NL193703C - Schakeling voor de voeding van een halfgeleidergeheugeninrichting. - Google Patents

Schakeling voor de voeding van een halfgeleidergeheugeninrichting. Download PDF

Info

Publication number
NL193703C
NL193703C NL9101377A NL9101377A NL193703C NL 193703 C NL193703 C NL 193703C NL 9101377 A NL9101377 A NL 9101377A NL 9101377 A NL9101377 A NL 9101377A NL 193703 C NL193703 C NL 193703C
Authority
NL
Netherlands
Prior art keywords
supply voltage
voltage
circuit
resistance
internal supply
Prior art date
Application number
NL9101377A
Other languages
English (en)
Dutch (nl)
Other versions
NL193703B (nl
NL9101377A (nl
Inventor
Tae-Je Jin
Joon-Young Jeon
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of NL9101377A publication Critical patent/NL9101377A/nl
Publication of NL193703B publication Critical patent/NL193703B/xx
Application granted granted Critical
Publication of NL193703C publication Critical patent/NL193703C/nl

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02Regulating voltage or current
    • G05F3/08Regulating voltage or current wherein the variable is dc
    • G05F3/10Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/30Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current
    • G05F1/46Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/462Regulating voltage or current wherein the variable actually regulated by the final control device is dc as a function of the requirements of the load, e.g. delay, temperature, specific voltage/current characteristic
    • G05F1/465Internal voltage generators for integrated circuits, e.g. step down generators
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current
    • G05F1/46Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G05F1/565Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
    • G05F1/567Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for temperature compensation
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02Regulating voltage or current
    • G05F3/08Regulating voltage or current wherein the variable is dc
    • G05F3/10Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
    • G05F3/242Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
    • G05F3/245Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage producing a voltage or current as a predetermined function of the temperature
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4074Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S323/00Electricity: power supply or regulation systems
    • Y10S323/907Temperature compensation of semiconductor

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Power Engineering (AREA)
  • Nonlinear Science (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Static Random-Access Memory (AREA)
  • Control Of Electrical Variables (AREA)
  • Logic Circuits (AREA)
  • Continuous-Control Power Sources That Use Transistors (AREA)
  • Power Sources (AREA)
NL9101377A 1991-06-12 1991-08-12 Schakeling voor de voeding van een halfgeleidergeheugeninrichting. NL193703C (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1019910009659A KR940003406B1 (ko) 1991-06-12 1991-06-12 내부 전원전압 발생회로
KR910009659 1991-06-12

Publications (3)

Publication Number Publication Date
NL9101377A NL9101377A (nl) 1993-01-04
NL193703B NL193703B (nl) 2000-03-01
NL193703C true NL193703C (nl) 2000-07-04

Family

ID=19315675

Family Applications (1)

Application Number Title Priority Date Filing Date
NL9101377A NL193703C (nl) 1991-06-12 1991-08-12 Schakeling voor de voeding van een halfgeleidergeheugeninrichting.

Country Status (12)

Country Link
US (1) US5146152A (ja)
JP (1) JPH0793006B2 (ja)
KR (1) KR940003406B1 (ja)
CN (1) CN1090775C (ja)
DE (1) DE4124427C2 (ja)
FR (1) FR2677793B1 (ja)
GB (1) GB2256731B (ja)
HK (1) HK28597A (ja)
IT (1) IT1251297B (ja)
NL (1) NL193703C (ja)
RU (1) RU2146388C1 (ja)
TW (1) TW238439B (ja)

Families Citing this family (61)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2727809B2 (ja) * 1991-08-26 1998-03-18 日本電気株式会社 半導体集積回路
US5220273A (en) * 1992-01-02 1993-06-15 Etron Technology, Inc. Reference voltage circuit with positive temperature compensation
US5302888A (en) * 1992-04-01 1994-04-12 Texas Instruments Incorporated CMOS integrated mid-supply voltage generator
JPH05289760A (ja) * 1992-04-06 1993-11-05 Mitsubishi Electric Corp 基準電圧発生回路
JP3122239B2 (ja) * 1992-07-23 2001-01-09 株式会社東芝 半導体集積回路
DE4334918C2 (de) * 1992-10-15 2000-02-03 Mitsubishi Electric Corp Absenkkonverter zum Absenken einer externen Versorgungsspannung mit Kompensation herstellungsbedingter Abweichungen, seine Verwendung sowie zugehöriges Betriebsverfahren
JP2851767B2 (ja) * 1992-10-15 1999-01-27 三菱電機株式会社 電圧供給回路および内部降圧回路
FR2718273B1 (fr) * 1994-03-31 1996-05-24 Sgs Thomson Microelectronics Mémoire intégrée avec circuit de maintien de la tension de colonne.
US5448159A (en) * 1994-05-12 1995-09-05 Matsushita Electronics Corporation Reference voltage generator
DE19654934B4 (de) * 1995-02-06 2004-05-06 Mitsubishi Denki K.K. Halbleitereinrichtung
US5757174A (en) * 1995-07-19 1998-05-26 Micro Linear Corporation Current sensing technique using MOS transistor scaling with matched current sources
EP0765037A3 (en) * 1995-09-20 1998-01-14 Texas Instruments Incorporated Buffer for integrated circuit memories
US5694073A (en) * 1995-11-21 1997-12-02 Texas Instruments Incorporated Temperature and supply-voltage sensing circuit
JP3234153B2 (ja) * 1996-04-19 2001-12-04 株式会社東芝 半導体装置
FR2750240B1 (fr) * 1996-06-20 1998-07-31 Sgs Thomson Microelectronics Generateur de reference de tension
US5777514A (en) * 1996-09-27 1998-07-07 Micro Linear Corporation Differential to single ended conversion technique for an operational amplifier having low input offset voltage, high speed and high gain
US5770965A (en) * 1996-09-30 1998-06-23 Motorola, Inc. Circuit and method of compensating for non-linearities in a sensor signal
KR100481824B1 (ko) * 1997-05-07 2005-07-08 삼성전자주식회사 리플레쉬용발진회로를갖는반도체메모리장치
DE19735381C1 (de) * 1997-08-14 1999-01-14 Siemens Ag Bandgap-Referenzspannungsquelle und Verfahren zum Betreiben derselben
US6018265A (en) * 1997-12-10 2000-01-25 Lexar Media, Inc. Internal CMOS reference generator and voltage regulator
US6107887A (en) * 1998-10-02 2000-08-22 Micro Linear Corporation Differential to single-ended video cable driver having BICMOS current-mode operational amplifier
JP2000124744A (ja) * 1998-10-12 2000-04-28 Texas Instr Japan Ltd 定電圧発生回路
KR20000056765A (ko) * 1999-02-25 2000-09-15 김영환 온도변화에 무관한 전압조정회로
KR100577552B1 (ko) * 1999-04-20 2006-05-08 삼성전자주식회사 반도체 메모리 장치의 내부 전압 변환회로
US6404246B1 (en) 2000-12-20 2002-06-11 Lexa Media, Inc. Precision clock synthesizer using RC oscillator and calibration circuit
JP2002270768A (ja) * 2001-03-08 2002-09-20 Nec Corp Cmos基準電圧回路
KR100439024B1 (ko) * 2001-03-08 2004-07-03 삼성전자주식회사 기준전압 발생회로
KR100744109B1 (ko) * 2001-10-23 2007-08-01 삼성전자주식회사 공정, 전압 및 온도의 변화에 따라 단자들의 상태를최적으로 변화시킬 수 있는 메모리 장치
JP3927788B2 (ja) * 2001-11-01 2007-06-13 株式会社ルネサステクノロジ 半導体装置
JP3964182B2 (ja) 2001-11-02 2007-08-22 株式会社ルネサステクノロジ 半導体装置
JP3976665B2 (ja) * 2002-11-20 2007-09-19 富士通株式会社 バッファ回路装置
EP1501000B1 (en) * 2003-07-22 2007-03-21 STMicroelectronics Limited A voltage reference circuit
JP2006041175A (ja) * 2004-07-27 2006-02-09 Toshiba Corp 半導体集積回路装置
KR100825029B1 (ko) * 2006-05-31 2008-04-24 주식회사 하이닉스반도체 밴드갭 기준전압 발생장치 및 이를 구비하는 반도체 소자
KR100784918B1 (ko) * 2006-10-13 2007-12-11 주식회사 하이닉스반도체 반도체 메모리 장치의 내부전압 발생기
US7969808B2 (en) * 2007-07-20 2011-06-28 Samsung Electronics Co., Ltd. Memory cell structures, memory arrays, memory devices, memory controllers, and memory systems, and methods of manufacturing and operating the same
KR20090116088A (ko) * 2008-05-06 2009-11-11 삼성전자주식회사 정보 유지 능력과 동작 특성이 향상된 커패시터리스 1t반도체 메모리 소자
KR101358930B1 (ko) * 2007-07-23 2014-02-05 삼성전자주식회사 전압 디바이더 및 이를 포함하는 내부 전원 전압 발생 회로
KR101308048B1 (ko) 2007-10-10 2013-09-12 삼성전자주식회사 반도체 메모리 장치
CN101470458B (zh) * 2007-12-26 2010-10-27 中国科学院微电子研究所 带隙基准电压参考电路
KR20090075063A (ko) * 2008-01-03 2009-07-08 삼성전자주식회사 플로팅 바디 트랜지스터를 이용한 동적 메모리 셀을 가지는메모리 셀 어레이를 구비하는 반도체 메모리 장치 및 이장치의 동작 방법
KR20100070158A (ko) * 2008-12-17 2010-06-25 삼성전자주식회사 커패시터가 없는 동작 메모리 셀을 구비한 반도체 메모리 장치 및 이 장치의 동작 방법
KR101442177B1 (ko) * 2008-12-18 2014-09-18 삼성전자주식회사 커패시터 없는 1-트랜지스터 메모리 셀을 갖는 반도체소자의 제조방법들
JP5176971B2 (ja) * 2009-01-15 2013-04-03 富士通株式会社 直流電位生成回路、多段回路、及び通信装置
JP2010219486A (ja) * 2009-03-19 2010-09-30 Renesas Electronics Corp 中間電位発生回路
US20120194150A1 (en) * 2011-02-01 2012-08-02 Samsung Electro-Mechanics Company Systems and methods for low-battery operation control in portable communication devices
DE102011051111A1 (de) 2011-06-16 2012-12-20 Packsys Global (Switzerland) Ltd. Verfahren zum Herstellen von Rohrkörpern für Verpackungstuben
RU2461864C1 (ru) * 2011-06-27 2012-09-20 Федеральное государственное образовательное учреждение высшего профессионального образования "Южно-Российский государственный университет экономики и сервиса" (ФГБОУ ВПО "ЮРГУЭС") Источник опорного напряжения
JP2013092958A (ja) * 2011-10-27 2013-05-16 Semiconductor Components Industries Llc 電流検出回路及び電源回路
KR20130098041A (ko) * 2012-02-27 2013-09-04 삼성전자주식회사 낮은 외부 전원 전압에 적합한 전압 발생부들
RU2518974C2 (ru) * 2012-10-04 2014-06-10 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Южно-Российский государственный университет экономики и сервиса" (ФГБОУ ВПО "ЮРГУЭС") Источник опорного напряжения
FR3002049B1 (fr) * 2013-02-13 2016-11-04 Cddic Regulateur de tension compense en temperature a faible courant de consommation
KR102031685B1 (ko) * 2013-12-31 2019-10-15 엘지디스플레이 주식회사 액정표시장치 및 그의 구동방법
CN104460811B (zh) * 2014-12-26 2016-01-20 昆腾微电子股份有限公司 基准电压温度系数校准电路及其工作方法
CN106571824A (zh) * 2015-10-08 2017-04-19 联发科技(新加坡)私人有限公司 信号处理电路
CN109874314B (zh) * 2017-12-21 2021-08-17 北京比特大陆科技有限公司 串联供电电路、***和方法
WO2019126946A1 (en) * 2017-12-25 2019-07-04 Texas Instruments Incorporated Low-dropout regulator with load-adaptive frequency compensation
CN110047523B (zh) * 2018-01-15 2021-07-27 珠海兴芯存储科技有限公司 电阻性内存单元的准定压降自我中止写入方法及其电路
JP6522201B1 (ja) * 2018-05-14 2019-05-29 ウィンボンド エレクトロニクス コーポレーション 半導体装置
CN109582076B (zh) * 2019-01-09 2023-10-24 上海晟矽微电子股份有限公司 基准电流源
CN114167929B (zh) * 2020-09-11 2023-03-24 兆易创新科技集团股份有限公司 电压产生电路及电子装置

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4095164A (en) * 1976-10-05 1978-06-13 Rca Corporation Voltage supply regulated in proportion to sum of positive- and negative-temperature-coefficient offset voltages
JPS53103770A (en) * 1977-02-22 1978-09-09 Seiko Instr & Electronics Ltd Electronic timepiece
SU744513A1 (ru) * 1978-03-06 1980-06-30 Предприятие П/Я В-8450 Стабилизатор напр жени посто нного тока
JPS6029123B2 (ja) * 1978-08-02 1985-07-09 富士通株式会社 電子回路
GB2046483A (en) * 1979-04-06 1980-11-12 Gen Electric Voltage regulator
US4298835A (en) * 1979-08-27 1981-11-03 Gte Products Corporation Voltage regulator with temperature dependent output
JPS56108258A (en) * 1980-02-01 1981-08-27 Seiko Instr & Electronics Ltd Semiconductor device
US4445083A (en) * 1981-08-26 1984-04-24 Honeywell Information Systems Inc. Integrated circuit compensatory regulator apparatus
JP2592234B2 (ja) * 1985-08-16 1997-03-19 富士通株式会社 半導体装置
JPS6269308A (ja) * 1985-09-17 1987-03-30 シ−メンス、アクチエンゲゼルシヤフト 基準電圧発生回路装置
JPH083766B2 (ja) * 1986-05-31 1996-01-17 株式会社東芝 半導体集積回路の電源電圧降下回路
US4746823A (en) * 1986-07-02 1988-05-24 Dallas Semiconductor Corporation Voltage-insensitive and temperature-compensated delay circuit for a monolithic integrated circuit
GB8630980D0 (en) * 1986-12-29 1987-02-04 Motorola Inc Bandgap reference circuit
JPH01124011A (ja) * 1987-11-10 1989-05-16 Furukawa Electric Co Ltd:The Led駆動回路
KR910005599B1 (ko) * 1989-05-01 1991-07-31 삼성전자 주식회사 고밀도 반도체 메모리장치의 전원 공급전압 변환회로
KR900019026A (ko) * 1989-05-11 1990-12-22 김광호 반도체 장치의 기준전압 발생회로
JP2674669B2 (ja) * 1989-08-23 1997-11-12 株式会社東芝 半導体集積回路
KR920010633A (ko) * 1990-11-30 1992-06-26 김광호 반도체 메모리 장치의 기준전압 발생회로

Also Published As

Publication number Publication date
ITMI912287A1 (it) 1992-12-13
FR2677793A1 (fr) 1992-12-18
FR2677793B1 (fr) 1997-01-31
CN1067751A (zh) 1993-01-06
DE4124427C2 (de) 1994-06-30
GB9118530D0 (en) 1991-10-16
ITMI912287A0 (it) 1991-08-26
JPH0793006B2 (ja) 1995-10-09
HK28597A (en) 1997-03-21
RU2146388C1 (ru) 2000-03-10
KR930001574A (ko) 1993-01-16
TW238439B (ja) 1995-01-11
DE4124427A1 (de) 1992-12-17
IT1251297B (it) 1995-05-08
NL193703B (nl) 2000-03-01
KR940003406B1 (ko) 1994-04-21
JPH04366492A (ja) 1992-12-18
US5146152A (en) 1992-09-08
GB2256731B (en) 1996-01-10
NL9101377A (nl) 1993-01-04
CN1090775C (zh) 2002-09-11
GB2256731A (en) 1992-12-16

Similar Documents

Publication Publication Date Title
NL193703C (nl) Schakeling voor de voeding van een halfgeleidergeheugeninrichting.
EP0000844B1 (en) Semiconductor circuit arrangement for controlling a controlled device.
US5955915A (en) Circuit for limiting the current in a power transistor
US5039878A (en) Temperature sensing circuit
US5404053A (en) Circuit for controlling the maximum current in a MOS power transistor used for driving a load connected to earth
JP2788843B2 (ja) 基準電圧発生器
NL9100684A (nl) Referentiespanningsopwekkingsketen van een halfgeleidergeheugeneenheid.
JP2525346B2 (ja) 定電流源回路を有する差動増幅回路
EP0476365A1 (en) An adaptive bias current control circuit
US6981381B1 (en) Linear thermoelectric device driver
KR0136121B1 (ko) 과열 검출 회로
US8269478B2 (en) Two-terminal voltage regulator with current-balancing current mirror
GB2267003A (en) Current-limiting cicuit and constant voltage source therefor; current regulator
JPH1049245A (ja) 定電流発生回路
US4970415A (en) Circuit for generating reference voltages and reference currents
US4158804A (en) MOSFET Reference voltage circuit
US5804958A (en) Self-referenced control circuit
CN114341764B (zh) 集成电路
JP3680122B2 (ja) 基準電圧発生回路
US20070200546A1 (en) Reference voltage generating circuit for generating low reference voltages
US6124754A (en) Temperature compensated current and voltage reference circuit
US4684880A (en) Reference current generator circuit
US8013582B2 (en) Voltage control circuit
US6072306A (en) Variation-compensated bias current generator
JP2002016484A (ja) 半導体回路

Legal Events

Date Code Title Description
A1C A request for examination has been filed
V1 Lapsed because of non-payment of the annual fee

Effective date: 20110301