ATE176323T1 - Methode um die abbildung der inneren struktur eines objektes zu erhalten - Google Patents
Methode um die abbildung der inneren struktur eines objektes zu erhaltenInfo
- Publication number
- ATE176323T1 ATE176323T1 AT92915825T AT92915825T ATE176323T1 AT E176323 T1 ATE176323 T1 AT E176323T1 AT 92915825 T AT92915825 T AT 92915825T AT 92915825 T AT92915825 T AT 92915825T AT E176323 T1 ATE176323 T1 AT E176323T1
- Authority
- AT
- Austria
- Prior art keywords
- radiation
- monocrystal
- monochromator
- image
- pseudoflat
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
Landscapes
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
- Devices For Executing Special Programs (AREA)
- Glass Compositions (AREA)
- Nitrogen And Oxygen Or Sulfur-Condensed Heterocyclic Ring Systems (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU914934958A RU2012872C1 (ru) | 1991-05-14 | 1991-05-14 | Способ получения изображения внутренней структуры объекта |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE176323T1 true ATE176323T1 (de) | 1999-02-15 |
Family
ID=21573829
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT92915825T ATE176323T1 (de) | 1991-05-14 | 1992-05-14 | Methode um die abbildung der inneren struktur eines objektes zu erhalten |
Country Status (7)
Country | Link |
---|---|
US (2) | US5319694A (de) |
EP (1) | EP0539608B1 (de) |
JP (1) | JP2694049B2 (de) |
AT (1) | ATE176323T1 (de) |
DE (1) | DE69228285T2 (de) |
RU (1) | RU2012872C1 (de) |
WO (1) | WO1992021016A1 (de) |
Families Citing this family (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2012872C1 (ru) * | 1991-05-14 | 1994-05-15 | Виктор Натанович Ингал | Способ получения изображения внутренней структуры объекта |
US5596620A (en) * | 1993-04-30 | 1997-01-21 | The University Of Connecticut | X-ray based extensometry device for radiography |
WO1995005725A1 (en) * | 1993-08-16 | 1995-02-23 | Commonwealth Scientific And Industrial Research Organisation | Improved x-ray optics, especially for phase contrast imaging |
RU2098797C1 (ru) * | 1994-11-30 | 1997-12-10 | Алексей Владиславович Курбатов | Способ получения проекции объекта с помощью проникающего излучения и устройство для его осуществления |
RU2098798C1 (ru) * | 1994-12-08 | 1997-12-10 | Алексей Владиславович Курбатов | Способ получения изображения внутренней структуры объекта с помощью проникающего излучения |
RU94043357A (ru) * | 1994-12-08 | 1996-10-27 | А.В. Курбатов | Способ получения изображения объекта с помощью проникающего излучения и устройство для его осуществления |
AU779490B2 (en) * | 1995-03-28 | 2005-01-27 | Xrt Limited | Simplified conditions and configurations for phase-contrast imaging with hard x-rays |
AUPN201295A0 (en) * | 1995-03-28 | 1995-04-27 | Commonwealth Scientific And Industrial Research Organisation | Simplified conditions and configurations for phase-contrast imaging with hard x-rays |
US5717733A (en) * | 1995-05-31 | 1998-02-10 | Quanta Vision, Inc. | X-ray and neutron diffractometric imaging of the internal structure of objects |
JPH09187455A (ja) * | 1996-01-10 | 1997-07-22 | Hitachi Ltd | 位相型x線ct装置 |
DE69730550T2 (de) * | 1996-03-29 | 2005-11-10 | Hitachi, Ltd. | Phasenkontrast-Röntgenabbildungssystem |
WO1998016817A1 (en) | 1996-10-16 | 1998-04-23 | Illinois Institute Of Technology | Method for detecting an image of an object |
US5787146A (en) * | 1996-10-18 | 1998-07-28 | Spad Technologies, Inc. | X-ray imaging system using diffractive x-ray optics for high definition low dosage three dimensional imaging of soft tissue |
RU2115943C1 (ru) * | 1997-01-16 | 1998-07-20 | Виктор Натанович Ингал | Способ фазовой рентгенографии объектов и устройство для его осуществления (варианты) |
US6023496A (en) * | 1997-04-30 | 2000-02-08 | Shimadzu Corporation | X-ray fluorescence analyzing apparatus |
US6054712A (en) * | 1998-01-23 | 2000-04-25 | Quanta Vision, Inc. | Inspection equipment using small-angle topography in determining an object's internal structure and composition |
US6175117B1 (en) | 1998-01-23 | 2001-01-16 | Quanta Vision, Inc. | Tissue analysis apparatus |
US6038285A (en) * | 1998-02-02 | 2000-03-14 | Zhong; Zhong | Method and apparatus for producing monochromatic radiography with a bent laue crystal |
US6281503B1 (en) | 1998-05-06 | 2001-08-28 | Quanta Vision, Inc. | Non-invasive composition analysis |
US6625250B2 (en) * | 1999-12-20 | 2003-09-23 | Agere Systems Inc. | Optical structures and methods for x-ray applications |
US6577708B2 (en) | 2000-04-17 | 2003-06-10 | Leroy Dean Chapman | Diffraction enhanced x-ray imaging of articular cartilage |
US6870896B2 (en) | 2000-12-28 | 2005-03-22 | Osmic, Inc. | Dark-field phase contrast imaging |
US6804324B2 (en) * | 2001-03-01 | 2004-10-12 | Osmo, Inc. | X-ray phase contrast imaging using a fabry-perot interferometer concept |
JP4498663B2 (ja) * | 2001-07-11 | 2010-07-07 | 学校法人東京理科大学 | 透過型結晶分析体の厚さ設定方法 |
JP5187694B2 (ja) * | 2001-07-11 | 2013-04-24 | 学校法人東京理科大学 | 非破壊分析方法および非破壊分析装置 |
GB0211691D0 (en) | 2002-05-21 | 2002-07-03 | Oxford Diffraction Ltd | X-ray diffraction apparatus |
AUPS299302A0 (en) * | 2002-06-17 | 2002-07-04 | Monash University | Methods and apparatus of sample analysis |
WO2004010125A1 (ja) * | 2002-07-18 | 2004-01-29 | Hitachi Zosen Corporation | X線検査装置およびx線検査方法 |
DE10245676B4 (de) * | 2002-09-30 | 2008-01-17 | Siemens Ag | Phasenkontrast-Röntgengerät mit Strichfokus zur Erstellung eines Phasenkontrast-Bildes eines Objekts und Verfahren zum Erstellen des Phasenkontrast-Bildes |
US6947521B2 (en) * | 2003-06-17 | 2005-09-20 | Illinois Institute Of Technology | Imaging method based on attenuation, refraction and ultra-small-angle-scattering of x-rays |
US7076025B2 (en) | 2004-05-19 | 2006-07-11 | Illinois Institute Of Technology | Method for detecting a mass density image of an object |
GB0411401D0 (en) * | 2004-05-21 | 2004-06-23 | Tissuomics Ltd | Penetrating radiation measurements |
US7330530B2 (en) * | 2004-10-04 | 2008-02-12 | Illinois Institute Of Technology | Diffraction enhanced imaging method using a line x-ray source |
BRPI0707273A2 (pt) * | 2006-01-24 | 2011-04-26 | Univ North Carolina | Sistemas e métodos para a detecção de uma imagem de um objeto pelo uso de um feixe de raios x que tem uma distribuição policromática |
DE102008008829B4 (de) | 2007-02-14 | 2008-11-20 | Technische Universität Dresden | Verfahren und Vorrichtung zur Registrierung von Realstruktur-Informationen in massiven Kristallkörpern mittels Röntgenstrahlung |
US7469037B2 (en) * | 2007-04-03 | 2008-12-23 | Illinois Institute Of Technology | Method for detecting a mass density image of an object |
JP5273955B2 (ja) * | 2007-06-26 | 2013-08-28 | 株式会社日立製作所 | X線撮像装置及びx線撮像方法 |
WO2009076700A1 (en) * | 2007-12-14 | 2009-06-25 | Commonwealth Scientific And Industrial Research Organisation | Phase-contrast imaging method and apparatus |
CN102065771B (zh) * | 2008-06-23 | 2013-07-10 | 皇家飞利浦电子股份有限公司 | 用于k边成像的医学X射线检查装置和方法 |
JP5483840B2 (ja) * | 2008-08-01 | 2014-05-07 | 株式会社日立製作所 | X線撮像装置及びx線撮像方法 |
DE102008049163A1 (de) * | 2008-09-24 | 2010-04-08 | BAM Bundesanstalt für Materialforschung und -prüfung | Vorrichtung zum Bestrahlen mit Röntgenstrahlung |
CA2745370A1 (en) | 2008-12-01 | 2010-06-10 | Brookhaven Science Associates | Systems and methods for detecting an image of an object using multi-beam imaging from an x-ray beam having a polychromatic distribution |
US8204174B2 (en) * | 2009-06-04 | 2012-06-19 | Nextray, Inc. | Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources and by use of facing sides of adjacent monochromator crystals |
WO2010141735A2 (en) * | 2009-06-04 | 2010-12-09 | Nextray, Inc. | Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods |
EA028468B1 (ru) * | 2014-11-27 | 2017-11-30 | Федеральное государственное автономное образовательное учреждение высшего профессионального образования "Балтийский федеральный университет имени Иммануила Канта" | Способ определения оптических характеристик материалов на основе аномального преломления в рефракционных оптических элементах |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57112847A (en) * | 1980-12-31 | 1982-07-14 | Shimadzu Corp | Image treating apparatus of computer tomograph apparatus |
GB2137453B (en) * | 1983-03-14 | 1987-01-21 | American Science & Eng Inc | Improvements in high energy computed tomography |
JPS59225339A (ja) * | 1983-06-04 | 1984-12-18 | Horiba Ltd | 結晶面傾き角度測定装置 |
JPS61256243A (ja) * | 1985-05-10 | 1986-11-13 | Hitachi Ltd | 単色x線断層撮影装置 |
JPH07104293B2 (ja) * | 1986-08-25 | 1995-11-13 | 株式会社日立製作所 | 単色x線画像計測装置 |
SU1402871A1 (ru) * | 1986-11-13 | 1988-06-15 | Предприятие П/Я А-1758 | Способ получени теневых картин внутренней структуры объекта с помощью проникающего излучени |
US4888693A (en) * | 1987-04-01 | 1989-12-19 | General Electric Company | Method to obtain object boundary information in limited-angle computerized tomography |
US4870669A (en) * | 1987-05-01 | 1989-09-26 | Florida Nuclear Associates, Inc. | Gamma ray flaw detection system |
DE3740614C1 (de) * | 1987-12-01 | 1988-12-29 | Deutsches Elektronen Synchr | Verfahren und Vorrichtung zur beruehrungsfreien Messung mechanischer Spannungen an schnell bewegten Objekten mit kristalliner Struktur |
JPH01187440A (ja) * | 1988-01-22 | 1989-07-26 | Nec Corp | X線回折顕微法装置 |
JPH02205760A (ja) * | 1989-02-03 | 1990-08-15 | Hitachi Ltd | 多重波長x線断層撮影装置 |
RU2012872C1 (ru) * | 1991-05-14 | 1994-05-15 | Виктор Натанович Ингал | Способ получения изображения внутренней структуры объекта |
-
1991
- 1991-05-14 RU SU914934958A patent/RU2012872C1/ru not_active IP Right Cessation
-
1992
- 1992-05-14 US US07/956,880 patent/US5319694A/en not_active Expired - Lifetime
- 1992-05-14 WO PCT/RU1992/000105 patent/WO1992021016A1/ru active IP Right Grant
- 1992-05-14 DE DE69228285T patent/DE69228285T2/de not_active Expired - Fee Related
- 1992-05-14 AT AT92915825T patent/ATE176323T1/de not_active IP Right Cessation
- 1992-05-14 EP EP92915825A patent/EP0539608B1/de not_active Expired - Lifetime
- 1992-05-14 JP JP4511111A patent/JP2694049B2/ja not_active Expired - Fee Related
-
1995
- 1995-07-11 US US08/500,559 patent/US5579363A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2694049B2 (ja) | 1997-12-24 |
WO1992021016A1 (en) | 1992-11-26 |
DE69228285D1 (de) | 1999-03-11 |
JPH06507019A (ja) | 1994-08-04 |
US5319694A (en) | 1994-06-07 |
EP0539608A4 (en) | 1993-09-22 |
EP0539608B1 (de) | 1999-01-27 |
EP0539608A1 (de) | 1993-05-05 |
DE69228285T2 (de) | 1999-09-09 |
RU2012872C1 (ru) | 1994-05-15 |
US5579363A (en) | 1996-11-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |