TW200714952A - Inspection apparatus - Google Patents

Inspection apparatus

Info

Publication number
TW200714952A
TW200714952A TW095128718A TW95128718A TW200714952A TW 200714952 A TW200714952 A TW 200714952A TW 095128718 A TW095128718 A TW 095128718A TW 95128718 A TW95128718 A TW 95128718A TW 200714952 A TW200714952 A TW 200714952A
Authority
TW
Taiwan
Prior art keywords
liquid crystal
crystal panel
prober
inspection apparatus
casing
Prior art date
Application number
TW095128718A
Other languages
English (en)
Inventor
Yutaka Kosaka
Yoshiyuki Andoh
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200714952A publication Critical patent/TW200714952A/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G13/00—Roller-ways
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
    • B65G49/061—Lifting, gripping, or carrying means, for one or more sheets forming independent means of transport, e.g. suction cups, transport frames
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2201/00—Indexing codes relating to handling devices, e.g. conveyors, characterised by the type of product or load being conveyed or handled
    • B65G2201/02—Articles
    • B65G2201/0214—Articles of special size, shape or weigh
    • B65G2201/022—Flat

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
TW095128718A 2005-10-12 2006-08-04 Inspection apparatus TW200714952A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005298074A JP2007107973A (ja) 2005-10-12 2005-10-12 検査装置

Publications (1)

Publication Number Publication Date
TW200714952A true TW200714952A (en) 2007-04-16

Family

ID=38033949

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095128718A TW200714952A (en) 2005-10-12 2006-08-04 Inspection apparatus

Country Status (3)

Country Link
JP (1) JP2007107973A (zh)
KR (1) KR100780312B1 (zh)
TW (1) TW200714952A (zh)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5001681B2 (ja) 2007-03-12 2012-08-15 株式会社日本マイクロニクス インライン自動検査装置及びインライン自動検査システム
KR101528282B1 (ko) * 2009-12-28 2015-06-12 재단법인 포항산업과학연구원 정밀 단조 성형품 측정 시스템
JP5525981B2 (ja) * 2010-09-28 2014-06-18 株式会社日本マイクロニクス 検査装置及び検査方法
US8901947B2 (en) * 2012-09-28 2014-12-02 Electro Scientific Industries, Inc. Probe out-of-position sensing for automated test equipment
CN107389307A (zh) * 2016-12-31 2017-11-24 深圳眼千里科技有限公司 屏幕自动检测机
JP2019052914A (ja) * 2017-09-14 2019-04-04 日本電産サンキョー株式会社 検査装置
CN110231724B (zh) * 2019-04-29 2024-05-24 苏州日和科技有限公司 液晶屏点亮测试用探针座顶升装置
JP7219172B2 (ja) * 2019-06-14 2023-02-07 日本電産サンキョー株式会社 検査システム
CN111693542A (zh) * 2020-06-03 2020-09-22 宿州市迎盛科技有限公司 一种手机屏检测设备及检测方法
CN115060732A (zh) * 2022-08-18 2022-09-16 深圳市信润富联数字科技有限公司 视觉检测设备

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0631029B2 (ja) * 1985-06-12 1994-04-27 富士重工業株式会社 ウインドガラスの位置決め装置
JPH03242566A (ja) * 1990-02-20 1991-10-29 Hioki Ee Corp 回路基板検査装置
JPH0792190A (ja) * 1993-09-21 1995-04-07 Tokusoo Riken:Kk プリント基板の検査装置
JPH08166779A (ja) * 1994-10-11 1996-06-25 Sony Corp 欠陥検査装置及び欠陥検査方法
JP3442930B2 (ja) * 1995-12-28 2003-09-02 シャープ株式会社 液晶表示パネルの洗浄方法
JP3272642B2 (ja) * 1997-08-05 2002-04-08 シャープ株式会社 液晶表示装置の検査装置
JP2001056298A (ja) * 1999-08-19 2001-02-27 Ishii Ind Co Ltd 遮光式物品検査装置
TW533319B (en) * 1999-11-19 2003-05-21 De & T Co Ltd LCD testing system
JP3976170B2 (ja) * 2001-10-16 2007-09-12 株式会社日立プラントテクノロジー 薄板物品の位置決め装置
JP2003270608A (ja) * 2002-03-15 2003-09-25 Mecc Co Ltd 液晶表示パネル検査装置
JP2004226127A (ja) * 2003-01-20 2004-08-12 On Denshi Kk 基板検査方法

Also Published As

Publication number Publication date
JP2007107973A (ja) 2007-04-26
KR100780312B1 (ko) 2007-11-29
KR20070040713A (ko) 2007-04-17

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