GB2144228B - Digital pin electronics module for computerized automatic diagnostic testing systems - Google Patents

Digital pin electronics module for computerized automatic diagnostic testing systems

Info

Publication number
GB2144228B
GB2144228B GB08417901A GB8417901A GB2144228B GB 2144228 B GB2144228 B GB 2144228B GB 08417901 A GB08417901 A GB 08417901A GB 8417901 A GB8417901 A GB 8417901A GB 2144228 B GB2144228 B GB 2144228B
Authority
GB
United Kingdom
Prior art keywords
electronics module
diagnostic testing
pin electronics
testing systems
automatic diagnostic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB08417901A
Other versions
GB2144228A (en
GB8417901D0 (en
Inventor
Gerald Maresca
Gerald Juskovic
Louis Devito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INSTRUMENTATION ENGINEERING
Original Assignee
INSTRUMENTATION ENGINEERING
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by INSTRUMENTATION ENGINEERING filed Critical INSTRUMENTATION ENGINEERING
Publication of GB8417901D0 publication Critical patent/GB8417901D0/en
Publication of GB2144228A publication Critical patent/GB2144228A/en
Application granted granted Critical
Publication of GB2144228B publication Critical patent/GB2144228B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
GB08417901A 1983-07-13 1984-07-13 Digital pin electronics module for computerized automatic diagnostic testing systems Expired GB2144228B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US51335483A 1983-07-13 1983-07-13

Publications (3)

Publication Number Publication Date
GB8417901D0 GB8417901D0 (en) 1984-08-15
GB2144228A GB2144228A (en) 1985-02-27
GB2144228B true GB2144228B (en) 1987-08-05

Family

ID=24042907

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08417901A Expired GB2144228B (en) 1983-07-13 1984-07-13 Digital pin electronics module for computerized automatic diagnostic testing systems

Country Status (2)

Country Link
ES (1) ES8601486A1 (en)
GB (1) GB2144228B (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3515802A1 (en) * 1985-05-02 1986-11-06 Siemens AG, 1000 Berlin und 8000 München ARRANGEMENT FOR FAST GENERATION OF LARGE TESTING DATA WORDS IN A TESTING DEVICE
DE3633464A1 (en) * 1986-10-01 1988-04-14 Siemens Ag TEST SYSTEM FOR DIGITAL CIRCUITS
US4799220A (en) * 1987-02-19 1989-01-17 Grumman Aerospace Corporation Dynamic system for testing an equipment
FR2615975A1 (en) * 1987-05-29 1988-12-02 Mo Aviat I DATA TRAINER AND AUTOMATIC TESTER WITH GROUPS OF SUCH TRAINERS IN APPLICATION
GB8826921D0 (en) * 1988-11-17 1988-12-21 Datatrace Ltd Circuit testing
CA2038295A1 (en) * 1990-03-16 1991-09-17 Brian Jerrold Arkin High speed fail processor
CA2127192C (en) * 1993-07-01 1999-09-07 Alan Brent Hussey Shaping ate bursts, particularly in gallium arsenide
US9449714B2 (en) * 2013-08-14 2016-09-20 Advantest Corporation Flexible interrupt generation mechanism

Also Published As

Publication number Publication date
ES534331A0 (en) 1985-10-16
GB2144228A (en) 1985-02-27
ES8601486A1 (en) 1985-10-16
GB8417901D0 (en) 1984-08-15

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee