JP5363437B2 - 試験装置 - Google Patents
試験装置 Download PDFInfo
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- JP5363437B2 JP5363437B2 JP2010200592A JP2010200592A JP5363437B2 JP 5363437 B2 JP5363437 B2 JP 5363437B2 JP 2010200592 A JP2010200592 A JP 2010200592A JP 2010200592 A JP2010200592 A JP 2010200592A JP 5363437 B2 JP5363437 B2 JP 5363437B2
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- power supply
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
- G01R31/2617—Circuits therefor for testing bipolar transistors for measuring switching properties thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Semiconductor Integrated Circuits (AREA)
Description
特許文献1 特開2000−58820号公報
Claims (4)
- 被試験デバイスを試験する試験装置であって、
前記被試験デバイスに電源電力を供給する電源部と、
前記被試験デバイスの状態を示す特性値を検出し、前記特性値を予め定められた閾値と比較する比較部と、
前記比較部における比較結果に基づいて、前記電源部から前記被試験デバイスに供給される前記電源電力を遮断する遮断部と、
前記比較部における閾値、または、前記特性値を検出する検出タイミングの少なくとも一方を変更する制御部と
を備え、
前記制御部は、前記電源部から前記被試験デバイスに電源電力を供給している状態で、前記閾値または前記検出タイミングの少なくとも一方を変更し、
前記比較部は、複数種類の前記特性値を検出し、前記特性値の種類毎に予め定められた前記閾値と比較し、
前記制御部は、いずれの種類の前記特性値の比較結果を用いて、前記遮断部に前記電源電力を遮断させるかについての設定を更に変更する
試験装置。 - 前記制御部は、前記特性値の種類毎に設けられ、対応する前記閾値を書き換え可能に格納する閾値格納部を有する
請求項1に記載の試験装置。 - 前記電源部は、前記被試験デバイス内に設けられる複数の被試験素子に対して並列に前記電源電力を供給し、
前記比較部は、前記複数の被試験素子に印加される電圧または電流を、前記閾値と比較し、
前記遮断部は、前記複数の被試験素子の全てに対する前記電源電力の供給を停止する
請求項2に記載の試験装置。 - 前記遮断部は、前記比較部において検出した特性値が範囲外と判定されたときの前記閾値に応じて、前記電源電力を遮断する速度を変化させる
請求項1から3のいずれか一項に記載の試験装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010200592A JP5363437B2 (ja) | 2010-09-08 | 2010-09-08 | 試験装置 |
US13/191,396 US8866489B2 (en) | 2010-09-08 | 2011-07-26 | Test apparatus with power cutoff section having variable maximum and minimum thresholds |
TW100126825A TWI436073B (zh) | 2010-09-08 | 2011-07-28 | Test device for switchgear |
CN2011102567643A CN102435939A (zh) | 2010-09-08 | 2011-09-01 | 测试装置 |
DE201110112860 DE102011112860A1 (de) | 2010-09-08 | 2011-09-07 | Prüfgerät |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010200592A JP5363437B2 (ja) | 2010-09-08 | 2010-09-08 | 試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2012058050A JP2012058050A (ja) | 2012-03-22 |
JP5363437B2 true JP5363437B2 (ja) | 2013-12-11 |
Family
ID=45595630
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010200592A Active JP5363437B2 (ja) | 2010-09-08 | 2010-09-08 | 試験装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8866489B2 (ja) |
JP (1) | JP5363437B2 (ja) |
CN (1) | CN102435939A (ja) |
DE (1) | DE102011112860A1 (ja) |
TW (1) | TWI436073B (ja) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2014092370A (ja) * | 2012-10-31 | 2014-05-19 | Agilent Technologies Inc | 電圧電流特性発生器 |
CN103810090B (zh) * | 2012-11-12 | 2018-01-09 | 中国广核集团有限公司 | 核电站数字化规程安装调试验证的方法、升版方法和平台 |
JP6051831B2 (ja) * | 2012-12-13 | 2016-12-27 | 三菱電機株式会社 | 評価装置 |
CN104181407B (zh) * | 2013-05-22 | 2017-02-22 | 浙江大华***工程有限公司 | 一种电话线路状态检测电路、方法及装置 |
CN103389427B (zh) * | 2013-07-31 | 2016-03-30 | 广州华工科技开发有限公司 | Gis设备运行状态在线检测方法与*** |
CN103389448B (zh) * | 2013-07-31 | 2015-12-23 | 广州供电局有限公司 | Gis设备运行状态在线检测方法与*** |
JP5939272B2 (ja) * | 2014-03-28 | 2016-06-22 | トヨタ自動車株式会社 | 試験装置及び試験方法 |
EP2933646B1 (en) * | 2014-04-17 | 2019-04-17 | Siemens Aktiengesellschaft | Precision measurement of voltage drop across a semiconductor switching element |
JP6398433B2 (ja) * | 2014-07-30 | 2018-10-03 | 株式会社デンソー | 半導体素子の検査回路および検査方法 |
CN104237573B (zh) * | 2014-10-09 | 2017-07-07 | 湖南崧顺科技有限公司 | 手机充电器自动测试设备 |
CN104638722B (zh) * | 2015-02-02 | 2017-07-28 | 成都芯源***有限公司 | 基于数字控制的电池充电***及其控制电路 |
JP6365425B2 (ja) * | 2015-06-05 | 2018-08-01 | 株式会社デンソー | 半導体素子の検査回路 |
JP6409697B2 (ja) * | 2015-07-07 | 2018-10-24 | 株式会社デンソー | 半導体素子の検査回路および検査方法 |
CN105067998A (zh) * | 2015-08-20 | 2015-11-18 | 贵州天义电器有限责任公司 | 一种电压电流波动检测装置 |
GB201616605D0 (en) * | 2016-09-30 | 2016-11-16 | Bae Systems Plc | Electrical power supply system |
JP2018054543A (ja) * | 2016-09-30 | 2018-04-05 | 株式会社デンソー | デバイス検査装置及びデバイス検査方法 |
TWI644106B (zh) | 2017-04-20 | 2018-12-11 | 致茂電子股份有限公司 | 具突波保護的測試裝置以及測試方法 |
CN110297144B (zh) * | 2019-07-22 | 2024-03-08 | 扬州亚星客车股份有限公司 | 一种三综合试验***及方法 |
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JP4853470B2 (ja) * | 2007-12-18 | 2012-01-11 | トヨタ自動車株式会社 | 半導体素子の試験装置及びその試験方法 |
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JP2010233439A (ja) * | 2009-03-03 | 2010-10-14 | Toshiba Corp | 電源制御装置、及びそれを用いた電源装置 |
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-
2010
- 2010-09-08 JP JP2010200592A patent/JP5363437B2/ja active Active
-
2011
- 2011-07-26 US US13/191,396 patent/US8866489B2/en active Active
- 2011-07-28 TW TW100126825A patent/TWI436073B/zh active
- 2011-09-01 CN CN2011102567643A patent/CN102435939A/zh active Pending
- 2011-09-07 DE DE201110112860 patent/DE102011112860A1/de not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
US8866489B2 (en) | 2014-10-21 |
TWI436073B (zh) | 2014-05-01 |
TW201219801A (en) | 2012-05-16 |
DE102011112860A1 (de) | 2012-03-08 |
JP2012058050A (ja) | 2012-03-22 |
CN102435939A (zh) | 2012-05-02 |
US20120187968A1 (en) | 2012-07-26 |
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