KR910020729A - 반도체 기억회로 - Google Patents
반도체 기억회로 Download PDFInfo
- Publication number
- KR910020729A KR910020729A KR1019910007291A KR910007291A KR910020729A KR 910020729 A KR910020729 A KR 910020729A KR 1019910007291 A KR1019910007291 A KR 1019910007291A KR 910007291 A KR910007291 A KR 910007291A KR 910020729 A KR910020729 A KR 910020729A
- Authority
- KR
- South Korea
- Prior art keywords
- bit line
- sense amplifier
- pair
- semiconductor memory
- amplifier node
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4096—Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Databases & Information Systems (AREA)
- Dram (AREA)
- Semiconductor Memories (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 실시예를 표시하는 반도체 기억회로에 있어서의 센스앰프 회로부분의 회로도.
Claims (3)
- 비트선쌍과 워드선이 각각 복수개 교차배열되어 그 각교차개소에 각각 접속된 다이내믹형 메모리셀과 상기 비트선쌍에 접속된 센스앰프노드쌍을 가지고 있고 그 센스앰프노드쌍간에 접속된 센스앰프를 구비한 반도체 기억회로에 있어서, 상기 비트선쌍과 상기 센스앰프노드쌍과의 사이에 각각 독립적으로 제어가능한 스위치수단을 설치한 것을 특징으로 하는 반도체 기억장치.
- 비트선쌍과 워드선이 각각 복수개 교차배열되어 그 각교차개소에 각각 접속된 다이내믹형 메모리셀과 상기 비트선쌍에 접속된 센스앰프노드쌍을 가지고 있고 그 센스앰프노드쌍간에 접속된 센스앰프와 상기 비트선쌍에 접속된 비트선전압원을 구비한 반도체 기억회로에 있어서, 상기 비트선쌍과 상기 비트선 전압원과의 사이에 각각 독립적으로 제어가능한 스위치수단을 설치한 것을 특징으로 하는 반도체 기억장치.
- 제2항에 있어서, 상기 비트선쌍과 상기 센스앰프노드쌍과의 사이에 각각 독립적으로 제어가능한 다른스위치수단을 설치한 반도체 기억회로.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2136223A JPH0430388A (ja) | 1990-05-25 | 1990-05-25 | 半導体記憶回路 |
JP2-136223 | 1990-05-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR910020729A true KR910020729A (ko) | 1991-12-20 |
Family
ID=15170175
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019910007291A KR910020729A (ko) | 1990-05-25 | 1991-05-06 | 반도체 기억회로 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5278799A (ko) |
EP (1) | EP0458351B1 (ko) |
JP (1) | JPH0430388A (ko) |
KR (1) | KR910020729A (ko) |
DE (1) | DE69127317T2 (ko) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04353692A (ja) * | 1991-05-30 | 1992-12-08 | Sanyo Electric Co Ltd | メモリセルの書き込み方法 |
US5280452A (en) * | 1991-07-12 | 1994-01-18 | International Business Machines Corporation | Power saving semsing circuits for dynamic random access memory |
US5737711A (en) * | 1994-11-09 | 1998-04-07 | Fuji Jukogyo Kabuishiki Kaisha | Diagnosis system for motor vehicle |
US5640114A (en) * | 1995-12-27 | 1997-06-17 | Vlsi Technology, Inc. | Versatile select and hold scan flip-flop |
JP2000132969A (ja) | 1998-10-28 | 2000-05-12 | Nec Corp | ダイナミックメモリ装置 |
US6687175B1 (en) | 2000-02-04 | 2004-02-03 | Renesas Technology Corporation | Semiconductor device |
KR100368133B1 (ko) * | 2000-03-28 | 2003-01-15 | 한국과학기술원 | 메모리 셀 정보 저장 방법 |
JP4934897B2 (ja) * | 2001-01-12 | 2012-05-23 | ソニー株式会社 | メモリ装置 |
WO2007110933A1 (ja) * | 2006-03-28 | 2007-10-04 | Fujitsu Limited | 半導体メモリおよびシステム |
JP4996422B2 (ja) * | 2007-11-05 | 2012-08-08 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US8116157B2 (en) * | 2007-11-20 | 2012-02-14 | Qimonda Ag | Integrated circuit |
WO2011153608A1 (en) * | 2010-06-10 | 2011-12-15 | Mosaid Technologies Incorporated | Semiconductor memory device with sense amplifier and bitline isolation |
US8681574B2 (en) * | 2011-03-31 | 2014-03-25 | Mosys, Inc. | Separate pass gate controlled sense amplifier |
US8451675B2 (en) | 2011-03-31 | 2013-05-28 | Mosys, Inc. | Methods for accessing DRAM cells using separate bit line control |
KR20130055992A (ko) * | 2011-11-21 | 2013-05-29 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 및 이를 이용한 반도체 집적 회로 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5836504B2 (ja) * | 1980-02-22 | 1983-08-09 | 富士通株式会社 | 半導体記憶装置 |
JPS5856287A (ja) * | 1981-09-29 | 1983-04-02 | Nec Corp | 半導体回路 |
JPS60206161A (ja) * | 1984-03-30 | 1985-10-17 | Toshiba Corp | 半導体集積回路 |
JPS6180597A (ja) * | 1984-09-26 | 1986-04-24 | Hitachi Ltd | 半導体記憶装置 |
US4800525A (en) * | 1984-10-31 | 1989-01-24 | Texas Instruments Incorporated | Dual ended folded bit line arrangement and addressing scheme |
JPH0652632B2 (ja) * | 1985-01-23 | 1994-07-06 | 株式会社日立製作所 | ダイナミツク型ram |
JPH0785354B2 (ja) * | 1985-05-08 | 1995-09-13 | 日本電気株式会社 | 半導体メモリ |
US4710902A (en) * | 1985-10-04 | 1987-12-01 | Motorola, Inc. | Technique restore for a dynamic random access memory |
JPS6280897A (ja) * | 1985-10-04 | 1987-04-14 | Mitsubishi Electric Corp | 半導体記憶装置 |
DE3884859T2 (de) * | 1987-06-04 | 1994-02-03 | Nippon Electric Co | Dynamische Speicherschaltung mit einem Abfühlschema. |
JPS6457495A (en) * | 1987-08-28 | 1989-03-03 | Hitachi Ltd | Semiconductor memory device |
EP0321847B1 (en) * | 1987-12-21 | 1994-06-29 | Kabushiki Kaisha Toshiba | Semiconductor memory capable of improving data rewrite speed |
JPH0229989A (ja) * | 1988-07-19 | 1990-01-31 | Mitsubishi Electric Corp | ダイナミックランダムアクセスメモリ装置 |
-
1990
- 1990-05-25 JP JP2136223A patent/JPH0430388A/ja active Pending
-
1991
- 1991-05-06 KR KR1019910007291A patent/KR910020729A/ko active IP Right Grant
- 1991-05-20 US US07/702,329 patent/US5278799A/en not_active Expired - Fee Related
- 1991-05-24 EP EP91108446A patent/EP0458351B1/en not_active Expired - Lifetime
- 1991-05-24 DE DE69127317T patent/DE69127317T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0458351B1 (en) | 1997-08-20 |
DE69127317D1 (de) | 1997-09-25 |
EP0458351A3 (en) | 1994-08-17 |
JPH0430388A (ja) | 1992-02-03 |
US5278799A (en) | 1994-01-11 |
EP0458351A2 (en) | 1991-11-27 |
DE69127317T2 (de) | 1998-04-02 |
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A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
NORF | Unpaid initial registration fee |