DE69228285D1 - Methode um die abbildung der inneren struktur eines objektes zu erhalten - Google Patents

Methode um die abbildung der inneren struktur eines objektes zu erhalten

Info

Publication number
DE69228285D1
DE69228285D1 DE69228285T DE69228285T DE69228285D1 DE 69228285 D1 DE69228285 D1 DE 69228285D1 DE 69228285 T DE69228285 T DE 69228285T DE 69228285 T DE69228285 T DE 69228285T DE 69228285 D1 DE69228285 D1 DE 69228285D1
Authority
DE
Germany
Prior art keywords
radiation
monocrystal
monochromator
pseudoflat
collimation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69228285T
Other languages
English (en)
Other versions
DE69228285T2 (de
Inventor
Viktor Natanovich Ingal
Elena Anatolievna Belyaevskaya
Valery Pavlovich Efanov
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RUSSIAN TECHNOLOGY GROUP, SAN MATEO, CALIF., US IN
Original Assignee
V Ray Imaging Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by V Ray Imaging Corp filed Critical V Ray Imaging Corp
Publication of DE69228285D1 publication Critical patent/DE69228285D1/de
Application granted granted Critical
Publication of DE69228285T2 publication Critical patent/DE69228285T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Superconductors And Manufacturing Methods Therefor (AREA)
  • Devices For Executing Special Programs (AREA)
  • Glass Compositions (AREA)
  • Nitrogen And Oxygen Or Sulfur-Condensed Heterocyclic Ring Systems (AREA)
DE69228285T 1991-05-14 1992-05-14 Methode um die abbildung der inneren struktur eines objektes zu erhalten Expired - Fee Related DE69228285T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SU914934958A RU2012872C1 (ru) 1991-05-14 1991-05-14 Способ получения изображения внутренней структуры объекта
PCT/RU1992/000105 WO1992021016A1 (en) 1991-05-14 1992-05-14 Method for obtaining internal structure image of object

Publications (2)

Publication Number Publication Date
DE69228285D1 true DE69228285D1 (de) 1999-03-11
DE69228285T2 DE69228285T2 (de) 1999-09-09

Family

ID=21573829

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69228285T Expired - Fee Related DE69228285T2 (de) 1991-05-14 1992-05-14 Methode um die abbildung der inneren struktur eines objektes zu erhalten

Country Status (7)

Country Link
US (2) US5319694A (de)
EP (1) EP0539608B1 (de)
JP (1) JP2694049B2 (de)
AT (1) ATE176323T1 (de)
DE (1) DE69228285T2 (de)
RU (1) RU2012872C1 (de)
WO (1) WO1992021016A1 (de)

Families Citing this family (45)

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US5596620A (en) * 1993-04-30 1997-01-21 The University Of Connecticut X-ray based extensometry device for radiography
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RU2098797C1 (ru) * 1994-11-30 1997-12-10 Алексей Владиславович Курбатов Способ получения проекции объекта с помощью проникающего излучения и устройство для его осуществления
RU2098798C1 (ru) * 1994-12-08 1997-12-10 Алексей Владиславович Курбатов Способ получения изображения внутренней структуры объекта с помощью проникающего излучения
RU94043357A (ru) * 1994-12-08 1996-10-27 А.В. Курбатов Способ получения изображения объекта с помощью проникающего излучения и устройство для его осуществления
AU779490B2 (en) * 1995-03-28 2005-01-27 Xrt Limited Simplified conditions and configurations for phase-contrast imaging with hard x-rays
AUPN201295A0 (en) * 1995-03-28 1995-04-27 Commonwealth Scientific And Industrial Research Organisation Simplified conditions and configurations for phase-contrast imaging with hard x-rays
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JPH09187455A (ja) * 1996-01-10 1997-07-22 Hitachi Ltd 位相型ｘ線ｃｔ装置
DE69730550T2 (de) * 1996-03-29 2005-11-10 Hitachi, Ltd. Phasenkontrast-Röntgenabbildungssystem
WO1998016817A1 (en) 1996-10-16 1998-04-23 Illinois Institute Of Technology Method for detecting an image of an object
US5787146A (en) * 1996-10-18 1998-07-28 Spad Technologies, Inc. X-ray imaging system using diffractive x-ray optics for high definition low dosage three dimensional imaging of soft tissue
RU2115943C1 (ru) * 1997-01-16 1998-07-20 Виктор Натанович Ингал Способ фазовой рентгенографии объектов и устройство для его осуществления (варианты)
US6023496A (en) * 1997-04-30 2000-02-08 Shimadzu Corporation X-ray fluorescence analyzing apparatus
US6054712A (en) * 1998-01-23 2000-04-25 Quanta Vision, Inc. Inspection equipment using small-angle topography in determining an object's internal structure and composition
US6175117B1 (en) 1998-01-23 2001-01-16 Quanta Vision, Inc. Tissue analysis apparatus
US6038285A (en) * 1998-02-02 2000-03-14 Zhong; Zhong Method and apparatus for producing monochromatic radiography with a bent laue crystal
US6281503B1 (en) 1998-05-06 2001-08-28 Quanta Vision, Inc. Non-invasive composition analysis
US6625250B2 (en) * 1999-12-20 2003-09-23 Agere Systems Inc. Optical structures and methods for x-ray applications
US6577708B2 (en) 2000-04-17 2003-06-10 Leroy Dean Chapman Diffraction enhanced x-ray imaging of articular cartilage
US6870896B2 (en) 2000-12-28 2005-03-22 Osmic, Inc. Dark-field phase contrast imaging
US6804324B2 (en) * 2001-03-01 2004-10-12 Osmo, Inc. X-ray phase contrast imaging using a fabry-perot interferometer concept
JP4498663B2 (ja) * 2001-07-11 2010-07-07 学校法人東京理科大学 透過型結晶分析体の厚さ設定方法
JP5187694B2 (ja) * 2001-07-11 2013-04-24 学校法人東京理科大学 非破壊分析方法および非破壊分析装置
GB0211691D0 (en) 2002-05-21 2002-07-03 Oxford Diffraction Ltd X-ray diffraction apparatus
AUPS299302A0 (en) * 2002-06-17 2002-07-04 Monash University Methods and apparatus of sample analysis
WO2004010125A1 (ja) * 2002-07-18 2004-01-29 Hitachi Zosen Corporation Ｘ線検査装置およびｘ線検査方法
DE10245676B4 (de) * 2002-09-30 2008-01-17 Siemens Ag Phasenkontrast-Röntgengerät mit Strichfokus zur Erstellung eines Phasenkontrast-Bildes eines Objekts und Verfahren zum Erstellen des Phasenkontrast-Bildes
US6947521B2 (en) * 2003-06-17 2005-09-20 Illinois Institute Of Technology Imaging method based on attenuation, refraction and ultra-small-angle-scattering of x-rays
US7076025B2 (en) 2004-05-19 2006-07-11 Illinois Institute Of Technology Method for detecting a mass density image of an object
GB0411401D0 (en) * 2004-05-21 2004-06-23 Tissuomics Ltd Penetrating radiation measurements
US7330530B2 (en) * 2004-10-04 2008-02-12 Illinois Institute Of Technology Diffraction enhanced imaging method using a line x-ray source
BRPI0707273A2 (pt) * 2006-01-24 2011-04-26 Univ North Carolina Sistemas e métodos para a detecção de uma imagem de um objeto pelo uso de um feixe de raios x que tem uma distribuição policromática
DE102008008829B4 (de) 2007-02-14 2008-11-20 Technische Universität Dresden Verfahren und Vorrichtung zur Registrierung von Realstruktur-Informationen in massiven Kristallkörpern mittels Röntgenstrahlung
US7469037B2 (en) * 2007-04-03 2008-12-23 Illinois Institute Of Technology Method for detecting a mass density image of an object
JP5273955B2 (ja) * 2007-06-26 2013-08-28 株式会社日立製作所 Ｘ線撮像装置及びｘ線撮像方法
WO2009076700A1 (en) * 2007-12-14 2009-06-25 Commonwealth Scientific And Industrial Research Organisation Phase-contrast imaging method and apparatus
CN102065771B (zh) * 2008-06-23 2013-07-10 皇家飞利浦电子股份有限公司 用于k边成像的医学X射线检查装置和方法
JP5483840B2 (ja) * 2008-08-01 2014-05-07 株式会社日立製作所 Ｘ線撮像装置及びｘ線撮像方法
DE102008049163A1 (de) * 2008-09-24 2010-04-08 BAM Bundesanstalt für Materialforschung und -prüfung Vorrichtung zum Bestrahlen mit Röntgenstrahlung
CA2745370A1 (en) 2008-12-01 2010-06-10 Brookhaven Science Associates Systems and methods for detecting an image of an object using multi-beam imaging from an x-ray beam having a polychromatic distribution
US8204174B2 (en) * 2009-06-04 2012-06-19 Nextray, Inc. Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources and by use of facing sides of adjacent monochromator crystals
WO2010141735A2 (en) * 2009-06-04 2010-12-09 Nextray, Inc. Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods
EA028468B1 (ru) * 2014-11-27 2017-11-30 Федеральное государственное автономное образовательное учреждение высшего профессионального образования "Балтийский федеральный университет имени Иммануила Канта" Способ определения оптических характеристик материалов на основе аномального преломления в рефракционных оптических элементах

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JPS57112847A (en) * 1980-12-31 1982-07-14 Shimadzu Corp Image treating apparatus of computer tomograph apparatus
GB2137453B (en) * 1983-03-14 1987-01-21 American Science & Eng Inc Improvements in high energy computed tomography
JPS59225339A (ja) * 1983-06-04 1984-12-18 Horiba Ltd 結晶面傾き角度測定装置
JPS61256243A (ja) * 1985-05-10 1986-11-13 Hitachi Ltd 単色ｘ線断層撮影装置
JPH07104293B2 (ja) * 1986-08-25 1995-11-13 株式会社日立製作所 単色ｘ線画像計測装置
SU1402871A1 (ru) * 1986-11-13 1988-06-15 Предприятие П/Я А-1758 Способ получени теневых картин внутренней структуры объекта с помощью проникающего излучени
US4888693A (en) * 1987-04-01 1989-12-19 General Electric Company Method to obtain object boundary information in limited-angle computerized tomography
US4870669A (en) * 1987-05-01 1989-09-26 Florida Nuclear Associates, Inc. Gamma ray flaw detection system
DE3740614C1 (de) * 1987-12-01 1988-12-29 Deutsches Elektronen Synchr Verfahren und Vorrichtung zur beruehrungsfreien Messung mechanischer Spannungen an schnell bewegten Objekten mit kristalliner Struktur
JPH01187440A (ja) * 1988-01-22 1989-07-26 Nec Corp Ｘ線回折顕微法装置
JPH02205760A (ja) * 1989-02-03 1990-08-15 Hitachi Ltd 多重波長ｘ線断層撮影装置
RU2012872C1 (ru) * 1991-05-14 1994-05-15 Виктор Натанович Ингал Способ получения изображения внутренней структуры объекта

Also Published As

Publication number Publication date
JP2694049B2 (ja) 1997-12-24
WO1992021016A1 (en) 1992-11-26
JPH06507019A (ja) 1994-08-04
US5319694A (en) 1994-06-07
ATE176323T1 (de) 1999-02-15
EP0539608A4 (en) 1993-09-22
EP0539608B1 (de) 1999-01-27
EP0539608A1 (de) 1993-05-05
DE69228285T2 (de) 1999-09-09
RU2012872C1 (ru) 1994-05-15
US5579363A (en) 1996-11-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: RUSSIAN TECHNOLOGY GROUP, SAN MATEO, CALIF., US IN

8328 Change in the person/name/address of the agent

Representative=s name: WITTE, WELLER & PARTNER, 70178 STUTTGART

8339 Ceased/non-payment of the annual fee