NL194246C - Inrichting voor het monitoren van een coating. - Google Patents

Inrichting voor het monitoren van een coating. Download PDF

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Publication number
NL194246C
NL194246C NL9301577A NL9301577A NL194246C NL 194246 C NL194246 C NL 194246C NL 9301577 A NL9301577 A NL 9301577A NL 9301577 A NL9301577 A NL 9301577A NL 194246 C NL194246 C NL 194246C
Authority
NL
Netherlands
Prior art keywords
coating
thickness
glass
light
signals
Prior art date
Application number
NL9301577A
Other languages
English (en)
Dutch (nl)
Other versions
NL9301577A (nl
NL194246B (nl
Inventor
Robert Terneu
Michel Hannotiau
Guy Renard
Original Assignee
Glaverbel
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Glaverbel filed Critical Glaverbel
Publication of NL9301577A publication Critical patent/NL9301577A/nl
Publication of NL194246B publication Critical patent/NL194246B/xx
Application granted granted Critical
Publication of NL194246C publication Critical patent/NL194246C/nl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Physical Vapour Deposition (AREA)
  • Surface Treatment Of Glass (AREA)
NL9301577A 1992-09-15 1993-09-13 Inrichting voor het monitoren van een coating. NL194246C (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9219450 1992-09-15
GB929219450A GB9219450D0 (en) 1992-09-15 1992-09-15 Thin film thickness monitoring and control

Publications (3)

Publication Number Publication Date
NL9301577A NL9301577A (nl) 1994-04-05
NL194246B NL194246B (nl) 2001-06-01
NL194246C true NL194246C (nl) 2001-10-02

Family

ID=10721896

Family Applications (1)

Application Number Title Priority Date Filing Date
NL9301577A NL194246C (nl) 1992-09-15 1993-09-13 Inrichting voor het monitoren van een coating.

Country Status (17)

Country Link
US (1) US5396080A (fr)
JP (1) JPH06201333A (fr)
CN (1) CN1049045C (fr)
AU (1) AU664474B2 (fr)
BE (1) BE1006795A3 (fr)
CA (1) CA2105635A1 (fr)
CZ (1) CZ289962B6 (fr)
DE (1) DE4331355A1 (fr)
ES (1) ES2078864B1 (fr)
FI (1) FI933971A (fr)
FR (1) FR2695721B1 (fr)
GB (2) GB9219450D0 (fr)
IT (1) IT1261253B (fr)
LU (1) LU88402A1 (fr)
NL (1) NL194246C (fr)
PT (1) PT101364B (fr)
SE (1) SE515115C2 (fr)

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US5619330A (en) * 1995-12-22 1997-04-08 Thomson Consumer Electronics, Inc. Method and apparatus for determining thickness of an OPC layer on a CRT faceplate panel
DE19735246C2 (de) * 1997-08-14 1999-07-15 Bayern Freistaat Verfahren zur Bestimmung eines Volumens
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US8982362B2 (en) * 2011-10-04 2015-03-17 First Solar, Inc. System and method for measuring layer thickness and depositing semiconductor layers
US11116695B2 (en) 2011-11-11 2021-09-14 Sio2 Medical Products, Inc. Blood sample collection tube
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CN110074968B (zh) 2013-03-11 2021-12-21 Sio2医药产品公司 涂布包装材料
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BR112016020894B1 (pt) * 2014-03-12 2022-05-03 Swimc Llc Sistema e método implantado por processador para determinar espessuras de revestimento e meio legível por computador
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Also Published As

Publication number Publication date
AU664474B2 (en) 1995-11-16
GB2270561B (en) 1996-07-17
DE4331355A1 (de) 1994-03-17
SE9302985D0 (sv) 1993-09-14
NL9301577A (nl) 1994-04-05
CA2105635A1 (fr) 1994-03-16
PT101364A (pt) 1994-12-30
ITTO930654A0 (it) 1993-09-08
FR2695721A1 (fr) 1994-03-18
AU4487393A (en) 1994-03-24
GB9318814D0 (en) 1993-10-27
CZ289962B6 (cs) 2002-05-15
IT1261253B (it) 1996-05-09
GB2270561A (en) 1994-03-16
ITTO930654A1 (it) 1995-03-08
SE515115C2 (sv) 2001-06-11
CZ9301924A3 (cs) 2001-12-12
FR2695721B1 (fr) 1995-02-24
US5396080A (en) 1995-03-07
CN1085655A (zh) 1994-04-20
FI933971A (fi) 1994-03-16
GB9219450D0 (en) 1992-10-28
JPH06201333A (ja) 1994-07-19
LU88402A1 (fr) 1995-04-05
CN1049045C (zh) 2000-02-02
PT101364B (pt) 1999-11-30
FI933971A0 (fi) 1993-09-10
ES2078864B1 (es) 1997-05-16
NL194246B (nl) 2001-06-01
BE1006795A3 (fr) 1994-12-13
ES2078864R (fr) 1996-12-16
ES2078864A2 (es) 1995-12-16
SE9302985L (sv) 1994-03-16

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