TW200512143A - Inspection device for display panel - Google Patents

Inspection device for display panel

Info

Publication number
TW200512143A
TW200512143A TW093117145A TW93117145A TW200512143A TW 200512143 A TW200512143 A TW 200512143A TW 093117145 A TW093117145 A TW 093117145A TW 93117145 A TW93117145 A TW 93117145A TW 200512143 A TW200512143 A TW 200512143A
Authority
TW
Taiwan
Prior art keywords
carrying
panel
inspection
display panel
inspection device
Prior art date
Application number
TW093117145A
Other languages
Chinese (zh)
Other versions
TWI272234B (en
Inventor
Takeshi Saito
Shinji Fujiwara
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200512143A publication Critical patent/TW200512143A/en
Application granted granted Critical
Publication of TWI272234B publication Critical patent/TWI272234B/en

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2203/00Function characteristic
    • G02F2203/69Arrangements or methods for testing or calibrating a device

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nonlinear Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Biochemistry (AREA)
  • Optics & Photonics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

An inspection device capable of stably carrying a large panel without damaging the same during inspection is provided. The inspection device includes an inspection stage for receiving a rectangular display panel and a carrying device for carrying a panel to and from the inspection stage. The carrying device includes at least one carrier for supporting the panel at the two edge parts in the X direction and the two edge parts in the Y direction in a detachable manner so as to carrying the panel.
TW093117145A 2003-09-18 2004-06-15 Inspection device for display panel TWI272234B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003326124A JP4490066B2 (en) 2003-09-18 2003-09-18 Display panel inspection device

Publications (2)

Publication Number Publication Date
TW200512143A true TW200512143A (en) 2005-04-01
TWI272234B TWI272234B (en) 2007-02-01

Family

ID=34456394

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093117145A TWI272234B (en) 2003-09-18 2004-06-15 Inspection device for display panel

Country Status (4)

Country Link
JP (1) JP4490066B2 (en)
KR (1) KR100634059B1 (en)
CN (1) CN100401495C (en)
TW (1) TWI272234B (en)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006317332A (en) * 2005-05-13 2006-11-24 Micronics Japan Co Ltd Lighting inspection device
KR101166839B1 (en) * 2005-12-29 2012-07-19 엘지디스플레이 주식회사 apparatus for testing for LCD panel
JP4914702B2 (en) * 2006-12-06 2012-04-11 新光電気工業株式会社 Work positioning device
JP5111285B2 (en) * 2008-08-06 2013-01-09 株式会社日立ハイテクノロジーズ Sample transport mechanism
KR101093646B1 (en) * 2009-05-01 2011-12-15 가부시키가이샤 니혼 마이크로닉스 A testing apparatus for a plate-shaped object
JP5631020B2 (en) * 2009-05-01 2014-11-26 株式会社日本マイクロニクス Test equipment for flat specimen
KR101868083B1 (en) * 2011-04-13 2018-06-19 삼성디스플레이 주식회사 Jig unit for inspecting a display panel
KR101367910B1 (en) * 2011-12-30 2014-02-28 엘아이지에이디피 주식회사 Substrate Aligner and Substrate Inspecting System With the Same
JP6084426B2 (en) * 2012-10-15 2017-02-22 株式会社日本マイクロニクス Inspection device
KR101979903B1 (en) * 2012-11-08 2019-05-20 삼성디스플레이 주식회사 Guide for inspecting panel and tray having the same
JP5978937B2 (en) * 2012-11-13 2016-08-24 旭硝子株式会社 Substrate transfer hand and substrate transfer method
CN102998823B (en) 2012-12-06 2015-04-08 京东方科技集团股份有限公司 Polarizer supporting part for lighting check equipment and lighting check equipment
KR101281075B1 (en) * 2013-01-31 2013-07-09 주식회사 현성오토텍 Inspection device of packge for vehicle of three-dimensional shape
JP7205823B2 (en) * 2018-12-05 2023-01-17 株式会社ニックス Gripping mechanism and conveying device
JP2020164282A (en) * 2019-03-29 2020-10-08 日本電産サンキョー株式会社 Panel transfer system
JP2020167256A (en) * 2019-03-29 2020-10-08 日本電産サンキョー株式会社 Panel transfer device and panel transfer system
CN111999919B (en) * 2020-08-31 2023-05-05 晟光科技股份有限公司 LCD display screen positioning detection mechanism

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4217370B2 (en) * 2000-06-30 2009-01-28 芝浦メカトロニクス株式会社 Substrate transfer device
JP3914717B2 (en) * 2001-04-13 2007-05-16 武秀 林 Flat panel transfer system
JP4745536B2 (en) * 2001-06-04 2011-08-10 株式会社日本マイクロニクス Display substrate transfer device

Also Published As

Publication number Publication date
KR20050028298A (en) 2005-03-22
KR100634059B1 (en) 2006-10-16
JP2005091862A (en) 2005-04-07
CN1598598A (en) 2005-03-23
CN100401495C (en) 2008-07-09
TWI272234B (en) 2007-02-01
JP4490066B2 (en) 2010-06-23

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