CN102289000B - X射线断层摄影检查*** - Google Patents
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Abstract
本发明涉及X射线断层摄影检查***。一种用于检查物品的X射线成像检查***,包括X射线源(10),该X射线源在成像体积(16)周围延伸并限定可从中引导X射线穿过成像体积的多个源点(14)。X射线检测器阵列(12)也在成像体积(16)周围延伸,并被配置为检测穿过成像体积的来自源点的X射线,并产生依赖于检测到的X射线的输出信号。传输器(20)被配置为传输物品以使其穿过成像体积(16)。
Description
本申请是国际申请日为2006年12月15日,申请号为200680051488.4,发明名称为“X射线断层摄影检查***”的分案申请。
技术领域
本发明涉及X射线扫描。它在行李、包裹和其他可疑物体的安全排查中具有特别的应用,而且它同样可用于其他合适的应用。
背景技术
X射线计算断层摄影(CT)扫描仪用于机场中的安全排查中已有若干年。常规的***包括围绕某一轴旋转的X射线管,以及也以相同的速度围绕同一轴旋转的弓形X射线检测器。其上承载有行李的传输带被放在位于旋转中心轴附近的适当的洞内,并且随着射线管的旋转沿该轴移动。X放射线的扇形射束从放射源穿过待检查物体到达X射线检测器阵列。
X射线检测器阵列在沿其长度的几个位置上记录穿过待检查物体的X射线的强度。在许多源角度中的每一个上记录一组投影数据。由这些记录的X射线强度,通常可以利用滤波反投影(filtered backprojection)算法形成断层摄影(断面)图像。为了产生诸如袋子或包裹的物体的精确的断层摄影图像,可以表明要求X射线源穿透通过物体的每个平面。在上述的配置中,通过X射线源的旋转扫描以及其上承载有物体的传输器的纵向移动来实现这一点。
在这种类型的***中,可收集X射线断层摄影扫描的速率取决于保持X射线源和检测器阵列的台架(gantry)的旋转速度。在现代CT台架中,整个射线管-检测器组件和台架将每秒完成二到四转。这分别允许每秒收集多达四次或八次的断层摄影扫描。
随着现有技术的发展,单环的X射线检测器已被多环的检测器代替。这使得可以采用从单扫描机器调整而来的滤波反投影方法同时扫描和重构许多切片(slice)(一般为8个)。随着传输器穿过成像***的连续移动,放射源描绘了围绕物体的螺旋状扫描移动。这允许应用更复杂的锥束图像重构方法,其可在原理上提供更精确的体图像重构。
在另一进展中,已在医疗应用中展示了扫掠式电子束扫描仪(swept electron beam scanner),由此免除了X射线源和检测器的机械扫描运动,取而代之的是围绕被检查物体的X射线检测器的连续环,以及由于在弓形阳极周围扫掠电子束而产生的移动X射线源。这使得可以比常规扫描仪更快速地获得图像。但是,由于电子源位于旋转轴上,因此这种扫掠式电子束扫描仪与传输器***不兼容,传输器***本身与旋转轴接近并平行地移动。
发明内容
本发明提供一种用于检查物品的X射线扫描***,该***包含:X射线源,其在扫描体积周围延伸并限定可从中引导X射线穿过扫描体积的多个源点;X射线检测器阵列,其同样在扫描体积周围延伸并被配置为检测已穿过扫描体积的来自源点的X射线并产生依赖于检测到的X射线的输出信号;和传输器,被配置为传输物品以使其穿过扫描体积。
本发明还提供一种网络化检查***,该网络化检查***包括X射线扫描***、工作站、和被配置为将扫描***连接到工作站上的连接装置,该扫描***包含:X射线源,其在扫描体积周围延伸并限定可从中引导X射线穿过扫描体积的多个源点;X射线检测器阵列,其同样在扫描体积周围延伸并被配置为检测已穿过扫描体积的来自源点的X射线并产生依赖于检测到的X射线的输出信号;和传输器,被配置为传输物品以使其穿过扫描体积。
本发明还提供一种用于对物品进行分拣的分拣***,该***包括:被配置为扫描各个物品的多个扫描区域以由此产生扫描仪输出的断层摄影扫描仪;被配置为分析扫描仪输出并且至少部分地基于扫描仪输出将各个物品分配到多个类别中的一个的分析装置;和被配置为至少部分地基于物品已被分配到的类别对它们进行分拣的分拣装置。
本发明还提供一种X射线扫描***,该X射线扫描***包括:被配置为从扫描区域周围的多个X射线源位置产生X射线的X射线源;被配置为检测穿过扫描区域的X射线的第一组检测器;被配置为检测在扫描区域内散射的X射线的第二组检测器;和处理装置,其被配置为处理来自第一组检测器的输出以产生限定扫描区域的图像的图像数据、分析图像数据以识别图像内的物体、处理来自第二组检测器的输出以产生散射数据并将散射数据的多个部分与物体相关联。
本发明还提供一种用于从X射线扫描仪收集数据的数据收集***,该***包括:具有分别与图像的相应区相关的多个区的存储器;被配置为以预定的次序从多个X射线检测器接收输入数据的数据输入装置;处理装置,其被配置为从输入数据产生与图像的区中的每一个相关的X射线透射数据和X射线散射数据,并将该X射线透射数据和X射线散射数据存储在适当的存储区中。
本发明还提供一种X射线扫描***,该X射线扫描***包括:被配置为扫描物体以产生限定物体的断层摄影X射线图像的扫描数据的扫描仪;和处理装置,其被配置为分析扫描数据以提取图像数据的至少一个参数并基于所述至少一个参数将物体分配到多个类别中的一个。
本发明还提供一种具有中心纵轴的X射线扫描***,包括:被配置为从扫描区域周围的多个X射线源位置产生X射线、并沿与中心纵轴垂直的方向穿过扫描区域发送产生的X射线的X射线源;被配置为在围绕中心纵轴的圆形阵列中对发送的X射线进行检测的第一组检测器;被配置为在围绕中心纵轴的圆形阵列中对在扫描区域内散射的X射线进行检测的第二组检测器;被配置为防止散射的X射线到达第二组检测器中的每一个除非X射线来自接收方向的准直器,其中对于第二组检测器中的每一个,沿接收方向来自检测器的线穿过中心纵轴并不与中心纵轴垂直,和处理装置,该处理装置被配置为:处理来自第一组检测器的输出以产生限定扫描区域的图像的图像数据,分析图像数据以识别图像内的物体,将散射数据的多个部分与物体相关联,以及处理来自第二组检测器的输出以产生散射数据并基于散射的X射线到达第二组检测器中的哪个检测器确定发送的X射线被散射的位置。
附图说明
现在参照附图仅作为示例说明本发明的优选实施例,在这些附图中:
图1是根据本发明第一实施例的实时断层摄影安全扫描***的纵剖面;
图1a是图1的***的X射线源的透视图;
图2是图1的***的平面图;
图3是图1的***的示意性侧视图;
图4是形成图1的***的一部分的数据获取***的示意图;
图5是形成图1的***的一部分的威胁检测***的示意图;
图6是根据本发明实施例的行李分拣***的示意图,该行李分拣***包括图1的扫描***;
图7是根据本发明另一实施例的行李分拣***的示意图;
图8a、图8b和图8c是根据本发明其他实施例的行李分拣***的示意图;
图9是根据本发明另一实施例的网络化行李分拣***的示意图;
图10是根据本发明另一实施例的独立式扫描***的示意性平面图;
图11是图10的***的示意性侧视图;
图12是根据本发明另一实施例的模块化扫描***的示意性侧视图;
图13是X射线散射事件的示图;
图14是根据本发明另一实施例的安全扫描***的纵剖面;
图15是图14的***的另一纵剖面,示出了如何检测不同的散射事件;
图16是图14的***的横剖面;
图17是图14的扫描***的数据采集***的示意图;
图18是根据本发明另一实施例的双重能量扫描仪的局部视图;
图19是图18的扫描仪的另一局部视图;
图20是本发明另一实施例的双重能量X射线源的示意图;
图21是根据本发明另一实施例的扫描仪的检测器阵列的示意图;
图22是根据本发明另一实施例的扫描仪的检测器阵列的示意图;
图23是图21的实施例的数据采集电路的电路图;以及
图24是本发明另一实施例的数据采集电路的电路图。
具体实施方式
参照图1~3,中央大厅行李扫描***6包括扫描单元8,扫描单元8包含多焦距X射线源10和X射线检测器阵列12。射线源10包含处于射线源上的各个分开的位置上并且被配置在围绕***的轴X-X的全360°圆形阵列中的大量源点14。可以理解,也可以使用覆盖少于全360°角的阵列。
参照图1a,在与传输器的移动方向垂直的平面上,X射线源10由许多源单元11组成,这些源单元11以基本上圆形的配置在扫描区域16的周围间隔开。各个源单元11包含具有两侧的导电金属抑制器13和沿抑制器两侧之间延伸的发射器元件15。在抑制器13的上方支撑有与发射器元件15垂直的网格导线17形式的许多网格元件。在网格导线的与发射器元件相对的一侧的另一平面上支撑有聚焦导线19形式的许多聚焦元件。聚焦导线19与网格导线17平行并且以与网格导线相同的间隔相互分开,每个聚焦导线19与网格导线17中的相应的一条对准。
聚焦导线19在与发射器元件15平行地延伸的两条承轨21上被支撑,并且与抑制器13分开。承轨21是导电性的,使得所有聚焦导线19均电连接在一起。承轨21中的一条与连接器23连接以为聚焦导线19提供电连接。网格导线17中的每一条在抑制器13的一侧的下方延伸,并与为网格导线17中的每一条提供单独的电连接的相应电连接器25连接。
在网格导线17和聚焦导线19的上方支撑有阳极27。阳极27形成为一般为镀钨或银的铜的杆,并与发射器元件15平行地延伸。网格和聚焦导线17、19因此在发射器元件15和阳极27之间延伸。电连接器29提供与阳极27的电连接。
除了与正电位连接的两条网格导线17以外,网格导线17均与负电位连接。这些正网格导线从发射器元件15的区域提取电子束,并且,通过聚焦导线19的聚焦,将电子束引导到阳极27上的点上,该点形成该对网格导线的X射线源点。网格导线的电位因此可在任意时间被切换,以选择哪一对网格导线是活动的,并因此在任何时间选择阳极27上的哪个点是活动的X射线源点。
放射源10因此可被控制为单独地从源单元11中的每一个中的源点14中的每一个产生X射线,并且,重新参照图1,来自各个源点14的X射线被向内引导为穿过圆形源10内的扫描区域16。由控制单元18(其控制施加到网格导线17上的电位并由此控制从源点14中的每一个的X射线发射)控制放射源10。
在WO 2004/097889中说明了其他适当的X射线源设计。多焦距X射线源10允许使用电子控制电路18以在任何时刻选择多焦距X射线源中的许多单个X射线源点14中的哪一个是活动的。由此,通过电子地扫描多焦距X射线管,在没有机械部分物理移动的情况下产生了X射线源移动的错觉。在这种情况下,源旋转的角速度可增加到使用常规旋转X射线管组件时根本不能实现的水平。这种迅速的旋转扫描会转化为等效地加速的数据采集过程,并在随后转化为快速的图像重构。
检测器阵列12也是圆形的,并且围绕轴X-X被配置在沿轴方向稍偏离放射源10的位置上。放射源10被配置为引导其产生的X射线向着扫描区域的相反一侧的检测器阵列12穿过扫描区域16。X射线束的路径18因此沿基本上或几乎与扫描仪轴X-X垂直的方向穿过扫描区域16,从而在该轴附近相交。被扫描和成像的扫描区域的体积因此呈现与扫描仪轴垂直的薄片的形式。放射源被扫描,使得各个源点发射X射线相应的时段,该发射时段以预定的次序被排列。随着各个源点14发射X射线,会产生来自检测器12的信号,该信号依赖于入射到检测器上的X射线的强度,并且在存储器中记录信号提供的强度数据。当放射源完成其扫描时,可以处理检测器信号以形成被扫描体积的图像。
传输带20如图1所示的那样与扫描仪的轴X-X平行地从左到右穿过成像体积。X射线散射防护罩22位于主X射线***的上游和下游的传输带20的周围,以防止由于散射的X射线导致的操作员放射剂量。X射线散射防护罩22在它们的开放的端部包含含铅橡胶条形幕帘24,使得检查中的物品26在进入检查区域时被拖动穿过一个幕帘并在离开时被拖动穿过一个幕帘。在示出的集成***中,示出了安装在传输器20的下方的主电子控制***18、处理***30、电源32和冷却架34。传输器20被配置为一般以恒定的传输器速度按连续的扫描移动进行工作,并且一般在成像体积内具有碳纤维框架。
参照图4,处理***30包含电子数据采集***和实时图像重构***。X射线检测器阵列12包含被配置为简单的线性图案(例如,1x 16)的多排的单一X射线检测器50。多个环图案(例如,8x 16)也是可能的。每个检测器50都输出依赖于它检测的X射线的强度的信号。多路传输块52多路传输来自输入X射线检测器50中的每一个的输出数据信号,执行数据过滤、增益和偏差校正,并将该数据格式化成高速串行流。选择块53从所有多路传输块52取得输入,并只选择整个X射线数据中的图像重构所需要的一部分。选择块53还为适当的X射线源点确定未衰减的X射线束强度Io(其将随多焦距X射线管内的每一个X射线源点而改变),通过形成结果loge(Ix/Io)处理来自多路传输块52的X射线强度数据Ix,然后用适当的1-D滤波器对其进行卷积处理。得到的投影数据被记录为声纳图(sinogram),其中,利用沿一个轴(在这种情况下是水平的)的像素号和沿另一轴的源角度(在这种情况下是垂直的)在阵列中排列数据。然后将数据从选择块53并行地传递给一组背投求和处理器元件54。使用具有用于选择必需的卷积X射线数据的预先计算的系数和用于快速背投和求和的加权因子的查找表,处理器元件54被映射成硬件。格式化块55从多个处理器元件54取得代表单个重构的图像文件的数据,并将最终的输出图像数据格式化成适于在显示屏上产生合适的格式化的三维图像的形式。为了实时或离线查看,可以实时地对于要产生的图像足够快地产生该输出,由此,该***被称为实时断层摄影(RTT)***。
在本实施例中,将多路传输块52编码在软件中,将选择块53和格式化块55编码在固件中,并将处理器元件映射在硬件中。但是,根据特定***的需求,这些部件中的每一个都可以是硬件也可以是软件。
参照图5,然后由处理***30内的威胁检测处理器60来处理用于每个行李物品的每幅最终输出图像,该威胁检测处理器60被配置为确定被成像的行李物品是否代表威胁。在威胁检测处理器60中,输入的X射线断层摄影图像数据62被传递到一组低层级参数提取器63(层级1)中。参数提取器63识别诸如恒定的灰度级的面积、纹理和统计信息之类的图像特征。一些提取器作用于单一的2维图像或切片的数据,一些作用于3维图像,一些作用于声纳图数据。在可能的情况下,各个提取器并行地作用于同一组输入数据,并且各个提取器被配置为执行不同的处理操作并确定不同的参数。在处理结束时,由参数提取器63确定的参数被传递到一组决策树64(层级2)。以下给出提取的参数的细节。决策树64分别取得大量的(一般为所有的)低层级参数,并且用相关的统计信息构建各更高层级的信息,如关于邻接的体积的信息。在最高层级(层级3)上,数据库搜索器65将在层级2上产生的较高层级的参数映射成表示存在威胁的“红色”概率Pr(威胁)和表示被检查物品安全的“绿色”概率Pr(安全)。处理***30利用这些概率将所扫描的物品分配到适当的安全类别,并产生自动分拣控制输出。该自动分拣控制输出可以为表示物品被分配到开释(clear)类别的第一“绿色”输出、表示物品被分配到“不开释”类别的第二“红色”输出、或表示不能实施具有足够的可靠性的自动分拣以将物品分配到“开释”或“不开释”的类别的第三“琥珀色”输出。具体来说,如果Pr(安全)高于预定值(或者Pr(威胁)低于预定值),那么将产生具有第一信号形式的自动分拣输出,表示物品应被分配到绿色通道。如果Pr(威胁)高于预定值(或者Pr(安全)低于预定值),那么将产生具有第二信号形式的自动分拣输出,表示物品应被分配到红色通道。如果Pr(威胁)(或者Pr(安全))处于两个预定值之间,那么将产生具有第三信号形式的自动分拣输出,表示不能将物品分配到红色通道或绿色通道。也可将概率输出为其他输出信号。
将要由参数提取器63确定的参数一般与2维或3维图像的各单独的区域内的像素的统计分析有关。为了识别图像中的各个单独的区域,使用统计边缘检测方法。该方法在某一像素上开始,然后检查相邻的像素是否是同一区域的一部分,从而随着区域生长而向外移动。在各个步骤中,通过计算区域内的像素的平均强度来确定区域的平均强度,并且,将与该区域相邻的下一个像素的强度与该平均值相比较,以对于待加入该区域的像素确定其强度是否足够接近该平均值。在这种情况下,确定区域内的像素强度的标准偏差,并且,如果新像素的强度在该标准偏差内,那么将它添加到该区域中。否则,不将它添加到该区域中,并且,这将该区域的边缘限定为该区域中的像素与已被检查并且未被添加到该区域中的像素之间的边界。
一旦已将图像分成多个区域,那么可以测量区域的参数。一个这种参数是对区域内的像素强度的方差的测量。如果它较高,这可能表示可能例如在自制炸弹中发现的块料(lumpy material),而如果方差较低,这可能表示诸如液体的均匀材料。
被测量的另一参数是区域内的像素值的分布的偏斜情况(skewedness),通过测量像素值的直方图的偏斜情况来确定该偏斜情况。高斯分布(即无偏斜分布)表示区域内的材料是均匀的,而高度偏斜的分布表示区域中的不均匀性。
如上所述,这些低层级参数被向上传递到决策树64,在这些决策树64中,用所确定的更高层级的参数构建更高层级的信息。一个这种更高层级的参数是识别的区域的表面积与体积之比。另一个是类似度的测量,该类似度在本情况下是区域的形状和存储在***中的模板形状之间的互相关性。模板形状被配置为对应于诸如***或***的具有安全威胁的物品的形状。如上面说明的那样使用这些高层级参数来确定由被成像物体引起的威胁级别。
参照图6,联机(in-line)实时断层摄影行李分拣***包括图1的扫描***6,传输器20穿过该扫描***6。在扫描***6的下游,分拣装置40被配置为从传输器20接收各件行李,并将它们移动到开释或“绿色”通道传输器42或不开释或“红色”通道传输器44。通过经由控制线路46来自处理***30的自动分拣输出信号并且还通过来自工作站48(分拣装置40经由线路45连接到工作站48)的信号来控制分拣装置40,自动分拣输出信号表示处理***30关于物品是否为开释的决定。来自扫描***6的图像和来自处理***30的表示红色和绿色概率和处理***30的名义决定的信号也被馈送到工作站48。工作站被配置为在屏幕47上显示图像,使得操作人员可看到它们,并提供指示绿色和红色概率和名义自动分拣决定的显示。工作站处的用户可回顾图像和概率以及自动分拣输出,并且,如果扫描***的决定是要将物品分配到红色或绿色类别,那么决定是接受还是推翻该决定,或者,如果扫描***决定是要将物品分配到“琥珀色”类别,那么决定是否输入该决定。工作站48具有使得用户能够向分拣装置40发送信号的用户输入49,该信号可被分拣装置识别为推翻扫描***的决定。如果推翻信号被分拣装置接收,那么分拣装置确实推翻扫描***的决定。如果没有接收到推翻信号,或者事实上如果从工作站接收到确认扫描***的决定的确认信号,那么分拣装置基于扫描***的决定对物品进行分拣。如果分拣***从扫描***接收与物品有关的“琥珀色”信号,那么它最初将该物品分配到要被放入红色通道的“红色”类别。但是,如果在它对物品进行分拣之前它从工作站接收到指示物品应处于“绿色”类别的输入信号,那么它将物品分类到绿色通道。
在图6的***的修改例中,分拣可以是完全自动的,使得处理***给出仅两种分拣输出“开释”和“不开释”中的一个,从而将物品分配到绿色通道或红色通道。对于处理***来说,也可以用一个阈值确定仅仅一个概率Pr(威胁),并根据该概率是否高于或低于阈值而将物品分配到两个类别中的一个。在这种情况下,分配仍是临时性的,并且操作员仍具有推翻自动分拣的选择权。在另一修改例中,在根本没有用户输入的情况下,使用扫描***的自动类别分配作为最终的分配。这提供了一种全自动分拣***。
在图6的***中,扫描速度与传输器速度匹配,使得可以按恒定的速度从装载区(在装载区处,行李被装载到传输器20上)穿过扫描***6移动行李,并将其移动到分拣装置40上。传输器20在扫描***6的出口和分拣装置40之间延伸距离L。在行李物品在传输器20上行进距离L的期间,操作员可观察被检查物品的图像数据以及由扫描***确定的初始类别分配,并且确认或拒绝RTT***的自动决定。一般来说,行李接着会被接受到开释通道上并向前传送以准备运输,或者被拒绝到不开释通道上以进行进一步的调查。
在该RTT多焦距***中,RTT扫描单元8能够按最高行李带速度操作,由此对于最佳的***操作来说不需要行李排队或其他转向机构。在诸如该***的集成***中,常规旋转源***的有限的吞吐能力是明显的约束。这往往意味着并行地放置多个常规的CT机,并使用复杂的行李处理***以将待检查物品切换到下一个可用的机器。通过图6的配置,可以避免这种复杂性。
参照图7,本发明的第二实施例包括冗余***,在该冗余***中,两个RTT扫描***70、72在同一传输器74上被串联地放置,使得如果使一个***退出服务,那么另一个可继续扫描行李。在任一种情况下,传输带74可在标准的操作带速度下继续穿过两个扫描***70、72。
参照图8a,在第三实施例中设置有并行地操作两个RTT***82、84的更复杂的冗余***。第一主进入传输器86将所有要被分拣的物品带到第一分拣装置88,该第一分拣装置88可将物品传送到两个另外的传输器90、92中的任一个上。这两个传输器90、92中的每一个都穿过将扫描物品并使得能够针对是否开释物品做出决定的扫描***82、84中的相应的一个。在两个传输器90、92中的每一个上设置有另一分拣装置94、96,该分拣装置94、96被配置为将行李分拣到用于向前传输的共用的‘绿色通道’传输器98上,或者在该物品未被开释的情况下将其分拣到‘红色通道’传输器100上,在该‘红色通道’传输器100上它可经受进一步的调查。在该配置中,可以按比RTT传输器速度高、一般达到该速度的两倍的速度运行输入传输器86和‘绿色通道’传输器。例如,在这种情况下,主进入传输器86和共用的‘绿色通道’传输器以1m/s的速度移动,而扫描传输器82、84以该速度的一半即0.5m/s的速度行进。当然,可以用更多的并行的RTT***来扩展该***,使得主进入传输器的速度与扫描仪传输器的速度之比等于或基本上等于并行的扫描仪的数量,尽管在大于约1m/s主传输器速度下分拣装置可能会变得不可靠。
参照图8b,在另一实施例中,行李分拣***包括许多RTT扫描仪81b、82b、83b,一般在一个***中达到约60个,每一个都与相应的检入台相关联。分拣装置84b、85b、86b与各个RTT扫描仪相关,并且行李在传输器上从各个RTT扫描仪被传输到其相关的分拣装置。每个分拣装置84b、85b、86b都响应于来自其扫描仪的信号将行李分拣到共用的开释通道传输器88b或共用的拒绝通道传输器87b。在拒绝通道传输器87b上设置有另一后备RTT扫描仪89b,该后备RTT扫描仪89b具有可将行李留在拒绝通道传输器87b上或将其传送到开释通道传输器88b的相关的分拣装置90b。
在正常的操作下,一次扫描仪81b、82b、83b中的每一个都对行李进行分拣,并且后备或冗余扫描仪89b对分拣到拒绝通道中的物品提供进一步的检查。如果该扫描仪确定行李物品代表没有或者足够低的威胁,那么它将该行李物品传送到开释通道。如果一次扫描仪中的一个不起作用或出现故障,那么其相关的分拣装置被配置为将来自该扫描仪的所有行李分拣到拒绝通道。然后,后备扫描仪89b扫描所有的这些行李并在开释通道和拒绝通道之间控制其分拣。这使得在故障扫描仪被维修或更换的同时所有的检入台都能够继续起作用。
参照图8c,在另一实施例中,来自检入台中的每一个的行李经由多个单独的传输器被传送到中央回路或环形传送带81c上,在该传送带81c上行李连续地循环。许多分拣装置82c、83c、84c分别被配置为将来自回路81c的行李物品传送到引导到相应RTT扫描仪85c、86c、87c的相应传输器。分拣装置82c、83c、84c被扫描仪控制以控制将行李物品馈送到扫描仪中的每一个的速率。从扫描仪起,传输器将所有的行李物品传送到引导到另一分拣装置89c的共用的出口传输器88c。通过所有的扫描仪对它进行控制以在开释通道90c和拒绝通道91c之间对行李物品中的每一个进行分拣。
为了跟踪各行李物品的移动,对每个物品都赋予6数字ID和当该物品第一次进入***时记录的其在传输带上的位置。扫描仪因此可识别在任意一个时刻正在扫描哪一件行李物品,并将扫描结果与适当的物品相关联。分拣装置因此还可识别各行李物品并基于它们的扫描结果对它们进行分拣。
配置本***中的扫描仪的数量和传输器的速度,使得如果扫描仪中的一个不起作用,那么剩余的扫描仪可处理从检入台正在被馈送到回路81c上的所有行李。
在本实施例的修改例中,选择哪些物品被传送到各个扫描仪的分拣装置82c、83c、84c不是由扫描仪控制的,而是分别被配置为选择来自回路81c的物品以按预定的速率将它们馈送到相应的扫描仪。
参照图9,根据另一实施例的网络化***包括三个与图6的扫描***类似的扫描***108和四个操作员工作站148。来自三个RTT扫描***108的视频图像输出通过相应的高带宽点对点视频链路与向冗余视频交换机110提供用于原始图像数据的瞬时存储器的实时盘阵列109连接。盘阵列109又与工作站148中的每一个连接。视频交换机110因此能够将从扫描***108中的每一个输出的原始视频图像从其临时存储器传送到工作站148中的任一个,在该工作站148中可以利用该原始视频图像来产生可离线观看的3维视频图像。来自扫描***的用于红色/绿色概率信号和自动分拣分配信号的输出与冗余的常规以太网交换机112连接,该以太网交换机112也与工作站中的每一个连接。以太网交换机被配置为将概率信号和分拣分配信号中的每一个切换到同一工作站148,作为相关联的视频信号。这允许将来自多个机器的图像数据与自动分配和赋予该分配的概率一起接到操作员工作站148组(bank)上,在该组中,操作员可监视行李检查***的执行并确定被赋以琥珀威胁等级的行李的目的地。
作为替代方案,一种网络化***包括与服务器连接的单个扫描***108和工作站148。来自扫描***108的视频图像输出与为原始图像数据提供瞬时存储器的实时盘阵列109连接。盘阵列109又与工作站148连接。将概率信号和分配信号输出与要***作员监视的相关视频图像输出一起被发送到工作站148。网络化的单个扫描***可以是具有多个扫描***的网络化***的一部分。
参照图10和图11,在另一实施例中,联机(in-line)扫描仪具有刚好与主散射防护罩162一样长的传输带160。在这种独立式***配置中,用于检查的物品被放置到传输带160上,并且该物品被装载到***中。然后通过扫描仪机器164扫描物品并产生图像。在常规***中,在物体中的选择的平面的计算断层摄影放映之前,常常用简单传送X射线***对物品进行预放映,以识别可能的威胁区域。这种应用只用于实时多焦距***。这里,不使用预放映并且将获得整个物品的真实三维图像。
在一些实施例中,多焦距X射线源中的源点的轨迹将在仅180度加上扇形射束角度(一般在40~90度的范围内)的角度范围上的弧中延伸。有利的是,选择离散的源点的数量以满足Nyquist采样定理。在一些实施例中,如图1的实施例那样,使用完整的360度环的源点。在这种情况下,对于给定的扫描速率,每个源点的停留时间增加,超过180+扇形射束配置,并且这在改善重构图像信噪比的方面是有利的。
图1的扫描仪***是集成扫描仪***,这是因为,在具有扫描***8和遮蔽罩22的单元中容纳有控制、处理、电源和冷却单元18、30、32、34。参照图12,在另一实施例中设置有模块化***,在该模块化***中,控制、处理、电源和冷却架218、230、232、234中的一些或全部被定位为远离包含多焦距X射线源和传感器阵列的扫描单元208。有利的是使用模块化设计以便于安装,这在行李处理大厅环境中尤其有利,在该环境中,***可被悬挂于天花板上或处于访问受限的区域。作为替代方案,整个***可被配置为具有共同位于单个外壳内的多个子组件单元的集成单元。
在包括图1的实施例在内的一些实施例中,使用单个X射线检测器环。即使在较高的图像扫描速率下用简单扇形射束图像重构算法构建和提供足够的信噪性能也是较为便宜的。在其他的实施例中(特别是对于较大的图像重构圆直径),优选的是使用多环传感器阵列,该多环传感器阵列具有沿***的偏离源的轴隔开的、彼此相邻布置的多个圆形或部分圆形的传感器组。这使得能够在处理***中使用更复杂的锥束图像重构算法。使用多环传感器会增加每个源点的停留时间,得到更大的积分信号大小并因此导致重构图像的信噪比的改善。
使用基于多焦距X射线源的计算断层摄影***的上述实施例的设计的中心是放射源的旋转角速度和穿过扫描仪的传输器***的速度之间的关系。在传输器静止的极限情况下,重构的图像切片的厚度完全由X射线焦距的大小和X射线检测器阵列的各元件的面积来确定。随着传输器速度从零增加,被检查物体将在X射线射束的旋转过程中穿过成像切片,并且,将沿切片厚度的方向在重构的图像中引入附加的模糊。在理想情况下,与传输器速度相比X射线源旋转将较快,使得沿切片厚度方向的模糊将被最小化。
出于对被检查物品中的威胁材料和物体的高概率检测的目的,用于行李检查的基于多焦距X射线源的计算断层摄影***提供了良好的放射源旋转角速度与传输器线速度之比。作为示例,在图1的实施例中,如在机场***中常见的那样,传输器速度为0.5m/s。放射源可实现每秒围绕传输器240次源旋转,因此被检查物体在扫描过程中将穿过成像切片移动2.08mm的距离。在具有每秒4转的源旋转的常规***中,被检查物体在相同的带速度下将在扫描过程中穿过成像切片移动62.5mm的距离。
用于检测威胁材料的检查***的主要目的是精确地检测威胁材料的存在并且在没有嫌疑时放过所有其他材料。在扫描过程中由于传输器移动而导致的沿切片方向的模糊越大,则重构图像像素中的部分体积人为现象(artefact)越大并且重构的图像密度越不精确。重构的图像密度的精度越差,则***越有可能对非威胁材料给出警报而不对真正的威胁材料发出警报。因此,与常规的机械旋转的X射线***相比,基于多焦距X射线源技术的实时断层摄影(RTT)***可以在较高的传输器速度下提供显著增强的威胁检测能力。
由于在多焦距X射线源中使用扩展的弓形阳极,因此可以对电子源进行开关,使得它在阳极的全长度上跳跃,而不是依次进行扫描以仿效在常规计算断层摄影***中观察到的机械旋转。有利的是,为了使阳极上的瞬时热负载最小化,X射线焦距将被开关以使当前的阳极辐射位置到所有以前的辐射位置的距离最大化。在使由于传输器移动导致的部分体积效应最小化从而进一步改善重构的像素精度的过程中,X射线发射点的这种瞬时展开是有利的。
RTT***的较高的时间分辨率允许在自动威胁检测中实现较高的精度水平。通过这种较高的精度水平,可以在无人看管的模式中操作RTT***,从而产生简单的两状态输出指示,一种状态与绿色或开释分配对应,另一种与红色或不开释分配对应。绿袋被开释用于向前传输。红袋代表较高的威胁水平,并且应与乘客协调并禁止该乘客旅行。
现在将说明本发明的其他实施例,在这些实施例中,与X射线的散射有关的数据以及与被透射的X射线有关的数据被记录并用于分析所扫描的行李物品。
参照图13,当X射线的射束300穿过物体302时,X射线中的一些直接透过它并离开物体,该物体沿与这些X射线进入物体的方向相同的方向行进。X射线中的一些按散射角θ被散射,散射角θ是它们进入物体的方向与它们离开物体的方向之差。众所周知,会发生两种类型的散射:集中在5°、一般为4~6°的散射角周围的相干或布拉格散射,和X射线按更大的角度散射的非相干或康普顿散射。布拉格散射随着物体的原子序数线性增加并且服从下式:
nλ=2dsinθ
其中,
n是整数
λ是X射线的波长
d是物体中的原子间距离。
因此,布拉格散射的量给出了关于物体的原子结构的信息。但是,它不随着原子序数而平滑地变化。
康普顿散射的量依赖于物体的电子密度并随其平滑地变化,因此,较大的散射角度下的散射量给出了关于物体的电子密度的信息,并由此给出了关于其原子序数的信息。
参照图14,根据本发明的另一实施例的安全扫描***包括与图1中的相同的多焦距X射线源410,和同样与图1中的相同的圆形检测器阵列412和传输器420。但是,在本实施例中,***包括另一圆筒检测器阵列422,该圆筒检测器阵列422以与圆形检测器阵列412相同的半径在传输器周围延伸,但沿轴向处于放射源410的另一侧。虽然圆形检测器阵列被配置为检测透过物体426的X射线,但圆筒检测器阵列422被配置为检测在物体中散射的X射线。散射检测器阵列422由检测器的大量的圆形阵列或环422a、422b构成,并且各个环中的检测器在传输器周围均等地隔开,使得它们被配置成沿扫描仪的轴向延伸的许多直行。
散射检测器阵列422中的检测器是能量分辨检测器,使得与各个检测器的各X射线交互作用会产生指示X射线的能量的检测器输出。可以由诸如GaAs、HgI、CdZnTe或CdTe的宽带隙III-V或II-IV半导体材料、诸如Ge的窄带隙半导体或诸如具有光电倍增管读出器的NaI(Ti)的复合闪烁检测器制造这些检测器。
参照图15,在散射检测器422的前面设置有准直器428。准直器428提供了障碍,该障碍防止X射线到达各个检测器,除非X射线来自特定的接收方向。从图16可以看出,对于阵列422中的各个检测器,接收方向穿过扫描仪的中心纵轴X-X。但是,从图15可以看出,接收方向不与轴X-X垂直,而是沿向着放射源410的方向以约5°的角度向检测器环422a、422b的平面倾斜。
参照图15,可以理解,入射到阵列422的检测器中的任一个上的X射线一定是从位于X射线射束的路径和从检测器422起的接收方向的线上的较薄的成像体积内的相应的小子体积散射出来的。对于任何相干散射的X射线,检测到它的检测器的轴向位置将由到发生散射的活动X射线源点的距离来确定。沿轴向最接近放射源410的检测器将检测从活动的X射线源点起散射得最远的X射线。例如,从最接近活动的X射线源点410a的点x散射的X射线将被距放射源410比从点z(其距活动的X射线源点更远)起散射的X射线远的检测器检测。因此,在任何一个时刻,当活动的X射线源点可被识别时,检测到散射的X射线的检测器的轴向位置可用于确定沿X射线射束方向的散射位置。
从图15还可理解,为了使***工作,很重要的是,应沿扫描仪的轴向很窄地聚焦X射线射束。射束沿横向的展开(即沿横向使用扇形射束展开)仍将允许相干散射事件的这种定位。
参照图16,由于准直器428对准扫描仪的轴,因此,经受相干散射的来自活动的源点410a的X射线将仅被位于扫描仪轴的与活动的源点相对的一侧的检测器行422a检测到,并且,根据准直器在多窄的程度上被聚焦,可能被在任一侧接近它的行中的一个或更多个行检测到。如果X射线被限定为又直又窄的“笔形”射束,那么,由于按较大角度非相干地散射的任何X射线将被准直器428截止,因此根本检测不到任何这种X射线。图16中的箭头‘a’示出了这种X射线的示例。但是,如果从活动的源点410a产生沿与扫描仪轴垂直的方向透过成像体积切片展开的X射线的扇形射束,那么指向进一步远离扫描仪轴的X射线可经受非相干散射并到达与活动的源点相对的行422a的任一侧的检测器。箭头b和c示出了这些X射线的示例。应当注意,为了到达任意检测器422b,必须在穿过扫描仪轴和该检测器422b的平面上发生散射事件。这意味着,对于给定的活动源点和特定的检测器,被检测的X射线的散射事件的位置可被识别为位于穿过扫描仪轴和该检测器的平面上。如果要确定散射事件的确切位置,那么需要其他的信息。例如,如果关于成像体积内的物体的位置的信息是可从例如断层摄影成像数据得到的,那么,如下面更详细地说明的那样,散射可与最可能的物体相关。
由布拉格散射数据,对于各个检测的散射事件,X射线能量和散射角度的组合可用于确定其中发生了散射事件的材料的原子间距离d。实际上,可以假定散射角度为常数,并且使用能量来区分不同的材料。对于康普顿散射,来自散射体积的各个体积的散射的水平给出该体积中的材料的密度的指示。也可确定康普顿散射与相干散射之比并将其用作表征成像物体的材料的另一参数。
由于用于各个X射线源点的较短的停留时间,因此各个源点的检测到的散射X射线的数量总是非常少,一般少于五条。为了形成合理的相干散射信号,必须收集断层摄影扫描内的所有源点的散射数据,然后累积成像体积的各个子体积的结果。对于具有500个源点的扫描仪和每次扫描每个子体积一个相干衍射散射结果的平均值,那么,在累积一组数据之后,每个子体积将具有与其相关的与该子体积内的500个散射事件对应的500个结果。典型的子体积在成像平面内占有几平方厘米的面积,体积厚度为几毫米。
现在参照图17,被配置为累积来自图14~16的扫描仪的散射检测器阵列422的数据的数据采集***包括与检测器422中的每一个相关的多通道分析器(MCA)500。各MCA 500被配置为接收来自检测器的输出信号,并向大量的X射线能量范围或通道中的一个分配检测的各X射线,并输出指示检测的X射线落入的能量范围的信号。多路复用器502被配置为接收来自MCA 500中的每一个的输出。还提供其中具有多个条目的查找表504,这些条目对于给定的源点和检测器识别其中散射了X射线的成像体积内的子体积。该***还包括包含大量的存储区508的图像存储器506,这些存储区508中的每一个都与扫描仪成像平面内的各个子体积相关。
在查找表504的指导下由多路复用器502自动地将数据加载到各个存储区508中。查找表在扫描之前装载有将检测器422和MCA 500的各个组合映射到相应的图像位置508的系数,每个X射线源位置一个查找表条目。处于正向(即基本上处于光子在任何交互作用之前从放射源起行进的方向)的那些像素(即检测器422)被假定为以约4~6度的小射束角度记录相干散射光子。不处于正向的那些像素422被假定为记录由于康普顿散射效应导致的非相干散射光子。由此,图像存储器506实际上是“三维的”-两个维度代表图像中的位置,而第三维度保持用于相干散射(低8位)和非相干散射(高8位)的散射能谱。查找表504还将关于在每次投影时为各个MCA 500收集的数据类型指示多路复用器502,使得填充适当的存储器空间。
一旦已对于给定的扫描收集了散射数据,就将数据传送到以上参照图4说明的主RTT数据采集***512,并且由投影定序器510使该数据与主RTT数据采集***512同步。由此,重构的图像数据和散射数据被同时传递到威胁检测***,该威胁检测***可使用它来确定适当的分析用参数。
对于每次扫描,来自透射检测器412的断层摄影图像数据会产生与图像的各个像素的X射线衰减有关的数据,该数据又与断层摄影成像体积的相应子体积对应。如以上参照图4说明的那样获得该数据。来自散射检测器422的数据如上所述的那样提供了与各子体积内的相干散射的量有关的数据和与各子体积内的非相干散射的量有关的数据。因此可在与图5的威胁检测处理器类似的威胁检测处理器中分析该数据。在这种情况下,提取的数据的参数可与图像数据或散射数据或两种或更多种类型的数据的组合有关。从数据提取的参数的示例是相干散射与非相干散射之比、从相干散射数据确定的材料类型、从非相干散射数据确定的材料密度、CT图像像素值与散射数据的相关关系。并且,还可确定与以上对于透射数据说明的参数对应的散射数据参数。
参照图18,在本发明的另一实施例中,用于产生断层摄影图像数据的透射检测器512被配置为在不同的能量范围上测量X射线透射。通过具有分别形成围绕传输器的环的两组检测器512a、512b来实现这一点。这两个组沿传输器的行进方向位于不同的轴向位置,在本情况下,这两个组沿轴向彼此相邻。第一组512a在其前面没有滤波器,但第二组512b具有位于它和X射线源510之间的金属滤波器513。第一组检测器512a因此在较宽的能量范围上检测透过的X射线,而第二组512b仅在该范围的处于高能量端的较窄的一部分中检测X射线。
随着要被扫描的物品沿传输器移动,可使用第一组检测器512a将其各个薄体积或切片扫描一次,然后使用第二组512b再次扫描。在示出的实施例中,使用同一放射源510同时扫描两个相邻的体积,使得通过检测器组512a、512b中的相应的一个收集这两个体积中的每一个的数据。在物品的体积经过两组检测器并被扫描两次之后,可使用两个不同的X射线能量范围形成两组图像数据,每个图像包含图像的各个像素的透射数据(并由此包含衰减数据)。可通过从第一检测器组512b的图像数据减去第二检测器组512a的图像数据,将这两组图像数据组合起来,得到低能量X射线分量的相应的图像数据。
可对于图像的各个像素记录各单个能量范围的X射线透射数据和诸如高能量和低能量的两个不同范围的数据之间的差异。然后可利用该数据来提高CT图像的精度。还可将其用作威胁检测算法中的另一参数。
可以理解,可以使用其他的方法以获得不同范围的X射线能量的透射数据。在图18和图19的***的修改例中,可以在两个检测器组上使用衡消滤波器。选择滤波器,使得存在被它们双方穿过的窄的能量窗口。然后可组合两组检测器的图像数据以获得该窄的能量窗口的透射数据。这使得能够获得化学特定成像。例如,可以通过使用在钙K边缘能量周围衡消的滤波器产生骨特定图像。很显然,可以在威胁检测算法中有效地使用该化学特定数据。
在另一实施例中,不使用各个单独的滤波器,而使用对于不同能量X射线敏感的两组检测器。在这种情况下,使用层叠的检测器,这些检测器包括对低能量X射线敏感而允许较高能量X射线穿过的薄的前检测器,和对于穿过前检测器的高能量X射线敏感的厚的后检测器。同样,可以使用不同能量范围的衰减数据以提供能量特定图像数据。
在另一实施例中,用通过在X射线源中使用例如160kV和100kV的不同的管电压实现的两种不同的X射线射束能量对物体的各个切片进行两次扫描。不同的能量会得到彼此相对偏移的X射线能谱。由于能谱在一部分能量范围上是相对平坦的,因此能谱在该范围的许多部分上是类似的。但是,能谱的一部分将显著变化。因此,可以使用两种管电压的比较图像以识别在这两幅图像之间衰减显著变化的物体部分。这因此在在图像之间发生变化的窄能谱部分中识别具有高衰减的图像区。这因此是获得被扫描体积内的子体积中的每一个的能量特定衰减数据的替代性方式。
参照图20,在本发明的另一实施例中,通过在具有两种不同的材料的目标区602、604的X射线管中设置阳极600,产生两种不同的X射线能谱。在这种情况下,例如,阳极包含具有一个钨目标区602和一个铀目标区604的铜基606。电子源610具有可被单独地激活的大量的源点612。在电子束616的路径的相对侧设置有一对电极612、614,该电极612、614可被控制为打开和切断电场以控制电子束的路径,使得它撞击目标区602、604中的一个或另一个。在阳极上产生的X射线的能谱将根据电子束616撞击到目标区中的哪一个上而改变。
本实施例使用与图1a的X射线源类似的X射线源,不同的目标区形成为沿阳极27延伸的平行条带。对于各个活动的电子源点,根据使用哪种目标材料,可以产生两种不同的X射线谱。放射源可被配置为在其活动时在各电子源点的两个目标区之间切换。作为替代方案,可以执行沿阳极27的扫描两次,一次针对一种目标材料,一次针对另一种。在任一种情况下,可能需要另外的电子束聚焦导线以确保电子束一次只照射一个或另一个目标材料。
根据从阳极提取X射线射束的角度,来自两个目标区602、604的射束在一些情况下可被配置为穿过同一成像体积并被共用的检测器阵列检测。作为替代方案,它们可被配置为穿过成像体积的相邻的切片并被各个单独的检测器阵列检测。在这种情况下,可以按与图18的配置类似的方式在物品连同传输器一起经过时扫描成像物品的各个部分两次。
参照图21,在还一实施例中,在单个扫描仪中设置在轴向上彼此相邻的两个检测器阵列,一个检测器阵列710与图1的检测器阵列对应并被配置为形成RTT图像,另一个检测器阵列712具有更高的分辨率并被配置为产生被扫描物体的高分辨率投影图像。在本实施例中,高分辨率检测器阵列712包括两个平行的线性阵列714、716,这两个线性阵列714、716中的每一个被配置为检测不同的能量的X射线,使得可以产生双重能量投影图像。在图22的实施例中,高分辨率阵列812包括两个层叠的阵列,即,位于上方的被配置为检测较低能量X射线而对较高能量X射线透明的薄阵列,和位于下方的被配置为检测较高能量X射线的较厚阵列。在两种情况下,两个检测器阵列均被配置为沿轴向足够靠近,以能够检测来自源点的单个线性阵列的X射线。
为了提供投影图像,当只有一个源点活动时,需要从高分辨率阵列712、812中的所有检测器捕获数据。参照图23,为了实现这一点,高分辨率阵列中的各个检测器718、818与积分器750连接。积分器包括与电容器754并联的放大器752。在检测器718和放大器752之间设置输入开关756,在放大器的输入端子两端设置复位开关758,在电容器754两端连接另一复位开关759,并且在积分器和模数转换器ADC之间设置多路复用开关760。
在操作中,当不需要检测器718活动时,关闭除多路复用开关760以外的所有开关。这确保电容器754不被充电并保持原样。然后,在要求检测器收集数据的时段的开始时,关闭两个复位开关758、759,使得由检测器718检测的任何X射线将导致电容器754上的电荷的增加,这会得到来自检测器718的信号的积分。当用于数据采集的时段结束时,打开输入开关756,使得电容器将保持充电。然后,为了从积分器读取积分信号,关闭输出开关760以将积分器与ADC连接。这样向ADC提供了模拟信号,该模拟信号由电容器754上的电荷的电平来确定,并因此指示检测器718在与积分器连接的时段期间检测到的X射线的数量。ADC然后将该模拟信号转换成用于输入到数据采集***的数字信号。为了产生单幅投影图像,当X射线源点中的一个活动时,使用所有的高分辨率检测器以同时收集数据。
参照图24,在另一实施例中,各个检测器718与并联的两个积分器750a、750b连接,这两个积分器750a、750b中的每一个与图23的积分器相同。来自这两个积分器的输出经由它们的输出开关760a、760b与ADC连接。这使得各个积分器能够被配置为在X射线源的扫描中在不同的点上积分来自检测器718的信号,并因此收集单独的图像的数据,这两幅图像通过不同的X射线源点来自不同的角度。例如,可以使用它以从正交方向产生多幅投影图像,这些投影图像可用于构建高分辨率3维图像的,由该高分辨率3维图像,可在三个维度中确定被成像包裹中的特征的位置。
由于高分辨率图像可帮助识别诸如细丝的需要较高分辨率的物品,因此当它与RTT图像组合时可以是有用的。
Claims (6)
1.一种具有中心纵轴的X射线扫描***,包括:
被配置为从扫描区域周围的多个X射线源位置产生X射线、并沿与中心纵轴垂直的方向穿过扫描区域发送产生的X射线的X射线源;
被配置为在围绕中心纵轴的圆形阵列中对发送的X射线进行检测的第一组检测器;
被配置为在围绕中心纵轴的圆筒阵列中对在扫描区域内散射的X射线进行检测的第二组检测器;
被配置为防止散射的X射线到达第二组检测器中的每一个除非X射线来自接收方向的准直器,其中,接收方向穿过中心纵轴并不与中心纵轴垂直,和
处理装置,该处理装置被配置为:
处理来自第一组检测器的输出以产生限定扫描区域的图像的图像数据,
分析图像数据以识别图像内的物体,
处理来自第二组检测器的输出以产生散射数据,
从检测到散射的X射线的检测器的轴向位置和在扫描区域中引导X射线的方向确定散射的位置,以及
将散射数据的多个部分与物体相关联。
2.根据权利要求1所述的***,其中,处理装置被配置为从散射数据确定来自扫描区域内的不同位置的散射的水平的度量。
3.根据权利要求2所述的***,其中,散射是相干散射。
4.根据权利要求1或权利要求2所述的***,其中,散射是非相干散射。
5.根据权利要求1或权利要求2所述的***,其中,处理装置被配置为从图像数据确定对散射的X射线已发生散射的位置的指示。
6.根据权利要求1或权利要求2所述的***,其中,处理装置被配置为限定图像内的多个像素、将像素中的至少一个识别为与图像内的物体相关联,并将散射数据的多个部分与相应像素相关联。
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Families Citing this family (133)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9958569B2 (en) | 2002-07-23 | 2018-05-01 | Rapiscan Systems, Inc. | Mobile imaging system and method for detection of contraband |
US8275091B2 (en) | 2002-07-23 | 2012-09-25 | Rapiscan Systems, Inc. | Compact mobile cargo scanning system |
US7963695B2 (en) | 2002-07-23 | 2011-06-21 | Rapiscan Systems, Inc. | Rotatable boom cargo scanning system |
US8804899B2 (en) | 2003-04-25 | 2014-08-12 | Rapiscan Systems, Inc. | Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners |
US7949101B2 (en) | 2005-12-16 | 2011-05-24 | Rapiscan Systems, Inc. | X-ray scanners and X-ray sources therefor |
US10483077B2 (en) | 2003-04-25 | 2019-11-19 | Rapiscan Systems, Inc. | X-ray sources having reduced electron scattering |
US8451974B2 (en) * | 2003-04-25 | 2013-05-28 | Rapiscan Systems, Inc. | X-ray tomographic inspection system for the identification of specific target items |
GB0525593D0 (en) | 2005-12-16 | 2006-01-25 | Cxr Ltd | X-ray tomography inspection systems |
GB0812864D0 (en) | 2008-07-15 | 2008-08-20 | Cxr Ltd | Coolign anode |
US8243876B2 (en) | 2003-04-25 | 2012-08-14 | Rapiscan Systems, Inc. | X-ray scanners |
US9113839B2 (en) | 2003-04-25 | 2015-08-25 | Rapiscon Systems, Inc. | X-ray inspection system and method |
GB0903198D0 (en) * | 2009-02-25 | 2009-04-08 | Cxr Ltd | X-Ray scanners |
US8223919B2 (en) | 2003-04-25 | 2012-07-17 | Rapiscan Systems, Inc. | X-ray tomographic inspection systems for the identification of specific target items |
US8837669B2 (en) | 2003-04-25 | 2014-09-16 | Rapiscan Systems, Inc. | X-ray scanning system |
US9208988B2 (en) | 2005-10-25 | 2015-12-08 | Rapiscan Systems, Inc. | Graphite backscattered electron shield for use in an X-ray tube |
US6928141B2 (en) | 2003-06-20 | 2005-08-09 | Rapiscan, Inc. | Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers |
US7471764B2 (en) | 2005-04-15 | 2008-12-30 | Rapiscan Security Products, Inc. | X-ray imaging system having improved weather resistance |
US9046465B2 (en) | 2011-02-24 | 2015-06-02 | Rapiscan Systems, Inc. | Optimization of the source firing pattern for X-ray scanning systems |
US7526064B2 (en) | 2006-05-05 | 2009-04-28 | Rapiscan Security Products, Inc. | Multiple pass cargo inspection system |
CA2666838C (en) | 2006-09-18 | 2010-12-07 | Optosecurity Inc. | Method and apparatus for assessing characteristics of liquids |
CA2690163C (en) * | 2006-10-02 | 2011-08-02 | Optosecurity Inc. | Method, apparatus and system for use in assessing the threat status of an article at a security check point |
NL1033178C2 (nl) * | 2007-01-05 | 2008-07-11 | Scarabee Id B V | Bagage-afgiftesysteem. |
US7693261B2 (en) * | 2007-05-17 | 2010-04-06 | Durham Scientific Crystals Limited | Method and apparatus for inspection of materials |
JP2009008441A (ja) * | 2007-06-26 | 2009-01-15 | Ihi Corp | 半固定式物質同定装置および方法 |
WO2009043145A1 (en) * | 2007-10-01 | 2009-04-09 | Optosecurity Inc. | Method and devices for assessing the threat status of an article at a security check point |
CN101403711B (zh) | 2007-10-05 | 2013-06-19 | 清华大学 | 液态物品检查方法和设备 |
CN101403710B (zh) * | 2007-10-05 | 2013-06-19 | 清华大学 | 液态物品检查方法和设备 |
CN101424648B (zh) * | 2007-10-30 | 2012-10-03 | 清华大学 | 检查***和检查方法 |
CN101470082B (zh) * | 2007-12-27 | 2011-03-30 | 同方威视技术股份有限公司 | 物品检测装置及其检测方法 |
US8086347B2 (en) * | 2008-01-22 | 2011-12-27 | Walgreen Co. | Targeted product distribution system and method |
GB0803640D0 (en) | 2008-02-28 | 2008-04-02 | Rapiscan Security Products Inc | Scanning systems |
GB0803641D0 (en) | 2008-02-28 | 2008-04-02 | Rapiscan Security Products Inc | Scanning systems |
WO2009127353A1 (de) * | 2008-04-18 | 2009-10-22 | Smiths Heimann | Verfahren und vorrichtung zur detektion eines bestimmten materials in einem objekt mittels elektromagnetischer strahlen |
GB0809110D0 (en) | 2008-05-20 | 2008-06-25 | Rapiscan Security Products Inc | Gantry scanner systems |
GB0809107D0 (en) | 2008-05-20 | 2008-06-25 | Rapiscan Security Products Inc | Scannign systems |
GB0809109D0 (en) | 2008-05-20 | 2008-06-25 | Rapiscan Security Products Inc | Scanner systems |
US8963094B2 (en) | 2008-06-11 | 2015-02-24 | Rapiscan Systems, Inc. | Composite gamma-neutron detection system |
GB0810638D0 (en) | 2008-06-11 | 2008-07-16 | Rapiscan Security Products Inc | Photomultiplier and detection systems |
WO2010025539A1 (en) * | 2008-09-05 | 2010-03-11 | Optosecurity Inc. | Method and system for performing x-ray inspection of a liquid product at a security checkpoint |
US7835495B2 (en) | 2008-10-31 | 2010-11-16 | Morpho Detection, Inc. | System and method for X-ray diffraction imaging |
GB0901338D0 (en) | 2009-01-28 | 2009-03-11 | Cxr Ltd | X-Ray tube electron sources |
US9202961B2 (en) * | 2009-02-02 | 2015-12-01 | Redlen Technologies | Imaging devices with solid-state radiation detector with improved sensitivity |
WO2010091493A1 (en) * | 2009-02-10 | 2010-08-19 | Optosecurity Inc. | Method and system for performing x-ray inspection of a product at a security checkpoint using simulation |
US7756249B1 (en) | 2009-02-19 | 2010-07-13 | Morpho Detection, Inc. | Compact multi-focus x-ray source, x-ray diffraction imaging system, and method for fabricating compact multi-focus x-ray source |
US8180138B2 (en) * | 2009-03-23 | 2012-05-15 | Morpho Detection, Inc. | Method and system for inspection of containers |
US9310323B2 (en) | 2009-05-16 | 2016-04-12 | Rapiscan Systems, Inc. | Systems and methods for high-Z threat alarm resolution |
GB2501023B (en) * | 2009-05-26 | 2014-02-12 | Rapiscan Systems Inc | X-ray tomographic inspection systems for the identification of specific target items |
EP3686901A1 (en) * | 2009-05-26 | 2020-07-29 | Rapiscan Systems, Inc. | X-ray tomographic inspection method |
JP5843759B2 (ja) * | 2009-05-26 | 2016-01-13 | ラピスカン システムズ、インコーポレイテッド | 高データ速度断層撮影x線スキャナ用のイメージング、データ獲得、データ伝送及びデータ配信のためのシステム |
EP2443441B8 (en) | 2009-06-15 | 2017-11-22 | Optosecurity Inc. | Method and apparatus for assessing the threat status of luggage |
RU2544388C2 (ru) * | 2009-06-18 | 2015-03-20 | Конинклейке Филипс Электроникс Н.В. | Создание оптимальных энергетических окон для рассеянных событий при формировании радионуклидных изображений |
EP2459990A4 (en) | 2009-07-31 | 2017-08-09 | Optosecurity Inc. | Method and system for identifying a liquid product in luggage or other receptacle |
US9442213B2 (en) | 2010-01-19 | 2016-09-13 | Rapiscan Systems, Inc. | Method of electron beam transport in an X-ray scanner |
CN102804326B (zh) * | 2010-01-19 | 2016-01-20 | 拉皮斯坎***股份有限公司 | 多视图货物扫描器 |
US20110188632A1 (en) * | 2010-02-03 | 2011-08-04 | Geoffrey Harding | Multiple plane multi-inverse fan-beam detection systems and method for using the same |
WO2011106332A2 (en) | 2010-02-23 | 2011-09-01 | Rapiscan Systems, Inc. | Simultaneous image distribution and archiving |
US8713131B2 (en) | 2010-02-23 | 2014-04-29 | RHPiscan Systems, Inc. | Simultaneous image distribution and archiving |
GB201010233D0 (en) | 2010-06-18 | 2010-07-21 | Univ Nottingham Trent | Improvements in or relating to sample analysis |
JP5765913B2 (ja) * | 2010-10-14 | 2015-08-19 | 株式会社東芝 | 医用画像診断装置及び医用画像処理方法 |
US8660226B2 (en) | 2011-01-19 | 2014-02-25 | General Electric Company | Systems and methods for multichannel noise reduction |
PL3270185T3 (pl) | 2011-02-08 | 2023-06-12 | Rapiscan Systems, Inc. | Niejawny nadzór z wykorzystaniem wielomodalnościowego wykrywania |
US9218933B2 (en) | 2011-06-09 | 2015-12-22 | Rapidscan Systems, Inc. | Low-dose radiographic imaging system |
KR101973221B1 (ko) | 2011-09-07 | 2019-04-26 | 라피스캔 시스템스, 인코포레이티드 | 적하목록 데이터를 이미징/검출 프로세싱에 통합시키는 x-선 검사시스템 |
DE112012004856B4 (de) | 2011-11-22 | 2022-01-05 | The University Of North Carolina At Chapel Hill | Kontrollsystem und Verfahren zur schnellen, platzsparenden Röntgentomografiekontrolle |
US10670740B2 (en) | 2012-02-14 | 2020-06-02 | American Science And Engineering, Inc. | Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors |
DE102012005767A1 (de) * | 2012-03-25 | 2013-09-26 | DüRR DENTAL AG | Phasenkontrast-Röntgen-Tomographiegerät |
CN104486997B (zh) * | 2012-06-05 | 2017-07-25 | 拉皮斯坎***股份有限公司 | X射线扫描***的射线源激发模式的最佳化 |
CN103674979B (zh) * | 2012-09-19 | 2016-12-21 | 同方威视技术股份有限公司 | 一种行李物品ct安检***及其探测器装置 |
US20140175289A1 (en) * | 2012-12-21 | 2014-06-26 | R. John Voorhees | Conveyer Belt with Optically Visible and Machine-Detectable Indicators |
CN103901488A (zh) * | 2012-12-27 | 2014-07-02 | 同方威视技术股份有限公司 | 固定式ct装置 |
CN103901493B (zh) * | 2012-12-27 | 2016-12-28 | 同方威视技术股份有限公司 | 一种无机架ct装置 |
US9183261B2 (en) | 2012-12-28 | 2015-11-10 | Shutterstock, Inc. | Lexicon based systems and methods for intelligent media search |
US9183215B2 (en) | 2012-12-29 | 2015-11-10 | Shutterstock, Inc. | Mosaic display systems and methods for intelligent media search |
CN103076350A (zh) * | 2013-01-04 | 2013-05-01 | 公安部第一研究所 | 一种移动背散射x射线安全检查方法及装置 |
WO2014121097A1 (en) | 2013-01-31 | 2014-08-07 | Rapiscan Systems, Inc. | Portable security inspection system |
CA2919159A1 (en) | 2013-07-23 | 2015-01-29 | Rapiscan Systems, Inc. | Methods for improving processing speed for object inspection |
EP3025148A1 (en) * | 2013-07-25 | 2016-06-01 | Analogic Corporation | Generation of diffraction signature of item within object |
KR102207643B1 (ko) | 2013-08-09 | 2021-01-25 | 고쿠리쓰다이가쿠호진 규슈다이가쿠 | 유기 금속 착물, 발광 재료, 지연 형광체 및 유기 발광 소자 |
CN103499593A (zh) * | 2013-09-23 | 2014-01-08 | 深圳先进技术研究院 | 一种计算机断层扫描*** |
CN103611687A (zh) * | 2013-11-27 | 2014-03-05 | 南通芯迎设计服务有限公司 | 一种具有安全检查功能的包裹自动分类通知装置 |
US9557427B2 (en) | 2014-01-08 | 2017-01-31 | Rapiscan Systems, Inc. | Thin gap chamber neutron detectors |
CN103808741A (zh) * | 2014-03-07 | 2014-05-21 | 黄善花 | 一种行李安全检查机及其检查方法 |
CN105785462B (zh) * | 2014-06-25 | 2019-02-22 | 同方威视技术股份有限公司 | 一种定位三维ct图像中的目标的方法和安检ct*** |
WO2016003547A1 (en) | 2014-06-30 | 2016-01-07 | American Science And Engineering, Inc. | Rapidly relocatable modular cargo container scanner |
FR3023001A1 (fr) | 2014-06-30 | 2016-01-01 | Commissariat Energie Atomique | Procede d'analyse d'un objet en deux temps utilisant un rayonnement en transmission puis un spectre en diffusion. |
CA2973721A1 (en) * | 2015-01-16 | 2016-07-21 | Rapiscan Systems, Inc. | Non-intrusive inspection systems and methods for the detection of materials of interest |
MX2017009342A (es) | 2015-01-20 | 2017-11-17 | American Science & Eng Inc | Punto focal dinamicamente ajustable. |
PL3271709T3 (pl) | 2015-03-20 | 2023-02-20 | Rapiscan Systems, Inc. | Ręczny przenośny system kontroli rozpraszania wstecznego |
WO2017011057A2 (en) * | 2015-04-27 | 2017-01-19 | GREEN, Christopher, K. | Four plane x-ray inspection system |
US10345479B2 (en) | 2015-09-16 | 2019-07-09 | Rapiscan Systems, Inc. | Portable X-ray scanner |
JP6654397B2 (ja) * | 2015-10-09 | 2020-02-26 | 株式会社イシダ | X線検査装置 |
WO2017114267A1 (zh) * | 2015-12-29 | 2017-07-06 | 上海联影医疗科技有限公司 | 一种医疗设备的数据采集***及其配置方法 |
GB2564038B (en) | 2016-02-22 | 2021-11-10 | Rapiscan Systems Inc | Systems and methods for detecting threats and contraband in cargo |
CN110199209B (zh) | 2016-07-28 | 2021-07-30 | 德国史密斯海曼简化股份公司 | 散射成像 |
GB2555564B (en) * | 2016-07-28 | 2020-09-09 | Smiths Heimann Sas | Scatter imaging |
US20180038807A1 (en) * | 2016-08-08 | 2018-02-08 | Adaptix Ltd. | Method and system for reconstructing 3-dimensional images from spatially and temporally overlapping x-rays |
WO2018144630A1 (en) | 2017-01-31 | 2018-08-09 | Rapiscan Systems, Inc. | High-power x-ray sources and methods of operation |
WO2018195016A1 (en) | 2017-04-17 | 2018-10-25 | Rapiscan Systems, Inc. | X-ray tomography inspection systems and methods |
US10987071B2 (en) * | 2017-06-29 | 2021-04-27 | University Of Delaware | Pixelated K-edge coded aperture system for compressive spectral X-ray imaging |
CN109420623A (zh) * | 2017-08-31 | 2019-03-05 | 无锡日联科技股份有限公司 | 一种应用于贝壳的全自动x射线检测、分拣*** |
US10585206B2 (en) | 2017-09-06 | 2020-03-10 | Rapiscan Systems, Inc. | Method and system for a multi-view scanner |
EP3530360A1 (de) * | 2018-02-21 | 2019-08-28 | Siemens Aktiengesellschaft | Erkennung von nicht förderfähigen sendungen |
US20190346379A1 (en) * | 2018-05-10 | 2019-11-14 | Voti Inc. | X-ray screening system and method |
US10845491B2 (en) | 2018-06-04 | 2020-11-24 | Sigray, Inc. | Energy-resolving x-ray detection system |
WO2019245636A1 (en) | 2018-06-20 | 2019-12-26 | American Science And Engineering, Inc. | Wavelength-shifting sheet-coupled scintillation detectors |
CN112154322A (zh) * | 2018-06-27 | 2020-12-29 | 东丽株式会社 | 放射线透过检查方法和装置、以及微多孔膜的制造方法 |
CN108614303A (zh) * | 2018-07-12 | 2018-10-02 | 同方威视技术股份有限公司 | 安全检查设备的屏蔽结构及安全检查通道 |
GB2591630B (en) | 2018-07-26 | 2023-05-24 | Sigray Inc | High brightness x-ray reflection source |
JP6632674B1 (ja) * | 2018-09-06 | 2020-01-22 | 株式会社東芝 | 検査装置及び検査プログラム |
CN112823280A (zh) | 2018-09-07 | 2021-05-18 | 斯格瑞公司 | 用于深度可选x射线分析的***和方法 |
CN110907481A (zh) * | 2018-09-18 | 2020-03-24 | 同方威视技术股份有限公司 | 一种x射线的检测***和检测方法 |
WO2020073132A1 (en) * | 2018-10-11 | 2020-04-16 | Shawcor Ltd. | Skewed x-ray detection apparatus and method for pipeline use |
US11977037B2 (en) | 2018-10-22 | 2024-05-07 | Rapiscan Holdings, Inc. | Insert for screening tray |
DE102019111463A1 (de) * | 2019-05-03 | 2020-11-05 | Wipotec Gmbh | Röntgenstrahlungsdetektorvorrichtung und Vorrichtung zur Röntgeninspektion von Produkten, insbesondere von Lebensmitteln |
CN110155688B (zh) * | 2019-06-02 | 2020-12-25 | 浙江鼎兴企业管理有限公司 | 一种分流式车站行李安检机 |
CN110361400A (zh) * | 2019-07-01 | 2019-10-22 | 创新奇智(合肥)科技有限公司 | 一种铸铁工件的气泡检测方法及电子设备 |
CN110327070A (zh) * | 2019-07-12 | 2019-10-15 | 山东大骋医疗科技有限公司 | 具有储能***的ct设备 |
US20220323030A1 (en) * | 2019-09-16 | 2022-10-13 | Voti Inc. | Probabilistic image analysis |
US11058369B2 (en) | 2019-11-15 | 2021-07-13 | GE Precision Healthcare LLC | Systems and methods for coherent scatter imaging using a segmented photon-counting detector for computed tomography |
US11594001B2 (en) | 2020-01-20 | 2023-02-28 | Rapiscan Systems, Inc. | Methods and systems for generating three-dimensional images that enable improved visualization and interaction with objects in the three-dimensional images |
US11397269B2 (en) | 2020-01-23 | 2022-07-26 | Rapiscan Systems, Inc. | Systems and methods for compton scatter and/or pulse pileup detection |
US11212902B2 (en) | 2020-02-25 | 2021-12-28 | Rapiscan Systems, Inc. | Multiplexed drive systems and methods for a multi-emitter X-ray source |
US11193898B1 (en) | 2020-06-01 | 2021-12-07 | American Science And Engineering, Inc. | Systems and methods for controlling image contrast in an X-ray system |
WO2021257049A1 (en) * | 2020-06-15 | 2021-12-23 | American Science And Engineering, Inc. | Scatter x-ray imaging with adaptive scanning beam intensity |
US11175245B1 (en) | 2020-06-15 | 2021-11-16 | American Science And Engineering, Inc. | Scatter X-ray imaging with adaptive scanning beam intensity |
EP3933881A1 (en) | 2020-06-30 | 2022-01-05 | VEC Imaging GmbH & Co. KG | X-ray source with multiple grids |
KR102246196B1 (ko) * | 2020-07-06 | 2021-04-29 | 주식회사 딥노이드 | X-ray 보안 장치에 대한 데이터 분석 장치 및 방법 |
US11340361B1 (en) | 2020-11-23 | 2022-05-24 | American Science And Engineering, Inc. | Wireless transmission detector panel for an X-ray scanner |
WO2022183191A1 (en) | 2021-02-23 | 2022-09-01 | Rapiscan Systems, Inc. | Systems and methods for eliminating cross-talk in scanning systems having multiple x-ray sources |
JP2022144586A (ja) * | 2021-03-19 | 2022-10-03 | 株式会社イシダ | X線検査装置 |
US11885752B2 (en) | 2021-06-30 | 2024-01-30 | Rapiscan Holdings, Inc. | Calibration method and device therefor |
CN113960086B (zh) * | 2021-09-18 | 2024-01-02 | 中国航天科工集团第二研究院 | 一种补偿式背散射探测器栅格准直成像***及方法 |
GB2612326A (en) * | 2021-10-27 | 2023-05-03 | Smiths Detection France S A S | Static or quasi-static multi-view or 3D inspection of cargo |
Family Cites Families (963)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US768538A (en) | 1903-01-03 | 1904-08-23 | Cons Car Heating Co | Air-brake. |
US2010020A (en) | 1929-11-04 | 1935-08-06 | Holzwarth Gas Turbine Co | Explosion turbine |
US2006291A (en) | 1932-01-28 | 1935-06-25 | Donald S Barrows | Registration control for pipe organs |
US2005180A (en) | 1933-02-20 | 1935-06-18 | Standard Oil Co California | Tank cleaning device |
US2009060A (en) | 1933-03-18 | 1935-07-23 | Noble And Cooley Company | Sound propagating diaphragm and hoop |
US2010278A (en) | 1933-12-18 | 1935-08-06 | William A Snyder | Folding table |
US2007003A (en) | 1934-05-24 | 1935-07-02 | Milprint Products Corp | Commodity wrapper |
US2101143A (en) | 1935-12-31 | 1937-12-07 | Westinghouse Electric & Mfg Co | Shockproof X-ray unit |
US2333525A (en) | 1941-09-04 | 1943-11-02 | Westinghouse Electric & Mfg Co | Vapor electric device |
US2299251A (en) | 1941-10-15 | 1942-10-20 | Albert C Perbal | Adjustable bracket |
GB730803A (en) | 1951-11-08 | 1955-06-01 | Licentia Gmbh | Improvements in and relating to x-ray tubes |
US2831123A (en) | 1956-07-11 | 1958-04-15 | Webster J Daly | X-ray fluoroscopic device |
US2952790A (en) | 1957-07-15 | 1960-09-13 | Raytheon Co | X-ray tubes |
US2999935A (en) | 1957-10-30 | 1961-09-12 | Industrial Nucleonics Corp | Convertible radiation source |
US3143651A (en) | 1961-02-23 | 1964-08-04 | American Science & Eng Inc | X-ray reflection collimator adapted to focus x-radiation directly on a detector |
US3239706A (en) * | 1961-04-17 | 1966-03-08 | High Voltage Engineering Corp | X-ray target |
US3138729A (en) | 1961-09-18 | 1964-06-23 | Philips Electronic Pharma | Ultra-soft X-ray source |
FR1469185A (fr) | 1965-12-30 | 1967-02-10 | Csf | Intégration d'éléments magnétiques câblés |
GB1272498A (en) | 1969-12-03 | 1972-04-26 | Philips Electronic Associated | X-ray tube having a metal envelope |
US3610994A (en) | 1970-08-31 | 1971-10-05 | Sheldon Edward E | Cathode-ray tubes of television type for x-rays protection |
US3713156A (en) | 1970-10-12 | 1973-01-23 | R Pothier | Surface and subsurface detection device |
US3768645A (en) | 1971-02-22 | 1973-10-30 | Sunkist Growers Inc | Method and means for automatically detecting and sorting produce according to internal damage |
JPS5325851B1 (zh) | 1971-03-29 | 1978-07-29 | ||
US3707672A (en) | 1971-06-02 | 1972-12-26 | Westinghouse Electric Corp | Weapon detector utilizing the pulsed field technique to detect weapons on the basis of weapons thickness |
US3780291A (en) | 1971-07-07 | 1973-12-18 | American Science & Eng Inc | Radiant energy imaging with scanning pencil beam |
USRE28544E (en) | 1971-07-07 | 1975-09-02 | Radiant energy imaging with scanning pencil beam | |
US3790785A (en) | 1971-11-18 | 1974-02-05 | American Science & Eng Inc | Radiographic imaging |
US3784837A (en) | 1972-05-08 | 1974-01-08 | Siemens Ag | X-ray device with a stand |
US3790799A (en) | 1972-06-21 | 1974-02-05 | American Science & Eng Inc | Radiant energy imaging with rocking scanning |
US3766387A (en) | 1972-07-11 | 1973-10-16 | Us Navy | Nondestructive test device using radiation to detect flaws in materials |
JPS5224397B2 (zh) | 1973-06-05 | 1977-06-30 | ||
US3848130A (en) | 1973-06-25 | 1974-11-12 | A Macovski | Selective material x-ray imaging system |
JPS5413286B2 (zh) | 1973-08-30 | 1979-05-30 | ||
US3867637A (en) | 1973-09-04 | 1975-02-18 | Raytheon Co | Extended monochromatic x-ray source |
JPS5081080A (zh) | 1973-11-14 | 1975-07-01 | ||
US3854049A (en) | 1973-12-10 | 1974-12-10 | Wisconsin Alumni Res Found | Compensation for patient thickness variations in differential x-ray transmission imaging |
GB1497396A (en) | 1974-03-23 | 1978-01-12 | Emi Ltd | Radiography |
US3980889A (en) | 1974-04-08 | 1976-09-14 | North American Philips Corporation | Article transfer and inspection apparatus |
USRE32961E (en) | 1974-09-06 | 1989-06-20 | U.S. Philips Corporation | Device for measuring local radiation absorption in a body |
DE2442809A1 (de) | 1974-09-06 | 1976-03-18 | Philips Patentverwaltung | Anordnung zur ermittlung der absorption in einem koerper |
US3965358A (en) | 1974-12-06 | 1976-06-22 | Albert Macovski | Cross-sectional imaging system using a polychromatic x-ray source |
JPS5178696A (en) | 1974-12-28 | 1976-07-08 | Tokyo Shibaura Electric Co | x senkan |
US4031401A (en) | 1975-03-14 | 1977-06-21 | American Science & Engineering, Inc. | Radiant energy imaging scanning |
DE2532218C2 (de) | 1975-07-18 | 1982-09-02 | Heimann Gmbh, 6200 Wiesbaden | Vorrichtung zum Prüfen von Gepäckstücken mittels Röntgenstrahlung |
DE2532300C3 (de) | 1975-07-18 | 1979-05-17 | Heimann Gmbh, 6200 Wiesbaden | Anlage zum Prüfen von Gepäckstücken mittels Röntgenstrahlung |
GB1526041A (en) | 1975-08-29 | 1978-09-27 | Emi Ltd | Sources of x-radiation |
US4031545A (en) | 1975-09-08 | 1977-06-21 | American Science & Engineering, Inc. | Radiant energy alarm system |
US4045672A (en) | 1975-09-11 | 1977-08-30 | Nihon Denshi Kabushiki Kaisha | Apparatus for tomography comprising a pin hole for forming a microbeam of x-rays |
NL7611391A (nl) | 1975-10-18 | 1977-04-20 | Emi Ltd | Roentgentoestel. |
US4210811A (en) | 1975-11-03 | 1980-07-01 | Heimann Gmbh | Drive for moveable shield in luggage screening apparatus |
JPS5275996A (en) | 1975-12-20 | 1977-06-25 | Toshiba Corp | X-ray tube for analysis |
IT1083997B (it) | 1976-01-30 | 1985-05-25 | Pretini Gisberto | Porta a tamburo definita da scomparti ruotanti combinabile con un rivelatore di armi per impianti di protezione antirapina ed antiostaggio |
JPS52124890A (en) | 1976-04-13 | 1977-10-20 | Toshiba Corp | X-ray tube |
DE2647167A1 (de) | 1976-10-19 | 1978-04-20 | Siemens Ag | Verfahren zur herstellung von schichtaufnahmen mit roentgen- oder aehnlich durchdringenden strahlen |
US4171254A (en) | 1976-12-30 | 1979-10-16 | Exxon Research & Engineering Co. | Shielded anodes |
FR2379158A1 (fr) | 1977-01-28 | 1978-08-25 | Radiologie Cie Gle | Tube radiogene pour fournir un faisceau de rayons x plat en eventail de grande ouverture et appareil de radiologie comportant un tel tube |
DE2705640A1 (de) * | 1977-02-10 | 1978-08-17 | Siemens Ag | Rechnersystem fuer den bildaufbau eines koerperschnittbildes und verfahren zum betrieb des rechnersystems |
US4105922A (en) | 1977-04-11 | 1978-08-08 | General Electric Company | CT number identifier in a computed tomography system |
DE2729353A1 (de) | 1977-06-29 | 1979-01-11 | Siemens Ag | Roentgenroehre mit wanderndem brennfleck |
JPS5427793A (en) * | 1977-08-04 | 1979-03-02 | Toshiba Corp | X-ray tomographic diagnosis apparatus |
DE2735400C2 (de) | 1977-08-05 | 1979-09-20 | Heimann Gmbh, 6200 Wiesbaden | Vorrichtung zum Prüfen von Gepäckstücken mitteis Röntgenstrahlung |
US4200800A (en) | 1977-11-03 | 1980-04-29 | American Science & Engineering, Inc. | Reduced dose CT scanning |
JPS5480097A (en) | 1977-12-09 | 1979-06-26 | Nippon Telegr & Teleph Corp <Ntt> | Soft x-ray tube anti-cathode and its manufacture |
DE2756659A1 (de) | 1977-12-19 | 1979-06-21 | Philips Patentverwaltung | Anordnung zur bestimmung der absorptionsverteilung |
US4471343A (en) | 1977-12-27 | 1984-09-11 | Lemelson Jerome H | Electronic detection systems and methods |
US4297580A (en) | 1977-12-27 | 1981-10-27 | North American Philips Corporation | X-ray optical system for article inspection, with components disposed on parallel axes |
US4158770A (en) | 1978-01-03 | 1979-06-19 | Raytheon Company | Radiographic imaging system |
DE2807735B2 (de) | 1978-02-23 | 1979-12-20 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Röntgenröhre mit einem aus Metall bestehenden Röhrenkolben |
US4242583A (en) | 1978-04-26 | 1980-12-30 | American Science And Engineering, Inc. | X-ray imaging variable resolution |
US4228353A (en) | 1978-05-02 | 1980-10-14 | Johnson Steven A | Multiple-phase flowmeter and materials analysis apparatus and method |
US4185205A (en) | 1978-05-09 | 1980-01-22 | American Science & Engineering, Inc. | Remote load controller |
US4165472A (en) | 1978-05-12 | 1979-08-21 | Rockwell International Corporation | Rotating anode x-ray source and cooling technique therefor |
US4260898A (en) | 1978-09-28 | 1981-04-07 | American Science And Engineering, Inc. | X-ray imaging variable resolution |
JPS5546408A (en) | 1978-09-29 | 1980-04-01 | Toshiba Corp | X-ray device |
JPS5568056A (en) | 1978-11-17 | 1980-05-22 | Hitachi Ltd | X-ray tube |
US4228357A (en) | 1978-12-04 | 1980-10-14 | American Science And Engineering, Inc. | Detector on wheel system (flying spot) |
US4245158A (en) | 1979-03-26 | 1981-01-13 | American Science And Engineering, Inc. | Soft x-ray spectrometric imaging system |
DE2926456A1 (de) * | 1979-06-30 | 1981-01-15 | Philips Patentverwaltung | Verfahren zur ermittlung des randes eines koerpers mittels am koerper gestreuter strahlung |
US4303860A (en) | 1979-07-30 | 1981-12-01 | American Science And Engineering, Inc. | High resolution radiation detector |
DE2944147A1 (de) * | 1979-11-02 | 1981-05-14 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Anordnung zur ermittlung der streudichteverteilung in einem ebenen untersuchungsbereich |
US4266425A (en) | 1979-11-09 | 1981-05-12 | Zikonix Corporation | Method for continuously determining the composition and mass flow of butter and similar substances from a manufacturing process |
US4309637A (en) | 1979-11-13 | 1982-01-05 | Emi Limited | Rotating anode X-ray tube |
JPS5686448A (en) | 1979-12-17 | 1981-07-14 | Hitachi Ltd | X-ray tube and its manufacturing method |
US4352021A (en) | 1980-01-07 | 1982-09-28 | The Regents Of The University Of California | X-Ray transmission scanning system and method and electron beam X-ray scan tube for use therewith |
US4420382A (en) | 1980-01-18 | 1983-12-13 | Alcan International Limited | Method for controlling end effect on anodes used for cathodic protection and other applications |
SU1022236A1 (ru) | 1980-03-12 | 1983-06-07 | Институт сильноточной электроники СО АН СССР | Источник м гкого рентгеновского излучени |
US4472822A (en) | 1980-05-19 | 1984-09-18 | American Science And Engineering, Inc. | X-Ray computed tomography using flying spot mechanical scanning mechanism |
JPS56167464A (en) | 1980-05-30 | 1981-12-23 | Nippon Telegr & Teleph Corp <Ntt> | Ink recording head |
JPS5717524A (en) | 1980-07-04 | 1982-01-29 | Meidensha Electric Mfg Co Ltd | Electrode structure for vacuum breaker |
US4366382B2 (en) | 1980-09-09 | 1997-10-14 | Scanray Corp | X-ray line scan system for use in baggage inspection |
JPS5756740A (en) | 1980-09-22 | 1982-04-05 | Mitsubishi Electric Corp | Object inspecting device |
US4342914A (en) | 1980-09-29 | 1982-08-03 | American Science And Engineering, Inc. | Flying spot scanner having arbitrarily shaped field size |
US4366576A (en) | 1980-11-17 | 1982-12-28 | American Science And Engineering, Inc. | Penetrating radiant energy imaging system with multiple resolution |
US4414682A (en) | 1980-11-17 | 1983-11-08 | American Science And Engineering, Inc. | Penetrating radiant energy imaging system with multiple resolution |
GB2089109B (en) | 1980-12-03 | 1985-05-15 | Machlett Lab Inc | X-rays targets and tubes |
JPS57110854A (en) | 1980-12-27 | 1982-07-09 | Seiko Epson Corp | Shuttle turning device |
DE3107949A1 (de) | 1981-03-02 | 1982-09-16 | Siemens AG, 1000 Berlin und 8000 München | Roentgenroehre |
US4405876A (en) | 1981-04-02 | 1983-09-20 | Iversen Arthur H | Liquid cooled anode x-ray tubes |
US4622687A (en) | 1981-04-02 | 1986-11-11 | Arthur H. Iversen | Liquid cooled anode x-ray tubes |
NL8101697A (nl) | 1981-04-07 | 1982-11-01 | Philips Nv | Werkwijze voor het vervaardigen van een anode en zo verkregen anode. |
JPS57175247A (en) | 1981-04-23 | 1982-10-28 | Toshiba Corp | Radiation void factor meter |
US4399403A (en) | 1981-09-22 | 1983-08-16 | Strandberg Engineering Laboratories, Inc. | Microwave moisture measuring, indicating and control apparatus |
DE3145227A1 (de) | 1981-11-13 | 1983-05-19 | Heimann Gmbh, 6200 Wiesbaden | Verfahren und vorrichtung zur untersuchung des inhaltes von containern |
US4389729A (en) | 1981-12-15 | 1983-06-21 | American Science And Engineering, Inc. | High resolution digital radiography system |
JPS58212045A (ja) | 1982-06-02 | 1983-12-09 | Natl Inst For Res In Inorg Mater | X線発生装置用筒状対陰極 |
US4422177A (en) | 1982-06-16 | 1983-12-20 | American Science And Engineering, Inc. | CT Slice proximity rotary table and elevator for examining large objects |
JPS591625A (ja) | 1982-06-26 | 1984-01-07 | High Frequency Heattreat Co Ltd | 膨大部のある軸体の表面加熱方法 |
FR2534066B1 (fr) | 1982-10-05 | 1989-09-08 | Thomson Csf | Tube a rayons x produisant un faisceau a haut rendement, notamment en forme de pinceau |
JPS5975549A (ja) | 1982-10-22 | 1984-04-28 | Canon Inc | X線管球 |
JPS5975549U (ja) | 1982-11-12 | 1984-05-22 | 株式会社クボタ | 側弁式エンジンの混合気加熱式気化促進装置 |
GB2133208B (en) | 1982-11-18 | 1986-02-19 | Kratos Ltd | X-ray sources |
US4626688A (en) | 1982-11-26 | 1986-12-02 | Barnes Gary T | Split energy level radiation detection |
US4511799A (en) | 1982-12-10 | 1985-04-16 | American Science And Engineering, Inc. | Dual energy imaging |
US4599740A (en) | 1983-01-06 | 1986-07-08 | Cable Arthur P | Radiographic examination system |
US4691332A (en) | 1983-03-14 | 1987-09-01 | American Science And Engineering, Inc. | High energy computed tomography |
US4531226A (en) | 1983-03-17 | 1985-07-23 | Imatron Associates | Multiple electron beam target for use in X-ray scanner |
JPS59174744A (ja) | 1983-03-25 | 1984-10-03 | Toshiba Corp | 二相流体の密度分布測定装置 |
NL8301839A (nl) | 1983-05-25 | 1984-12-17 | Philips Nv | Roentgenbuis met twee opvolgende lagen anodemateriaal. |
JPS5916254A (ja) | 1983-06-03 | 1984-01-27 | Toshiba Corp | 携帯用x線装置 |
JPS601554A (ja) | 1983-06-20 | 1985-01-07 | Mitsubishi Electric Corp | 超音波検査装置 |
JPS6015546A (ja) | 1983-07-07 | 1985-01-26 | Toshiba Corp | 局所ボイド率分布の測定方法 |
JPS6021440A (ja) | 1983-07-15 | 1985-02-02 | Toshiba Corp | 局所ボイド率分布の測定方法 |
JPS6038957A (ja) | 1983-08-11 | 1985-02-28 | Nec Corp | 4相psk波の位相不確定除去回路 |
US4625324A (en) | 1983-09-19 | 1986-11-25 | Technicare Corporation | High vacuum rotating anode x-ray tube |
JPS6073442A (ja) | 1983-09-30 | 1985-04-25 | Toshiba Corp | 放射線断層測定装置 |
US4593355A (en) | 1983-11-21 | 1986-06-03 | American Science And Engineering, Inc. | Method of quick back projection for computed tomography and improved CT machine employing the method |
DE3343886A1 (de) | 1983-12-05 | 1985-06-13 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Drehanoden-roentgenroehre mit einem gleitlager |
US4571491A (en) | 1983-12-29 | 1986-02-18 | Shell Oil Company | Method of imaging the atomic number of a sample |
JPS60181851A (ja) | 1984-02-29 | 1985-09-17 | Toshiba Corp | 部分書込み制御方式 |
US4672649A (en) | 1984-05-29 | 1987-06-09 | Imatron, Inc. | Three dimensional scanned projection radiography using high speed computed tomographic scanning system |
JPH0744056B2 (ja) | 1984-06-15 | 1995-05-15 | 日本電装株式会社 | セラミツクヒ−タ |
FR2566960B1 (fr) | 1984-06-29 | 1986-11-14 | Thomson Cgr | Tube a rayons x a anode tournante et procede de fixation d'une anode tournante sur un axe support |
JPS6128039A (ja) | 1984-07-16 | 1986-02-07 | ユニチカ株式会社 | 荒巻整経法 |
US4763345A (en) | 1984-07-31 | 1988-08-09 | The Regents Of The University Of California | Slit scanning and deteching system |
DE3431082A1 (de) | 1984-08-23 | 1986-02-27 | Heimann Gmbh, 6200 Wiesbaden | Schaltungsanordnung zur hochspannungsversorung einer roentgenroehre |
JPS61107642A (ja) | 1984-10-30 | 1986-05-26 | Mitsubishi Electric Corp | X線発生用タ−ゲツトの冷却方法 |
JPS61134021A (ja) | 1984-12-05 | 1986-06-21 | Canon Inc | 投影露光装置 |
US4768214A (en) | 1985-01-16 | 1988-08-30 | American Science And Engineering, Inc. | Imaging |
CN1003542B (zh) | 1985-03-04 | 1989-03-08 | 海曼股份公司 | X-射线扫描仪 |
CN85107860A (zh) | 1985-04-03 | 1986-10-01 | 海曼股份公司 | X-射线扫描仪 |
US4845731A (en) | 1985-06-05 | 1989-07-04 | Picker International | Radiation data acquistion |
DE3526015A1 (de) | 1985-07-20 | 1987-01-22 | Philips Patentverwaltung | Verfahren zum bestimmen der raeumlichen verteilung der streuquerschnitte fuer elastisch gestreute roentgenstrahlung und anordnung zur durchfuehrung des verfahrens |
US4719645A (en) | 1985-08-12 | 1988-01-12 | Fujitsu Limited | Rotary anode assembly for an X-ray source |
JPS6244940A (ja) | 1985-08-22 | 1987-02-26 | Shimadzu Corp | X線源 |
GB8521287D0 (en) | 1985-08-27 | 1985-10-02 | Frith B | Flow measurement & imaging |
JPS6264977A (ja) | 1985-09-18 | 1987-03-24 | Hitachi Medical Corp | 産業用x線異物検査方法及びその実施装置 |
US5414622A (en) | 1985-11-15 | 1995-05-09 | Walters; Ronald G. | Method and apparatus for back projecting image data into an image matrix location |
US4789930A (en) | 1985-11-15 | 1988-12-06 | Picker International, Inc. | Energy dependent gain correction for radiation detection |
JPS62121773A (ja) | 1985-11-20 | 1987-06-03 | Kansai Paint Co Ltd | 防汚塗料 |
US4736400A (en) | 1986-01-09 | 1988-04-05 | The Machlett Laboratories, Inc. | Diffusion bonded x-ray target |
US4845769A (en) | 1986-01-17 | 1989-07-04 | American Science And Engineering, Inc. | Annular x-ray inspection system |
EP0247491B1 (de) | 1986-05-28 | 1990-08-16 | Heimann GmbH | Röntgenscanner |
US4799247A (en) | 1986-06-20 | 1989-01-17 | American Science And Engineering, Inc. | X-ray imaging particularly adapted for low Z materials |
JPS6316535A (ja) | 1986-07-09 | 1988-01-23 | Rigaku Keisoku Kk | 細径x線ビ−ム発生装置 |
JPS6321040A (ja) | 1986-07-16 | 1988-01-28 | 工業技術院長 | 超高速x線ctスキヤナ |
US4809312A (en) | 1986-07-22 | 1989-02-28 | American Science And Engineering, Inc. | Method and apparatus for producing tomographic images |
US4958363A (en) | 1986-08-15 | 1990-09-18 | Nelson Robert S | Apparatus for narrow bandwidth and multiple energy x-ray imaging |
JPS63109653A (ja) | 1986-10-27 | 1988-05-14 | Sharp Corp | 情報登録検索装置 |
DE3638378A1 (de) | 1986-11-11 | 1988-05-19 | Siemens Ag | Roentgenroehre |
US4963746A (en) | 1986-11-25 | 1990-10-16 | Picker International, Inc. | Split energy level radiation detection |
JPS63150840A (ja) | 1986-12-16 | 1988-06-23 | Fuji Electric Co Ltd | X線発生用対陰極 |
US4893015A (en) | 1987-04-01 | 1990-01-09 | American Science And Engineering, Inc. | Dual mode radiographic measurement method and device |
JPS63255683A (ja) | 1987-04-13 | 1988-10-21 | Hitachi Ltd | 異物の映像化装置 |
US5018181A (en) | 1987-06-02 | 1991-05-21 | Coriolis Corporation | Liquid cooled rotating anodes |
IL83233A (en) | 1987-07-17 | 1991-01-31 | Elscint Ltd | Reconstruction in ct scanners using divergent beams |
JPS6434333A (en) | 1987-07-31 | 1989-02-03 | Toshiba Corp | Image processing apparatus |
JPS6486938A (en) | 1987-09-30 | 1989-03-31 | Toshiba Corp | Ct scanner |
DE3886334D1 (de) | 1987-10-05 | 1994-01-27 | Philips Patentverwaltung | Anordnung zur Untersuchung eines Körpers mit einer Strahlenquelle. |
US4899283A (en) | 1987-11-23 | 1990-02-06 | American Science And Engineering, Inc. | Tomographic apparatus including means to illuminate the bounded field of view from a plurality of directions |
GB2212903B (en) | 1987-11-24 | 1991-11-06 | Rolls Royce Plc | Measuring two phase flow in pipes. |
JPH0186156U (zh) | 1987-11-30 | 1989-06-07 | ||
US4788706A (en) | 1987-12-17 | 1988-11-29 | General Electric Company | Method of measurement of x-ray energy |
US4825454A (en) | 1987-12-28 | 1989-04-25 | American Science And Engineering, Inc. | Tomographic imaging with concentric conical collimator |
FR2625605A1 (fr) | 1987-12-30 | 1989-07-07 | Thomson Cgr | Anode tournante pour tube a rayons x |
US4928296A (en) | 1988-04-04 | 1990-05-22 | General Electric Company | Apparatus for cooling an X-ray device |
US5227800A (en) | 1988-04-19 | 1993-07-13 | Millitech Corporation | Contraband detection system |
US4852131A (en) | 1988-05-13 | 1989-07-25 | Advanced Research & Applications Corporation | Computed tomography inspection of electronic devices |
US4887604A (en) | 1988-05-16 | 1989-12-19 | Science Research Laboratory, Inc. | Apparatus for performing dual energy medical imaging |
JPH01296544A (ja) | 1988-05-24 | 1989-11-29 | Seiko Epson Corp | 高輝度x線銃 |
FR2632436B1 (fr) | 1988-06-01 | 1991-02-15 | Commissariat Energie Atomique | Procede d'adressage d'un ecran matriciel fluorescent a micropointes |
US5007072A (en) | 1988-08-03 | 1991-04-09 | Ion Track Instruments | X-ray diffraction inspection system |
DE3909147A1 (de) | 1988-09-22 | 1990-09-27 | Philips Patentverwaltung | Anordnung zur messung des impulsuebertrages |
JPH02147942A (ja) * | 1988-11-30 | 1990-06-06 | Fuji Electric Co Ltd | 内容物検査方法 |
US5127030A (en) | 1989-02-28 | 1992-06-30 | American Science And Engineering, Inc. | Tomographic imaging with improved collimator |
EP0390950B1 (de) * | 1989-04-06 | 1993-01-13 | Heimann Systems GmbH & Co. KG | Materialprüfanlage |
US4945562A (en) | 1989-04-24 | 1990-07-31 | General Electric Company | X-ray target cooling |
JP2840611B2 (ja) | 1989-05-24 | 1998-12-24 | 明治乳業株式会社 | 包装体内容物の非破壊検査方法及び検査装置 |
EP0412189B1 (de) | 1989-08-09 | 1992-10-28 | Heimann Systems GmbH & Co. KG | Vorrichtung zum Durchstrahlen von Gegenständen mit fächerförmiger Strahlung |
DE58906047D1 (de) | 1989-08-09 | 1993-12-02 | Heimann Systems Gmbh & Co | Vorrichtung zum Durchstrahlen von Gegenständen mittels fächerförmiger Strahlung. |
US4979202A (en) | 1989-08-25 | 1990-12-18 | Siczek Aldona A | Support structure for X-ray imaging apparatus |
US5179581A (en) | 1989-09-13 | 1993-01-12 | American Science And Engineering, Inc. | Automatic threat detection based on illumination by penetrating radiant energy |
US5022062A (en) | 1989-09-13 | 1991-06-04 | American Science And Engineering, Inc. | Automatic threat detection based on illumination by penetrating radiant energy using histogram processing |
AT392160B (de) | 1989-09-14 | 1991-02-11 | Otto Dipl Ing Dr Kratky | Blendenanordnung zur streuungsarmen, einseitigen, linearen begrenzung eines roentgenstrahlbuendels |
JP2742454B2 (ja) | 1989-10-16 | 1998-04-22 | 株式会社テクノシステムズ | ハンダ付け装置 |
US4975968A (en) | 1989-10-27 | 1990-12-04 | Spatial Dynamics, Ltd. | Timed dielectrometry surveillance method and apparatus |
JP2845995B2 (ja) | 1989-10-27 | 1999-01-13 | 株式会社日立製作所 | 領域抽出手法 |
DE8914064U1 (zh) | 1989-11-29 | 1990-02-01 | Philips Patentverwaltung Gmbh, 2000 Hamburg, De | |
US5864146A (en) | 1996-11-13 | 1999-01-26 | University Of Massachusetts Medical Center | System for quantitative radiographic imaging |
EP0432568A3 (en) | 1989-12-11 | 1991-08-28 | General Electric Company | X ray tube anode and tube having same |
US5098640A (en) | 1990-01-10 | 1992-03-24 | Science Applications International Corporation | Apparatus and method for detecting contraband using fast neutron activation |
DE4000573A1 (de) | 1990-01-10 | 1991-07-11 | Balzers Hochvakuum | Elektronenstrahlerzeuger und emissionskathode |
US5056127A (en) | 1990-03-02 | 1991-10-08 | Iversen Arthur H | Enhanced heat transfer rotating anode x-ray tubes |
US4991189A (en) | 1990-04-16 | 1991-02-05 | General Electric Company | Collimation apparatus for x-ray beam correction |
EP0455177A3 (en) | 1990-04-30 | 1992-05-20 | Shimadzu Corporation | High-speed scan type x-ray generator |
DE4015105C3 (de) | 1990-05-11 | 1997-06-19 | Bruker Analytische Messtechnik | Röntgen-Computer-Tomographie-System |
DE4015180A1 (de) | 1990-05-11 | 1991-11-28 | Bruker Analytische Messtechnik | Roentgen-computer-tomographie-system mit geteiltem detektorring |
US5155365A (en) | 1990-07-09 | 1992-10-13 | Cann Christopher E | Emission-transmission imaging system using single energy and dual energy transmission and radionuclide emission data |
JPH0479128A (ja) | 1990-07-23 | 1992-03-12 | Nec Corp | マイクロ波管用多段電位低下コレクタ |
US5181234B1 (en) | 1990-08-06 | 2000-01-04 | Rapiscan Security Products Inc | X-ray backscatter detection system |
US5319547A (en) | 1990-08-10 | 1994-06-07 | Vivid Technologies, Inc. | Device and method for inspection of baggage and other objects |
WO1992003722A1 (en) | 1990-08-15 | 1992-03-05 | Massachusetts Institute Of Technology | Detection of explosives and other materials using resonance fluorescence, resonance absorption, and other electromagnetic processes with bremsstrahlung radiation |
US5068882A (en) | 1990-08-27 | 1991-11-26 | General Electric Company | Dual parallel cone beam circular scanning trajectories for reduced data incompleteness in three-dimensional computerized tomography |
US5073910A (en) | 1990-08-27 | 1991-12-17 | General Electric Company | Square wave cone beam scanning trajectory for data completeness in three-dimensional computerized tomography |
CN1020048C (zh) | 1990-11-08 | 1993-03-10 | 大港石油管理局第一采油厂 | 低能源原油含水分析仪 |
US5247561A (en) * | 1991-01-02 | 1993-09-21 | Kotowski Andreas F | Luggage inspection device |
DE4100297A1 (de) | 1991-01-08 | 1992-07-09 | Philips Patentverwaltung | Roentgenroehre |
DE4101544A1 (de) | 1991-01-19 | 1992-07-23 | Philips Patentverwaltung | Roentgengeraet |
DE4103588C1 (zh) | 1991-02-06 | 1992-05-27 | Siemens Ag, 8000 Muenchen, De | |
US5841832A (en) | 1991-02-13 | 1998-11-24 | Lunar Corporation | Dual-energy x-ray detector providing spatial and temporal interpolation |
JP2962015B2 (ja) | 1991-02-20 | 1999-10-12 | 松下電器産業株式会社 | k吸収端フィルタおよびX線装置 |
US5105452A (en) | 1991-03-26 | 1992-04-14 | Mcinerney Joseph J | Device for determining the characteristics of blood flow through coronary bypass grafts |
US5272627A (en) | 1991-03-27 | 1993-12-21 | Gulton Industries, Inc. | Data converter for CT data acquisition system |
DE4110468A1 (de) * | 1991-03-30 | 1992-10-01 | Forschungszentrum Juelich Gmbh | Einrichtung zur roentgenbestrahlung von objekten |
FR2675629B1 (fr) | 1991-04-17 | 1997-05-16 | Gen Electric Cgr | Cathode pour tube a rayons x et tube ainsi obtenu. |
US5144191A (en) | 1991-06-12 | 1992-09-01 | Mcnc | Horizontal microelectronic field emission devices |
JP2928677B2 (ja) * | 1991-06-21 | 1999-08-03 | 株式会社東芝 | X線検出器およびx線検査装置 |
US5338984A (en) | 1991-08-29 | 1994-08-16 | National Semiconductor Corp. | Local and express diagonal busses in a configurable logic array |
US5557283A (en) | 1991-08-30 | 1996-09-17 | Sheen; David M. | Real-time wideband holographic surveillance system |
JPH0560381A (ja) | 1991-09-02 | 1993-03-09 | Harman Co Ltd | 元止め式の給湯器 |
DE69229176D1 (de) | 1991-09-10 | 1999-06-17 | Integrated Silicon Design Pty | Identifizierung und telemetriesystem |
JP3325301B2 (ja) | 1991-09-12 | 2002-09-17 | 株式会社東芝 | X線ct装置 |
DE69223884T2 (de) | 1991-09-12 | 1998-08-27 | Toshiba Kawasaki Kk | Verfahren und Vorrichtung zur Erzeugung von Röntgencomputertomogrammen und zum Erzeugen von Schattenbildern mittels spiralförmiger Abtastung |
US5224144A (en) | 1991-09-12 | 1993-06-29 | American Science And Engineering, Inc. | Reduced mass flying spot scanner having arcuate scanning lines |
US5367552A (en) | 1991-10-03 | 1994-11-22 | In Vision Technologies, Inc. | Automatic concealed object detection system having a pre-scan stage |
US5182764A (en) * | 1991-10-03 | 1993-01-26 | Invision Technologies, Inc. | Automatic concealed object detection system having a pre-scan stage |
JPH05135721A (ja) | 1991-11-08 | 1993-06-01 | Toshiba Corp | X線管 |
US5253283A (en) | 1991-12-23 | 1993-10-12 | American Science And Engineering, Inc. | Inspection method and apparatus with single color pixel imaging |
JPH05182617A (ja) | 1991-12-27 | 1993-07-23 | Shimadzu Corp | 超高速x線ct用x線管の陽極ターゲット構体 |
US5305363A (en) | 1992-01-06 | 1994-04-19 | Picker International, Inc. | Computerized tomographic scanner having a toroidal x-ray tube with a stationary annular anode and a rotating cathode assembly |
US5268955A (en) | 1992-01-06 | 1993-12-07 | Picker International, Inc. | Ring tube x-ray source |
US5263075A (en) | 1992-01-13 | 1993-11-16 | Ion Track Instruments, Inc. | High angular resolution x-ray collimator |
GB9200828D0 (en) | 1992-01-15 | 1992-03-11 | Image Research Ltd | Improvements in and relating to material identification using x-rays |
US5375156A (en) | 1992-03-31 | 1994-12-20 | Siemens Medical Systems, Inc. | Method and apparatus for 3-D computer tomography |
JPH05290768A (ja) | 1992-04-16 | 1993-11-05 | Toshiba Corp | X線管 |
US5237598A (en) | 1992-04-24 | 1993-08-17 | Albert Richard D | Multiple image scanning X-ray method and apparatus |
JPH05325851A (ja) | 1992-05-18 | 1993-12-10 | Rigaku Corp | X線管用対陰極 |
JP2005013768A (ja) | 1992-05-27 | 2005-01-20 | Toshiba Corp | X線ct装置 |
JP3441455B2 (ja) | 1992-05-27 | 2003-09-02 | 株式会社東芝 | X線ct装置 |
JP3631235B2 (ja) | 1992-05-27 | 2005-03-23 | 株式会社東芝 | X線ct装置 |
JP3405760B2 (ja) | 1992-05-27 | 2003-05-12 | 株式会社東芝 | Ct装置 |
EP0579848B1 (de) | 1992-07-20 | 1995-10-04 | Heimann Systems GmbH | Prüfanlage für Gegenstände |
US5966422A (en) | 1992-07-20 | 1999-10-12 | Picker Medical Systems, Ltd. | Multiple source CT scanner |
DE4228559A1 (de) | 1992-08-27 | 1994-03-03 | Dagang Tan | Röntgenröhre mit einer Transmissionsanode |
US5410156A (en) * | 1992-10-21 | 1995-04-25 | Miller; Thomas G. | High energy x-y neutron detector and radiographic/tomographic device |
JPH06133960A (ja) | 1992-10-23 | 1994-05-17 | Hitachi Medical Corp | X線ct装置 |
JPH06162974A (ja) | 1992-11-18 | 1994-06-10 | Toshiba Corp | X線管 |
JPH06169911A (ja) | 1992-12-04 | 1994-06-21 | Toshiba Corp | X線コンピュータトモグラフィ装置 |
US5600303A (en) * | 1993-01-15 | 1997-02-04 | Technology International Incorporated | Detection of concealed explosives and contraband |
US5651047A (en) | 1993-01-25 | 1997-07-22 | Cardiac Mariners, Incorporated | Maneuverable and locateable catheters |
DE4304332A1 (de) | 1993-02-13 | 1994-08-18 | Philips Patentverwaltung | Verfahren zur Erzeugung von Schichtbildern und Anordnung zur Durchführung des Verfahrens |
JP3280743B2 (ja) | 1993-03-12 | 2002-05-13 | 株式会社島津製作所 | X線断層撮影方法 |
JPH06277207A (ja) | 1993-03-25 | 1994-10-04 | Toshiba Corp | 非破壊検査装置、x線ct用データ検出装置及びx線ct用画像処理装置 |
DE4311174C2 (de) | 1993-04-05 | 1996-02-15 | Heimann Systems Gmbh & Co | Röntgenprüfanlage für Container und Lastkraftwagen |
US5339080A (en) | 1993-04-08 | 1994-08-16 | Coleman Research Corporation | Earth-penetrating synthetic image radar |
JP3449561B2 (ja) | 1993-04-19 | 2003-09-22 | 東芝医用システムエンジニアリング株式会社 | X線ct装置 |
FR2705785B1 (fr) | 1993-05-28 | 1995-08-25 | Schlumberger Ind Sa | Procédé pour déterminer la fonction d'atténuation d'un objet par rapport à la transmission d'une épaisseur de référence d'un matériau de référence et dispositif pour la mise en Óoeuvre du procédé. |
FR2705786B1 (fr) | 1993-05-28 | 1995-08-25 | Schlumberger Ind Sa | Procédé et dispositif pour la reconnaissance de matériaux déterminés dans la composition d'un objet. |
JP3218810B2 (ja) | 1993-06-25 | 2001-10-15 | 石川島播磨重工業株式会社 | X線検査車両 |
DE69430088T2 (de) | 1993-07-05 | 2002-11-07 | Koninkl Philips Electronics Nv | Röntgenstrahlen-Beugungsgerät mit Kühlmittel-Verbindung zur Röntgenröhre |
US5511105A (en) | 1993-07-12 | 1996-04-23 | Siemens Aktiengesellschaft | X-ray tube with multiple differently sized focal spots and method for operating same |
FR2708751B1 (fr) | 1993-07-30 | 1995-10-06 | Schlumberger Ind Sa | Procédé et dispositif pour détecter la présence d'un objet, comportant un matériau donné, non accessible à la vue. |
US5345240A (en) | 1993-08-04 | 1994-09-06 | Hughes Missile Systems Company | Handheld obstacle penetrating motion detecting radar |
JPH0757113A (ja) | 1993-08-18 | 1995-03-03 | Ge Yokogawa Medical Syst Ltd | 3次元画像表示方法および装置 |
DE4331317A1 (de) | 1993-09-15 | 1995-03-16 | Philips Patentverwaltung | Untersuchungsverfahren zur Auswertung ortsabhängiger Spektren |
US5557108A (en) | 1993-10-25 | 1996-09-17 | T+E,Uml U+Ee Mer; T+E,Uml U+Ee May O. | Integrated substance detection and identification system |
US5493596A (en) | 1993-11-03 | 1996-02-20 | Annis; Martin | High-energy X-ray inspection system |
US5541975A (en) | 1994-01-07 | 1996-07-30 | Anderson; Weston A. | X-ray tube having rotary anode cooled with high thermal conductivity fluid |
CA2139537C (en) | 1994-01-07 | 2007-04-24 | Ulf Anders Staffan Tapper | Method and apparatus for the classification of matter |
US5666393A (en) | 1994-02-17 | 1997-09-09 | Annis; Martin | Method and apparatus for reducing afterglow noise in an X-ray inspection system |
US5511104A (en) * | 1994-03-11 | 1996-04-23 | Siemens Aktiengesellschaft | X-ray tube |
US5490196A (en) * | 1994-03-18 | 1996-02-06 | Metorex International Oy | Multi energy system for x-ray imaging applications |
US5428657A (en) * | 1994-03-22 | 1995-06-27 | Georgia Tech Research Corporation | X-ray monitoring system |
US5467377A (en) | 1994-04-15 | 1995-11-14 | Dawson; Ralph L. | Computed tomographic scanner |
SE9401300L (sv) | 1994-04-18 | 1995-10-19 | Bgc Dev Ab | Roterande cylinderkollimator för kollimering av joniserande, elektromagnetisk strålning |
DE4413689C1 (de) | 1994-04-20 | 1995-06-08 | Siemens Ag | Röntgencomputertomograph |
US5606167A (en) * | 1994-07-11 | 1997-02-25 | Miller; Thomas G. | Contraband detection apparatus and method |
DE4425691C2 (de) | 1994-07-20 | 1996-07-11 | Siemens Ag | Röntgenstrahler |
US5616926A (en) | 1994-08-03 | 1997-04-01 | Hitachi, Ltd. | Schottky emission cathode and a method of stabilizing the same |
US5712889A (en) | 1994-08-24 | 1998-01-27 | Lanzara; Giovanni | Scanned volume CT scanner |
DE4432205C1 (de) | 1994-09-09 | 1996-01-25 | Siemens Ag | Hochspannungsstecker für eine Röntgenröhre |
GB9419510D0 (en) | 1994-09-28 | 1994-11-16 | Ic Consultants Limited | Apparatus for analysing fluid flow |
DE4436688A1 (de) | 1994-10-13 | 1996-04-25 | Siemens Ag | Computertomograph |
US5712926A (en) | 1994-10-20 | 1998-01-27 | Eberhard; Jeffrey Wayne | X-ray computed tomography (CT) system for detecting thin objects |
US5959580A (en) | 1994-11-03 | 1999-09-28 | Ksi Inc. | Communications localization system |
US5481584A (en) | 1994-11-23 | 1996-01-02 | Tang; Jihong | Device for material separation using nondestructive inspection imaging |
US6438201B1 (en) | 1994-11-23 | 2002-08-20 | Lunar Corporation | Scanning densitometry system with adjustable X-ray tube current |
US5568829A (en) | 1994-12-16 | 1996-10-29 | Lake Shove, Inc. | Boom construction for sliding boom delimeers |
JP3011360B2 (ja) | 1994-12-27 | 2000-02-21 | 株式会社スタビック | X線非破壊検査装置 |
DE19502752C2 (de) | 1995-01-23 | 1999-11-11 | Siemens Ag | Verfahren und Vorrichtung zur Erzeugung eines umlaufenden Röntgenstrahls zur schnellen Computertomographie |
JP3259561B2 (ja) | 1995-01-26 | 2002-02-25 | 松下電器産業株式会社 | リチウム二次電池の負極材料及びその製造方法 |
DE19510168C2 (de) | 1995-03-21 | 2001-09-13 | Heimann Systems Gmbh & Co | Verfahren und Vorrichtung zur Bestimmung von kristallinen und polykristallinen Materialien in einem Untersuchungsbereich |
DE19513291C2 (de) | 1995-04-07 | 1998-11-12 | Siemens Ag | Röntgenröhre |
AUPN226295A0 (en) | 1995-04-07 | 1995-05-04 | Technological Resources Pty Limited | A method and an apparatus for analysing a material |
DE19514332C1 (de) | 1995-04-18 | 1996-07-25 | Siemens Ag | Röntgencomputertomograph |
US5552705A (en) | 1995-06-01 | 1996-09-03 | Keller; George V. | Non-obtrusive weapon detection system and method for discriminating between a concealed weapon and other metal objects |
US6216540B1 (en) * | 1995-06-06 | 2001-04-17 | Robert S. Nelson | High resolution device and method for imaging concealed objects within an obscuring medium |
DE19532965C2 (de) | 1995-09-07 | 1998-07-16 | Heimann Systems Gmbh & Co | Röntgenprüfanlage für großvolumige Güter |
US5600700A (en) * | 1995-09-25 | 1997-02-04 | Vivid Technologies, Inc. | Detecting explosives or other contraband by employing transmitted and scattered X-rays |
US5642393A (en) | 1995-09-26 | 1997-06-24 | Vivid Technologies, Inc. | Detecting contraband by employing interactive multiprobe tomography |
WO1997013142A1 (en) | 1995-10-03 | 1997-04-10 | Philips Electronics N.V. | Apparatus for simultaneous x-ray diffraction and x-ray fluorescence measurements |
US6507025B1 (en) * | 1995-10-23 | 2003-01-14 | Science Applications International Corporation | Density detection using real time discrete photon counting for fast moving targets |
US7045787B1 (en) | 1995-10-23 | 2006-05-16 | Science Applications International Corporation | Density detection using real time discrete photon counting for fast moving targets |
US6255654B1 (en) | 1995-10-23 | 2001-07-03 | Science Applications International Corporation | Density detection using discrete photon counting |
JP3080994B2 (ja) * | 1995-11-13 | 2000-08-28 | アメリカ合衆国 | 多重エネルギコンピュータ断層撮影法を用いた隠された対象物の自動認識のための装置および方法 |
US6018562A (en) * | 1995-11-13 | 2000-01-25 | The United States Of America As Represented By The Secretary Of The Army | Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography |
DE19542438C1 (de) | 1995-11-14 | 1996-11-28 | Siemens Ag | Röntgenröhre |
DE19544203A1 (de) | 1995-11-28 | 1997-06-05 | Philips Patentverwaltung | Röntgenröhre, insbesondere Mikrofokusröntgenröhre |
US5648997A (en) | 1995-12-29 | 1997-07-15 | Advanced Optical Technologies, Inc. | Apparatus and method for removing scatter from an x-ray image |
US6304629B1 (en) | 1996-01-11 | 2001-10-16 | Granville Todd Conway | Compact scanner apparatus and method |
US5764683B1 (en) | 1996-02-12 | 2000-11-21 | American Science & Eng Inc | Mobile x-ray inspection system for large objects |
USRE39396E1 (en) | 1996-02-12 | 2006-11-14 | American Science And Engineering, Inc. | Mobile x-ray inspection system for large objects |
US5696806A (en) | 1996-03-11 | 1997-12-09 | Grodzins; Lee | Tomographic method of x-ray imaging |
DE19610093A1 (de) | 1996-03-15 | 1997-09-18 | Bsbg Bremer Sonderabfall Berat | Verfahren zum Sortieren von Altbatterien und/oder Altakkumulatoren sowie Vorrichtung zur Durchführung des Verfahrens |
US5633907A (en) | 1996-03-21 | 1997-05-27 | General Electric Company | X-ray tube electron beam formation and focusing |
US5642394A (en) | 1996-04-03 | 1997-06-24 | American Science And Engineering, Inc. | Sidescatter X-ray detection system |
DE19618749A1 (de) | 1996-05-09 | 1997-11-13 | Siemens Ag | Röntgen-Computertomograph |
EP0844639A1 (en) | 1996-05-21 | 1998-05-27 | Kabushiki Kaisha Toshiba | Cathode body structure, electron gun body structure, grid unit for electron gun, electronic tube, heater, and method for manufacturing cathode body structure |
JPH101209A (ja) | 1996-06-17 | 1998-01-06 | Ishikawajima Harima Heavy Ind Co Ltd | 移動式コンベヤへの給電方法 |
JPH105206A (ja) | 1996-06-25 | 1998-01-13 | Shimadzu Corp | ディジタルx線撮影装置 |
DE69716169T2 (de) | 1996-06-27 | 2003-06-12 | Analogic Corp | Vorrichtung zum Erfassen für axiale Transversal- und Quadratur-Tomographie |
US5661774A (en) | 1996-06-27 | 1997-08-26 | Analogic Corporation | Dual energy power supply |
US5638420A (en) | 1996-07-03 | 1997-06-10 | Advanced Research And Applications Corporation | Straddle inspection system |
US5838759A (en) | 1996-07-03 | 1998-11-17 | Advanced Research And Applications Corporation | Single beam photoneutron probe and X-ray imaging system for contraband detection and identification |
DE69719988D1 (de) | 1996-07-12 | 2003-04-24 | American Science & Eng Inc | System für tomographie mit seitenstreuung |
GB2315546A (en) | 1996-07-18 | 1998-02-04 | Imperial College | Luggage scanner |
WO1998003889A1 (en) | 1996-07-22 | 1998-01-29 | American Science And Engineering, Inc. | System for rapid x-ray inspection of enclosures |
US5943388A (en) | 1996-07-30 | 1999-08-24 | Nova R & D, Inc. | Radiation detector and non-destructive inspection |
EP0825457A3 (en) | 1996-08-19 | 2002-02-13 | Analogic Corporation | Multiple angle pre-screening tomographic systems and methods |
JPH1075944A (ja) * | 1996-09-02 | 1998-03-24 | Mitsubishi Heavy Ind Ltd | 高速x線ctスキャナ装置 |
US6359582B1 (en) | 1996-09-18 | 2002-03-19 | The Macaleese Companies, Inc. | Concealed weapons detection system |
US5974111A (en) * | 1996-09-24 | 1999-10-26 | Vivid Technologies, Inc. | Identifying explosives or other contraband by employing transmitted or scattered X-rays |
US5940468A (en) * | 1996-11-08 | 1999-08-17 | American Science And Engineering, Inc. | Coded aperture X-ray imaging system |
US5798972A (en) | 1996-12-19 | 1998-08-25 | Mitsubishi Semiconductor America, Inc. | High-speed main amplifier with reduced access and output disable time periods |
US6184841B1 (en) | 1996-12-31 | 2001-02-06 | Lucent Technologies Inc. | Antenna array in an RFID system |
WO1998030980A1 (en) | 1997-01-14 | 1998-07-16 | Edholm, Paul | Technique and arrangement for tomographic imaging |
JPH10211196A (ja) | 1997-01-31 | 1998-08-11 | Olympus Optical Co Ltd | X線ctスキャナ装置 |
US6037597A (en) * | 1997-02-18 | 2000-03-14 | Neutech Systems, Inc. | Non-destructive detection systems and methods |
US6118850A (en) | 1997-02-28 | 2000-09-12 | Rutgers, The State University | Analysis methods for energy dispersive X-ray diffraction patterns |
US5859891A (en) * | 1997-03-07 | 1999-01-12 | Hibbard; Lyn | Autosegmentation/autocontouring system and method for use with three-dimensional radiation therapy treatment planning |
JPH10272128A (ja) | 1997-03-31 | 1998-10-13 | Futec Inc | 直接断層撮影方法及び装置 |
US6026135A (en) | 1997-04-04 | 2000-02-15 | Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of National Defence Of Her Majesty's Canadian Government | Multisensor vehicle-mounted mine detector |
US5802134A (en) * | 1997-04-09 | 1998-09-01 | Analogic Corporation | Nutating slice CT image reconstruction apparatus and method |
US6054712A (en) | 1998-01-23 | 2000-04-25 | Quanta Vision, Inc. | Inspection equipment using small-angle topography in determining an object's internal structure and composition |
US5889833A (en) | 1997-06-17 | 1999-03-30 | Kabushiki Kaisha Toshiba | High speed computed tomography device and method |
US6075836A (en) | 1997-07-03 | 2000-06-13 | University Of Rochester | Method of and system for intravenous volume tomographic digital angiography imaging |
US6058158A (en) | 1997-07-04 | 2000-05-02 | Eiler; Peter | X-ray device for checking the contents of closed cargo carriers |
US6252932B1 (en) | 1997-07-22 | 2001-06-26 | Fuji Photo Film Co., Ltd. | Method and apparatus for acquiring image information for energy subtraction processing |
US6115454A (en) | 1997-08-06 | 2000-09-05 | Varian Medical Systems, Inc. | High-performance X-ray generating apparatus with improved cooling system |
EP1005638A1 (en) | 1997-08-21 | 2000-06-07 | American Science & Engineering, Inc. | X-ray determination of the mass distribution in containers |
JP4346128B2 (ja) | 1997-09-09 | 2009-10-21 | 株式会社東芝 | X線ct装置 |
US6081580A (en) * | 1997-09-09 | 2000-06-27 | American Science And Engineering, Inc. | Tomographic inspection system |
US7028899B2 (en) | 1999-06-07 | 2006-04-18 | Metrologic Instruments, Inc. | Method of speckle-noise pattern reduction and apparatus therefore based on reducing the temporal-coherence of the planar laser illumination beam before it illuminates the target object by applying temporal phase modulation techniques during the transmission of the plib towards the target |
GB9720658D0 (en) | 1997-09-29 | 1997-11-26 | Univ Nottingham Trent | Detecting, improving and charecterising material in 3-D space |
US5901198A (en) | 1997-10-10 | 1999-05-04 | Analogic Corporation | Computed tomography scanning target detection using target surface normals |
US6188743B1 (en) | 1997-10-10 | 2001-02-13 | Analogic Corporation | Computed tomography scanner drive system and bearing |
US5982843A (en) | 1997-10-10 | 1999-11-09 | Analogic Corporation | Closed loop air conditioning system for a computed tomography scanner |
US6256404B1 (en) | 1997-10-10 | 2001-07-03 | Analogic Corporation | Computed tomography scanning apparatus and method using adaptive reconstruction window |
US6091795A (en) | 1997-10-10 | 2000-07-18 | Analogic Corporation | Area detector array for computer tomography scanning system |
DE19745998A1 (de) | 1997-10-20 | 1999-03-04 | Siemens Ag | Verwendung einer Röntgenröhre und für diese Verwendung vorgesehene Röntgenröhre |
US6014419A (en) | 1997-11-07 | 2000-01-11 | Hu; Hui | CT cone beam scanner with fast and complete data acquistion and accurate and efficient regional reconstruction |
US5907593A (en) | 1997-11-26 | 1999-05-25 | General Electric Company | Image reconstruction in a CT fluoroscopy system |
US6149592A (en) | 1997-11-26 | 2000-11-21 | Picker International, Inc. | Integrated fluoroscopic projection image data, volumetric image data, and surgical device position data |
US6067344A (en) | 1997-12-19 | 2000-05-23 | American Science And Engineering, Inc. | X-ray ambient level safety system |
US6005918A (en) | 1997-12-19 | 1999-12-21 | Picker International, Inc. | X-ray tube window heat shield |
US5987097A (en) | 1997-12-23 | 1999-11-16 | General Electric Company | X-ray tube having reduced window heating |
DE19802668B4 (de) | 1998-01-24 | 2013-10-17 | Smiths Heimann Gmbh | Röntgenstrahlungserzeuger |
US6151381A (en) | 1998-01-28 | 2000-11-21 | American Science And Engineering, Inc. | Gated transmission and scatter detection for x-ray imaging |
US6067366A (en) | 1998-02-11 | 2000-05-23 | Analogic Corporation | Apparatus and method for detecting objects in computed tomography data using erosion and dilation of objects |
US6078642A (en) | 1998-02-11 | 2000-06-20 | Analogice Corporation | Apparatus and method for density discrimination of objects in computed tomography data using multiple density ranges |
US6272230B1 (en) | 1998-02-11 | 2001-08-07 | Analogic Corporation | Apparatus and method for optimizing detection of objects in computed tomography data |
US6076400A (en) | 1998-02-11 | 2000-06-20 | Analogic Corporation | Apparatus and method for classifying objects in computed tomography data using density dependent mass thresholds |
US6317509B1 (en) | 1998-02-11 | 2001-11-13 | Analogic Corporation | Computed tomography apparatus and method for classifying objects |
US6075871A (en) | 1998-02-11 | 2000-06-13 | Analogic Corporation | Apparatus and method for eroding objects in computed tomography data |
US6128365A (en) | 1998-02-11 | 2000-10-03 | Analogic Corporation | Apparatus and method for combining related objects in computed tomography data |
US6035014A (en) * | 1998-02-11 | 2000-03-07 | Analogic Corporation | Multiple-stage apparatus and method for detecting objects in computed tomography data |
US6026171A (en) * | 1998-02-11 | 2000-02-15 | Analogic Corporation | Apparatus and method for detection of liquids in computed tomography data |
US6026143A (en) * | 1998-02-11 | 2000-02-15 | Analogic Corporation | Apparatus and method for detecting sheet objects in computed tomography data |
US6108396A (en) | 1998-02-11 | 2000-08-22 | Analogic Corporation | Apparatus and method for correcting object density in computed tomography data |
US6111974A (en) | 1998-02-11 | 2000-08-29 | Analogic Corporation | Apparatus and method for detecting sheet objects in computed tomography data |
EP1062555A4 (en) * | 1998-02-11 | 2001-05-23 | Analogic Corp | TOMODENSITOMETRY APPARATUS AND METHOD FOR CLASSIFYING OBJECTS |
JPH11230918A (ja) | 1998-02-12 | 1999-08-27 | Hitachi Medical Corp | X線検査装置 |
US6108575A (en) | 1998-02-20 | 2000-08-22 | General Electric Company | Helical weighting algorithms for fast reconstruction |
DE19812055C2 (de) | 1998-03-19 | 2002-08-08 | Heimann Systems Gmbh & Co | Bildverarbeitung zur Materialerkennung mittels Röntgenstrahlungen |
US6218943B1 (en) * | 1998-03-27 | 2001-04-17 | Vivid Technologies, Inc. | Contraband detection and article reclaim system |
WO1999050882A1 (en) | 1998-03-27 | 1999-10-07 | Thermal Corp. | Multiple wavelength x-ray tube |
US6094472A (en) | 1998-04-14 | 2000-07-25 | Rapiscan Security Products, Inc. | X-ray backscatter imaging system including moving body tracking assembly |
JP3572191B2 (ja) * | 1998-04-14 | 2004-09-29 | 株式会社日立製作所 | X線ctスキャナ装置 |
US6236709B1 (en) | 1998-05-04 | 2001-05-22 | Ensco, Inc. | Continuous high speed tomographic imaging system and method |
GB2337032B (en) | 1998-05-05 | 2002-11-06 | Rapiscan Security Products Ltd | Sorting apparatus |
US6097786A (en) | 1998-05-18 | 2000-08-01 | Schlumberger Technology Corporation | Method and apparatus for measuring multiphase flows |
US6347132B1 (en) * | 1998-05-26 | 2002-02-12 | Annistech, Inc. | High energy X-ray inspection system for detecting nuclear weapons materials |
US6088426A (en) | 1998-05-27 | 2000-07-11 | Varian Medical Systems, Inc. | Graphite x-ray target assembly |
US6088423A (en) * | 1998-06-05 | 2000-07-11 | Vivid Technologies, Inc. | Multiview x-ray based system for detecting contraband such as in baggage |
DE19826062B4 (de) | 1998-06-12 | 2006-12-14 | Smiths Heimann Gmbh | Verfahren und Anordnung zur Detektion von Röntgenstrahlen |
US6442233B1 (en) | 1998-06-18 | 2002-08-27 | American Science And Engineering, Inc. | Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection |
US6621888B2 (en) | 1998-06-18 | 2003-09-16 | American Science And Engineering, Inc. | X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects |
US6118852A (en) | 1998-07-02 | 2000-09-12 | General Electric Company | Aluminum x-ray transmissive window for an x-ray tube vacuum vessel |
US6417797B1 (en) | 1998-07-14 | 2002-07-09 | Cirrus Logic, Inc. | System for A multi-purpose portable imaging device and methods for using same |
US6278115B1 (en) * | 1998-08-28 | 2001-08-21 | Annistech, Inc. | X-ray inspection system detector with plastic scintillating material |
US6266390B1 (en) | 1998-09-21 | 2001-07-24 | Spectramet, Llc | High speed materials sorting using x-ray fluorescence |
US6188745B1 (en) * | 1998-09-23 | 2001-02-13 | Analogic Corporation | CT scanner comprising a spatially encoded detector array arrangement and method |
US6183139B1 (en) * | 1998-10-06 | 2001-02-06 | Cardiac Mariners, Inc. | X-ray scanning method and apparatus |
US6642513B1 (en) | 1998-10-06 | 2003-11-04 | General Electric Company | Materials and apparatus for the detection of contraband |
JP2000107173A (ja) | 1998-10-08 | 2000-04-18 | Fuji Photo Film Co Ltd | 3次元用放射線画像形成装置 |
US6021174A (en) * | 1998-10-26 | 2000-02-01 | Picker International, Inc. | Use of shaped charge explosives in the manufacture of x-ray tube targets |
US6301326B2 (en) | 1998-11-02 | 2001-10-09 | Perkinelmer Detection Systems, Inc. | Sheet detection system |
JP2000139891A (ja) | 1998-11-17 | 2000-05-23 | Toshiba Corp | 放射線診断装置 |
US6229870B1 (en) | 1998-11-25 | 2001-05-08 | Picker International, Inc. | Multiple fan beam computed tomography system |
US6125167A (en) | 1998-11-25 | 2000-09-26 | Picker International, Inc. | Rotating anode x-ray tube with multiple simultaneously emitting focal spots |
US7050536B1 (en) | 1998-11-30 | 2006-05-23 | Invision Technologies, Inc. | Nonintrusive inspection system |
US6320933B1 (en) | 1998-11-30 | 2001-11-20 | American Science And Engineering, Inc. | Multiple scatter system for threat identification |
WO2000033109A1 (en) | 1998-11-30 | 2000-06-08 | American Science And Engineering, Inc. | Fan and pencil beams from a common source for x-ray inspection |
US6453007B2 (en) | 1998-11-30 | 2002-09-17 | American Science And Engineering, Inc. | X-ray inspection using co-planar pencil and fan beams |
DE19855213C2 (de) | 1998-11-30 | 2001-03-15 | Siemens Ag | Röntgenaufnahmeeinrichtung |
DE69937067D1 (de) * | 1998-11-30 | 2007-10-18 | Invision Technologies Inc | Eindringungsfreies untersuchungssystem |
US6249567B1 (en) | 1998-12-01 | 2001-06-19 | American Science & Engineering, Inc. | X-ray back scatter imaging system for undercarriage inspection |
US6421420B1 (en) * | 1998-12-01 | 2002-07-16 | American Science & Engineering, Inc. | Method and apparatus for generating sequential beams of penetrating radiation |
US6181765B1 (en) * | 1998-12-10 | 2001-01-30 | General Electric Company | X-ray tube assembly |
US6282260B1 (en) | 1998-12-14 | 2001-08-28 | American Science & Engineering, Inc. | Unilateral hand-held x-ray inspection apparatus |
EP1147406A1 (en) | 1998-12-22 | 2001-10-24 | American Science & Engineering, Inc. | Unilateral hand-held x-ray inspection apparatus |
US6195444B1 (en) * | 1999-01-12 | 2001-02-27 | Analogic Corporation | Apparatus and method for detecting concealed objects in computed tomography data |
US6345113B1 (en) * | 1999-01-12 | 2002-02-05 | Analogic Corporation | Apparatus and method for processing object data in computed tomography data using object projections |
US6687333B2 (en) * | 1999-01-25 | 2004-02-03 | Vanderbilt University | System and method for producing pulsed monochromatic X-rays |
US6429578B1 (en) | 1999-01-26 | 2002-08-06 | Mats Danielsson | Diagnostic and therapeutic detector system for imaging with low and high energy X-ray and electrons |
US6459764B1 (en) | 1999-01-27 | 2002-10-01 | American Science And Engineering, Inc. | Drive-through vehicle inspection system |
JP2000235007A (ja) * | 1999-02-15 | 2000-08-29 | Hitachi Engineering & Services Co Ltd | X線ctスキャナ装置およびx線貨物検査方法 |
US6185272B1 (en) * | 1999-03-15 | 2001-02-06 | Analogic Corporation | Architecture for CT scanning system |
US6256369B1 (en) | 1999-03-31 | 2001-07-03 | Analogic Corporation | Computerized tomography scanner with longitudinal flying focal spot |
DE19916664A1 (de) | 1999-04-14 | 2000-10-19 | Heimann Systems Gmbh & Co | Verfahren zur Bearbeitung eines Röntgenbildes |
US6342696B1 (en) | 1999-05-25 | 2002-01-29 | The Macaleese Companies, Inc. | Object detection method and apparatus employing polarized radiation |
US6856271B1 (en) | 1999-05-25 | 2005-02-15 | Safe Zone Systems, Inc. | Signal processing for object detection system |
GB9914705D0 (en) | 1999-06-23 | 1999-08-25 | Stereo Scan Systems Limited | Castellated linear array scintillator system |
JP4154805B2 (ja) | 1999-06-28 | 2008-09-24 | 株式会社島津製作所 | X線断層撮像装置 |
JP4261691B2 (ja) | 1999-07-13 | 2009-04-30 | 浜松ホトニクス株式会社 | X線管 |
US6456684B1 (en) | 1999-07-23 | 2002-09-24 | Inki Mun | Surgical scanning system and process for use thereof |
US6546072B1 (en) * | 1999-07-30 | 2003-04-08 | American Science And Engineering, Inc. | Transmission enhanced scatter imaging |
EP1206903A2 (en) | 1999-07-30 | 2002-05-22 | American Science & Engineering, Inc. | Method for raster scanning an x-ray tube focal spot |
US6269142B1 (en) * | 1999-08-11 | 2001-07-31 | Steven W. Smith | Interrupted-fan-beam imaging |
JP3208426B2 (ja) | 1999-09-14 | 2001-09-10 | 経済産業省産業技術総合研究所長 | 高速x線ctによる被写移動体速度及び高解像度情報の計測方法及びその装置 |
SE517315C2 (sv) | 1999-09-17 | 2002-05-21 | Sik Inst Foer Livsmedel Och Bi | Apparat och metod för detektering av främmande kroppar i produkter |
DE19954663B4 (de) | 1999-11-13 | 2006-06-08 | Smiths Heimann Gmbh | Verfahren und Vorrichtung zur Bestimmung eines Materials eines detektierten Gegenstandes |
US6542578B2 (en) | 1999-11-13 | 2003-04-01 | Heimann Systems Gmbh | Apparatus for determining the crystalline and polycrystalline materials of an item |
JP4460695B2 (ja) | 1999-11-24 | 2010-05-12 | 株式会社東芝 | X線コンピュータ断層撮影装置 |
US6528787B2 (en) | 1999-11-30 | 2003-03-04 | Jeol Ltd. | Scanning electron microscope |
US6763635B1 (en) | 1999-11-30 | 2004-07-20 | Shook Mobile Technology, Lp | Boom with mast assembly |
JP2001176408A (ja) | 1999-12-15 | 2001-06-29 | New Japan Radio Co Ltd | 電子管 |
US6324247B1 (en) | 1999-12-30 | 2001-11-27 | Ge Medical Systems Global Technology Company, Llc | Partial scan weighting for multislice CT imaging with arbitrary pitch |
US6891381B2 (en) | 1999-12-30 | 2005-05-10 | Secure Logistix | Human body: scanning, typing and profiling system |
US6469624B1 (en) | 2000-01-03 | 2002-10-22 | 3-J Tech., Ltd. | Non-obtrusive weapon detection system |
US6418189B1 (en) | 2000-01-24 | 2002-07-09 | Analogic Corporation | Explosive material detection apparatus and method using dual energy information of a scan |
US7079624B1 (en) | 2000-01-26 | 2006-07-18 | Varian Medical Systems, Inc. | X-Ray tube and method of manufacture |
US20050117683A1 (en) | 2000-02-10 | 2005-06-02 | Andrey Mishin | Multiple energy x-ray source for security applications |
US20050105665A1 (en) | 2000-03-28 | 2005-05-19 | Lee Grodzins | Detection of neutrons and sources of radioactive material |
US7010094B2 (en) | 2000-02-10 | 2006-03-07 | American Science And Engineering, Inc. | X-ray inspection using spatially and spectrally tailored beams |
US6459761B1 (en) | 2000-02-10 | 2002-10-01 | American Science And Engineering, Inc. | Spectrally shaped x-ray inspection system |
JP2001233440A (ja) | 2000-02-21 | 2001-08-28 | New Tokyo International Airport Authority | 手荷物自動選別システム |
US6324243B1 (en) | 2000-02-23 | 2001-11-27 | General Electric Company | Method and apparatus for reconstructing images from projection data acquired by a computed tomography system |
DE10196075B3 (de) | 2000-03-01 | 2015-08-20 | Tsinghua University | Containeruntersuchungsvorrichtung |
GB2360405A (en) | 2000-03-14 | 2001-09-19 | Sharp Kk | A common-gate level-shifter exhibiting a high input impedance when disabled |
JP4161513B2 (ja) | 2000-04-21 | 2008-10-08 | 株式会社島津製作所 | 二次ターゲット装置及び蛍光x線分析装置 |
CA2348150C (en) * | 2000-05-25 | 2007-03-13 | Esam M.A. Hussein | Non-rotating x-ray system for three-dimensional, three-parameter imaging |
JP2001351551A (ja) | 2000-06-06 | 2001-12-21 | Kazuo Taniguchi | X線管 |
US20020031202A1 (en) * | 2000-06-07 | 2002-03-14 | Joseph Callerame | X-ray scatter and transmission system with coded beams |
JP3481186B2 (ja) | 2000-06-08 | 2003-12-22 | メディエックステック株式会社 | X線発生器、x線検査装置およびx線発生方法 |
US7132123B2 (en) | 2000-06-09 | 2006-11-07 | Cymer, Inc. | High rep-rate laser with improved electrodes |
US6480571B1 (en) | 2000-06-20 | 2002-11-12 | Varian Medical Systems, Inc. | Drive assembly for an x-ray tube having a rotating anode |
US6341154B1 (en) | 2000-06-22 | 2002-01-22 | Ge Medical Systems Global Technology Company, Llc | Methods and apparatus for fast CT imaging helical weighting |
AUPQ831200A0 (en) * | 2000-06-22 | 2000-07-13 | X-Ray Technologies Pty Ltd | X-ray micro-target source |
US6628745B1 (en) | 2000-07-01 | 2003-09-30 | Martin Annis | Imaging with digital tomography and a rapidly moving x-ray source |
GB2364390B (en) | 2000-07-03 | 2004-11-17 | Yousri Mohammad Tah Haj-Yousef | A method and device for detecting and monitoring concealed bodies and objects |
FR2811799B1 (fr) | 2000-07-13 | 2003-06-13 | Commissariat Energie Atomique | Procede et dispositif de commande d'une source d'electrons a structure matricielle, avec regulation par la charge emise |
JP2002039966A (ja) | 2000-07-19 | 2002-02-06 | Mitsubishi Heavy Ind Ltd | 検査車両 |
US6839403B1 (en) | 2000-07-24 | 2005-01-04 | Rapiscan Security Products (Usa), Inc. | Generation and distribution of annotation overlays of digital X-ray images for security systems |
US6434219B1 (en) | 2000-07-24 | 2002-08-13 | American Science And Engineering, Inc. | Chopper wheel with two axes of rotation |
US6812426B1 (en) | 2000-07-24 | 2004-11-02 | Rapiscan Security Products | Automatic reject unit spacer and diverter |
DE10036210A1 (de) | 2000-07-25 | 2001-11-15 | Siemens Ag | Drehkolbenröhre |
CA2355560C (en) | 2000-08-28 | 2003-11-18 | Balza Achmad | X-ray compton scatter density measurement at a point within an object |
US6837422B1 (en) | 2000-09-01 | 2005-01-04 | Heimann Systems Gmbh | Service unit for an X-ray examining device |
DE10044357A1 (de) | 2000-09-07 | 2002-03-21 | Heimann Systems Gmbh & Co | Detektoranordnung zur Detektion von Röntgenstrahlen |
US6907281B2 (en) | 2000-09-07 | 2005-06-14 | Ge Medical Systems | Fast mapping of volumetric density data onto a two-dimensional screen |
US6580780B1 (en) | 2000-09-07 | 2003-06-17 | Varian Medical Systems, Inc. | Cooling system for stationary anode x-ray tubes |
AU9088701A (en) * | 2000-09-14 | 2002-03-26 | Univ Leland Stanford Junior | Assessing condition of a joint and cartilage loss |
AU2002235122A1 (en) | 2000-09-27 | 2002-05-21 | The Johns Hopkins University | System and method of radar detection of non linear interfaces |
US6737652B2 (en) | 2000-09-29 | 2004-05-18 | Massachusetts Institute Of Technology | Coded aperture imaging |
DE10048775B4 (de) * | 2000-09-29 | 2006-02-02 | Siemens Ag | Röntgen-Computertomographieeinrichtung |
US7082182B2 (en) | 2000-10-06 | 2006-07-25 | The University Of North Carolina At Chapel Hill | Computed tomography system for imaging of human and small animal |
US6980627B2 (en) | 2000-10-06 | 2005-12-27 | Xintek, Inc. | Devices and methods for producing multiple x-ray beams from multiple locations |
US6876724B2 (en) | 2000-10-06 | 2005-04-05 | The University Of North Carolina - Chapel Hill | Large-area individually addressable multi-beam x-ray system and method of forming same |
US7826595B2 (en) | 2000-10-06 | 2010-11-02 | The University Of North Carolina | Micro-focus field emission x-ray sources and related methods |
US6553096B1 (en) | 2000-10-06 | 2003-04-22 | The University Of North Carolina Chapel Hill | X-ray generating mechanism using electron field emission cathode |
US20040213378A1 (en) | 2003-04-24 | 2004-10-28 | The University Of North Carolina At Chapel Hill | Computed tomography system for imaging of human and small animal |
AU2001294014A1 (en) | 2000-10-11 | 2002-04-22 | University Of Southampton | Gamma-ray spectrometry |
US6748043B1 (en) | 2000-10-19 | 2004-06-08 | Analogic Corporation | Method and apparatus for stabilizing the measurement of CT numbers |
JP4476471B2 (ja) | 2000-11-27 | 2010-06-09 | 株式会社東芝 | X線コンピュータ断層撮影装置 |
US6735271B1 (en) | 2000-11-28 | 2004-05-11 | Ge Medical Systems Global Technology Company Llc | Electron beam computed tomographic scanner system with helical or tilted target, collimator, and detector components to eliminate cone beam error and to scan continuously moving objects |
JP2002168805A (ja) | 2000-11-28 | 2002-06-14 | Anritsu Corp | X線異物検出装置 |
DE10062214B4 (de) | 2000-12-13 | 2013-01-24 | Smiths Heimann Gmbh | Vorrichtungen zur Durchleuchtung von Objekten |
US6708572B2 (en) | 2000-12-22 | 2004-03-23 | General Electric Company | Portal trace detection systems for detection of imbedded particles |
JP2002195961A (ja) * | 2000-12-25 | 2002-07-10 | Shimadzu Corp | X線撮像装置 |
US6473487B1 (en) | 2000-12-27 | 2002-10-29 | Rapiscan Security Products, Inc. | Method and apparatus for physical characteristics discrimination of objects using a limited view three dimensional reconstruction |
US20020085674A1 (en) | 2000-12-29 | 2002-07-04 | Price John Scott | Radiography device with flat panel X-ray source |
US6430260B1 (en) | 2000-12-29 | 2002-08-06 | General Electric Company | X-ray tube anode cooling device and systems incorporating same |
US6385292B1 (en) | 2000-12-29 | 2002-05-07 | Ge Medical Systems Global Technology Company, Llc | Solid-state CT system and method |
DE10100664A1 (de) | 2001-01-09 | 2002-07-11 | Hauni Maschinenbau Ag | Verfahren zum Prüfen eines Produktionsmaterials |
US6449331B1 (en) | 2001-01-09 | 2002-09-10 | Cti, Inc. | Combined PET and CT detector and method for using same |
JP2002216106A (ja) | 2001-01-16 | 2002-08-02 | Fuji Photo Film Co Ltd | エネルギーサブトラクション画像生成方法および装置 |
US6487274B2 (en) | 2001-01-29 | 2002-11-26 | Siemens Medical Solutions Usa, Inc. | X-ray target assembly and radiation therapy systems and methods |
JP2002320610A (ja) | 2001-02-23 | 2002-11-05 | Mitsubishi Heavy Ind Ltd | X線ct装置とx線ct装置撮影方法 |
CA2410892A1 (en) * | 2001-02-28 | 2002-11-29 | Mitsubishi Heavy Industries, Ltd. | Multi-radiation source x-ray ct apparatus |
JP2002257751A (ja) | 2001-03-01 | 2002-09-11 | Kawasaki Heavy Ind Ltd | 手荷物検査方法および手荷物検査システム |
US6480572B2 (en) | 2001-03-09 | 2002-11-12 | Koninklijke Philips Electronics N.V. | Dual filament, electrostatically controlled focal spot for x-ray tubes |
US6480141B1 (en) | 2001-03-13 | 2002-11-12 | Sandia Corporation | Detection of contraband using microwave radiation |
US6876322B2 (en) | 2003-06-26 | 2005-04-05 | Battelle Memorial Institute | Concealed object detection |
US6324249B1 (en) | 2001-03-21 | 2001-11-27 | Agilent Technologies, Inc. | Electronic planar laminography system and method |
US6965199B2 (en) | 2001-03-27 | 2005-11-15 | The University Of North Carolina At Chapel Hill | Coated electrode with enhanced electron emission and ignition characteristics |
US6501414B2 (en) | 2001-04-02 | 2002-12-31 | The United States Of America As Represented By The United States National Aeronautics And Space Administration | Method for locating a concealed object |
WO2002082125A1 (en) * | 2001-04-03 | 2002-10-17 | L-3 Communications Security & Detection Systems | X-ray inspection system |
US6721391B2 (en) * | 2001-04-03 | 2004-04-13 | L-3 Communications Security And Detection Systems | Remote baggage screening system, software and method |
US6477417B1 (en) | 2001-04-12 | 2002-11-05 | Pacesetter, Inc. | System and method for automatically selecting electrode polarity during sensing and stimulation |
US6813374B1 (en) | 2001-04-25 | 2004-11-02 | Analogic Corporation | Method and apparatus for automatic image quality assessment |
EP1428048A2 (en) | 2001-05-03 | 2004-06-16 | American Science & Engineering, Inc. | Nautical x-ray inspection system |
US6624425B2 (en) | 2001-05-03 | 2003-09-23 | Bio-Imaging Research, Inc. | Waste inspection tomography and non-destructive assay |
DE10123365A1 (de) | 2001-05-14 | 2002-11-28 | Infineon Technologies Ag | Verfahren und Vorrichtung zum Ermitteln von Bewegung in mindestens zwei zeitlich aufeinander folgenden digitalen Bildern, Computerlesbares Speichermedium und Computerprogramm-Element |
US6597760B2 (en) | 2001-05-23 | 2003-07-22 | Heimann Systems Gmbh | Inspection device |
US6580778B2 (en) | 2001-05-23 | 2003-06-17 | Heimann Systems Gmbh | Inspection device |
JP4777539B2 (ja) | 2001-05-29 | 2011-09-21 | エスアイアイ・ナノテクノロジー株式会社 | 複合x線分析装置 |
US6721387B1 (en) * | 2001-06-13 | 2004-04-13 | Analogic Corporation | Method of and system for reducing metal artifacts in images generated by x-ray scanning devices |
JP2002370814A (ja) | 2001-06-13 | 2002-12-24 | Ito Denki Kk | 搬送装置 |
DE10129463A1 (de) | 2001-06-19 | 2003-01-02 | Philips Corp Intellectual Pty | Röntgenstrahler mit einem Flüssigmetall-Target |
GB0115615D0 (en) | 2001-06-27 | 2001-08-15 | Univ Coventry | Image segmentation |
US6663280B2 (en) | 2001-06-28 | 2003-12-16 | Heimann Systems Gmbh | Inspection unit |
US6735477B2 (en) | 2001-07-09 | 2004-05-11 | Robert A. Levine | Internal monitoring system with detection of food intake |
US6470065B1 (en) | 2001-07-13 | 2002-10-22 | Siemens Aktiengesellschaft | Apparatus for computer tomography scanning with compression of measurement data |
US6650276B2 (en) | 2001-07-13 | 2003-11-18 | James C. Lawless | Radar apparatus and method for detecting small slow moving targets |
US20030023592A1 (en) | 2001-07-27 | 2003-01-30 | Rapiscan Security Products (Usa), Inc. | Method and system for certifying operators of x-ray inspection systems |
US6661876B2 (en) * | 2001-07-30 | 2003-12-09 | Moxtek, Inc. | Mobile miniature X-ray source |
US6665433B2 (en) | 2001-07-31 | 2003-12-16 | Agilent Technologies, Inc. | Automatic X-ray determination of solder joint and view Delta Z values from a laser mapped reference surface for circuit board inspection using X-ray laminography |
US6914959B2 (en) | 2001-08-09 | 2005-07-05 | Analogic Corporation | Combined radiation therapy and imaging system and method |
US6636623B2 (en) * | 2001-08-10 | 2003-10-21 | Visiongate, Inc. | Optical projection imaging system and method for automatically detecting cells with molecular marker compartmentalization associated with malignancy and disease |
DE10139672A1 (de) | 2001-08-11 | 2003-03-06 | Heimann Systems Gmbh & Co | Verfahren und Anlage zur Inspektion eines Objektes, insbesondere eines Gepäckstückes |
CN1185482C (zh) | 2001-08-14 | 2005-01-19 | 清华大学 | 航空集装箱/托盘货物检查*** |
US7072436B2 (en) | 2001-08-24 | 2006-07-04 | The Board Of Trustees Of The Leland Stanford Junior University | Volumetric computed tomography (VCT) |
US6636581B2 (en) | 2001-08-31 | 2003-10-21 | Michael R. Sorenson | Inspection system and method |
DE10143131B4 (de) * | 2001-09-03 | 2006-03-09 | Siemens Ag | Verfahren zur Ermittlung von Dichte- und Ordnungszahlverteilungen bei radiographischen Untersuchungsverfahren |
US6831590B1 (en) | 2001-09-12 | 2004-12-14 | Cyterra Corporation | Concealed object detection |
JP3699666B2 (ja) | 2001-09-19 | 2005-09-28 | 株式会社リガク | X線管の熱陰極 |
WO2003027637A2 (en) | 2001-09-24 | 2003-04-03 | Oregon Health And Science University | Assessment of neurons in the arcuate nucleus to screen for agents that modify feeding behavior |
GB0123492D0 (en) | 2001-09-29 | 2001-11-21 | Logan Fabricom Ltd | Baggage screening system |
CA2462523A1 (en) | 2001-10-01 | 2003-04-10 | L-3 Communications Security & Detection Systems | Remote data access |
US20030085163A1 (en) * | 2001-10-01 | 2003-05-08 | Chan Chin F. | Remote data access |
US7734066B2 (en) * | 2003-11-19 | 2010-06-08 | L-3 Communications Security And Detection Systems, Inc. | Security system with distributed computing |
US6751293B1 (en) | 2001-10-05 | 2004-06-15 | Varian Medical Systems, Inc. | Rotary component support system |
DE10149254B4 (de) * | 2001-10-05 | 2006-04-20 | Smiths Heimann Gmbh | Verfahren und Vorrichtung zur Detektion eines bestimmten Materials in einem Objekt mittels elektromagnetischer Strahlen |
US7072440B2 (en) | 2001-10-19 | 2006-07-04 | Control Screening, Llc | Tomographic scanning X-ray inspection system using transmitted and Compton scattered radiation |
US6661867B2 (en) * | 2001-10-19 | 2003-12-09 | Control Screening, Llc | Tomographic scanning X-ray inspection system using transmitted and compton scattered radiation |
JP3847134B2 (ja) | 2001-10-19 | 2006-11-15 | 三井造船株式会社 | 放射線検出装置 |
AU2002348143A1 (en) | 2001-10-31 | 2003-05-12 | Vrex, Inc. | 3d stereoscopic x-ray system with two different object trajectories |
JP2003135442A (ja) | 2001-11-06 | 2003-05-13 | Ge Medical Systems Global Technology Co Llc | X線ctシステムおよびその制御方法 |
US6674838B1 (en) | 2001-11-08 | 2004-01-06 | Varian Medical Systems, Inc. | X-ray tube having a unitary vacuum enclosure and housing |
WO2003042674A1 (en) | 2001-11-14 | 2003-05-22 | Texas Tech University | Method for identification of cotton contaminants with x-ray microtomographic image analysis |
US6707882B2 (en) | 2001-11-14 | 2004-03-16 | Koninklijke Philips Electronics, N.V. | X-ray tube heat barrier |
GB0128659D0 (en) | 2001-11-30 | 2002-01-23 | Qinetiq Ltd | Imaging system and method |
US6819742B1 (en) | 2001-12-07 | 2004-11-16 | Varian Medical Systems, Inc. | Integrated component mounting system for use in an X-ray tube |
CA2365045A1 (en) | 2001-12-14 | 2003-06-14 | Cedara Software Corp. | Method for the detection of guns and ammunition in x-ray scans of containers for security assurance |
WO2003051201A2 (en) | 2001-12-14 | 2003-06-26 | Wisconsin Alumni Research Foundation | Virtual spherical anode computed tomography |
AU2002366300A1 (en) | 2001-12-19 | 2003-06-30 | Agresearch Limited | A phantom |
US7012256B1 (en) | 2001-12-21 | 2006-03-14 | National Recovery Technologies, Inc. | Computer assisted bag screening system |
JP3888156B2 (ja) | 2001-12-26 | 2007-02-28 | 株式会社日立製作所 | 放射線検査装置 |
US6542580B1 (en) | 2002-01-15 | 2003-04-01 | Rapiscan Security Products (Usa), Inc. | Relocatable X-ray imaging system and method for inspecting vehicles and containers |
US6922455B2 (en) | 2002-01-28 | 2005-07-26 | Starfire Industries Management, Inc. | Gas-target neutron generation and applications |
EP1488441A2 (en) | 2002-01-31 | 2004-12-22 | The Johns Hopkins University | X-ray source and method for more efficiently producing selectable x-ray frequencies |
US6816571B2 (en) * | 2002-02-06 | 2004-11-09 | L-3 Communications Security And Detection Systems Corporation Delaware | Method and apparatus for transmitting information about a target object between a prescanner and a CT scanner |
US6754298B2 (en) | 2002-02-20 | 2004-06-22 | The Regents Of The University Of Michigan | Method for statistically reconstructing images from a plurality of transmission measurements having energy diversity and image reconstructor apparatus utilizing the method |
US6618466B1 (en) | 2002-02-21 | 2003-09-09 | University Of Rochester | Apparatus and method for x-ray scatter reduction and correction for fan beam CT and cone beam volume CT |
US6654443B1 (en) * | 2002-02-25 | 2003-11-25 | Ge Medical Systems Global Technology Co., Llc | Thermal sensing detector cell for a computed tomography system and method of manufacturing same |
US6459755B1 (en) | 2002-02-26 | 2002-10-01 | Ge Medical Systems Global Technology Co. Llc | Method and apparatus for administering low dose CT scans |
US6775348B2 (en) | 2002-02-27 | 2004-08-10 | General Electric Company | Fiber optic scintillator with optical gain for a computed tomography system and method of manufacturing same |
JP3910468B2 (ja) | 2002-02-28 | 2007-04-25 | 株式会社東芝 | 回転陽極型x線管 |
US7110493B1 (en) | 2002-02-28 | 2006-09-19 | Rapiscan Security Products (Usa), Inc. | X-ray detector system having low Z material panel |
US7868665B2 (en) | 2002-03-05 | 2011-01-11 | Nova R&D, Inc. | Integrated circuit and sensor for imaging |
US6665373B1 (en) | 2002-03-12 | 2003-12-16 | Rapiscan Security Products (Usa), Inc. | X-ray imaging system with active detector |
JP2005520661A (ja) | 2002-03-23 | 2005-07-14 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 対象に含まれる構造のインタラクティブなセグメンテーションの方法 |
US6647095B2 (en) | 2002-04-02 | 2003-11-11 | Ge Medical Systems Global Technology Co., Llc | Method and apparatus for optimizing dosage to scan subject |
US20040077943A1 (en) | 2002-04-05 | 2004-04-22 | Meaney Paul M. | Systems and methods for 3-D data acquisition for microwave imaging |
AU2003262118A1 (en) | 2002-04-08 | 2003-10-27 | Nanodynamics, Inc. | High quantum energy efficiency x-ray tube and targets |
US6760407B2 (en) | 2002-04-17 | 2004-07-06 | Ge Medical Global Technology Company, Llc | X-ray source and method having cathode with curved emission surface |
US7087902B2 (en) | 2002-04-19 | 2006-08-08 | Rensselaer Polytechnic Institute | Fresnel lens tomographic imaging |
US7295691B2 (en) * | 2002-05-15 | 2007-11-13 | Ge Medical Systems Global Technology Company, Llc | Computer aided diagnosis of an image set |
US6796944B2 (en) | 2002-05-17 | 2004-09-28 | Ge Medical Systems Global Technology, Llc | Display for subtraction imaging techniques |
AU2003237995A1 (en) | 2002-06-10 | 2003-12-22 | American Science And Engineering, Inc. | Scanner for x-ray inspection comprising a chopper wheel with differently sized apertures |
US7106830B2 (en) | 2002-06-12 | 2006-09-12 | Agilent Technologies, Inc. | 3D x-ray system adapted for high speed scanning of large articles |
US6754300B2 (en) | 2002-06-20 | 2004-06-22 | Ge Medical Systems Global Technology Company, Llc | Methods and apparatus for operating a radiation source |
JP2004028675A (ja) | 2002-06-24 | 2004-01-29 | Hitachi Ltd | 危険物検知システム |
US6654440B1 (en) | 2002-06-29 | 2003-11-25 | Ge Medical Systems Global Technology Company, Llc | Methods and apparatus for computed tomography scanning using a two-dimensional radiation source |
NL1021026C2 (nl) | 2002-07-08 | 2004-01-09 | Havatec B V | Werkwijze en inrichting voor het sorteren van bloembollen op afwijkingen en ziektes. |
US6770884B2 (en) | 2002-07-11 | 2004-08-03 | Triumf | High resolution 3-D position sensitive detector for gamma rays |
US7162005B2 (en) | 2002-07-19 | 2007-01-09 | Varian Medical Systems Technologies, Inc. | Radiation sources and compact radiation scanning systems |
GB0216889D0 (en) | 2002-07-20 | 2002-08-28 | Univ Surrey | Image control |
GB0216891D0 (en) | 2002-07-20 | 2002-08-28 | Univ Surrey | Radiation collimation |
GB0216893D0 (en) | 2002-07-20 | 2002-08-28 | Univ Surrey | Image colouring |
US7050529B2 (en) | 2002-07-23 | 2006-05-23 | Ge Medical Systems Global Technolgy Company, Llc | Methods and apparatus for performing a computed tomography scan |
US7486768B2 (en) | 2002-07-23 | 2009-02-03 | Rapiscan Security Products, Inc. | Self-contained mobile inspection system and method |
US20040016271A1 (en) | 2002-07-23 | 2004-01-29 | Kirti Shah | Portable inspection containers |
US7322745B2 (en) | 2002-07-23 | 2008-01-29 | Rapiscan Security Products, Inc. | Single boom cargo scanning system |
US6843599B2 (en) | 2002-07-23 | 2005-01-18 | Rapiscan, Inc. | Self-contained, portable inspection system and method |
US7369643B2 (en) | 2002-07-23 | 2008-05-06 | Rapiscan Security Products, Inc. | Single boom cargo scanning system |
US7356115B2 (en) | 2002-12-04 | 2008-04-08 | Varian Medical Systems Technology, Inc. | Radiation scanning units including a movable platform |
US7103137B2 (en) | 2002-07-24 | 2006-09-05 | Varian Medical Systems Technology, Inc. | Radiation scanning of objects for contraband |
US6785359B2 (en) | 2002-07-30 | 2004-08-31 | Ge Medical Systems Global Technology Company, Llc | Cathode for high emission x-ray tube |
JP2004079128A (ja) | 2002-08-22 | 2004-03-11 | Matsushita Electric Ind Co Ltd | 光ディスク記録装置 |
US6661866B1 (en) | 2002-08-28 | 2003-12-09 | Ge Medical Systems Global Technology Company, Llc | Integrated CT-PET system |
AU2003268462A1 (en) | 2002-09-03 | 2004-03-29 | Parker Medical, Inc. | Multiple grooved x-ray generator |
US7155812B1 (en) * | 2002-09-05 | 2007-01-02 | Sandia Corporation | Method for producing a tube |
US7006591B2 (en) | 2002-09-09 | 2006-02-28 | Kabushiki Kaisha Toshiba | Computed tomography apparatus and program |
US7062009B2 (en) | 2002-09-12 | 2006-06-13 | Analogic Corporation | Helical interpolation for an asymmetric multi-slice scanner |
KR20050083718A (ko) | 2002-10-02 | 2005-08-26 | 리빌 이미징 테크놀로지스, 인코포레이티드 | 폴디드 어레이형 ct 수화물 스캐너 |
US7224765B2 (en) | 2002-10-02 | 2007-05-29 | Reveal Imaging Technologies, Inc. | Computed tomography system |
US7078699B2 (en) | 2002-10-04 | 2006-07-18 | Varian Medical Systems Technologies, Inc. | Imaging apparatus and method with event sensitive photon detection |
US7203629B2 (en) | 2002-10-09 | 2007-04-10 | State Of Oregon Acting By And Through The Oregon State Board Of Higher Education On Behalf Of Oregon State University | Modeling substrate noise coupling using scalable parameters |
CN1181336C (zh) | 2002-10-16 | 2004-12-22 | 清华大学 | 一种车载移动式集装箱检查*** |
US7042975B2 (en) | 2002-10-25 | 2006-05-09 | Koninklijke Philips Electronics N.V. | Four-dimensional helical tomographic scanner |
US7505556B2 (en) | 2002-11-06 | 2009-03-17 | American Science And Engineering, Inc. | X-ray backscatter detection imaging modules |
US7099434B2 (en) | 2002-11-06 | 2006-08-29 | American Science And Engineering, Inc. | X-ray backscatter mobile inspection van |
FR2847074B1 (fr) | 2002-11-08 | 2005-02-25 | Thales Sa | Generateur de rayons x a dissipation thermique amelioree et procede de realisation du generateur |
US7023956B2 (en) * | 2002-11-11 | 2006-04-04 | Lockheed Martin Corporaiton | Detection methods and system using sequenced technologies |
DE10252662A1 (de) | 2002-11-11 | 2004-05-27 | Philips Intellectual Property & Standards Gmbh | Computertomographie-Verfahren mit kohärenten Streustrahlen und Computertomograph |
JP2004182977A (ja) | 2002-11-18 | 2004-07-02 | Fuji Photo Film Co Ltd | インクジェット用カラーインク |
US6859518B2 (en) | 2002-11-19 | 2005-02-22 | Invision Technologies, Inc. | X-ray technique-based nonintrusive inspection apparatus |
JP2004177138A (ja) | 2002-11-25 | 2004-06-24 | Hitachi Ltd | 危険物探知装置および危険物探知方法 |
US7272429B2 (en) | 2002-11-27 | 2007-09-18 | Ge Medical Systems Global Technology Company, Llc | Methods and apparatus for facilitating a reduction in artifacts |
US7672426B2 (en) | 2002-12-04 | 2010-03-02 | Varian Medical Systems, Inc. | Radiation scanning units with reduced detector requirements |
WO2004054329A2 (en) | 2002-12-10 | 2004-06-24 | Digitome Corporation | Volumetric 3d x-ray imaging system for baggage inspection including the detection of explosives |
US7062011B1 (en) | 2002-12-10 | 2006-06-13 | Analogic Corporation | Cargo container tomography scanning system |
US7177387B2 (en) * | 2003-11-29 | 2007-02-13 | General Electric Company | Self-aligning scintillator-collimator assembly |
US6993115B2 (en) * | 2002-12-31 | 2006-01-31 | Mcguire Edward L | Forward X-ray generation |
US7166458B2 (en) * | 2003-01-07 | 2007-01-23 | Bio Tex, Inc. | Assay and method for analyte sensing by detecting efficiency of radiation conversion |
US6785357B2 (en) | 2003-01-16 | 2004-08-31 | Bio-Imaging Research, Inc. | High energy X-ray mobile cargo inspection system with penumbra collimator |
US7072434B1 (en) | 2003-01-16 | 2006-07-04 | Analogic Corporation | Carry-on baggage tomography scanning system |
JP4601607B2 (ja) * | 2003-01-23 | 2010-12-22 | リビール イメージング テクノロジーズ, インコーポレイテッド | 手荷物のctスキャンシステム及びctスキャン方法 |
JP2004226253A (ja) | 2003-01-23 | 2004-08-12 | Shimadzu Corp | X線異物検査装置 |
US7340525B1 (en) | 2003-01-24 | 2008-03-04 | Oracle International Corporation | Method and apparatus for single sign-on in a wireless environment |
US7184520B1 (en) | 2003-01-29 | 2007-02-27 | Varian Medical Systems Technologies, Inc. | Component mounting system with stress compensation |
JP3779957B2 (ja) | 2003-01-30 | 2006-05-31 | アンリツ産機システム株式会社 | X線異物検出装置 |
US7317782B2 (en) | 2003-01-31 | 2008-01-08 | Varian Medical Systems Technologies, Inc. | Radiation scanning of cargo conveyances at seaports and the like |
US7263160B2 (en) | 2003-02-13 | 2007-08-28 | Koninklijke Philips Electronics N.V. | Method and device for examining an object |
US7149339B2 (en) | 2003-02-25 | 2006-12-12 | Schlumberger Technology Corporation | Non-destructive inspection of downhole equipment |
US7065175B2 (en) | 2003-03-03 | 2006-06-20 | Varian Medical Systems Technologies, Inc. | X-ray diffraction-based scanning system |
US6907101B2 (en) | 2003-03-03 | 2005-06-14 | General Electric Company | CT detector with integrated air gap |
US6947517B2 (en) | 2003-03-03 | 2005-09-20 | Ge Medical Systems Global Technology Company, Llc | Scintillator array having a reflector with integrated air gaps |
US6933504B2 (en) | 2003-03-12 | 2005-08-23 | General Electric Company | CT detector having a segmented optical coupler and method of manufacturing same |
US6859514B2 (en) * | 2003-03-14 | 2005-02-22 | Ge Medical Systems Global Technology Company Llc | CT detector array with uniform cross-talk |
US7164750B2 (en) * | 2003-03-26 | 2007-01-16 | Smiths Detection, Inc. | Non-destructive inspection of material in container |
WO2004090576A2 (en) | 2003-04-02 | 2004-10-21 | Reveal Imaging Technologies, Inc. | System and method for detection of explosives in baggage |
US20050190882A1 (en) | 2003-04-04 | 2005-09-01 | Mcguire Edward L. | Multi-spectral x-ray image processing |
JP3795028B2 (ja) | 2003-04-08 | 2006-07-12 | 株式会社エーイーティー | X線発生装置および前記装置を用いたx線治療装置 |
US7466799B2 (en) | 2003-04-09 | 2008-12-16 | Varian Medical Systems, Inc. | X-ray tube having an internal radiation shield |
DE10318194A1 (de) | 2003-04-22 | 2004-11-25 | Siemens Ag | Röntgenröhre mit Flüssigmetall-Gleitlager |
GB0309383D0 (en) | 2003-04-25 | 2003-06-04 | Cxr Ltd | X-ray tube electron sources |
GB0309374D0 (en) * | 2003-04-25 | 2003-06-04 | Cxr Ltd | X-ray sources |
GB0309379D0 (en) * | 2003-04-25 | 2003-06-04 | Cxr Ltd | X-ray scanning |
GB0812864D0 (en) | 2008-07-15 | 2008-08-20 | Cxr Ltd | Coolign anode |
US10483077B2 (en) | 2003-04-25 | 2019-11-19 | Rapiscan Systems, Inc. | X-ray sources having reduced electron scattering |
US8804899B2 (en) | 2003-04-25 | 2014-08-12 | Rapiscan Systems, Inc. | Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners |
US7949101B2 (en) | 2005-12-16 | 2011-05-24 | Rapiscan Systems, Inc. | X-ray scanners and X-ray sources therefor |
GB0309371D0 (en) | 2003-04-25 | 2003-06-04 | Cxr Ltd | X-Ray tubes |
US8451974B2 (en) | 2003-04-25 | 2013-05-28 | Rapiscan Systems, Inc. | X-ray tomographic inspection system for the identification of specific target items |
US9208988B2 (en) | 2005-10-25 | 2015-12-08 | Rapiscan Systems, Inc. | Graphite backscattered electron shield for use in an X-ray tube |
US8204173B2 (en) | 2003-04-25 | 2012-06-19 | Rapiscan Systems, Inc. | System and method for image reconstruction by using multi-sheet surface rebinning |
US8837669B2 (en) | 2003-04-25 | 2014-09-16 | Rapiscan Systems, Inc. | X-ray scanning system |
US8223919B2 (en) | 2003-04-25 | 2012-07-17 | Rapiscan Systems, Inc. | X-ray tomographic inspection systems for the identification of specific target items |
US8094784B2 (en) | 2003-04-25 | 2012-01-10 | Rapiscan Systems, Inc. | X-ray sources |
US20050058242A1 (en) * | 2003-09-15 | 2005-03-17 | Peschmann Kristian R. | Methods and systems for the rapid detection of concealed objects |
GB0309387D0 (en) * | 2003-04-25 | 2003-06-04 | Cxr Ltd | X-Ray scanning |
US9113839B2 (en) | 2003-04-25 | 2015-08-25 | Rapiscon Systems, Inc. | X-ray inspection system and method |
GB0525593D0 (en) | 2005-12-16 | 2006-01-25 | Cxr Ltd | X-ray tomography inspection systems |
US8243876B2 (en) | 2003-04-25 | 2012-08-14 | Rapiscan Systems, Inc. | X-ray scanners |
GB0903198D0 (en) | 2009-02-25 | 2009-04-08 | Cxr Ltd | X-Ray scanners |
US8331535B2 (en) | 2003-04-25 | 2012-12-11 | Rapiscan Systems, Inc. | Graphite backscattered electron shield for use in an X-ray tube |
GB0309385D0 (en) | 2003-04-25 | 2003-06-04 | Cxr Ltd | X-ray monitoring |
US7112797B2 (en) | 2003-04-30 | 2006-09-26 | General Electric Company | Scintillator having integrated collimator and method of manufacturing same |
DE10319547B4 (de) | 2003-04-30 | 2012-02-16 | Siemens Ag | Drehanoden-Röntgenröhre |
US7054408B2 (en) | 2003-04-30 | 2006-05-30 | General Electric Company | CT detector array having non pixelated scintillator array |
DE10319549B3 (de) | 2003-04-30 | 2004-12-23 | Siemens Ag | Drehanoden-Röntgenröhre |
US6934354B2 (en) * | 2003-05-02 | 2005-08-23 | General Electric Company | Collimator assembly having multi-piece components |
US7068749B2 (en) * | 2003-05-19 | 2006-06-27 | General Electric Company | Stationary computed tomography system with compact x ray source assembly |
US6972693B2 (en) | 2003-05-19 | 2005-12-06 | Brown Betty J | Vehicle security inspection system |
JP4206819B2 (ja) * | 2003-05-20 | 2009-01-14 | 株式会社日立製作所 | X線撮影装置 |
US7046756B2 (en) | 2003-05-20 | 2006-05-16 | General Electric Company | Rotatable filter for a pre-subject CT collimator having multiple filtering profiles |
US6968030B2 (en) | 2003-05-20 | 2005-11-22 | General Electric Company | Method and apparatus for presenting multiple pre-subject filtering profiles during CT data acquisition |
US7092485B2 (en) | 2003-05-27 | 2006-08-15 | Control Screening, Llc | X-ray inspection system for detecting explosives and other contraband |
CN1794951A (zh) * | 2003-05-28 | 2006-06-28 | 皇家飞利浦电子股份有限公司 | 扇形射束相干散射计算机断层摄影 |
JP2004357724A (ja) | 2003-05-30 | 2004-12-24 | Toshiba Corp | X線ct装置、x線発生装置及びx線ct装置のデータ収集方法 |
US7120222B2 (en) | 2003-06-05 | 2006-10-10 | General Electric Company | CT imaging system with multiple peak x-ray source |
US6937692B2 (en) | 2003-06-06 | 2005-08-30 | Varian Medical Systems Technologies, Inc. | Vehicle mounted inspection systems and methods |
US6952163B2 (en) | 2003-06-11 | 2005-10-04 | Quantum Magnetics, Inc. | Combined systems user interface for centralized monitoring of a screening checkpoint for passengers and baggage |
US7119553B2 (en) | 2003-06-11 | 2006-10-10 | Konsulteurope Limited Limited Joint Stock Company | Security scanners with capacitance and magnetic sensor arrays |
US6922460B2 (en) | 2003-06-11 | 2005-07-26 | Quantum Magnetics, Inc. | Explosives detection system using computed tomography (CT) and quadrupole resonance (QR) sensors |
US7317390B2 (en) * | 2003-06-11 | 2008-01-08 | Quantum Magnetics, Inc. | Screening checkpoint for passengers and baggage |
US7366280B2 (en) | 2003-06-19 | 2008-04-29 | General Electric Company | Integrated arc anode x-ray source for a computed tomography system |
FR2856513A1 (fr) | 2003-06-20 | 2004-12-24 | Thales Sa | Tube generateur de rayons x a ensemble porte-cible orientable |
US6928141B2 (en) | 2003-06-20 | 2005-08-09 | Rapiscan, Inc. | Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers |
WO2005009206A2 (en) | 2003-06-25 | 2005-02-03 | Besson Guy M | Dynamic multi-spectral imaging system |
US6975698B2 (en) | 2003-06-30 | 2005-12-13 | General Electric Company | X-ray generator and slip ring for a CT system |
US7197172B1 (en) * | 2003-07-01 | 2007-03-27 | Analogic Corporation | Decomposition of multi-energy scan projections using multi-step fitting |
CN100445767C (zh) | 2003-07-08 | 2008-12-24 | 通用电气家园保护有限公司 | 安全检查站 |
US6975703B2 (en) | 2003-08-01 | 2005-12-13 | General Electric Company | Notched transmission target for a multiple focal spot X-ray source |
US7031434B1 (en) | 2003-08-06 | 2006-04-18 | General Electric Company | Method of manufacturing, and a collimator mandrel having variable attenuation characteristics for a CT system |
US7492855B2 (en) | 2003-08-07 | 2009-02-17 | General Electric Company | System and method for detecting an object |
US7010092B2 (en) | 2003-08-08 | 2006-03-07 | Imaging Dynamics Company Ltd. | Dual energy imaging using optically coupled digital radiography system |
US7856081B2 (en) | 2003-09-15 | 2010-12-21 | Rapiscan Systems, Inc. | Methods and systems for rapid detection of concealed objects using fluorescence |
US7366282B2 (en) | 2003-09-15 | 2008-04-29 | Rapiscan Security Products, Inc. | Methods and systems for rapid detection of concealed objects using fluorescence |
US20050117700A1 (en) | 2003-08-08 | 2005-06-02 | Peschmann Kristian R. | Methods and systems for the rapid detection of concealed objects |
US6901135B2 (en) | 2003-08-28 | 2005-05-31 | Bio-Imaging Research, Inc. | System for extending the dynamic gain of an X-ray detector |
US7279120B2 (en) | 2003-09-04 | 2007-10-09 | Intematix Corporation | Doped cadmium tungstate scintillator with improved radiation hardness |
JP3909048B2 (ja) * | 2003-09-05 | 2007-04-25 | ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー | X線ct装置およびx線管 |
JP2005110722A (ja) * | 2003-10-02 | 2005-04-28 | Shimadzu Corp | X線管およびx線撮影装置 |
US7039154B1 (en) | 2003-10-02 | 2006-05-02 | Reveal Imaging Technologies, Inc. | Folded array CT baggage scanner |
US7038552B2 (en) | 2003-10-07 | 2006-05-02 | Analog Devices, Inc. | Voltage controlled oscillator having improved phase noise |
US6991371B2 (en) * | 2003-10-14 | 2006-01-31 | The Boeing Company | Computed tomography image quality phantom |
JP2007508561A (ja) * | 2003-10-14 | 2007-04-05 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 非対称csct |
US20050082491A1 (en) | 2003-10-15 | 2005-04-21 | Seppi Edward J. | Multi-energy radiation detector |
US7649981B2 (en) | 2003-10-15 | 2010-01-19 | Varian Medical Systems, Inc. | Multi-energy x-ray source |
CN100437096C (zh) * | 2003-10-16 | 2008-11-26 | 清华大学 | 一种用于集装箱检查***的双辐射源框架结构 |
US6987833B2 (en) | 2003-10-16 | 2006-01-17 | General Electric Company | Methods and apparatus for identification and imaging of specific materials |
CN100437097C (zh) | 2003-10-16 | 2008-11-26 | 清华大学 | 一种可调整辐射射线角度的集装货物/车辆检查*** |
US7068750B2 (en) | 2003-10-27 | 2006-06-27 | General Electric Company | System and method of x-ray flux management control |
US6996209B2 (en) * | 2003-10-27 | 2006-02-07 | Ge Medical Systems Global Technology Company, Llc | Scintillator coatings having barrier protection, light transmission, and light reflection properties |
US7076029B2 (en) | 2003-10-27 | 2006-07-11 | General Electric Company | Method and apparatus of radiographic imaging with an energy beam tailored for a subject to be scanned |
US6990171B2 (en) * | 2003-10-27 | 2006-01-24 | General Electric Company | System and method of determining a user-defined region-of-interest of an imaging subject for x-ray flux management control |
US7068751B2 (en) | 2003-10-27 | 2006-06-27 | General Electric Company | System and method of determining a center of mass of an imaging subject for x-ray flux management control |
US20050100126A1 (en) | 2003-11-07 | 2005-05-12 | Mistretta Charles A. | Computed tomography with z-axis scanning |
US7065179B2 (en) | 2003-11-07 | 2006-06-20 | General Electric Company | Multiple target anode assembly and system of operation |
US7081628B2 (en) | 2003-11-10 | 2006-07-25 | Ge Medical Systems Global Technology Company, Llc | Spatially patterned light-blocking layers for radiation imaging detectors |
US7366281B2 (en) | 2003-11-12 | 2008-04-29 | Ge Invision Inc. | System and method for detecting contraband |
US7099435B2 (en) | 2003-11-15 | 2006-08-29 | Agilent Technologies, Inc | Highly constrained tomography for automated inspection of area arrays |
US7206379B2 (en) | 2003-11-25 | 2007-04-17 | General Electric Company | RF accelerator for imaging applications |
US7233640B2 (en) | 2003-11-26 | 2007-06-19 | General Electric Company | CT detector having an optical mask layer |
US20050226364A1 (en) | 2003-11-26 | 2005-10-13 | General Electric Company | Rotational computed tomography system and method |
US7280631B2 (en) | 2003-11-26 | 2007-10-09 | General Electric Company | Stationary computed tomography system and method |
KR100659710B1 (ko) | 2003-11-29 | 2006-12-21 | 삼성에스디아이 주식회사 | 발광 표시 장치 및 그 표시 패널 |
CN1627061A (zh) | 2003-12-10 | 2005-06-15 | 清华同方威视技术股份有限公司 | 一种组合移动式低靶点集装箱检查*** |
US7308074B2 (en) | 2003-12-11 | 2007-12-11 | General Electric Company | Multi-layer reflector for CT detector |
US7027553B2 (en) * | 2003-12-29 | 2006-04-11 | Ge Medical Systems Global Technology Company, Llc | Systems and methods for generating images by using monochromatic x-rays |
IL159828A0 (en) | 2004-01-12 | 2005-11-20 | Elbit Systems Ltd | System and method for identifying a threat associated person among a crowd |
US7133491B2 (en) | 2004-01-15 | 2006-11-07 | Bio-Imaging Research, Inc. | Traveling X-ray inspection system with collimators |
US7039159B2 (en) | 2004-01-30 | 2006-05-02 | Science Applications International Corporation | Method and system for automatically scanning and imaging the contents of a moving target |
US7192031B2 (en) * | 2004-02-05 | 2007-03-20 | General Electric Company | Emitter array configurations for a stationary CT system |
US7203282B2 (en) | 2004-02-11 | 2007-04-10 | Proto Manufacturing Ltd. | Removable filter holder and method |
EP1719000A2 (en) | 2004-02-11 | 2006-11-08 | Reveal Imaging Technologies, Inc. | Contraband detection systems and methods |
US7023950B1 (en) | 2004-02-11 | 2006-04-04 | Martin Annis | Method and apparatus for determining the position of an x-ray cone beam produced by a scanning electron beam |
US7609807B2 (en) | 2004-02-17 | 2009-10-27 | General Electric Company | CT-Guided system and method for analyzing regions of interest for contraband detection |
US6990172B2 (en) * | 2004-02-19 | 2006-01-24 | General Electric Company | Method and apparatus to determine tube current modulation profile for radiographic imaging |
US7224769B2 (en) | 2004-02-20 | 2007-05-29 | Aribex, Inc. | Digital x-ray camera |
US7885375B2 (en) | 2004-02-27 | 2011-02-08 | General Electric Company | Method and system for X-ray imaging |
US7333587B2 (en) * | 2004-02-27 | 2008-02-19 | General Electric Company | Method and system for imaging using multiple offset X-ray emission points |
US7027554B2 (en) * | 2004-03-01 | 2006-04-11 | Invision Technologies, Inc. | Reduced-size apparatus for non-intrusively inspecting an object |
EP1730502B1 (en) * | 2004-03-01 | 2014-04-09 | Varian Medical Systems, Inc. | Dual energy radiation scanning of objects |
US7596275B1 (en) * | 2004-03-01 | 2009-09-29 | Science Applications International Corporation | Methods and systems for imaging and classifying targets as empty or non-empty |
US7183906B2 (en) * | 2004-03-19 | 2007-02-27 | Lockheed Martin Corporation | Threat scanning machine management system |
US7769138B2 (en) | 2004-03-29 | 2010-08-03 | Cmt Medical Technologies Ltd. | Apparatus and method of improved angiographic imaging |
SE528234C2 (sv) | 2004-03-30 | 2006-09-26 | Xcounter Ab | Anordning och metod för att erhålla tomosyntesdata |
US7142629B2 (en) | 2004-03-31 | 2006-11-28 | General Electric Company | Stationary computed tomography system and method |
US7031430B2 (en) * | 2004-04-06 | 2006-04-18 | General Electric Company | System and method for detecting objects with differential operators |
US7317195B2 (en) * | 2004-04-08 | 2008-01-08 | Eikman Edward A | Quantitative transmission/emission detector system and methods of detecting concealed radiation sources |
PL1733213T3 (pl) * | 2004-04-09 | 2010-07-30 | American Science & Eng Inc | Eliminowanie przesłuchu w bramce kontrolnej z rozpraszaniem wstecznym, zawierającej wiele źródeł, przez zapewnienie, że tylko jedno źródło emituje promieniowanie w tym samym czasie |
EP1740097A1 (en) * | 2004-04-21 | 2007-01-10 | Philips Intellectual Property & Standards GmbH | Fan-beam coherent-scatter computer tomograph |
US7277577B2 (en) | 2004-04-26 | 2007-10-02 | Analogic Corporation | Method and system for detecting threat objects using computed tomography images |
US7356174B2 (en) | 2004-05-07 | 2008-04-08 | General Electric Company | Contraband detection system and method using variance data |
US6953935B1 (en) | 2004-05-11 | 2005-10-11 | General Electric Company | CT detector fabrication process |
GB2414072B (en) | 2004-05-12 | 2006-07-26 | Schlumberger Holdings | Classification method for sedimentary rocks |
US7092481B2 (en) | 2004-05-19 | 2006-08-15 | General Electric Company | Direct conversion energy discriminating CT detector |
US7190757B2 (en) * | 2004-05-21 | 2007-03-13 | Analogic Corporation | Method of and system for computing effective atomic number images in multi-energy computed tomography |
US7136450B2 (en) | 2004-05-26 | 2006-11-14 | Analogic Corporation | Method of and system for adaptive scatter correction in multi-energy computed tomography |
WO2006076038A2 (en) | 2004-05-27 | 2006-07-20 | L-3 Communications Security And Detection Systems, Inc. | Method and apparatus for detecting contraband using radiated compound signatures |
US7324625B2 (en) * | 2004-05-27 | 2008-01-29 | L-3 Communications Security And Detection Systems, Inc. | Contraband detection systems using a large-angle cone beam CT system |
US7274772B2 (en) | 2004-05-27 | 2007-09-25 | Cabot Microelectronics Corporation | X-ray source with nonparallel geometry |
US7218700B2 (en) | 2004-05-28 | 2007-05-15 | General Electric Company | System for forming x-rays and method for using same |
WO2005121756A2 (en) * | 2004-06-03 | 2005-12-22 | Brondo Joseph H Jr | Mult-mode gamma beam detection and imaging system |
US7590215B2 (en) * | 2004-06-07 | 2009-09-15 | Koninklijke Philips Electronics N.V. | Coherent-scatter computer tomograph |
US7327853B2 (en) * | 2004-06-09 | 2008-02-05 | Analogic Corporation | Method of and system for extracting 3D bag images from continuously reconstructed 2D image slices in computed tomography |
US20050276377A1 (en) | 2004-06-10 | 2005-12-15 | Carol Mark P | Kilovoltage delivery system for radiation therapy |
US7203271B2 (en) | 2004-06-28 | 2007-04-10 | Pediatric Imaging Technology, Llc | Ionizing radiation imaging system and method with decreased radiation dose |
US7302083B2 (en) | 2004-07-01 | 2007-11-27 | Analogic Corporation | Method of and system for sharp object detection using computed tomography images |
US7412026B2 (en) | 2004-07-02 | 2008-08-12 | The Board Of Regents Of The University Of Oklahoma | Phase-contrast x-ray imaging systems and methods |
US7372937B2 (en) | 2004-07-16 | 2008-05-13 | University Of Iowa Research Foundation | Systems and methods of non-standard spiral cone-beam computed tomograpy (CT) |
US7282727B2 (en) | 2004-07-26 | 2007-10-16 | Retsky Michael W | Electron beam directed energy device and methods of using same |
US7224763B2 (en) | 2004-07-27 | 2007-05-29 | Analogic Corporation | Method of and system for X-ray spectral correction in multi-energy computed tomography |
GB2416944A (en) | 2004-07-30 | 2006-02-08 | Voxar Ltd | Classifying voxels in a medical image |
GB2416655A (en) | 2004-08-06 | 2006-02-08 | Jason Rudd Farmery | Float retrieval tool |
JP4109232B2 (ja) | 2004-09-03 | 2008-07-02 | 株式会社イシダ | X線検査装置 |
DE102004043158A1 (de) | 2004-09-03 | 2006-03-23 | Smiths Heimann Gmbh | Transportable Kontrollstation zur Überprüfung von Personen und Gepäck |
US7289603B2 (en) | 2004-09-03 | 2007-10-30 | Varian Medical Systems Technologies, Inc. | Shield structure and focal spot control assembly for x-ray device |
US7149278B2 (en) * | 2004-09-10 | 2006-12-12 | General Electric Company | Method and system of dynamically controlling shaping time of a photon counting energy-sensitive radiation detector to accommodate variations in incident radiation flux levels |
US7260174B2 (en) | 2004-09-13 | 2007-08-21 | General Electric Company | Direct conversion energy discriminating CT detector with over-ranging correction |
US7139367B1 (en) | 2004-09-29 | 2006-11-21 | Khai Minh Le | Time share digital integration method and apparatus for processing X-ray images |
US20060067471A1 (en) | 2004-09-30 | 2006-03-30 | General Electric Company | Linear array detector system and inspection method |
US7136451B2 (en) | 2004-10-05 | 2006-11-14 | Analogic Corporation | Method of and system for stabilizing high voltage power supply voltages in multi-energy computed tomography |
CA2584292A1 (en) | 2004-10-14 | 2006-04-27 | Eklin Medical Systems, Inc. | Polychromic digital radiography detector with patterned mask for single-exposure energy-sensitive x-ray imaging |
US7356118B2 (en) * | 2004-10-22 | 2008-04-08 | Scantech Holdings, Llc | Angled-beam detection system for container inspection |
US7260171B1 (en) | 2004-10-25 | 2007-08-21 | General Electric Company | Apparatus for acquisition of CT data with penumbra attenuation calibration |
US7558374B2 (en) | 2004-10-29 | 2009-07-07 | General Electric Co. | System and method for generating X-rays |
US7450686B2 (en) | 2004-10-29 | 2008-11-11 | Thermofisher Scientific | Contaminant detector for food inspection |
US7197116B2 (en) | 2004-11-16 | 2007-03-27 | General Electric Company | Wide scanning x-ray source |
US7583779B2 (en) | 2004-11-24 | 2009-09-01 | General Electric Company | System and method for acquisition and reconstruction of contrast-enhanced, artifact-reduced CT images |
US7382853B2 (en) | 2004-11-24 | 2008-06-03 | General Electric Company | Method and system of CT data correction |
JP2006141906A (ja) | 2004-11-25 | 2006-06-08 | Ge Medical Systems Global Technology Co Llc | 放射線撮影装置 |
CN100427368C (zh) | 2004-11-26 | 2008-10-22 | 同方威视技术股份有限公司 | 一种用于集装箱检查***的拖动装置 |
US7233644B1 (en) | 2004-11-30 | 2007-06-19 | Ge Homeland Protection, Inc. | Computed tomographic scanner using rastered x-ray tubes |
DE102004060580A1 (de) | 2004-12-16 | 2006-06-29 | Siemens Ag | Verfahren zur Erzeugung einer computertomographischen Darstellung von Gewebestrukturen mit Hilfe einer Kontrastmittelapplikation |
EP1677253A1 (en) | 2004-12-30 | 2006-07-05 | GSF-Forschungszentrum für Umwelt und Gesundheit GmbH | Method and device of reconstructing an (n+1)-dimensional image function from radon data |
US20080267350A1 (en) | 2005-01-10 | 2008-10-30 | Gray Stephen J | Integrated carry-on baggage cart and passenger screening station |
CN100441144C (zh) | 2005-02-18 | 2008-12-10 | 傅耀宗 | X射线检测装置和图像获取及处理方法 |
GB2423687B (en) | 2005-02-25 | 2010-04-28 | Rapiscan Security Products Ltd | X-ray security inspection machine |
DE102005011054A1 (de) | 2005-03-10 | 2006-09-14 | Smiths Heimann Gmbh | Verfahren und Vorrichtung zur Kontrolle von Handgepäck und anderen mitgeführten Gegenständen |
US7177391B2 (en) * | 2005-03-29 | 2007-02-13 | Surescan Corporation | Imaging inspection apparatus |
US7440547B2 (en) | 2005-04-15 | 2008-10-21 | Kabushiki Kaisha Toshiba | CT scanner |
US7471764B2 (en) | 2005-04-15 | 2008-12-30 | Rapiscan Security Products, Inc. | X-ray imaging system having improved weather resistance |
US7227923B2 (en) | 2005-04-18 | 2007-06-05 | General Electric Company | Method and system for CT imaging using a distributed X-ray source and interpolation based reconstruction |
WO2006116316A2 (en) | 2005-04-22 | 2006-11-02 | University Of Chicago | Open source trajectory method and apparatus for interior imaging |
US7130374B1 (en) | 2005-05-11 | 2006-10-31 | University Of Florida Research Foundation, Inc. | Snapshot backscatter radiography (SBR) systems including system having dynamic collimation |
JP5042465B2 (ja) * | 2005-05-18 | 2012-10-03 | 株式会社日立メディコ | 放射線撮影装置、画像処理方法 |
JP4135727B2 (ja) | 2005-05-23 | 2008-08-20 | トヨタ自動車株式会社 | 動力出力装置、これを搭載する自動車及び動力出力装置の制御方法 |
WO2006130630A2 (en) | 2005-05-31 | 2006-12-07 | The University Of North Carolina At Chapel Hill | X-ray pixel beam array systems and methods for electronically shaping radiation fields and modulating radiation field intensity patterns for radiotherapy |
US7354197B2 (en) | 2005-06-01 | 2008-04-08 | Endicott Interconnect Technologies, Inc. | Imaging inspection apparatus with improved cooling |
CN100573116C (zh) | 2005-06-01 | 2009-12-23 | 同方威视技术股份有限公司 | 一种用于辐射成像的双阵列探测器模块结构 |
US7261466B2 (en) | 2005-06-01 | 2007-08-28 | Endicott Interconnect Technologies, Inc. | Imaging inspection apparatus with directional cooling |
US7653176B2 (en) | 2005-06-14 | 2010-01-26 | L-3 Communications Security and Detection Systems Inc. | Inspection system with material identification |
JP4269074B2 (ja) | 2005-06-14 | 2009-05-27 | 株式会社エーイーティー | X線発生装置 |
US7295651B2 (en) | 2005-06-30 | 2007-11-13 | General Electric Company | Stationary computed tomography system and method |
JP4074874B2 (ja) | 2005-06-30 | 2008-04-16 | 株式会社リガク | X線回折装置 |
US7801348B2 (en) * | 2005-07-18 | 2010-09-21 | Analogic Corporation | Method of and system for classifying objects using local distributions of multi-energy computed tomography images |
US7539337B2 (en) * | 2005-07-18 | 2009-05-26 | Analogic Corporation | Method of and system for splitting compound objects in multi-energy computed tomography images |
US7231017B2 (en) | 2005-07-27 | 2007-06-12 | Physical Optics Corporation | Lobster eye X-ray imaging system and method of fabrication thereof |
US7474786B2 (en) * | 2005-08-04 | 2009-01-06 | Analogic Corporation | Method of and system for classifying objects using histogram segment features of multi-energy computed tomography images |
US20070189597A1 (en) | 2005-08-23 | 2007-08-16 | Limer Daniel J | Machine vision counting system apparatus and method |
DE102005048389A1 (de) | 2005-10-10 | 2007-04-19 | Siemens Ag | Tomografiegerät und Verfahren zur röntgentomografischen Untersuchung eines Patienten |
US7308073B2 (en) | 2005-10-20 | 2007-12-11 | General Electric Company | X-ray filter having dynamically displaceable x-ray attenuating fluid |
US9046465B2 (en) | 2011-02-24 | 2015-06-02 | Rapiscan Systems, Inc. | Optimization of the source firing pattern for X-ray scanning systems |
CN101013094B (zh) | 2005-11-03 | 2010-12-29 | 清华大学 | 一种用于辐射成像的双阵列固体探测器模块结构 |
CN100582758C (zh) | 2005-11-03 | 2010-01-20 | 清华大学 | 用快中子和连续能谱x射线进行材料识别的方法及其装置 |
US7283609B2 (en) | 2005-11-10 | 2007-10-16 | General Electric Company | CT detector photodiode having multiple charge storage devices |
US7330535B2 (en) * | 2005-11-10 | 2008-02-12 | General Electric Company | X-ray flux management device |
JP3887395B2 (ja) | 2005-11-25 | 2007-02-28 | 株式会社東芝 | X線発生装置 |
US7215731B1 (en) | 2005-11-30 | 2007-05-08 | General Electric Company | Fast backprojection/reprojection with hexagonal segmentation of image |
US7197113B1 (en) * | 2005-12-01 | 2007-03-27 | General Electric Company | Contactless power transfer system |
GB0904236D0 (en) | 2009-03-12 | 2009-04-22 | Cxr Ltd | X-ray scanners and x-ray sources thereof |
US7372934B2 (en) | 2005-12-22 | 2008-05-13 | General Electric Company | Method for performing image reconstruction using hybrid computed tomography detectors |
CN1995993B (zh) | 2005-12-31 | 2010-07-14 | 清华大学 | 一种利用多种能量辐射扫描物质的方法及其装置 |
CN101000312B (zh) | 2006-01-11 | 2010-05-12 | 清华大学 | 一种大型航空集装货物检查*** |
US20070205367A1 (en) | 2006-03-01 | 2007-09-06 | General Electric Company | Apparatus and method for hybrid computed tomography imaging |
JP4878311B2 (ja) | 2006-03-03 | 2012-02-15 | キヤノン株式会社 | マルチx線発生装置 |
US7298812B2 (en) | 2006-03-31 | 2007-11-20 | General Electric Company | Image-based material decomposition |
US7319737B2 (en) * | 2006-04-07 | 2008-01-15 | Satpal Singh | Laminographic system for 3D imaging and inspection |
WO2007130857A2 (en) | 2006-05-05 | 2007-11-15 | American Science And Engineering, Inc. | Combined x-ray ct/neutron material identification system |
US7728397B2 (en) | 2006-05-05 | 2010-06-01 | Virgin Islands Microsystems, Inc. | Coupled nano-resonating energy emitting structures |
US8189893B2 (en) | 2006-05-19 | 2012-05-29 | The University Of North Carolina At Chapel Hill | Methods, systems, and computer program products for binary multiplexing x-ray radiography |
US7440549B2 (en) | 2006-06-21 | 2008-10-21 | Bruker Axs Inc. | Heat pipe anode for x-ray generator |
US8842808B2 (en) | 2006-08-11 | 2014-09-23 | American Science And Engineering, Inc. | Scatter attenuation tomography using a monochromatic radiation source |
KR101034753B1 (ko) | 2006-08-11 | 2011-05-17 | 아메리칸 사이언스 앤 엔지니어링, 인크. | 동시에 발생하며 근접한 투과 및 후방 산란 영상화를 이용한 엑스레이 검사 |
US20100166285A1 (en) | 2006-08-11 | 2010-07-01 | Koninklijke Philips Electronics N.V. | System and method for acquiring image data |
US7486760B2 (en) * | 2006-08-15 | 2009-02-03 | Ge Security, Inc. | Compact systems and methods for generating a diffraction profile |
US7376218B2 (en) | 2006-08-16 | 2008-05-20 | Endicott Interconnect Technologies, Inc. | X-ray source assembly |
WO2008024825A2 (en) | 2006-08-23 | 2008-02-28 | American Science And Engineering, Inc. | Scatter attenuation tomography |
US7924979B2 (en) | 2006-08-23 | 2011-04-12 | American Science And Engineering, Inc. | Scatter attenuation tomography |
CN101512379B (zh) | 2006-08-30 | 2013-06-05 | 通用电气公司 | 使用静止计算机x射线断层造影几何结构的投影数据的采集和再现 |
US7706499B2 (en) | 2006-08-30 | 2010-04-27 | General Electric Company | Acquisition and reconstruction of projection data using a stationary CT geometry |
US7616731B2 (en) | 2006-08-30 | 2009-11-10 | General Electric Company | Acquisition and reconstruction of projection data using a stationary CT geometry |
US7835486B2 (en) | 2006-08-30 | 2010-11-16 | General Electric Company | Acquisition and reconstruction of projection data using a stationary CT geometry |
US20080056432A1 (en) * | 2006-08-30 | 2008-03-06 | General Electric Company | Reconstruction of CT projection data |
US7548606B2 (en) | 2006-08-31 | 2009-06-16 | Ge Homeland Protection, Inc. | System and method for integrating explosive detection systems |
CA2666838C (en) | 2006-09-18 | 2010-12-07 | Optosecurity Inc. | Method and apparatus for assessing characteristics of liquids |
DE102006046741A1 (de) | 2006-09-29 | 2008-04-10 | Siemens Ag | Röntgensystem und Verfahren zur Tomosyntheseabtastung |
CN101162205B (zh) | 2006-10-13 | 2010-09-01 | 同方威视技术股份有限公司 | 对移动目标进行检查的设备及避让方法 |
WO2008047269A2 (en) | 2006-10-17 | 2008-04-24 | Philips Intellectual Property & Standards Gmbh | Emitter for x-ray tubes and heating method therefore |
EP2081497B1 (en) | 2006-10-31 | 2014-10-08 | Koninklijke Philips N.V. | Swept anode ct scanner |
JP2008113960A (ja) | 2006-11-07 | 2008-05-22 | Ge Medical Systems Global Technology Co Llc | 放射線撮影装置 |
CN102512192B (zh) | 2006-11-09 | 2015-06-03 | 佳能株式会社 | 控制多放射线生成设备的控制设备及其控制方法 |
US20080112540A1 (en) | 2006-11-09 | 2008-05-15 | General Electric Company | Shield assembly apparatus for an x-ray device |
US7428292B2 (en) | 2006-11-24 | 2008-09-23 | General Electric Company | Method and system for CT imaging using multi-spot emission sources |
CN101553896B (zh) | 2006-12-04 | 2012-06-06 | 株式会社东芝 | 旋转阳极型x射线管 |
US20100074392A1 (en) | 2006-12-04 | 2010-03-25 | Koninklijke Philips Electronics N.V. | X-ray tube with multiple electron sources and common electron deflection unit |
US7508916B2 (en) | 2006-12-08 | 2009-03-24 | General Electric Company | Convectively cooled x-ray tube target and method of making same |
JP4899858B2 (ja) | 2006-12-27 | 2012-03-21 | 株式会社島津製作所 | 外囲器回転型x線管装置 |
CN201034948Y (zh) | 2006-12-28 | 2008-03-12 | 华南理工大学 | 基于图像理解的轮毂铸造缺陷自动检测装置 |
US8552722B2 (en) | 2007-01-15 | 2013-10-08 | Rapiscan Systems, Inc. | Detector systems |
US7539283B2 (en) | 2007-01-17 | 2009-05-26 | Ge Homeland Protection, Inc. | Combined computed tomography and nuclear resonance fluorescence cargo inspection system and method |
US7720194B2 (en) | 2007-02-16 | 2010-05-18 | L-3 Communications Security and Detection Systems Inc. | High throughput baggage inspection system |
US20100277312A1 (en) | 2007-02-22 | 2010-11-04 | Peter Michael Edic | In-line high-throughput contraband detection system |
JP2008212840A (ja) | 2007-03-05 | 2008-09-18 | Hitachi Constr Mach Co Ltd | 自走式処理機械 |
US7769132B1 (en) | 2007-03-13 | 2010-08-03 | L-3 Communications Security And Detection Systems, Inc. | Material analysis based on imaging effective atomic numbers |
GB0706088D0 (en) | 2007-03-29 | 2007-05-09 | Durham Scient Crystals Ltd | X-ray imaging of materials |
JP2008268035A (ja) | 2007-04-20 | 2008-11-06 | Ishida Co Ltd | 異物検査装置 |
GB0716045D0 (en) | 2007-08-17 | 2007-09-26 | Durham Scient Crystals Ltd | Method and apparatus for inspection of materials |
US8090075B2 (en) | 2007-06-06 | 2012-01-03 | Comet Holding Ag | X-ray tube with an anode insulation element for liquid cooling and a receptacle for a high-voltage plug |
EP2165188A4 (en) | 2007-06-21 | 2014-01-22 | Rapiscan Systems Inc | SYSTEMS AND METHODS FOR IMPROVING DIRECT SCREENING OF PEOPLE |
US7869566B2 (en) | 2007-06-29 | 2011-01-11 | Morpho Detection, Inc. | Integrated multi-sensor systems for and methods of explosives detection |
CN103948395A (zh) | 2007-07-19 | 2014-07-30 | 北卡罗来纳大学查珀尔希尔分校 | 固定 x 射线数字化断层合成或断层摄影***和相关方法 |
CA2694647A1 (en) | 2007-08-02 | 2009-02-05 | L-3 Communications Security And Detection Systems, Inc. | Reducing latency in a detection system |
US9256713B2 (en) | 2007-08-30 | 2016-02-09 | Exelis Inc. | Library generation for detection and identification of shielded radioisotopes |
DE102007046278A1 (de) | 2007-09-27 | 2009-04-09 | Siemens Ag | Röntgenröhre mit Transmissionsanode |
US7593509B2 (en) | 2007-09-27 | 2009-09-22 | Varian Medical Systems, Inc. | Analytical x-ray tube for close coupled sample analysis |
JP4853444B2 (ja) | 2007-09-28 | 2012-01-11 | 株式会社デンソー | 移動物体検出装置 |
JP5306628B2 (ja) | 2007-10-16 | 2013-10-02 | 富士フイルム株式会社 | 撮影方法及び装置 |
US8031829B2 (en) | 2007-10-26 | 2011-10-04 | General Electric Company | Method for analytic reconstruction of cone-beam projection data for multi-source inverse geometry CT systems |
US7636638B2 (en) | 2007-11-27 | 2009-12-22 | Canberra Industries, Inc. | Hybrid radiation detection system |
US7885372B2 (en) | 2007-12-07 | 2011-02-08 | Morpho Detection, Inc. | System and method for energy sensitive computed tomography |
US9005420B2 (en) | 2007-12-20 | 2015-04-14 | Integran Technologies Inc. | Variable property electrodepositing of metallic structures |
US8391581B2 (en) | 2007-12-27 | 2013-03-05 | Omron Corporation | X-ray inspecting apparatus and X-ray inspecting method |
US20090168958A1 (en) | 2008-01-02 | 2009-07-02 | Cristina Francesca Cozzini | Apparatus and method for identifying components in a container |
US7809114B2 (en) | 2008-01-21 | 2010-10-05 | General Electric Company | Field emitter based electron source for multiple spot X-ray |
EP2243021B1 (en) | 2008-02-15 | 2018-01-24 | Mayo Foundation For Medical Education And Research | System and method for quantitative imaging of chemical composition to decompose multiple materials |
US7924978B2 (en) | 2008-02-22 | 2011-04-12 | Morpho Detection Inc. | System and method for XRD-based threat detection |
CN101303317B (zh) | 2008-03-05 | 2010-11-17 | 中国科学院合肥物质科学研究院 | ***物检测***装置及其检测方法 |
JP4268996B2 (ja) | 2008-03-31 | 2009-05-27 | 株式会社モリタ製作所 | 局所x線ct撮影装置及びその画像表示方法 |
GB0807473D0 (en) | 2008-04-24 | 2008-12-03 | Durham Scient Crystals Ltd | Method and Apparatus for Inspection of Materials |
DE102008038569A1 (de) | 2008-08-20 | 2010-02-25 | Siemens Aktiengesellschaft | Röntgenröhre |
US8705822B2 (en) | 2008-09-03 | 2014-04-22 | Mayo Foundation For Medical Education And Research | Method for creating images indicating material decomposition in dual energy, dual source helical computed tomography |
GB0816823D0 (en) | 2008-09-13 | 2008-10-22 | Cxr Ltd | X-ray tubes |
JP3147024U (ja) | 2008-09-30 | 2008-12-11 | 株式会社島津製作所 | X線ct装置 |
US7844032B2 (en) | 2008-10-16 | 2010-11-30 | General Electric Company | Apparatus for providing collimation in a multispot X-ray source and method of making same |
US7835495B2 (en) | 2008-10-31 | 2010-11-16 | Morpho Detection, Inc. | System and method for X-ray diffraction imaging |
WO2010061325A1 (en) | 2008-11-25 | 2010-06-03 | Philips Intellectual Property & Standards Gmbh | X-ray tube with target temperature sensor |
US7970096B2 (en) | 2009-01-07 | 2011-06-28 | Analogic Corporation | Method of and system for low cost implementation of dual energy CT imaging |
GB0901338D0 (en) | 2009-01-28 | 2009-03-11 | Cxr Ltd | X-Ray tube electron sources |
US8111803B2 (en) | 2009-04-29 | 2012-02-07 | General Electric Company | Method for energy sensitive computed tomography using checkerboard filtering |
WO2010129058A2 (en) | 2009-05-08 | 2010-11-11 | L-3 Communications Security and Detection Systems Inc. | Dual energy imaging system |
GB2501023B (en) | 2009-05-26 | 2014-02-12 | Rapiscan Systems Inc | X-ray tomographic inspection systems for the identification of specific target items |
US20170161922A1 (en) | 2009-05-26 | 2017-06-08 | Rapiscan Systems, Inc. | Imaging, Data Acquisition, Data Transmission, and Data Distribution Methods and Systems for High Data Rate Tomographic X-Ray Scanners |
EP3686901A1 (en) | 2009-05-26 | 2020-07-29 | Rapiscan Systems, Inc. | X-ray tomographic inspection method |
JP5766184B2 (ja) | 2009-06-03 | 2015-08-19 | ラピスカン システムズ、インコーポレイテッド | X線管の中で使用されるグラファイト後方散乱電子シールド |
EP2443441B8 (en) | 2009-06-15 | 2017-11-22 | Optosecurity Inc. | Method and apparatus for assessing the threat status of luggage |
JP5325851B2 (ja) | 2009-08-28 | 2013-10-23 | 株式会社丸彰 | 単一ゼンマイ機構による複数アクション連係作動玩具 |
CN102804326B (zh) | 2010-01-19 | 2016-01-20 | 拉皮斯坎***股份有限公司 | 多视图货物扫描器 |
US9442213B2 (en) | 2010-01-19 | 2016-09-13 | Rapiscan Systems, Inc. | Method of electron beam transport in an X-ray scanner |
US8311313B1 (en) | 2010-02-08 | 2012-11-13 | Surescan Corporation | Imaging inspection apparatus incorporating a device for solving cubic polynomials |
US8509380B2 (en) | 2010-03-19 | 2013-08-13 | The Board Of Trustees Of The Leland Stanford Junior University | Inverse geometry volume computed tomography systems |
US8160200B2 (en) | 2010-03-30 | 2012-04-17 | General Electric Company | Method and system for image data acquisition |
EP2377467A1 (en) | 2010-04-08 | 2011-10-19 | CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement | System and method for determining the composition of an object |
US8039812B1 (en) | 2010-04-13 | 2011-10-18 | Surescan Corporation | Test equipment for verification of crystal linearity at high-flux levels |
US8908831B2 (en) | 2011-02-08 | 2014-12-09 | Rapiscan Systems, Inc. | Covert surveillance using multi-modality sensing |
WO2012115629A1 (en) | 2011-02-22 | 2012-08-30 | Rapiscan Systems, Inc. | X-ray inspection system and method |
DE112012004856B4 (de) | 2011-11-22 | 2022-01-05 | The University Of North Carolina At Chapel Hill | Kontrollsystem und Verfahren zur schnellen, platzsparenden Röntgentomografiekontrolle |
US9530528B2 (en) | 2011-12-16 | 2016-12-27 | Varian Medical Systems, Inc. | X-ray tube aperture having expansion joints |
US9514911B2 (en) | 2012-02-01 | 2016-12-06 | Varian Medical Systems, Inc. | X-ray tube aperture body with shielded vacuum wall |
US8829446B2 (en) | 2012-04-05 | 2014-09-09 | Analogic Corporation | Tile for detector array of imaging modality having selectively removable/replaceable tile sub-assemblies |
CN104486997B (zh) | 2012-06-05 | 2017-07-25 | 拉皮斯坎***股份有限公司 | X射线扫描***的射线源激发模式的最佳化 |
JP6238584B2 (ja) | 2012-07-17 | 2017-11-29 | 東芝メディカルシステムズ株式会社 | X線ct装置およびx線ct装置の制御方法 |
CN103901057B (zh) | 2012-12-31 | 2019-04-30 | 同方威视技术股份有限公司 | 使用了分布式x射线源的物品检查装置 |
WO2014121097A1 (en) | 2013-01-31 | 2014-08-07 | Rapiscan Systems, Inc. | Portable security inspection system |
US9778391B2 (en) | 2013-03-15 | 2017-10-03 | Varex Imaging Corporation | Systems and methods for multi-view imaging and tomography |
US9093187B1 (en) | 2013-11-19 | 2015-07-28 | Surescan Corporation | Fixed gantry CT system having a non-uniform slit |
JP6296607B2 (ja) | 2014-06-12 | 2018-03-20 | 矢崎総業株式会社 | 車両用表示装置 |
US20190178821A1 (en) | 2017-12-11 | 2019-06-13 | Rapiscan Systems, Inc. | X-Ray Tomography Inspection Systems and Methods |
-
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