TW200743808A - Movable probe unit mechanism and electric inspecting apparatus - Google Patents

Movable probe unit mechanism and electric inspecting apparatus

Info

Publication number
TW200743808A
TW200743808A TW096110864A TW96110864A TW200743808A TW 200743808 A TW200743808 A TW 200743808A TW 096110864 A TW096110864 A TW 096110864A TW 96110864 A TW96110864 A TW 96110864A TW 200743808 A TW200743808 A TW 200743808A
Authority
TW
Taiwan
Prior art keywords
probe unit
unit mechanism
inspecting apparatus
movable probe
movable
Prior art date
Application number
TW096110864A
Other languages
English (en)
Other versions
TWI390223B (zh
Inventor
Tsukasa Kudo
Takeshi Saitoh
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200743808A publication Critical patent/TW200743808A/zh
Application granted granted Critical
Publication of TWI390223B publication Critical patent/TWI390223B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
TW096110864A 2006-05-29 2007-03-28 可動式探針組件機構及電氣檢查裝置 TWI390223B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006148562A JP5137336B2 (ja) 2006-05-29 2006-05-29 可動式プローブユニット機構及び電気検査装置

Publications (2)

Publication Number Publication Date
TW200743808A true TW200743808A (en) 2007-12-01
TWI390223B TWI390223B (zh) 2013-03-21

Family

ID=38849998

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096110864A TWI390223B (zh) 2006-05-29 2007-03-28 可動式探針組件機構及電氣檢查裝置

Country Status (3)

Country Link
JP (1) JP5137336B2 (zh)
KR (1) KR20070114628A (zh)
TW (1) TWI390223B (zh)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102884567A (zh) * 2010-06-17 2013-01-16 夏普株式会社 点亮检查装置
TWI719681B (zh) * 2019-09-24 2021-02-21 思達科技股份有限公司 探測裝置及其操作方法
CN112635341A (zh) * 2019-09-24 2021-04-09 东京毅力科创株式会社 检查装置的控制方法和检查装置
CN112924770A (zh) * 2019-11-21 2021-06-08 科美仪器公司 不同尺寸显示板的检查装置
CN114018544A (zh) * 2021-07-13 2022-02-08 重庆康佳光电技术研究院有限公司 点灯装置和点亮方法

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5294195B2 (ja) * 2008-05-01 2013-09-18 株式会社 東京ウエルズ ワーク特性測定装置およびワーク特性測定方法
KR101129708B1 (ko) * 2010-05-28 2012-03-28 조영창 프로브 유닛의 블럭 베이스 검사장치, 및 이를 이용한 프로브 유닛의 블럭 베이스 검사방법
KR101191343B1 (ko) * 2010-12-30 2012-10-16 주식회사 탑 엔지니어링 어레이 테스트 장치
CN105093012B (zh) * 2015-07-22 2018-04-10 京东方科技集团股份有限公司 一种点灯检测装置及点灯检测***
JP2017096949A (ja) 2015-11-24 2017-06-01 フォトン・ダイナミクス・インコーポレーテッド セル接触プロービングパッドを使用して平面パネル型表示装置を電気的に検査するためのシステムおよび方法
CN106200051B (zh) * 2016-09-01 2019-11-29 京东方科技集团股份有限公司 对位组件及脱泡设备
CN108132553B (zh) * 2018-02-09 2024-02-23 旭东机械(昆山)有限公司 一种液晶面板尺寸自适应调整装置
CN108363226A (zh) * 2018-03-30 2018-08-03 蚌埠国显科技有限公司 一种ips屏贴片后测试用背光箱
CN108594493A (zh) * 2018-06-14 2018-09-28 广东速美达自动化股份有限公司 一种自动对位检测机构
CN108776400B (zh) * 2018-07-17 2024-04-05 武汉精测电子集团股份有限公司 一种角度可调的便携式电子屏幕测试治具
CN109029922B (zh) * 2018-08-08 2024-04-16 苏州精濑光电有限公司 一种显示面板压接装置
JP7182951B2 (ja) * 2018-08-27 2022-12-05 株式会社日本マイクロニクス 検査装置及び検査方法
CN109116253A (zh) * 2018-08-28 2019-01-01 东莞仕群智能科技有限公司 一种锂电池电压内阻自动检测机构
CN109360518B (zh) * 2018-09-06 2023-09-29 武汉精测电子集团股份有限公司 一种显示面板自动对位微调载具
KR102115179B1 (ko) * 2018-11-20 2020-06-08 주식회사 탑 엔지니어링 프로브장치 및 프로브 자세 보정 방법
KR102157070B1 (ko) * 2020-03-03 2020-09-17 주식회사 프로이천 오토 프로브장치
CN114815339B (zh) * 2022-05-17 2023-09-26 厦门特仪科技有限公司 一种可适用于不同尺寸lcd屏的离线点亮设备

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08110363A (ja) * 1994-10-11 1996-04-30 Kobe Steel Ltd フラットパネルの検査装置
JPH08254677A (ja) * 1994-10-14 1996-10-01 Hitachi Electron Eng Co Ltd 液晶パネルの点灯試験用コンタクト装置
JP3545655B2 (ja) * 1999-09-08 2004-07-21 株式会社日本マイクロニクス 電気接続装置
JP3480925B2 (ja) * 2000-09-12 2003-12-22 株式会社双晶テック ディスプレイパネル又はプローブブロックの支持枠体
JP2002286754A (ja) * 2002-01-31 2002-10-03 Micronics Japan Co Ltd プローブユニット
JP3864201B2 (ja) * 2002-09-30 2006-12-27 日本電子材料株式会社 プローブカード
JP2005209895A (ja) * 2004-01-23 2005-08-04 Sharp Corp 可撓性を有する平型回路体の搭載装置
JP4786884B2 (ja) * 2004-06-17 2011-10-05 株式会社日本マイクロニクス 液晶パネル点灯検査装置のアライメント方法
JP4570930B2 (ja) * 2004-10-22 2010-10-27 株式会社日本マイクロニクス パネルの検査装置に用いられる電気的接続装置
JP2006133099A (ja) * 2004-11-08 2006-05-25 Micronics Japan Co Ltd 表示用パネルの検査装置

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102884567A (zh) * 2010-06-17 2013-01-16 夏普株式会社 点亮检查装置
CN102884567B (zh) * 2010-06-17 2015-01-28 夏普株式会社 点亮检查装置
TWI719681B (zh) * 2019-09-24 2021-02-21 思達科技股份有限公司 探測裝置及其操作方法
CN112635341A (zh) * 2019-09-24 2021-04-09 东京毅力科创株式会社 检查装置的控制方法和检查装置
US11307246B2 (en) 2019-09-24 2022-04-19 Star Technologies, Inc. Probing apparatus and method of operating the same
CN112924770A (zh) * 2019-11-21 2021-06-08 科美仪器公司 不同尺寸显示板的检查装置
CN114018544A (zh) * 2021-07-13 2022-02-08 重庆康佳光电技术研究院有限公司 点灯装置和点亮方法
CN114018544B (zh) * 2021-07-13 2023-12-19 重庆康佳光电科技有限公司 点灯装置和点亮方法

Also Published As

Publication number Publication date
TWI390223B (zh) 2013-03-21
JP5137336B2 (ja) 2013-02-06
JP2007316022A (ja) 2007-12-06
KR20070114628A (ko) 2007-12-04

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