GB0525593D0 - X-ray tomography inspection systems - Google Patents

X-ray tomography inspection systems

Info

Publication number
GB0525593D0
GB0525593D0 GBGB0525593.0A GB0525593A GB0525593D0 GB 0525593 D0 GB0525593 D0 GB 0525593D0 GB 0525593 A GB0525593 A GB 0525593A GB 0525593 D0 GB0525593 D0 GB 0525593D0
Authority
GB
United Kingdom
Prior art keywords
inspection systems
ray tomography
tomography inspection
ray
systems
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB0525593.0A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CXR Ltd
Original Assignee
CXR Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CXR Ltd filed Critical CXR Ltd
Priority to GBGB0525593.0A priority Critical patent/GB0525593D0/en
Publication of GB0525593D0 publication Critical patent/GB0525593D0/en
Priority to CN201110114529.2A priority patent/CN102269826B/en
Priority to JP2008545089A priority patent/JP5537031B2/en
Priority to ES08016552T priority patent/ES2769530T3/en
Priority to ES09177217.8T priority patent/ES2645587T3/en
Priority to US12/097,422 priority patent/US7876879B2/en
Priority to PL09177217T priority patent/PL2151681T3/en
Priority to EP08016552.5A priority patent/EP2017605B1/en
Priority to GB0812867A priority patent/GB2448260B/en
Priority to PL08016552T priority patent/PL2017605T3/en
Priority to CN201110114520.1A priority patent/CN102289000B/en
Priority to EP09177217.8A priority patent/EP2151681B1/en
Priority to GB1017187A priority patent/GB2471421B/en
Priority to GB1017188A priority patent/GB2471422B/en
Priority to EP06820525A priority patent/EP1969356A1/en
Priority to PCT/GB2006/004684 priority patent/WO2007068933A1/en
Priority to CN2006800514884A priority patent/CN101400992B/en
Priority to US12/142,005 priority patent/US8135110B2/en
Priority to US12/485,900 priority patent/US7949101B2/en
Priority to JP2009274521A priority patent/JP5357724B2/en
Priority to JP2009274526A priority patent/JP2010048829A/en
Priority to US12/712,476 priority patent/US8243876B2/en
Priority to US12/788,083 priority patent/US8451974B2/en
Priority to US12/787,930 priority patent/US8223919B2/en
Priority to US12/787,878 priority patent/US8804899B2/en
Priority to US12/792,931 priority patent/US8331535B2/en
Priority to US12/835,682 priority patent/US8204173B2/en
Priority to US13/032,593 priority patent/US9113839B2/en
Priority to US13/086,708 priority patent/US8625735B2/en
Priority to US13/346,705 priority patent/US8559592B2/en
Priority to US13/370,941 priority patent/US8958526B2/en
Priority to US13/532,862 priority patent/US10591424B2/en
Priority to US13/548,873 priority patent/US9020095B2/en
Priority to US13/870,407 priority patent/US8885794B2/en
Priority to US14/094,603 priority patent/US9048061B2/en
Priority to US14/312,540 priority patent/US9183647B2/en
Priority to US14/508,464 priority patent/US9158030B2/en
Priority to US14/588,732 priority patent/US10295483B2/en
Priority to US14/641,777 priority patent/US9618648B2/en
Priority to US14/688,539 priority patent/US9638646B2/en
Priority to US14/798,195 priority patent/US9442082B2/en
Priority to US14/848,176 priority patent/US9606259B2/en
Priority to US14/848,590 priority patent/US9747705B2/en
Priority to US14/930,293 priority patent/US9576766B2/en
Priority to US15/437,033 priority patent/US20180038988A1/en
Priority to US15/439,837 priority patent/US10175381B2/en
Priority to US16/192,112 priority patent/US10901112B2/en
Priority to US16/376,918 priority patent/US20200103357A1/en
Priority to US16/745,251 priority patent/US20200200690A1/en
Priority to US16/997,309 priority patent/US10976271B2/en
Priority to US16/997,285 priority patent/US20200378906A1/en
Priority to US17/123,452 priority patent/US11796711B2/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/246—Measuring radiation intensity with semiconductor detectors utilizing latent read-out, e.g. charge stored and read-out later
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of nuclear radiation, e.g. of natural or induced radioactivity
    • G01V5/20—
    • G01V5/22—
    • G01V5/222—
    • G01V5/226—
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/12—Edge-based segmentation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/143—Segmentation; Edge detection involving probabilistic approaches, e.g. Markov random field [MRF] modelling
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/187—Segmentation; Edge detection involving region growing; involving region merging; involving connected component labelling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3304—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts helicoidal scan
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3307—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts source and detector fixed; object moves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3308—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object translates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/421—Imaging digitised image, analysed in real time (recognition algorithms)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/501—Detectors array
    • G01N2223/5015—Detectors array linear array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/639—Specific applications or type of materials material in a container
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
GBGB0525593.0A 2003-04-25 2005-12-16 X-ray tomography inspection systems Ceased GB0525593D0 (en)

Priority Applications (52)

Application Number Priority Date Filing Date Title
GBGB0525593.0A GB0525593D0 (en) 2005-12-16 2005-12-16 X-ray tomography inspection systems
CN201110114529.2A CN102269826B (en) 2005-12-16 2006-12-15 X-ray tomography inspection system
JP2008545089A JP5537031B2 (en) 2005-12-16 2006-12-15 X-ray tomography inspection system
ES08016552T ES2769530T3 (en) 2005-12-16 2006-12-15 X-ray tomography inspection systems
ES09177217.8T ES2645587T3 (en) 2005-12-16 2006-12-15 X-ray tomography inspection systems
US12/097,422 US7876879B2 (en) 2005-12-16 2006-12-15 X-ray tomography inspection systems
PL09177217T PL2151681T3 (en) 2005-12-16 2006-12-15 X-ray tomography inspection systems
EP08016552.5A EP2017605B1 (en) 2005-12-16 2006-12-15 X-ray tomography inspection systems
GB0812867A GB2448260B (en) 2005-12-16 2006-12-15 X-ray inspection systems
PL08016552T PL2017605T3 (en) 2005-12-16 2006-12-15 X-ray tomography inspection systems
CN201110114520.1A CN102289000B (en) 2005-12-16 2006-12-15 X-ray tomography inspection system
EP09177217.8A EP2151681B1 (en) 2005-12-16 2006-12-15 X-ray tomography inspection systems
GB1017187A GB2471421B (en) 2005-12-16 2006-12-15 X-ray inspection systems
GB1017188A GB2471422B (en) 2005-12-16 2006-12-15 X-ray inspection systems
EP06820525A EP1969356A1 (en) 2005-12-16 2006-12-15 X-ray tomography inspection systems
PCT/GB2006/004684 WO2007068933A1 (en) 2005-12-16 2006-12-15 X-ray tomography inspection systems
CN2006800514884A CN101400992B (en) 2005-12-16 2006-12-15 X-ray tomography inspection systems
US12/142,005 US8135110B2 (en) 2005-12-16 2008-06-19 X-ray tomography inspection systems
US12/485,900 US7949101B2 (en) 2005-12-16 2009-06-16 X-ray scanners and X-ray sources therefor
JP2009274521A JP5357724B2 (en) 2005-12-16 2009-12-02 X-ray tomography inspection system
JP2009274526A JP2010048829A (en) 2005-12-16 2009-12-02 X-ray tomography inspection system
US12/712,476 US8243876B2 (en) 2003-04-25 2010-02-25 X-ray scanners
US12/788,083 US8451974B2 (en) 2003-04-25 2010-05-26 X-ray tomographic inspection system for the identification of specific target items
US12/787,930 US8223919B2 (en) 2003-04-25 2010-05-26 X-ray tomographic inspection systems for the identification of specific target items
US12/787,878 US8804899B2 (en) 2003-04-25 2010-05-26 Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners
US12/792,931 US8331535B2 (en) 2003-04-25 2010-06-03 Graphite backscattered electron shield for use in an X-ray tube
US12/835,682 US8204173B2 (en) 2003-04-25 2010-07-13 System and method for image reconstruction by using multi-sheet surface rebinning
US13/032,593 US9113839B2 (en) 2003-04-25 2011-02-22 X-ray inspection system and method
US13/086,708 US8625735B2 (en) 2005-12-16 2011-04-14 X-ray scanners and X-ray sources therefor
US13/346,705 US8559592B2 (en) 2003-04-25 2012-01-09 System and method for image reconstruction by using multi-sheet surface rebinning
US13/370,941 US8958526B2 (en) 2005-12-16 2012-02-10 Data collection, processing and storage systems for X-ray tomographic images
US13/532,862 US10591424B2 (en) 2003-04-25 2012-06-26 X-ray tomographic inspection systems for the identification of specific target items
US13/548,873 US9020095B2 (en) 2003-04-25 2012-07-13 X-ray scanners
US13/870,407 US8885794B2 (en) 2003-04-25 2013-04-25 X-ray tomographic inspection system for the identification of specific target items
US14/094,603 US9048061B2 (en) 2005-12-16 2013-12-02 X-ray scanners and X-ray sources therefor
US14/312,540 US9183647B2 (en) 2003-04-25 2014-06-23 Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners
US14/508,464 US9158030B2 (en) 2003-04-25 2014-10-07 X-ray tomographic inspection system for the identification of specific target items
US14/588,732 US10295483B2 (en) 2005-12-16 2015-01-02 Data collection, processing and storage systems for X-ray tomographic images
US14/641,777 US9618648B2 (en) 2003-04-25 2015-03-09 X-ray scanners
US14/688,539 US9638646B2 (en) 2005-12-16 2015-04-16 X-ray scanners and X-ray sources therefor
US14/798,195 US9442082B2 (en) 2003-04-25 2015-07-13 X-ray inspection system and method
US14/848,176 US9606259B2 (en) 2003-04-25 2015-09-08 X-ray tomographic inspection system for the identification of specific target items
US14/848,590 US9747705B2 (en) 2003-04-25 2015-09-09 Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners
US14/930,293 US9576766B2 (en) 2003-04-25 2015-11-02 Graphite backscattered electron shield for use in an X-ray tube
US15/437,033 US20180038988A1 (en) 2003-04-25 2017-02-20 X-ray Tomographic Inspection System for the Identification of Specific Target Items
US15/439,837 US10175381B2 (en) 2003-04-25 2017-02-22 X-ray scanners having source points with less than a predefined variation in brightness
US16/192,112 US10901112B2 (en) 2003-04-25 2018-11-15 X-ray scanning system with stationary x-ray sources
US16/376,918 US20200103357A1 (en) 2005-12-16 2019-04-05 Data Collection, Processing and Storage Systems for X-Ray Tomographic Images
US16/745,251 US20200200690A1 (en) 2003-04-25 2020-01-16 X-Ray Tomographic Inspection Systems for the Identification of Specific Target Items
US16/997,309 US10976271B2 (en) 2005-12-16 2020-08-19 Stationary tomographic X-ray imaging systems for automatically sorting objects based on generated tomographic images
US16/997,285 US20200378906A1 (en) 2005-12-16 2020-08-19 Stationary Tomographic X-Ray Imaging Systems for Identifying Threats Based on Generated Tomographic Images
US17/123,452 US11796711B2 (en) 2003-04-25 2020-12-16 Modular CT scanning system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0525593.0A GB0525593D0 (en) 2005-12-16 2005-12-16 X-ray tomography inspection systems

Publications (1)

Publication Number Publication Date
GB0525593D0 true GB0525593D0 (en) 2006-01-25

Family

ID=35736226

Family Applications (4)

Application Number Title Priority Date Filing Date
GBGB0525593.0A Ceased GB0525593D0 (en) 2003-04-25 2005-12-16 X-ray tomography inspection systems
GB0812867A Active GB2448260B (en) 2005-12-16 2006-12-15 X-ray inspection systems
GB1017188A Active GB2471422B (en) 2005-12-16 2006-12-15 X-ray inspection systems
GB1017187A Active GB2471421B (en) 2005-12-16 2006-12-15 X-ray inspection systems

Family Applications After (3)

Application Number Title Priority Date Filing Date
GB0812867A Active GB2448260B (en) 2005-12-16 2006-12-15 X-ray inspection systems
GB1017188A Active GB2471422B (en) 2005-12-16 2006-12-15 X-ray inspection systems
GB1017187A Active GB2471421B (en) 2005-12-16 2006-12-15 X-ray inspection systems

Country Status (8)

Country Link
US (7) US7876879B2 (en)
EP (3) EP2017605B1 (en)
JP (3) JP5537031B2 (en)
CN (2) CN101400992B (en)
ES (2) ES2645587T3 (en)
GB (4) GB0525593D0 (en)
PL (2) PL2017605T3 (en)
WO (1) WO2007068933A1 (en)

Families Citing this family (132)

* Cited by examiner, † Cited by third party
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US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
GB0903198D0 (en) * 2009-02-25 2009-04-08 Cxr Ltd X-Ray scanners
US7949101B2 (en) 2005-12-16 2011-05-24 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US10483077B2 (en) 2003-04-25 2019-11-19 Rapiscan Systems, Inc. X-ray sources having reduced electron scattering
US8451974B2 (en) 2003-04-25 2013-05-28 Rapiscan Systems, Inc. X-ray tomographic inspection system for the identification of specific target items
US8837669B2 (en) 2003-04-25 2014-09-16 Rapiscan Systems, Inc. X-ray scanning system
US9208988B2 (en) 2005-10-25 2015-12-08 Rapiscan Systems, Inc. Graphite backscattered electron shield for use in an X-ray tube
US8243876B2 (en) 2003-04-25 2012-08-14 Rapiscan Systems, Inc. X-ray scanners
US8223919B2 (en) 2003-04-25 2012-07-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
GB0812864D0 (en) 2008-07-15 2008-08-20 Cxr Ltd Coolign anode
US9113839B2 (en) 2003-04-25 2015-08-25 Rapiscon Systems, Inc. X-ray inspection system and method
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