RU2012872C1 - Способ получения изображения внутренней структуры объекта - Google Patents

Способ получения изображения внутренней структуры объекта Download PDF

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Publication number
RU2012872C1
RU2012872C1 SU914934958A SU4934958A RU2012872C1 RU 2012872 C1 RU2012872 C1 RU 2012872C1 SU 914934958 A SU914934958 A SU 914934958A SU 4934958 A SU4934958 A SU 4934958A RU 2012872 C1 RU2012872 C1 RU 2012872C1
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Russia
Prior art keywords
crystal
image
radiation
reflection
analyzer
Prior art date
Application number
SU914934958A
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English (en)
Russian (ru)
Inventor
Виктор Натанович Ингал
Елена Анатольевна Беляевская
Валерий Павлович Ефанов
Original Assignee
Виктор Натанович Ингал
Елена Анатольевна Беляевская
Валерий Павлович Ефанов
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Application filed by Виктор Натанович Ингал, Елена Анатольевна Беляевская, Валерий Павлович Ефанов filed Critical Виктор Натанович Ингал
Priority to SU914934958A priority Critical patent/RU2012872C1/ru
Priority to US07/956,880 priority patent/US5319694A/en
Priority to PCT/RU1992/000105 priority patent/WO1992021016A1/ru
Priority to DE69228285T priority patent/DE69228285T2/de
Priority to AT92915825T priority patent/ATE176323T1/de
Priority to JP4511111A priority patent/JP2694049B2/ja
Priority to EP92915825A priority patent/EP0539608B1/en
Application granted granted Critical
Publication of RU2012872C1 publication Critical patent/RU2012872C1/ru
Priority to US08/500,559 priority patent/US5579363A/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

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  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Superconductors And Manufacturing Methods Therefor (AREA)
  • Devices For Executing Special Programs (AREA)
  • Glass Compositions (AREA)
  • Nitrogen And Oxygen Or Sulfur-Condensed Heterocyclic Ring Systems (AREA)
SU914934958A 1991-05-14 1991-05-14 Способ получения изображения внутренней структуры объекта RU2012872C1 (ru)

Priority Applications (8)

Application Number Priority Date Filing Date Title
SU914934958A RU2012872C1 (ru) 1991-05-14 1991-05-14 Способ получения изображения внутренней структуры объекта
US07/956,880 US5319694A (en) 1991-05-14 1992-05-14 Method for obtaining the image of the internal structure of an object
PCT/RU1992/000105 WO1992021016A1 (en) 1991-05-14 1992-05-14 Method for obtaining internal structure image of object
DE69228285T DE69228285T2 (de) 1991-05-14 1992-05-14 Methode um die abbildung der inneren struktur eines objektes zu erhalten
AT92915825T ATE176323T1 (de) 1991-05-14 1992-05-14 Methode um die abbildung der inneren struktur eines objektes zu erhalten
JP4511111A JP2694049B2 (ja) 1991-05-14 1992-05-14 物体の内部構造の像を得るための方法
EP92915825A EP0539608B1 (en) 1991-05-14 1992-05-14 Method for obtaining internal structure image of object
US08/500,559 US5579363A (en) 1991-05-14 1995-07-11 Method for obtaining the image of the internal structure of an object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU914934958A RU2012872C1 (ru) 1991-05-14 1991-05-14 Способ получения изображения внутренней структуры объекта

Publications (1)

Publication Number Publication Date
RU2012872C1 true RU2012872C1 (ru) 1994-05-15

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Family Applications (1)

Application Number Title Priority Date Filing Date
SU914934958A RU2012872C1 (ru) 1991-05-14 1991-05-14 Способ получения изображения внутренней структуры объекта

Country Status (7)

Country Link
US (2) US5319694A (ja)
EP (1) EP0539608B1 (ja)
JP (1) JP2694049B2 (ja)
AT (1) ATE176323T1 (ja)
DE (1) DE69228285T2 (ja)
RU (1) RU2012872C1 (ja)
WO (1) WO1992021016A1 (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996023210A1 (en) * 1994-12-08 1996-08-01 Alexei Vladislavovich Kurbatov Using deflected penetrating radiation to image an object's internal structure
RU2115943C1 (ru) * 1997-01-16 1998-07-20 Виктор Натанович Ингал Способ фазовой рентгенографии объектов и устройство для его осуществления (варианты)
US6054712A (en) * 1998-01-23 2000-04-25 Quanta Vision, Inc. Inspection equipment using small-angle topography in determining an object's internal structure and composition
US6175117B1 (en) 1998-01-23 2001-01-16 Quanta Vision, Inc. Tissue analysis apparatus
US6281503B1 (en) 1998-05-06 2001-08-28 Quanta Vision, Inc. Non-invasive composition analysis
EA028468B1 (ru) * 2014-11-27 2017-11-30 Федеральное государственное автономное образовательное учреждение высшего профессионального образования "Балтийский федеральный университет имени Иммануила Канта" Способ определения оптических характеристик материалов на основе аномального преломления в рефракционных оптических элементах

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RU2012872C1 (ru) * 1991-05-14 1994-05-15 Виктор Натанович Ингал Способ получения изображения внутренней структуры объекта
US5596620A (en) * 1993-04-30 1997-01-21 The University Of Connecticut X-ray based extensometry device for radiography
WO1995005725A1 (en) * 1993-08-16 1995-02-23 Commonwealth Scientific And Industrial Research Organisation Improved x-ray optics, especially for phase contrast imaging
RU2098797C1 (ru) * 1994-11-30 1997-12-10 Алексей Владиславович Курбатов Способ получения проекции объекта с помощью проникающего излучения и устройство для его осуществления
RU94043357A (ru) * 1994-12-08 1996-10-27 А.В. Курбатов Способ получения изображения объекта с помощью проникающего излучения и устройство для его осуществления
AU779490B2 (en) * 1995-03-28 2005-01-27 Xrt Limited Simplified conditions and configurations for phase-contrast imaging with hard x-rays
AUPN201295A0 (en) * 1995-03-28 1995-04-27 Commonwealth Scientific And Industrial Research Organisation Simplified conditions and configurations for phase-contrast imaging with hard x-rays
US5717733A (en) * 1995-05-31 1998-02-10 Quanta Vision, Inc. X-ray and neutron diffractometric imaging of the internal structure of objects
JPH09187455A (ja) * 1996-01-10 1997-07-22 Hitachi Ltd 位相型ｘ線ｃｔ装置
DE69730550T2 (de) * 1996-03-29 2005-11-10 Hitachi, Ltd. Phasenkontrast-Röntgenabbildungssystem
WO1998016817A1 (en) 1996-10-16 1998-04-23 Illinois Institute Of Technology Method for detecting an image of an object
US5787146A (en) * 1996-10-18 1998-07-28 Spad Technologies, Inc. X-ray imaging system using diffractive x-ray optics for high definition low dosage three dimensional imaging of soft tissue
US6023496A (en) * 1997-04-30 2000-02-08 Shimadzu Corporation X-ray fluorescence analyzing apparatus
US6038285A (en) * 1998-02-02 2000-03-14 Zhong; Zhong Method and apparatus for producing monochromatic radiography with a bent laue crystal
US6625250B2 (en) * 1999-12-20 2003-09-23 Agere Systems Inc. Optical structures and methods for x-ray applications
US6577708B2 (en) 2000-04-17 2003-06-10 Leroy Dean Chapman Diffraction enhanced x-ray imaging of articular cartilage
US6870896B2 (en) 2000-12-28 2005-03-22 Osmic, Inc. Dark-field phase contrast imaging
US6804324B2 (en) * 2001-03-01 2004-10-12 Osmo, Inc. X-ray phase contrast imaging using a fabry-perot interferometer concept
JP4498663B2 (ja) * 2001-07-11 2010-07-07 学校法人東京理科大学 透過型結晶分析体の厚さ設定方法
JP5187694B2 (ja) * 2001-07-11 2013-04-24 学校法人東京理科大学 非破壊分析方法および非破壊分析装置
GB0211691D0 (en) 2002-05-21 2002-07-03 Oxford Diffraction Ltd X-ray diffraction apparatus
AUPS299302A0 (en) * 2002-06-17 2002-07-04 Monash University Methods and apparatus of sample analysis
WO2004010125A1 (ja) * 2002-07-18 2004-01-29 Hitachi Zosen Corporation Ｘ線検査装置およびｘ線検査方法
DE10245676B4 (de) * 2002-09-30 2008-01-17 Siemens Ag Phasenkontrast-Röntgengerät mit Strichfokus zur Erstellung eines Phasenkontrast-Bildes eines Objekts und Verfahren zum Erstellen des Phasenkontrast-Bildes
US6947521B2 (en) * 2003-06-17 2005-09-20 Illinois Institute Of Technology Imaging method based on attenuation, refraction and ultra-small-angle-scattering of x-rays
US7076025B2 (en) 2004-05-19 2006-07-11 Illinois Institute Of Technology Method for detecting a mass density image of an object
GB0411401D0 (en) * 2004-05-21 2004-06-23 Tissuomics Ltd Penetrating radiation measurements
US7330530B2 (en) * 2004-10-04 2008-02-12 Illinois Institute Of Technology Diffraction enhanced imaging method using a line x-ray source
BRPI0707273A2 (pt) * 2006-01-24 2011-04-26 Univ North Carolina Sistemas e métodos para a detecção de uma imagem de um objeto pelo uso de um feixe de raios x que tem uma distribuição policromática
DE102008008829B4 (de) 2007-02-14 2008-11-20 Technische Universität Dresden Verfahren und Vorrichtung zur Registrierung von Realstruktur-Informationen in massiven Kristallkörpern mittels Röntgenstrahlung
US7469037B2 (en) * 2007-04-03 2008-12-23 Illinois Institute Of Technology Method for detecting a mass density image of an object
JP5273955B2 (ja) * 2007-06-26 2013-08-28 株式会社日立製作所 Ｘ線撮像装置及びｘ線撮像方法
WO2009076700A1 (en) * 2007-12-14 2009-06-25 Commonwealth Scientific And Industrial Research Organisation Phase-contrast imaging method and apparatus
CN102065771B (zh) * 2008-06-23 2013-07-10 皇家飞利浦电子股份有限公司 用于k边成像的医学X射线检查装置和方法
JP5483840B2 (ja) * 2008-08-01 2014-05-07 株式会社日立製作所 Ｘ線撮像装置及びｘ線撮像方法
DE102008049163A1 (de) * 2008-09-24 2010-04-08 BAM Bundesanstalt für Materialforschung und -prüfung Vorrichtung zum Bestrahlen mit Röntgenstrahlung
CA2745370A1 (en) 2008-12-01 2010-06-10 Brookhaven Science Associates Systems and methods for detecting an image of an object using multi-beam imaging from an x-ray beam having a polychromatic distribution
US8204174B2 (en) * 2009-06-04 2012-06-19 Nextray, Inc. Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources and by use of facing sides of adjacent monochromator crystals
WO2010141735A2 (en) * 2009-06-04 2010-12-09 Nextray, Inc. Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods

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JPS59225339A (ja) * 1983-06-04 1984-12-18 Horiba Ltd 結晶面傾き角度測定装置
JPS61256243A (ja) * 1985-05-10 1986-11-13 Hitachi Ltd 単色ｘ線断層撮影装置
JPH07104293B2 (ja) * 1986-08-25 1995-11-13 株式会社日立製作所 単色ｘ線画像計測装置
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JPH01187440A (ja) * 1988-01-22 1989-07-26 Nec Corp Ｘ線回折顕微法装置
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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996023210A1 (en) * 1994-12-08 1996-08-01 Alexei Vladislavovich Kurbatov Using deflected penetrating radiation to image an object's internal structure
RU2115943C1 (ru) * 1997-01-16 1998-07-20 Виктор Натанович Ингал Способ фазовой рентгенографии объектов и устройство для его осуществления (варианты)
WO1998032005A1 (fr) * 1997-01-16 1998-07-23 Noel, Joseph, M. Procede de radiographie a contraste de phase destine principalement aux objets medico-biologiques et dispositif prevu a cet effet
US6054712A (en) * 1998-01-23 2000-04-25 Quanta Vision, Inc. Inspection equipment using small-angle topography in determining an object's internal structure and composition
US6175117B1 (en) 1998-01-23 2001-01-16 Quanta Vision, Inc. Tissue analysis apparatus
US6281503B1 (en) 1998-05-06 2001-08-28 Quanta Vision, Inc. Non-invasive composition analysis
EA028468B1 (ru) * 2014-11-27 2017-11-30 Федеральное государственное автономное образовательное учреждение высшего профессионального образования "Балтийский федеральный университет имени Иммануила Канта" Способ определения оптических характеристик материалов на основе аномального преломления в рефракционных оптических элементах

Also Published As

Publication number Publication date
JP2694049B2 (ja) 1997-12-24
WO1992021016A1 (en) 1992-11-26
DE69228285D1 (de) 1999-03-11
JPH06507019A (ja) 1994-08-04
US5319694A (en) 1994-06-07
ATE176323T1 (de) 1999-02-15
EP0539608A4 (en) 1993-09-22
EP0539608B1 (en) 1999-01-27
EP0539608A1 (en) 1993-05-05
DE69228285T2 (de) 1999-09-09
US5579363A (en) 1996-11-26

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Effective date: 20070515