TW200743808A - Movable probe unit mechanism and electric inspecting apparatus - Google Patents

Movable probe unit mechanism and electric inspecting apparatus

Info

Publication number
TW200743808A
TW200743808A TW096110864A TW96110864A TW200743808A TW 200743808 A TW200743808 A TW 200743808A TW 096110864 A TW096110864 A TW 096110864A TW 96110864 A TW96110864 A TW 96110864A TW 200743808 A TW200743808 A TW 200743808A
Authority
TW
Taiwan
Prior art keywords
probe unit
unit mechanism
inspecting apparatus
movable probe
movable
Prior art date
Application number
TW096110864A
Other languages
Chinese (zh)
Other versions
TWI390223B (en
Inventor
Tsukasa Kudo
Takeshi Saitoh
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200743808A publication Critical patent/TW200743808A/en
Application granted granted Critical
Publication of TWI390223B publication Critical patent/TWI390223B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Liquid Crystal (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

A movable probe unit mechanism 21 and an electric inspecting apparatus 1 including an adjustment function in accordance with a different dimensional inspection plate are provided. The movable probe unit mechanism 21 adjusts an opening 23A in accordance with different dimensions of various kinds of liquid crystal panel 22 and aligns a position of a probe needle. The movable probe unit mechanism 21 includes a movable frame mechanism 30 for adjusting the opening 23A by moving a frame board in accordance with different dimensions of the various kinds of liquid crystal panel 22, and contact units 31 for feeding and contacting the probe needle by supporting and positioning the probe needle so as to match terminals 22A of liquid crystal panel 22. The electric inspecting apparatus 1 includes the movable probe unit mechanism 21.
TW096110864A 2006-05-29 2007-03-28 Movable probe unit mechanism and electric inspecting apparatus TWI390223B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006148562A JP5137336B2 (en) 2006-05-29 2006-05-29 Movable probe unit mechanism and electrical inspection device

Publications (2)

Publication Number Publication Date
TW200743808A true TW200743808A (en) 2007-12-01
TWI390223B TWI390223B (en) 2013-03-21

Family

ID=38849998

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096110864A TWI390223B (en) 2006-05-29 2007-03-28 Movable probe unit mechanism and electric inspecting apparatus

Country Status (3)

Country Link
JP (1) JP5137336B2 (en)
KR (1) KR20070114628A (en)
TW (1) TWI390223B (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102884567A (en) * 2010-06-17 2013-01-16 夏普株式会社 Lighting inspection device
TWI719681B (en) * 2019-09-24 2021-02-21 思達科技股份有限公司 Probing apparatus and method of operating the same
CN112635341A (en) * 2019-09-24 2021-04-09 东京毅力科创株式会社 Control method of inspection apparatus and inspection apparatus
CN112924770A (en) * 2019-11-21 2021-06-08 科美仪器公司 Inspection device for display panels of different sizes
CN114018544A (en) * 2021-07-13 2022-02-08 重庆康佳光电技术研究院有限公司 Lighting device and lighting method

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5294195B2 (en) * 2008-05-01 2013-09-18 株式会社 東京ウエルズ Work characteristic measuring apparatus and work characteristic measuring method
KR101129708B1 (en) * 2010-05-28 2012-03-28 조영창 Block base inspecting method using the same
KR101191343B1 (en) * 2010-12-30 2012-10-16 주식회사 탑 엔지니어링 Array test apparatus
CN105093012B (en) * 2015-07-22 2018-04-10 京东方科技集团股份有限公司 A kind of lighting detection means and lighting detecting system
JP2017096949A (en) * 2015-11-24 2017-06-01 フォトン・ダイナミクス・インコーポレーテッド System and method for electrical inspection of flat panel display device using cell contact probing pads
CN106200051B (en) * 2016-09-01 2019-11-29 京东方科技集团股份有限公司 Align component and defoaming device
CN108132553B (en) * 2018-02-09 2024-02-23 旭东机械(昆山)有限公司 Self-adaptive adjusting device for size of liquid crystal display panel
CN108363226A (en) * 2018-03-30 2018-08-03 蚌埠国显科技有限公司 Test backlight case after a kind of IPS screens patch
CN108594493A (en) * 2018-06-14 2018-09-28 广东速美达自动化股份有限公司 A kind of automatic aligning testing agency
CN108776400B (en) * 2018-07-17 2024-04-05 武汉精测电子集团股份有限公司 Portable electronic screen test fixture of angularly adjustable
CN109029922B (en) * 2018-08-08 2024-04-16 苏州精濑光电有限公司 Display panel crimping device
JP7182951B2 (en) * 2018-08-27 2022-12-05 株式会社日本マイクロニクス Inspection device and inspection method
CN109116253A (en) * 2018-08-28 2019-01-01 东莞仕群智能科技有限公司 A kind of lithium battery voltage internal resistance automatic detection mechanism
CN109360518B (en) * 2018-09-06 2023-09-29 武汉精测电子集团股份有限公司 Automatic alignment fine adjustment carrier for display panel
KR102115179B1 (en) * 2018-11-20 2020-06-08 주식회사 탑 엔지니어링 Probe device and method for calibrating probe
KR102157070B1 (en) * 2020-03-03 2020-09-17 주식회사 프로이천 Auto-Probe Apparatus
CN114815339B (en) * 2022-05-17 2023-09-26 厦门特仪科技有限公司 Offline lighting device applicable to LCD screens of different sizes

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08110363A (en) * 1994-10-11 1996-04-30 Kobe Steel Ltd Inspection device of flat panel
JPH08254677A (en) * 1994-10-14 1996-10-01 Hitachi Electron Eng Co Ltd Contact device for testing lighting of liquid crystal panel
JP3545655B2 (en) * 1999-09-08 2004-07-21 株式会社日本マイクロニクス Electrical connection device
JP3480925B2 (en) * 2000-09-12 2003-12-22 株式会社双晶テック Display panel or probe frame support frame
JP2002286754A (en) * 2002-01-31 2002-10-03 Micronics Japan Co Ltd Probe unit
JP3864201B2 (en) * 2002-09-30 2006-12-27 日本電子材料株式会社 Probe card
JP2005209895A (en) * 2004-01-23 2005-08-04 Sharp Corp Apparatus for mounting flat type circuit having flexibility
JP4786884B2 (en) * 2004-06-17 2011-10-05 株式会社日本マイクロニクス Alignment method for LCD panel lighting inspection equipment
JP4570930B2 (en) * 2004-10-22 2010-10-27 株式会社日本マイクロニクス Electrical connection device used in panel inspection equipment
JP2006133099A (en) * 2004-11-08 2006-05-25 Micronics Japan Co Ltd Inspection device of display panel

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102884567A (en) * 2010-06-17 2013-01-16 夏普株式会社 Lighting inspection device
CN102884567B (en) * 2010-06-17 2015-01-28 夏普株式会社 Lighting inspection device
TWI719681B (en) * 2019-09-24 2021-02-21 思達科技股份有限公司 Probing apparatus and method of operating the same
CN112635341A (en) * 2019-09-24 2021-04-09 东京毅力科创株式会社 Control method of inspection apparatus and inspection apparatus
US11307246B2 (en) 2019-09-24 2022-04-19 Star Technologies, Inc. Probing apparatus and method of operating the same
CN112924770A (en) * 2019-11-21 2021-06-08 科美仪器公司 Inspection device for display panels of different sizes
CN114018544A (en) * 2021-07-13 2022-02-08 重庆康佳光电技术研究院有限公司 Lighting device and lighting method
CN114018544B (en) * 2021-07-13 2023-12-19 重庆康佳光电科技有限公司 Lighting device and lighting method

Also Published As

Publication number Publication date
JP2007316022A (en) 2007-12-06
KR20070114628A (en) 2007-12-04
JP5137336B2 (en) 2013-02-06
TWI390223B (en) 2013-03-21

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