 American Science And Engineering, Inc. Soft x-ray spectrometric imaging system
DE2926456A1 (de) * 1979-06-30 1981-01-15 Philips Patentverwaltung Verfahren zur ermittlung des randes eines koerpers mittels am koerper gestreuter strahlung
US4303860A (en) 1979-07-30 1981-12-01 American Science And Engineering, Inc. High resolution radiation detector
DE2944147A1 (de) * 1979-11-02 1981-05-14 Philips Patentverwaltung Gmbh, 2000 Hamburg Anordnung zur ermittlung der streudichteverteilung in einem ebenen untersuchungsbereich
US4266425A (en) 1979-11-09 1981-05-12 Zikonix Corporation Method for continuously determining the composition and mass flow of butter and similar substances from a manufacturing process
US4309637A (en) 1979-11-13 1982-01-05 Emi Limited Rotating anode X-ray tube
JPS5686448A (en) 1979-12-17 1981-07-14 Hitachi Ltd X-ray tube and its manufacturing method
US4352021A (en) 1980-01-07 1982-09-28 The Regents Of The University Of California X-Ray transmission scanning system and method and electron beam X-ray scan tube for use therewith
US4420382A (en) 1980-01-18 1983-12-13 Alcan International Limited Method for controlling end effect on anodes used for cathodic protection and other applications
SU1022236A1 (ru) 1980-03-12 1983-06-07 Институт сильноточной электроники СО АН СССР Источник м гкого рентгеновского излучени
US4472822A (en) 1980-05-19 1984-09-18 American Science And Engineering, Inc. X-Ray computed tomography using flying spot mechanical scanning mechanism
JPS56167464A (en) 1980-05-30 1981-12-23 Nippon Telegr & Teleph Corp <Ntt> Ink recording head
JPS5717524A (en) 1980-07-04 1982-01-29 Meidensha Electric Mfg Co Ltd Electrode structure for vacuum breaker
US4366382B2 (en) 1980-09-09 1997-10-14 Scanray Corp X-ray line scan system for use in baggage inspection
JPS5756740A (en) 1980-09-22 1982-04-05 Mitsubishi Electric Corp Object inspecting device
US4342914A (en) 1980-09-29 1982-08-03 American Science And Engineering, Inc. Flying spot scanner having arbitrarily shaped field size
US4366576A (en) 1980-11-17 1982-12-28 American Science And Engineering, Inc. Penetrating radiant energy imaging system with multiple resolution
US4414682A (en) 1980-11-17 1983-11-08 American Science And Engineering, Inc. Penetrating radiant energy imaging system with multiple resolution
GB2089109B (en) 1980-12-03 1985-05-15 Machlett Lab Inc X-rays targets and tubes
JPS57110854A (en) 1980-12-27 1982-07-09 Seiko Epson Corp Shuttle turning device
DE3107949A1 (de) 1981-03-02 1982-09-16 Siemens AG, 1000 Berlin und 8000 München Roentgenroehre
US4405876A (en) 1981-04-02 1983-09-20 Iversen Arthur H Liquid cooled anode x-ray tubes
US4622687A (en) 1981-04-02 1986-11-11 Arthur H. Iversen Liquid cooled anode x-ray tubes
NL8101697A (nl) 1981-04-07 1982-11-01 Philips Nv Werkwijze voor het vervaardigen van een anode en zo verkregen anode.
JPS57175247A (en) 1981-04-23 1982-10-28 Toshiba Corp Radiation void factor meter
US4399403A (en) 1981-09-22 1983-08-16 Strandberg Engineering Laboratories, Inc. Microwave moisture measuring, indicating and control apparatus
DE3145227A1 (de) 1981-11-13 1983-05-19 Heimann Gmbh, 6200 Wiesbaden Verfahren und vorrichtung zur untersuchung des inhaltes von containern
US4389729A (en) 1981-12-15 1983-06-21 American Science And Engineering, Inc. High resolution digital radiography system
JPS58212045A (ja) 1982-06-02 1983-12-09 Natl Inst For Res In Inorg Mater X線発生装置用筒状対陰極
US4422177A (en) 1982-06-16 1983-12-20 American Science And Engineering, Inc. CT Slice proximity rotary table and elevator for examining large objects
JPS591625A (ja) 1982-06-26 1984-01-07 High Frequency Heattreat Co Ltd 膨大部のある軸体の表面加熱方法
FR2534066B1 (fr) 1982-10-05 1989-09-08 Thomson Csf Tube a rayons x produisant un faisceau a haut rendement, notamment en forme de pinceau
JPS5975549A (ja) 1982-10-22 1984-04-28 Canon Inc X線管球
JPS5975549U (ja) 1982-11-12 1984-05-22 株式会社クボタ 側弁式エンジンの混合気加熱式気化促進装置
GB2133208B (en) 1982-11-18 1986-02-19 Kratos Ltd X-ray sources
US4626688A (en) 1982-11-26 1986-12-02 Barnes Gary T Split energy level radiation detection
US4511799A (en) 1982-12-10 1985-04-16 American Science And Engineering, Inc. Dual energy imaging
US4599740A (en) 1983-01-06 1986-07-08 Cable Arthur P Radiographic examination system
US4691332A (en) 1983-03-14 1987-09-01 American Science And Engineering, Inc. High energy computed tomography
US4531226A (en) 1983-03-17 1985-07-23 Imatron Associates Multiple electron beam target for use in X-ray scanner
JPS59174744A (ja) 1983-03-25 1984-10-03 Toshiba Corp 二相流体の密度分布測定装置
NL8301839A (nl) 1983-05-25 1984-12-17 Philips Nv Roentgenbuis met twee opvolgende lagen anodemateriaal.
JPS5916254A (ja) 1983-06-03 1984-01-27 Toshiba Corp 携帯用x線装置
JPS601554A (ja) 1983-06-20 1985-01-07 Mitsubishi Electric Corp 超音波検査装置
JPS6015546A (ja) 1983-07-07 1985-01-26 Toshiba Corp 局所ボイド率分布の測定方法
JPS6021440A (ja) 1983-07-15 1985-02-02 Toshiba Corp 局所ボイド率分布の測定方法
JPS6038957A (ja) 1983-08-11 1985-02-28 Nec Corp 4相psk波の位相不確定除去回路
US4625324A (en) 1983-09-19 1986-11-25 Technicare Corporation High vacuum rotating anode x-ray tube
JPS6073442A (ja) 1983-09-30 1985-04-25 Toshiba Corp 放射線断層測定装置
US4593355A (en) 1983-11-21 1986-06-03 American Science And Engineering, Inc. Method of quick back projection for computed tomography and improved CT machine employing the method
DE3343886A1 (de) 1983-12-05 1985-06-13 Philips Patentverwaltung Gmbh, 2000 Hamburg Drehanoden-roentgenroehre mit einem gleitlager
US4571491A (en) 1983-12-29 1986-02-18 Shell Oil Company Method of imaging the atomic number of a sample
JPS60181851A (ja) 1984-02-29 1985-09-17 Toshiba Corp 部分書込み制御方式
US4672649A (en) 1984-05-29 1987-06-09 Imatron, Inc. Three dimensional scanned projection radiography using high speed computed tomographic scanning system
JPH0744056B2 (ja) 1984-06-15 1995-05-15 日本電装株式会社 セラミツクヒ−タ
FR2566960B1 (fr) 1984-06-29 1986-11-14 Thomson Cgr Tube a rayons x a anode tournante et procede de fixation d'une anode tournante sur un axe support
JPS6128039A (ja) 1984-07-16 1986-02-07 ユニチカ株式会社 荒巻整経法
US4763345A (en) 1984-07-31 1988-08-09 The Regents Of The University Of California Slit scanning and deteching system
DE3431082A1 (de) 1984-08-23 1986-02-27 Heimann Gmbh, 6200 Wiesbaden Schaltungsanordnung zur hochspannungsversorung einer roentgenroehre
JPS61107642A (ja) 1984-10-30 1986-05-26 Mitsubishi Electric Corp X線発生用タ−ゲツトの冷却方法
JPS61134021A (ja) 1984-12-05 1986-06-21 Canon Inc 投影露光装置
US4768214A (en) 1985-01-16 1988-08-30 American Science And Engineering, Inc. Imaging
CN1003542B (zh) 1985-03-04 1989-03-08 海曼股份公司 X-射线扫描仪
CN85107860A (zh) 1985-04-03 1986-10-01 海曼股份公司 X-射线扫描仪
US4845731A (en) 1985-06-05 1989-07-04 Picker International Radiation data acquistion
DE3526015A1 (de) 1985-07-20 1987-01-22 Philips Patentverwaltung Verfahren zum bestimmen der raeumlichen verteilung der streuquerschnitte fuer elastisch gestreute roentgenstrahlung und anordnung zur durchfuehrung des verfahrens
US4719645A (en) 1985-08-12 1988-01-12 Fujitsu Limited Rotary anode assembly for an X-ray source
JPS6244940A (ja) 1985-08-22 1987-02-26 Shimadzu Corp X線源
GB8521287D0 (en) 1985-08-27 1985-10-02 Frith B Flow measurement & imaging
JPS6264977A (ja) 1985-09-18 1987-03-24 Hitachi Medical Corp 産業用x線異物検査方法及びその実施装置
US5414622A (en) 1985-11-15 1995-05-09 Walters; Ronald G. Method and apparatus for back projecting image data into an image matrix location
US4789930A (en) 1985-11-15 1988-12-06 Picker International, Inc. Energy dependent gain correction for radiation detection
JPS62121773A (ja) 1985-11-20 1987-06-03 Kansai Paint Co Ltd 防汚塗料
US4736400A (en) 1986-01-09 1988-04-05 The Machlett Laboratories, Inc. Diffusion bonded x-ray target
US4845769A (en) 1986-01-17 1989-07-04 American Science And Engineering, Inc. Annular x-ray inspection system
EP0247491B1 (de) 1986-05-28 1990-08-16 Heimann GmbH Röntgenscanner
US4799247A (en) 1986-06-20 1989-01-17 American Science And Engineering, Inc. X-ray imaging particularly adapted for low Z materials
JPS6316535A (ja) 1986-07-09 1988-01-23 Rigaku Keisoku Kk 細径x線ビ−ム発生装置
JPS6321040A (ja) 1986-07-16 1988-01-28 工業技術院長 超高速x線ctスキヤナ
US4809312A (en) 1986-07-22 1989-02-28 American Science And Engineering, Inc. Method and apparatus for producing tomographic images
US4958363A (en) 1986-08-15 1990-09-18 Nelson Robert S Apparatus for narrow bandwidth and multiple energy x-ray imaging
JPS63109653A (ja) 1986-10-27 1988-05-14 Sharp Corp 情報登録検索装置
DE3638378A1 (de) 1986-11-11 1988-05-19 Siemens Ag Roentgenroehre
US4963746A (en) 1986-11-25 1990-10-16 Picker International, Inc. Split energy level radiation detection
JPS63150840A (ja) 1986-12-16 1988-06-23 Fuji Electric Co Ltd X線発生用対陰極
US4893015A (en) 1987-04-01 1990-01-09 American Science And Engineering, Inc. Dual mode radiographic measurement method and device
JPS63255683A (ja) 1987-04-13 1988-10-21 Hitachi Ltd 異物の映像化装置
US5018181A (en) 1987-06-02 1991-05-21 Coriolis Corporation Liquid cooled rotating anodes
IL83233A (en) 1987-07-17 1991-01-31 Elscint Ltd Reconstruction in ct scanners using divergent beams
JPS6434333A (en) 1987-07-31 1989-02-03 Toshiba Corp Image processing apparatus
JPS6486938A (en) 1987-09-30 1989-03-31 Toshiba Corp Ct scanner
DE3886334D1 (de) 1987-10-05 1994-01-27 Philips Patentverwaltung Anordnung zur Untersuchung eines Körpers mit einer Strahlenquelle.
US4899283A (en) 1987-11-23 1990-02-06 American Science And Engineering, Inc. Tomographic apparatus including means to illuminate the bounded field of view from a plurality of directions
GB2212903B (en) 1987-11-24 1991-11-06 Rolls Royce Plc Measuring two phase flow in pipes.
JPH0186156U (zh) 1987-11-30 1989-06-07
US4788706A (en) 1987-12-17 1988-11-29 General Electric Company Method of measurement of x-ray energy
US4825454A (en) 1987-12-28 1989-04-25 American Science And Engineering, Inc. Tomographic imaging with concentric conical collimator
FR2625605A1 (fr) 1987-12-30 1989-07-07 Thomson Cgr Anode tournante pour tube a rayons x
US4928296A (en) 1988-04-04 1990-05-22 General Electric Company Apparatus for cooling an X-ray device
US5227800A (en) 1988-04-19 1993-07-13 Millitech Corporation Contraband detection system
US4852131A (en) 1988-05-13 1989-07-25 Advanced Research & Applications Corporation Computed tomography inspection of electronic devices
US4887604A (en) 1988-05-16 1989-12-19 Science Research Laboratory, Inc. Apparatus for performing dual energy medical imaging
JPH01296544A (ja) 1988-05-24 1989-11-29 Seiko Epson Corp 高輝度x線銃
FR2632436B1 (fr) 1988-06-01 1991-02-15 Commissariat Energie Atomique Procede d'adressage d'un ecran matriciel fluorescent a micropointes
US5007072A (en) 1988-08-03 1991-04-09 Ion Track Instruments X-ray diffraction inspection system
DE3909147A1 (de) 1988-09-22 1990-09-27 Philips Patentverwaltung Anordnung zur messung des impulsuebertrages
JPH02147942A (ja) * 1988-11-30 1990-06-06 Fuji Electric Co Ltd 内容物検査方法
US5127030A (en) 1989-02-28 1992-06-30 American Science And Engineering, Inc. Tomographic imaging with improved collimator
EP0390950B1 (de) * 1989-04-06 1993-01-13 Heimann Systems GmbH &amp; Co. KG Materialprüfanlage
US4945562A (en) 1989-04-24 1990-07-31 General Electric Company X-ray target cooling
JP2840611B2 (ja) 1989-05-24 1998-12-24 明治乳業株式会社 包装体内容物の非破壊検査方法及び検査装置
EP0412189B1 (de) 1989-08-09 1992-10-28 Heimann Systems GmbH &amp; Co. KG Vorrichtung zum Durchstrahlen von Gegenständen mit fächerförmiger Strahlung
DE58906047D1 (de) 1989-08-09 1993-12-02 Heimann Systems Gmbh & Co Vorrichtung zum Durchstrahlen von Gegenständen mittels fächerförmiger Strahlung.
US4979202A (en) 1989-08-25 1990-12-18 Siczek Aldona A Support structure for X-ray imaging apparatus
US5179581A (en) 1989-09-13 1993-01-12 American Science And Engineering, Inc. Automatic threat detection based on illumination by penetrating radiant energy
US5022062A (en) 1989-09-13 1991-06-04 American Science And Engineering, Inc. Automatic threat detection based on illumination by penetrating radiant energy using histogram processing
AT392160B (de) 1989-09-14 1991-02-11 Otto Dipl Ing Dr Kratky Blendenanordnung zur streuungsarmen, einseitigen, linearen begrenzung eines roentgenstrahlbuendels
JP2742454B2 (ja) 1989-10-16 1998-04-22 株式会社テクノシステムズ ハンダ付け装置
US4975968A (en) 1989-10-27 1990-12-04 Spatial Dynamics, Ltd. Timed dielectrometry surveillance method and apparatus
JP2845995B2 (ja) 1989-10-27 1999-01-13 株式会社日立製作所 領域抽出手法
DE8914064U1 (zh) 1989-11-29 1990-02-01 Philips Patentverwaltung Gmbh, 2000 Hamburg, De
US5864146A (en) 1996-11-13 1999-01-26 University Of Massachusetts Medical Center System for quantitative radiographic imaging
EP0432568A3 (en) 1989-12-11 1991-08-28 General Electric Company X ray tube anode and tube having same
US5098640A (en) 1990-01-10 1992-03-24 Science Applications International Corporation Apparatus and method for detecting contraband using fast neutron activation
DE4000573A1 (de) 1990-01-10 1991-07-11 Balzers Hochvakuum Elektronenstrahlerzeuger und emissionskathode
US5056127A (en) 1990-03-02 1991-10-08 Iversen Arthur H Enhanced heat transfer rotating anode x-ray tubes
US4991189A (en) 1990-04-16 1991-02-05 General Electric Company Collimation apparatus for x-ray beam correction
EP0455177A3 (en) 1990-04-30 1992-05-20 Shimadzu Corporation High-speed scan type x-ray generator
DE4015105C3 (de) 1990-05-11 1997-06-19 Bruker Analytische Messtechnik Röntgen-Computer-Tomographie-System
DE4015180A1 (de) 1990-05-11 1991-11-28 Bruker Analytische Messtechnik Roentgen-computer-tomographie-system mit geteiltem detektorring
US5155365A (en) 1990-07-09 1992-10-13 Cann Christopher E Emission-transmission imaging system using single energy and dual energy transmission and radionuclide emission data
JPH0479128A (ja) 1990-07-23 1992-03-12 Nec Corp マイクロ波管用多段電位低下コレクタ
US5181234B1 (en) 1990-08-06 2000-01-04 Rapiscan Security Products Inc X-ray backscatter detection system
US5319547A (en) 1990-08-10 1994-06-07 Vivid Technologies, Inc. Device and method for inspection of baggage and other objects
WO1992003722A1 (en) 1990-08-15 1992-03-05 Massachusetts Institute Of Technology Detection of explosives and other materials using resonance fluorescence, resonance absorption, and other electromagnetic processes with bremsstrahlung radiation
US5068882A (en) 1990-08-27 1991-11-26 General Electric Company Dual parallel cone beam circular scanning trajectories for reduced data incompleteness in three-dimensional computerized tomography
US5073910A (en) 1990-08-27 1991-12-17 General Electric Company Square wave cone beam scanning trajectory for data completeness in three-dimensional computerized tomography
CN1020048C (zh) 1990-11-08 1993-03-10 大港石油管理局第一采油厂 低能源原油含水分析仪
US5247561A (en) * 1991-01-02 1993-09-21 Kotowski Andreas F Luggage inspection device
DE4100297A1 (de) 1991-01-08 1992-07-09 Philips Patentverwaltung Roentgenroehre
DE4101544A1 (de) 1991-01-19 1992-07-23 Philips Patentverwaltung Roentgengeraet
DE4103588C1 (zh) 1991-02-06 1992-05-27 Siemens Ag, 8000 Muenchen, De
US5841832A (en) 1991-02-13 1998-11-24 Lunar Corporation Dual-energy x-ray detector providing spatial and temporal interpolation
JP2962015B2 (ja) 1991-02-20 1999-10-12 松下電器産業株式会社 k吸収端フィルタおよびX線装置
US5105452A (en) 1991-03-26 1992-04-14 Mcinerney Joseph J Device for determining the characteristics of blood flow through coronary bypass grafts
US5272627A (en) 1991-03-27 1993-12-21 Gulton Industries, Inc. Data converter for CT data acquisition system
DE4110468A1 (de) * 1991-03-30 1992-10-01 Forschungszentrum Juelich Gmbh Einrichtung zur roentgenbestrahlung von objekten
FR2675629B1 (fr) 1991-04-17 1997-05-16 Gen Electric Cgr Cathode pour tube a rayons x et tube ainsi obtenu.
US5144191A (en) 1991-06-12 1992-09-01 Mcnc Horizontal microelectronic field emission devices
JP2928677B2 (ja) * 1991-06-21 1999-08-03 株式会社東芝 X線検出器およびx線検査装置
US5338984A (en) 1991-08-29 1994-08-16 National Semiconductor Corp. Local and express diagonal busses in a configurable logic array
US5557283A (en) 1991-08-30 1996-09-17 Sheen; David M. Real-time wideband holographic surveillance system
JPH0560381A (ja) 1991-09-02 1993-03-09 Harman Co Ltd 元止め式の給湯器
DE69229176D1 (de) 1991-09-10 1999-06-17 Integrated Silicon Design Pty Identifizierung und telemetriesystem
JP3325301B2 (ja) 1991-09-12 2002-09-17 株式会社東芝 X線ct装置
DE69223884T2 (de) 1991-09-12 1998-08-27 Toshiba Kawasaki Kk Verfahren und Vorrichtung zur Erzeugung von Röntgencomputertomogrammen und zum Erzeugen von Schattenbildern mittels spiralförmiger Abtastung
US5224144A (en) 1991-09-12 1993-06-29 American Science And Engineering, Inc. Reduced mass flying spot scanner having arcuate scanning lines
US5367552A (en) 1991-10-03 1994-11-22 In Vision Technologies, Inc. Automatic concealed object detection system having a pre-scan stage
US5182764A (en) * 1991-10-03 1993-01-26 Invision Technologies, Inc. Automatic concealed object detection system having a pre-scan stage
JPH05135721A (ja) 1991-11-08 1993-06-01 Toshiba Corp X線管
US5253283A (en) 1991-12-23 1993-10-12 American Science And Engineering, Inc. Inspection method and apparatus with single color pixel imaging
JPH05182617A (ja) 1991-12-27 1993-07-23 Shimadzu Corp 超高速x線ct用x線管の陽極ターゲット構体
US5305363A (en) 1992-01-06 1994-04-19 Picker International, Inc. Computerized tomographic scanner having a toroidal x-ray tube with a stationary annular anode and a rotating cathode assembly
US5268955A (en) 1992-01-06 1993-12-07 Picker International, Inc. Ring tube x-ray source
US5263075A (en) 1992-01-13 1993-11-16 Ion Track Instruments, Inc. High angular resolution x-ray collimator
GB9200828D0 (en) 1992-01-15 1992-03-11 Image Research Ltd Improvements in and relating to material identification using x-rays
US5375156A (en) 1992-03-31 1994-12-20 Siemens Medical Systems, Inc. Method and apparatus for 3-D computer tomography
JPH05290768A (ja) 1992-04-16 1993-11-05 Toshiba Corp X線管
US5237598A (en) 1992-04-24 1993-08-17 Albert Richard D Multiple image scanning X-ray method and apparatus
JPH05325851A (ja) 1992-05-18 1993-12-10 Rigaku Corp X線管用対陰極
JP2005013768A (ja) 1992-05-27 2005-01-20 Toshiba Corp X線ct装置
JP3441455B2 (ja) 1992-05-27 2003-09-02 株式会社東芝 X線ct装置
JP3631235B2 (ja) 1992-05-27 2005-03-23 株式会社東芝 X線ct装置
JP3405760B2 (ja) 1992-05-27 2003-05-12 株式会社東芝 Ct装置
EP0579848B1 (de) 1992-07-20 1995-10-04 Heimann Systems GmbH Prüfanlage für Gegenstände
US5966422A (en) 1992-07-20 1999-10-12 Picker Medical Systems, Ltd. Multiple source CT scanner
DE4228559A1 (de) 1992-08-27 1994-03-03 Dagang Tan Röntgenröhre mit einer Transmissionsanode
US5410156A (en) * 1992-10-21 1995-04-25 Miller; Thomas G. High energy x-y neutron detector and radiographic/tomographic device
JPH06133960A (ja) 1992-10-23 1994-05-17 Hitachi Medical Corp X線ct装置
JPH06162974A (ja) 1992-11-18 1994-06-10 Toshiba Corp X線管
JPH06169911A (ja) 1992-12-04 1994-06-21 Toshiba Corp X線コンピュータトモグラフィ装置
US5600303A (en) * 1993-01-15 1997-02-04 Technology International Incorporated Detection of concealed explosives and contraband
US5651047A (en) 1993-01-25 1997-07-22 Cardiac Mariners, Incorporated Maneuverable and locateable catheters
DE4304332A1 (de) 1993-02-13 1994-08-18 Philips Patentverwaltung Verfahren zur Erzeugung von Schichtbildern und Anordnung zur Durchführung des Verfahrens
JP3280743B2 (ja) 1993-03-12 2002-05-13 株式会社島津製作所 X線断層撮影方法
JPH06277207A (ja) 1993-03-25 1994-10-04 Toshiba Corp 非破壊検査装置、x線ct用データ検出装置及びx線ct用画像処理装置
DE4311174C2 (de) 1993-04-05 1996-02-15 Heimann Systems Gmbh & Co Röntgenprüfanlage für Container und Lastkraftwagen
US5339080A (en) 1993-04-08 1994-08-16 Coleman Research Corporation Earth-penetrating synthetic image radar
JP3449561B2 (ja) 1993-04-19 2003-09-22 東芝医用システムエンジニアリング株式会社 X線ct装置
FR2705785B1 (fr) 1993-05-28 1995-08-25 Schlumberger Ind Sa Procédé pour déterminer la fonction d'atténuation d'un objet par rapport à la transmission d'une épaisseur de référence d'un matériau de référence et dispositif pour la mise en Óoeuvre du procédé.
FR2705786B1 (fr) 1993-05-28 1995-08-25 Schlumberger Ind Sa Procédé et dispositif pour la reconnaissance de matériaux déterminés dans la composition d'un objet.
JP3218810B2 (ja) 1993-06-25 2001-10-15 石川島播磨重工業株式会社 X線検査車両
DE69430088T2 (de) 1993-07-05 2002-11-07 Koninkl Philips Electronics Nv Röntgenstrahlen-Beugungsgerät mit Kühlmittel-Verbindung zur Röntgenröhre
US5511105A (en) 1993-07-12 1996-04-23 Siemens Aktiengesellschaft X-ray tube with multiple differently sized focal spots and method for operating same
FR2708751B1 (fr) 1993-07-30 1995-10-06 Schlumberger Ind Sa Procédé et dispositif pour détecter la présence d'un objet, comportant un matériau donné, non accessible à la vue.
US5345240A (en) 1993-08-04 1994-09-06 Hughes Missile Systems Company Handheld obstacle penetrating motion detecting radar
JPH0757113A (ja) 1993-08-18 1995-03-03 Ge Yokogawa Medical Syst Ltd 3次元画像表示方法および装置
DE4331317A1 (de) 1993-09-15 1995-03-16 Philips Patentverwaltung Untersuchungsverfahren zur Auswertung ortsabhängiger Spektren
US5557108A (en) 1993-10-25 1996-09-17 T+E,Uml U+Ee Mer; T+E,Uml U+Ee May O. Integrated substance detection and identification system
US5493596A (en) 1993-11-03 1996-02-20 Annis; Martin High-energy X-ray inspection system
US5541975A (en) 1994-01-07 1996-07-30 Anderson; Weston A. X-ray tube having rotary anode cooled with high thermal conductivity fluid
CA2139537C (en) 1994-01-07 2007-04-24 Ulf Anders Staffan Tapper Method and apparatus for the classification of matter
US5666393A (en) 1994-02-17 1997-09-09 Annis; Martin Method and apparatus for reducing afterglow noise in an X-ray inspection system
US5511104A (en) * 1994-03-11 1996-04-23 Siemens Aktiengesellschaft X-ray tube
US5490196A (en) * 1994-03-18 1996-02-06 Metorex International Oy Multi energy system for x-ray imaging applications
US5428657A (en) * 1994-03-22 1995-06-27 Georgia Tech Research Corporation X-ray monitoring system
US5467377A (en) 1994-04-15 1995-11-14 Dawson; Ralph L. Computed tomographic scanner
SE9401300L (sv) 1994-04-18 1995-10-19 Bgc Dev Ab Roterande cylinderkollimator för kollimering av joniserande, elektromagnetisk strålning
DE4413689C1 (de) 1994-04-20 1995-06-08 Siemens Ag Röntgencomputertomograph
US5606167A (en) * 1994-07-11 1997-02-25 Miller; Thomas G. Contraband detection apparatus and method
DE4425691C2 (de) 1994-07-20 1996-07-11 Siemens Ag Röntgenstrahler
US5616926A (en) 1994-08-03 1997-04-01 Hitachi, Ltd. Schottky emission cathode and a method of stabilizing the same
US5712889A (en) 1994-08-24 1998-01-27 Lanzara; Giovanni Scanned volume CT scanner
DE4432205C1 (de) 1994-09-09 1996-01-25 Siemens Ag Hochspannungsstecker für eine Röntgenröhre
GB9419510D0 (en) 1994-09-28 1994-11-16 Ic Consultants Limited Apparatus for analysing fluid flow
DE4436688A1 (de) 1994-10-13 1996-04-25 Siemens Ag Computertomograph
US5712926A (en) 1994-10-20 1998-01-27 Eberhard; Jeffrey Wayne X-ray computed tomography (CT) system for detecting thin objects
US5959580A (en) 1994-11-03 1999-09-28 Ksi Inc. Communications localization system
US5481584A (en) 1994-11-23 1996-01-02 Tang; Jihong Device for material separation using nondestructive inspection imaging
US6438201B1 (en) 1994-11-23 2002-08-20 Lunar Corporation Scanning densitometry system with adjustable X-ray tube current
US5568829A (en) 1994-12-16 1996-10-29 Lake Shove, Inc. Boom construction for sliding boom delimeers
JP3011360B2 (ja) 1994-12-27 2000-02-21 株式会社スタビック X線非破壊検査装置
DE19502752C2 (de) 1995-01-23 1999-11-11 Siemens Ag Verfahren und Vorrichtung zur Erzeugung eines umlaufenden Röntgenstrahls zur schnellen Computertomographie
JP3259561B2 (ja) 1995-01-26 2002-02-25 松下電器産業株式会社 リチウム二次電池の負極材料及びその製造方法
DE19510168C2 (de) 1995-03-21 2001-09-13 Heimann Systems Gmbh & Co Verfahren und Vorrichtung zur Bestimmung von kristallinen und polykristallinen Materialien in einem Untersuchungsbereich
DE19513291C2 (de) 1995-04-07 1998-11-12 Siemens Ag Röntgenröhre
AUPN226295A0 (en) 1995-04-07 1995-05-04 Technological Resources Pty Limited A method and an apparatus for analysing a material
DE19514332C1 (de) 1995-04-18 1996-07-25 Siemens Ag Röntgencomputertomograph
US5552705A (en) 1995-06-01 1996-09-03 Keller; George V. Non-obtrusive weapon detection system and method for discriminating between a concealed weapon and other metal objects
US6216540B1 (en) * 1995-06-06 2001-04-17 Robert S. Nelson High resolution device and method for imaging concealed objects within an obscuring medium
DE19532965C2 (de) 1995-09-07 1998-07-16 Heimann Systems Gmbh & Co Röntgenprüfanlage für großvolumige Güter
US5600700A (en) * 1995-09-25 1997-02-04 Vivid Technologies, Inc. Detecting explosives or other contraband by employing transmitted and scattered X-rays
US5642393A (en) 1995-09-26 1997-06-24 Vivid Technologies, Inc. Detecting contraband by employing interactive multiprobe tomography
WO1997013142A1 (en) 1995-10-03 1997-04-10 Philips Electronics N.V. Apparatus for simultaneous x-ray diffraction and x-ray fluorescence measurements
US6507025B1 (en) * 1995-10-23 2003-01-14 Science Applications International Corporation Density detection using real time discrete photon counting for fast moving targets
US7045787B1 (en) 1995-10-23 2006-05-16 Science Applications International Corporation Density detection using real time discrete photon counting for fast moving targets
US6255654B1 (en) 1995-10-23 2001-07-03 Science Applications International Corporation Density detection using discrete photon counting
JP3080994B2 (ja) * 1995-11-13 2000-08-28 アメリカ合衆国 多重エネルギコンピュータ断層撮影法を用いた隠された対象物の自動認識のための装置および方法
US6018562A (en) * 1995-11-13 2000-01-25 The United States Of America As Represented By The Secretary Of The Army Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography
DE19542438C1 (de) 1995-11-14 1996-11-28 Siemens Ag Röntgenröhre
DE19544203A1 (de) 1995-11-28 1997-06-05 Philips Patentverwaltung Röntgenröhre, insbesondere Mikrofokusröntgenröhre
US5648997A (en) 1995-12-29 1997-07-15 Advanced Optical Technologies, Inc. Apparatus and method for removing scatter from an x-ray image
US6304629B1 (en) 1996-01-11 2001-10-16 Granville Todd Conway Compact scanner apparatus and method
US5764683B1 (en) 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
USRE39396E1 (en) 1996-02-12 2006-11-14 American Science And Engineering, Inc. Mobile x-ray inspection system for large objects
US5696806A (en) 1996-03-11 1997-12-09 Grodzins; Lee Tomographic method of x-ray imaging
DE19610093A1 (de) 1996-03-15 1997-09-18 Bsbg Bremer Sonderabfall Berat Verfahren zum Sortieren von Altbatterien und/oder Altakkumulatoren sowie Vorrichtung zur Durchführung des Verfahrens
US5633907A (en) 1996-03-21 1997-05-27 General Electric Company X-ray tube electron beam formation and focusing
US5642394A (en) 1996-04-03 1997-06-24 American Science And Engineering, Inc. Sidescatter X-ray detection system
DE19618749A1 (de) 1996-05-09 1997-11-13 Siemens Ag Röntgen-Computertomograph
EP0844639A1 (en) 1996-05-21 1998-05-27 Kabushiki Kaisha Toshiba Cathode body structure, electron gun body structure, grid unit for electron gun, electronic tube, heater, and method for manufacturing cathode body structure
JPH101209A (ja) 1996-06-17 1998-01-06 Ishikawajima Harima Heavy Ind Co Ltd 移動式コンベヤへの給電方法
JPH105206A (ja) 1996-06-25 1998-01-13 Shimadzu Corp ディジタルx線撮影装置
DE69716169T2 (de) 1996-06-27 2003-06-12 Analogic Corp Vorrichtung zum Erfassen für axiale Transversal- und Quadratur-Tomographie
US5661774A (en) 1996-06-27 1997-08-26 Analogic Corporation Dual energy power supply
US5638420A (en) 1996-07-03 1997-06-10 Advanced Research And Applications Corporation Straddle inspection system
US5838759A (en) 1996-07-03 1998-11-17 Advanced Research And Applications Corporation Single beam photoneutron probe and X-ray imaging system for contraband detection and identification
DE69719988D1 (de) 1996-07-12 2003-04-24 American Science & Eng Inc System für tomographie mit seitenstreuung
GB2315546A (en) 1996-07-18 1998-02-04 Imperial College Luggage scanner
WO1998003889A1 (en) 1996-07-22 1998-01-29 American Science And Engineering, Inc. System for rapid x-ray inspection of enclosures
US5943388A (en) 1996-07-30 1999-08-24 Nova R & D, Inc. Radiation detector and non-destructive inspection
EP0825457A3 (en) 1996-08-19 2002-02-13 Analogic Corporation Multiple angle pre-screening tomographic systems and methods
JPH1075944A (ja) * 1996-09-02 1998-03-24 Mitsubishi Heavy Ind Ltd 高速x線ctスキャナ装置
US6359582B1 (en) 1996-09-18 2002-03-19 The Macaleese Companies, Inc. Concealed weapons detection system
US5974111A (en) * 1996-09-24 1999-10-26 Vivid Technologies, Inc. Identifying explosives or other contraband by employing transmitted or scattered X-rays
US5940468A (en) * 1996-11-08 1999-08-17 American Science And Engineering, Inc. Coded aperture X-ray imaging system
US5798972A (en) 1996-12-19 1998-08-25 Mitsubishi Semiconductor America, Inc. High-speed main amplifier with reduced access and output disable time periods
US6184841B1 (en) 1996-12-31 2001-02-06 Lucent Technologies Inc. Antenna array in an RFID system
WO1998030980A1 (en) 1997-01-14 1998-07-16 Edholm, Paul Technique and arrangement for tomographic imaging
JPH10211196A (ja) 1997-01-31 1998-08-11 Olympus Optical Co Ltd X線ctスキャナ装置
US6037597A (en) * 1997-02-18 2000-03-14 Neutech Systems, Inc. Non-destructive detection systems and methods
US6118850A (en) 1997-02-28 2000-09-12 Rutgers, The State University Analysis methods for energy dispersive X-ray diffraction patterns
US5859891A (en) * 1997-03-07 1999-01-12 Hibbard; Lyn Autosegmentation/autocontouring system and method for use with three-dimensional radiation therapy treatment planning
JPH10272128A (ja) 1997-03-31 1998-10-13 Futec Inc 直接断層撮影方法及び装置
US6026135A (en) 1997-04-04 2000-02-15 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of National Defence Of Her Majesty's Canadian Government Multisensor vehicle-mounted mine detector
US5802134A (en) * 1997-04-09 1998-09-01 Analogic Corporation Nutating slice CT image reconstruction apparatus and method
US6054712A (en) 1998-01-23 2000-04-25 Quanta Vision, Inc. Inspection equipment using small-angle topography in determining an object's internal structure and composition
US5889833A (en) 1997-06-17 1999-03-30 Kabushiki Kaisha Toshiba High speed computed tomography device and method
US6075836A (en) 1997-07-03 2000-06-13 University Of Rochester Method of and system for intravenous volume tomographic digital angiography imaging
US6058158A (en) 1997-07-04 2000-05-02 Eiler; Peter X-ray device for checking the contents of closed cargo carriers
US6252932B1 (en) 1997-07-22 2001-06-26 Fuji Photo Film Co., Ltd. Method and apparatus for acquiring image information for energy subtraction processing
US6115454A (en) 1997-08-06 2000-09-05 Varian Medical Systems, Inc. High-performance X-ray generating apparatus with improved cooling system
EP1005638A1 (en) 1997-08-21 2000-06-07 American Science &amp; Engineering, Inc. X-ray determination of the mass distribution in containers
JP4346128B2 (ja) 1997-09-09 2009-10-21 株式会社東芝 X線ct装置
US6081580A (en) * 1997-09-09 2000-06-27 American Science And Engineering, Inc. Tomographic inspection system
US7028899B2 (en) 1999-06-07 2006-04-18 Metrologic Instruments, Inc. Method of speckle-noise pattern reduction and apparatus therefore based on reducing the temporal-coherence of the planar laser illumination beam before it illuminates the target object by applying temporal phase modulation techniques during the transmission of the plib towards the target
GB9720658D0 (en) 1997-09-29 1997-11-26 Univ Nottingham Trent Detecting, improving and charecterising material in 3-D space
US5901198A (en) 1997-10-10 1999-05-04 Analogic Corporation Computed tomography scanning target detection using target surface normals
US6188743B1 (en) 1997-10-10 2001-02-13 Analogic Corporation Computed tomography scanner drive system and bearing
US5982843A (en) 1997-10-10 1999-11-09 Analogic Corporation Closed loop air conditioning system for a computed tomography scanner
US6256404B1 (en) 1997-10-10 2001-07-03 Analogic Corporation Computed tomography scanning apparatus and method using adaptive reconstruction window
US6091795A (en) 1997-10-10 2000-07-18 Analogic Corporation Area detector array for computer tomography scanning system
DE19745998A1 (de) 1997-10-20 1999-03-04 Siemens Ag Verwendung einer Röntgenröhre und für diese Verwendung vorgesehene Röntgenröhre
US6014419A (en) 1997-11-07 2000-01-11 Hu; Hui CT cone beam scanner with fast and complete data acquistion and accurate and efficient regional reconstruction
US5907593A (en) 1997-11-26 1999-05-25 General Electric Company Image reconstruction in a CT fluoroscopy system
US6149592A (en) 1997-11-26 2000-11-21 Picker International, Inc. Integrated fluoroscopic projection image data, volumetric image data, and surgical device position data
US6067344A (en) 1997-12-19 2000-05-23 American Science And Engineering, Inc. X-ray ambient level safety system
US6005918A (en) 1997-12-19 1999-12-21 Picker International, Inc. X-ray tube window heat shield
US5987097A (en) 1997-12-23 1999-11-16 General Electric Company X-ray tube having reduced window heating
DE19802668B4 (de) 1998-01-24 2013-10-17 Smiths Heimann Gmbh Röntgenstrahlungserzeuger
US6151381A (en) 1998-01-28 2000-11-21 American Science And Engineering, Inc. Gated transmission and scatter detection for x-ray imaging
US6067366A (en) 1998-02-11 2000-05-23 Analogic Corporation Apparatus and method for detecting objects in computed tomography data using erosion and dilation of objects
US6078642A (en) 1998-02-11 2000-06-20 Analogice Corporation Apparatus and method for density discrimination of objects in computed tomography data using multiple density ranges
US6272230B1 (en) 1998-02-11 2001-08-07 Analogic Corporation Apparatus and method for optimizing detection of objects in computed tomography data
US6076400A (en) 1998-02-11 2000-06-20 Analogic Corporation Apparatus and method for classifying objects in computed tomography data using density dependent mass thresholds
US6317509B1 (en) 1998-02-11 2001-11-13 Analogic Corporation Computed tomography apparatus and method for classifying objects
US6075871A (en) 1998-02-11 2000-06-13 Analogic Corporation Apparatus and method for eroding objects in computed tomography data
US6128365A (en) 1998-02-11 2000-10-03 Analogic Corporation Apparatus and method for combining related objects in computed tomography data
US6035014A (en) * 1998-02-11 2000-03-07 Analogic Corporation Multiple-stage apparatus and method for detecting objects in computed tomography data
US6026171A (en) * 1998-02-11 2000-02-15 Analogic Corporation Apparatus and method for detection of liquids in computed tomography data
US6026143A (en) * 1998-02-11 2000-02-15 Analogic Corporation Apparatus and method for detecting sheet objects in computed tomography data
US6108396A (en) 1998-02-11 2000-08-22 Analogic Corporation Apparatus and method for correcting object density in computed tomography data
US6111974A (en) 1998-02-11 2000-08-29 Analogic Corporation Apparatus and method for detecting sheet objects in computed tomography data
EP1062555A4 (en) * 1998-02-11 2001-05-23 Analogic Corp TOMODENSITOMETRY APPARATUS AND METHOD FOR CLASSIFYING OBJECTS
JPH11230918A (ja) 1998-02-12 1999-08-27 Hitachi Medical Corp X線検査装置
US6108575A (en) 1998-02-20 2000-08-22 General Electric Company Helical weighting algorithms for fast reconstruction
DE19812055C2 (de) 1998-03-19 2002-08-08 Heimann Systems Gmbh & Co Bildverarbeitung zur Materialerkennung mittels Röntgenstrahlungen
US6218943B1 (en) * 1998-03-27 2001-04-17 Vivid Technologies, Inc. Contraband detection and article reclaim system
WO1999050882A1 (en) 1998-03-27 1999-10-07 Thermal Corp. Multiple wavelength x-ray tube
US6094472A (en) 1998-04-14 2000-07-25 Rapiscan Security Products, Inc. X-ray backscatter imaging system including moving body tracking assembly
JP3572191B2 (ja) * 1998-04-14 2004-09-29 株式会社日立製作所 X線ctスキャナ装置
US6236709B1 (en) 1998-05-04 2001-05-22 Ensco, Inc. Continuous high speed tomographic imaging system and method
GB2337032B (en) 1998-05-05 2002-11-06 Rapiscan Security Products Ltd Sorting apparatus
US6097786A (en) 1998-05-18 2000-08-01 Schlumberger Technology Corporation Method and apparatus for measuring multiphase flows
US6347132B1 (en) * 1998-05-26 2002-02-12 Annistech, Inc. High energy X-ray inspection system for detecting nuclear weapons materials
US6088426A (en) 1998-05-27 2000-07-11 Varian Medical Systems, Inc. Graphite x-ray target assembly
US6088423A (en) * 1998-06-05 2000-07-11 Vivid Technologies, Inc. Multiview x-ray based system for detecting contraband such as in baggage
DE19826062B4 (de) 1998-06-12 2006-12-14 Smiths Heimann Gmbh Verfahren und Anordnung zur Detektion von Röntgenstrahlen
US6442233B1 (en) 1998-06-18 2002-08-27 American Science And Engineering, Inc. Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection
US6621888B2 (en) 1998-06-18 2003-09-16 American Science And Engineering, Inc. X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects
US6118852A (en) 1998-07-02 2000-09-12 General Electric Company Aluminum x-ray transmissive window for an x-ray tube vacuum vessel
US6417797B1 (en) 1998-07-14 2002-07-09 Cirrus Logic, Inc. System for A multi-purpose portable imaging device and methods for using same
US6278115B1 (en) * 1998-08-28 2001-08-21 Annistech, Inc. X-ray inspection system detector with plastic scintillating material
US6266390B1 (en) 1998-09-21 2001-07-24 Spectramet, Llc High speed materials sorting using x-ray fluorescence
US6188745B1 (en) * 1998-09-23 2001-02-13 Analogic Corporation CT scanner comprising a spatially encoded detector array arrangement and method
US6183139B1 (en) * 1998-10-06 2001-02-06 Cardiac Mariners, Inc. X-ray scanning method and apparatus
US6642513B1 (en) 1998-10-06 2003-11-04 General Electric Company Materials and apparatus for the detection of contraband
JP2000107173A (ja) 1998-10-08 2000-04-18 Fuji Photo Film Co Ltd 3次元用放射線画像形成装置
US6021174A (en) * 1998-10-26 2000-02-01 Picker International, Inc. Use of shaped charge explosives in the manufacture of x-ray tube targets
US6301326B2 (en) 1998-11-02 2001-10-09 Perkinelmer Detection Systems, Inc. Sheet detection system
JP2000139891A (ja) 1998-11-17 2000-05-23 Toshiba Corp 放射線診断装置
US6229870B1 (en) 1998-11-25 2001-05-08 Picker International, Inc. Multiple fan beam computed tomography system
US6125167A (en) 1998-11-25 2000-09-26 Picker International, Inc. Rotating anode x-ray tube with multiple simultaneously emitting focal spots
US7050536B1 (en) 1998-11-30 2006-05-23 Invision Technologies, Inc. Nonintrusive inspection system
US6320933B1 (en) 1998-11-30 2001-11-20 American Science And Engineering, Inc. Multiple scatter system for threat identification
WO2000033109A1 (en) 1998-11-30 2000-06-08 American Science And Engineering, Inc. Fan and pencil beams from a common source for x-ray inspection
US6453007B2 (en) 1998-11-30 2002-09-17 American Science And Engineering, Inc. X-ray inspection using co-planar pencil and fan beams
DE19855213C2 (de) 1998-11-30 2001-03-15 Siemens Ag Röntgenaufnahmeeinrichtung
DE69937067D1 (de) * 1998-11-30 2007-10-18 Invision Technologies Inc Eindringungsfreies untersuchungssystem
US6249567B1 (en) 1998-12-01 2001-06-19 American Science & Engineering, Inc. X-ray back scatter imaging system for undercarriage inspection
US6421420B1 (en) * 1998-12-01 2002-07-16 American Science & Engineering, Inc. Method and apparatus for generating sequential beams of penetrating radiation
US6181765B1 (en) * 1998-12-10 2001-01-30 General Electric Company X-ray tube assembly
US6282260B1 (en) 1998-12-14 2001-08-28 American Science & Engineering, Inc. Unilateral hand-held x-ray inspection apparatus
EP1147406A1 (en) 1998-12-22 2001-10-24 American Science &amp; Engineering, Inc. Unilateral hand-held x-ray inspection apparatus
US6195444B1 (en) * 1999-01-12 2001-02-27 Analogic Corporation Apparatus and method for detecting concealed objects in computed tomography data
US6345113B1 (en) * 1999-01-12 2002-02-05 Analogic Corporation Apparatus and method for processing object data in computed tomography data using object projections
US6687333B2 (en) * 1999-01-25 2004-02-03 Vanderbilt University System and method for producing pulsed monochromatic X-rays
US6429578B1 (en) 1999-01-26 2002-08-06 Mats Danielsson Diagnostic and therapeutic detector system for imaging with low and high energy X-ray and electrons
US6459764B1 (en) 1999-01-27 2002-10-01 American Science And Engineering, Inc. Drive-through vehicle inspection system
JP2000235007A (ja) * 1999-02-15 2000-08-29 Hitachi Engineering & Services Co Ltd X線ctスキャナ装置およびx線貨物検査方法
US6185272B1 (en) * 1999-03-15 2001-02-06 Analogic Corporation Architecture for CT scanning system
US6256369B1 (en) 1999-03-31 2001-07-03 Analogic Corporation Computerized tomography scanner with longitudinal flying focal spot
DE19916664A1 (de) 1999-04-14 2000-10-19 Heimann Systems Gmbh & Co Verfahren zur Bearbeitung eines Röntgenbildes
US6342696B1 (en) 1999-05-25 2002-01-29 The Macaleese Companies, Inc. Object detection method and apparatus employing polarized radiation
US6856271B1 (en) 1999-05-25 2005-02-15 Safe Zone Systems, Inc. Signal processing for object detection system
GB9914705D0 (en) 1999-06-23 1999-08-25 Stereo Scan Systems Limited Castellated linear array scintillator system
JP4154805B2 (ja) 1999-06-28 2008-09-24 株式会社島津製作所 X線断層撮像装置
JP4261691B2 (ja) 1999-07-13 2009-04-30 浜松ホトニクス株式会社 X線管
US6456684B1 (en) 1999-07-23 2002-09-24 Inki Mun Surgical scanning system and process for use thereof
US6546072B1 (en) * 1999-07-30 2003-04-08 American Science And Engineering, Inc. Transmission enhanced scatter imaging
EP1206903A2 (en) 1999-07-30 2002-05-22 American Science &amp; Engineering, Inc. Method for raster scanning an x-ray tube focal spot
US6269142B1 (en) * 1999-08-11 2001-07-31 Steven W. Smith Interrupted-fan-beam imaging
JP3208426B2 (ja) 1999-09-14 2001-09-10 経済産業省産業技術総合研究所長 高速x線ctによる被写移動体速度及び高解像度情報の計測方法及びその装置
SE517315C2 (sv) 1999-09-17 2002-05-21 Sik Inst Foer Livsmedel Och Bi Apparat och metod för detektering av främmande kroppar i produkter
DE19954663B4 (de) 1999-11-13 2006-06-08 Smiths Heimann Gmbh Verfahren und Vorrichtung zur Bestimmung eines Materials eines detektierten Gegenstandes
US6542578B2 (en) 1999-11-13 2003-04-01 Heimann Systems Gmbh Apparatus for determining the crystalline and polycrystalline materials of an item
JP4460695B2 (ja) 1999-11-24 2010-05-12 株式会社東芝 X線コンピュータ断層撮影装置
US6528787B2 (en) 1999-11-30 2003-03-04 Jeol Ltd. Scanning electron microscope
US6763635B1 (en) 1999-11-30 2004-07-20 Shook Mobile Technology, Lp Boom with mast assembly
JP2001176408A (ja) 1999-12-15 2001-06-29 New Japan Radio Co Ltd 電子管
US6324247B1 (en) 1999-12-30 2001-11-27 Ge Medical Systems Global Technology Company, Llc Partial scan weighting for multislice CT imaging with arbitrary pitch
US6891381B2 (en) 1999-12-30 2005-05-10 Secure Logistix Human body: scanning, typing and profiling system
US6469624B1 (en) 2000-01-03 2002-10-22 3-J Tech., Ltd. Non-obtrusive weapon detection system
US6418189B1 (en) 2000-01-24 2002-07-09 Analogic Corporation Explosive material detection apparatus and method using dual energy information of a scan
US7079624B1 (en) 2000-01-26 2006-07-18 Varian Medical Systems, Inc. X-Ray tube and method of manufacture
US20050117683A1 (en) 2000-02-10 2005-06-02 Andrey Mishin Multiple energy x-ray source for security applications
US20050105665A1 (en) 2000-03-28 2005-05-19 Lee Grodzins Detection of neutrons and sources of radioactive material
US7010094B2 (en) 2000-02-10 2006-03-07 American Science And Engineering, Inc. X-ray inspection using spatially and spectrally tailored beams
US6459761B1 (en) 2000-02-10 2002-10-01 American Science And Engineering, Inc. Spectrally shaped x-ray inspection system
JP2001233440A (ja) 2000-02-21 2001-08-28 New Tokyo International Airport Authority 手荷物自動選別システム
US6324243B1 (en) 2000-02-23 2001-11-27 General Electric Company Method and apparatus for reconstructing images from projection data acquired by a computed tomography system
DE10196075B3 (de) 2000-03-01 2015-08-20 Tsinghua University Containeruntersuchungsvorrichtung
GB2360405A (en) 2000-03-14 2001-09-19 Sharp Kk A common-gate level-shifter exhibiting a high input impedance when disabled
JP4161513B2 (ja) 2000-04-21 2008-10-08 株式会社島津製作所 二次ターゲット装置及び蛍光x線分析装置
CA2348150C (en) * 2000-05-25 2007-03-13 Esam M.A. Hussein Non-rotating x-ray system for three-dimensional, three-parameter imaging
JP2001351551A (ja) 2000-06-06 2001-12-21 Kazuo Taniguchi X線管
US20020031202A1 (en) * 2000-06-07 2002-03-14 Joseph Callerame X-ray scatter and transmission system with coded beams
JP3481186B2 (ja) 2000-06-08 2003-12-22 メディエックステック株式会社 X線発生器、x線検査装置およびx線発生方法
US7132123B2 (en) 2000-06-09 2006-11-07 Cymer, Inc. High rep-rate laser with improved electrodes
US6480571B1 (en) 2000-06-20 2002-11-12 Varian Medical Systems, Inc. Drive assembly for an x-ray tube having a rotating anode
US6341154B1 (en) 2000-06-22 2002-01-22 Ge Medical Systems Global Technology Company, Llc Methods and apparatus for fast CT imaging helical weighting
AUPQ831200A0 (en) * 2000-06-22 2000-07-13 X-Ray Technologies Pty Ltd X-ray micro-target source
US6628745B1 (en) 2000-07-01 2003-09-30 Martin Annis Imaging with digital tomography and a rapidly moving x-ray source
GB2364390B (en) 2000-07-03 2004-11-17 Yousri Mohammad Tah Haj-Yousef A method and device for detecting and monitoring concealed bodies and objects
FR2811799B1 (fr) 2000-07-13 2003-06-13 Commissariat Energie Atomique Procede et dispositif de commande d'une source d'electrons a structure matricielle, avec regulation par la charge emise
JP2002039966A (ja) 2000-07-19 2002-02-06 Mitsubishi Heavy Ind Ltd 検査車両
US6839403B1 (en) 2000-07-24 2005-01-04 Rapiscan Security Products (Usa), Inc. Generation and distribution of annotation overlays of digital X-ray images for security systems
US6434219B1 (en) 2000-07-24 2002-08-13 American Science And Engineering, Inc. Chopper wheel with two axes of rotation
US6812426B1 (en) 2000-07-24 2004-11-02 Rapiscan Security Products Automatic reject unit spacer and diverter
DE10036210A1 (de) 2000-07-25 2001-11-15 Siemens Ag Drehkolbenröhre
CA2355560C (en) 2000-08-28 2003-11-18 Balza Achmad X-ray compton scatter density measurement at a point within an object
US6837422B1 (en) 2000-09-01 2005-01-04 Heimann Systems Gmbh Service unit for an X-ray examining device
DE10044357A1 (de) 2000-09-07 2002-03-21 Heimann Systems Gmbh & Co Detektoranordnung zur Detektion von Röntgenstrahlen
US6907281B2 (en) 2000-09-07 2005-06-14 Ge Medical Systems Fast mapping of volumetric density data onto a two-dimensional screen
US6580780B1 (en) 2000-09-07 2003-06-17 Varian Medical Systems, Inc. Cooling system for stationary anode x-ray tubes
AU9088701A (en) * 2000-09-14 2002-03-26 Univ Leland Stanford Junior Assessing condition of a joint and cartilage loss
AU2002235122A1 (en) 2000-09-27 2002-05-21 The Johns Hopkins University System and method of radar detection of non linear interfaces
US6737652B2 (en) 2000-09-29 2004-05-18 Massachusetts Institute Of Technology Coded aperture imaging
DE10048775B4 (de) * 2000-09-29 2006-02-02 Siemens Ag Röntgen-Computertomographieeinrichtung
US7082182B2 (en) 2000-10-06 2006-07-25 The University Of North Carolina At Chapel Hill Computed tomography system for imaging of human and small animal
US6980627B2 (en) 2000-10-06 2005-12-27 Xintek, Inc. Devices and methods for producing multiple x-ray beams from multiple locations
US6876724B2 (en) 2000-10-06 2005-04-05 The University Of North Carolina - Chapel Hill Large-area individually addressable multi-beam x-ray system and method of forming same
US7826595B2 (en) 2000-10-06 2010-11-02 The University Of North Carolina Micro-focus field emission x-ray sources and related methods
US6553096B1 (en) 2000-10-06 2003-04-22 The University Of North Carolina Chapel Hill X-ray generating mechanism using electron field emission cathode
US20040213378A1 (en) 2003-04-24 2004-10-28 The University Of North Carolina At Chapel Hill Computed tomography system for imaging of human and small animal
AU2001294014A1 (en) 2000-10-11 2002-04-22 University Of Southampton Gamma-ray spectrometry
US6748043B1 (en) 2000-10-19 2004-06-08 Analogic Corporation Method and apparatus for stabilizing the measurement of CT numbers
JP4476471B2 (ja) 2000-11-27 2010-06-09 株式会社東芝 X線コンピュータ断層撮影装置
US6735271B1 (en) 2000-11-28 2004-05-11 Ge Medical Systems Global Technology Company Llc Electron beam computed tomographic scanner system with helical or tilted target, collimator, and detector components to eliminate cone beam error and to scan continuously moving objects
JP2002168805A (ja) 2000-11-28 2002-06-14 Anritsu Corp X線異物検出装置
DE10062214B4 (de) 2000-12-13 2013-01-24 Smiths Heimann Gmbh Vorrichtungen zur Durchleuchtung von Objekten
US6708572B2 (en) 2000-12-22 2004-03-23 General Electric Company Portal trace detection systems for detection of imbedded particles
JP2002195961A (ja) * 2000-12-25 2002-07-10 Shimadzu Corp X線撮像装置
US6473487B1 (en) 2000-12-27 2002-10-29 Rapiscan Security Products, Inc. Method and apparatus for physical characteristics discrimination of objects using a limited view three dimensional reconstruction
US20020085674A1 (en) 2000-12-29 2002-07-04 Price John Scott Radiography device with flat panel X-ray source
US6430260B1 (en) 2000-12-29 2002-08-06 General Electric Company X-ray tube anode cooling device and systems incorporating same
US6385292B1 (en) 2000-12-29 2002-05-07 Ge Medical Systems Global Technology Company, Llc Solid-state CT system and method
DE10100664A1 (de) 2001-01-09 2002-07-11 Hauni Maschinenbau Ag Verfahren zum Prüfen eines Produktionsmaterials
US6449331B1 (en) 2001-01-09 2002-09-10 Cti, Inc. Combined PET and CT detector and method for using same
JP2002216106A (ja) 2001-01-16 2002-08-02 Fuji Photo Film Co Ltd エネルギーサブトラクション画像生成方法および装置
US6487274B2 (en) 2001-01-29 2002-11-26 Siemens Medical Solutions Usa, Inc. X-ray target assembly and radiation therapy systems and methods
JP2002320610A (ja) 2001-02-23 2002-11-05 Mitsubishi Heavy Ind Ltd X線ct装置とx線ct装置撮影方法
CA2410892A1 (en) * 2001-02-28 2002-11-29 Mitsubishi Heavy Industries, Ltd. Multi-radiation source x-ray ct apparatus
JP2002257751A (ja) 2001-03-01 2002-09-11 Kawasaki Heavy Ind Ltd 手荷物検査方法および手荷物検査システム
US6480572B2 (en) 2001-03-09 2002-11-12 Koninklijke Philips Electronics N.V. Dual filament, electrostatically controlled focal spot for x-ray tubes
US6480141B1 (en) 2001-03-13 2002-11-12 Sandia Corporation Detection of contraband using microwave radiation
US6876322B2 (en) 2003-06-26 2005-04-05 Battelle Memorial Institute Concealed object detection
US6324249B1 (en) 2001-03-21 2001-11-27 Agilent Technologies, Inc. Electronic planar laminography system and method
US6965199B2 (en) 2001-03-27 2005-11-15 The University Of North Carolina At Chapel Hill Coated electrode with enhanced electron emission and ignition characteristics
US6501414B2 (en) 2001-04-02 2002-12-31 The United States Of America As Represented By The United States National Aeronautics And Space Administration Method for locating a concealed object
WO2002082125A1 (en) * 2001-04-03 2002-10-17 L-3 Communications Security & Detection Systems X-ray inspection system
US6721391B2 (en) * 2001-04-03 2004-04-13 L-3 Communications Security And Detection Systems Remote baggage screening system, software and method
US6477417B1 (en) 2001-04-12 2002-11-05 Pacesetter, Inc. System and method for automatically selecting electrode polarity during sensing and stimulation
US6813374B1 (en) 2001-04-25 2004-11-02 Analogic Corporation Method and apparatus for automatic image quality assessment
EP1428048A2 (en) 2001-05-03 2004-06-16 American Science &amp; Engineering, Inc. Nautical x-ray inspection system
US6624425B2 (en) 2001-05-03 2003-09-23 Bio-Imaging Research, Inc. Waste inspection tomography and non-destructive assay
DE10123365A1 (de) 2001-05-14 2002-11-28 Infineon Technologies Ag Verfahren und Vorrichtung zum Ermitteln von Bewegung in mindestens zwei zeitlich aufeinander folgenden digitalen Bildern, Computerlesbares Speichermedium und Computerprogramm-Element
US6597760B2 (en) 2001-05-23 2003-07-22 Heimann Systems Gmbh Inspection device
US6580778B2 (en) 2001-05-23 2003-06-17 Heimann Systems Gmbh Inspection device
JP4777539B2 (ja) 2001-05-29 2011-09-21 エスアイアイ・ナノテクノロジー株式会社 複合x線分析装置
US6721387B1 (en) * 2001-06-13 2004-04-13 Analogic Corporation Method of and system for reducing metal artifacts in images generated by x-ray scanning devices
JP2002370814A (ja) 2001-06-13 2002-12-24 Ito Denki Kk 搬送装置
DE10129463A1 (de) 2001-06-19 2003-01-02 Philips Corp Intellectual Pty Röntgenstrahler mit einem Flüssigmetall-Target
GB0115615D0 (en) 2001-06-27 2001-08-15 Univ Coventry Image segmentation
US6663280B2 (en) 2001-06-28 2003-12-16 Heimann Systems Gmbh Inspection unit
US6735477B2 (en) 2001-07-09 2004-05-11 Robert A. Levine Internal monitoring system with detection of food intake
US6470065B1 (en) 2001-07-13 2002-10-22 Siemens Aktiengesellschaft Apparatus for computer tomography scanning with compression of measurement data
US6650276B2 (en) 2001-07-13 2003-11-18 James C. Lawless Radar apparatus and method for detecting small slow moving targets
US20030023592A1 (en) 2001-07-27 2003-01-30 Rapiscan Security Products (Usa), Inc. Method and system for certifying operators of x-ray inspection systems
US6661876B2 (en) * 2001-07-30 2003-12-09 Moxtek, Inc. Mobile miniature X-ray source
US6665433B2 (en) 2001-07-31 2003-12-16 Agilent Technologies, Inc. Automatic X-ray determination of solder joint and view Delta Z values from a laser mapped reference surface for circuit board inspection using X-ray laminography
US6914959B2 (en) 2001-08-09 2005-07-05 Analogic Corporation Combined radiation therapy and imaging system and method
US6636623B2 (en) * 2001-08-10 2003-10-21 Visiongate, Inc. Optical projection imaging system and method for automatically detecting cells with molecular marker compartmentalization associated with malignancy and disease
DE10139672A1 (de) 2001-08-11 2003-03-06 Heimann Systems Gmbh & Co Verfahren und Anlage zur Inspektion eines Objektes, insbesondere eines Gepäckstückes
CN1185482C (zh) 2001-08-14 2005-01-19 清华大学 航空集装箱/托盘货物检查***
US7072436B2 (en) 2001-08-24 2006-07-04 The Board Of Trustees Of The Leland Stanford Junior University Volumetric computed tomography (VCT)
US6636581B2 (en) 2001-08-31 2003-10-21 Michael R. Sorenson Inspection system and method
DE10143131B4 (de) * 2001-09-03 2006-03-09 Siemens Ag Verfahren zur Ermittlung von Dichte- und Ordnungszahlverteilungen bei radiographischen Untersuchungsverfahren
US6831590B1 (en) 2001-09-12 2004-12-14 Cyterra Corporation Concealed object detection
JP3699666B2 (ja) 2001-09-19 2005-09-28 株式会社リガク X線管の熱陰極
WO2003027637A2 (en) 2001-09-24 2003-04-03 Oregon Health And Science University Assessment of neurons in the arcuate nucleus to screen for agents that modify feeding behavior
GB0123492D0 (en) 2001-09-29 2001-11-21 Logan Fabricom Ltd Baggage screening system
CA2462523A1 (en) 2001-10-01 2003-04-10 L-3 Communications Security & Detection Systems Remote data access
US20030085163A1 (en) * 2001-10-01 2003-05-08 Chan Chin F. Remote data access
US7734066B2 (en) * 2003-11-19 2010-06-08 L-3 Communications Security And Detection Systems, Inc. Security system with distributed computing
US6751293B1 (en) 2001-10-05 2004-06-15 Varian Medical Systems, Inc. Rotary component support system
DE10149254B4 (de) * 2001-10-05 2006-04-20 Smiths Heimann Gmbh Verfahren und Vorrichtung zur Detektion eines bestimmten Materials in einem Objekt mittels elektromagnetischer Strahlen
US7072440B2 (en) 2001-10-19 2006-07-04 Control Screening, Llc Tomographic scanning X-ray inspection system using transmitted and Compton scattered radiation
US6661867B2 (en) * 2001-10-19 2003-12-09 Control Screening, Llc Tomographic scanning X-ray inspection system using transmitted and compton scattered radiation
JP3847134B2 (ja) 2001-10-19 2006-11-15 三井造船株式会社 放射線検出装置
AU2002348143A1 (en) 2001-10-31 2003-05-12 Vrex, Inc. 3d stereoscopic x-ray system with two different object trajectories
JP2003135442A (ja) 2001-11-06 2003-05-13 Ge Medical Systems Global Technology Co Llc X線ctシステムおよびその制御方法
US6674838B1 (en) 2001-11-08 2004-01-06 Varian Medical Systems, Inc. X-ray tube having a unitary vacuum enclosure and housing
WO2003042674A1 (en) 2001-11-14 2003-05-22 Texas Tech University Method for identification of cotton contaminants with x-ray microtomographic image analysis
US6707882B2 (en) 2001-11-14 2004-03-16 Koninklijke Philips Electronics, N.V. X-ray tube heat barrier
GB0128659D0 (en) 2001-11-30 2002-01-23 Qinetiq Ltd Imaging system and method
US6819742B1 (en) 2001-12-07 2004-11-16 Varian Medical Systems, Inc. Integrated component mounting system for use in an X-ray tube
CA2365045A1 (en) 2001-12-14 2003-06-14 Cedara Software Corp. Method for the detection of guns and ammunition in x-ray scans of containers for security assurance
WO2003051201A2 (en) 2001-12-14 2003-06-26 Wisconsin Alumni Research Foundation Virtual spherical anode computed tomography
AU2002366300A1 (en) 2001-12-19 2003-06-30 Agresearch Limited A phantom
US7012256B1 (en) 2001-12-21 2006-03-14 National Recovery Technologies, Inc. Computer assisted bag screening system
JP3888156B2 (ja) 2001-12-26 2007-02-28 株式会社日立製作所 放射線検査装置
US6542580B1 (en) 2002-01-15 2003-04-01 Rapiscan Security Products (Usa), Inc. Relocatable X-ray imaging system and method for inspecting vehicles and containers
US6922455B2 (en) 2002-01-28 2005-07-26 Starfire Industries Management, Inc. Gas-target neutron generation and applications
EP1488441A2 (en) 2002-01-31 2004-12-22 The Johns Hopkins University X-ray source and method for more efficiently producing selectable x-ray frequencies
US6816571B2 (en) * 2002-02-06 2004-11-09 L-3 Communications Security And Detection Systems Corporation Delaware Method and apparatus for transmitting information about a target object between a prescanner and a CT scanner
US6754298B2 (en) 2002-02-20 2004-06-22 The Regents Of The University Of Michigan Method for statistically reconstructing images from a plurality of transmission measurements having energy diversity and image reconstructor apparatus utilizing the method
US6618466B1 (en) 2002-02-21 2003-09-09 University Of Rochester Apparatus and method for x-ray scatter reduction and correction for fan beam CT and cone beam volume CT
US6654443B1 (en) * 2002-02-25 2003-11-25 Ge Medical Systems Global Technology Co., Llc Thermal sensing detector cell for a computed tomography system and method of manufacturing same
US6459755B1 (en) 2002-02-26 2002-10-01 Ge Medical Systems Global Technology Co. Llc Method and apparatus for administering low dose CT scans
US6775348B2 (en) 2002-02-27 2004-08-10 General Electric Company Fiber optic scintillator with optical gain for a computed tomography system and method of manufacturing same
JP3910468B2 (ja) 2002-02-28 2007-04-25 株式会社東芝 回転陽極型x線管
US7110493B1 (en) 2002-02-28 2006-09-19 Rapiscan Security Products (Usa), Inc. X-ray detector system having low Z material panel
US7868665B2 (en) 2002-03-05 2011-01-11 Nova R&D, Inc. Integrated circuit and sensor for imaging
US6665373B1 (en) 2002-03-12 2003-12-16 Rapiscan Security Products (Usa), Inc. X-ray imaging system with active detector
JP2005520661A (ja) 2002-03-23 2005-07-14 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 対象に含まれる構造のインタラクティブなセグメンテーションの方法
US6647095B2 (en) 2002-04-02 2003-11-11 Ge Medical Systems Global Technology Co., Llc Method and apparatus for optimizing dosage to scan subject
US20040077943A1 (en) 2002-04-05 2004-04-22 Meaney Paul M. Systems and methods for 3-D data acquisition for microwave imaging
AU2003262118A1 (en) 2002-04-08 2003-10-27 Nanodynamics, Inc. High quantum energy efficiency x-ray tube and targets
US6760407B2 (en) 2002-04-17 2004-07-06 Ge Medical Global Technology Company, Llc X-ray source and method having cathode with curved emission surface
US7087902B2 (en) 2002-04-19 2006-08-08 Rensselaer Polytechnic Institute Fresnel lens tomographic imaging
US7295691B2 (en) * 2002-05-15 2007-11-13 Ge Medical Systems Global Technology Company, Llc Computer aided diagnosis of an image set
US6796944B2 (en) 2002-05-17 2004-09-28 Ge Medical Systems Global Technology, Llc Display for subtraction imaging techniques
AU2003237995A1 (en) 2002-06-10 2003-12-22 American Science And Engineering, Inc. Scanner for x-ray inspection comprising a chopper wheel with differently sized apertures
US7106830B2 (en) 2002-06-12 2006-09-12 Agilent Technologies, Inc. 3D x-ray system adapted for high speed scanning of large articles
US6754300B2 (en) 2002-06-20 2004-06-22 Ge Medical Systems Global Technology Company, Llc Methods and apparatus for operating a radiation source
JP2004028675A (ja) 2002-06-24 2004-01-29 Hitachi Ltd 危険物検知システム
US6654440B1 (en) 2002-06-29 2003-11-25 Ge Medical Systems Global Technology Company, Llc Methods and apparatus for computed tomography scanning using a two-dimensional radiation source
NL1021026C2 (nl) 2002-07-08 2004-01-09 Havatec B V Werkwijze en inrichting voor het sorteren van bloembollen op afwijkingen en ziektes.
US6770884B2 (en) 2002-07-11 2004-08-03 Triumf High resolution 3-D position sensitive detector for gamma rays
US7162005B2 (en) 2002-07-19 2007-01-09 Varian Medical Systems Technologies, Inc. Radiation sources and compact radiation scanning systems
GB0216889D0 (en) 2002-07-20 2002-08-28 Univ Surrey Image control
GB0216891D0 (en) 2002-07-20 2002-08-28 Univ Surrey Radiation collimation
GB0216893D0 (en) 2002-07-20 2002-08-28 Univ Surrey Image colouring
US7050529B2 (en) 2002-07-23 2006-05-23 Ge Medical Systems Global Technolgy Company, Llc Methods and apparatus for performing a computed tomography scan
US7486768B2 (en) 2002-07-23 2009-02-03 Rapiscan Security Products, Inc. Self-contained mobile inspection system and method
US20040016271A1 (en) 2002-07-23 2004-01-29 Kirti Shah Portable inspection containers
US7322745B2 (en) 2002-07-23 2008-01-29 Rapiscan Security Products, Inc. Single boom cargo scanning system
US6843599B2 (en) 2002-07-23 2005-01-18 Rapiscan, Inc. Self-contained, portable inspection system and method
US7369643B2 (en) 2002-07-23 2008-05-06 Rapiscan Security Products, Inc. Single boom cargo scanning system
US7356115B2 (en) 2002-12-04 2008-04-08 Varian Medical Systems Technology, Inc. Radiation scanning units including a movable platform
US7103137B2 (en) 2002-07-24 2006-09-05 Varian Medical Systems Technology, Inc. Radiation scanning of objects for contraband
US6785359B2 (en) 2002-07-30 2004-08-31 Ge Medical Systems Global Technology Company, Llc Cathode for high emission x-ray tube
JP2004079128A (ja) 2002-08-22 2004-03-11 Matsushita Electric Ind Co Ltd 光ディスク記録装置
US6661866B1 (en) 2002-08-28 2003-12-09 Ge Medical Systems Global Technology Company, Llc Integrated CT-PET system
AU2003268462A1 (en) 2002-09-03 2004-03-29 Parker Medical, Inc. Multiple grooved x-ray generator
US7155812B1 (en) * 2002-09-05 2007-01-02 Sandia Corporation Method for producing a tube
US7006591B2 (en) 2002-09-09 2006-02-28 Kabushiki Kaisha Toshiba Computed tomography apparatus and program
US7062009B2 (en) 2002-09-12 2006-06-13 Analogic Corporation Helical interpolation for an asymmetric multi-slice scanner
KR20050083718A (ko) 2002-10-02 2005-08-26 리빌 이미징 테크놀로지스, 인코포레이티드 폴디드 어레이형 ct 수화물 스캐너
US7224765B2 (en) 2002-10-02 2007-05-29 Reveal Imaging Technologies, Inc. Computed tomography system
US7078699B2 (en) 2002-10-04 2006-07-18 Varian Medical Systems Technologies, Inc. Imaging apparatus and method with event sensitive photon detection
US7203629B2 (en) 2002-10-09 2007-04-10 State Of Oregon Acting By And Through The Oregon State Board Of Higher Education On Behalf Of Oregon State University Modeling substrate noise coupling using scalable parameters
CN1181336C (zh) 2002-10-16 2004-12-22 清华大学 一种车载移动式集装箱检查***
US7042975B2 (en) 2002-10-25 2006-05-09 Koninklijke Philips Electronics N.V. Four-dimensional helical tomographic scanner
US7505556B2 (en) 2002-11-06 2009-03-17 American Science And Engineering, Inc. X-ray backscatter detection imaging modules
US7099434B2 (en) 2002-11-06 2006-08-29 American Science And Engineering, Inc. X-ray backscatter mobile inspection van
FR2847074B1 (fr) 2002-11-08 2005-02-25 Thales Sa Generateur de rayons x a dissipation thermique amelioree et procede de realisation du generateur
US7023956B2 (en) * 2002-11-11 2006-04-04 Lockheed Martin Corporaiton Detection methods and system using sequenced technologies
DE10252662A1 (de) 2002-11-11 2004-05-27 Philips Intellectual Property & Standards Gmbh Computertomographie-Verfahren mit kohärenten Streustrahlen und Computertomograph
JP2004182977A (ja) 2002-11-18 2004-07-02 Fuji Photo Film Co Ltd インクジェット用カラーインク
US6859518B2 (en) 2002-11-19 2005-02-22 Invision Technologies, Inc. X-ray technique-based nonintrusive inspection apparatus
JP2004177138A (ja) 2002-11-25 2004-06-24 Hitachi Ltd 危険物探知装置および危険物探知方法
US7272429B2 (en) 2002-11-27 2007-09-18 Ge Medical Systems Global Technology Company, Llc Methods and apparatus for facilitating a reduction in artifacts
US7672426B2 (en) 2002-12-04 2010-03-02 Varian Medical Systems, Inc. Radiation scanning units with reduced detector requirements
WO2004054329A2 (en) 2002-12-10 2004-06-24 Digitome Corporation Volumetric 3d x-ray imaging system for baggage inspection including the detection of explosives
US7062011B1 (en) 2002-12-10 2006-06-13 Analogic Corporation Cargo container tomography scanning system
US7177387B2 (en) * 2003-11-29 2007-02-13 General Electric Company Self-aligning scintillator-collimator assembly
US6993115B2 (en) * 2002-12-31 2006-01-31 Mcguire Edward L Forward X-ray generation
US7166458B2 (en) * 2003-01-07 2007-01-23 Bio Tex, Inc. Assay and method for analyte sensing by detecting efficiency of radiation conversion
US6785357B2 (en) 2003-01-16 2004-08-31 Bio-Imaging Research, Inc. High energy X-ray mobile cargo inspection system with penumbra collimator
US7072434B1 (en) 2003-01-16 2006-07-04 Analogic Corporation Carry-on baggage tomography scanning system
JP4601607B2 (ja) * 2003-01-23 2010-12-22 リビール イメージング テクノロジーズ, インコーポレイテッド 手荷物のctスキャンシステム及びctスキャン方法
JP2004226253A (ja) 2003-01-23 2004-08-12 Shimadzu Corp X線異物検査装置
US7340525B1 (en) 2003-01-24 2008-03-04 Oracle International Corporation Method and apparatus for single sign-on in a wireless environment
US7184520B1 (en) 2003-01-29 2007-02-27 Varian Medical Systems Technologies, Inc. Component mounting system with stress compensation
JP3779957B2 (ja) 2003-01-30 2006-05-31 アンリツ産機システム株式会社 X線異物検出装置
US7317782B2 (en) 2003-01-31 2008-01-08 Varian Medical Systems Technologies, Inc. Radiation scanning of cargo conveyances at seaports and the like
US7263160B2 (en) 2003-02-13 2007-08-28 Koninklijke Philips Electronics N.V. Method and device for examining an object
US7149339B2 (en) 2003-02-25 2006-12-12 Schlumberger Technology Corporation Non-destructive inspection of downhole equipment
US7065175B2 (en) 2003-03-03 2006-06-20 Varian Medical Systems Technologies, Inc. X-ray diffraction-based scanning system
US6907101B2 (en) 2003-03-03 2005-06-14 General Electric Company CT detector with integrated air gap
US6947517B2 (en) 2003-03-03 2005-09-20 Ge Medical Systems Global Technology Company, Llc Scintillator array having a reflector with integrated air gaps
US6933504B2 (en) 2003-03-12 2005-08-23 General Electric Company CT detector having a segmented optical coupler and method of manufacturing same
US6859514B2 (en) * 2003-03-14 2005-02-22 Ge Medical Systems Global Technology Company Llc CT detector array with uniform cross-talk
US7164750B2 (en) * 2003-03-26 2007-01-16 Smiths Detection, Inc. Non-destructive inspection of material in container
WO2004090576A2 (en) 2003-04-02 2004-10-21 Reveal Imaging Technologies, Inc. System and method for detection of explosives in baggage
US20050190882A1 (en) 2003-04-04 2005-09-01 Mcguire Edward L. Multi-spectral x-ray image processing
JP3795028B2 (ja) 2003-04-08 2006-07-12 株式会社エーイーティー X線発生装置および前記装置を用いたx線治療装置
US7466799B2 (en) 2003-04-09 2008-12-16 Varian Medical Systems, Inc. X-ray tube having an internal radiation shield
DE10318194A1 (de) 2003-04-22 2004-11-25 Siemens Ag Röntgenröhre mit Flüssigmetall-Gleitlager
GB0309383D0 (en) 2003-04-25 2003-06-04 Cxr Ltd X-ray tube electron sources
GB0309374D0 (en) * 2003-04-25 2003-06-04 Cxr Ltd X-ray sources
GB0309379D0 (en) * 2003-04-25 2003-06-04 Cxr Ltd X-ray scanning
GB0812864D0 (en) 2008-07-15 2008-08-20 Cxr Ltd Coolign anode
US10483077B2 (en) 2003-04-25 2019-11-19 Rapiscan Systems, Inc. X-ray sources having reduced electron scattering
US8804899B2 (en) 2003-04-25 2014-08-12 Rapiscan Systems, Inc. Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners
US7949101B2 (en) 2005-12-16 2011-05-24 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
GB0309371D0 (en) 2003-04-25 2003-06-04 Cxr Ltd X-Ray tubes
US8451974B2 (en) 2003-04-25 2013-05-28 Rapiscan Systems, Inc. X-ray tomographic inspection system for the identification of specific target items
US9208988B2 (en) 2005-10-25 2015-12-08 Rapiscan Systems, Inc. Graphite backscattered electron shield for use in an X-ray tube
US8204173B2 (en) 2003-04-25 2012-06-19 Rapiscan Systems, Inc. System and method for image reconstruction by using multi-sheet surface rebinning
US8837669B2 (en) 2003-04-25 2014-09-16 Rapiscan Systems, Inc. X-ray scanning system
US8223919B2 (en) 2003-04-25 2012-07-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
US8094784B2 (en) 2003-04-25 2012-01-10 Rapiscan Systems, Inc. X-ray sources
US20050058242A1 (en) * 2003-09-15 2005-03-17 Peschmann Kristian R. Methods and systems for the rapid detection of concealed objects
GB0309387D0 (en) * 2003-04-25 2003-06-04 Cxr Ltd X-Ray scanning
US9113839B2 (en) 2003-04-25 2015-08-25 Rapiscon Systems, Inc. X-ray inspection system and method
GB0525593D0 (en) 2005-12-16 2006-01-25 Cxr Ltd X-ray tomography inspection systems
US8243876B2 (en) 2003-04-25 2012-08-14 Rapiscan Systems, Inc. X-ray scanners
GB0903198D0 (en) 2009-02-25 2009-04-08 Cxr Ltd X-Ray scanners
US8331535B2 (en) 2003-04-25 2012-12-11 Rapiscan Systems, Inc. Graphite backscattered electron shield for use in an X-ray tube
GB0309385D0 (en) 2003-04-25 2003-06-04 Cxr Ltd X-ray monitoring
US7112797B2 (en) 2003-04-30 2006-09-26 General Electric Company Scintillator having integrated collimator and method of manufacturing same
DE10319547B4 (de) 2003-04-30 2012-02-16 Siemens Ag Drehanoden-Röntgenröhre
US7054408B2 (en) 2003-04-30 2006-05-30 General Electric Company CT detector array having non pixelated scintillator array
DE10319549B3 (de) 2003-04-30 2004-12-23 Siemens Ag Drehanoden-Röntgenröhre
US6934354B2 (en) * 2003-05-02 2005-08-23 General Electric Company Collimator assembly having multi-piece components
US7068749B2 (en) * 2003-05-19 2006-06-27 General Electric Company Stationary computed tomography system with compact x ray source assembly
US6972693B2 (en) 2003-05-19 2005-12-06 Brown Betty J Vehicle security inspection system
JP4206819B2 (ja) * 2003-05-20 2009-01-14 株式会社日立製作所 X線撮影装置
US7046756B2 (en) 2003-05-20 2006-05-16 General Electric Company Rotatable filter for a pre-subject CT collimator having multiple filtering profiles
US6968030B2 (en) 2003-05-20 2005-11-22 General Electric Company Method and apparatus for presenting multiple pre-subject filtering profiles during CT data acquisition
US7092485B2 (en) 2003-05-27 2006-08-15 Control Screening, Llc X-ray inspection system for detecting explosives and other contraband
CN1794951A (zh) * 2003-05-28 2006-06-28 皇家飞利浦电子股份有限公司 扇形射束相干散射计算机断层摄影
JP2004357724A (ja) 2003-05-30 2004-12-24 Toshiba Corp X線ct装置、x線発生装置及びx線ct装置のデータ収集方法
US7120222B2 (en) 2003-06-05 2006-10-10 General Electric Company CT imaging system with multiple peak x-ray source
US6937692B2 (en) 2003-06-06 2005-08-30 Varian Medical Systems Technologies, Inc. Vehicle mounted inspection systems and methods
US6952163B2 (en) 2003-06-11 2005-10-04 Quantum Magnetics, Inc. Combined systems user interface for centralized monitoring of a screening checkpoint for passengers and baggage
US7119553B2 (en) 2003-06-11 2006-10-10 Konsulteurope Limited Limited Joint Stock Company Security scanners with capacitance and magnetic sensor arrays
US6922460B2 (en) 2003-06-11 2005-07-26 Quantum Magnetics, Inc. Explosives detection system using computed tomography (CT) and quadrupole resonance (QR) sensors
US7317390B2 (en) * 2003-06-11 2008-01-08 Quantum Magnetics, Inc. Screening checkpoint for passengers and baggage
US7366280B2 (en) 2003-06-19 2008-04-29 General Electric Company Integrated arc anode x-ray source for a computed tomography system
FR2856513A1 (fr) 2003-06-20 2004-12-24 Thales Sa Tube generateur de rayons x a ensemble porte-cible orientable
US6928141B2 (en) 2003-06-20 2005-08-09 Rapiscan, Inc. Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
WO2005009206A2 (en) 2003-06-25 2005-02-03 Besson Guy M Dynamic multi-spectral imaging system
US6975698B2 (en) 2003-06-30 2005-12-13 General Electric Company X-ray generator and slip ring for a CT system
US7197172B1 (en) * 2003-07-01 2007-03-27 Analogic Corporation Decomposition of multi-energy scan projections using multi-step fitting
CN100445767C (zh) 2003-07-08 2008-12-24 通用电气家园保护有限公司 安全检查站
US6975703B2 (en) 2003-08-01 2005-12-13 General Electric Company Notched transmission target for a multiple focal spot X-ray source
US7031434B1 (en) 2003-08-06 2006-04-18 General Electric Company Method of manufacturing, and a collimator mandrel having variable attenuation characteristics for a CT system
US7492855B2 (en) 2003-08-07 2009-02-17 General Electric Company System and method for detecting an object
US7010092B2 (en) 2003-08-08 2006-03-07 Imaging Dynamics Company Ltd. Dual energy imaging using optically coupled digital radiography system
US7856081B2 (en) 2003-09-15 2010-12-21 Rapiscan Systems, Inc. Methods and systems for rapid detection of concealed objects using fluorescence
US7366282B2 (en) 2003-09-15 2008-04-29 Rapiscan Security Products, Inc. Methods and systems for rapid detection of concealed objects using fluorescence
US20050117700A1 (en) 2003-08-08 2005-06-02 Peschmann Kristian R. Methods and systems for the rapid detection of concealed objects
US6901135B2 (en) 2003-08-28 2005-05-31 Bio-Imaging Research, Inc. System for extending the dynamic gain of an X-ray detector
US7279120B2 (en) 2003-09-04 2007-10-09 Intematix Corporation Doped cadmium tungstate scintillator with improved radiation hardness
JP3909048B2 (ja) * 2003-09-05 2007-04-25 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー X線ct装置およびx線管
JP2005110722A (ja) * 2003-10-02 2005-04-28 Shimadzu Corp X線管およびx線撮影装置
US7039154B1 (en) 2003-10-02 2006-05-02 Reveal Imaging Technologies, Inc. Folded array CT baggage scanner
US7038552B2 (en) 2003-10-07 2006-05-02 Analog Devices, Inc. Voltage controlled oscillator having improved phase noise
US6991371B2 (en) * 2003-10-14 2006-01-31 The Boeing Company Computed tomography image quality phantom
JP2007508561A (ja) * 2003-10-14 2007-04-05 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 非対称csct
US20050082491A1 (en) 2003-10-15 2005-04-21 Seppi Edward J. Multi-energy radiation detector
US7649981B2 (en) 2003-10-15 2010-01-19 Varian Medical Systems, Inc. Multi-energy x-ray source
CN100437096C (zh) * 2003-10-16 2008-11-26 清华大学 一种用于集装箱检查***的双辐射源框架结构
US6987833B2 (en) 2003-10-16 2006-01-17 General Electric Company Methods and apparatus for identification and imaging of specific materials
CN100437097C (zh) 2003-10-16 2008-11-26 清华大学 一种可调整辐射射线角度的集装货物/车辆检查***
US7068750B2 (en) 2003-10-27 2006-06-27 General Electric Company System and method of x-ray flux management control
US6996209B2 (en) * 2003-10-27 2006-02-07 Ge Medical Systems Global Technology Company, Llc Scintillator coatings having barrier protection, light transmission, and light reflection properties
US7076029B2 (en) 2003-10-27 2006-07-11 General Electric Company Method and apparatus of radiographic imaging with an energy beam tailored for a subject to be scanned
US6990171B2 (en) * 2003-10-27 2006-01-24 General Electric Company System and method of determining a user-defined region-of-interest of an imaging subject for x-ray flux management control
US7068751B2 (en) 2003-10-27 2006-06-27 General Electric Company System and method of determining a center of mass of an imaging subject for x-ray flux management control
US20050100126A1 (en) 2003-11-07 2005-05-12 Mistretta Charles A. Computed tomography with z-axis scanning
US7065179B2 (en) 2003-11-07 2006-06-20 General Electric Company Multiple target anode assembly and system of operation
US7081628B2 (en) 2003-11-10 2006-07-25 Ge Medical Systems Global Technology Company, Llc Spatially patterned light-blocking layers for radiation imaging detectors
US7366281B2 (en) 2003-11-12 2008-04-29 Ge Invision Inc. System and method for detecting contraband
US7099435B2 (en) 2003-11-15 2006-08-29 Agilent Technologies, Inc Highly constrained tomography for automated inspection of area arrays
US7206379B2 (en) 2003-11-25 2007-04-17 General Electric Company RF accelerator for imaging applications
US7233640B2 (en) 2003-11-26 2007-06-19 General Electric Company CT detector having an optical mask layer
US20050226364A1 (en) 2003-11-26 2005-10-13 General Electric Company Rotational computed tomography system and method
US7280631B2 (en) 2003-11-26 2007-10-09 General Electric Company Stationary computed tomography system and method
KR100659710B1 (ko) 2003-11-29 2006-12-21 삼성에스디아이 주식회사 발광 표시 장치 및 그 표시 패널
CN1627061A (zh) 2003-12-10 2005-06-15 清华同方威视技术股份有限公司 一种组合移动式低靶点集装箱检查***
US7308074B2 (en) 2003-12-11 2007-12-11 General Electric Company Multi-layer reflector for CT detector
US7027553B2 (en) * 2003-12-29 2006-04-11 Ge Medical Systems Global Technology Company, Llc Systems and methods for generating images by using monochromatic x-rays
IL159828A0 (en) 2004-01-12 2005-11-20 Elbit Systems Ltd System and method for identifying a threat associated person among a crowd
US7133491B2 (en) 2004-01-15 2006-11-07 Bio-Imaging Research, Inc. Traveling X-ray inspection system with collimators
US7039159B2 (en) 2004-01-30 2006-05-02 Science Applications International Corporation Method and system for automatically scanning and imaging the contents of a moving target
US7192031B2 (en) * 2004-02-05 2007-03-20 General Electric Company Emitter array configurations for a stationary CT system
US7203282B2 (en) 2004-02-11 2007-04-10 Proto Manufacturing Ltd. Removable filter holder and method
EP1719000A2 (en) 2004-02-11 2006-11-08 Reveal Imaging Technologies, Inc. Contraband detection systems and methods
US7023950B1 (en) 2004-02-11 2006-04-04 Martin Annis Method and apparatus for determining the position of an x-ray cone beam produced by a scanning electron beam
US7609807B2 (en) 2004-02-17 2009-10-27 General Electric Company CT-Guided system and method for analyzing regions of interest for contraband detection
US6990172B2 (en) * 2004-02-19 2006-01-24 General Electric Company Method and apparatus to determine tube current modulation profile for radiographic imaging
US7224769B2 (en) 2004-02-20 2007-05-29 Aribex, Inc. Digital x-ray camera
US7885375B2 (en) 2004-02-27 2011-02-08 General Electric Company Method and system for X-ray imaging
US7333587B2 (en) * 2004-02-27 2008-02-19 General Electric Company Method and system for imaging using multiple offset X-ray emission points
US7027554B2 (en) * 2004-03-01 2006-04-11 Invision Technologies, Inc. Reduced-size apparatus for non-intrusively inspecting an object
EP1730502B1 (en) * 2004-03-01 2014-04-09 Varian Medical Systems, Inc. Dual energy radiation scanning of objects
US7596275B1 (en) * 2004-03-01 2009-09-29 Science Applications International Corporation Methods and systems for imaging and classifying targets as empty or non-empty
US7183906B2 (en) * 2004-03-19 2007-02-27 Lockheed Martin Corporation Threat scanning machine management system
US7769138B2 (en) 2004-03-29 2010-08-03 Cmt Medical Technologies Ltd. Apparatus and method of improved angiographic imaging
SE528234C2 (sv) 2004-03-30 2006-09-26 Xcounter Ab Anordning och metod för att erhålla tomosyntesdata
US7142629B2 (en) 2004-03-31 2006-11-28 General Electric Company Stationary computed tomography system and method
US7031430B2 (en) * 2004-04-06 2006-04-18 General Electric Company System and method for detecting objects with differential operators
US7317195B2 (en) * 2004-04-08 2008-01-08 Eikman Edward A Quantitative transmission/emission detector system and methods of detecting concealed radiation sources
PL1733213T3 (pl) * 2004-04-09 2010-07-30 American Science & Eng Inc Eliminowanie przesłuchu w bramce kontrolnej z rozpraszaniem wstecznym, zawierającej wiele źródeł, przez zapewnienie, że tylko jedno źródło emituje promieniowanie w tym samym czasie
EP1740097A1 (en) * 2004-04-21 2007-01-10 Philips Intellectual Property & Standards GmbH Fan-beam coherent-scatter computer tomograph
US7277577B2 (en) 2004-04-26 2007-10-02 Analogic Corporation Method and system for detecting threat objects using computed tomography images
US7356174B2 (en) 2004-05-07 2008-04-08 General Electric Company Contraband detection system and method using variance data
US6953935B1 (en) 2004-05-11 2005-10-11 General Electric Company CT detector fabrication process
GB2414072B (en) 2004-05-12 2006-07-26 Schlumberger Holdings Classification method for sedimentary rocks
US7092481B2 (en) 2004-05-19 2006-08-15 General Electric Company Direct conversion energy discriminating CT detector
US7190757B2 (en) * 2004-05-21 2007-03-13 Analogic Corporation Method of and system for computing effective atomic number images in multi-energy computed tomography
US7136450B2 (en) 2004-05-26 2006-11-14 Analogic Corporation Method of and system for adaptive scatter correction in multi-energy computed tomography
WO2006076038A2 (en) 2004-05-27 2006-07-20 L-3 Communications Security And Detection Systems, Inc. Method and apparatus for detecting contraband using radiated compound signatures
US7324625B2 (en) * 2004-05-27 2008-01-29 L-3 Communications Security And Detection Systems, Inc. Contraband detection systems using a large-angle cone beam CT system
US7274772B2 (en) 2004-05-27 2007-09-25 Cabot Microelectronics Corporation X-ray source with nonparallel geometry
US7218700B2 (en) 2004-05-28 2007-05-15 General Electric Company System for forming x-rays and method for using same
WO2005121756A2 (en) * 2004-06-03 2005-12-22 Brondo Joseph H Jr Mult-mode gamma beam detection and imaging system
US7590215B2 (en) * 2004-06-07 2009-09-15 Koninklijke Philips Electronics N.V. Coherent-scatter computer tomograph
US7327853B2 (en) * 2004-06-09 2008-02-05 Analogic Corporation Method of and system for extracting 3D bag images from continuously reconstructed 2D image slices in computed tomography
US20050276377A1 (en) 2004-06-10 2005-12-15 Carol Mark P Kilovoltage delivery system for radiation therapy
US7203271B2 (en) 2004-06-28 2007-04-10 Pediatric Imaging Technology, Llc Ionizing radiation imaging system and method with decreased radiation dose
US7302083B2 (en) 2004-07-01 2007-11-27 Analogic Corporation Method of and system for sharp object detection using computed tomography images
US7412026B2 (en) 2004-07-02 2008-08-12 The Board Of Regents Of The University Of Oklahoma Phase-contrast x-ray imaging systems and methods
US7372937B2 (en) 2004-07-16 2008-05-13 University Of Iowa Research Foundation Systems and methods of non-standard spiral cone-beam computed tomograpy (CT)
US7282727B2 (en) 2004-07-26 2007-10-16 Retsky Michael W Electron beam directed energy device and methods of using same
US7224763B2 (en) 2004-07-27 2007-05-29 Analogic Corporation Method of and system for X-ray spectral correction in multi-energy computed tomography
GB2416944A (en) 2004-07-30 2006-02-08 Voxar Ltd Classifying voxels in a medical image
GB2416655A (en) 2004-08-06 2006-02-08 Jason Rudd Farmery Float retrieval tool
JP4109232B2 (ja) 2004-09-03 2008-07-02 株式会社イシダ X線検査装置
DE102004043158A1 (de) 2004-09-03 2006-03-23 Smiths Heimann Gmbh Transportable Kontrollstation zur Überprüfung von Personen und Gepäck
US7289603B2 (en) 2004-09-03 2007-10-30 Varian Medical Systems Technologies, Inc. Shield structure and focal spot control assembly for x-ray device
US7149278B2 (en) * 2004-09-10 2006-12-12 General Electric Company Method and system of dynamically controlling shaping time of a photon counting energy-sensitive radiation detector to accommodate variations in incident radiation flux levels
US7260174B2 (en) 2004-09-13 2007-08-21 General Electric Company Direct conversion energy discriminating CT detector with over-ranging correction
US7139367B1 (en) 2004-09-29 2006-11-21 Khai Minh Le Time share digital integration method and apparatus for processing X-ray images
US20060067471A1 (en) 2004-09-30 2006-03-30 General Electric Company Linear array detector system and inspection method
US7136451B2 (en) 2004-10-05 2006-11-14 Analogic Corporation Method of and system for stabilizing high voltage power supply voltages in multi-energy computed tomography
CA2584292A1 (en) 2004-10-14 2006-04-27 Eklin Medical Systems, Inc. Polychromic digital radiography detector with patterned mask for single-exposure energy-sensitive x-ray imaging
US7356118B2 (en) * 2004-10-22 2008-04-08 Scantech Holdings, Llc Angled-beam detection system for container inspection
US7260171B1 (en) 2004-10-25 2007-08-21 General Electric Company Apparatus for acquisition of CT data with penumbra attenuation calibration
US7558374B2 (en) 2004-10-29 2009-07-07 General Electric Co. System and method for generating X-rays
US7450686B2 (en) 2004-10-29 2008-11-11 Thermofisher Scientific Contaminant detector for food inspection
US7197116B2 (en) 2004-11-16 2007-03-27 General Electric Company Wide scanning x-ray source
US7583779B2 (en) 2004-11-24 2009-09-01 General Electric Company System and method for acquisition and reconstruction of contrast-enhanced, artifact-reduced CT images
US7382853B2 (en) 2004-11-24 2008-06-03 General Electric Company Method and system of CT data correction
JP2006141906A (ja) 2004-11-25 2006-06-08 Ge Medical Systems Global Technology Co Llc 放射線撮影装置
CN100427368C (zh) 2004-11-26 2008-10-22 同方威视技术股份有限公司 一种用于集装箱检查***的拖动装置
US7233644B1 (en) 2004-11-30 2007-06-19 Ge Homeland Protection, Inc. Computed tomographic scanner using rastered x-ray tubes
DE102004060580A1 (de) 2004-12-16 2006-06-29 Siemens Ag Verfahren zur Erzeugung einer computertomographischen Darstellung von Gewebestrukturen mit Hilfe einer Kontrastmittelapplikation
EP1677253A1 (en) 2004-12-30 2006-07-05 GSF-Forschungszentrum für Umwelt und Gesundheit GmbH Method and device of reconstructing an (n+1)-dimensional image function from radon data
US20080267350A1 (en) 2005-01-10 2008-10-30 Gray Stephen J Integrated carry-on baggage cart and passenger screening station
CN100441144C (zh) 2005-02-18 2008-12-10 傅耀宗 X射线检测装置和图像获取及处理方法
GB2423687B (en) 2005-02-25 2010-04-28 Rapiscan Security Products Ltd X-ray security inspection machine
DE102005011054A1 (de) 2005-03-10 2006-09-14 Smiths Heimann Gmbh Verfahren und Vorrichtung zur Kontrolle von Handgepäck und anderen mitgeführten Gegenständen
US7177391B2 (en) * 2005-03-29 2007-02-13 Surescan Corporation Imaging inspection apparatus
US7440547B2 (en) 2005-04-15 2008-10-21 Kabushiki Kaisha Toshiba CT scanner
US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
US7227923B2 (en) 2005-04-18 2007-06-05 General Electric Company Method and system for CT imaging using a distributed X-ray source and interpolation based reconstruction
WO2006116316A2 (en) 2005-04-22 2006-11-02 University Of Chicago Open source trajectory method and apparatus for interior imaging
US7130374B1 (en) 2005-05-11 2006-10-31 University Of Florida Research Foundation, Inc. Snapshot backscatter radiography (SBR) systems including system having dynamic collimation
JP5042465B2 (ja) * 2005-05-18 2012-10-03 株式会社日立メディコ 放射線撮影装置、画像処理方法
JP4135727B2 (ja) 2005-05-23 2008-08-20 トヨタ自動車株式会社 動力出力装置、これを搭載する自動車及び動力出力装置の制御方法
WO2006130630A2 (en) 2005-05-31 2006-12-07 The University Of North Carolina At Chapel Hill X-ray pixel beam array systems and methods for electronically shaping radiation fields and modulating radiation field intensity patterns for radiotherapy
US7354197B2 (en) 2005-06-01 2008-04-08 Endicott Interconnect Technologies, Inc. Imaging inspection apparatus with improved cooling
CN100573116C (zh) 2005-06-01 2009-12-23 同方威视技术股份有限公司 一种用于辐射成像的双阵列探测器模块结构
US7261466B2 (en) 2005-06-01 2007-08-28 Endicott Interconnect Technologies, Inc. Imaging inspection apparatus with directional cooling
US7653176B2 (en) 2005-06-14 2010-01-26 L-3 Communications Security and Detection Systems Inc. Inspection system with material identification
JP4269074B2 (ja) 2005-06-14 2009-05-27 株式会社エーイーティー X線発生装置
US7295651B2 (en) 2005-06-30 2007-11-13 General Electric Company Stationary computed tomography system and method
JP4074874B2 (ja) 2005-06-30 2008-04-16 株式会社リガク X線回折装置
US7801348B2 (en) * 2005-07-18 2010-09-21 Analogic Corporation Method of and system for classifying objects using local distributions of multi-energy computed tomography images
US7539337B2 (en) * 2005-07-18 2009-05-26 Analogic Corporation Method of and system for splitting compound objects in multi-energy computed tomography images
US7231017B2 (en) 2005-07-27 2007-06-12 Physical Optics Corporation Lobster eye X-ray imaging system and method of fabrication thereof
US7474786B2 (en) * 2005-08-04 2009-01-06 Analogic Corporation Method of and system for classifying objects using histogram segment features of multi-energy computed tomography images
US20070189597A1 (en) 2005-08-23 2007-08-16 Limer Daniel J Machine vision counting system apparatus and method
DE102005048389A1 (de) 2005-10-10 2007-04-19 Siemens Ag Tomografiegerät und Verfahren zur röntgentomografischen Untersuchung eines Patienten
US7308073B2 (en) 2005-10-20 2007-12-11 General Electric Company X-ray filter having dynamically displaceable x-ray attenuating fluid
US9046465B2 (en) 2011-02-24 2015-06-02 Rapiscan Systems, Inc. Optimization of the source firing pattern for X-ray scanning systems
CN101013094B (zh) 2005-11-03 2010-12-29 清华大学 一种用于辐射成像的双阵列固体探测器模块结构
CN100582758C (zh) 2005-11-03 2010-01-20 清华大学 用快中子和连续能谱x射线进行材料识别的方法及其装置
US7283609B2 (en) 2005-11-10 2007-10-16 General Electric Company CT detector photodiode having multiple charge storage devices
US7330535B2 (en) * 2005-11-10 2008-02-12 General Electric Company X-ray flux management device
JP3887395B2 (ja) 2005-11-25 2007-02-28 株式会社東芝 X線発生装置
US7215731B1 (en) 2005-11-30 2007-05-08 General Electric Company Fast backprojection/reprojection with hexagonal segmentation of image
US7197113B1 (en) * 2005-12-01 2007-03-27 General Electric Company Contactless power transfer system
GB0904236D0 (en) 2009-03-12 2009-04-22 Cxr Ltd X-ray scanners and x-ray sources thereof
US7372934B2 (en) 2005-12-22 2008-05-13 General Electric Company Method for performing image reconstruction using hybrid computed tomography detectors
CN1995993B (zh) 2005-12-31 2010-07-14 清华大学 一种利用多种能量辐射扫描物质的方法及其装置
CN101000312B (zh) 2006-01-11 2010-05-12 清华大学 一种大型航空集装货物检查***
US20070205367A1 (en) 2006-03-01 2007-09-06 General Electric Company Apparatus and method for hybrid computed tomography imaging
JP4878311B2 (ja) 2006-03-03 2012-02-15 キヤノン株式会社 マルチx線発生装置
US7298812B2 (en) 2006-03-31 2007-11-20 General Electric Company Image-based material decomposition
US7319737B2 (en) * 2006-04-07 2008-01-15 Satpal Singh Laminographic system for 3D imaging and inspection
WO2007130857A2 (en) 2006-05-05 2007-11-15 American Science And Engineering, Inc. Combined x-ray ct/neutron material identification system
US7728397B2 (en) 2006-05-05 2010-06-01 Virgin Islands Microsystems, Inc. Coupled nano-resonating energy emitting structures
US8189893B2 (en) 2006-05-19 2012-05-29 The University Of North Carolina At Chapel Hill Methods, systems, and computer program products for binary multiplexing x-ray radiography
US7440549B2 (en) 2006-06-21 2008-10-21 Bruker Axs Inc. Heat pipe anode for x-ray generator
US8842808B2 (en) 2006-08-11 2014-09-23 American Science And Engineering, Inc. Scatter attenuation tomography using a monochromatic radiation source
KR101034753B1 (ko) 2006-08-11 2011-05-17 아메리칸 사이언스 앤 엔지니어링, 인크. 동시에 발생하며 근접한 투과 및 후방 산란 영상화를 이용한 엑스레이 검사
US20100166285A1 (en) 2006-08-11 2010-07-01 Koninklijke Philips Electronics N.V. System and method for acquiring image data
US7486760B2 (en) * 2006-08-15 2009-02-03 Ge Security, Inc. Compact systems and methods for generating a diffraction profile
US7376218B2 (en) 2006-08-16 2008-05-20 Endicott Interconnect Technologies, Inc. X-ray source assembly
WO2008024825A2 (en) 2006-08-23 2008-02-28 American Science And Engineering, Inc. Scatter attenuation tomography
US7924979B2 (en) 2006-08-23 2011-04-12 American Science And Engineering, Inc. Scatter attenuation tomography
CN101512379B (zh) 2006-08-30 2013-06-05 通用电气公司 使用静止计算机x射线断层造影几何结构的投影数据的采集和再现
US7706499B2 (en) 2006-08-30 2010-04-27 General Electric Company Acquisition and reconstruction of projection data using a stationary CT geometry
US7616731B2 (en) 2006-08-30 2009-11-10 General Electric Company Acquisition and reconstruction of projection data using a stationary CT geometry
US7835486B2 (en) 2006-08-30 2010-11-16 General Electric Company Acquisition and reconstruction of projection data using a stationary CT geometry
US20080056432A1 (en) * 2006-08-30 2008-03-06 General Electric Company Reconstruction of CT projection data
US7548606B2 (en) 2006-08-31 2009-06-16 Ge Homeland Protection, Inc. System and method for integrating explosive detection systems
CA2666838C (en) 2006-09-18 2010-12-07 Optosecurity Inc. Method and apparatus for assessing characteristics of liquids
DE102006046741A1 (de) 2006-09-29 2008-04-10 Siemens Ag Röntgensystem und Verfahren zur Tomosyntheseabtastung
CN101162205B (zh) 2006-10-13 2010-09-01 同方威视技术股份有限公司 对移动目标进行检查的设备及避让方法
WO2008047269A2 (en) 2006-10-17 2008-04-24 Philips Intellectual Property & Standards Gmbh Emitter for x-ray tubes and heating method therefore
EP2081497B1 (en) 2006-10-31 2014-10-08 Koninklijke Philips N.V. Swept anode ct scanner
JP2008113960A (ja) 2006-11-07 2008-05-22 Ge Medical Systems Global Technology Co Llc 放射線撮影装置
CN102512192B (zh) 2006-11-09 2015-06-03 佳能株式会社 控制多放射线生成设备的控制设备及其控制方法
US20080112540A1 (en) 2006-11-09 2008-05-15 General Electric Company Shield assembly apparatus for an x-ray device
US7428292B2 (en) 2006-11-24 2008-09-23 General Electric Company Method and system for CT imaging using multi-spot emission sources
CN101553896B (zh) 2006-12-04 2012-06-06 株式会社东芝 旋转阳极型x射线管
US20100074392A1 (en) 2006-12-04 2010-03-25 Koninklijke Philips Electronics N.V. X-ray tube with multiple electron sources and common electron deflection unit
US7508916B2 (en) 2006-12-08 2009-03-24 General Electric Company Convectively cooled x-ray tube target and method of making same
JP4899858B2 (ja) 2006-12-27 2012-03-21 株式会社島津製作所 外囲器回転型x線管装置
CN201034948Y (zh) 2006-12-28 2008-03-12 华南理工大学 基于图像理解的轮毂铸造缺陷自动检测装置
US8552722B2 (en) 2007-01-15 2013-10-08 Rapiscan Systems, Inc. Detector systems
US7539283B2 (en) 2007-01-17 2009-05-26 Ge Homeland Protection, Inc. Combined computed tomography and nuclear resonance fluorescence cargo inspection system and method
US7720194B2 (en) 2007-02-16 2010-05-18 L-3 Communications Security and Detection Systems Inc. High throughput baggage inspection system
US20100277312A1 (en) 2007-02-22 2010-11-04 Peter Michael Edic In-line high-throughput contraband detection system
JP2008212840A (ja) 2007-03-05 2008-09-18 Hitachi Constr Mach Co Ltd 自走式処理機械
US7769132B1 (en) 2007-03-13 2010-08-03 L-3 Communications Security And Detection Systems, Inc. Material analysis based on imaging effective atomic numbers
GB0706088D0 (en) 2007-03-29 2007-05-09 Durham Scient Crystals Ltd X-ray imaging of materials
JP2008268035A (ja) 2007-04-20 2008-11-06 Ishida Co Ltd 異物検査装置
GB0716045D0 (en) 2007-08-17 2007-09-26 Durham Scient Crystals Ltd Method and apparatus for inspection of materials
US8090075B2 (en) 2007-06-06 2012-01-03 Comet Holding Ag X-ray tube with an anode insulation element for liquid cooling and a receptacle for a high-voltage plug
EP2165188A4 (en) 2007-06-21 2014-01-22 Rapiscan Systems Inc SYSTEMS AND METHODS FOR IMPROVING DIRECT SCREENING OF PEOPLE
US7869566B2 (en) 2007-06-29 2011-01-11 Morpho Detection, Inc. Integrated multi-sensor systems for and methods of explosives detection
CN103948395A (zh) 2007-07-19 2014-07-30 北卡罗来纳大学查珀尔希尔分校 固定 x 射线数字化断层合成或断层摄影***和相关方法
CA2694647A1 (en) 2007-08-02 2009-02-05 L-3 Communications Security And Detection Systems, Inc. Reducing latency in a detection system
US9256713B2 (en) 2007-08-30 2016-02-09 Exelis Inc. Library generation for detection and identification of shielded radioisotopes
DE102007046278A1 (de) 2007-09-27 2009-04-09 Siemens Ag Röntgenröhre mit Transmissionsanode
US7593509B2 (en) 2007-09-27 2009-09-22 Varian Medical Systems, Inc. Analytical x-ray tube for close coupled sample analysis
JP4853444B2 (ja) 2007-09-28 2012-01-11 株式会社デンソー 移動物体検出装置
JP5306628B2 (ja) 2007-10-16 2013-10-02 富士フイルム株式会社 撮影方法及び装置
US8031829B2 (en) 2007-10-26 2011-10-04 General Electric Company Method for analytic reconstruction of cone-beam projection data for multi-source inverse geometry CT systems
US7636638B2 (en) 2007-11-27 2009-12-22 Canberra Industries, Inc. Hybrid radiation detection system
US7885372B2 (en) 2007-12-07 2011-02-08 Morpho Detection, Inc. System and method for energy sensitive computed tomography
US9005420B2 (en) 2007-12-20 2015-04-14 Integran Technologies Inc. Variable property electrodepositing of metallic structures
US8391581B2 (en) 2007-12-27 2013-03-05 Omron Corporation X-ray inspecting apparatus and X-ray inspecting method
US20090168958A1 (en) 2008-01-02 2009-07-02 Cristina Francesca Cozzini Apparatus and method for identifying components in a container
US7809114B2 (en) 2008-01-21 2010-10-05 General Electric Company Field emitter based electron source for multiple spot X-ray
EP2243021B1 (en) 2008-02-15 2018-01-24 Mayo Foundation For Medical Education And Research System and method for quantitative imaging of chemical composition to decompose multiple materials
US7924978B2 (en) 2008-02-22 2011-04-12 Morpho Detection Inc. System and method for XRD-based threat detection
CN101303317B (zh) 2008-03-05 2010-11-17 中国科学院合肥物质科学研究院 ***物检测***装置及其检测方法
JP4268996B2 (ja) 2008-03-31 2009-05-27 株式会社モリタ製作所 局所x線ct撮影装置及びその画像表示方法
GB0807473D0 (en) 2008-04-24 2008-12-03 Durham Scient Crystals Ltd Method and Apparatus for Inspection of Materials
DE102008038569A1 (de) 2008-08-20 2010-02-25 Siemens Aktiengesellschaft Röntgenröhre
US8705822B2 (en) 2008-09-03 2014-04-22 Mayo Foundation For Medical Education And Research Method for creating images indicating material decomposition in dual energy, dual source helical computed tomography
GB0816823D0 (en) 2008-09-13 2008-10-22 Cxr Ltd X-ray tubes
JP3147024U (ja) 2008-09-30 2008-12-11 株式会社島津製作所 X線ct装置
US7844032B2 (en) 2008-10-16 2010-11-30 General Electric Company Apparatus for providing collimation in a multispot X-ray source and method of making same
US7835495B2 (en) 2008-10-31 2010-11-16 Morpho Detection, Inc. System and method for X-ray diffraction imaging
WO2010061325A1 (en) 2008-11-25 2010-06-03 Philips Intellectual Property & Standards Gmbh X-ray tube with target temperature sensor
US7970096B2 (en) 2009-01-07 2011-06-28 Analogic Corporation Method of and system for low cost implementation of dual energy CT imaging
GB0901338D0 (en) 2009-01-28 2009-03-11 Cxr Ltd X-Ray tube electron sources
US8111803B2 (en) 2009-04-29 2012-02-07 General Electric Company Method for energy sensitive computed tomography using checkerboard filtering
WO2010129058A2 (en) 2009-05-08 2010-11-11 L-3 Communications Security and Detection Systems Inc. Dual energy imaging system
GB2501023B (en) 2009-05-26 2014-02-12 Rapiscan Systems Inc X-ray tomographic inspection systems for the identification of specific target items
US20170161922A1 (en) 2009-05-26 2017-06-08 Rapiscan Systems, Inc. Imaging, Data Acquisition, Data Transmission, and Data Distribution Methods and Systems for High Data Rate Tomographic X-Ray Scanners
EP3686901A1 (en) 2009-05-26 2020-07-29 Rapiscan Systems, Inc. X-ray tomographic inspection method
JP5766184B2 (ja) 2009-06-03 2015-08-19 ラピスカン システムズ、インコーポレイテッド X線管の中で使用されるグラファイト後方散乱電子シールド
EP2443441B8 (en) 2009-06-15 2017-11-22 Optosecurity Inc. Method and apparatus for assessing the threat status of luggage
JP5325851B2 (ja) 2009-08-28 2013-10-23 株式会社丸彰 単一ゼンマイ機構による複数アクション連係作動玩具
CN102804326B (zh) 2010-01-19 2016-01-20 拉皮斯坎***股份有限公司 多视图货物扫描器
US9442213B2 (en) 2010-01-19 2016-09-13 Rapiscan Systems, Inc. Method of electron beam transport in an X-ray scanner
US8311313B1 (en) 2010-02-08 2012-11-13 Surescan Corporation Imaging inspection apparatus incorporating a device for solving cubic polynomials
US8509380B2 (en) 2010-03-19 2013-08-13 The Board Of Trustees Of The Leland Stanford Junior University Inverse geometry volume computed tomography systems
US8160200B2 (en) 2010-03-30 2012-04-17 General Electric Company Method and system for image data acquisition
EP2377467A1 (en) 2010-04-08 2011-10-19 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement System and method for determining the composition of an object
US8039812B1 (en) 2010-04-13 2011-10-18 Surescan Corporation Test equipment for verification of crystal linearity at high-flux levels
US8908831B2 (en) 2011-02-08 2014-12-09 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
WO2012115629A1 (en) 2011-02-22 2012-08-30 Rapiscan Systems, Inc. X-ray inspection system and method
DE112012004856B4 (de) 2011-11-22 2022-01-05 The University Of North Carolina At Chapel Hill Kontrollsystem und Verfahren zur schnellen, platzsparenden Röntgentomografiekontrolle
US9530528B2 (en) 2011-12-16 2016-12-27 Varian Medical Systems, Inc. X-ray tube aperture having expansion joints
US9514911B2 (en) 2012-02-01 2016-12-06 Varian Medical Systems, Inc. X-ray tube aperture body with shielded vacuum wall
US8829446B2 (en) 2012-04-05 2014-09-09 Analogic Corporation Tile for detector array of imaging modality having selectively removable/replaceable tile sub-assemblies
CN104486997B (zh) 2012-06-05 2017-07-25 拉皮斯坎***股份有限公司 X射线扫描***的射线源激发模式的最佳化
JP6238584B2 (ja) 2012-07-17 2017-11-29 東芝メディカルシステムズ株式会社 X線ct装置およびx線ct装置の制御方法
CN103901057B (zh) 2012-12-31 2019-04-30 同方威视技术股份有限公司 使用了分布式x射线源的物品检查装置
WO2014121097A1 (en) 2013-01-31 2014-08-07 Rapiscan Systems, Inc. Portable security inspection system
US9778391B2 (en) 2013-03-15 2017-10-03 Varex Imaging Corporation Systems and methods for multi-view imaging and tomography
US9093187B1 (en) 2013-11-19 2015-07-28 Surescan Corporation Fixed gantry CT system having a non-uniform slit
JP6296607B2 (ja) 2014-06-12 2018-03-20 矢崎総業株式会社 車両用表示装置
US20190178821A1 (en) 2017-12-11 2019-06-13 Rapiscan Systems, Inc. X-Ray Tomography Inspection Systems and Methods

Also Published As

Publication number Publication date
GB2471422B (en) 2011-03-09
CN102289000A (zh) 2011-12-21
GB201017187D0 (en) 2010-11-24
JP5537031B2 (ja) 2014-07-02
EP2151681A1 (en) 2010-02-10
JP2009519457A (ja) 2009-05-14
US20200103357A1 (en) 2020-04-02
GB0525593D0 (en) 2006-01-25
GB2448260B (en) 2011-02-09
PL2151681T3 (pl) 2018-02-28
GB2471421B (en) 2011-03-09
US20200378906A1 (en) 2020-12-03
GB2471422A (en) 2010-12-29
US7876879B2 (en) 2011-01-25
US10295483B2 (en) 2019-05-21
US8958526B2 (en) 2015-02-17
US20090060135A1 (en) 2009-03-05
JP5357724B2 (ja) 2013-12-04
US20150355117A1 (en) 2015-12-10
US20200378907A1 (en) 2020-12-03
PL2017605T3 (pl) 2020-05-18
WO2007068933A1 (en) 2007-06-21
ES2645587T3 (es) 2017-12-05
GB201017188D0 (en) 2010-11-24
EP1969356A1 (en) 2008-09-17
JP2010048829A (ja) 2010-03-04
US10976271B2 (en) 2021-04-13
GB2448260A (en) 2008-10-08
EP2017605B1 (en) 2019-12-04
US8135110B2 (en) 2012-03-13
US20120230463A1 (en) 2012-09-13
JP2010060572A (ja) 2010-03-18
US20080304622A1 (en) 2008-12-11
EP2017605A1 (en) 2009-01-21
GB0812867D0 (en) 2008-08-20
CN102269826A (zh) 2011-12-07
EP2151681B1 (en) 2017-08-30
CN101400992B (zh) 2011-09-28
GB2471421A (en) 2010-12-29
CN101400992A (zh) 2009-04-01
ES2769530T3 (es) 2020-06-26

Similar Documents

Publication Publication Date Title
CN102289000B (zh) X射线断层摄影检查***
CN102483803B (zh) 识别特定目标物品的x射线断层摄影检查***
CN102483965B (zh) 识别特定目标项目的x 射线层析检查***
US9606259B2 (en) X-ray tomographic inspection system for the identification of specific target items
CN102269826B (zh) X射线断层摄影检查***

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CP02 Change in the address of a patent holder
CP02 Change in the address of a patent holder

Address after: England Atsushi

Patentee after: Rapiscan Systems, Inc.

Address before: UK fictitious

Patentee before: Rapiscan Systems, Inc.

CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20140709

Termination date: 20201215