KR20040044071A - 표시용 기판의 검사방법 및 장치 - Google Patents
표시용 기판의 검사방법 및 장치 Download PDFInfo
- Publication number
- KR20040044071A KR20040044071A KR1020030004634A KR20030004634A KR20040044071A KR 20040044071 A KR20040044071 A KR 20040044071A KR 1020030004634 A KR1020030004634 A KR 1020030004634A KR 20030004634 A KR20030004634 A KR 20030004634A KR 20040044071 A KR20040044071 A KR 20040044071A
- Authority
- KR
- South Korea
- Prior art keywords
- light
- display substrate
- image signal
- polarization
- polarization filter
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nonlinear Science (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002333450A JP2004170495A (ja) | 2002-11-18 | 2002-11-18 | 表示用基板の検査方法及び装置 |
JPJP-P-2002-00333450 | 2002-11-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20040044071A true KR20040044071A (ko) | 2004-05-27 |
Family
ID=32588052
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020030004634A KR20040044071A (ko) | 2002-11-18 | 2003-01-23 | 표시용 기판의 검사방법 및 장치 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP2004170495A (ja) |
KR (1) | KR20040044071A (ja) |
CN (1) | CN1249426C (ja) |
SG (1) | SG119174A1 (ja) |
TW (1) | TW571079B (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100834730B1 (ko) * | 2006-09-04 | 2008-06-05 | 케이 이엔지(주) | 비전 센서 시스템을 이용한 액정 디스플레이 패널의 불량검사 시스템 |
US7738102B2 (en) | 2006-01-11 | 2010-06-15 | Nitto Denko Corporation | Layered film fabrication method, layered film defect detection method, layered film defect detection device, layered film, and image display device |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100722223B1 (ko) * | 2004-12-11 | 2007-05-29 | 주식회사 매크론 | 백라이트 유닛 검사 장치 |
JP4884738B2 (ja) * | 2005-09-26 | 2012-02-29 | 株式会社日本マイクロニクス | 液晶パネル検査装置 |
KR100783309B1 (ko) * | 2006-02-15 | 2007-12-10 | 주식회사 동진쎄미켐 | 평판 표시 장치의 검사 시스템 |
TWI409450B (zh) * | 2006-05-04 | 2013-09-21 | Au Optronics Corp | 光學量測機構 |
JP4842034B2 (ja) * | 2006-07-12 | 2011-12-21 | 株式会社日本マイクロニクス | 液晶パネルの検査方法および画像処理装置 |
JP4960161B2 (ja) * | 2006-10-11 | 2012-06-27 | 日東電工株式会社 | 検査データ処理装置及び検査データ処理方法 |
KR101286534B1 (ko) | 2008-02-29 | 2013-07-16 | 엘지디스플레이 주식회사 | 액정표시장치의 검사장치 및 검사방법 |
TWI376500B (en) | 2008-03-28 | 2012-11-11 | Ind Tech Res Inst | System for detecting defect of panel device |
CN101825781B (zh) * | 2009-03-06 | 2012-02-29 | 北京京东方光电科技有限公司 | 光学测试装置 |
CN102914889B (zh) * | 2012-11-15 | 2016-05-04 | 昆山迈致治具科技有限公司 | Lcd测试治具 |
TWI502186B (zh) * | 2014-05-08 | 2015-10-01 | Utechzone Co Ltd | A bright spot detection device for filtering foreign matter noise and its method |
KR102250032B1 (ko) * | 2014-12-29 | 2021-05-12 | 삼성디스플레이 주식회사 | 표시 장치의 검사 장치 및 표시 장치의 검사 방법 |
CN105806850A (zh) * | 2016-03-10 | 2016-07-27 | 惠州高视科技有限公司 | 一种lcd玻璃缺陷检测装置及检测方法 |
CN106444105A (zh) * | 2016-10-18 | 2017-02-22 | 凌云光技术集团有限责任公司 | 一种液晶屏缺陷检测的方法、装置及*** |
CN107515222A (zh) * | 2017-09-20 | 2017-12-26 | 哈尔滨工程大学 | 一种冰的微观结构观测装置 |
JP6834903B2 (ja) * | 2017-10-20 | 2021-02-24 | トヨタ自動車株式会社 | 検査装置および検査装置故障確認方法 |
CN108267453B (zh) * | 2017-12-20 | 2021-05-25 | 张家港康得新光电材料有限公司 | 可切换式3d模组的不良检测方法 |
JP7051445B2 (ja) * | 2018-01-10 | 2022-04-11 | 日東電工株式会社 | 光学表示パネルの連続検査方法および連続検査装置、並びに、光学表示パネルの連続製造方法および連続製造システム |
CN109632829B (zh) * | 2018-12-26 | 2021-09-24 | 江苏宏芯亿泰智能装备有限公司 | 玻璃基板宏观检查装置 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61178648A (ja) * | 1985-02-04 | 1986-08-11 | Seiko Epson Corp | 液晶表示素子検査装置 |
JPH03217817A (ja) * | 1990-01-24 | 1991-09-25 | Nippon Maikuronikusu:Kk | 液晶表示パネルの検査方法と検査装置 |
JPH07146253A (ja) * | 1993-11-25 | 1995-06-06 | Sekisui Chem Co Ltd | 粘着偏光フィルムの欠陥検査装置 |
JPH08292406A (ja) * | 1995-04-24 | 1996-11-05 | Advantest Corp | Lcdパネル検査装置 |
JPH10160628A (ja) * | 1996-11-29 | 1998-06-19 | Advantest Corp | Lcdパネルの画質検査装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09257641A (ja) * | 1996-03-26 | 1997-10-03 | Seiko Epson Corp | 液晶パネルの表示面検査方法及び装置 |
JPH10111237A (ja) * | 1996-10-07 | 1998-04-28 | Hitachi Ltd | 液晶表示装置の製造方法、光学的検査装置及び光学的検査方法 |
JP3533946B2 (ja) * | 1998-06-25 | 2004-06-07 | セイコーエプソン株式会社 | 液晶表示パネルの検査装置及び液晶表示パネルの検査方法 |
-
2002
- 2002-11-18 JP JP2002333450A patent/JP2004170495A/ja active Pending
- 2002-12-27 TW TW091137619A patent/TW571079B/zh not_active IP Right Cessation
-
2003
- 2003-01-23 KR KR1020030004634A patent/KR20040044071A/ko not_active Application Discontinuation
- 2003-03-05 SG SG200301150A patent/SG119174A1/en unknown
- 2003-03-07 CN CNB031205127A patent/CN1249426C/zh not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61178648A (ja) * | 1985-02-04 | 1986-08-11 | Seiko Epson Corp | 液晶表示素子検査装置 |
JPH03217817A (ja) * | 1990-01-24 | 1991-09-25 | Nippon Maikuronikusu:Kk | 液晶表示パネルの検査方法と検査装置 |
JPH07146253A (ja) * | 1993-11-25 | 1995-06-06 | Sekisui Chem Co Ltd | 粘着偏光フィルムの欠陥検査装置 |
JPH08292406A (ja) * | 1995-04-24 | 1996-11-05 | Advantest Corp | Lcdパネル検査装置 |
JPH10160628A (ja) * | 1996-11-29 | 1998-06-19 | Advantest Corp | Lcdパネルの画質検査装置 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7738102B2 (en) | 2006-01-11 | 2010-06-15 | Nitto Denko Corporation | Layered film fabrication method, layered film defect detection method, layered film defect detection device, layered film, and image display device |
KR100834730B1 (ko) * | 2006-09-04 | 2008-06-05 | 케이 이엔지(주) | 비전 센서 시스템을 이용한 액정 디스플레이 패널의 불량검사 시스템 |
Also Published As
Publication number | Publication date |
---|---|
CN1249426C (zh) | 2006-04-05 |
TW571079B (en) | 2004-01-11 |
TW200408800A (en) | 2004-06-01 |
CN1501073A (zh) | 2004-06-02 |
SG119174A1 (en) | 2006-02-28 |
JP2004170495A (ja) | 2004-06-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E601 | Decision to refuse application |