WO2019189310A1 - マスク接着剤、およびこれを備えたペリクル - Google Patents
マスク接着剤、およびこれを備えたペリクル Download PDFInfo
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- WO2019189310A1 WO2019189310A1 PCT/JP2019/013094 JP2019013094W WO2019189310A1 WO 2019189310 A1 WO2019189310 A1 WO 2019189310A1 JP 2019013094 W JP2019013094 W JP 2019013094W WO 2019189310 A1 WO2019189310 A1 WO 2019189310A1
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- mask adhesive
- mask
- pellicle
- process oil
- thermoplastic elastomer
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J153/00—Adhesives based on block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Adhesives based on derivatives of such polymers
- C09J153/02—Vinyl aromatic monomers and conjugated dienes
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
- G03F1/64—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof characterised by the frames, e.g. structure or material, including bonding means therefor
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L91/00—Compositions of oils, fats or waxes; Compositions of derivatives thereof
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L93/00—Compositions of natural resins; Compositions of derivatives thereof
- C08L93/04—Rosin
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
- C09J11/02—Non-macromolecular additives
- C09J11/06—Non-macromolecular additives organic
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
- C09J11/08—Macromolecular additives
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J123/00—Adhesives based on homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bond; Adhesives based on derivatives of such polymers
- C09J123/02—Adhesives based on homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bond; Adhesives based on derivatives of such polymers not modified by chemical after-treatment
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J125/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an aromatic carbocyclic ring; Adhesives based on derivatives of such polymers
- C09J125/02—Homopolymers or copolymers of hydrocarbons
- C09J125/04—Homopolymers or copolymers of styrene
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J133/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
- C09J133/04—Homopolymers or copolymers of esters
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J153/00—Adhesives based on block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Adhesives based on derivatives of such polymers
- C09J153/02—Vinyl aromatic monomers and conjugated dienes
- C09J153/025—Vinyl aromatic monomers and conjugated dienes modified
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J157/00—Adhesives based on unspecified polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds
- C09J157/02—Copolymers of mineral oil hydrocarbons
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/01—Hydrocarbons
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J193/00—Adhesives based on natural resins; Adhesives based on derivatives thereof
- C09J193/04—Rosin
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6735—Closed carriers
- H01L21/67359—Closed carriers specially adapted for containing masks, reticles or pellicles
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/28—Web or sheet containing structurally defined element or component and having an adhesive outermost layer
- Y10T428/2852—Adhesive compositions
- Y10T428/2878—Adhesive compositions including addition polymer from unsaturated monomer
- Y10T428/2883—Adhesive compositions including addition polymer from unsaturated monomer including addition polymer of diene monomer [e.g., SBR, SIS, etc.]
Definitions
- the present invention relates to an adhesive for bonding a pellicle to a mask, and a pellicle provided with the same.
- patterning is performed by irradiating light to a photosensitive layer or the like through a mask (also referred to as an exposure original plate or a reticle).
- a mask also referred to as an exposure original plate or a reticle.
- the light is absorbed by the foreign substance, or the light is reflected by the surface of the foreign substance and bent.
- a method is adopted in which a pellicle having a pellicle film that transmits light is attached to the surface of the mask to suppress adhesion of foreign matter.
- the pellicle usually includes a metal pellicle frame and a pellicle film disposed on one end surface of the pellicle frame.
- a mask adhesive layer for fixing the pellicle to the mask is formed on the other end surface of the pellicle frame.
- Patent Document 1 A hot melt adhesive containing a styrene / ethylene / propylene / styrene triblock copolymer and an aliphatic petroleum resin has also been proposed (see Patent Document 2). Furthermore, a pressure-sensitive adhesive containing a (meth) acrylic acid alkyl ester-containing block copolymer and a tackifying resin such as a (hydrogenated) petroleum resin has also been proposed (see Patent Document 3). An adhesive containing a styrene-based triblock copolymer, a tackifier resin, and a softening agent has also been proposed (Patent Document 4).
- Double patterning is known. In double patterning, one circuit pattern is divided into two patterns with low density, each is exposed to form, and the two patterns thus formed are combined to finally form a fine pattern with high density. (See Patent Documents 5 and 6). Double patterning is preferably applied to the production of next-generation semiconductors after the 22 nm generation (half pitch: 32 nm).
- JP 2000-267261 A Japanese Patent Laid-Open No. 4-237056 JP 11-323072 A International Publication No. 2012/004951 JP 2008-103718 A JP 2008-103719 A
- Mask distortion is one of the factors that cause the relative displacement of the two patterns.
- the pellicle is pressure-bonded to the mask, it is considered that the distortion of the pellicle frame is transmitted to the mask through the mask adhesive layer, so that the mask is distorted. Therefore, it is considered that the distortion of the mask can be suppressed by using a material (mask adhesive) that effectively plastically deforms as the mask adhesive layer.
- tan ⁇ loss tangent
- a mask adhesive having a temperature at which tan ⁇ exhibits a maximum value (hereinafter also referred to as “tan ⁇ peak temperature”) in the range of ⁇ 10 ° C. to 30 ° C. is a temperature at which double patterning exposure is performed (generally room temperature). ) Is easily plastically deformed. Therefore, in a pellicle having such a mask adhesive layer, it is difficult to cause distortion in the mask.
- the tan ⁇ peak temperature of a general thermoplastic elastomer (for example, styrene / ethylene butylene / styrene block copolymer (SEBS) in Patent Document 2 etc.) is as low as about ⁇ 70 to ⁇ 50 ° C.
- SEBS ethylene butylene / styrene block copolymer
- the tackifier resin added for the purpose of adjusting the tackiness and adhesive strength of the adhesive layer often has a higher tan ⁇ peak temperature.
- Mask adhesive that is too soft tends to remain on the mask surface after the pellicle is peeled from the mask. Furthermore, since the mask adhesive which is too soft has a high instantaneous adhesiveness, there is a problem that it is sticky when touched by hands and handling is also low.
- Patent Document 4 proposed using a styrene / hydrogenated isoprene / styrene triblock copolymer having a relatively high tan ⁇ peak temperature as the base polymer. According to the technique described in the patent document, it is described that not only the mask adhesive is easily plastically deformed in a temperature range where exposure is performed, but also that there is almost no adhesive residue on the mask after the pellicle is peeled off. Yes. It also describes that the handling property of the pellicle is improved.
- the present invention has been made in view of such problems of the prior art. Specifically, mask adhesion that can suppress pattern displacement, has little adhesive residue after peeling from the mask, has good handling properties, and does not easily increase the haze of the pellicle film even when used repeatedly. Provide the agent. Moreover, the pellicle containing the said mask adhesive agent is provided.
- thermoplastic elastomer (A) having a maximum loss tangent measured at a frequency of 1 Hz of ⁇ 20 to 30 ° C.
- thermoplastic elastomer (B) includes a styrene thermoplastic elastomer, a (meth) acrylic ester thermoplastic elastomer, and an olefin
- the process oil (C) is at least one selected from the group consisting of thermoplastic elastomers, and the sum of the ratio of paraffin carbon (% CP) and the ratio of naphthene carbon (% CN) is 50% or more
- the temperature at which the loss tangent measured under the condition of a frequency of 1 Hz of the mask adhesive shows the maximum value is ⁇ 10 to 30
- thermoplastic elastomer (A) is a styrenic thermoplastic elastomer.
- the styrenic thermoplastic elastomer is a first polystyrene block, a polyisoprene block having an isopropenyl group in the side chain, and a triblock copolymer having a second polystyrene block and / or hydrogenation thereof.
- the softening point of the tackifying resin (B) measured according to the ring and ball method defined in JIS K-2207 is 60 to 150 ° C., according to any one of [1] to [8] Mask adhesive.
- the mask adhesive according to any one of [1] to [9], wherein the tackifying resin (B) has a number average molecular weight of 300 to 3000.
- the tackifier resin (B) is rosin and derivatives thereof, polyterpene resin and hydride thereof, terpene phenol resin and hydride thereof, aromatic modified terpene resin and hydride thereof, coumarone / indene resin, aliphatic series Selected from the group consisting of petroleum resins, alicyclic petroleum resins and their hydrides, aromatic petroleum resins and their hydrides, aliphatic aromatic copolymer petroleum resins, and dicyclopentadiene petroleum resins and their hydrides.
- the mask adhesive according to any one of [1] to [10], which is at least one of the above.
- a pellicle frame, a pellicle film disposed on one end surface of the pellicle frame, and the mask adhesive according to any one of [1] to [11] disposed on the other end surface of the pellicle frame A pellicle comprising a mask adhesive layer.
- the mask adhesive and pellicle of the present invention can suppress the positional deviation of the pattern, have little adhesive residue after peeling from the mask, have good handling properties, and reduce the haze of the pellicle film even when used repeatedly. It is difficult to raise. That is, the mask adhesive and pellicle of the present invention are suitable for patterning that requires high patterning accuracy such as double patterning.
- the mask adhesive of the present invention contains a specific thermoplastic elastomer (A), a tackifying resin (B), and a process oil (C) in a predetermined ratio.
- the mask adhesive may further contain other components such as a softener and a wax as necessary.
- a conventional mask adhesive containing a base polymer, a tackifier resin, and a softening agent may easily generate components that cause an increase in haze of the pellicle film.
- the sulfur content contained in the mask adhesive greatly affects.
- the reason why the haze of the pellicle film is increased by sulfur in the mask adhesive is considered as follows. When short wavelength light such as ArF light is irradiated, oxygen in the atmosphere changes to ozone.
- the mask adhesive contains a large amount of sulfur
- the sulfur, ozone, and ammonium ions (NH 4 + ) in the atmosphere react to generate ammonium sulfate.
- the ammonium sulfate grows into particles of about several ⁇ m on the surface of the pellicle film, and reflects or scatters light.
- sulfur contained in the mask adhesive is derived from impurities contained in the raw material of the mask adhesive, and in particular, is derived from natural petroleum resin that has been conventionally used as a softening agent. Therefore, in the present invention, the sulfur content contained in the mask adhesive is set to 300 ⁇ g / g or less, for example, by using process oil (C) having a low sulfur content. As a result, it is difficult for ammonium sulfate to be generated due to sulfur in the mask adhesive, and an increase in the haze of the pellicle film can be suppressed over a long period of time.
- the sulfur content of the mask adhesive is more preferably 10 ⁇ g / g or less, and further preferably 1 ⁇ g / g or less, from the viewpoint of suppressing an increase in haze.
- the sulfur content in the mask adhesive can be specified as follows. First, the mask adhesive is precisely weighed in a sample boat, and is burned and decomposed at 900 ° C. (combustion furnace set temperature) in an Ar / O 2 air stream, so that the generated gas is absorbed by the absorption liquid. And the component absorbed in the said absorption liquid is quantified by the ion chromatography method. Examples of the instrument used for the ion chromatography method include ICS-3000 (manufactured by Thermo Fisher Scientific).
- the mask adhesive of the present invention contains, together with the process oil (C), a thermoplastic resin (A) having a relatively high loss tangent (tan ⁇ ) peak and a tackifier resin (B). .
- the temperature at which the tan ⁇ of the mask adhesive shows the maximum value is ⁇ 10 to 30 ° C. Therefore, it is particularly easy to be plastically deformed at a temperature at which general exposure is performed (for example, room temperature), and it is difficult to cause distortion in the mask.
- content with tackifying resin (B) is restrained in the predetermined range. Therefore, after the pellicle is peeled from the mask, adhesive residue is hardly generated on the mask, and stickiness is also reduced. Therefore, the handling property of the pellicle using the mask adhesive is also good. Therefore, the mask adhesive of the present invention is very useful as a mask adhesive for various pellicles.
- each component contained in the mask adhesive of the present invention will be described.
- Thermoplastic elastomer (A) The tan ⁇ peak temperature of the thermoplastic elastomer (A) is ⁇ 20 to 30 ° C., preferably ⁇ 20 to 25 ° C., more preferably ⁇ 20 to 20 ° C., and ⁇ 20 ° C. to 0 ° C. More preferably.
- the thermoplastic elastomer (A) having a tan ⁇ peak temperature within the above range is used as the base polymer, the tan ⁇ peak temperature of the resulting mask adhesive can be reduced to ⁇ 10 even if the amount of the tackifier resin (B) is reduced. It can be in the range of -30 ° C. For this reason, it can be set as the mask adhesive which is easy to carry out plastic deformation in exposure temperature range, and the stickiness was suppressed.
- the tan ⁇ of the thermoplastic elastomer (A) is a value represented by the ratio (G ′′ / G ′) of the loss elastic modulus (G ′′) to the storage elastic modulus (G ′).
- the maximum value of tan ⁇ of the thermoplastic elastomer (A) is preferably in the range of 0.5 to 3, more preferably in the range of 0.9 to 2.0.
- Tan ⁇ (loss tangent) can be specified using a dynamic viscoelasticity measuring device (trade name “ARES”, manufactured by TA Instruments). Specifically, a disk-shaped sample piece (diameter: 25 mm ⁇ thickness: 2 mm) is sandwiched between two parallel plates (diameter: 25 mm) as a measurement jig, and the thickness of the test piece is set to a predetermined initial value. Adjust to the gap.
- the sulfur content of the thermoplastic elastomer (A) is preferably 10 ⁇ g / g or less, preferably 3 ⁇ g / g or less, from the viewpoint of suppressing the haze increase by lowering the sulfur content in the mask adhesive. It is more preferable.
- the sulfur content in the thermoplastic elastomer (A) can be measured in the same manner as the sulfur content in the mask adhesive described above.
- the thermoplastic elastomer (A) contained in the mask adhesive of the present invention includes at least one of a styrene-based thermoplastic elastomer, a (meth) acrylic ester-based thermoplastic elastomer, and an olefin-based thermoplastic elastomer. included.
- a styrene-based thermoplastic elastomer a (meth) acrylic ester-based thermoplastic elastomer
- an olefin-based thermoplastic elastomer included.
- the styrene thermoplastic elastomer is excellent in hydrolysis resistance because it does not contain an ester bond site in the molecular skeleton.
- the styrene thermoplastic elastomer since the styrene thermoplastic elastomer has both a soft segment and a hard segment in the same molecular skeleton, it also has an advantage of being excellent in both flexibility and mechanical strength.
- the styrenic thermoplastic elastomer may be an elastomer containing a structural unit derived from styrene, and can be a block copolymer of styrene and an olefin other than styrene.
- the olefin other than styrene is preferably a monomer such as isoprene or 4-methyl-1-pentene capable of forming a bulky branched side chain in the polymer block. Of these, isoprene is particularly preferred.
- the proportion of structural units derived from styrene contained in the styrene-based thermoplastic elastomer is preferably 35% by mass or less, and more preferably 20% by mass or less.
- compatibility with the tackifier resin (B) and process oil (C) described later may be reduced, and the styrene thermoplastic elastomer and these may be separated. May end up.
- the styrenic thermoplastic elastomer has a first polystyrene block, a polyisoprene block having an isopropenyl group (1-methylethenyl group (—C ( ⁇ CH 2 ) CH 3 ) in the side chain), and a second polystyrene block.
- a triblock copolymer hereinafter also referred to as “SIS” or a hydrogenated product of the triblock copolymer (hereinafter also referred to as “H-SIS”), such as an isopropenyl group.
- SIS triblock copolymer
- H-SIS hydrogenated product of the triblock copolymer
- the tan ⁇ peak temperature of a triblock copolymer having a bulky branched structure in the side chain is usually as high as ⁇ 20 to 30 ° C.
- the “hydrogenated triblock copolymer” is included in SIS. This means that the unsaturated bonds in the “polyisoprene block” of the three polymer blocks are hydrogenated, and the hydrogenation amount is 90 mol. Preferably at least% is, further preferably 95 mol% or more.
- SIS Specific examples (commercially available products) of the SIS include a trade name “Hibler 5127” (manufactured by Kuraray Co., Ltd., tan ⁇ peak temperature: 20 ° C.), and a trade name “Hibura 5215” (manufactured by Kuraray Co., Ltd., tan ⁇ peak temperature: ⁇ 3 ° C.). Etc. are included.
- H-SIS commercially available products
- H-SIS commercially available products
- H-SIS include a trade name “HIBLER 7125” (manufactured by Kuraray Co., Ltd., tan ⁇ peak temperature: ⁇ 5 ° C.), and a trade name “HIBLER 7311” (manufactured by Kuraray Co., Ltd., tan ⁇ peak temperature). : -17 ° C) and the like.
- the (meth) acrylic ester thermoplastic elastomer may be an elastomer containing a structural unit derived from (meth) acrylic ester.
- the (meth) acrylate thermoplastic elastomer is, for example, a diblock copolymer or a triblock copolymer of poly (meth) acrylate and (meth) acrylate other than poly (meth) acrylate. Etc.
- Examples of (meth) acrylate other than poly (meth) acrylate include poly (meth) acrylate n-butyl, poly (meth) acrylate 2-ethylhexyl, poly (meth) acrylate isononyl, etc.
- the polymer block is preferably a polymer capable of forming a bulky branched side chain in the polymer block. Of these, n-butyl poly (meth) acrylate is particularly preferred.
- thermoplastic elastomers examples include the product name “LA polymer” series (manufactured by Kuraray Co., Ltd.).
- the olefinic thermoplastic elastomer can be an elastomer containing a copolymer of one or more ⁇ -olefins, and among them, an amorphous or low crystalline one is preferable.
- the ⁇ -olefin constituting the olefinic thermoplastic elastomer include ethylene, propylene, butene, pentene, hexene, heptene, octene, nonene, decene, undecene, dodecene, 4-methyl-1-pentene and the like.
- thermoplastic elastomers examples include the product name “Tuffmer” (manufactured by Mitsui Chemicals), the product name “Notio” (manufactured by Mitsui Chemicals), and the like.
- thermoplastic elastomer (A) is preferably contained in an amount of 29 to 71% by mass, more preferably 30 to 60% by mass, and more preferably 33 to 55% by mass with respect to the total amount of the mask adhesive. Further preferred.
- strength of a mask adhesive agent can fully be raised as the quantity of a thermoplastic elastomer (A) is the said range.
- Tackifying resin (B) The softening point of the tackifier resin (B) is preferably 60 to 150 ° C, more preferably 90 to 120 ° C, and more preferably 90 to 110 ° C.
- the softening point of the tackifying resin (B) When the softening point of the tackifying resin (B) is 60 ° C. or higher, the tackifying resin (B) tends to hardly bleed out from the mask adhesive. In addition, the tan ⁇ peak temperature of the mask adhesive tends to be ⁇ 10 ° C. or higher, and the pattern misalignment tends not to occur. On the other hand, when the softening point of the tackifier resin (B) is 150 ° C. or less, the tackiness tends to be excellent.
- the softening point of the tackifier resin (B) is measured based on the ring and ball method defined in JIS K-2207.
- the number average molecular weight (Mn) of the tackifier resin (B) is preferably 300 to 3000, and more preferably 500 to 1000. When the number average molecular weight (Mn) of the tackifier resin (B) is less than 300, the softening point tends to be too low. On the other hand, when the number average molecular weight (Mn) of the tackifier resin (B) is more than 3000, the softening point tends to be too high.
- the number average molecular weight (Mn) of the tackifier resin (B) is measured by gel permeation chromatography (GPC) using polystyrene as a standard.
- the sulfur content of the tackifier resin (B) is preferably 10 ⁇ g / g or less, preferably 3 ⁇ g / g or less, from the viewpoint of suppressing the haze increase by lowering the sulfur content in the mask adhesive. More preferred.
- the sulfur content in the tackifier resin (B) can also be measured in the same manner as the sulfur content in the mask adhesive described above.
- the tackifier resin (B) is compatible with the thermoplastic elastomer (A). Thereby, the tan ⁇ peak temperature of the mask adhesive can be effectively shifted to the high temperature side.
- the tackifier resin (B) is composed of rosin and its derivatives, polyterpene resin and its hydride, terpene phenol resin and its hydride, aromatic modified terpene resin and its hydrogen.
- rosin and derivatives thereof polyterpene resins and hydrides thereof, aliphatic petroleum resins, alicyclic petroleum resins and hydrides thereof are preferable, and rosin and derivatives thereof, aliphatic petroleum resins and alicyclic resins. Petroleum resins and their hydrides are particularly preferred.
- the thermoplastic elastomer (A) is the above-described styrene thermoplastic elastomer
- the tackifier resin (B) is preferably a hydride of an alicyclic petroleum resin from the viewpoint of reducing the sulfur content. .
- rosin and its derivatives include “Pine Crystal”, “Superester”, “Tamanol” (above, manufactured by Arakawa Chemical Co., Ltd.) under the trade names.
- Specific examples (commercial products) of polyterpene resins, terpene phenol resins, aromatic modified terpene resins, and hydrides thereof are “YS Resin”, “YS Polystar”, “Clearon” (hereinafter referred to as Yashara Chemical Co., Ltd.). Manufactured) and the like.
- aliphatic petroleum resins examples include aliphatic petroleum resins, alicyclic petroleum resins and hydrides thereof, aromatic petroleum resins and hydrides thereof, aliphatic aromatic copolymer petroleum resins, dicyclopentadiene petroleum resins and hydrides thereof (Commercially available products) are the following trade names: “Arcon” (made by Arakawa Chemical Co., Ltd.), “Highlets” (made by Mitsui Chemicals), “Imabe” (made by Idemitsu Kosan Co., Ltd.), “Quinton” (made by Nippon Zeon Co., Ltd.) , “Escollets” (manufactured by Tonex) and the like. Only one type of tackifier resin (B) may be contained in the mask adhesive, or two or more types may be contained.
- the amount of the tackifying resin (B) contained in the mask adhesive is 20 to 150 parts by mass with respect to 100 parts by mass of the thermoplastic elastomer (A).
- the amount of the tackifier resin (B) is preferably 50 to 130 parts by mass, more preferably 80 to 120 parts by mass with respect to 100 parts by mass of the thermoplastic elastomer (A).
- thermoplastic elastomer (A) when a resin having a low tan ⁇ peak temperature (for example, SEBS) is used as the thermoplastic elastomer (A), in order to make the tan ⁇ peak temperature of the obtained mask adhesive in the range of ⁇ 10 to 30 ° C., 100 mass of SEBS It was necessary to add 200 to 300 parts by mass of tackifying resin (B) with respect to parts. On the other hand, in the present invention, even if the amount of the tackifier resin (B) with respect to 100 parts by mass of the thermoplastic elastomer (A) is 150 parts by mass or less, the tan ⁇ of the obtained mask adhesive is ⁇ 10 to 30 ° C. It can be a range. For this reason, the mask adhesive of the present invention has little stickiness and almost no adhesive residue when peeled off from the mask.
- SEBS a resin having a low tan ⁇ peak temperature
- the amount of the tackifier resin (B) is less than 20 parts by mass relative to 100 parts by mass of the thermoplastic elastomer (A), it is difficult to set the tan ⁇ peak temperature of the obtained mask adhesive to ⁇ 10 ° C. or higher. .
- the amount of the tackifying resin (B) is more than 150 parts by mass, the resulting mask adhesive may become sticky, and adhesive residue may occur after peeling from the mask.
- Process oil (C) is a high-boiling petroleum fraction and is generally classified into a paraffinic process oil (C1), a naphthenic process oil (C2), and an aromatic process oil.
- a process oil (C) having a total of 50% or more of paraffin carbon (% CP) and naphthene carbon (% CN) is used.
- the ratio of carbon constituting the aromatic ring (% CA) is preferably 10% or less, preferably 5% or less, from the viewpoint of further reducing the displacement of the pattern by reducing the kinematic viscosity of the mask adhesive. More preferred is 1% or less.
- the paraffinic process oil (C1) is a ratio of paraffinic carbon (% CP) to 50% of the total carbon content of petroleum fraction, as measured by a ring analysis method (ndM method). It means process oil that is above.
- the naphthenic process oil (C2) means a process oil in which the ratio (% CN) of naphthene carbon to the total carbon content of the petroleum fraction is 50% or more.
- the process oil (C) is not particularly limited as long as the sum of% CP and% CN is 50% or more, but the sum of% CP and% CN is more preferably 70% or more, and more preferably 90% or more. More preferably it is.
- paraffinic process oil (C1) or naphthenic process oil (C2) may be used alone, or a plurality of types of process oils may be mixed and used as process oil (C).
- the ratio (% CP) of paraffin carbon in the process oil is 50% or more.
- % CP and% CN of the process oil (C) can be determined by analyzing% CP and% CN in the mixed state.
- the sulfur content of the process oil (C) is preferably 500 ⁇ g / g or less, more preferably 100 ⁇ g / g or less from the viewpoint of setting the sulfur content of the mask adhesive to 300 ⁇ g / g or less. Preferably, it is 10 ⁇ g / g or less.
- the sulfur content in the process oil (C) can be specified by the above-mentioned ion chromatography method.
- the sulfur content of the process oil (C) In order to set the sulfur content of the process oil (C) within the above range, a commercially available paraffinic process oil (C1) or naphthenic process oil (C2) having a low sulfur content is used alone or in combination. Also good.
- the sulfur content may be reduced by subjecting the paraffinic process oil (C1) or the naphthenic process oil (C2) having a relatively high sulfur content to adsorption treatment, hydrogenation treatment, or the like.
- paraffinic process oil (C1) with low sulfur content examples include the trade name “Diana Process Oil PW-90” and the trade name “Diana Process Oil PW-380” (both manufactured by Idemitsu Kosan Co., Ltd.) ) Etc. are included.
- the paraffinic process oil (C1) when the process oil (C) includes a paraffinic process oil (C1), the paraffinic process oil (C1) preferably has a kinematic viscosity at 40 ° C. of 50 to 400 mm 2 / s, preferably 60 to More preferably, it is 100 mm 2 / s.
- the kinematic viscosity is in this range, the mask adhesive can be easily applied to the pellicle frame.
- the kinematic viscosity is a value measured according to JIS K2283 (2000).
- the number average molecular weight (Mn) of the paraffinic process oil (C1) is preferably 300 to 1500, 300 to 1200, more preferably 400 to 800. When the molecular weight of the paraffinic process oil (C1) is within the above range, the mask adhesive can be easily applied to the pellicle frame.
- the number average molecular weight (Mn) of the process oil (C) is measured by gel permeation chromatography (GPC) using polystyrene as a standard.
- naphthenic process oil (C2) having a low sulfur content examples include trade name “SNH3” (manufactured by Sankyo Oil Chemical Co., Ltd.) and trade name “SNH8SP” (manufactured by Sankyo Oil Chemical Industries, Ltd.). ), Trade name “SUNPURE N100” (manufactured by Nippon San Oil Co., Ltd.).
- the process oil (C) has an area ratio of a region having a molecular weight of 500 or less, preferably 5% or less with respect to the total peak area. Yes, more preferably 4% or less.
- the process oil (C) having a low molecular weight component By using such process oil (C) having a low molecular weight component, the amount of outgas from the mask adhesive can be reduced.
- the area ratio of the low molecular weight region can be controlled by the polymerization conditions and purification of the process oil (C).
- the amount of process oil (C) contained in the mask adhesive is 20 to 150 parts by mass with respect to 100 parts by mass of the thermoplastic elastomer (A).
- the amount of process oil (C) is preferably 40 to 100 parts by mass, and more preferably 50 to 70 parts by mass. When the amount of the process oil (C) is within the range, the flexibility of the mask adhesive is easily increased.
- the mask adhesive further includes components other than the thermoplastic elastomer (A), the tackifier resin (B), and the process oil (C) as long as the objects and effects of the present invention are not impaired. Also good.
- other components include softeners, fluidity modifiers, and the like.
- the softener is not particularly limited as long as it is a material other than the process oil (C) and can impart flexibility to the thermoplastic elastomer (A).
- Specific examples of the softening agent include polybutene, hydrogenated polybutene, unsaturated polybutene, aliphatic hydrocarbon, acrylic polymer, and the like.
- the amount of the softening agent is preferably 5 parts by mass or less and more preferably 1 part by mass or less with respect to 100 parts by mass of the thermoplastic elastomer (A).
- the fluidity adjusting agent is a component for adjusting the fluidity of the obtained mask adhesive.
- the fluidity modifier include waxes of various resins.
- Specific examples of the wax include highly elastic materials such as polyethylene wax and polypropylene wax.
- the amount of the fluidity adjusting agent is preferably 10 parts by mass or less and more preferably 1 part by mass or less with respect to 100 parts by mass of the thermoplastic elastomer (A) from the viewpoint of further suppressing adhesive residue.
- the tan ⁇ peak temperature of the mask adhesive of the present invention is ⁇ 10 to 30 ° C., more preferably ⁇ 5 to 30 ° C., and further preferably ⁇ 1 to 15 ° C.
- the mounting operation of the pellicle on the mask, exposure using the mask, and the like are usually performed at room temperature. Therefore, when the tan ⁇ peak temperature of the mask adhesive is within the above range, plastic deformation is likely to occur under normal temperature conditions, and the strain energy of the pellicle frame can be effectively reduced. Furthermore, the mask adhesive of the present invention is less likely to leave glue. For this reason, even if a mask adhesive touches an operator's hand, it is easy to leave
- the maximum value of tan ⁇ of the mask adhesive is preferably 1.3 to 5, and more preferably 1.3 to 3. It can be said that the higher the maximum value of tan ⁇ , the easier the mask adhesive is plastically deformed. Therefore, when tan ⁇ of the mask adhesive is 1.3 or more, the distortion energy of the pellicle frame is easily relaxed by the mask adhesive when the pellicle is bonded to the mask. However, if the maximum value of tan ⁇ is too high, the mask adhesive tends to be excessively deformed, and it tends to be difficult to maintain the shape of the mask adhesive layer in the pellicle.
- the storage elastic modulus (G ′) at 25 ° C. of the mask adhesive is preferably 1 ⁇ 10 3 to 1 ⁇ 10 7 Pa, more preferably 1 ⁇ 10 4 to 1 ⁇ 10 6 Pa.
- a mask adhesive having a storage elastic modulus (G ′) in the above range has good handling properties when used for a pellicle. Note that the storage elastic modulus (G ′) of the mask adhesive tends to increase as the content of the thermoplastic elastomer (A) increases. Further, the loss elastic modulus (G ′′) at 25 ° C.
- the tan ⁇ , storage elastic modulus (G ′) and loss elastic modulus (G ′′) of the mask adhesive can be measured by the same method as described above.
- the outgas amount of the mask adhesive is preferably 20.0 ⁇ g / g or less, and more preferably 10 ⁇ g / g or less.
- the smaller the outgas amount the smaller the number of substances that cause haze, so that the generation of haze tends to be further suppressed.
- the outgas amount is a value obtained by measuring the amount of outgas generated when the mask adhesive is heated at 100 ° C. for 30 minutes as the amount of generated gas (in terms of undecane).
- the mask adhesive of the present invention preferably has a peel strength from a quartz glass substrate at 23 ° C. of 50 to 300 gf (0.49 to 2.94 N), and more preferably 100 to 250 gf.
- the strength of the peel strength from the quartz glass substrate can be used as an indicator of the presence or absence of adhesive residue when the pellicle is peeled from the mask. If the peel strength from the quartz glass substrate at 23 ° C. is within the above numerical range, it is difficult for adhesive to remain. Moreover, even if the mask adhesive touches the operator's hand, it can be easily removed from the hand, and the handleability is excellent.
- the peel strength is less than 50 gf, the adhesion reliability may be deteriorated, for example, the pellicle may fall off during use or the attachment position may be displaced.
- the peel strength exceeds 300 gf, adhesive residue may occur after peeling.
- the peel strength of the mask adhesive can be measured according to the following method. First, a cleaned quartz glass substrate (model “# 6025 substrate”, manufactured by HOYA, size: 152 mm ⁇ 152 mm ⁇ 6.35 mm) is prepared. Then, the mask adhesive was placed on the quartz glass substrate in accordance with the shape of the pellicle, and an aluminum pellicle frame (outside dimension: 149 mm ⁇ 122 mm, frame height H: 5.8 mm, (Frame width W: 2 mm) is placed. The size of the mask adhesive is set to an outer dimension: 149 mm ⁇ 122 mm and a frame width W: 1.6 mm.
- the weight is removed to obtain a laminate composed of a quartz glass substrate, a mask adhesive, and a pellicle frame. Then, the obtained laminated body is accommodated in a glass substrate stand and stored at 23 ° C. for 10 days to stabilize the adhesion and prepare a measurement sample.
- FIG. 1 is a cross-sectional view schematically showing a method for measuring the peel strength of a mask adhesive.
- a laminate composed of a quartz glass substrate 20, a mask adhesive layer 22, and a pellicle frame 24 is applied to, for example, a peeling jig 28 of a standard universal testing machine (manufactured by Intesco).
- the projections 28 are set so as to be fitted into jig holes (not shown) of the pellicle frame 24.
- a weight 26 is placed on the quartz glass substrate 20.
- the load measuring load cell of the standard universal testing machine is set to a speed of 20 mm / min, and the end of the arm 32 of the peeling jig 28 is pushed down by the pushing jig 30 under the condition of 23 ° C. At this time, the load required for the mask adhesive layer 22 to peel from the quartz glass substrate 20 is defined as “peel strength (gf)”.
- the residual stress rate R (900) defined by the following formula (1) of the mask adhesive is preferably 0 ⁇ R (900) ⁇ 20%, and 0 ⁇ R (900) ⁇ 15%. Is more preferable.
- the mask adhesive easily relaxes the distortion (stress) of the pellicle frame.
- Stress residual ratio R (900) ⁇ F (900) / F (0) ⁇ ⁇ 100 (1)
- F (0) represents the maximum stress measured by the stress relaxation measurement
- F (900) represents the stress after the test time of 900 seconds measured by the stress relaxation measurement. .
- the degree of stress relaxation of the mask adhesive (speed at which stress is relaxed) varies depending on the material constituting the mask adhesive, but can be quantified by the above-described stress residual ratio R (t).
- This residual stress rate R (t) is expressed as the ratio (%) of the stress F (t) after the test elapsed time t seconds to the maximum stress F (0).
- the residual stress of the pellicle frame is relaxed by the mask adhesive layer (after the distortion of the mask is eliminated), and the process proceeds to the next process.
- the time for reducing the residual stress is short.
- t 900 seconds.
- the residual stress rate R (900 s) is used as an index.
- the residual stress rate measured at 23 ° C. is used as an index.
- F (0) and F (900) are values specified using a rheometer under the condition of 23 ° C.
- a dynamic viscoelasticity measuring device (trade name “ARES”, manufactured by TA Instruments Inc.) can be used.
- F (0) and F (900) sandwich a disc-shaped sample piece (diameter: 25 mm ⁇ thickness: 2 mm) between two parallel plates (diameter: 25 mm) as measurement jigs, After adjusting the thickness of the sample piece to a predetermined initial gap, it is specified under the conditions of a shearing mode, a strain of 1%, a measurement temperature of 23 ° C., and an initial gap of 2 mm in a nitrogen atmosphere.
- the pellicle of the present invention includes a pellicle frame, a pellicle film disposed on one end surface of the pellicle frame, and a mask adhesive layer including a mask adhesive disposed on the other end surface of the pellicle frame.
- FIG. 2 is a schematic view showing an embodiment of a pellicle according to the present invention.
- the pellicle 10 of this embodiment includes a pellicle film 12 and a pellicle frame 14 that supports the outer periphery of the pellicle film 12.
- the pellicle film 12 is stretched through a film adhesive layer 13 on one end face of the pellicle frame 14.
- a mask adhesive layer 15 is provided on the other end surface of the pellicle frame 14.
- the mask adhesive layer 15 is formed by the aforementioned mask adhesive.
- the pellicle film 12 is held by a pellicle frame 14 and covers the exposure area of the mask. Therefore, the pellicle film 12 has translucency so as not to cut off energy by exposure.
- Examples of the material of the pellicle film 12 include quartz glass, a transparent material such as a fluororesin and cellulose acetate.
- the pellicle frame 14 is an anodized aluminum frame or the like.
- the pellicle frame 14 is preferably black. This is to prevent reflection of exposure light and to easily inspect the presence or absence of adhered foreign matter.
- the film adhesive layer 13 bonds the pellicle frame 14 and the pellicle film 12 together.
- the film adhesive layer 13 include fluoropolymers such as an acrylic resin adhesive, an epoxy resin adhesive, a silicon resin adhesive, and a fluorine-containing silicon adhesive.
- the mask adhesive layer 15 can be formed by applying and drying the mask adhesive described above.
- the method for applying the mask adhesive may be a known method.
- the mask adhesive can be applied to a desired location by a method of pressing a spatula-shaped application nozzle against the end surface of the pellicle frame and discharging the mask adhesive from the application nozzle.
- the thickness of the mask adhesive layer 15 is about 0.3 to 1.0 mm.
- a release sheet (separator) for protecting the mask adhesive layer 15 may be disposed on the surface of the mask adhesive layer 15.
- the release sheet include a polyethylene terephthalate film and a polypropylene film. The release sheet is peeled off when the pellicle is mounted on the mask.
- the pellicle 10 is mounted on the mask via the mask adhesive layer 15 after the release sheet is peeled off. Foreign matter adhering to the mask causes poor resolution on the wafer. For this reason, the pellicle 10 is mounted so as to cover the exposure area of the mask. This prevents foreign matter from adhering to the mask.
- a pellicle mounter (for example, manufactured by Matsushita Seiki Co., Ltd.) is used to mount the pellicle 10 on the mask. Place the pellicle and mask on the pellicle mounter and press the pellicle to the mask.
- the pressure bonding condition depends on the type of the mask and the like, but may be pressure bonded for about 3 minutes at a pressure of about 20 kgf / cm 2 at room temperature, for example.
- the mask may be a glass substrate such as synthetic quartz or quartz glass on which a patterned light-shielding film is disposed.
- the light shielding film may be a film having a single layer structure or a multilayer structure of metal such as Cr or MoSi.
- the thickness of a mask can be about 6 mm, for example.
- Exposure light used for lithography such as a process for forming a circuit pattern drawn on a semiconductor element is a short wavelength such as a mercury lamp i-line (wavelength 365 nm), KrF excimer laser (wavelength 248 nm), ArF excimer laser (wavelength 193 nm), etc.
- the exposure light is used.
- the mask adhesive has a low sulfur content and hardly generates ammonium sulfate that causes an increase in the haze of the pellicle film. Therefore, even if the mask to which the pellicle is bonded is repeatedly used, it is difficult to cause a reduction in patterning accuracy, a reduction in the amount of exposure light, and the like.
- the mask adhesive is plastically deformed moderately in the exposure temperature range. Therefore, when the pellicle is mounted on the mask, the mask adhesive layer absorbs and relaxes the distortion energy of the pellicle, and the mask is difficult to be distorted. That is, a decrease in patterning accuracy due to mask distortion can be suppressed.
- the above-described mask adhesive has the advantage that after the pellicle is peeled from the mask, the adhesive remains on the mask and the handling property is excellent.
- the pellicle of the present invention is particularly suitable for double patterning because it prevents the distortion of the pellicle from being transmitted to the mask.
- H-SIS Styrene-hydrogenated isoprene-styrene block copolymer (trade name “HIBLER 7125” (manufactured by Kuraray Co., Ltd.), tan ⁇ peak temperature ⁇ 5 ° C., styrene content 20% by mass, sulfur content 3 ⁇ g / g or less)
- SEBS Styrene-ethylene-butylene-styrene block copolymer (trade name “G1657” (manufactured by KRATON), tan ⁇ peak temperature ⁇ 48 ° C., sulfur content 3 ⁇ g / g or less)
- Tackifying resin (B)) P-100 C9 hydrogenated petroleum resin (trade name “Arcon P-100” (manufactured by Arakawa Chemical Industries), softening point 100 ⁇ 5 ° C., number average molecular weight (Mn) 610)
- PW-90 (a (purified product): paraffinic process oil (trade name “Diana Process Oil PW-90” (manufactured by Idemitsu Kosan Co., Ltd.), sulfur content 3 ⁇ g / g, number average molecular weight (Mn) 850, kinematic viscosity (40 ° C.) 87 mm 2 / s, paraffin carbon ratio (% CP) 71%, naphthene carbon ratio (% CN) 32%, low molecular weight with molecular weight of 500 or less in molecular weight distribution measured by gel permeation chromatograph The area ratio of the peak in the region is 3.7% or less of the total peak area.
- PW-90 (b (unrefined product): Paraffinic process oil (trade name “Diana Process Oil PW-90” company Ltd.), a sulfur content of 3 [mu] g / g, number average molecular weight (Mn) 790, kinematic viscosity (40 °C) 87mm 2 / s , the proportion of paraffin carbon (% CP) 70
- Mn number average molecular weight
- Mn number average molecular weight
- kinematic viscosity 40 °C
- % CP paraffin carbon
- PW-380 Paraffinic process oil (trade name “Diana Process Oil PW-380” (manufactured by Idemitsu Kosan Co., Ltd.), sulfur content 2 ⁇ g / g, number average molecular weight (Mn) 1220, kinematic viscosity (40 ° C.) 385 mm 2 / S, paraffin carbon ratio (% CP) 73% CP, naphthene carbon ratio (% CN) 30%, in the molecular weight distribution measured by gel permeation chromatography, the peak area in the low molecular weight region with a molecular weight of 500 or less Proportion is 0.8% or less of the total peak area
- MR-200 Paraffinic process oil Trade name "Neobakku MR-200" (MORESCO Corporation), a sulfur content of 2500 g / g, number average molecular weight (Mn) 500, kinematic viscosity (40 °C) 71mm 2 / s , the proportion of paraffin
- pellicle Preparation of pellicle [Example 1] -Preparation of mask adhesive 100 parts by mass of H-SIS as thermoplastic elastomer (A), 100 parts by mass of P-100 as tackifying resin (B), 60 parts by mass of PW-90 as process oil (C), Mixed. 48 g of the mixture was put into a lab plast mill (manufactured by Toyo Seiki Seisakusho, internal volume: 60 mL) and sealed. And it knead
- anodized aluminum pellicle frame 14 (outside dimensions: 149 mm x 122 mm, frame height H: 5.8 mm, frame width W: 2 mm) as shown in FIG. 2 was prepared. Then, a molten mask adhesive extruded from the needle tip communicating with the heating tank was applied to one end face of the pellicle frame 14 to form a mask adhesive layer 15. The thickness of the mask adhesive layer 15 was 0.6 mm. A separator was disposed on the surface of the mask adhesive layer 15. The pellicle film 12 was adhered to the other end face (end face on which the mask adhesive layer 15 was not formed) of the pellicle frame 14 via the film adhesive layer 13 to obtain the pellicle 10.
- Examples 2 and 3 and Comparative Examples 1 and 2 As shown in Table 1 below, a mask adhesive was prepared and a pellicle was prepared in the same manner as in Example 1 except that the composition of the mask adhesive was changed.
- the sulfur content of mask adhesive is precisely determined by weighing the mask adhesive in a sample boat and burning it at 900 ° C (combustion furnace set temperature) in an Ar / O 2 stream. The generated gas was absorbed into the absorbing solution. Then, the amount of sulfur atoms was quantified by ion chromatography (device used: ICS-3000 (Thermo Fisher Scientific)). In addition, it measured similarly about the sulfur content of the above-mentioned process oil.
- the storage elastic modulus (G ′) and loss elastic modulus (G ′′) at 25 ° C. were also specified.
- the weight was removed to obtain a laminate composed of a quartz glass substrate, a mask adhesive layer, and a pellicle frame.
- the obtained laminate was stored in a glass substrate stand and stored at 23 ° C. for 10 days to stabilize the adhesion and prepare a measurement sample.
- a laminate composed of a quartz glass substrate 20, a mask adhesive layer 22, and a pellicle frame 24 is placed on a peeling jig 28 of a standard universal testing machine (manufactured by Intesco).
- the protrusion was set so as to fit into a jig hole (not shown) of the pellicle frame 24.
- a weight 26 was placed on the quartz glass substrate 20.
- the load cell for load measurement of the standard universal testing machine was set to a speed of 20 mm / min, and the end of the arm 32 of the peeling jig 28 was pushed down by the pushing jig 30 under the condition of 23 ° C.
- the load required for the mask adhesive layer 22 to peel from the quartz glass substrate 20 was specified as “peel strength (gf)”.
- Mask distortion amount A pellicle mounter (manufactured by Matsushita Seiki Co., Ltd.) and a mask made of quartz glass (thickness: 6.35 mm) and a mask made of quartz glass were installed at a temperature: Pressure bonding was performed under conditions of normal temperature (25 ° C.), pressure: 20 kgf / cm 2 , and pressure bonding time: 3 minutes. Then, the amount of distortion of the mask on which the pellicle was mounted was measured using a flatness measurement analyzer (trade name “UltraFlat 200 Mask”, manufactured by Corning Tropel). The measurement area was 146 mm 2 .
- the mask with the pellicle is usually distorted like a bow reflecting the distortion of the pellicle frame (aluminum frame).
- the distortion state of the mask is shown as a contour diagram, and the difference between the maximum value and the minimum value of the distortion amount is shown.
- the mask distortion is preferably as small as possible, and is most preferably “0” (that is, no distortion).
- pattern displacement amount (nm) the difference between the measured distance (X) and the amount (Y) by which the mask was displaced. Note that the smaller the pattern displacement amount, the better. The case where the pattern displacement amount was 5 nm or less was evaluated as “good”, and the case where it exceeded 5 nm was evaluated as “bad”.
- Adhesive residue A pellicle was attached to the mask in the same manner as the measurement of the distortion amount of the mask. Then, the pellicle was peeled off from the mask, and the surface of the mask after peeling off the pellicle using an illumination device (trade name: High Illuminance Halogen Illumination Device 370TFI / R, manufactured by Sener & Burns) was observed with a microscope.
- an illumination device trade name: High Illuminance Halogen Illumination Device 370TFI / R, manufactured by Sener & Burns
- the sulfur content of the mask adhesive is more than 300 ⁇ g / g, it can be seen that there is room for improvement in the amount of foreign matter adhered during exposure (Comparative Example 1). If the sulfur content in the mask adhesive is high, it is assumed that the sulfur reacts with ozone and ammonium ions generated during ArF light irradiation, and ammonium sulfate is likely to adhere to the pellicle film.
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Abstract
Description
[1]周波数1Hzの条件で測定される損失正接が最大値を示す温度が-20~30℃である熱可塑性エラストマー(A)100質量部と、粘着付与樹脂(B)20~150質量部と、プロセスオイル(C)20~150質量部と、を含むマスク接着剤であり、前記熱可塑性エラストマー(A)は、スチレン系熱可塑性エラストマー、(メタ)アクリル酸エステル系熱可塑性エラストマー、およびオレフィン系熱可塑性エラストマーからなる群より選択される少なくとも一種であり前記プロセスオイル(C)は、パラフィン炭素の割合(%CP)とナフテン炭素の割合(%CN)との合計が50%以上であり、前記マスク接着剤の周波数1Hzの条件で測定される損失正接が最大値を示す温度が-10~30℃であり、かつ硫黄含有量が300μg/g以下である、マスク接着剤。
[3]前記プロセスオイル(C)におけるパラフィン炭素の割合(%CP)が50%以上である、[1]または[2]に記載のマスク接着剤。
[4]前記プロセスオイル(C)がパラフィン系プロセスオイル(C1)を含み、前記パラフィン系プロセスオイル(C1)の数平均分子量が、300~1500である、[1]~[3]のいずれかに記載のマスク接着剤。
[5]前記パラフィン系プロセスオイル(C1)の40℃における動粘度が、50~400mm2/sである、[4]に記載のマスク接着剤。
[7]前記熱可塑性エラストマー(A)が、スチレン系熱可塑性エラストマーである、[1]~[6]のいずれかに記載のマスク接着剤。
[8]前記スチレン系熱可塑性エラストマーが、第一のポリスチレンブロック、側鎖にイソプロペニル基を持ったポリイソプレンブロック、および第二のポリスチレンブロックを有するトリブロック共重合体、ならびに/またはその水素添加物である、[7]に記載のマスク接着剤。
[9]前記粘着付与樹脂(B)の、JIS K-2207に定められた環球法に基づいて測定される軟化点が60~150℃である、[1]~[8]のいずれかに記載のマスク接着剤。
[11]前記粘着付与樹脂(B)が、ロジンおよびその誘導体、ポリテルペン樹脂およびその水素化物、テルペンフェノール樹脂およびその水素化物、芳香族変性テルペン樹脂およびその水素化物、クマロン・インデン樹脂、脂肪族系石油樹脂、脂環族系石油樹脂およびその水素化物、芳香族系石油樹脂およびその水素化物、脂肪族芳香族共重合系石油樹脂、ならびにジシクロペンタジエン系石油樹脂およびその水素化物からなる群より選択される少なくとも一種である、[1]~[10]のいずれかに記載のマスク接着剤。
本発明のマスク接着剤には、特定の熱可塑性エラストマー(A)と、粘着付与樹脂(B)と、プロセスオイル(C)と、が所定の比率で含まれている。当該マスク接着剤には、必要に応じて軟化剤やワックス等、その他の成分がさらに含まれていてもよい。
以下、本発明のマスク接着剤に含まれる各成分について説明する。
熱可塑性エラストマー(A)のtanδピーク温度は-20~30℃であり、-20~25℃であることが好ましく、-20~20℃であることがより好ましく、-20℃~0℃であることがさらに好ましい。tanδピーク温度が上記の範囲内である熱可塑性エラストマー(A)をベースポリマーとして用いると、粘着付与樹脂(B)の配合量を少なくしても、得られるマスク接着剤のtanδピーク温度を-10~30℃の範囲内とすることができる。このため、露光温度域において塑性変形し易く、かつベタつきが抑制されたマスク接着剤とすることができる。
粘着付与樹脂(B)の軟化点は60~150℃であることが好ましく、90~120℃であることがさらに好ましく、より好ましくは90~110℃である。
プロセスオイル(C)とは、高沸点の石油留分であり、一般的にパラフィン系プロセスオイル(C1)、ナフテン系プロセスオイル(C2)、および芳香族系プロセスオイルに分類される。本発明のマスク接着剤には、プロセスオイル(C)として、パラフィン炭素(%CP)とナフテン炭素(%CN)との合計が50%以上のものを用いる。一方、芳香環を構成する炭素の割合(%CA)は、マスク接着剤の動粘度を低下させてパターンの位置ずれをより抑制する観点から、10%以下であることが好ましく、5%以下がより好ましく、1%以下がさらに好ましい。
マスク接着剤には、本発明の目的および効果を損なわない範囲で、熱可塑性エラストマー(A)、粘着付与樹脂(B)、およびプロセスオイル(C)以外の成分がさらに含まれていてもよい。その他の成分の例には、軟化剤、流動性調整剤等が含まれる。
本発明のマスク接着剤のtanδピーク温度は-10~30℃であるが、-5~30℃であることがより好ましく、-1~15℃であることがさらに好ましい。ペリクルのマスクへの装着作業や、マスクを用いた露光等は通常、常温で行われる。そのため、マスク接着剤のtanδピーク温度が上記範囲内にあると、常温条件下で塑性変形しやすく、ペリクルフレームの歪みエネルギーを効果的に緩和することが可能となる。さらに、本発明のマスク接着剤は糊残りし難い。このため、マスク接着剤が作業者の手に触れても、手から離れ易く、ハンドリング性にも優れる。
応力残留率R(900)={F(900)/F(0)}×100 ・・・(1)
前記式(1)中、F(0)は応力緩和測定により測定される最大応力を示し、F(900)は、応力緩和測定により測定される、試験時間が900秒経過した後の応力を示す。
本発明のペリクルは、ペリクルフレームと、ペリクルフレームの一端面に配置されるペリクル膜と、ペリクルフレームの他端面に配置される、マスク接着剤を含むマスク接着剤層と、を備える。図2は、本発明のペリクルの一実施形態を示す模式図である。本実施形態のペリクル10は、ペリクル膜12と、ペリクル膜12の外周を支持するペリクルフレーム14とを有する。ペリクル膜12は、ペリクルフレーム14の一方の端面にある膜接着剤層13を介して張設されている。一方、ペリクルフレーム14をマスク(図示せず)に接着させるために、ペリクルフレーム14のもう一方の端面には、マスク接着剤層15が設けられている。マスク接着剤層15は、前述のマスク接着剤により形成される。
マスク接着剤の原料として、以下に示す各種成分を使用した。
H-SIS:スチレン-水素添加イソプレン-スチレンブロック共重合体(商品名「ハイブラー7125」(クラレ社製)、tanδピーク温度-5℃、スチレン含有割合20質量%、硫黄含有量3μg/g以下)
SEBS:スチレン-エチレン・ブチレン-スチレンブロック共重合体(商品名「G1657」(KRATON社製)、tanδピーク温度-48℃、硫黄含有量3μg/g以下)
P-100:C9系水素添加石油樹脂(商品名「アルコンP-100」(荒川化学工業社製)、軟化点100±5℃、数平均分子量(Mn)610)
PW-90(a(精製品)):パラフィン系プロセスオイル(商品名「ダイアナプロセスオイルPW-90」(出光興産社製)、硫黄含有量3μg/g、数平均分子量(Mn)850、動粘度(40℃)87mm2/s、パラフィン炭素の割合(%CP)71%、ナフテン炭素の割合(%CN)32%、ゲルパーミエーションクロマトグラフにより測定した分子量分布図における、分子量500以下の低分子量領域のピークの面積割合が、全体のピーク面積に対して3.7%以下
PW-90(b(未精製品)):パラフィン系プロセスオイル(商品名「ダイアナプロセスオイルPW-90」(出光興産社製)、硫黄含有量3μg/g、数平均分子量(Mn)790、動粘度(40℃)87mm2/s、パラフィン炭素の割合(%CP)70%、ナフテン炭素の割合(%CN)31%、ゲルパーミエーションクロマトグラフにより測定した分子量分布図における、分子量500以下の低分子量領域のピークの面積割合が、全体のピーク面積に対して7.1%以下
PW-380:パラフィン系プロセスオイル(商品名「ダイアナプロセスオイルPW-380」(出光興産社製)、硫黄含有量2μg/g、数平均分子量(Mn)1220、動粘度(40℃)385mm2/s、パラフィン炭素の割合(%CP)73%CP、ナフテン炭素の割合(%CN)30%、ゲルパーミエーションクロマトグラフにより測定した分子量分布図における、分子量500以下の低分子量領域のピークの面積割合が、全体のピーク面積に対して0.8%以下
MR-200:パラフィン系プロセスオイル(商品名「ネオバックMR-200」(MORESCO社製)、硫黄含有量2500μg/g、数平均分子量(Mn)500、動粘度(40℃)71mm2/s、パラフィン炭素の割合(%CP)68%、ナフテン炭素の割合(%CN)30%)
液状ポリブテン(日油社製ニッサンポリブテン30N)
(流動調整剤)
ポリプロピレンワックス(クラリアント社製リコセンPP6102)
上記プロセスオイルPW-90およびPW-380の分子量、および低分子量成分の割合は、GPCにより以下の装置や条件等により、測定した。
装置:GPC HLC-8320(東ソー社製)
溶剤:テトラヒドロフラン カラム:TSKgel G7000×1、TSKgel G4000×2、TSKgel G2000×1(何れも東ソー社製)
流速:1.0ml/分
試料:10mg/mL テトラヒドロフラン溶液
試料濃度:1g/L
注入量:5mL
検出器:赤外分光計
測定温度:40℃
標準物質:ポリスチレン
プロセスオイルMR-200の分子量については、ASTM D3238に準拠してndm環分析を行った。そして得られた温度粘度密度データを基にAlfred E.Hirschlerが発表した計算式に基づいて分子量を算出した。
[実施例1]
・マスク接着剤の調製
熱可塑性エラストマー(A)としてH-SISを100質量部、粘着付与樹脂(B)としてP-100を100質量部、プロセスオイル(C)としてPW-90を60質量部、混合した。当該混合物48gをラボプラストミル(東洋精機製作所社製、内容量:60mL)に投入して密閉した。そして、当該ラボプラストミルにて、200℃、100rpmで20分間混練して、塊状のマスク接着剤を得た。約10gのマスク接着剤を加熱タンク(タンク内温度:200℃)に投入して溶融させた。
一方、図2に示すような、陽極酸化処理したアルミニウム製のペリクルフレーム14(外寸:149mm×122mm、枠高さH:5.8mm、枠幅W:2mm)を用意した。そして、当該ペリクルフレーム14の一方の端面に、加熱タンクに連通する針先から押し出した溶融状態のマスク接着剤を塗布し、マスク接着剤層15を形成した。マスク接着剤層15の厚さは0.6mmとした。そして、マスク接着剤層15の表面にセパレータを配置した。ペリクルフレーム14の他方の端面(マスク接着剤層15が形成されていない側の端面)上に、膜接着剤層13を介してペリクル膜12を貼付してペリクル10を得た。
下記表1に示すように、マスク接着剤の組成を変更した以外は、実施例1と同様にマスク接着剤を調製し、ペリクルを作製した。
実施例および比較例で調製したマスク接着剤の物性、および実施例および比較例で作製したペリクルの評価を以下の手順で行った。
マスク接着剤の硫黄含有量は、マスク接着剤を試料ボートに精秤し、Ar/O2気流中、900℃(燃焼炉設定温度)で燃焼分解させて、発生ガスを吸収液に吸収させた。そして、イオンクロマトグラフ法(使用機器:ICS-3000(サーモフィッシャーサイエンティフィック))にて硫黄原子の量を定量した。なお、上述のプロセスオイルの硫黄含有量についても同様に測定した。
動的粘弾性測定装置(商品名「ARES」、TA インスツルメンツ社製)を使用し、円盤状のマスク接着剤からなる層(直径:25mm×厚さ:2mm)を測定治具である2枚のパラレルプレート(直径:25mm)の間に挟みこんだ。そして、試験片の厚みを所定の初期ギャップに調整した後、貯蔵弾性率(G’)と損失弾性率(G”)とを、窒素雰囲気下、ずりモード、周波数:1Hz、測定温度:-80~200℃、昇温速度:3℃/分、および初期Gap:2mmの条件で測定した。
得られた貯蔵弾性率(G’)と損失弾性率(G”)からtanδ(=G”/G’)を求めた。そして、tanδが最大値を示す温度(tanδピーク温度)、およびその最大値を特定した。また、25℃における貯蔵弾性率(G’)および損失弾性率(G”)も特定した。
動的粘弾性測定装置(商品名「ARES」、TA インスツルメンツ社製)を使用し、円盤状のマスク接着剤からなる層(直径:25mm×厚さ:2mm)を測定治具である2枚のパラレルプレート(直径:25mm)の間に挟みこみ、試料片の厚みを所定の初期ギャップに調整した後、窒素雰囲気下、ずりモード、歪:1%、測定温度:23℃、および初期Gap:2mmの条件で、測定時間tにおける応力F(t)を測定した。得られた「最大応力F(0)」と、試験時間が900秒経過した後の応力「F(900)」とから、応力残留率R(900)を算出した。
清浄にした石英ガラス基板(型式「#6025基板」、HOYA社製、サイズ:152mm×152mm×6.35mm)を準備した。当該石英ガラス基板上に、枠状にマスク接着剤(外寸:149mm×122mm、枠幅W:1.6mm)を塗布した。そして、当該マスク接着剤層上に、ペリクルフレーム(外寸:149mm×122mm、枠高さH:5.8mm、枠幅W:2mm)を載置した。そして、ペリクルフレーム上に30kgの分銅を載置して3分間保持した後、分銅を取り除き、石英ガラス基板とマスク接着剤層とペリクルフレームとからなる積層体を得た。得られた積層体をガラス基板立てに収納し、23℃で10日間保管して密着力を安定化させて測定用サンプルとした。
ペリクルマウンター(松下精機社製)に、実施例または比較例で作製したペリクルと、石英ガラス製のマスク(厚み:6.35mm)と、を設置し、これらを温度:常温(25℃)、圧力:20kgf/cm2、圧着時間:3分間の条件で圧着させた。そして、ペリクルが装着されたマスクの歪み量を、平面度測定解析装置(商品名「UltraFlat200Mask」、Corning Tropel社製)を使用して測定した。なお、測定面積は146mm2とした。
マスクの歪み量測定と同様に、マスクにペリクルを装着した。そして、半導体露光装置(商品名「ArF液浸スキャナー NSR-S610C」、ニコン社製)にて、当該マスクを介してウエハ(6025基板、厚さ:6.35mm、長さ:151.95mm)を2回露光し、ウエハにパターンを焼き付けた。より具体的には、1回目の露光を行った後、マスクをずらして2回目の露光を行った。そして、1回目の露光で形成されたパターンと、2回目の露光で形成されたパターンとのずれ量(距離)を走査型電子顕微鏡(SEM)で観察して測定した。そして、測定された距離(X)と、マスクをずらした量(Y)との差(X-Y)を「パターンの位置ずれ量(nm)」とした。なお、パターンの位置ずれ量は小さいほど好ましく、パターンの位置ずれ量が5nm以下であった場合を「良好」、5nm超であった場合を「不良」と評価した。
マスクの歪み量測定と同様に、マスクにペリクルを装着した。そして、マスクからペリクルを剥がし、照明装置(商品名:高照度ハロゲン照明装置370TFI/R、セナーアンドバーンズ社製)を使用してペリクルを剥がした後のマスクの表面をマイクロスコープで観察した。糊残りが認められた場合には、その幅を測定し、以下の基準で評価した。
A:接着剤の幅に対する糊残りの幅の割合が5%未満であった。または糊残りが認められなかった
B:接着剤の幅に対する糊残りの幅の割合が5%以上20%未満であった
C:接着剤の幅に対する糊残りの幅の割合が20%以上であった
マスク接着剤10mgを2口のキャップが付いたガラスインサートに入れ、加熱脱着装置(TDTS-2020)にセットし、片側からキャリアガスとしてH2ガスを流し込みながら100℃で30分間加熱し揮発性成分を抽出後、-20℃のコールドトラップで凝集した。次いで、コールドトラップを10℃/分で280℃まで再加熱し、抽出し凝集した揮発性成分をガスクロマトグラフ(GC)及び質量分析計を用いて発生ガス量(ウンデカン換算)として測定した。測定には株式会社島津製作所製の加熱脱着GC-MS(TDTS-2010)、ガスクロマトグラフ(GC-2010)、質量分析計(GCMS-QP2010)を使用した。
図3に示すように、石英ガラス41(外寸:20cm×20cm、厚み:2.3mm)の上に実施例および比較例で作製したペリクル10を貼付けた。そして、ペリクルを45°傾けて固定し、5mm角のArF光42(エネルギー密度0.5mJ/cm2、頻度1000Hz)をペリクルフレーム14の内面とマスク接着剤層15とに当たるよう照射した。
そして、照射部のArF光42の積算エネルギー量が1000Jであるとき、2000Jであるとき、3000Jであるとき、4000Jであるとき、および5000Jであるときに、ペリクル膜12の内面に発生した0.3μm以上の異物の個数を膜面異物検査機(山梨技術工房社製、YPI-MX)で計測した。
12 ペリクル膜
13 膜接着剤層
14、24 ペリクルフレーム
15 マスク接着剤層
20 石英ガラス基板
22 マスク接着剤層
26 重り
28 剥離治具
30 押し下げ治具
32 アーム
41 石英ガラス
42 ArF光
Claims (12)
- 周波数1Hzの条件で測定される損失正接が最大値を示す温度が-20~30℃である熱可塑性エラストマー(A)100質量部と、
粘着付与樹脂(B)20~150質量部と、
プロセスオイル(C)20~150質量部と、
を含むマスク接着剤であり、
前記熱可塑性エラストマー(A)は、スチレン系熱可塑性エラストマー、(メタ)アクリル酸エステル系熱可塑性エラストマー、およびオレフィン系熱可塑性エラストマーからなる群より選択される少なくとも一種であり、
前記プロセスオイル(C)は、パラフィン炭素の割合(%CP)とナフテン炭素の割合(%CN)との合計が50%以上であり、
前記マスク接着剤の周波数1Hzの条件で測定される損失正接が最大値を示す温度が-10~30℃であり、かつ硫黄含有量が300μg/g以下である、
マスク接着剤。 - 前記プロセスオイル(C)の硫黄含有量が2000μg/g以下である、
請求項1に記載のマスク接着剤。 - 前記プロセスオイル(C)におけるパラフィン炭素の割合(%CP)が50%以上である、
請求項1に記載のマスク接着剤。 - 前記プロセスオイル(C)がパラフィン系プロセスオイル(C1)を含み、
前記パラフィン系プロセスオイル(C1)の数平均分子量が、300~1500である、
請求項1に記載のマスク接着剤。 - 前記パラフィン系プロセスオイル(C1)の40℃における動粘度が、50~400mm2/sである、
請求項4に記載のマスク接着剤。 - アウトガス量が20.0μg/g以下である、
請求項1に記載のマスク接着剤。 - 前記熱可塑性エラストマー(A)が、スチレン系熱可塑性エラストマーである、
請求項1に記載のマスク接着剤。 - 前記スチレン系熱可塑性エラストマーが、第一のポリスチレンブロック、側鎖にイソプロペニル基を持ったポリイソプレンブロック、および第二のポリスチレンブロックを有するトリブロック共重合体、ならびに/またはその水素添加物である、
請求項7に記載のマスク接着剤。 - 前記粘着付与樹脂(B)の、JIS K-2207に定められた環球法に基づいて測定される軟化点が60~150℃である、
請求項1に記載のマスク接着剤。 - 前記粘着付与樹脂(B)の数平均分子量が300~3000である、
請求項1に記載のマスク接着剤。 - 前記粘着付与樹脂(B)が、ロジンおよびその誘導体、ポリテルペン樹脂およびその水素化物、テルペンフェノール樹脂およびその水素化物、芳香族変性テルペン樹脂およびその水素化物、クマロン・インデン樹脂、脂肪族系石油樹脂、脂環族系石油樹脂およびその水素化物、芳香族系石油樹脂およびその水素化物、脂肪族芳香族共重合系石油樹脂、ならびにジシクロペンタジエン系石油樹脂およびその水素化物からなる群より選択される少なくとも一種である、
請求項1に記載のマスク接着剤。 - ペリクルフレームと、前記ペリクルフレームの一端面に配置されるペリクル膜と、前記ペリクルフレームの他端面に配置される、請求項1~11のいずれか一項に記載のマスク接着剤を含むマスク接着剤層と、を備えたペリクル。
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