CN1236482C - 半导体器件检查装置 - Google Patents
半导体器件检查装置 Download PDFInfo
- Publication number
- CN1236482C CN1236482C CNB00133431XA CN00133431A CN1236482C CN 1236482 C CN1236482 C CN 1236482C CN B00133431X A CNB00133431X A CN B00133431XA CN 00133431 A CN00133431 A CN 00133431A CN 1236482 C CN1236482 C CN 1236482C
- Authority
- CN
- China
- Prior art keywords
- electron beam
- mentioned
- contact hole
- semiconductor device
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
- H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/305—Contactless testing using electron beams
- G01R31/307—Contactless testing using electron beams of integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/202—Movement
- H01J2237/20221—Translation
- H01J2237/20228—Mechanical X-Y scanning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/22—Treatment of data
- H01J2237/221—Image processing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/245—Detection characterised by the variable being measured
- H01J2237/24564—Measurements of electric or magnetic variables, e.g. voltage, current, frequency
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
Description
Claims (35)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP31532099 | 1999-11-05 | ||
JP315320/1999 | 1999-11-05 | ||
JP191817/2000 | 2000-06-26 | ||
JP2000191817 | 2000-06-26 | ||
JP311196/2000 | 2000-10-11 | ||
JP2000311196A JP3749107B2 (ja) | 1999-11-05 | 2000-10-11 | 半導体デバイス検査装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2005101243124A Division CN100382272C (zh) | 1999-11-05 | 2000-11-06 | 半导体器件检查装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1296287A CN1296287A (zh) | 2001-05-23 |
CN1236482C true CN1236482C (zh) | 2006-01-11 |
Family
ID=27339466
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB00133431XA Expired - Fee Related CN1236482C (zh) | 1999-11-05 | 2000-11-06 | 半导体器件检查装置 |
Country Status (5)
Country | Link |
---|---|
US (4) | US6768324B1 (zh) |
JP (1) | JP3749107B2 (zh) |
KR (1) | KR100388690B1 (zh) |
CN (1) | CN1236482C (zh) |
TW (1) | TW473892B (zh) |
Families Citing this family (132)
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CN1296287A (zh) | 2001-05-23 |
US7385195B2 (en) | 2008-06-10 |
US20040239347A1 (en) | 2004-12-02 |
US20040207415A1 (en) | 2004-10-21 |
KR20010051425A (ko) | 2001-06-25 |
KR100388690B1 (ko) | 2003-06-25 |
US6768324B1 (en) | 2004-07-27 |
JP2002083849A (ja) | 2002-03-22 |
US20060202119A1 (en) | 2006-09-14 |
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