CA2038295A1 - Processeur rapide d'information sur les defaillances - Google Patents

Processeur rapide d'information sur les defaillances

Info

Publication number
CA2038295A1
CA2038295A1 CA 2038295 CA2038295A CA2038295A1 CA 2038295 A1 CA2038295 A1 CA 2038295A1 CA 2038295 CA2038295 CA 2038295 CA 2038295 A CA2038295 A CA 2038295A CA 2038295 A1 CA2038295 A1 CA 2038295A1
Authority
CA
Canada
Prior art keywords
fail
memories
failure information
sequence
failure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA 2038295
Other languages
English (en)
Inventor
Brian Jerrold Arkin
Benjamin Joseph Brown
Peter Addison Reichert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2038295A1 publication Critical patent/CA2038295A1/fr
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
CA 2038295 1990-03-16 1991-03-14 Processeur rapide d'information sur les defaillances Abandoned CA2038295A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US49460190A 1990-03-16 1990-03-16
US494,601 1990-03-16

Publications (1)

Publication Number Publication Date
CA2038295A1 true CA2038295A1 (fr) 1991-09-17

Family

ID=23965152

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2038295 Abandoned CA2038295A1 (fr) 1990-03-16 1991-03-14 Processeur rapide d'information sur les defaillances

Country Status (5)

Country Link
JP (1) JP2635229B2 (fr)
CA (1) CA2038295A1 (fr)
DE (1) DE4108594C2 (fr)
FR (1) FR2659745B1 (fr)
GB (1) GB2243702B (fr)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3748650A (en) * 1972-08-21 1973-07-24 Ibm Input/output hardware trace monitor
GB2144228B (en) * 1983-07-13 1987-08-05 Instrumentation Engineering Digital pin electronics module for computerized automatic diagnostic testing systems
US4656632A (en) * 1983-11-25 1987-04-07 Giordano Associates, Inc. System for automatic testing of circuits and systems
US4709366A (en) * 1985-07-29 1987-11-24 John Fluke Mfg. Co., Inc. Computer assisted fault isolation in circuit board testing
US4816750A (en) * 1987-01-16 1989-03-28 Teradyne, Inc. Automatic circuit tester control system
US4875210A (en) * 1988-01-06 1989-10-17 Teradyne, Inc. Automatic circuit tester control system
DE3827959A1 (de) * 1988-08-17 1990-02-22 Siemens Ag Testgeraet zur funktionspruefung von elektroischen bausteinen

Also Published As

Publication number Publication date
DE4108594C2 (de) 1993-11-11
JPH05126905A (ja) 1993-05-25
GB2243702A (en) 1991-11-06
FR2659745B1 (fr) 1994-05-06
JP2635229B2 (ja) 1997-07-30
GB9105577D0 (en) 1991-05-01
FR2659745A1 (fr) 1991-09-20
DE4108594A1 (de) 1991-10-10
GB2243702B (en) 1993-08-11

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Legal Events

Date Code Title Description
EEER Examination request
FZDE Dead