TW366450B - IC function block, semiconductor circuit, method of checking semiconductor circuits and the design method - Google Patents
IC function block, semiconductor circuit, method of checking semiconductor circuits and the design methodInfo
- Publication number
- TW366450B TW366450B TW087104273A TW87104273A TW366450B TW 366450 B TW366450 B TW 366450B TW 087104273 A TW087104273 A TW 087104273A TW 87104273 A TW87104273 A TW 87104273A TW 366450 B TW366450 B TW 366450B
- Authority
- TW
- Taiwan
- Prior art keywords
- checking
- function block
- circuit
- semiconductor
- standby
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 3
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0207—Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
- Logic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6766797 | 1997-03-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW366450B true TW366450B (en) | 1999-08-11 |
Family
ID=13351592
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW087104273A TW366450B (en) | 1997-03-21 | 1998-03-20 | IC function block, semiconductor circuit, method of checking semiconductor circuits and the design method |
Country Status (6)
Country | Link |
---|---|
US (2) | US6708301B1 (zh) |
EP (1) | EP0969289B1 (zh) |
KR (1) | KR100522217B1 (zh) |
DE (1) | DE69836625D1 (zh) |
TW (1) | TW366450B (zh) |
WO (1) | WO1998043101A1 (zh) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3654104B2 (ja) * | 2000-01-12 | 2005-06-02 | 富士通株式会社 | 試験方法、動作条件設定方法及び動作条件設定可能な装置 |
KR100657255B1 (ko) * | 2000-06-16 | 2006-12-14 | 삼성전자주식회사 | 비디오 신호 처리 시스템 |
JP4846128B2 (ja) * | 2001-07-12 | 2011-12-28 | ルネサスエレクトロニクス株式会社 | 半導体装置およびそのテスト方法 |
US7027947B2 (en) * | 2003-04-03 | 2006-04-11 | Fujitsu Limited | Integrated circuit testing method, program, storing medium, and apparatus |
JP4063207B2 (ja) * | 2003-12-04 | 2008-03-19 | 株式会社リコー | 画像処理装置検査システムと方法およびプログラム |
KR100657830B1 (ko) * | 2005-01-24 | 2006-12-14 | 삼성전자주식회사 | 반도체 메모리 장치의 테스트 장치 및 방법 |
US7587645B2 (en) * | 2005-01-24 | 2009-09-08 | Samsung Electronics Co., Ltd. | Input circuit of semiconductor memory device and test system having the same |
US7739571B2 (en) * | 2005-01-27 | 2010-06-15 | Panasonic Corporation | Semiconductor integrated circuit and system LSI having a test expected value programming circuit |
JP2008541059A (ja) * | 2005-05-05 | 2008-11-20 | サイプレス セミコンダクター コーポレーション | パラレルデータ伝送テスト回路及びテスト方法 |
JP5601860B2 (ja) * | 2010-03-26 | 2014-10-08 | ピーエスフォー ルクスコ エスエイアールエル | 半導体装置 |
TWI435208B (zh) * | 2010-12-02 | 2014-04-21 | Realtek Semiconductor Corp | 積體電路與其控制方法 |
DE102012009256B4 (de) * | 2012-05-02 | 2015-08-06 | Norma Germany Gmbh | Profilschelle |
JP6295113B2 (ja) * | 2014-03-17 | 2018-03-14 | ルネサスエレクトロニクス株式会社 | 自己診断装置及び自己診断方法 |
US9835680B2 (en) | 2015-03-16 | 2017-12-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method, device and computer program product for circuit testing |
CN112768444B (zh) * | 2020-12-31 | 2023-06-13 | 成都海光集成电路设计有限公司 | 集成电路芯片、数据分析***及电子设备 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL8502476A (nl) * | 1985-09-11 | 1987-04-01 | Philips Nv | Werkwijze voor het testen van dragers met meerdere digitaal-werkende geintegreerde schakelingen, drager voorzien van zulke schakelingen, geintegreerde schakeling geschikt voor het aanbrengen op zo'n drager, en testinrichting voor het testen van zulke dragers. |
JPH01237472A (ja) * | 1988-03-18 | 1989-09-21 | Fujitsu Ltd | 実装配線試験システム |
US5173906A (en) * | 1990-08-31 | 1992-12-22 | Dreibelbis Jeffrey H | Built-in self test for integrated circuits |
JPH0599993A (ja) * | 1991-04-15 | 1993-04-23 | Internatl Business Mach Corp <Ibm> | 試験可能な走査ストリングを有する論理回路 |
JPH0552910A (ja) * | 1991-08-22 | 1993-03-02 | Fujitsu Ltd | 高速論理ユニツトにおける信号伝播特性試験方式 |
US5258985A (en) * | 1991-11-12 | 1993-11-02 | Motorola, Inc. | Combinational data generator and analyzer for built-in self test |
JPH05158724A (ja) * | 1991-12-05 | 1993-06-25 | Nec Ibaraki Ltd | Lsi間接続診断方式 |
JP3247937B2 (ja) * | 1992-09-24 | 2002-01-21 | 株式会社日立製作所 | 論理集積回路 |
JPH06186302A (ja) * | 1992-12-18 | 1994-07-08 | Nippon Steel Corp | 半導体装置 |
US6055661A (en) * | 1994-06-13 | 2000-04-25 | Luk; Fong | System configuration and methods for on-the-fly testing of integrated circuits |
JPH08248096A (ja) * | 1995-03-13 | 1996-09-27 | Advantest Corp | 回路試験装置 |
US5991907A (en) * | 1996-02-02 | 1999-11-23 | Lucent Technologies Inc. | Method for testing field programmable gate arrays |
US5805608A (en) * | 1996-10-18 | 1998-09-08 | Samsung Electronics Co., Ltd. | Clock generation for testing of integrated circuits |
US5812562A (en) * | 1996-11-15 | 1998-09-22 | Samsung Electronics Company, Ltd. | Low cost emulation scheme implemented via clock control using JTAG controller in a scan environment |
US5790561A (en) * | 1997-01-17 | 1998-08-04 | Rockwell International Corporation | Internal testability system for microprocessor-based integrated circuit |
JP3501200B2 (ja) * | 1997-02-21 | 2004-03-02 | 株式会社アドバンテスト | Ic試験装置 |
-
1998
- 1998-03-20 EP EP98909824A patent/EP0969289B1/en not_active Expired - Lifetime
- 1998-03-20 TW TW087104273A patent/TW366450B/zh not_active IP Right Cessation
- 1998-03-20 KR KR10-1999-7008378A patent/KR100522217B1/ko not_active IP Right Cessation
- 1998-03-20 US US09/381,377 patent/US6708301B1/en not_active Expired - Fee Related
- 1998-03-20 WO PCT/JP1998/001249 patent/WO1998043101A1/ja active IP Right Grant
- 1998-03-20 DE DE69836625T patent/DE69836625D1/de not_active Expired - Lifetime
-
2004
- 2004-01-06 US US10/751,525 patent/US20040139376A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
US20040139376A1 (en) | 2004-07-15 |
DE69836625D1 (de) | 2007-01-25 |
EP0969289A4 (en) | 2004-09-08 |
KR20000076281A (ko) | 2000-12-26 |
WO1998043101A1 (fr) | 1998-10-01 |
KR100522217B1 (ko) | 2005-10-14 |
US6708301B1 (en) | 2004-03-16 |
EP0969289A1 (en) | 2000-01-05 |
EP0969289B1 (en) | 2006-12-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |