CN1003542B - X-射线扫描仪 - Google Patents

X-射线扫描仪 Download PDF

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CN1003542B
CN1003542B CN85107859.1A CN85107859A CN1003542B CN 1003542 B CN1003542 B CN 1003542B CN 85107859 A CN85107859 A CN 85107859A CN 1003542 B CN1003542 B CN 1003542B
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格哈特·唐格斯
科尼利厄斯·科克
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G1/00X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08Electrical details
    • H05G1/60Circuit arrangements for obtaining a series of X-ray photographs or for X-ray cinematography
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
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Abstract

一具有扇形X射线束和检测器行的X射线扫描仪。电子组件(6至16)拥有一识别错误信号的比较电路,并通过该电路控制图象存储器,当出现错误的检测信号时,该电路便使前一个存储行的信息被接受到归属于检测器(4a,4b等)的存储行中。此外,还有一修正元件,用来在100%的幅射强度时形成一个基准信号,即从多个测量信号中形成一平均值。最后,在对属于100%幅射强度的幅值进行比较测试时。拥有降低有效信号的幅值的手段。

Description

X-射线扫描仪
本发明涉及一种X-射线扫描仪,这种扫描仪在待检验物品的输送设备的一侧,有一台可以发射出扇形X-射线束的X-射线辐射器,在另一侧有一排单个的检测器;它还拥有收集和处理检测信号的电子组件以及一台附加连接上的目视指示器。电子组件有一个图象存储器,后者为每个单个的检测器都各配有一个存储行。
例如,这种类型的X-射线扫描仪可以用来检查行李包裹,目前人们已经熟悉的X-射线扫描仪,其每个检测器是由一个闪烁器组成,用来将X-射线转变成可见光,可见光再借助于一个光电二极管转变成电流。为了处理平行出现的测量值,通过电子开关(模拟乘法器)将它们转变成系列顺序的模拟测量值,使其数字化,对***的误差补偿后,再将这些测量值逐次写入一个数字图象存储器,这样,通过一个数-模转换器在一个视频监视器上显示存储器的内容时,便可产生一个连续的图象。当图象水平方向移动时,数据便纵列式地写入图象存储器中。然后,每个检测器都产生一行视频图。
这种情况下,会出现下列类型的***的误差:
-光电二极管的暗电流以及附加连接上的乘法器和放大器的补偿电流所产生的总的补偿误差,对于每个检测器通道并不一样;
-由于检测器的不均匀和X-射线源的反射特性的缘故,会导致出现振幅误差。
这些***的误差可以进行补偿,其方法是,在切断X-射线源的情况下测量所有通道(i)的补偿值Oi(i=1…m),并将其存储在一个数字存储器(offset-RAM-补偿随机存取存储器)中。从总信号Si中减去所测出的补偿值,便得到有效信号Ni。振幅误差在一个测量***中进行收集。当100%的辐射强度时,便在该测量***中测量信号幅值,对其补偿修正后作为基准值Ri而存入信号随机存取存储器(Signal-RAM)中。用基准值Ri除以信号值Ni,便可获得一个100%标准化了的有效信号NNi
NNi=Ni/Ri
i=1,2…m
0<Ri≤1
然而,与补偿测试相反,除了可以忽略不计的电交流声外,对100%强度时各种不同的基准值Ri的收集,会因为X-射线器的量子噪声而出现误差,特别是在小的测量量值时,这种误差会更大。当存储基准值时,与信号重叠的量子噪声会被“冻结”。在紧接着的除法过程中,这种“被冻结了的噪声”以1/Ri的比例放大。被冻结了的噪声形成了一个有线条的图象背景。
补偿值和信号值都有其极限性,超出了这种极限值,在运算器内进行处理,就有可能出现误差。从而,当补偿值和信号值超过它们的极限值时,在图象再现过程中就会出现误差。
在有大量的检测器通道的情况下(例如500个),个别通道出现故障是完全可能的。
本发明的任务在于,提供一种本文开头所指示那种类型的X-射线扫描仪,这种X-射线扫描仪比现有的技术水平更进一步,在对信号进行处理时,可以减少误差。
本发明的这一任务是通过下面的途径加以解决的:电子组件有一个比较电路,用来识别含有误差的信号,并通过该比较电路控制图象存储器;当出现含有误差的检测信号时,该比较电路便使前一个存储行的信息被接受到归属于有误差的检测器的那个存储行中。根据本发明的X-射线扫描仪,对于所出现的补偿误差及信号误差,可借助于比较电路进行检测。只要出现一个误差,就已足以阻止业已标准化了的信号测量值被接受到图象存储器中,而代之以接受前一个不含误差的值。在图象显示中,这就意味着,在出现故障的通道的位置上,重复出现前一行的值。不过,这种取代值的可见度是非常小的。
本发明的另一个组成部分是,电子组件拥有一个修正元件,用来在100%的辐射强度时形成一个基准信号,也就是从许多个这样的出了信号中形成一个平均值。基准信号Ri的测量周期,在这种情况下并不是只进行一次,而是要进行n次。每个通道的测量值Ri在一个累加器中相加几次后,再用n相除:
Figure 85107859_IMG1
根据有名的统计规律,这种测试的精确度可以改善因子 n
对于在一定的时间间隔内需要重复测试的Ri,可供使用的时间要比用来测试有效信号的时间长得多;有效信号的测量周期的延续时间是限定的。从而,测试的次数n几乎可以接受任意的值。
为前面已提及的,只有基准值的测试才能实行多次,即经过一段较长的时间才完成测试,而这段时间又相应地被看作是一个测试周期。
这样,量子噪声幅值便与为生成图象而进行过评价的有效信号相重叠。这种量子噪声幅值,当同在收集基准信号时只有在一个测量周期中可能出现的那样。
根据目前的技术水平,在按照模-数转换原理进行工作的扫描中对测量值所进行的存储和处理,都是数字式进行的。由于量子化阶段的次数,即由于分解成二进制位的次数,可以进行处理的信号幅值范围是固定的。如果借助于已存储的基准值使有效信号的标志化程度达到100%,那么,根据对在有效信号中重叠的量子噪声的统计,全部测量值的一半超过了100%的信号幅值。然而,信号差只能被收集到100%的幅值,所以,便丢失了视频图以灰色差形式出现的信息。根据本发明的构思,在对属于100%辐射强度的幅值进行比较测试时,拥有降低有效信号的幅值的装置。据此,有效信号的幅值,在基准信号的测量周期完成之后,至少可以减少噪声电压最大可能值的一半,这样,信号和噪声源可以一起出现在信号范围内。
下面,根据图中所示的实例,对本发明作进一步的说明。
图中示出一台X-射线辐射器(1),它以一扇形X-射线束(3)透射输送设备(2)上的物品(图中未示出)。X-射线束(3)的扇形面与输送设备(2)相交,后者与符号的平面相垂直地行驶。由物品中透出的射线,由一行(4)单个的检测器(4a,4b等)所收集,这时检测器的输出信号经过一电子组件而输送给目视指示器(5)。电子组件包括:一台模-数转换器(6),一个减法器(7),一个除法器(8),一个接收寄存器(9),一个图象存储器(10),两个电子开关(11,12),一个补偿随机存取存储器(13),一个信号随机存取存储器(14),一个累加器(15)和一个比较电路(16)。
组件(7,11和13)如同本文开头所述那样,对偏差值进行补偿。这时,当切断X-射线源时,补偿随机存取存储器(13)便用来存放所有检测通道的补偿值;在此存放的补偿值在减法器中从总信号Si中减去。
组件(8,12,14和15)所描述的方式用来产生基准信号Ri。这时,在累加器(15)中对基准值Ri进行相加,然后用其相加的次数n除,这样,在累加器(15)的输出端便出现值Ri。将该值存储在信号随机存取存储器(14)中,然后在除法器(8)中用相应的信号值Ni相除,以便形成经过标准化了的有效信号NNi
比较电路(16)对所出现的补偿误差和信号误差进行检测。补偿信号和基准信号的误差警报,各以误差二进制位的形式分别存放在随机存取存储器(13和14)中。当收集有效信号时,便读随机存取存储器(13和14)。逻辑连接两个误差二进制位,使得只要出现一个误差,就能以上述方式,足以阻止标准化了的信号测量值被接受到图象存储器(10)中,而代之以接受前一个不含误差的值。
有效信号的幅值的降低,是以本文开头所述的方式,按照基准信号所完成的测试周期,借助于除法器(8)而实现的。

Claims (3)

1、X-射线扫描仪在待检验物品的输送设备(2)的一侧,有一台可以发射出扇形X-射线束(3)的X-射线辐射器(1),在另一侧有一排单个的检测器(4),它还拥有收集和处理检波信号的电子组件(6至16)以及一台附加连接上的目视指示器(5),电子组件(6至16)有一个图象存储器(10),后者为每个单个的检测器(4a,4b等)各配有一个存储行,其特征是:电子组件(6至16)有一个用来识别误差信号的比较电路(16),并通过该比较电路(16)控制图象存储器(10),当出现一个错误的检测信号时,该比较电路(16)便使前一个存储行的信息被接受到归属于检测器(4a,4b等)的存储行中。
2、按照权利要求1的X-射线扫描仪,其特征在于:在对属于100%辐射强度的幅值进行比较测试时,拥有降低有效信号的幅值的装置(8)。
3、按照权利要求1或2的X-射线扫描仪,其特征在于:电子组件(6至16)拥有一个修正元件(15),用来在100%的辐射强度时形成一个基准信号,也就是从许多个这样的测量信号中形成一个平均值。
CN85107859.1A 1985-03-04 1985-10-23 X-射线扫描仪 Expired CN1003542B (zh)

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CN85107859A (zh) 1986-12-03
US4788704A (en) 1988-11-29
EP0194477A1 (de) 1986-09-17
EP0194477B1 (de) 1989-01-11
DE3661783D1 (en) 1989-02-16

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