GB2243702B - Processing failure information - Google Patents
Processing failure informationInfo
- Publication number
- GB2243702B GB2243702B GB9105577A GB9105577A GB2243702B GB 2243702 B GB2243702 B GB 2243702B GB 9105577 A GB9105577 A GB 9105577A GB 9105577 A GB9105577 A GB 9105577A GB 2243702 B GB2243702 B GB 2243702B
- Authority
- GB
- United Kingdom
- Prior art keywords
- failure information
- processing failure
- processing
- information
- failure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31935—Storing data, e.g. failure memory
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US49460190A | 1990-03-16 | 1990-03-16 |
Publications (3)
Publication Number | Publication Date |
---|---|
GB9105577D0 GB9105577D0 (en) | 1991-05-01 |
GB2243702A GB2243702A (en) | 1991-11-06 |
GB2243702B true GB2243702B (en) | 1993-08-11 |
Family
ID=23965152
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9105577A Expired - Fee Related GB2243702B (en) | 1990-03-16 | 1991-03-15 | Processing failure information |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP2635229B2 (fr) |
CA (1) | CA2038295A1 (fr) |
DE (1) | DE4108594C2 (fr) |
FR (1) | FR2659745B1 (fr) |
GB (1) | GB2243702B (fr) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3748650A (en) * | 1972-08-21 | 1973-07-24 | Ibm | Input/output hardware trace monitor |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2144228B (en) * | 1983-07-13 | 1987-08-05 | Instrumentation Engineering | Digital pin electronics module for computerized automatic diagnostic testing systems |
US4656632A (en) * | 1983-11-25 | 1987-04-07 | Giordano Associates, Inc. | System for automatic testing of circuits and systems |
US4709366A (en) * | 1985-07-29 | 1987-11-24 | John Fluke Mfg. Co., Inc. | Computer assisted fault isolation in circuit board testing |
US4816750A (en) * | 1987-01-16 | 1989-03-28 | Teradyne, Inc. | Automatic circuit tester control system |
US4875210A (en) * | 1988-01-06 | 1989-10-17 | Teradyne, Inc. | Automatic circuit tester control system |
DE3827959A1 (de) * | 1988-08-17 | 1990-02-22 | Siemens Ag | Testgeraet zur funktionspruefung von elektroischen bausteinen |
-
1991
- 1991-03-14 CA CA 2038295 patent/CA2038295A1/fr not_active Abandoned
- 1991-03-15 GB GB9105577A patent/GB2243702B/en not_active Expired - Fee Related
- 1991-03-15 DE DE19914108594 patent/DE4108594C2/de not_active Expired - Fee Related
- 1991-03-16 JP JP3051752A patent/JP2635229B2/ja not_active Expired - Lifetime
- 1991-03-18 FR FR9103262A patent/FR2659745B1/fr not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3748650A (en) * | 1972-08-21 | 1973-07-24 | Ibm | Input/output hardware trace monitor |
Also Published As
Publication number | Publication date |
---|---|
GB9105577D0 (en) | 1991-05-01 |
FR2659745B1 (fr) | 1994-05-06 |
JPH05126905A (ja) | 1993-05-25 |
FR2659745A1 (fr) | 1991-09-20 |
DE4108594C2 (de) | 1993-11-11 |
CA2038295A1 (fr) | 1991-09-17 |
GB2243702A (en) | 1991-11-06 |
JP2635229B2 (ja) | 1997-07-30 |
DE4108594A1 (de) | 1991-10-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19970315 |