US20070020167A1 - Method of preparing catalyst for manufacturing carbon nanotubes - Google Patents
Method of preparing catalyst for manufacturing carbon nanotubes Download PDFInfo
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- US20070020167A1 US20070020167A1 US11/158,047 US15804705A US2007020167A1 US 20070020167 A1 US20070020167 A1 US 20070020167A1 US 15804705 A US15804705 A US 15804705A US 2007020167 A1 US2007020167 A1 US 2007020167A1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
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- D—TEXTILES; PAPER
- D01—NATURAL OR MAN-MADE THREADS OR FIBRES; SPINNING
- D01F—CHEMICAL FEATURES IN THE MANUFACTURE OF ARTIFICIAL FILAMENTS, THREADS, FIBRES, BRISTLES OR RIBBONS; APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OF CARBON FILAMENTS
- D01F9/00—Artificial filaments or the like of other substances; Manufacture thereof; Apparatus specially adapted for the manufacture of carbon filaments
- D01F9/08—Artificial filaments or the like of other substances; Manufacture thereof; Apparatus specially adapted for the manufacture of carbon filaments of inorganic material
- D01F9/12—Carbon filaments; Apparatus specially adapted for the manufacture thereof
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y99/00—Subject matter not provided for in other groups of this subclass
Definitions
- the present invention relates to a method of preparing a catalyst for manufacturing carbon nanotubes and a method of manufacturing carbon nanotubes using the same.
- a carbon nanotube has a cylindrical structure having a diameter of several nano-meter and a very large aspect ratio of about 10 to 1,000.
- carbon atoms are generally arranged in a hexagonal honeycomb pattern.
- One carbon atom bonds to three adjacent carbon atoms.
- the carbon nanotube may be a conductor or a semiconductor according to its structure.
- As a conductor the carbon nanotube has high electroconductivity.
- the carbon nanotube has superior mechanical strength, Young's modulus of tera level, and high heat conductivity.
- the carbon nanotube having these properties can be advantageously used in various technical fields, such as an emitter of FED, a cathode material for a secondary battery, a catalyst support of a fuel cell, a high strength composite, and the like.
- Examples of a method of preparing the carbon nanotube include arc discharge, laser deposition, plasma enhanced chemical vapor deposition (PECVD), chemical vapor deposition, vapor phase growth, electrolysis, and the like.
- the vapor phase growth is suitable for preparing the carbon nanotube in bulk form since it synthesizes the carbon nanotube in a vapor phase by directly supplying a reaction gas and a catalytic metal into a reactor without using a substrate.
- the arc discharge and the laser deposition have relatively low yields of carbon nanotubes. When using the arc discharge and the laser deposition, It is difficult to control the diameter and the length of the carbon nanotube. Further, in the arc discharge and the laser deposition, clusters of amorphous carbon besides the carbon nanotubes are produced in a large amount, and thus a complicated purifying process must be performed.
- Chemical vapor deposition (CVD) methods such as thermal chemical vapor deposition, low pressure chemical vapor deposition and PECVD are generally used to form carbon nanotubes on a substrate.
- the carbon nanotubes can be synthesized at low temperatures by activating gas with a plasma.
- it is relatively easy to control the diameter, the length, the density, etc. of the carbon nanotube.
- catalyst particles on which carbon nanotubes grow based, are first dispersed on a substrate in order to obtain a uniform density of the carbon nanotubes formed on the substrate.
- Korean Patent Laid-Open Publication No. 2001-0049398 discloses a method of forming a plurality of catalyst particles by forming a catalytic metal film on a substrate and etching the catalytic metal film with an etching gas.
- the uniformity of the catalyst particles formed on the substrate can be evaluated by measuring the uniformity of the particle sizes of the catalyst particles and the uniformity of the production density of the catalyst particles.
- the uniformity of the catalyst particles formed by the conventional methods is not sufficient.
- a novel method of forming catalyst particles in order to improve the uniformity of the catalyst particles formed on a substrate is needed.
- a method of forming catalyst particles including: applying a catalytic metal precursor solution to a substrate, the catalytic metal precursor solution comprising a catalytic metal precursor and a solvent; freeze-drying the catalytic metal precursor solution applied to the substrate; and reducing the freeze-dried catalytic metal precursor to a catalytic metal.
- the catalytic metal precursor solution is freeze-dried by cooling the catalytic metal precursor solution applied to the substrate below the freezing point of the catalytic metal precursor solution and evaporating the solvent in the catalytic metal precursor solution under a reduced pressure.
- the method of forming catalyst particles can minimize the agglomeration and/or recrystallization of the catalytic metal particles when forming the catalytic metal particles by freeze-drying the catalytic metal precursor solution. Therefore, the catalytic metal particles formed by the method of the present invention have particle sizes with very high uniformity and are very uniformly distributed on the substrate.
- a method of manufacturing carbon nanotubes including: forming catalyst particles, on which carbon nanotubes grow based, on a substrate by applying a catalytic metal precursor solution to the substrate, freeze-drying the catalytic metal precursor solution applied to the substrate, and reducing the freeze-dried catalytic metal precursor to a catalytic metal; and growing carbon nanotubes on the catalyst particles by supplying a carbon source to the catalyst particles.
- a method of manufacturing carbon nanotubes including: applying a catalytic metal precursor solution to the substrate; cooling the catalytic metal precursor solution applied to the substrate below the freezing point of the catalytic metal precursor solution; evaporating the solvent in the catalytic metal precursor solution under a reduced pressure to form catalytic metal precursor particles; converting the catalytic metal precursor particles to a catalyst particles; and growing carbon nanotubes on the catalyst particles.
- the catalytic metal precursor particles is converted into the catalyst particles by heating the catalytic metal precursor particles in an oxidation atmosphere to oxidize the catalytic metal precursor particles and reducing the oxidized catalytic metal precursor particles to the catalyst particles by heat-treatment or plasma-treatment.
- FIG. 1 is an optical microscopic image illustrating catalyst particles for manufacturing carbon nanotubes, prepared according to an Example of the present invention
- FIG. 2 is an electron microscopic image illustrating a side view of carbon nanotubes prepared according to an Example of the present invention
- FIG. 3 is an electron microscopic image illustrating a top view of carbon nanotubes prepared according to an Example of the present invention
- FIG. 4 is an optical microscopic image illustrating catalyst particles for manufacturing carbon nanotubes, prepared according to a Comparative Example
- FIG. 5 is an enlarged view of a part of FIG. 4 ;
- FIG. 6 is an electron microscopic image illustrating a state of carbon nanotubes prepared according to a Comparative Example.
- the method of forming catalyst particles includes: applying a catalytic metal precursor solution to a substrate; freeze-drying the catalytic metal precursor solution applied to the substrate; and reducing the freeze-dried catalytic metal precursor to catalytic metal.
- the catalytic metal precursor solution includes a catalytic metal precursor and a solvent for dissolving the catalytic metal precursor.
- the catalytic metal precursor may be any material that can be converted to metal particles, on which carbon nanotubes can grow based.
- An example of the catalytic metal precursor includes an organo-metallic compound.
- the organo-metallic compound can contain at least one metal element selected from the group consisting of Fe, Co, Ni, Y, Mo, Cu, Pt, V, and Ti.
- Examples of the organo-metallic compound include iron acetate, iron oxalate, cobalt acetate, nickel acetate, ferrocene, or a mixture thereof.
- the solvent may be any liquid material that can dissolve the catalytic metal precursor.
- examples of the solvent include ethanol, ethylene glycol, polyethylene glycol, polyvinyl alcohol, and a mixture thereof.
- the concentration of the catalytic metal precursor in the catalytic metal precursor solution is not particularly limited. If the concentration of the catalytic metal precursor in the catalytic metal precursor solution is too low, the carbon nanotubes may not be generated in a subsequent process of manufacturing. If the concentration of the catalytic metal precursor in the catalytic metal precursor solution is too high, the diameter of the carbon nanotubes generated in a subsequent process of manufacturing may be increased or the crystallinity of the carbon nanotubes generated or carbon nanofibers may be reduced.
- the concentration of the catalytic metal precursor in the catalytic metal precursor solution can preferably be about 10 mM to 200 mM.
- the substrate may be composed of any material, to which catalyst particles can be attached, for example, a metal with a high melting point, such as Mo, Cr, and W, silicon, glass, plastic, quartz, and the like.
- a metal with a high melting point such as Mo, Cr, and W
- silicon glass, plastic, quartz, and the like.
- the method of applying the catalytic metal precursor solution to the substrate may be any method capable of uniformly coating the solution on the surface of the substrate. Examples of the method include dip coating, evaporation coating, screen printing, spin coating, and the like. These methods can also be used in a combination.
- the catalytic metal precursor solution can be applied to the entire surface of the substrate or on only a part of the surface of the substrate.
- the catalytic metal precursor solution applied to the substrate is freeze-dried.
- the freeze-drying process includes cooling the catalytic metal precursor solution applied to the substrate below the freezing point of the catalytic metal precursor solution and evaporating the solvent in the catalytic metal precursor solution under a reduced pressure.
- the freezing point of the catalytic metal precursor solution may vary depending on a composition of the catalytic metal precursor solution. That is, the freezing point of the catalytic metal precursor solution can be determined by the type of the catalytic metal precursor, the type of the solvent, the concentration of the catalytic metal precursor, and the like. The freezing point of the catalytic metal precursor solution can be easily determined by those skilled in the art through thermodynamical calculation and the method of trial and error. The freezing point of the catalytic metal precursor solution can also be selected by adjusting the composition of the catalytic metal precursor solution.
- the process of cooling the catalytic metal precursor solution applied to the substrate below the freezing point of the catalyst solution can be performed using a cooling method suitable for the freezing point of the catalytic metal precursor solution.
- a cooling method suitable for the freezing point of the catalytic metal precursor solution for example, a freezer, liquid nitrogen, etc. can be used.
- liquid nitrogen the catalytic metal precursor solution applied to the substrate can be cooled to below the freezing point of the catalytic metal precursor solution by dipping the substrate with the catalytic metal precursor solution applied thereto in liquid nitrogen.
- the substrate is subjected to a reduced pressure in order to allow the solvent in the frozen catalytic metal precursor solution to evaporate.
- the substrate with the frozen catalytic metal precursor solution applied thereto is placed in a vacuum chamber, and then the pressure of the inside of the vacuum chamber is reduced.
- the reduced pressure should be sufficient to allow the solvent in the frozen catalytic metal precursor solution to evaporate.
- the reduced pressure sufficient to allow the solvent in the frozen catalytic metal precursor solution to evaporate is abbreviated to “evaporation pressure”.
- the evaporation pressure can vary depending on a composition the used catalytic metal precursor solution. That is, the evaporation pressure can be determined by the type of the catalytic metal precursor, the type of the solvent, the concentration of the catalytic metal precursor, freezing point, and the like.
- the evaporation pressure of the catalytic metal precursor solution can be easily determined by those skilled in the art through thermodynamical calculation and the method of trial and error.
- the evaporation pressure of the catalytic metal precursor solution can also be selected by adjusting the composition of the catalytic metal precursor solution, freezing point, and the like.
- the solvent in the frozen catalytic metal precursor solution is removed through the evaporation.
- catalytic metal precursor components are formed in a particle form on the substrate. It is noted that the catalytic metal precursor particles formed according to the present method have particle size with high uniformity and a uniform distribution on the substrate.
- the catalytic metal precursor particles formed on the substrate are reduced to catalytic metal particles.
- the process of reducing the catalytic metal precursor particles to catalytic metal particles can be performed, for example, as follows. First, the catalytic metal precursor is converted into an oxide through heat-treatment in an oxidation atmosphere, and then the oxide is heat-treated or plasma treated in a reduction atmosphere to be reduced to a metal.
- the process of reducing the catalytic metal precursor can be performed by various methods known in the art, and thus, the detailed description thereof will be omitted herein.
- FIG. 1 is an electron microscopic image of catalytic metal particles prepared according to an Example of the present invention. Referring to FIG. 1 , the catalytic metal particles are uniformly distributed on the substrate and the particle sizes thereof are relatively uniform.
- the method of manufacturing carbon nanotubes includes forming catalyst particles, on which carbon nanotubes grow based, on a substrate by applying a catalytic metal precursor solution to the substrate, freeze-drying the catalytic metal precursor solution applied to the substrate, and reducing the freeze-dried catalytic metal precursor to catalytic metal; and growing carbon nanotubes on the catalyst particles by supplying a carbon source to the catalyst particles.
- the process of forming catalyst particles on the substrate is performed in the same manner as described in the method of forming catalyst particles.
- the process of growing carbon nanotubes on the catalyst particles by supplying the carbon source to the catalyst particles may be performed by various methods useful for the manufacture of carbon nanotubes.
- the process of growing carbon nanotubes on the catalyst particles includes placing the substrate on which the catalyst particles are formed in a reaction chamber, supplying carbon precursor gas into the reaction chamber, and decomposing the carbon precursor gas in the reaction chamber to supply carbon to the catalyst particles.
- the process of growing the carbon nanotubes can be performed by low pressure chemical vapor deposition, thermal chemical vapor deposition, PECVD, or a combination thereof.
- Examples of the carbon precursor gas include carbon containing compounds such as acetylene, methane, propane, ethylene, carbon monoxide, carbon dioxide, alcohol, and benzene.
- the internal temperature of the reaction chamber may preferably be in the range of about 450 to 1100° C.
- carbon nanotubes grow based on catalyst particles that have a uniform particle size and are uniformly distributed on the substrate, the uniformity of the resulting carbon nanotubes is also highly improved.
- the uniformity of carbon nanotubes is evaluated by the uniformity of the lengths and diameters of the carbon nanotubes.
- the lengths and diameters of carbon nanotubes can be measured by an electron microscope and a transmittance electron microscope, respectively.
- FIG. 2 is an image showing a side view of carbon nanotubes prepared in an Example of the present invention. Referring to FIG. 2 , the carbon nanotubes prepared according to the method of the present embodiment are vertically oriented without being entangled with one another.
- FIG. 3 is an image showing a top view of carbon nanotubes prepared in an Example of the present invention. Referring to FIG. 3 , the production density of carbon nanotubes prepared according to the method of the present embodiment is uniform.
- a 40 mM iron acetate solution was prepared using ethanol and ethylene glycol as a solvent. 20 mL of ethanol and 20 mL of ethylene glycol were added to 0.1 g of iron acetate powder to obtain a solution having a proper viscosity. A silicon substrate with a diameter of 20.32 cm was dipped in the obtained solution. The coated substrate was cooled immediately with liquid nitrogen and then transferred into a vacuum chamber. Then, a vacuum less than 0.1 mmHg was applied to the chamber in order to evaporate the solvent. To minimize an amount of the remained solvent, the substrate was further heated at 100° C.
- the freeze-dried substrate was heat-treated at 300° C. for 10 minutes in order to oxidize the iron acetate. Then, the substrate was subjected to a reduction treatment with hydrogen at 600° C.
- FIG. 1 is an electron microscopic image of iron particles formed on the silicon substrate according to the present Example. Referring to FIG. 1 , the iron particles are uniformly distributed on the substrate and the particle sizes thereof are relatively uniform.
- the substrate having iron particles formed thereon was placed in a reaction chamber for chemical vapor deposition (CVD), an internal temperature of which is 600° C., and then a mixed gas of carbon monoxide and hydrogen (weight ratio 1:2) was supplied to the reaction chamber for 20 minutes to synthesize carbon nanotubes based on the iron particles.
- CVD chemical vapor deposition
- FIG. 2 is an image showing a side view of carbon nanotubes prepared in the present Example. As is apparent from FIG. 2 , the carbon nanotubes prepared in the present Example are vertically oriented without being entangled with one another.
- FIG. 3 is an image showing a top view of carbon nanotubes prepared in the present Example. It can be seen from FIG. 3 that the production density of carbon nanotubes prepared in the present Example is uniform.
- Carbon nanotubes were synthesized in the same manner as in the above Example, except that the iron acetate solution applied to the substrate was not freeze-dried but naturally dried.
- FIG. 4 is an optical microscopic image showing iron particles prepared in Comparative Example.
- FIG. 5 is an enlarged view of a part of FIG. 4 . As seen from FIGS. 4 and 5 , iron particles prepared in Comparative Example have no uniformity.
- FIG. 6 is an electron microscopic image showing a form of carbon nanotube clusters synthesized in Comparative Example. Referring to FIG. 6 , the carbon nanotubes synthesized in Comparative Example are partially lumped on the substrate, are entangled with one another, and not vertically oriented.
- the method of forming catalyst particles according to an embodiment of the present invention can minimize the agglomeration and/or recrystallization of the catalyst particles when forming the catalyst particles by freeze-drying the catalyst metal precursor solution.
- the catalyst particles formed by the method of the present embodiment have a very uniform particle size and a very uniform distribution on the substrate.
- the carbon nanotubes grow based on the catalyst particles having a uniform particle size and a uniform distribution on the substrate, and thus, the synthesized carbon nanotubes have highly improved uniformity.
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Abstract
A novel method of forming catalyst particles, on which carbon nanotubes grow based, on a substrate with increased uniformity, and a method of synthesizing carbon nanotubes having improved uniformity are provided. A catalytic metal precursor solution is applied to a substrate. The applied catalytic metal precursor solution is freeze-dried, and then reduced to catalytic metal. The method of forming catalyst particles can minimize agglomeration and/or recrystallization of catalyst particles when forming the catalyst particles by freeze-drying the catalyst metal precursor solution. The catalyst particles formed by the method has a very uniform particle size and are very uniformly distributed on the substrate.
Description
- This application claims the priority of Korean Patent Application No. 10-2004-0046552, filed on Jun. 22, 2004, in the Korean Intellectual Property Office, the disclosure of which is incorporated herein in its entirety by reference.
- 1. Field of the Invention
- The present invention relates to a method of preparing a catalyst for manufacturing carbon nanotubes and a method of manufacturing carbon nanotubes using the same.
- 2. Description of the Related Art
- A carbon nanotube has a cylindrical structure having a diameter of several nano-meter and a very large aspect ratio of about 10 to 1,000. In the carbon nanotube, carbon atoms are generally arranged in a hexagonal honeycomb pattern. One carbon atom bonds to three adjacent carbon atoms. The carbon nanotube may be a conductor or a semiconductor according to its structure. As a conductor, the carbon nanotube has high electroconductivity. Also, the carbon nanotube has superior mechanical strength, Young's modulus of tera level, and high heat conductivity. The carbon nanotube having these properties can be advantageously used in various technical fields, such as an emitter of FED, a cathode material for a secondary battery, a catalyst support of a fuel cell, a high strength composite, and the like.
- Examples of a method of preparing the carbon nanotube include arc discharge, laser deposition, plasma enhanced chemical vapor deposition (PECVD), chemical vapor deposition, vapor phase growth, electrolysis, and the like. The vapor phase growth is suitable for preparing the carbon nanotube in bulk form since it synthesizes the carbon nanotube in a vapor phase by directly supplying a reaction gas and a catalytic metal into a reactor without using a substrate. The arc discharge and the laser deposition have relatively low yields of carbon nanotubes. When using the arc discharge and the laser deposition, It is difficult to control the diameter and the length of the carbon nanotube. Further, in the arc discharge and the laser deposition, clusters of amorphous carbon besides the carbon nanotubes are produced in a large amount, and thus a complicated purifying process must be performed.
- Chemical vapor deposition (CVD) methods, such as thermal chemical vapor deposition, low pressure chemical vapor deposition and PECVD are generally used to form carbon nanotubes on a substrate. In the PECVD, the carbon nanotubes can be synthesized at low temperatures by activating gas with a plasma. In the PECVD, it is relatively easy to control the diameter, the length, the density, etc. of the carbon nanotube.
- In the case of chemical vapor deposition (CVD) methods, catalyst particles, on which carbon nanotubes grow based, are first dispersed on a substrate in order to obtain a uniform density of the carbon nanotubes formed on the substrate.
- For example, Korean Patent Laid-Open Publication No. 2001-0049398 discloses a method of forming a plurality of catalyst particles by forming a catalytic metal film on a substrate and etching the catalytic metal film with an etching gas.
- In addition, Chemical Physics Letter, vol. 377 p. 49, 2003 discloses a method of forming catalyst particles on a substrate by applying a catalytic metal precursor solution to the substrate, and then drying and heat-treating the applied catalytic metal precursor solution. However, in this case, recrystallization and agglomeration of the catalytic metals occur during the drying and heat-treatment processes so that uniformity of the catalyst particles formed on the substrate is deteriorated. Due to the deterioration in the uniformity of the catalyst particles formed on the substrate, the uniformity of the diameter and production density of the carbon nanotubes grown on the basis of the catalytic particles are both deteriorated.
- The uniformity of the catalyst particles formed on the substrate can be evaluated by measuring the uniformity of the particle sizes of the catalyst particles and the uniformity of the production density of the catalyst particles. The uniformity of the catalyst particles formed by the conventional methods is not sufficient. Thus, a novel method of forming catalyst particles in order to improve the uniformity of the catalyst particles formed on a substrate is needed.
- It is therefore an object of the present invention to provide a novel method of forming catalyst particles.
- It is a further object of the present invention to provide a novel method of forming catalyst particles with increased uniformity, on which carbon nanotubes grow based, on a substrate.
- It is also an object of the present invention to provide a method of synthesizing carbon nanotubes with improved uniformity.
- According to an aspect of the present invention, there is provided a method of forming catalyst particles, the method including: applying a catalytic metal precursor solution to a substrate, the catalytic metal precursor solution comprising a catalytic metal precursor and a solvent; freeze-drying the catalytic metal precursor solution applied to the substrate; and reducing the freeze-dried catalytic metal precursor to a catalytic metal.
- It is preferred that the catalytic metal precursor solution is freeze-dried by cooling the catalytic metal precursor solution applied to the substrate below the freezing point of the catalytic metal precursor solution and evaporating the solvent in the catalytic metal precursor solution under a reduced pressure.
- The method of forming catalyst particles can minimize the agglomeration and/or recrystallization of the catalytic metal particles when forming the catalytic metal particles by freeze-drying the catalytic metal precursor solution. Therefore, the catalytic metal particles formed by the method of the present invention have particle sizes with very high uniformity and are very uniformly distributed on the substrate.
- According to another aspect of the present invention, there is provided a method of manufacturing carbon nanotubes, the method including: forming catalyst particles, on which carbon nanotubes grow based, on a substrate by applying a catalytic metal precursor solution to the substrate, freeze-drying the catalytic metal precursor solution applied to the substrate, and reducing the freeze-dried catalytic metal precursor to a catalytic metal; and growing carbon nanotubes on the catalyst particles by supplying a carbon source to the catalyst particles.
- According to another aspect of the present invention, there is provided a method of manufacturing carbon nanotubes, the method including: applying a catalytic metal precursor solution to the substrate; cooling the catalytic metal precursor solution applied to the substrate below the freezing point of the catalytic metal precursor solution; evaporating the solvent in the catalytic metal precursor solution under a reduced pressure to form catalytic metal precursor particles; converting the catalytic metal precursor particles to a catalyst particles; and growing carbon nanotubes on the catalyst particles.
- It is preferred that the catalytic metal precursor particles is converted into the catalyst particles by heating the catalytic metal precursor particles in an oxidation atmosphere to oxidize the catalytic metal precursor particles and reducing the oxidized catalytic metal precursor particles to the catalyst particles by heat-treatment or plasma-treatment.
- A more complete appreciation of the present invention, and many of the above and other features and advantages of the present invention, will be readily apparent as the same becomes better understood by reference to the following detailed description when considered in conjunction with the accompanying drawings in which like reference symbols indicate the same or similar components, wherein:
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FIG. 1 is an optical microscopic image illustrating catalyst particles for manufacturing carbon nanotubes, prepared according to an Example of the present invention; -
FIG. 2 is an electron microscopic image illustrating a side view of carbon nanotubes prepared according to an Example of the present invention; -
FIG. 3 is an electron microscopic image illustrating a top view of carbon nanotubes prepared according to an Example of the present invention; -
FIG. 4 is an optical microscopic image illustrating catalyst particles for manufacturing carbon nanotubes, prepared according to a Comparative Example; -
FIG. 5 is an enlarged view of a part ofFIG. 4 ; and -
FIG. 6 is an electron microscopic image illustrating a state of carbon nanotubes prepared according to a Comparative Example. - Hereinafter, a method of forming catalyst particles, on which carbon nanotubes grow based, on a substrate according to an embodiment of the present invention will be described in detail.
- The method of forming catalyst particles includes: applying a catalytic metal precursor solution to a substrate; freeze-drying the catalytic metal precursor solution applied to the substrate; and reducing the freeze-dried catalytic metal precursor to catalytic metal.
- The catalytic metal precursor solution includes a catalytic metal precursor and a solvent for dissolving the catalytic metal precursor.
- The catalytic metal precursor may be any material that can be converted to metal particles, on which carbon nanotubes can grow based. An example of the catalytic metal precursor includes an organo-metallic compound. The organo-metallic compound can contain at least one metal element selected from the group consisting of Fe, Co, Ni, Y, Mo, Cu, Pt, V, and Ti. Examples of the organo-metallic compound include iron acetate, iron oxalate, cobalt acetate, nickel acetate, ferrocene, or a mixture thereof.
- The solvent may be any liquid material that can dissolve the catalytic metal precursor. Examples of the solvent include ethanol, ethylene glycol, polyethylene glycol, polyvinyl alcohol, and a mixture thereof.
- The concentration of the catalytic metal precursor in the catalytic metal precursor solution is not particularly limited. If the concentration of the catalytic metal precursor in the catalytic metal precursor solution is too low, the carbon nanotubes may not be generated in a subsequent process of manufacturing. If the concentration of the catalytic metal precursor in the catalytic metal precursor solution is too high, the diameter of the carbon nanotubes generated in a subsequent process of manufacturing may be increased or the crystallinity of the carbon nanotubes generated or carbon nanofibers may be reduced. The concentration of the catalytic metal precursor in the catalytic metal precursor solution can preferably be about 10 mM to 200 mM.
- The substrate may be composed of any material, to which catalyst particles can be attached, for example, a metal with a high melting point, such as Mo, Cr, and W, silicon, glass, plastic, quartz, and the like.
- The method of applying the catalytic metal precursor solution to the substrate may be any method capable of uniformly coating the solution on the surface of the substrate. Examples of the method include dip coating, evaporation coating, screen printing, spin coating, and the like. These methods can also be used in a combination.
- The catalytic metal precursor solution can be applied to the entire surface of the substrate or on only a part of the surface of the substrate.
- The catalytic metal precursor solution applied to the substrate is freeze-dried. The freeze-drying process includes cooling the catalytic metal precursor solution applied to the substrate below the freezing point of the catalytic metal precursor solution and evaporating the solvent in the catalytic metal precursor solution under a reduced pressure.
- The freezing point of the catalytic metal precursor solution may vary depending on a composition of the catalytic metal precursor solution. That is, the freezing point of the catalytic metal precursor solution can be determined by the type of the catalytic metal precursor, the type of the solvent, the concentration of the catalytic metal precursor, and the like. The freezing point of the catalytic metal precursor solution can be easily determined by those skilled in the art through thermodynamical calculation and the method of trial and error. The freezing point of the catalytic metal precursor solution can also be selected by adjusting the composition of the catalytic metal precursor solution.
- The process of cooling the catalytic metal precursor solution applied to the substrate below the freezing point of the catalyst solution can be performed using a cooling method suitable for the freezing point of the catalytic metal precursor solution. For example, a freezer, liquid nitrogen, etc. can be used. When using liquid nitrogen, the catalytic metal precursor solution applied to the substrate can be cooled to below the freezing point of the catalytic metal precursor solution by dipping the substrate with the catalytic metal precursor solution applied thereto in liquid nitrogen.
- After the catalytic metal precursor solution applied to the substrate freezes, the substrate is subjected to a reduced pressure in order to allow the solvent in the frozen catalytic metal precursor solution to evaporate. For example, the substrate with the frozen catalytic metal precursor solution applied thereto is placed in a vacuum chamber, and then the pressure of the inside of the vacuum chamber is reduced.
- The reduced pressure should be sufficient to allow the solvent in the frozen catalytic metal precursor solution to evaporate. Hereinafter, the reduced pressure sufficient to allow the solvent in the frozen catalytic metal precursor solution to evaporate is abbreviated to “evaporation pressure”. The evaporation pressure can vary depending on a composition the used catalytic metal precursor solution. That is, the evaporation pressure can be determined by the type of the catalytic metal precursor, the type of the solvent, the concentration of the catalytic metal precursor, freezing point, and the like. The evaporation pressure of the catalytic metal precursor solution can be easily determined by those skilled in the art through thermodynamical calculation and the method of trial and error. The evaporation pressure of the catalytic metal precursor solution can also be selected by adjusting the composition of the catalytic metal precursor solution, freezing point, and the like.
- The solvent in the frozen catalytic metal precursor solution is removed through the evaporation. As a result, catalytic metal precursor components are formed in a particle form on the substrate. It is noted that the catalytic metal precursor particles formed according to the present method have particle size with high uniformity and a uniform distribution on the substrate.
- Subsequently, the catalytic metal precursor particles formed on the substrate are reduced to catalytic metal particles. The process of reducing the catalytic metal precursor particles to catalytic metal particles can be performed, for example, as follows. First, the catalytic metal precursor is converted into an oxide through heat-treatment in an oxidation atmosphere, and then the oxide is heat-treated or plasma treated in a reduction atmosphere to be reduced to a metal. The process of reducing the catalytic metal precursor can be performed by various methods known in the art, and thus, the detailed description thereof will be omitted herein.
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FIG. 1 is an electron microscopic image of catalytic metal particles prepared according to an Example of the present invention. Referring toFIG. 1 , the catalytic metal particles are uniformly distributed on the substrate and the particle sizes thereof are relatively uniform. - A method of manufacturing carbon nanotubes according to an embodiment of the present invention will now be described in more detail.
- The method of manufacturing carbon nanotubes includes forming catalyst particles, on which carbon nanotubes grow based, on a substrate by applying a catalytic metal precursor solution to the substrate, freeze-drying the catalytic metal precursor solution applied to the substrate, and reducing the freeze-dried catalytic metal precursor to catalytic metal; and growing carbon nanotubes on the catalyst particles by supplying a carbon source to the catalyst particles.
- The process of forming catalyst particles on the substrate is performed in the same manner as described in the method of forming catalyst particles.
- The process of growing carbon nanotubes on the catalyst particles by supplying the carbon source to the catalyst particles may be performed by various methods useful for the manufacture of carbon nanotubes.
- For example, the process of growing carbon nanotubes on the catalyst particles includes placing the substrate on which the catalyst particles are formed in a reaction chamber, supplying carbon precursor gas into the reaction chamber, and decomposing the carbon precursor gas in the reaction chamber to supply carbon to the catalyst particles.
- The process of growing the carbon nanotubes can be performed by low pressure chemical vapor deposition, thermal chemical vapor deposition, PECVD, or a combination thereof.
- Examples of the carbon precursor gas include carbon containing compounds such as acetylene, methane, propane, ethylene, carbon monoxide, carbon dioxide, alcohol, and benzene.
- If the internal temperature of the reaction chamber is too low, the crystallinity of the generated carbon nanotubes may be diminished. If the internal temperature of the reaction chamber is too high, the carbon nanotubes may not be formed. In view of this, the internal temperature of the reaction chamber may preferably be in the range of about 450 to 1100° C.
- Other conditions in the process of growing carbon nanotubes may typically be those suitable for the growth of carbon nanotubes and be easily selected by those skilled in the art according to specific application purposes. Thus, detailed description of other conditions will be omitted herein.
- Since in the method of manufacturing carbon nanotubes of the present embodiment, carbon nanotubes grow based on catalyst particles that have a uniform particle size and are uniformly distributed on the substrate, the uniformity of the resulting carbon nanotubes is also highly improved. The uniformity of carbon nanotubes is evaluated by the uniformity of the lengths and diameters of the carbon nanotubes. The lengths and diameters of carbon nanotubes can be measured by an electron microscope and a transmittance electron microscope, respectively.
- Further, the vertical orientation characteristic of carbon nanotubes manufactured by the method of the present embodiment is very good. This can be confirmed from an electron microscopic image of
FIG. 2 .FIG. 2 is an image showing a side view of carbon nanotubes prepared in an Example of the present invention. Referring toFIG. 2 , the carbon nanotubes prepared according to the method of the present embodiment are vertically oriented without being entangled with one another. -
FIG. 3 is an image showing a top view of carbon nanotubes prepared in an Example of the present invention. Referring toFIG. 3 , the production density of carbon nanotubes prepared according to the method of the present embodiment is uniform. - A 40 mM iron acetate solution was prepared using ethanol and ethylene glycol as a solvent. 20 mL of ethanol and 20 mL of ethylene glycol were added to 0.1 g of iron acetate powder to obtain a solution having a proper viscosity. A silicon substrate with a diameter of 20.32 cm was dipped in the obtained solution. The coated substrate was cooled immediately with liquid nitrogen and then transferred into a vacuum chamber. Then, a vacuum less than 0.1 mmHg was applied to the chamber in order to evaporate the solvent. To minimize an amount of the remained solvent, the substrate was further heated at 100° C.
- The freeze-dried substrate was heat-treated at 300° C. for 10 minutes in order to oxidize the iron acetate. Then, the substrate was subjected to a reduction treatment with hydrogen at 600° C.
- As a result, the iron particles were uniformly formed on the substrate.
FIG. 1 is an electron microscopic image of iron particles formed on the silicon substrate according to the present Example. Referring toFIG. 1 , the iron particles are uniformly distributed on the substrate and the particle sizes thereof are relatively uniform. - The substrate having iron particles formed thereon was placed in a reaction chamber for chemical vapor deposition (CVD), an internal temperature of which is 600° C., and then a mixed gas of carbon monoxide and hydrogen (weight ratio 1:2) was supplied to the reaction chamber for 20 minutes to synthesize carbon nanotubes based on the iron particles.
-
FIG. 2 is an image showing a side view of carbon nanotubes prepared in the present Example. As is apparent fromFIG. 2 , the carbon nanotubes prepared in the present Example are vertically oriented without being entangled with one another.FIG. 3 is an image showing a top view of carbon nanotubes prepared in the present Example. It can be seen fromFIG. 3 that the production density of carbon nanotubes prepared in the present Example is uniform. - To evaluate the uniformity of the formed carbon nanotubes, the measurements of the lengths and the diameters of the carbon nanotubes using an electron microscope and a transmittance electron microscope, respectively, were performed on the respective parts of the substrate, which were equally divided into 9 parts. As a result, it is confirmed that carbon nanotubes on the substrate equally divided into 9 parts has a uniformity within ±5%.
- Carbon nanotubes were synthesized in the same manner as in the above Example, except that the iron acetate solution applied to the substrate was not freeze-dried but naturally dried.
-
FIG. 4 is an optical microscopic image showing iron particles prepared in Comparative Example.FIG. 5 is an enlarged view of a part ofFIG. 4 . As seen fromFIGS. 4 and 5 , iron particles prepared in Comparative Example have no uniformity. -
FIG. 6 is an electron microscopic image showing a form of carbon nanotube clusters synthesized in Comparative Example. Referring toFIG. 6 , the carbon nanotubes synthesized in Comparative Example are partially lumped on the substrate, are entangled with one another, and not vertically oriented. - The method of forming catalyst particles according to an embodiment of the present invention can minimize the agglomeration and/or recrystallization of the catalyst particles when forming the catalyst particles by freeze-drying the catalyst metal precursor solution. The catalyst particles formed by the method of the present embodiment have a very uniform particle size and a very uniform distribution on the substrate.
- In the method of manufacturing carbon nanotubes according to another embodiment of the present invention, the carbon nanotubes grow based on the catalyst particles having a uniform particle size and a uniform distribution on the substrate, and thus, the synthesized carbon nanotubes have highly improved uniformity.
- While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the present invention as defined by the following claims.
Claims (20)
1. A method of preparing catalyst particles for carbon nanotube manufacture, the method comprising:
applying a catalytic metal precursor solution to a substrate, the catalytic metal precursor solution comprising a catalytic metal precursor and a solvent;
freeze-drying the catalytic metal precursor solution applied to the substrate; and
reducing the freeze-dried catalytic metal precursor to catalytic metal.
2. The method of claim 1 , wherein the catalytic metal precursor is an organo-metallic compound.
3. The method of claim 2 , wherein the catalytic metal precursor is an organo-metallic compound containing at least one metal element selected from the group consisting of Fe, Co, Ni, Y, Mo, Cu, Pt, V, and Ti.
4. The method of claim 1 , wherein the solvent of the catalytic metal precursor solution is ethanol, ethylene glycol, polyethylene glycol, polyvinyl alcohol, or a mixture thereof.
5. The method of claim 1 , wherein the concentration of the catalytic metal precursor in the catalytic metal precursor solution is 10 mM to 200 mM.
6. The method of claim 1 , wherein the step of freeze-drying the catalytic metal precursor solution comprises cooling the catalytic metal precursor solution applied to the substrate below the freezing point of the catalytic metal precursor solution and evaporating the solvent in the catalytic metal precursor solution under a reduced pressure.
7. The method of claim 6 , wherein the step of cooling the catalytic metal precursor solution comprises using a freezer or liquid nitrogen.
8. Catalyst particles prepared by the method of claim 1 .
9. A method of manufacturing carbon nanotubes, comprising utilizing the catalyst particles of claim 8 .
10. A method of manufacturing carbon nanotubes, the method comprising:
forming catalyst particles on a substrate by applying a catalytic metal precursor solution comprising a catalytic metal precursor and a solvent to the substrate, freeze-drying the catalytic metal precursor solution applied to the substrate, and reducing the freeze-dried catalytic metal precursor to a catalytic metal; and
growing carbon nanotubes on the catalyst particles by supplying a carbon source to the catalyst particles.
11. The method of claim 10 , wherein the catalytic metal precursor is an organo-metallic compound, and the solvent is ethanol, ethylene glycol, polyethylene glycol, polyvinyl alcohol, or a mixture thereof.
12. The method of claim 10 , wherein the catalytic metal precursor is an organo-metallic compound containing at least one metal element selected from the group consisting of Fe, Co, Ni, Y, Mo, Cu, Pt, V, and Ti.
13. The method of claim 10 , wherein the concentration of the catalytic metal precursor in the catalytic metal precursor solution is 10 mM to 200 mM.
14. The method of claim 10 , wherein the step of freeze-drying the catalytic metal precursor solution comprises cooling the catalytic metal precursor solution applied to the substrate below the freezing point of the catalytic metal precursor solution and evaporating the solvent in the catalytic metal precursor solution under a reduced pressure.
15. The method of claim 10 , wherein the step of cooling the catalytic metal precursor solution comprises using a freezer or liquid nitrogen.
16. The method of 10, wherein the step of growing the carbon nanotubes comprises placing the substrate on which the catalyst particles are formed in a reaction chamber, supplying carbon precursor gas into the reaction chamber, and decomposing the carbon precursor gas in the reaction chamber to supply carbon to the catalyst particles.
17. The method of 16, wherein the internal temperature of the reaction chamber is in the range of about 450 to 1100° C.
18. The method of claim 10 , wherein the reduction of the freeze-dried catalytic metal precursor to a catalytic metal comprises heating the freeze-dried catalytic metal precursor in an oxidation atmosphere to oxidize the catalytic metal precursor, and reducing the oxidized catalytic metal precursor to the catalyst metal by heat-treatment or plasma-treatment.
19. A method of manufacturing carbon nanotubes, the method comprising:
applying a catalytic metal precursor solution to the substrate, the catalytic metal precursor solution comprising a catalytic metal precursor dissolved in a solvent;
cooling the catalytic metal precursor solution applied to the substrate below the freezing point of the catalytic metal precursor solution;
evaporating the solvent in the catalytic metal precursor solution to form catalytic metal precursor particles;
converting the catalytic metal precursor particles to a catalyst particles; and
growing carbon nanotubes on the catalyst particles.
20. The method of claim 19 , wherein the step of converting the catalytic metal precursor particles to the catalyst particles comprises heating the catalytic metal precursor particles in an oxidation atmosphere to oxidize the catalytic metal precursor particles, and reducing the oxidized catalytic metal precursor particles to the catalyst particles by heat-treatment or plasma-treatment.
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US10818758B2 (en) | 2018-11-16 | 2020-10-27 | Asm Ip Holding B.V. | Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures |
US10829852B2 (en) | 2018-08-16 | 2020-11-10 | Asm Ip Holding B.V. | Gas distribution device for a wafer processing apparatus |
US10832903B2 (en) | 2011-10-28 | 2020-11-10 | Asm Ip Holding B.V. | Process feed management for semiconductor substrate processing |
US10847365B2 (en) | 2018-10-11 | 2020-11-24 | Asm Ip Holding B.V. | Method of forming conformal silicon carbide film by cyclic CVD |
US10844484B2 (en) | 2017-09-22 | 2020-11-24 | Asm Ip Holding B.V. | Apparatus for dispensing a vapor phase reactant to a reaction chamber and related methods |
US10847366B2 (en) | 2018-11-16 | 2020-11-24 | Asm Ip Holding B.V. | Methods for depositing a transition metal chalcogenide film on a substrate by a cyclical deposition process |
US10847371B2 (en) | 2018-03-27 | 2020-11-24 | Asm Ip Holding B.V. | Method of forming an electrode on a substrate and a semiconductor device structure including an electrode |
US10851456B2 (en) | 2016-04-21 | 2020-12-01 | Asm Ip Holding B.V. | Deposition of metal borides |
USD903477S1 (en) | 2018-01-24 | 2020-12-01 | Asm Ip Holdings B.V. | Metal clamp |
US10854498B2 (en) | 2011-07-15 | 2020-12-01 | Asm Ip Holding B.V. | Wafer-supporting device and method for producing same |
US10858737B2 (en) | 2014-07-28 | 2020-12-08 | Asm Ip Holding B.V. | Showerhead assembly and components thereof |
US10867786B2 (en) | 2018-03-30 | 2020-12-15 | Asm Ip Holding B.V. | Substrate processing method |
US10867788B2 (en) | 2016-12-28 | 2020-12-15 | Asm Ip Holding B.V. | Method of forming a structure on a substrate |
US10865475B2 (en) | 2016-04-21 | 2020-12-15 | Asm Ip Holding B.V. | Deposition of metal borides and silicides |
US10872771B2 (en) | 2018-01-16 | 2020-12-22 | Asm Ip Holding B. V. | Method for depositing a material film on a substrate within a reaction chamber by a cyclical deposition process and related device structures |
US10886123B2 (en) | 2017-06-02 | 2021-01-05 | Asm Ip Holding B.V. | Methods for forming low temperature semiconductor layers and related semiconductor device structures |
US10883175B2 (en) | 2018-08-09 | 2021-01-05 | Asm Ip Holding B.V. | Vertical furnace for processing substrates and a liner for use therein |
US10892156B2 (en) | 2017-05-08 | 2021-01-12 | Asm Ip Holding B.V. | Methods for forming a silicon nitride film on a substrate and related semiconductor device structures |
US10896820B2 (en) | 2018-02-14 | 2021-01-19 | Asm Ip Holding B.V. | Method for depositing a ruthenium-containing film on a substrate by a cyclical deposition process |
US10910262B2 (en) | 2017-11-16 | 2021-02-02 | Asm Ip Holding B.V. | Method of selectively depositing a capping layer structure on a semiconductor device structure |
US10914004B2 (en) | 2018-06-29 | 2021-02-09 | Asm Ip Holding B.V. | Thin-film deposition method and manufacturing method of semiconductor device |
US10923344B2 (en) | 2017-10-30 | 2021-02-16 | Asm Ip Holding B.V. | Methods for forming a semiconductor structure and related semiconductor structures |
US10928731B2 (en) | 2017-09-21 | 2021-02-23 | Asm Ip Holding B.V. | Method of sequential infiltration synthesis treatment of infiltrateable material and structures and devices formed using same |
US10934619B2 (en) | 2016-11-15 | 2021-03-02 | Asm Ip Holding B.V. | Gas supply unit and substrate processing apparatus including the gas supply unit |
US10941490B2 (en) | 2014-10-07 | 2021-03-09 | Asm Ip Holding B.V. | Multiple temperature range susceptor, assembly, reactor and system including the susceptor, and methods of using the same |
US10975470B2 (en) | 2018-02-23 | 2021-04-13 | Asm Ip Holding B.V. | Apparatus for detecting or monitoring for a chemical precursor in a high temperature environment |
US11001925B2 (en) | 2016-12-19 | 2021-05-11 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11015245B2 (en) | 2014-03-19 | 2021-05-25 | Asm Ip Holding B.V. | Gas-phase reactor and system having exhaust plenum and components thereof |
US11018002B2 (en) | 2017-07-19 | 2021-05-25 | Asm Ip Holding B.V. | Method for selectively depositing a Group IV semiconductor and related semiconductor device structures |
US11018047B2 (en) | 2018-01-25 | 2021-05-25 | Asm Ip Holding B.V. | Hybrid lift pin |
US11024523B2 (en) | 2018-09-11 | 2021-06-01 | Asm Ip Holding B.V. | Substrate processing apparatus and method |
US11022879B2 (en) | 2017-11-24 | 2021-06-01 | Asm Ip Holding B.V. | Method of forming an enhanced unexposed photoresist layer |
US11031242B2 (en) | 2018-11-07 | 2021-06-08 | Asm Ip Holding B.V. | Methods for depositing a boron doped silicon germanium film |
USD922229S1 (en) | 2019-06-05 | 2021-06-15 | Asm Ip Holding B.V. | Device for controlling a temperature of a gas supply unit |
US11049751B2 (en) | 2018-09-14 | 2021-06-29 | Asm Ip Holding B.V. | Cassette supply system to store and handle cassettes and processing apparatus equipped therewith |
US11056567B2 (en) | 2018-05-11 | 2021-07-06 | Asm Ip Holding B.V. | Method of forming a doped metal carbide film on a substrate and related semiconductor device structures |
US11056344B2 (en) | 2017-08-30 | 2021-07-06 | Asm Ip Holding B.V. | Layer forming method |
US11053591B2 (en) | 2018-08-06 | 2021-07-06 | Asm Ip Holding B.V. | Multi-port gas injection system and reactor system including same |
US11069510B2 (en) | 2017-08-30 | 2021-07-20 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11081345B2 (en) | 2018-02-06 | 2021-08-03 | Asm Ip Holding B.V. | Method of post-deposition treatment for silicon oxide film |
US11088002B2 (en) | 2018-03-29 | 2021-08-10 | Asm Ip Holding B.V. | Substrate rack and a substrate processing system and method |
US11087997B2 (en) | 2018-10-31 | 2021-08-10 | Asm Ip Holding B.V. | Substrate processing apparatus for processing substrates |
US11101370B2 (en) | 2016-05-02 | 2021-08-24 | Asm Ip Holding B.V. | Method of forming a germanium oxynitride film |
US11114294B2 (en) | 2019-03-08 | 2021-09-07 | Asm Ip Holding B.V. | Structure including SiOC layer and method of forming same |
US11114283B2 (en) | 2018-03-16 | 2021-09-07 | Asm Ip Holding B.V. | Reactor, system including the reactor, and methods of manufacturing and using same |
USD930782S1 (en) | 2019-08-22 | 2021-09-14 | Asm Ip Holding B.V. | Gas distributor |
US11127617B2 (en) | 2017-11-27 | 2021-09-21 | Asm Ip Holding B.V. | Storage device for storing wafer cassettes for use with a batch furnace |
US11127589B2 (en) | 2019-02-01 | 2021-09-21 | Asm Ip Holding B.V. | Method of topology-selective film formation of silicon oxide |
USD931978S1 (en) | 2019-06-27 | 2021-09-28 | Asm Ip Holding B.V. | Showerhead vacuum transport |
US11139308B2 (en) | 2015-12-29 | 2021-10-05 | Asm Ip Holding B.V. | Atomic layer deposition of III-V compounds to form V-NAND devices |
US11139191B2 (en) | 2017-08-09 | 2021-10-05 | Asm Ip Holding B.V. | Storage apparatus for storing cassettes for substrates and processing apparatus equipped therewith |
US11158513B2 (en) | 2018-12-13 | 2021-10-26 | Asm Ip Holding B.V. | Methods for forming a rhenium-containing film on a substrate by a cyclical deposition process and related semiconductor device structures |
US11171025B2 (en) | 2019-01-22 | 2021-11-09 | Asm Ip Holding B.V. | Substrate processing device |
USD935572S1 (en) | 2019-05-24 | 2021-11-09 | Asm Ip Holding B.V. | Gas channel plate |
US11205585B2 (en) | 2016-07-28 | 2021-12-21 | Asm Ip Holding B.V. | Substrate processing apparatus and method of operating the same |
US11217444B2 (en) | 2018-11-30 | 2022-01-04 | Asm Ip Holding B.V. | Method for forming an ultraviolet radiation responsive metal oxide-containing film |
US11222772B2 (en) | 2016-12-14 | 2022-01-11 | Asm Ip Holding B.V. | Substrate processing apparatus |
USD940837S1 (en) | 2019-08-22 | 2022-01-11 | Asm Ip Holding B.V. | Electrode |
US11227782B2 (en) | 2019-07-31 | 2022-01-18 | Asm Ip Holding B.V. | Vertical batch furnace assembly |
US11227789B2 (en) | 2019-02-20 | 2022-01-18 | Asm Ip Holding B.V. | Method and apparatus for filling a recess formed within a substrate surface |
US11230766B2 (en) | 2018-03-29 | 2022-01-25 | Asm Ip Holding B.V. | Substrate processing apparatus and method |
US11232963B2 (en) | 2018-10-03 | 2022-01-25 | Asm Ip Holding B.V. | Substrate processing apparatus and method |
US11233133B2 (en) | 2015-10-21 | 2022-01-25 | Asm Ip Holding B.V. | NbMC layers |
US11251068B2 (en) | 2018-10-19 | 2022-02-15 | Asm Ip Holding B.V. | Substrate processing apparatus and substrate processing method |
US11251040B2 (en) | 2019-02-20 | 2022-02-15 | Asm Ip Holding B.V. | Cyclical deposition method including treatment step and apparatus for same |
USD944946S1 (en) | 2019-06-14 | 2022-03-01 | Asm Ip Holding B.V. | Shower plate |
US11270899B2 (en) | 2018-06-04 | 2022-03-08 | Asm Ip Holding B.V. | Wafer handling chamber with moisture reduction |
US11274369B2 (en) | 2018-09-11 | 2022-03-15 | Asm Ip Holding B.V. | Thin film deposition method |
US11282698B2 (en) | 2019-07-19 | 2022-03-22 | Asm Ip Holding B.V. | Method of forming topology-controlled amorphous carbon polymer film |
US11286562B2 (en) | 2018-06-08 | 2022-03-29 | Asm Ip Holding B.V. | Gas-phase chemical reactor and method of using same |
US11286558B2 (en) | 2019-08-23 | 2022-03-29 | Asm Ip Holding B.V. | Methods for depositing a molybdenum nitride film on a surface of a substrate by a cyclical deposition process and related semiconductor device structures including a molybdenum nitride film |
US11289326B2 (en) | 2019-05-07 | 2022-03-29 | Asm Ip Holding B.V. | Method for reforming amorphous carbon polymer film |
US11295980B2 (en) | 2017-08-30 | 2022-04-05 | Asm Ip Holding B.V. | Methods for depositing a molybdenum metal film over a dielectric surface of a substrate by a cyclical deposition process and related semiconductor device structures |
USD947913S1 (en) | 2019-05-17 | 2022-04-05 | Asm Ip Holding B.V. | Susceptor shaft |
USD948463S1 (en) | 2018-10-24 | 2022-04-12 | Asm Ip Holding B.V. | Susceptor for semiconductor substrate supporting apparatus |
USD949319S1 (en) | 2019-08-22 | 2022-04-19 | Asm Ip Holding B.V. | Exhaust duct |
US11306395B2 (en) | 2017-06-28 | 2022-04-19 | Asm Ip Holding B.V. | Methods for depositing a transition metal nitride film on a substrate by atomic layer deposition and related deposition apparatus |
US11315794B2 (en) | 2019-10-21 | 2022-04-26 | Asm Ip Holding B.V. | Apparatus and methods for selectively etching films |
US11342216B2 (en) | 2019-02-20 | 2022-05-24 | Asm Ip Holding B.V. | Cyclical deposition method and apparatus for filling a recess formed within a substrate surface |
US11339476B2 (en) | 2019-10-08 | 2022-05-24 | Asm Ip Holding B.V. | Substrate processing device having connection plates, substrate processing method |
US11345999B2 (en) | 2019-06-06 | 2022-05-31 | Asm Ip Holding B.V. | Method of using a gas-phase reactor system including analyzing exhausted gas |
US11355338B2 (en) | 2019-05-10 | 2022-06-07 | Asm Ip Holding B.V. | Method of depositing material onto a surface and structure formed according to the method |
US11361990B2 (en) | 2018-05-28 | 2022-06-14 | Asm Ip Holding B.V. | Substrate processing method and device manufactured by using the same |
US11374112B2 (en) | 2017-07-19 | 2022-06-28 | Asm Ip Holding B.V. | Method for depositing a group IV semiconductor and related semiconductor device structures |
US11378337B2 (en) | 2019-03-28 | 2022-07-05 | Asm Ip Holding B.V. | Door opener and substrate processing apparatus provided therewith |
US11390945B2 (en) | 2019-07-03 | 2022-07-19 | Asm Ip Holding B.V. | Temperature control assembly for substrate processing apparatus and method of using same |
US11393690B2 (en) | 2018-01-19 | 2022-07-19 | Asm Ip Holding B.V. | Deposition method |
US11390946B2 (en) | 2019-01-17 | 2022-07-19 | Asm Ip Holding B.V. | Methods of forming a transition metal containing film on a substrate by a cyclical deposition process |
US11390950B2 (en) | 2017-01-10 | 2022-07-19 | Asm Ip Holding B.V. | Reactor system and method to reduce residue buildup during a film deposition process |
US11401605B2 (en) | 2019-11-26 | 2022-08-02 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11414760B2 (en) | 2018-10-08 | 2022-08-16 | Asm Ip Holding B.V. | Substrate support unit, thin film deposition apparatus including the same, and substrate processing apparatus including the same |
US11424119B2 (en) | 2019-03-08 | 2022-08-23 | Asm Ip Holding B.V. | Method for selective deposition of silicon nitride layer and structure including selectively-deposited silicon nitride layer |
US11430640B2 (en) | 2019-07-30 | 2022-08-30 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11430674B2 (en) | 2018-08-22 | 2022-08-30 | Asm Ip Holding B.V. | Sensor array, apparatus for dispensing a vapor phase reactant to a reaction chamber and related methods |
US11437241B2 (en) | 2020-04-08 | 2022-09-06 | Asm Ip Holding B.V. | Apparatus and methods for selectively etching silicon oxide films |
US11443926B2 (en) | 2019-07-30 | 2022-09-13 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11447861B2 (en) | 2016-12-15 | 2022-09-20 | Asm Ip Holding B.V. | Sequential infiltration synthesis apparatus and a method of forming a patterned structure |
US11447864B2 (en) | 2019-04-19 | 2022-09-20 | Asm Ip Holding B.V. | Layer forming method and apparatus |
USD965044S1 (en) | 2019-08-19 | 2022-09-27 | Asm Ip Holding B.V. | Susceptor shaft |
US11453943B2 (en) | 2016-05-25 | 2022-09-27 | Asm Ip Holding B.V. | Method for forming carbon-containing silicon/metal oxide or nitride film by ALD using silicon precursor and hydrocarbon precursor |
USD965524S1 (en) | 2019-08-19 | 2022-10-04 | Asm Ip Holding B.V. | Susceptor support |
US11469098B2 (en) | 2018-05-08 | 2022-10-11 | Asm Ip Holding B.V. | Methods for depositing an oxide film on a substrate by a cyclical deposition process and related device structures |
US11473195B2 (en) | 2018-03-01 | 2022-10-18 | Asm Ip Holding B.V. | Semiconductor processing apparatus and a method for processing a substrate |
US11476109B2 (en) | 2019-06-11 | 2022-10-18 | Asm Ip Holding B.V. | Method of forming an electronic structure using reforming gas, system for performing the method, and structure formed using the method |
US11482533B2 (en) | 2019-02-20 | 2022-10-25 | Asm Ip Holding B.V. | Apparatus and methods for plug fill deposition in 3-D NAND applications |
US11482412B2 (en) | 2018-01-19 | 2022-10-25 | Asm Ip Holding B.V. | Method for depositing a gap-fill layer by plasma-assisted deposition |
US11482418B2 (en) | 2018-02-20 | 2022-10-25 | Asm Ip Holding B.V. | Substrate processing method and apparatus |
US11488854B2 (en) | 2020-03-11 | 2022-11-01 | Asm Ip Holding B.V. | Substrate handling device with adjustable joints |
US11488819B2 (en) | 2018-12-04 | 2022-11-01 | Asm Ip Holding B.V. | Method of cleaning substrate processing apparatus |
US11495459B2 (en) | 2019-09-04 | 2022-11-08 | Asm Ip Holding B.V. | Methods for selective deposition using a sacrificial capping layer |
US11492703B2 (en) | 2018-06-27 | 2022-11-08 | Asm Ip Holding B.V. | Cyclic deposition methods for forming metal-containing material and films and structures including the metal-containing material |
US11499222B2 (en) | 2018-06-27 | 2022-11-15 | Asm Ip Holding B.V. | Cyclic deposition methods for forming metal-containing material and films and structures including the metal-containing material |
US11499226B2 (en) | 2018-11-02 | 2022-11-15 | Asm Ip Holding B.V. | Substrate supporting unit and a substrate processing device including the same |
US11501968B2 (en) | 2019-11-15 | 2022-11-15 | Asm Ip Holding B.V. | Method for providing a semiconductor device with silicon filled gaps |
US11515187B2 (en) | 2020-05-01 | 2022-11-29 | Asm Ip Holding B.V. | Fast FOUP swapping with a FOUP handler |
US11515188B2 (en) | 2019-05-16 | 2022-11-29 | Asm Ip Holding B.V. | Wafer boat handling device, vertical batch furnace and method |
US11521851B2 (en) | 2020-02-03 | 2022-12-06 | Asm Ip Holding B.V. | Method of forming structures including a vanadium or indium layer |
US11527400B2 (en) | 2019-08-23 | 2022-12-13 | Asm Ip Holding B.V. | Method for depositing silicon oxide film having improved quality by peald using bis(diethylamino)silane |
US11527403B2 (en) | 2019-12-19 | 2022-12-13 | Asm Ip Holding B.V. | Methods for filling a gap feature on a substrate surface and related semiconductor structures |
US11532757B2 (en) | 2016-10-27 | 2022-12-20 | Asm Ip Holding B.V. | Deposition of charge trapping layers |
US11530483B2 (en) | 2018-06-21 | 2022-12-20 | Asm Ip Holding B.V. | Substrate processing system |
US11530876B2 (en) | 2020-04-24 | 2022-12-20 | Asm Ip Holding B.V. | Vertical batch furnace assembly comprising a cooling gas supply |
US11551925B2 (en) | 2019-04-01 | 2023-01-10 | Asm Ip Holding B.V. | Method for manufacturing a semiconductor device |
US11551912B2 (en) | 2020-01-20 | 2023-01-10 | Asm Ip Holding B.V. | Method of forming thin film and method of modifying surface of thin film |
USD975665S1 (en) | 2019-05-17 | 2023-01-17 | Asm Ip Holding B.V. | Susceptor shaft |
US11557474B2 (en) | 2019-07-29 | 2023-01-17 | Asm Ip Holding B.V. | Methods for selective deposition utilizing n-type dopants and/or alternative dopants to achieve high dopant incorporation |
US11562901B2 (en) | 2019-09-25 | 2023-01-24 | Asm Ip Holding B.V. | Substrate processing method |
US11572620B2 (en) | 2018-11-06 | 2023-02-07 | Asm Ip Holding B.V. | Methods for selectively depositing an amorphous silicon film on a substrate |
US11581186B2 (en) | 2016-12-15 | 2023-02-14 | Asm Ip Holding B.V. | Sequential infiltration synthesis apparatus |
US11587815B2 (en) | 2019-07-31 | 2023-02-21 | Asm Ip Holding B.V. | Vertical batch furnace assembly |
US11587814B2 (en) | 2019-07-31 | 2023-02-21 | Asm Ip Holding B.V. | Vertical batch furnace assembly |
US11594450B2 (en) | 2019-08-22 | 2023-02-28 | Asm Ip Holding B.V. | Method for forming a structure with a hole |
US11594600B2 (en) | 2019-11-05 | 2023-02-28 | Asm Ip Holding B.V. | Structures with doped semiconductor layers and methods and systems for forming same |
USD979506S1 (en) | 2019-08-22 | 2023-02-28 | Asm Ip Holding B.V. | Insulator |
US11605528B2 (en) | 2019-07-09 | 2023-03-14 | Asm Ip Holding B.V. | Plasma device using coaxial waveguide, and substrate treatment method |
USD980813S1 (en) | 2021-05-11 | 2023-03-14 | Asm Ip Holding B.V. | Gas flow control plate for substrate processing apparatus |
USD980814S1 (en) | 2021-05-11 | 2023-03-14 | Asm Ip Holding B.V. | Gas distributor for substrate processing apparatus |
US11610775B2 (en) | 2016-07-28 | 2023-03-21 | Asm Ip Holding B.V. | Method and apparatus for filling a gap |
US11610774B2 (en) | 2019-10-02 | 2023-03-21 | Asm Ip Holding B.V. | Methods for forming a topographically selective silicon oxide film by a cyclical plasma-enhanced deposition process |
US11615970B2 (en) | 2019-07-17 | 2023-03-28 | Asm Ip Holding B.V. | Radical assist ignition plasma system and method |
USD981973S1 (en) | 2021-05-11 | 2023-03-28 | Asm Ip Holding B.V. | Reactor wall for substrate processing apparatus |
US11626308B2 (en) | 2020-05-13 | 2023-04-11 | Asm Ip Holding B.V. | Laser alignment fixture for a reactor system |
US11626316B2 (en) | 2019-11-20 | 2023-04-11 | Asm Ip Holding B.V. | Method of depositing carbon-containing material on a surface of a substrate, structure formed using the method, and system for forming the structure |
US11629407B2 (en) | 2019-02-22 | 2023-04-18 | Asm Ip Holding B.V. | Substrate processing apparatus and method for processing substrates |
US11629406B2 (en) | 2018-03-09 | 2023-04-18 | Asm Ip Holding B.V. | Semiconductor processing apparatus comprising one or more pyrometers for measuring a temperature of a substrate during transfer of the substrate |
US11637014B2 (en) | 2019-10-17 | 2023-04-25 | Asm Ip Holding B.V. | Methods for selective deposition of doped semiconductor material |
US11637011B2 (en) | 2019-10-16 | 2023-04-25 | Asm Ip Holding B.V. | Method of topology-selective film formation of silicon oxide |
US11639811B2 (en) | 2017-11-27 | 2023-05-02 | Asm Ip Holding B.V. | Apparatus including a clean mini environment |
US11639548B2 (en) | 2019-08-21 | 2023-05-02 | Asm Ip Holding B.V. | Film-forming material mixed-gas forming device and film forming device |
US11646205B2 (en) | 2019-10-29 | 2023-05-09 | Asm Ip Holding B.V. | Methods of selectively forming n-type doped material on a surface, systems for selectively forming n-type doped material, and structures formed using same |
US11646204B2 (en) | 2020-06-24 | 2023-05-09 | Asm Ip Holding B.V. | Method for forming a layer provided with silicon |
US11644758B2 (en) | 2020-07-17 | 2023-05-09 | Asm Ip Holding B.V. | Structures and methods for use in photolithography |
US11643724B2 (en) | 2019-07-18 | 2023-05-09 | Asm Ip Holding B.V. | Method of forming structures using a neutral beam |
US11646184B2 (en) | 2019-11-29 | 2023-05-09 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11658035B2 (en) | 2020-06-30 | 2023-05-23 | Asm Ip Holding B.V. | Substrate processing method |
US11658029B2 (en) | 2018-12-14 | 2023-05-23 | Asm Ip Holding B.V. | Method of forming a device structure using selective deposition of gallium nitride and system for same |
US11664199B2 (en) | 2018-10-19 | 2023-05-30 | Asm Ip Holding B.V. | Substrate processing apparatus and substrate processing method |
US11664267B2 (en) | 2019-07-10 | 2023-05-30 | Asm Ip Holding B.V. | Substrate support assembly and substrate processing device including the same |
US11664245B2 (en) | 2019-07-16 | 2023-05-30 | Asm Ip Holding B.V. | Substrate processing device |
US11674220B2 (en) | 2020-07-20 | 2023-06-13 | Asm Ip Holding B.V. | Method for depositing molybdenum layers using an underlayer |
US11680839B2 (en) | 2019-08-05 | 2023-06-20 | Asm Ip Holding B.V. | Liquid level sensor for a chemical source vessel |
US11688603B2 (en) | 2019-07-17 | 2023-06-27 | Asm Ip Holding B.V. | Methods of forming silicon germanium structures |
USD990441S1 (en) | 2021-09-07 | 2023-06-27 | Asm Ip Holding B.V. | Gas flow control plate |
US11685991B2 (en) | 2018-02-14 | 2023-06-27 | Asm Ip Holding B.V. | Method for depositing a ruthenium-containing film on a substrate by a cyclical deposition process |
USD990534S1 (en) | 2020-09-11 | 2023-06-27 | Asm Ip Holding B.V. | Weighted lift pin |
US11705333B2 (en) | 2020-05-21 | 2023-07-18 | Asm Ip Holding B.V. | Structures including multiple carbon layers and methods of forming and using same |
US11718913B2 (en) | 2018-06-04 | 2023-08-08 | Asm Ip Holding B.V. | Gas distribution system and reactor system including same |
US11725280B2 (en) | 2020-08-26 | 2023-08-15 | Asm Ip Holding B.V. | Method for forming metal silicon oxide and metal silicon oxynitride layers |
US11725277B2 (en) | 2011-07-20 | 2023-08-15 | Asm Ip Holding B.V. | Pressure transmitter for a semiconductor processing environment |
US11735422B2 (en) | 2019-10-10 | 2023-08-22 | Asm Ip Holding B.V. | Method of forming a photoresist underlayer and structure including same |
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Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101185904B (en) * | 2007-01-18 | 2011-01-19 | 江苏工业学院 | Selectivity liquid phase hydrogenation catalyst and preparation method and use thereof |
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Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6346023B1 (en) * | 1998-09-11 | 2002-02-12 | Futaba Denshi Kogyo Kabushiki Kaisha | Method of preparing film of carbon nano-tube and film of carbon nano-tube prepared thereby |
US20030012722A1 (en) * | 2002-07-02 | 2003-01-16 | Jie Liu | High yiel vapor phase deposition method for large scale sing walled carbon nanotube preparation |
-
2004
- 2004-06-22 KR KR1020040046552A patent/KR20050121426A/en not_active Application Discontinuation
-
2005
- 2005-06-21 CN CNA2005100794134A patent/CN1883807A/en active Pending
- 2005-06-21 JP JP2005180590A patent/JP2006007213A/en active Pending
- 2005-06-22 US US11/158,047 patent/US20070020167A1/en not_active Abandoned
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6346023B1 (en) * | 1998-09-11 | 2002-02-12 | Futaba Denshi Kogyo Kabushiki Kaisha | Method of preparing film of carbon nano-tube and film of carbon nano-tube prepared thereby |
US20030012722A1 (en) * | 2002-07-02 | 2003-01-16 | Jie Liu | High yiel vapor phase deposition method for large scale sing walled carbon nanotube preparation |
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US9302260B2 (en) | 2007-10-15 | 2016-04-05 | SDCmaterials, Inc. | Method and system for forming plug and play metal catalysts |
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US9533299B2 (en) | 2012-11-21 | 2017-01-03 | SDCmaterials, Inc. | Three-way catalytic converter using nanoparticles |
US11967488B2 (en) | 2013-02-01 | 2024-04-23 | Asm Ip Holding B.V. | Method for treatment of deposition reactor |
US9586179B2 (en) | 2013-07-25 | 2017-03-07 | SDCmaterials, Inc. | Washcoats and coated substrates for catalytic converters and methods of making and using same |
US9517448B2 (en) | 2013-10-22 | 2016-12-13 | SDCmaterials, Inc. | Compositions of lean NOx trap (LNT) systems and methods of making and using same |
US9427732B2 (en) | 2013-10-22 | 2016-08-30 | SDCmaterials, Inc. | Catalyst design for heavy-duty diesel combustion engines |
US9950316B2 (en) | 2013-10-22 | 2018-04-24 | Umicore Ag & Co. Kg | Catalyst design for heavy-duty diesel combustion engines |
US9566568B2 (en) | 2013-10-22 | 2017-02-14 | SDCmaterials, Inc. | Catalyst design for heavy-duty diesel combustion engines |
US10683571B2 (en) | 2014-02-25 | 2020-06-16 | Asm Ip Holding B.V. | Gas supply manifold and method of supplying gases to chamber using same |
US10604847B2 (en) | 2014-03-18 | 2020-03-31 | Asm Ip Holding B.V. | Gas distribution system, reactor including the system, and methods of using the same |
US11015245B2 (en) | 2014-03-19 | 2021-05-25 | Asm Ip Holding B.V. | Gas-phase reactor and system having exhaust plenum and components thereof |
US10086356B2 (en) | 2014-03-21 | 2018-10-02 | Umicore Ag & Co. Kg | Compositions for passive NOx adsorption (PNA) systems and methods of making and using same |
US10413880B2 (en) | 2014-03-21 | 2019-09-17 | Umicore Ag & Co. Kg | Compositions for passive NOx adsorption (PNA) systems and methods of making and using same |
US9687811B2 (en) | 2014-03-21 | 2017-06-27 | SDCmaterials, Inc. | Compositions for passive NOx adsorption (PNA) systems and methods of making and using same |
US10858737B2 (en) | 2014-07-28 | 2020-12-08 | Asm Ip Holding B.V. | Showerhead assembly and components thereof |
US10787741B2 (en) | 2014-08-21 | 2020-09-29 | Asm Ip Holding B.V. | Method and system for in situ formation of gas-phase compounds |
US10561975B2 (en) | 2014-10-07 | 2020-02-18 | Asm Ip Holdings B.V. | Variable conductance gas distribution apparatus and method |
US11795545B2 (en) | 2014-10-07 | 2023-10-24 | Asm Ip Holding B.V. | Multiple temperature range susceptor, assembly, reactor and system including the susceptor, and methods of using the same |
US10941490B2 (en) | 2014-10-07 | 2021-03-09 | Asm Ip Holding B.V. | Multiple temperature range susceptor, assembly, reactor and system including the susceptor, and methods of using the same |
US10438965B2 (en) | 2014-12-22 | 2019-10-08 | Asm Ip Holding B.V. | Semiconductor device and manufacturing method thereof |
US10529542B2 (en) | 2015-03-11 | 2020-01-07 | Asm Ip Holdings B.V. | Cross-flow reactor and method |
US11742189B2 (en) | 2015-03-12 | 2023-08-29 | Asm Ip Holding B.V. | Multi-zone reactor, system including the reactor, and method of using the same |
US11242598B2 (en) | 2015-06-26 | 2022-02-08 | Asm Ip Holding B.V. | Structures including metal carbide material, devices including the structures, and methods of forming same |
US10458018B2 (en) | 2015-06-26 | 2019-10-29 | Asm Ip Holding B.V. | Structures including metal carbide material, devices including the structures, and methods of forming same |
US10600673B2 (en) | 2015-07-07 | 2020-03-24 | Asm Ip Holding B.V. | Magnetic susceptor to baseplate seal |
US10312129B2 (en) | 2015-09-29 | 2019-06-04 | Asm Ip Holding B.V. | Variable adjustment for precise matching of multiple chamber cavity housings |
US11233133B2 (en) | 2015-10-21 | 2022-01-25 | Asm Ip Holding B.V. | NbMC layers |
US11139308B2 (en) | 2015-12-29 | 2021-10-05 | Asm Ip Holding B.V. | Atomic layer deposition of III-V compounds to form V-NAND devices |
US11956977B2 (en) | 2015-12-29 | 2024-04-09 | Asm Ip Holding B.V. | Atomic layer deposition of III-V compounds to form V-NAND devices |
US11676812B2 (en) | 2016-02-19 | 2023-06-13 | Asm Ip Holding B.V. | Method for forming silicon nitride film selectively on top/bottom portions |
US10468251B2 (en) | 2016-02-19 | 2019-11-05 | Asm Ip Holding B.V. | Method for forming spacers using silicon nitride film for spacer-defined multiple patterning |
US10720322B2 (en) | 2016-02-19 | 2020-07-21 | Asm Ip Holding B.V. | Method for forming silicon nitride film selectively on top surface |
US10343920B2 (en) * | 2016-03-18 | 2019-07-09 | Asm Ip Holding B.V. | Aligned carbon nanotubes |
US10851456B2 (en) | 2016-04-21 | 2020-12-01 | Asm Ip Holding B.V. | Deposition of metal borides |
US10865475B2 (en) | 2016-04-21 | 2020-12-15 | Asm Ip Holding B.V. | Deposition of metal borides and silicides |
US11101370B2 (en) | 2016-05-02 | 2021-08-24 | Asm Ip Holding B.V. | Method of forming a germanium oxynitride film |
US10665452B2 (en) | 2016-05-02 | 2020-05-26 | Asm Ip Holdings B.V. | Source/drain performance through conformal solid state doping |
US11453943B2 (en) | 2016-05-25 | 2022-09-27 | Asm Ip Holding B.V. | Method for forming carbon-containing silicon/metal oxide or nitride film by ALD using silicon precursor and hydrocarbon precursor |
US10388509B2 (en) | 2016-06-28 | 2019-08-20 | Asm Ip Holding B.V. | Formation of epitaxial layers via dislocation filtering |
US10541173B2 (en) | 2016-07-08 | 2020-01-21 | Asm Ip Holding B.V. | Selective deposition method to form air gaps |
US10612137B2 (en) | 2016-07-08 | 2020-04-07 | Asm Ip Holdings B.V. | Organic reactants for atomic layer deposition |
US11749562B2 (en) | 2016-07-08 | 2023-09-05 | Asm Ip Holding B.V. | Selective deposition method to form air gaps |
US11649546B2 (en) | 2016-07-08 | 2023-05-16 | Asm Ip Holding B.V. | Organic reactants for atomic layer deposition |
US11094582B2 (en) | 2016-07-08 | 2021-08-17 | Asm Ip Holding B.V. | Selective deposition method to form air gaps |
US10714385B2 (en) | 2016-07-19 | 2020-07-14 | Asm Ip Holding B.V. | Selective deposition of tungsten |
US11107676B2 (en) | 2016-07-28 | 2021-08-31 | Asm Ip Holding B.V. | Method and apparatus for filling a gap |
US10395919B2 (en) | 2016-07-28 | 2019-08-27 | Asm Ip Holding B.V. | Method and apparatus for filling a gap |
US11205585B2 (en) | 2016-07-28 | 2021-12-21 | Asm Ip Holding B.V. | Substrate processing apparatus and method of operating the same |
US11694892B2 (en) | 2016-07-28 | 2023-07-04 | Asm Ip Holding B.V. | Method and apparatus for filling a gap |
US11610775B2 (en) | 2016-07-28 | 2023-03-21 | Asm Ip Holding B.V. | Method and apparatus for filling a gap |
US10741385B2 (en) | 2016-07-28 | 2020-08-11 | Asm Ip Holding B.V. | Method and apparatus for filling a gap |
US10410943B2 (en) | 2016-10-13 | 2019-09-10 | Asm Ip Holding B.V. | Method for passivating a surface of a semiconductor and related systems |
US10643826B2 (en) | 2016-10-26 | 2020-05-05 | Asm Ip Holdings B.V. | Methods for thermally calibrating reaction chambers |
US10943771B2 (en) | 2016-10-26 | 2021-03-09 | Asm Ip Holding B.V. | Methods for thermally calibrating reaction chambers |
US11532757B2 (en) | 2016-10-27 | 2022-12-20 | Asm Ip Holding B.V. | Deposition of charge trapping layers |
US10720331B2 (en) | 2016-11-01 | 2020-07-21 | ASM IP Holdings, B.V. | Methods for forming a transition metal nitride film on a substrate by atomic layer deposition and related semiconductor device structures |
US11810788B2 (en) | 2016-11-01 | 2023-11-07 | Asm Ip Holding B.V. | Methods for forming a transition metal niobium nitride film on a substrate by atomic layer deposition and related semiconductor device structures |
US10435790B2 (en) | 2016-11-01 | 2019-10-08 | Asm Ip Holding B.V. | Method of subatmospheric plasma-enhanced ALD using capacitively coupled electrodes with narrow gap |
US10714350B2 (en) | 2016-11-01 | 2020-07-14 | ASM IP Holdings, B.V. | Methods for forming a transition metal niobium nitride film on a substrate by atomic layer deposition and related semiconductor device structures |
US10644025B2 (en) | 2016-11-07 | 2020-05-05 | Asm Ip Holding B.V. | Method of processing a substrate and a device manufactured by using the method |
US10622375B2 (en) | 2016-11-07 | 2020-04-14 | Asm Ip Holding B.V. | Method of processing a substrate and a device manufactured by using the method |
US11396702B2 (en) | 2016-11-15 | 2022-07-26 | Asm Ip Holding B.V. | Gas supply unit and substrate processing apparatus including the gas supply unit |
US10934619B2 (en) | 2016-11-15 | 2021-03-02 | Asm Ip Holding B.V. | Gas supply unit and substrate processing apparatus including the gas supply unit |
US10340135B2 (en) | 2016-11-28 | 2019-07-02 | Asm Ip Holding B.V. | Method of topologically restricted plasma-enhanced cyclic deposition of silicon or metal nitride |
US11222772B2 (en) | 2016-12-14 | 2022-01-11 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11970766B2 (en) | 2016-12-15 | 2024-04-30 | Asm Ip Holding B.V. | Sequential infiltration synthesis apparatus |
US11851755B2 (en) | 2016-12-15 | 2023-12-26 | Asm Ip Holding B.V. | Sequential infiltration synthesis apparatus and a method of forming a patterned structure |
US12000042B2 (en) | 2016-12-15 | 2024-06-04 | Asm Ip Holding B.V. | Sequential infiltration synthesis apparatus and a method of forming a patterned structure |
US11581186B2 (en) | 2016-12-15 | 2023-02-14 | Asm Ip Holding B.V. | Sequential infiltration synthesis apparatus |
US11447861B2 (en) | 2016-12-15 | 2022-09-20 | Asm Ip Holding B.V. | Sequential infiltration synthesis apparatus and a method of forming a patterned structure |
US11001925B2 (en) | 2016-12-19 | 2021-05-11 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11251035B2 (en) | 2016-12-22 | 2022-02-15 | Asm Ip Holding B.V. | Method of forming a structure on a substrate |
US10784102B2 (en) | 2016-12-22 | 2020-09-22 | Asm Ip Holding B.V. | Method of forming a structure on a substrate |
US10867788B2 (en) | 2016-12-28 | 2020-12-15 | Asm Ip Holding B.V. | Method of forming a structure on a substrate |
US12043899B2 (en) | 2017-01-10 | 2024-07-23 | Asm Ip Holding B.V. | Reactor system and method to reduce residue buildup during a film deposition process |
US11390950B2 (en) | 2017-01-10 | 2022-07-19 | Asm Ip Holding B.V. | Reactor system and method to reduce residue buildup during a film deposition process |
US10655221B2 (en) | 2017-02-09 | 2020-05-19 | Asm Ip Holding B.V. | Method for depositing oxide film by thermal ALD and PEALD |
US10468262B2 (en) | 2017-02-15 | 2019-11-05 | Asm Ip Holding B.V. | Methods for forming a metallic film on a substrate by a cyclical deposition and related semiconductor device structures |
US11410851B2 (en) | 2017-02-15 | 2022-08-09 | Asm Ip Holding B.V. | Methods for forming a metallic film on a substrate by cyclical deposition and related semiconductor device structures |
US10468261B2 (en) | 2017-02-15 | 2019-11-05 | Asm Ip Holding B.V. | Methods for forming a metallic film on a substrate by cyclical deposition and related semiconductor device structures |
US10529563B2 (en) | 2017-03-29 | 2020-01-07 | Asm Ip Holdings B.V. | Method for forming doped metal oxide films on a substrate by cyclical deposition and related semiconductor device structures |
US11658030B2 (en) | 2017-03-29 | 2023-05-23 | Asm Ip Holding B.V. | Method for forming doped metal oxide films on a substrate by cyclical deposition and related semiconductor device structures |
US10714335B2 (en) | 2017-04-25 | 2020-07-14 | Asm Ip Holding B.V. | Method of depositing thin film and method of manufacturing semiconductor device |
US10950432B2 (en) | 2017-04-25 | 2021-03-16 | Asm Ip Holding B.V. | Method of depositing thin film and method of manufacturing semiconductor device |
US10446393B2 (en) | 2017-05-08 | 2019-10-15 | Asm Ip Holding B.V. | Methods for forming silicon-containing epitaxial layers and related semiconductor device structures |
US11848200B2 (en) | 2017-05-08 | 2023-12-19 | Asm Ip Holding B.V. | Methods for selectively forming a silicon nitride film on a substrate and related semiconductor device structures |
US10892156B2 (en) | 2017-05-08 | 2021-01-12 | Asm Ip Holding B.V. | Methods for forming a silicon nitride film on a substrate and related semiconductor device structures |
US10770286B2 (en) | 2017-05-08 | 2020-09-08 | Asm Ip Holdings B.V. | Methods for selectively forming a silicon nitride film on a substrate and related semiconductor device structures |
US10504742B2 (en) | 2017-05-31 | 2019-12-10 | Asm Ip Holding B.V. | Method of atomic layer etching using hydrogen plasma |
US10886123B2 (en) | 2017-06-02 | 2021-01-05 | Asm Ip Holding B.V. | Methods for forming low temperature semiconductor layers and related semiconductor device structures |
US12040200B2 (en) | 2017-06-20 | 2024-07-16 | Asm Ip Holding B.V. | Semiconductor processing apparatus and methods for calibrating a semiconductor processing apparatus |
US11976361B2 (en) | 2017-06-28 | 2024-05-07 | Asm Ip Holding B.V. | Methods for depositing a transition metal nitride film on a substrate by atomic layer deposition and related deposition apparatus |
US11306395B2 (en) | 2017-06-28 | 2022-04-19 | Asm Ip Holding B.V. | Methods for depositing a transition metal nitride film on a substrate by atomic layer deposition and related deposition apparatus |
US10685834B2 (en) | 2017-07-05 | 2020-06-16 | Asm Ip Holdings B.V. | Methods for forming a silicon germanium tin layer and related semiconductor device structures |
US10734497B2 (en) | 2017-07-18 | 2020-08-04 | Asm Ip Holding B.V. | Methods for forming a semiconductor device structure and related semiconductor device structures |
US11695054B2 (en) | 2017-07-18 | 2023-07-04 | Asm Ip Holding B.V. | Methods for forming a semiconductor device structure and related semiconductor device structures |
US11164955B2 (en) | 2017-07-18 | 2021-11-02 | Asm Ip Holding B.V. | Methods for forming a semiconductor device structure and related semiconductor device structures |
US10541333B2 (en) | 2017-07-19 | 2020-01-21 | Asm Ip Holding B.V. | Method for depositing a group IV semiconductor and related semiconductor device structures |
US11374112B2 (en) | 2017-07-19 | 2022-06-28 | Asm Ip Holding B.V. | Method for depositing a group IV semiconductor and related semiconductor device structures |
US11004977B2 (en) | 2017-07-19 | 2021-05-11 | Asm Ip Holding B.V. | Method for depositing a group IV semiconductor and related semiconductor device structures |
US11018002B2 (en) | 2017-07-19 | 2021-05-25 | Asm Ip Holding B.V. | Method for selectively depositing a Group IV semiconductor and related semiconductor device structures |
US10605530B2 (en) | 2017-07-26 | 2020-03-31 | Asm Ip Holding B.V. | Assembly of a liner and a flange for a vertical furnace as well as the liner and the vertical furnace |
US11802338B2 (en) | 2017-07-26 | 2023-10-31 | Asm Ip Holding B.V. | Chemical treatment, deposition and/or infiltration apparatus and method for using the same |
US10590535B2 (en) | 2017-07-26 | 2020-03-17 | Asm Ip Holdings B.V. | Chemical treatment, deposition and/or infiltration apparatus and method for using the same |
US10692741B2 (en) | 2017-08-08 | 2020-06-23 | Asm Ip Holdings B.V. | Radiation shield |
US11587821B2 (en) | 2017-08-08 | 2023-02-21 | Asm Ip Holding B.V. | Substrate lift mechanism and reactor including same |
US10770336B2 (en) | 2017-08-08 | 2020-09-08 | Asm Ip Holding B.V. | Substrate lift mechanism and reactor including same |
US11417545B2 (en) | 2017-08-08 | 2022-08-16 | Asm Ip Holding B.V. | Radiation shield |
US10672636B2 (en) | 2017-08-09 | 2020-06-02 | Asm Ip Holding B.V. | Cassette holder assembly for a substrate cassette and holding member for use in such assembly |
US11769682B2 (en) | 2017-08-09 | 2023-09-26 | Asm Ip Holding B.V. | Storage apparatus for storing cassettes for substrates and processing apparatus equipped therewith |
US11139191B2 (en) | 2017-08-09 | 2021-10-05 | Asm Ip Holding B.V. | Storage apparatus for storing cassettes for substrates and processing apparatus equipped therewith |
USD900036S1 (en) | 2017-08-24 | 2020-10-27 | Asm Ip Holding B.V. | Heater electrical connector and adapter |
US11830730B2 (en) | 2017-08-29 | 2023-11-28 | Asm Ip Holding B.V. | Layer forming method and apparatus |
US11581220B2 (en) | 2017-08-30 | 2023-02-14 | Asm Ip Holding B.V. | Methods for depositing a molybdenum metal film over a dielectric surface of a substrate by a cyclical deposition process and related semiconductor device structures |
US11056344B2 (en) | 2017-08-30 | 2021-07-06 | Asm Ip Holding B.V. | Layer forming method |
US11069510B2 (en) | 2017-08-30 | 2021-07-20 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11295980B2 (en) | 2017-08-30 | 2022-04-05 | Asm Ip Holding B.V. | Methods for depositing a molybdenum metal film over a dielectric surface of a substrate by a cyclical deposition process and related semiconductor device structures |
US11993843B2 (en) | 2017-08-31 | 2024-05-28 | Asm Ip Holding B.V. | Substrate processing apparatus |
US10607895B2 (en) | 2017-09-18 | 2020-03-31 | Asm Ip Holdings B.V. | Method for forming a semiconductor device structure comprising a gate fill metal |
US10928731B2 (en) | 2017-09-21 | 2021-02-23 | Asm Ip Holding B.V. | Method of sequential infiltration synthesis treatment of infiltrateable material and structures and devices formed using same |
US10844484B2 (en) | 2017-09-22 | 2020-11-24 | Asm Ip Holding B.V. | Apparatus for dispensing a vapor phase reactant to a reaction chamber and related methods |
US10658205B2 (en) | 2017-09-28 | 2020-05-19 | Asm Ip Holdings B.V. | Chemical dispensing apparatus and methods for dispensing a chemical to a reaction chamber |
US11387120B2 (en) | 2017-09-28 | 2022-07-12 | Asm Ip Holding B.V. | Chemical dispensing apparatus and methods for dispensing a chemical to a reaction chamber |
US11094546B2 (en) | 2017-10-05 | 2021-08-17 | Asm Ip Holding B.V. | Method for selectively depositing a metallic film on a substrate |
US10403504B2 (en) | 2017-10-05 | 2019-09-03 | Asm Ip Holding B.V. | Method for selectively depositing a metallic film on a substrate |
US12033861B2 (en) | 2017-10-05 | 2024-07-09 | Asm Ip Holding B.V. | Method for selectively depositing a metallic film on a substrate |
US10734223B2 (en) | 2017-10-10 | 2020-08-04 | Asm Ip Holding B.V. | Method for depositing a metal chalcogenide on a substrate by cyclical deposition |
US12040184B2 (en) | 2017-10-30 | 2024-07-16 | Asm Ip Holding B.V. | Methods for forming a semiconductor structure and related semiconductor structures |
US10923344B2 (en) | 2017-10-30 | 2021-02-16 | Asm Ip Holding B.V. | Methods for forming a semiconductor structure and related semiconductor structures |
US10734244B2 (en) | 2017-11-16 | 2020-08-04 | Asm Ip Holding B.V. | Method of processing a substrate and a device manufactured by the same |
US10910262B2 (en) | 2017-11-16 | 2021-02-02 | Asm Ip Holding B.V. | Method of selectively depositing a capping layer structure on a semiconductor device structure |
US11022879B2 (en) | 2017-11-24 | 2021-06-01 | Asm Ip Holding B.V. | Method of forming an enhanced unexposed photoresist layer |
US11127617B2 (en) | 2017-11-27 | 2021-09-21 | Asm Ip Holding B.V. | Storage device for storing wafer cassettes for use with a batch furnace |
US11682572B2 (en) | 2017-11-27 | 2023-06-20 | Asm Ip Holdings B.V. | Storage device for storing wafer cassettes for use with a batch furnace |
US11639811B2 (en) | 2017-11-27 | 2023-05-02 | Asm Ip Holding B.V. | Apparatus including a clean mini environment |
US11501973B2 (en) | 2018-01-16 | 2022-11-15 | Asm Ip Holding B.V. | Method for depositing a material film on a substrate within a reaction chamber by a cyclical deposition process and related device structures |
US10872771B2 (en) | 2018-01-16 | 2020-12-22 | Asm Ip Holding B. V. | Method for depositing a material film on a substrate within a reaction chamber by a cyclical deposition process and related device structures |
US11393690B2 (en) | 2018-01-19 | 2022-07-19 | Asm Ip Holding B.V. | Deposition method |
US11482412B2 (en) | 2018-01-19 | 2022-10-25 | Asm Ip Holding B.V. | Method for depositing a gap-fill layer by plasma-assisted deposition |
US11972944B2 (en) | 2018-01-19 | 2024-04-30 | Asm Ip Holding B.V. | Method for depositing a gap-fill layer by plasma-assisted deposition |
USD903477S1 (en) | 2018-01-24 | 2020-12-01 | Asm Ip Holdings B.V. | Metal clamp |
US11018047B2 (en) | 2018-01-25 | 2021-05-25 | Asm Ip Holding B.V. | Hybrid lift pin |
US10535516B2 (en) | 2018-02-01 | 2020-01-14 | Asm Ip Holdings B.V. | Method for depositing a semiconductor structure on a surface of a substrate and related semiconductor structures |
USD913980S1 (en) | 2018-02-01 | 2021-03-23 | Asm Ip Holding B.V. | Gas supply plate for semiconductor manufacturing apparatus |
USD880437S1 (en) | 2018-02-01 | 2020-04-07 | Asm Ip Holding B.V. | Gas supply plate for semiconductor manufacturing apparatus |
US11081345B2 (en) | 2018-02-06 | 2021-08-03 | Asm Ip Holding B.V. | Method of post-deposition treatment for silicon oxide film |
US11735414B2 (en) | 2018-02-06 | 2023-08-22 | Asm Ip Holding B.V. | Method of post-deposition treatment for silicon oxide film |
US11387106B2 (en) | 2018-02-14 | 2022-07-12 | Asm Ip Holding B.V. | Method for depositing a ruthenium-containing film on a substrate by a cyclical deposition process |
US11685991B2 (en) | 2018-02-14 | 2023-06-27 | Asm Ip Holding B.V. | Method for depositing a ruthenium-containing film on a substrate by a cyclical deposition process |
US10896820B2 (en) | 2018-02-14 | 2021-01-19 | Asm Ip Holding B.V. | Method for depositing a ruthenium-containing film on a substrate by a cyclical deposition process |
US10731249B2 (en) | 2018-02-15 | 2020-08-04 | Asm Ip Holding B.V. | Method of forming a transition metal containing film on a substrate by a cyclical deposition process, a method for supplying a transition metal halide compound to a reaction chamber, and related vapor deposition apparatus |
US11482418B2 (en) | 2018-02-20 | 2022-10-25 | Asm Ip Holding B.V. | Substrate processing method and apparatus |
US10658181B2 (en) | 2018-02-20 | 2020-05-19 | Asm Ip Holding B.V. | Method of spacer-defined direct patterning in semiconductor fabrication |
US11939673B2 (en) | 2018-02-23 | 2024-03-26 | Asm Ip Holding B.V. | Apparatus for detecting or monitoring for a chemical precursor in a high temperature environment |
US10975470B2 (en) | 2018-02-23 | 2021-04-13 | Asm Ip Holding B.V. | Apparatus for detecting or monitoring for a chemical precursor in a high temperature environment |
US11473195B2 (en) | 2018-03-01 | 2022-10-18 | Asm Ip Holding B.V. | Semiconductor processing apparatus and a method for processing a substrate |
US11629406B2 (en) | 2018-03-09 | 2023-04-18 | Asm Ip Holding B.V. | Semiconductor processing apparatus comprising one or more pyrometers for measuring a temperature of a substrate during transfer of the substrate |
US11114283B2 (en) | 2018-03-16 | 2021-09-07 | Asm Ip Holding B.V. | Reactor, system including the reactor, and methods of manufacturing and using same |
US12020938B2 (en) | 2018-03-27 | 2024-06-25 | Asm Ip Holding B.V. | Method of forming an electrode on a substrate and a semiconductor device structure including an electrode |
US10847371B2 (en) | 2018-03-27 | 2020-11-24 | Asm Ip Holding B.V. | Method of forming an electrode on a substrate and a semiconductor device structure including an electrode |
US11398382B2 (en) | 2018-03-27 | 2022-07-26 | Asm Ip Holding B.V. | Method of forming an electrode on a substrate and a semiconductor device structure including an electrode |
US11230766B2 (en) | 2018-03-29 | 2022-01-25 | Asm Ip Holding B.V. | Substrate processing apparatus and method |
US10510536B2 (en) | 2018-03-29 | 2019-12-17 | Asm Ip Holding B.V. | Method of depositing a co-doped polysilicon film on a surface of a substrate within a reaction chamber |
US11088002B2 (en) | 2018-03-29 | 2021-08-10 | Asm Ip Holding B.V. | Substrate rack and a substrate processing system and method |
US10867786B2 (en) | 2018-03-30 | 2020-12-15 | Asm Ip Holding B.V. | Substrate processing method |
US12025484B2 (en) | 2018-05-08 | 2024-07-02 | Asm Ip Holding B.V. | Thin film forming method |
US11469098B2 (en) | 2018-05-08 | 2022-10-11 | Asm Ip Holding B.V. | Methods for depositing an oxide film on a substrate by a cyclical deposition process and related device structures |
US11056567B2 (en) | 2018-05-11 | 2021-07-06 | Asm Ip Holding B.V. | Method of forming a doped metal carbide film on a substrate and related semiconductor device structures |
US11361990B2 (en) | 2018-05-28 | 2022-06-14 | Asm Ip Holding B.V. | Substrate processing method and device manufactured by using the same |
US11908733B2 (en) | 2018-05-28 | 2024-02-20 | Asm Ip Holding B.V. | Substrate processing method and device manufactured by using the same |
US11837483B2 (en) | 2018-06-04 | 2023-12-05 | Asm Ip Holding B.V. | Wafer handling chamber with moisture reduction |
US11270899B2 (en) | 2018-06-04 | 2022-03-08 | Asm Ip Holding B.V. | Wafer handling chamber with moisture reduction |
US11718913B2 (en) | 2018-06-04 | 2023-08-08 | Asm Ip Holding B.V. | Gas distribution system and reactor system including same |
US11286562B2 (en) | 2018-06-08 | 2022-03-29 | Asm Ip Holding B.V. | Gas-phase chemical reactor and method of using same |
US11530483B2 (en) | 2018-06-21 | 2022-12-20 | Asm Ip Holding B.V. | Substrate processing system |
US11296189B2 (en) | 2018-06-21 | 2022-04-05 | Asm Ip Holding B.V. | Method for depositing a phosphorus doped silicon arsenide film and related semiconductor device structures |
US10797133B2 (en) | 2018-06-21 | 2020-10-06 | Asm Ip Holding B.V. | Method for depositing a phosphorus doped silicon arsenide film and related semiconductor device structures |
US11492703B2 (en) | 2018-06-27 | 2022-11-08 | Asm Ip Holding B.V. | Cyclic deposition methods for forming metal-containing material and films and structures including the metal-containing material |
US11499222B2 (en) | 2018-06-27 | 2022-11-15 | Asm Ip Holding B.V. | Cyclic deposition methods for forming metal-containing material and films and structures including the metal-containing material |
US11814715B2 (en) | 2018-06-27 | 2023-11-14 | Asm Ip Holding B.V. | Cyclic deposition methods for forming metal-containing material and films and structures including the metal-containing material |
US11952658B2 (en) | 2018-06-27 | 2024-04-09 | Asm Ip Holding B.V. | Cyclic deposition methods for forming metal-containing material and films and structures including the metal-containing material |
US10612136B2 (en) | 2018-06-29 | 2020-04-07 | ASM IP Holding, B.V. | Temperature-controlled flange and reactor system including same |
US11168395B2 (en) | 2018-06-29 | 2021-11-09 | Asm Ip Holding B.V. | Temperature-controlled flange and reactor system including same |
US10914004B2 (en) | 2018-06-29 | 2021-02-09 | Asm Ip Holding B.V. | Thin-film deposition method and manufacturing method of semiconductor device |
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US10388513B1 (en) | 2018-07-03 | 2019-08-20 | Asm Ip Holding B.V. | Method for depositing silicon-free carbon-containing film as gap-fill layer by pulse plasma-assisted deposition |
US11646197B2 (en) | 2018-07-03 | 2023-05-09 | Asm Ip Holding B.V. | Method for depositing silicon-free carbon-containing film as gap-fill layer by pulse plasma-assisted deposition |
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US11053591B2 (en) | 2018-08-06 | 2021-07-06 | Asm Ip Holding B.V. | Multi-port gas injection system and reactor system including same |
US10883175B2 (en) | 2018-08-09 | 2021-01-05 | Asm Ip Holding B.V. | Vertical furnace for processing substrates and a liner for use therein |
US10829852B2 (en) | 2018-08-16 | 2020-11-10 | Asm Ip Holding B.V. | Gas distribution device for a wafer processing apparatus |
US11430674B2 (en) | 2018-08-22 | 2022-08-30 | Asm Ip Holding B.V. | Sensor array, apparatus for dispensing a vapor phase reactant to a reaction chamber and related methods |
US11274369B2 (en) | 2018-09-11 | 2022-03-15 | Asm Ip Holding B.V. | Thin film deposition method |
US11804388B2 (en) | 2018-09-11 | 2023-10-31 | Asm Ip Holding B.V. | Substrate processing apparatus and method |
US11024523B2 (en) | 2018-09-11 | 2021-06-01 | Asm Ip Holding B.V. | Substrate processing apparatus and method |
US11049751B2 (en) | 2018-09-14 | 2021-06-29 | Asm Ip Holding B.V. | Cassette supply system to store and handle cassettes and processing apparatus equipped therewith |
US11885023B2 (en) | 2018-10-01 | 2024-01-30 | Asm Ip Holding B.V. | Substrate retaining apparatus, system including the apparatus, and method of using same |
US11232963B2 (en) | 2018-10-03 | 2022-01-25 | Asm Ip Holding B.V. | Substrate processing apparatus and method |
US11414760B2 (en) | 2018-10-08 | 2022-08-16 | Asm Ip Holding B.V. | Substrate support unit, thin film deposition apparatus including the same, and substrate processing apparatus including the same |
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US11664199B2 (en) | 2018-10-19 | 2023-05-30 | Asm Ip Holding B.V. | Substrate processing apparatus and substrate processing method |
US11251068B2 (en) | 2018-10-19 | 2022-02-15 | Asm Ip Holding B.V. | Substrate processing apparatus and substrate processing method |
USD948463S1 (en) | 2018-10-24 | 2022-04-12 | Asm Ip Holding B.V. | Susceptor for semiconductor substrate supporting apparatus |
US10381219B1 (en) | 2018-10-25 | 2019-08-13 | Asm Ip Holding B.V. | Methods for forming a silicon nitride film |
US11087997B2 (en) | 2018-10-31 | 2021-08-10 | Asm Ip Holding B.V. | Substrate processing apparatus for processing substrates |
US11735445B2 (en) | 2018-10-31 | 2023-08-22 | Asm Ip Holding B.V. | Substrate processing apparatus for processing substrates |
US11866823B2 (en) | 2018-11-02 | 2024-01-09 | Asm Ip Holding B.V. | Substrate supporting unit and a substrate processing device including the same |
US11499226B2 (en) | 2018-11-02 | 2022-11-15 | Asm Ip Holding B.V. | Substrate supporting unit and a substrate processing device including the same |
US11572620B2 (en) | 2018-11-06 | 2023-02-07 | Asm Ip Holding B.V. | Methods for selectively depositing an amorphous silicon film on a substrate |
US11031242B2 (en) | 2018-11-07 | 2021-06-08 | Asm Ip Holding B.V. | Methods for depositing a boron doped silicon germanium film |
US11798999B2 (en) | 2018-11-16 | 2023-10-24 | Asm Ip Holding B.V. | Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures |
US10847366B2 (en) | 2018-11-16 | 2020-11-24 | Asm Ip Holding B.V. | Methods for depositing a transition metal chalcogenide film on a substrate by a cyclical deposition process |
US10818758B2 (en) | 2018-11-16 | 2020-10-27 | Asm Ip Holding B.V. | Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures |
US11244825B2 (en) | 2018-11-16 | 2022-02-08 | Asm Ip Holding B.V. | Methods for depositing a transition metal chalcogenide film on a substrate by a cyclical deposition process |
US11411088B2 (en) | 2018-11-16 | 2022-08-09 | Asm Ip Holding B.V. | Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures |
US10559458B1 (en) | 2018-11-26 | 2020-02-11 | Asm Ip Holding B.V. | Method of forming oxynitride film |
US12040199B2 (en) | 2018-11-28 | 2024-07-16 | Asm Ip Holding B.V. | Substrate processing apparatus for processing substrates |
US11217444B2 (en) | 2018-11-30 | 2022-01-04 | Asm Ip Holding B.V. | Method for forming an ultraviolet radiation responsive metal oxide-containing film |
US11488819B2 (en) | 2018-12-04 | 2022-11-01 | Asm Ip Holding B.V. | Method of cleaning substrate processing apparatus |
US11158513B2 (en) | 2018-12-13 | 2021-10-26 | Asm Ip Holding B.V. | Methods for forming a rhenium-containing film on a substrate by a cyclical deposition process and related semiconductor device structures |
US11769670B2 (en) | 2018-12-13 | 2023-09-26 | Asm Ip Holding B.V. | Methods for forming a rhenium-containing film on a substrate by a cyclical deposition process and related semiconductor device structures |
US11658029B2 (en) | 2018-12-14 | 2023-05-23 | Asm Ip Holding B.V. | Method of forming a device structure using selective deposition of gallium nitride and system for same |
US11390946B2 (en) | 2019-01-17 | 2022-07-19 | Asm Ip Holding B.V. | Methods of forming a transition metal containing film on a substrate by a cyclical deposition process |
US11959171B2 (en) | 2019-01-17 | 2024-04-16 | Asm Ip Holding B.V. | Methods of forming a transition metal containing film on a substrate by a cyclical deposition process |
US11171025B2 (en) | 2019-01-22 | 2021-11-09 | Asm Ip Holding B.V. | Substrate processing device |
US11127589B2 (en) | 2019-02-01 | 2021-09-21 | Asm Ip Holding B.V. | Method of topology-selective film formation of silicon oxide |
US11227789B2 (en) | 2019-02-20 | 2022-01-18 | Asm Ip Holding B.V. | Method and apparatus for filling a recess formed within a substrate surface |
US11342216B2 (en) | 2019-02-20 | 2022-05-24 | Asm Ip Holding B.V. | Cyclical deposition method and apparatus for filling a recess formed within a substrate surface |
US11251040B2 (en) | 2019-02-20 | 2022-02-15 | Asm Ip Holding B.V. | Cyclical deposition method including treatment step and apparatus for same |
US11798834B2 (en) | 2019-02-20 | 2023-10-24 | Asm Ip Holding B.V. | Cyclical deposition method and apparatus for filling a recess formed within a substrate surface |
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US11114294B2 (en) | 2019-03-08 | 2021-09-07 | Asm Ip Holding B.V. | Structure including SiOC layer and method of forming same |
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US11742198B2 (en) | 2019-03-08 | 2023-08-29 | Asm Ip Holding B.V. | Structure including SiOCN layer and method of forming same |
US11378337B2 (en) | 2019-03-28 | 2022-07-05 | Asm Ip Holding B.V. | Door opener and substrate processing apparatus provided therewith |
US11551925B2 (en) | 2019-04-01 | 2023-01-10 | Asm Ip Holding B.V. | Method for manufacturing a semiconductor device |
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US11781221B2 (en) | 2019-05-07 | 2023-10-10 | Asm Ip Holding B.V. | Chemical source vessel with dip tube |
US11289326B2 (en) | 2019-05-07 | 2022-03-29 | Asm Ip Holding B.V. | Method for reforming amorphous carbon polymer film |
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US11996309B2 (en) | 2019-05-16 | 2024-05-28 | Asm Ip Holding B.V. | Wafer boat handling device, vertical batch furnace and method |
US11515188B2 (en) | 2019-05-16 | 2022-11-29 | Asm Ip Holding B.V. | Wafer boat handling device, vertical batch furnace and method |
USD975665S1 (en) | 2019-05-17 | 2023-01-17 | Asm Ip Holding B.V. | Susceptor shaft |
USD947913S1 (en) | 2019-05-17 | 2022-04-05 | Asm Ip Holding B.V. | Susceptor shaft |
USD935572S1 (en) | 2019-05-24 | 2021-11-09 | Asm Ip Holding B.V. | Gas channel plate |
USD922229S1 (en) | 2019-06-05 | 2021-06-15 | Asm Ip Holding B.V. | Device for controlling a temperature of a gas supply unit |
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US11453946B2 (en) | 2019-06-06 | 2022-09-27 | Asm Ip Holding B.V. | Gas-phase reactor system including a gas detector |
US11908684B2 (en) | 2019-06-11 | 2024-02-20 | Asm Ip Holding B.V. | Method of forming an electronic structure using reforming gas, system for performing the method, and structure formed using the method |
US11476109B2 (en) | 2019-06-11 | 2022-10-18 | Asm Ip Holding B.V. | Method of forming an electronic structure using reforming gas, system for performing the method, and structure formed using the method |
USD944946S1 (en) | 2019-06-14 | 2022-03-01 | Asm Ip Holding B.V. | Shower plate |
USD931978S1 (en) | 2019-06-27 | 2021-09-28 | Asm Ip Holding B.V. | Showerhead vacuum transport |
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US11390945B2 (en) | 2019-07-03 | 2022-07-19 | Asm Ip Holding B.V. | Temperature control assembly for substrate processing apparatus and method of using same |
US11605528B2 (en) | 2019-07-09 | 2023-03-14 | Asm Ip Holding B.V. | Plasma device using coaxial waveguide, and substrate treatment method |
US11664267B2 (en) | 2019-07-10 | 2023-05-30 | Asm Ip Holding B.V. | Substrate support assembly and substrate processing device including the same |
US11664245B2 (en) | 2019-07-16 | 2023-05-30 | Asm Ip Holding B.V. | Substrate processing device |
US11996304B2 (en) | 2019-07-16 | 2024-05-28 | Asm Ip Holding B.V. | Substrate processing device |
US11688603B2 (en) | 2019-07-17 | 2023-06-27 | Asm Ip Holding B.V. | Methods of forming silicon germanium structures |
US11615970B2 (en) | 2019-07-17 | 2023-03-28 | Asm Ip Holding B.V. | Radical assist ignition plasma system and method |
US11643724B2 (en) | 2019-07-18 | 2023-05-09 | Asm Ip Holding B.V. | Method of forming structures using a neutral beam |
US11282698B2 (en) | 2019-07-19 | 2022-03-22 | Asm Ip Holding B.V. | Method of forming topology-controlled amorphous carbon polymer film |
US11557474B2 (en) | 2019-07-29 | 2023-01-17 | Asm Ip Holding B.V. | Methods for selective deposition utilizing n-type dopants and/or alternative dopants to achieve high dopant incorporation |
US11443926B2 (en) | 2019-07-30 | 2022-09-13 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11430640B2 (en) | 2019-07-30 | 2022-08-30 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11587815B2 (en) | 2019-07-31 | 2023-02-21 | Asm Ip Holding B.V. | Vertical batch furnace assembly |
US11227782B2 (en) | 2019-07-31 | 2022-01-18 | Asm Ip Holding B.V. | Vertical batch furnace assembly |
US11587814B2 (en) | 2019-07-31 | 2023-02-21 | Asm Ip Holding B.V. | Vertical batch furnace assembly |
US11876008B2 (en) | 2019-07-31 | 2024-01-16 | Asm Ip Holding B.V. | Vertical batch furnace assembly |
US11680839B2 (en) | 2019-08-05 | 2023-06-20 | Asm Ip Holding B.V. | Liquid level sensor for a chemical source vessel |
USD965044S1 (en) | 2019-08-19 | 2022-09-27 | Asm Ip Holding B.V. | Susceptor shaft |
USD965524S1 (en) | 2019-08-19 | 2022-10-04 | Asm Ip Holding B.V. | Susceptor support |
US11639548B2 (en) | 2019-08-21 | 2023-05-02 | Asm Ip Holding B.V. | Film-forming material mixed-gas forming device and film forming device |
USD940837S1 (en) | 2019-08-22 | 2022-01-11 | Asm Ip Holding B.V. | Electrode |
USD930782S1 (en) | 2019-08-22 | 2021-09-14 | Asm Ip Holding B.V. | Gas distributor |
US12040229B2 (en) | 2019-08-22 | 2024-07-16 | Asm Ip Holding B.V. | Method for forming a structure with a hole |
USD979506S1 (en) | 2019-08-22 | 2023-02-28 | Asm Ip Holding B.V. | Insulator |
US11594450B2 (en) | 2019-08-22 | 2023-02-28 | Asm Ip Holding B.V. | Method for forming a structure with a hole |
USD949319S1 (en) | 2019-08-22 | 2022-04-19 | Asm Ip Holding B.V. | Exhaust duct |
US11827978B2 (en) | 2019-08-23 | 2023-11-28 | Asm Ip Holding B.V. | Methods for depositing a molybdenum nitride film on a surface of a substrate by a cyclical deposition process and related semiconductor device structures including a molybdenum nitride film |
US11527400B2 (en) | 2019-08-23 | 2022-12-13 | Asm Ip Holding B.V. | Method for depositing silicon oxide film having improved quality by peald using bis(diethylamino)silane |
US12033849B2 (en) | 2019-08-23 | 2024-07-09 | Asm Ip Holding B.V. | Method for depositing silicon oxide film having improved quality by PEALD using bis(diethylamino)silane |
US11898242B2 (en) | 2019-08-23 | 2024-02-13 | Asm Ip Holding B.V. | Methods for forming a polycrystalline molybdenum film over a surface of a substrate and related structures including a polycrystalline molybdenum film |
US11286558B2 (en) | 2019-08-23 | 2022-03-29 | Asm Ip Holding B.V. | Methods for depositing a molybdenum nitride film on a surface of a substrate by a cyclical deposition process and related semiconductor device structures including a molybdenum nitride film |
US11495459B2 (en) | 2019-09-04 | 2022-11-08 | Asm Ip Holding B.V. | Methods for selective deposition using a sacrificial capping layer |
US11823876B2 (en) | 2019-09-05 | 2023-11-21 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11562901B2 (en) | 2019-09-25 | 2023-01-24 | Asm Ip Holding B.V. | Substrate processing method |
US11610774B2 (en) | 2019-10-02 | 2023-03-21 | Asm Ip Holding B.V. | Methods for forming a topographically selective silicon oxide film by a cyclical plasma-enhanced deposition process |
US12006572B2 (en) | 2019-10-08 | 2024-06-11 | Asm Ip Holding B.V. | Reactor system including a gas distribution assembly for use with activated species and method of using same |
US11339476B2 (en) | 2019-10-08 | 2022-05-24 | Asm Ip Holding B.V. | Substrate processing device having connection plates, substrate processing method |
US11735422B2 (en) | 2019-10-10 | 2023-08-22 | Asm Ip Holding B.V. | Method of forming a photoresist underlayer and structure including same |
US12009241B2 (en) | 2019-10-14 | 2024-06-11 | Asm Ip Holding B.V. | Vertical batch furnace assembly with detector to detect cassette |
US11637011B2 (en) | 2019-10-16 | 2023-04-25 | Asm Ip Holding B.V. | Method of topology-selective film formation of silicon oxide |
US11637014B2 (en) | 2019-10-17 | 2023-04-25 | Asm Ip Holding B.V. | Methods for selective deposition of doped semiconductor material |
US11315794B2 (en) | 2019-10-21 | 2022-04-26 | Asm Ip Holding B.V. | Apparatus and methods for selectively etching films |
US11996292B2 (en) | 2019-10-25 | 2024-05-28 | Asm Ip Holding B.V. | Methods for filling a gap feature on a substrate surface and related semiconductor structures |
US11646205B2 (en) | 2019-10-29 | 2023-05-09 | Asm Ip Holding B.V. | Methods of selectively forming n-type doped material on a surface, systems for selectively forming n-type doped material, and structures formed using same |
US11594600B2 (en) | 2019-11-05 | 2023-02-28 | Asm Ip Holding B.V. | Structures with doped semiconductor layers and methods and systems for forming same |
US11501968B2 (en) | 2019-11-15 | 2022-11-15 | Asm Ip Holding B.V. | Method for providing a semiconductor device with silicon filled gaps |
US11626316B2 (en) | 2019-11-20 | 2023-04-11 | Asm Ip Holding B.V. | Method of depositing carbon-containing material on a surface of a substrate, structure formed using the method, and system for forming the structure |
US11401605B2 (en) | 2019-11-26 | 2022-08-02 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11915929B2 (en) | 2019-11-26 | 2024-02-27 | Asm Ip Holding B.V. | Methods for selectively forming a target film on a substrate comprising a first dielectric surface and a second metallic surface |
US11923181B2 (en) | 2019-11-29 | 2024-03-05 | Asm Ip Holding B.V. | Substrate processing apparatus for minimizing the effect of a filling gas during substrate processing |
US11646184B2 (en) | 2019-11-29 | 2023-05-09 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11929251B2 (en) | 2019-12-02 | 2024-03-12 | Asm Ip Holding B.V. | Substrate processing apparatus having electrostatic chuck and substrate processing method |
US11840761B2 (en) | 2019-12-04 | 2023-12-12 | Asm Ip Holding B.V. | Substrate processing apparatus |
US11885013B2 (en) | 2019-12-17 | 2024-01-30 | Asm Ip Holding B.V. | Method of forming vanadium nitride layer and structure including the vanadium nitride layer |
US11527403B2 (en) | 2019-12-19 | 2022-12-13 | Asm Ip Holding B.V. | Methods for filling a gap feature on a substrate surface and related semiconductor structures |
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US11993847B2 (en) | 2020-01-08 | 2024-05-28 | Asm Ip Holding B.V. | Injector |
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JP2006007213A (en) | 2006-01-12 |
KR20050121426A (en) | 2005-12-27 |
CN1883807A (en) | 2006-12-27 |
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