TW200714952A - Inspection apparatus - Google Patents

Inspection apparatus

Info

Publication number
TW200714952A
TW200714952A TW095128718A TW95128718A TW200714952A TW 200714952 A TW200714952 A TW 200714952A TW 095128718 A TW095128718 A TW 095128718A TW 95128718 A TW95128718 A TW 95128718A TW 200714952 A TW200714952 A TW 200714952A
Authority
TW
Taiwan
Prior art keywords
liquid crystal
crystal panel
prober
inspection apparatus
casing
Prior art date
Application number
TW095128718A
Other languages
Chinese (zh)
Inventor
Yutaka Kosaka
Yoshiyuki Andoh
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200714952A publication Critical patent/TW200714952A/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G13/00—Roller-ways
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
    • B65G49/061—Lifting, gripping, or carrying means, for one or more sheets forming independent means of transport, e.g. suction cups, transport frames
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2201/00—Indexing codes relating to handling devices, e.g. conveyors, characterised by the type of product or load being conveyed or handled
    • B65G2201/02—Articles
    • B65G2201/0214—Articles of special size, shape or weigh
    • B65G2201/022—Flat

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

An inspection apparatus 1 is provided so as to save space and improve working efficiency. The inspection apparatus 1 is involved in the middle of a processing step of a liquid crystal panel 7. The inspection apparatus 1 includes a prober 4, disposed on a conveyor line in the processing step, for detecting the liquid crystal panel 7; a carry-in mechanism 3 for carrying, in the prober 4, the liquid crystal panel 7 guided to the prober 4 on the conveyor line; and a carry-out mechanism 5 for carrying out, on the conveyor line of a post-process side, the liquid crystal panel 7 already inspected by the prober 4. The prober 4 includes a casing 41; a work table 42, stored in the casing 41, on which the liquid crystal panel 7 is placed; a backlight 43 for illuminating the liquid crystal panel 7 placed on the work table 42; a probe unit 45 for probing the liquid crystal panel 7; and a screen 46, provided on the casing 41 to be recognized from the outside, for displaying the image of the liquid crystal panel 7.
TW095128718A 2005-10-12 2006-08-04 Inspection apparatus TW200714952A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005298074A JP2007107973A (en) 2005-10-12 2005-10-12 Inspection device

Publications (1)

Publication Number Publication Date
TW200714952A true TW200714952A (en) 2007-04-16

Family

ID=38033949

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095128718A TW200714952A (en) 2005-10-12 2006-08-04 Inspection apparatus

Country Status (3)

Country Link
JP (1) JP2007107973A (en)
KR (1) KR100780312B1 (en)
TW (1) TW200714952A (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5001681B2 (en) 2007-03-12 2012-08-15 株式会社日本マイクロニクス Inline automatic inspection device and inline automatic inspection system
KR101528282B1 (en) * 2009-12-28 2015-06-12 재단법인 포항산업과학연구원 Forging measurement system for automobile parts
JP5525981B2 (en) * 2010-09-28 2014-06-18 株式会社日本マイクロニクス Inspection apparatus and inspection method
US8901947B2 (en) 2012-09-28 2014-12-02 Electro Scientific Industries, Inc. Probe out-of-position sensing for automated test equipment
CN107389307A (en) * 2016-12-31 2017-11-24 深圳眼千里科技有限公司 Screen automatic detecting machine
JP2019052914A (en) * 2017-09-14 2019-04-04 日本電産サンキョー株式会社 Inspection device
CN110231724B (en) * 2019-04-29 2024-05-24 苏州日和科技有限公司 Probe seat jacking device for liquid crystal display lighting test
JP7219172B2 (en) * 2019-06-14 2023-02-07 日本電産サンキョー株式会社 inspection system
CN111693542A (en) * 2020-06-03 2020-09-22 宿州市迎盛科技有限公司 Mobile phone screen detection device and detection method
CN115060732A (en) * 2022-08-18 2022-09-16 深圳市信润富联数字科技有限公司 Visual inspection equipment

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0631029B2 (en) * 1985-06-12 1994-04-27 富士重工業株式会社 Wind glass positioning device
JPH03242566A (en) * 1990-02-20 1991-10-29 Hioki Ee Corp Apparatus for inspecting circuit board
JPH0792190A (en) * 1993-09-21 1995-04-07 Tokusoo Riken:Kk Inspection equipment for printed board
JPH08166779A (en) * 1994-10-11 1996-06-25 Sony Corp Defect inspection apparatus and defect inspection method
JP3442930B2 (en) * 1995-12-28 2003-09-02 シャープ株式会社 How to clean the LCD panel
JP3272642B2 (en) * 1997-08-05 2002-04-08 シャープ株式会社 Inspection equipment for liquid crystal display
JP2001056298A (en) * 1999-08-19 2001-02-27 Ishii Ind Co Ltd Shielding-type article inspection device
TW533319B (en) * 1999-11-19 2003-05-21 De & T Co Ltd LCD testing system
JP3976170B2 (en) * 2001-10-16 2007-09-12 株式会社日立プラントテクノロジー Thin article positioning device
JP2003270608A (en) * 2002-03-15 2003-09-25 Mecc Co Ltd Inspection device for liquid crystal display panel
JP2004226127A (en) * 2003-01-20 2004-08-12 On Denshi Kk Substrate inspection method

Also Published As

Publication number Publication date
KR20070040713A (en) 2007-04-17
KR100780312B1 (en) 2007-11-29
JP2007107973A (en) 2007-04-26

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