GB2243702B - Processing failure information - Google Patents

Processing failure information

Info

Publication number
GB2243702B
GB2243702B GB9105577A GB9105577A GB2243702B GB 2243702 B GB2243702 B GB 2243702B GB 9105577 A GB9105577 A GB 9105577A GB 9105577 A GB9105577 A GB 9105577A GB 2243702 B GB2243702 B GB 2243702B
Authority
GB
United Kingdom
Prior art keywords
failure information
processing failure
processing
information
failure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9105577A
Other languages
English (en)
Other versions
GB9105577D0 (en
GB2243702A (en
Inventor
Brian Jerrold Arkin
Benjamin Joseph Brown
Richard Addison Reichert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of GB9105577D0 publication Critical patent/GB9105577D0/en
Publication of GB2243702A publication Critical patent/GB2243702A/en
Application granted granted Critical
Publication of GB2243702B publication Critical patent/GB2243702B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
GB9105577A 1990-03-16 1991-03-15 Processing failure information Expired - Fee Related GB2243702B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US49460190A 1990-03-16 1990-03-16

Publications (3)

Publication Number Publication Date
GB9105577D0 GB9105577D0 (en) 1991-05-01
GB2243702A GB2243702A (en) 1991-11-06
GB2243702B true GB2243702B (en) 1993-08-11

Family

ID=23965152

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9105577A Expired - Fee Related GB2243702B (en) 1990-03-16 1991-03-15 Processing failure information

Country Status (5)

Country Link
JP (1) JP2635229B2 (fr)
CA (1) CA2038295A1 (fr)
DE (1) DE4108594C2 (fr)
FR (1) FR2659745B1 (fr)
GB (1) GB2243702B (fr)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3748650A (en) * 1972-08-21 1973-07-24 Ibm Input/output hardware trace monitor

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2144228B (en) * 1983-07-13 1987-08-05 Instrumentation Engineering Digital pin electronics module for computerized automatic diagnostic testing systems
US4656632A (en) * 1983-11-25 1987-04-07 Giordano Associates, Inc. System for automatic testing of circuits and systems
US4709366A (en) * 1985-07-29 1987-11-24 John Fluke Mfg. Co., Inc. Computer assisted fault isolation in circuit board testing
US4816750A (en) * 1987-01-16 1989-03-28 Teradyne, Inc. Automatic circuit tester control system
US4875210A (en) * 1988-01-06 1989-10-17 Teradyne, Inc. Automatic circuit tester control system
DE3827959A1 (de) * 1988-08-17 1990-02-22 Siemens Ag Testgeraet zur funktionspruefung von elektroischen bausteinen

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3748650A (en) * 1972-08-21 1973-07-24 Ibm Input/output hardware trace monitor

Also Published As

Publication number Publication date
GB9105577D0 (en) 1991-05-01
FR2659745B1 (fr) 1994-05-06
JPH05126905A (ja) 1993-05-25
FR2659745A1 (fr) 1991-09-20
DE4108594C2 (de) 1993-11-11
CA2038295A1 (fr) 1991-09-17
GB2243702A (en) 1991-11-06
JP2635229B2 (ja) 1997-07-30
DE4108594A1 (de) 1991-10-10

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19970315