GB2144228B - Digital pin electronics module for computerized automatic diagnostic testing systems - Google Patents
Digital pin electronics module for computerized automatic diagnostic testing systemsInfo
- Publication number
- GB2144228B GB2144228B GB08417901A GB8417901A GB2144228B GB 2144228 B GB2144228 B GB 2144228B GB 08417901 A GB08417901 A GB 08417901A GB 8417901 A GB8417901 A GB 8417901A GB 2144228 B GB2144228 B GB 2144228B
- Authority
- GB
- United Kingdom
- Prior art keywords
- electronics module
- diagnostic testing
- pin electronics
- testing systems
- automatic diagnostic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31935—Storing data, e.g. failure memory
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US51335483A | 1983-07-13 | 1983-07-13 |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8417901D0 GB8417901D0 (en) | 1984-08-15 |
GB2144228A GB2144228A (en) | 1985-02-27 |
GB2144228B true GB2144228B (en) | 1987-08-05 |
Family
ID=24042907
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB08417901A Expired GB2144228B (en) | 1983-07-13 | 1984-07-13 | Digital pin electronics module for computerized automatic diagnostic testing systems |
Country Status (2)
Country | Link |
---|---|
ES (1) | ES8601486A1 (en) |
GB (1) | GB2144228B (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3515802A1 (en) * | 1985-05-02 | 1986-11-06 | Siemens AG, 1000 Berlin und 8000 München | ARRANGEMENT FOR FAST GENERATION OF LARGE TESTING DATA WORDS IN A TESTING DEVICE |
DE3633464A1 (en) * | 1986-10-01 | 1988-04-14 | Siemens Ag | TEST SYSTEM FOR DIGITAL CIRCUITS |
US4799220A (en) * | 1987-02-19 | 1989-01-17 | Grumman Aerospace Corporation | Dynamic system for testing an equipment |
FR2615975A1 (en) * | 1987-05-29 | 1988-12-02 | Mo Aviat I | DATA TRAINER AND AUTOMATIC TESTER WITH GROUPS OF SUCH TRAINERS IN APPLICATION |
GB8826921D0 (en) * | 1988-11-17 | 1988-12-21 | Datatrace Ltd | Circuit testing |
CA2038295A1 (en) * | 1990-03-16 | 1991-09-17 | Brian Jerrold Arkin | High speed fail processor |
CA2127192C (en) * | 1993-07-01 | 1999-09-07 | Alan Brent Hussey | Shaping ate bursts, particularly in gallium arsenide |
US9449714B2 (en) * | 2013-08-14 | 2016-09-20 | Advantest Corporation | Flexible interrupt generation mechanism |
-
1984
- 1984-07-13 GB GB08417901A patent/GB2144228B/en not_active Expired
- 1984-07-13 ES ES534331A patent/ES8601486A1/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
ES534331A0 (en) | 1985-10-16 |
GB2144228A (en) | 1985-02-27 |
ES8601486A1 (en) | 1985-10-16 |
GB8417901D0 (en) | 1984-08-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |