TW200615637A - Inspection device for display panel - Google Patents

Inspection device for display panel

Info

Publication number
TW200615637A
TW200615637A TW094136465A TW94136465A TW200615637A TW 200615637 A TW200615637 A TW 200615637A TW 094136465 A TW094136465 A TW 094136465A TW 94136465 A TW94136465 A TW 94136465A TW 200615637 A TW200615637 A TW 200615637A
Authority
TW
Taiwan
Prior art keywords
display panel
inspection device
inspection stage
inspection
base stand
Prior art date
Application number
TW094136465A
Other languages
Chinese (zh)
Other versions
TWI314659B (en
Inventor
Masayuki Anzai
Hideki Ikeuchi
Yutaka Kosaka
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200615637A publication Critical patent/TW200615637A/en
Application granted granted Critical
Publication of TWI314659B publication Critical patent/TWI314659B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/04—Optical benches therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nonlinear Science (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

This invention provides an inspection device for display panel capable of inspecting right and left viewing angle by displacing inspection stage. In the present invention, the inspection device comprises an inspection stage for receiving display panel, a base stand for supporting the inspection stage, a first rotation mechanism for rotating the inspection stage about the first axis line that extends vertically with respect to the base stand, and a second rotation mechanism for rotating the inspection stage about the second axis line that extends horizontally to the base stand.
TW094136465A 2004-11-08 2005-10-19 Inspection device for display panel TWI314659B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004323164A JP2006133099A (en) 2004-11-08 2004-11-08 Inspection device of display panel

Publications (2)

Publication Number Publication Date
TW200615637A true TW200615637A (en) 2006-05-16
TWI314659B TWI314659B (en) 2009-09-11

Family

ID=36726766

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094136465A TWI314659B (en) 2004-11-08 2005-10-19 Inspection device for display panel

Country Status (3)

Country Link
JP (1) JP2006133099A (en)
KR (1) KR100784274B1 (en)
TW (1) TWI314659B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI421467B (en) * 2006-04-07 2014-01-01 Nishiyama Stainless Chemical Co Ltd Apparatus for measuring thickness of glass substrate
TWI456235B (en) * 2008-08-08 2014-10-11 Samsung Display Co Ltd Inspection jig for display panel, inspection system using the same, and method for inspecting the display panel using the same

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5137336B2 (en) * 2006-05-29 2013-02-06 株式会社日本マイクロニクス Movable probe unit mechanism and electrical inspection device
KR100856727B1 (en) * 2006-07-28 2008-09-09 아프로시스템 주식회사 Eye inspection apparatus for flat panel display glass
KR101300098B1 (en) * 2006-08-09 2013-08-30 엘아이지에이디피 주식회사 Device for inspecting substrate and method therefor
KR100854072B1 (en) * 2007-07-02 2008-08-25 주식회사 디네트웍스 Apparatus for inspecting glass
KR101868083B1 (en) * 2011-04-13 2018-06-19 삼성디스플레이 주식회사 Jig unit for inspecting a display panel
KR101146721B1 (en) 2011-12-21 2012-05-17 한동희 Inspecting apparatus of pannel for display
KR102063679B1 (en) * 2013-09-06 2020-01-10 삼성디스플레이 주식회사 Apparatus for tilting panel and apparatus for evaluatiing properties of panel comprising the same.
CN106200048B (en) * 2016-08-30 2023-08-22 京东方科技集团股份有限公司 Jig for detecting display module
KR102608599B1 (en) * 2018-08-16 2023-12-01 삼성디스플레이 주식회사 Device and method for testing pressure sensor and display device using the same
KR20200053216A (en) * 2018-11-08 2020-05-18 주식회사 하이딥 Test apparatus for providing constant pressure to touch input device
KR102184167B1 (en) * 2020-04-29 2020-11-27 가온솔루션 주식회사 Work stage for inspection equipment
CN113851065B (en) * 2020-06-09 2023-08-22 华为技术有限公司 Display panel testing device and display panel testing box
KR102432815B1 (en) * 2020-08-24 2022-08-16 한화시스템 주식회사 Supporting apparatus for subject to be inspected and inspecting method using the same
CN111965189A (en) * 2020-08-26 2020-11-20 东莞市鼎力自动化科技有限公司 Electronic screen AOI check out test set
KR200496368Y1 (en) * 2021-04-02 2023-01-12 주식회사 스마트터치 A assembly device for large electronic board
CN113311602B (en) * 2021-04-15 2022-09-20 昆山精讯电子技术有限公司 Double-station detection equipment compatible with people inspection and automatic inspection
CN113580083B (en) * 2021-07-30 2023-03-14 博众精工科技股份有限公司 Test fixture

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4121662B2 (en) * 1999-03-24 2008-07-23 オリンパス株式会社 Board inspection equipment
JP4582958B2 (en) * 2001-05-30 2010-11-17 株式会社日本マイクロニクス Display substrate inspection equipment
JP3585229B2 (en) * 2002-03-20 2004-11-04 和也 廣瀬 Multi-degree-of-freedom positioning device
JP2004108921A (en) * 2002-09-18 2004-04-08 Micronics Japan Co Ltd Inspection device for substrate to be inspected
JP3745750B2 (en) * 2003-06-27 2006-02-15 東芝テリー株式会社 Display panel inspection apparatus and inspection method
JP2006023139A (en) * 2004-07-07 2006-01-26 Micronics Japan Co Ltd Liquid crystal panel inspection device
JP2007114146A (en) * 2005-10-24 2007-05-10 Micronics Japan Co Ltd Lighting inspection device of display panel

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI421467B (en) * 2006-04-07 2014-01-01 Nishiyama Stainless Chemical Co Ltd Apparatus for measuring thickness of glass substrate
TWI456235B (en) * 2008-08-08 2014-10-11 Samsung Display Co Ltd Inspection jig for display panel, inspection system using the same, and method for inspecting the display panel using the same

Also Published As

Publication number Publication date
TWI314659B (en) 2009-09-11
KR100784274B1 (en) 2007-12-11
KR20060049154A (en) 2006-05-18
JP2006133099A (en) 2006-05-25

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